JP4645776B2 - 感光性樹脂組成物、並びにこれを用いた感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造法 - Google Patents
感光性樹脂組成物、並びにこれを用いた感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造法 Download PDFInfo
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- JP4645776B2 JP4645776B2 JP2010517920A JP2010517920A JP4645776B2 JP 4645776 B2 JP4645776 B2 JP 4645776B2 JP 2010517920 A JP2010517920 A JP 2010517920A JP 2010517920 A JP2010517920 A JP 2010517920A JP 4645776 B2 JP4645776 B2 JP 4645776B2
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- resin composition
- photosensitive resin
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- acrylate
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- 239000011342 resin composition Substances 0.000 title claims description 122
- 238000000034 method Methods 0.000 title claims description 63
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 57
- 150000001875 compounds Chemical class 0.000 claims description 50
- 239000000758 substrate Substances 0.000 claims description 40
- -1 acrylate compound Chemical class 0.000 claims description 35
- 229920000642 polymer Polymers 0.000 claims description 20
- 238000007747 plating Methods 0.000 claims description 18
- 239000000178 monomer Substances 0.000 claims description 15
- 239000011230 binding agent Substances 0.000 claims description 14
- 125000004432 carbon atom Chemical group C* 0.000 claims description 14
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 claims description 12
- 238000005530 etching Methods 0.000 claims description 9
- 239000003999 initiator Substances 0.000 claims description 9
- 125000002947 alkylene group Chemical group 0.000 claims description 7
- 230000015572 biosynthetic process Effects 0.000 claims description 7
- 125000001424 substituent group Chemical group 0.000 claims description 7
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 125000003118 aryl group Chemical group 0.000 claims description 3
- 238000000016 photochemical curing Methods 0.000 claims description 3
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 88
- 229940048053 acrylate Drugs 0.000 description 63
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 45
- 239000010410 layer Substances 0.000 description 44
- 239000001294 propane Substances 0.000 description 44
- 239000000047 product Substances 0.000 description 37
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 30
- 239000000243 solution Substances 0.000 description 26
- 206010034972 Photosensitivity reaction Diseases 0.000 description 23
- 230000036211 photosensitivity Effects 0.000 description 23
- 238000011161 development Methods 0.000 description 20
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 18
- 239000007864 aqueous solution Substances 0.000 description 15
- 238000011156 evaluation Methods 0.000 description 14
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 13
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 12
