JP4507634B2 - Life presenting circuit, life presenting method, and recording / reproducing apparatus - Google Patents

Description

  The present invention relates to a lifetime presentation circuit, a lifetime presentation method, and a recording / reproducing apparatus that can present the lifetime of an electronic device.

  In recent years, recording / reproducing apparatuses for recording / reproducing information signals by irradiating a signal surface of an optical recording medium with laser light have been widely used. In this recording / reproducing apparatus, a semiconductor laser is used as a light source for irradiating laser light.

  Since the semiconductor laser deteriorates with time, it is necessary to replace the semiconductor laser before a problem occurs in the recording / reproducing operation. Therefore, in order to inform the user of the replacement time of the semiconductor laser, a method of accumulating the laser emission time and determining whether or not the accumulated emission time has reached the operation guarantee time presented by the semiconductor laser manufacturer has been proposed. (For example, refer to Patent Document 1).

JP 2002-197709 A

  However, since the lifetime of the semiconductor laser depends on the temperature as conventionally known, the lifetime of the semiconductor laser varies significantly depending on the use environment. Therefore, it is difficult to accurately notify the user of the replacement timing of the semiconductor laser simply by accumulating the laser emission time without considering the use environment of the semiconductor laser.

  Accordingly, an object of the present invention is to provide a lifetime presentation circuit, a lifetime presentation method, and a recording / reproducing apparatus that can inform the user of the lifetime of the semiconductor laser more accurately.

In order to solve the above-mentioned problem, the first invention includes a temperature detection means for detecting a temperature of an electronic device whose lifetime depends on temperature,
A measuring means for measuring the operating time of the electronic device;
A deriving means for deriving a weighting coefficient according to the deviation from the average temperature of the actual use environment from the temperature at the time of operation of the electronic device;
Deriving means, deriving a weighting coefficient from the temperature of the electronic device detected by the temperature detecting means, correcting the operating time using the derived weighting coefficient, and accumulating means for accumulating the corrected operating time;
Display means for displaying the accumulated operating time , and
The deriving means substitutes a temperature table in which the temperature during operation of the electronic device and the weighting coefficient according to the deviation from the average temperature of the actual use environment are related, or by substituting the temperature during operation of the electronic device, is a temperature correction function der Ru life presentation circuit for deriving a weighting factor corresponding to the deviation from the average temperature of the actual use environment.

The second invention detects the temperature of the electronic device whose lifetime depends on the temperature;
Measuring the operating time of the electronic device;
Deriving a weighting coefficient from the temperature of the electronic device detected by the detecting step using a deriving means for deriving the weighting coefficient according to the deviation from the average temperature of the actual use environment from the temperature at the time of operation of the electronic device; ,
Correcting the operating time using the derived weighting factor, accumulating the corrected operating time, and displaying the accumulated operating time ,
The deriving means substitutes a temperature table in which the temperature during operation of the electronic device and the weighting coefficient according to the deviation from the average temperature of the actual use environment are related, or by substituting the temperature during operation of the electronic device, is a temperature correction function der Ru life presentation method of deriving a weighted coefficient corresponding to the deviation from the average temperature of the actual use environment.

According to a third aspect of the invention, there is provided a semiconductor laser that emits laser light to a signal surface of a recordable optical disc;
A light receiving means for receiving the laser light reflected by the optical disc and outputting a signal corresponding to the received laser light;
Signal processing means for processing the recording signal supplied to the semiconductor laser and processing the reproduction signal supplied from the light receiving means;
Temperature detecting means for detecting the temperature of the semiconductor laser;
A measuring means for measuring the operating time of the semiconductor laser;
A deriving means for deriving a weighting coefficient according to the deviation from the average temperature of the actual use environment from the temperature at the time of operation of the semiconductor laser;
Deriving means, deriving a weighting coefficient from the temperature of the semiconductor laser detected by the temperature detecting means, correcting the operating time using the derived weighting coefficient, and accumulating the corrected operating time,
Display means for displaying the accumulated operating time , and
The deriving means substitutes a temperature table in which a temperature during operation of the semiconductor laser and a weighting factor according to a deviation from an average temperature of the actual use environment are associated, or a temperature during operation of the semiconductor laser, it is a temperature correction function der Ru recording and reproducing apparatus for deriving a weighting factor corresponding to the deviation from the average temperature of the actual use environment.

  According to the present invention, the temperature of the electronic device detected by the detecting means is derived using the deriving means for deriving the weighting coefficient corresponding to the deviation from the average temperature corresponding to the actual use environment from the temperature during operation of the electronic device. The operating time is corrected using the derived weighting factor, the corrected operating time is accumulated, and the accumulated operating time is displayed, so the progress of the accumulated operating time and the actual time There can be no significant difference between progress.

  As described above, according to the present invention, it is possible to prevent a great difference between the progress of the accumulated operation time and the progress of the real time. Therefore, the user can more accurately determine how much the electronic device is used and how long the replacement time is reached based on the accumulated operation time.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. In all the drawings of the following embodiments, the same or corresponding parts are denoted by the same reference numerals.

  First, in order to facilitate the understanding of the embodiment of the present invention, the contents of studies conducted by the present inventor in order to solve the above-described problems of the prior art will be described.

  First, a temperature table is created based on the “life temperature characteristics” of a semiconductor laser (Laser Diode) presented by a semiconductor laser manufacturer, and stored in advance in a memory such as a recording / reproducing apparatus. The temperature table is a table in which the temperature of the semiconductor laser is associated with a life factor for correcting the laser emission time. In this temperature table, the life coefficient corresponding to the reference temperature determined by the semiconductor manufacturer takes a value of “1”.

  Then, a lifetime coefficient corresponding to the temperature of the semiconductor laser is extracted from the temperature table, the laser emission time is corrected using the extracted lifetime coefficient, and the corrected emission time is accumulated and displayed. However, since the reference temperature determined by the semiconductor laser manufacturer is different from the reference temperature that becomes the reference in the actual use environment, the laser emission time is corrected using a life factor that deviates from the life factor “1”. End up. Therefore, there is a difference between the progress of the accumulated laser emission time and the progress of the real time, and the user determines how much the semiconductor laser is used to reach the replacement time based on the accumulated laser emission time. It becomes difficult.

  Thus, as a result of repeated studies, the present inventor has come up with the method shown in FIG. First, the average temperature in the actual use environment of the semiconductor laser is calculated, and the above-described temperature table is converted so that the calculated average temperature becomes the reference temperature. That is, the temperature table is converted so that the lifetime coefficient of the temperature table becomes “1” at the calculated average temperature.

  Then, a lifetime coefficient corresponding to the temperature of the semiconductor laser is extracted from the temperature table converted as described above, the laser emission time is corrected using the extracted lifetime coefficient, and the corrected laser emission time is accumulated. . In this method, since the average temperature in the actual use environment becomes the reference temperature, the laser emission time is corrected using the life coefficient near the life coefficient “1”. Therefore, there is no significant difference between the progress