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 11
- 239000010949 copper Substances 0.000 description 11
- HEMHJVSKTPXQMS-UHFFFAOYSA-M sodium hydroxide Inorganic materials [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 11
- 239000000463 material Substances 0.000 description 10
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 9
- 239000003960 organic solvent Substances 0.000 description 9
- 229920006254 polymer film Polymers 0.000 description 9
- 230000001681 protective effect Effects 0.000 description 9
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 8
- 239000003513 alkali Substances 0.000 description 8
- 238000001035 drying Methods 0.000 description 8
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 8
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 7
- 238000000576 coating method Methods 0.000 description 7
- CDBYLPFSWZWCQE-UHFFFAOYSA-L sodium carbonate Substances [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 7
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 6
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 6
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 6
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 5
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 5
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 5
- 238000005227 gel permeation chromatography Methods 0.000 description 5
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 5
- 238000003475 lamination Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229920000139 polyethylene terephthalate Polymers 0.000 description 5
- 239000005020 polyethylene terephthalate Substances 0.000 description 5
- 239000007921 spray Substances 0.000 description 5
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 125000000217 alkyl group Chemical group 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 239000002585 base Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 4
- 239000000539 dimer Substances 0.000 description 4
- 150000002148 esters Chemical class 0.000 description 4
- 125000004836 hexamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 4
- 229910052753 mercury Inorganic materials 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 150000003673 urethanes Chemical class 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 3
- 239000002518 antifoaming agent Substances 0.000 description 3
- 230000002349 favourable effect Effects 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 125000005843 halogen group Chemical group 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 3
- 238000005498 polishing Methods 0.000 description 3
- 229920000573 polyethylene Polymers 0.000 description 3
- 229920001155 polypropylene Polymers 0.000 description 3
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Substances [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 3
- 229910000029 sodium carbonate Inorganic materials 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 150000003440 styrenes Chemical class 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- FRASJONUBLZVQX-UHFFFAOYSA-N 1,4-naphthoquinone Chemical compound C1=CC=C2C(=O)C=CC(=O)C2=C1 FRASJONUBLZVQX-UHFFFAOYSA-N 0.000 description 2
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 2
- NJWGQARXZDRHCD-UHFFFAOYSA-N 2-methylanthraquinone Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3C(=O)C2=C1 NJWGQARXZDRHCD-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
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- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 2
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- MJVAVZPDRWSRRC-UHFFFAOYSA-N Menadione Chemical compound C1=CC=C2C(=O)C(C)=CC(=O)C2=C1 MJVAVZPDRWSRRC-UHFFFAOYSA-N 0.000 description 2
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- NPKSPKHJBVJUKB-UHFFFAOYSA-N N-phenylglycine Chemical compound OC(=O)CNC1=CC=CC=C1 NPKSPKHJBVJUKB-UHFFFAOYSA-N 0.000 description 2
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- XECAHXYUAAWDEL-UHFFFAOYSA-N acrylonitrile butadiene styrene Chemical compound C=CC=C.C=CC#N.C=CC1=CC=CC=C1 XECAHXYUAAWDEL-UHFFFAOYSA-N 0.000 description 2
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- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 2
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- 238000010030 laminating Methods 0.000 description 2
- 208000013469 light sensitivity Diseases 0.000 description 2
- WMFOQBRAJBCJND-UHFFFAOYSA-M lithium hydroxide Inorganic materials [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 2
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- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 2
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- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
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- 125000004400 (C1-C12) alkyl group Chemical group 0.000 description 1
- ZQHJVIHCDHJVII-OWOJBTEDSA-N (e)-2-chlorobut-2-enedioic acid Chemical compound OC(=O)\C=C(\Cl)C(O)=O ZQHJVIHCDHJVII-OWOJBTEDSA-N 0.000 description 1
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- FWUIHQFQLSWYED-ARJAWSKDSA-N (z)-4-oxo-4-propan-2-yloxybut-2-enoic acid Chemical compound CC(C)OC(=O)\C=C/C(O)=O FWUIHQFQLSWYED-ARJAWSKDSA-N 0.000 description 1
- WBYWAXJHAXSJNI-VOTSOKGWSA-M .beta-Phenylacrylic acid Natural products [O-]C(=O)\C=C\C1=CC=CC=C1 WBYWAXJHAXSJNI-VOTSOKGWSA-M 0.000 description 1
- UOCLXMDMGBRAIB-UHFFFAOYSA-N 1,1,1-trichloroethane Chemical compound CC(Cl)(Cl)Cl UOCLXMDMGBRAIB-UHFFFAOYSA-N 0.000 description 1
- XHXSXTIIDBZEKB-UHFFFAOYSA-N 1,2,3,4,5,6,7,8-octamethylanthracene-9,10-dione Chemical compound CC1=C(C)C(C)=C2C(=O)C3=C(C)C(C)=C(C)C(C)=C3C(=O)C2=C1C XHXSXTIIDBZEKB-UHFFFAOYSA-N 0.000 description 1
- SCEFCWXRXJZWHE-UHFFFAOYSA-N 1,2,3-tribromo-4-(2,3,4-tribromophenyl)sulfonylbenzene Chemical compound BrC1=C(Br)C(Br)=CC=C1S(=O)(=O)C1=CC=C(Br)C(Br)=C1Br SCEFCWXRXJZWHE-UHFFFAOYSA-N 0.000 description 1
- GJZFGDYLJLCGHT-UHFFFAOYSA-N 1,2-diethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=C(CC)C(CC)=CC=C3SC2=C1 GJZFGDYLJLCGHT-UHFFFAOYSA-N 0.000 description 1
- 229940008841 1,6-hexamethylene diisocyanate Drugs 0.000 description 1
- LMGYOBQJBQAZKC-UHFFFAOYSA-N 1-(2-ethylphenyl)-2-hydroxy-2-phenylethanone Chemical compound CCC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 LMGYOBQJBQAZKC-UHFFFAOYSA-N 0.000 description 1
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 1
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 1
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- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
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- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
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- 229920013716 polyethylene resin Polymers 0.000 description 1
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- 229910052700 potassium Inorganic materials 0.000 description 1
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- ARJOQCYCJMAIFR-UHFFFAOYSA-N prop-2-enoyl prop-2-enoate Chemical compound C=CC(=O)OC(=O)C=C ARJOQCYCJMAIFR-UHFFFAOYSA-N 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- UORVCLMRJXCDCP-UHFFFAOYSA-N propynoic acid Chemical compound OC(=O)C#C UORVCLMRJXCDCP-UHFFFAOYSA-N 0.000 description 1
- 150000003219 pyrazolines Chemical class 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 235000015424 sodium Nutrition 0.000 description 1
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- 229940048086 sodium pyrophosphate Drugs 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- RYCLIXPGLDDLTM-UHFFFAOYSA-J tetrapotassium;phosphonato phosphate Chemical compound [K+].[K+].[K+].[K+].[O-]P([O-])(=O)OP([O-])([O-])=O RYCLIXPGLDDLTM-UHFFFAOYSA-J 0.000 description 1
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 1
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- LMYRWZFENFIFIT-UHFFFAOYSA-N toluene-4-sulfonamide Chemical compound CC1=CC=C(S(N)(=O)=O)C=C1 LMYRWZFENFIFIT-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- ROVRRJSRRSGUOL-UHFFFAOYSA-N victoria blue bo Chemical compound [Cl-].C12=CC=CC=C2C(NCC)=CC=C1C(C=1C=CC(=CC=1)N(CC)CC)=C1C=CC(=[N+](CC)CC)C=C1 ROVRRJSRRSGUOL-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/031—Organic compounds not covered by group G03F7/029
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
- H01L21/0275—Photolithographic processes using lasers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Optics & Photonics (AREA)
- Materials For Photolithography (AREA)
- Polymerisation Methods In General (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
まず、本実施形態に係る感光性樹脂組成物について説明する。本実施形態に係る感光性樹脂組成物は、(A)バインダーポリマー(以下、場合により「(A)成分」と称する。)と、(B)エチレン性不飽和結合を少なくとも一つ有する光重合性化合物(以下、場合により「(B)成分」と称する。)と、(C)光重合開始剤(以下、場合により「(C)成分」と称する。)とを含有する。
次に、本実施形態に係る感光性エレメントについて説明する。本実施形態に係る感光性エレメントは、支持体と、該支持体上に形成された上記感光性樹脂組成物からなる感光性樹脂組成物層とを備えるものである。
次に本実施形態に係るレジストパターンの形成方法について説明する。本実施形態に係るレジストパターンの形成方法は、回路形成用基板上に形成された上記感光性樹脂組成物からなる感光性樹脂組成物層の所定部分に活性光線を照射し、露光部を光硬化させる照射工程と、上記感光性樹脂組成物層の所定部分以外の部分を上記基板上から除去する除去工程とを含むものである。なお、回路形成用基板とは、絶縁層と絶縁層上に形成された導電層とを備えた基板をいう。
次に、本実施形態に係るプリント配線板の製造法について説明する。本実施形態に係るプリント配線板の製造法は、上述したレジストパターンの形成方法によりレジストパターンが形成された回路形成用基板を、エッチング又はめっきすることを特徴とする。
(合成例1)
撹拌機、還流冷却器、温度計、滴下ロート及び窒素ガス導入管を備えたフラスコに、質量比6/4(メチルセロソルブ/トルエン)であるメチルセロソルブ及びトルエンの配合物400gを加え、窒素ガスを吹き込みながら撹拌して、80℃まで加熱した。一方、共重合単量体としてメタクリル酸100g、メタクリル酸メチル250g、アクリル酸エチル100g及びスチレン50gと、アゾビスイソブチロニトリル0.8gとを混合した溶液(以下、「溶液a」という)を用意し、80℃に加熱された質量比6/4であるメチルセロソルブ及びトルエンの上記配合物に溶液aを4時間かけて滴下した後、80℃で撹拌しながら2時間保温した。さらに、質量比6/4であるメチルセロソルブ及びトルエンの配合物100gにアゾビスイソブチロニトリル1.2gを溶解した溶液を、10分かけて上記フラスコ内に滴下した。滴下後の溶液を撹拌しながら80℃で3時間保温した後、30分間かけて90℃に加温した。90℃で2時間保温した後、冷却して(A)成分であるバインダーポリマー溶液を得た。このバインダーポリマー溶液に、アセトンを加えて不揮発成分(固形分)が50質量%になるように調整した。バインダーポリマーの重量平均分子量は80000であった。なお、重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)法によって測定し、標準ポリスチレンの検量線を用いて換算することにより導出した。GPCの条件を、以下に示す。
(GPC条件)
ポンプ:日立 L−6000型[株式会社日立製作所製]
カラム:Gelpack GL−R420+Gelpack GL−R430+Gelpack GL−R440(計3本)[以上、日立化成工業株式会社製、製品名]
溶離液:テトラヒドロフラン
測定温度:25℃
流量:2.05mL/分
検出器:日立 L−3300型RI[株式会社日立製作所製、製品名]
表1に示す配合量(g)で材料を配合し、感光性樹脂組成物の溶液を得た。
*1:メタクリル酸/メタクリル酸メチル/アクリル酸エチル/スチレン=20/50/20/10(質量比)、重量平均分子量=80000、50質量%メチルセロソルブ/トルエン=6/4(質量比)溶液
*2:2,2−ビス(4−((メタ)アクリロキシポリエトキシ)フェニル)プロパン[日立化成工業株式会社製、製品名]
*3:トリス(メタクリロイルオキシテトラエチレングリコールイソシアネートヘキサメチレン)イソシアヌレート[新中村化学株式会社製、製品名]
*4:γ−クロロ−β−ヒドロキシプロピル−β’−メタクリロイルオキシエチル−o−フタレート[日立化成工業株式会社製、製品名]
*5:ノニルフェノキシテトラエチレンオキシアクリレート[東亞合成株式会社製、製品名]
*6:ノニルフェノキシオクタエチレンオキシアクリレート[共栄社化学株式会社製、製品名]
*7:1,7−ビス(9,9−アクリジニル)ヘプタン[旭電化工業株式会社製、製品名]
*8:9−フェニルアクリジン[新日鐵化学株式会社製、製品名]
*9:N−フェニルグリシン[三井化学株式会社製、製品名]
上記試験基板の上に日立41段ステップタブレットを置いて、半導体レーザを光源とした波長355nmのLDI露光機(日本オルボテック株式会社製、製品名「Paragon−9000m」)を用いて、17mJ/cm2で露光した。次いでポリエチレンテレフタレートフィルムを剥離し、30℃で1.0質量%炭酸ナトリウム水溶液を60秒間スプレーし、未露光部分を除去した後、銅張積層板上に形成された光硬化膜のステップタブレットの段数を測定することにより、感光性樹脂組成物の光感度を評価した。光感度は、ステップタブレットの段数で示され、このステップタブレットの段数が高いほど、光感度が高いことを示す。
上記ラミネート後の試験基板上に、解像度評価用パターンとしてライン幅/スペース幅が5/5〜47/47(単位:μm)の配線パターンを有する描画データを使用し、日立41段ステップタブレットの現像後の残存ステップ段数が20.0となるエネルギー量で露光を行った。上記光感度の評価と同様の条件で現像処理を行った後、光学顕微鏡を用いてレジストパターンを観察し、未露光部が完全に除去することができ、なおかつラインが蛇行、カケを生じることなく生成されたライン幅間のスペース幅の最小値を解像度として評価した。この数値が小さいほど解像度が良好であることを示す。
テンティング性の評価には、直径6mmの穴が24個空いている1.6mm厚の銅張積層板を使用した。上記銅張積層板は、銅箔(厚さ35μm)を両面に積層したガラスエポキシ材である銅張積層板(日立化成工業株式会社製、製品名「MCL−E−67」)に型抜き機で直径6mmの穴を24個作製し、穴を作製した際に生じたバリを#600相当のブラシを持つ研磨機(三啓株式会社製)を用いて取り除き、これをテンティング性評価用基板とした。上記テンティング性評価用基板の両面に上記感光性エレメントをラミネートし、上記LDI露光機を用いて、17mJ/cm2で全面露光した。次いでポリエチレンテレフタレートフィルムを剥離し、30℃で1.0質量%炭酸ナトリウム水溶液にて60秒間のスプレー現像を2回行った。現像後、穴破れ個数を目視で測定し、テント破れ率として評価し、これをテンティング性とした。テント破れ率は、低いほどテンティング性が高いことを示し、ゼロであることが望ましい。
上記ラミネート後の試験基板上に、剥離性評価用パターンとして60mm×45mmのパターンを有する描画データを使用し、日立41段ステップタブレットの現像後の残存ステップ段数が20.0となるエネルギー量で露光を行った。上記光感度及び解像度の評価と同様の条件で現像処理を行った後、50℃、3.0質量%水酸化ナトリウム水溶液にてビーカー浸漬し、レジストが基板表面から完全に剥離されるまでの時間(単位:秒)を剥離時間として評価し、これを剥離性とした。剥離時間は、短いほど剥離性が良好であることを示す。
上記ラミネート後の試験基板上に、レジスト形状評価用パターンとしてライン幅/スペース幅が5/5〜47/47(単位:μm)の配線パターンを有する描画データを使用し、日立41段ステップタブレットの現像後の残存ステップ段数が20.0となるエネルギー量で露光を行った。上記光感度の評価と同様の条件で現像処理を行った後、株式会社日立製作所製のS−2100A型走査型電子顕微鏡を用いてレジスト形状を観察した。
レジスト形状において、パターン断面が台形又は逆台形であると、エッチング又はめっき処理後に設計幅の配線パターンが得られない等の不都合が生じるため、パターン断面は矩形であることが好ましい。
Claims (9)
- 前記(B)エチレン性不飽和結合を少なくとも一つ有する光重合性化合物は、ビスフェノールA系(メタ)アクリレート化合物を含む、請求項1又は2に記載の感光性樹脂組成物。
- 前記(B)エチレン性不飽和結合を少なくとも一つ有する光重合性化合物は、ウレタンモノマーを含む、請求項1〜3のいずれか一項に記載の感光性樹脂組成物。
- 前記(B)エチレン性不飽和結合を少なくとも一つ有する光重合性化合物は、ノニルフェノキシポリアルキレンオキシ(メタ)アクリレートを含む、請求項1〜4のいずれか一項に記載の感光性樹脂組成物。
- 支持体と、該支持体上に形成された請求項1〜5のいずれか一項に記載の感光性樹脂組成物からなる感光性樹脂組成物層とを備える、感光性エレメント。
- 回路形成用基板上に形成された請求項1〜5のいずれか一項に記載の感光性樹脂組成物からなる感光性樹脂組成物層の所定部分に活性光線を照射し、露光部を光硬化させる照射工程と、
前記感光性樹脂組成物層の所定部分以外の部分を前記基板上から除去する除去工程とを含む、レジストパターンの形成方法。 - 回路形成用基板上に形成された請求項1〜5のいずれか一項に記載の感光性樹脂組成物からなる感光性樹脂組成物層の所定部分に、直接描画法により活性光線を画像状に照射し、露光部を光硬化させる照射工程と、
前記感光性樹脂組成物層の所定部分以外の部分を前記基板上から除去する除去工程とを含む、レジストパターンの形成方法。 - 請求項7又は8に記載のレジストパターンの形成方法によりレジストパターンが形成された回路形成用基板を、エッチング又はめっきする、プリント配線板の製造法。
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PCT/JP2009/060929 WO2009154194A1 (ja) | 2008-06-18 | 2009-06-16 | 感光性樹脂組成物、並びにこれを用いた感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造法 |
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US20120040290A1 (en) * | 2009-03-13 | 2012-02-16 | Hitachi Chemical Company, Ltd. | Photosensitive resin composition, and photosensitive element, resist pattern formation method and printed circuit board production method each utilizing same |
WO2011114593A1 (ja) * | 2010-03-19 | 2011-09-22 | 日立化成工業株式会社 | 感光性樹脂組成物並びにこれを用いた感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法 |
CN102375335B (zh) * | 2010-08-10 | 2015-04-15 | 日立化成工业株式会社 | 树脂组合物、感光性元件、抗蚀图形与线路板的制造方法 |
CN103076719B (zh) * | 2011-10-26 | 2019-08-09 | 日立化成株式会社 | 感光性树脂组合物、感光性元件、抗蚀图案的形成方法及印刷配线板的制造方法 |
CN103064253B (zh) * | 2012-12-05 | 2015-04-08 | 北京化工大学常州先进材料研究院 | 一种含有吖啶类氧化物的感光性组合物 |
KR101708343B1 (ko) * | 2013-12-27 | 2017-02-20 | 코오롱인더스트리 주식회사 | 드라이 필름 포토 레지스트용 감광성 수지 조성물 |
JP6673196B2 (ja) * | 2014-05-13 | 2020-03-25 | 日立化成株式会社 | 感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法 |
KR102061130B1 (ko) * | 2015-05-21 | 2020-02-20 | 창저우 트론리 어드벤스드 일렉트로닉 머티어리얼스 컴퍼니, 리미티드 | 피라졸린계 증감제 및 그 제조방법과 응용 |
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JP2001272779A (ja) * | 2000-03-23 | 2001-10-05 | Hitachi Chem Co Ltd | 感光性樹脂組成物、これを用いた感光性エレメント、レジストパターンの製造法及びプリント配線板の製造法 |
JP2002323761A (ja) * | 2001-04-26 | 2002-11-08 | Asahi Kasei Corp | 感光性樹脂積層体 |
JP2008122920A (ja) * | 2006-10-18 | 2008-05-29 | Hitachi Chem Co Ltd | 感光性樹脂組成物及び感光性フィルム |
JP2008287227A (ja) * | 2007-04-17 | 2008-11-27 | Asahi Kasei Electronics Co Ltd | 感光性樹脂組成物及び積層体 |
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TWI369584B (ja) | 2012-08-01 |
CN102067037A (zh) | 2011-05-18 |
CN102067037B (zh) | 2013-07-24 |
KR101040475B1 (ko) | 2011-06-09 |
MY152017A (en) | 2014-08-15 |
KR20110005914A (ko) | 2011-01-19 |
JPWO2009154194A1 (ja) | 2011-12-01 |
WO2009154194A1 (ja) | 2009-12-23 |
CN103064250A (zh) | 2013-04-24 |
TW201007360A (en) | 2010-02-16 |
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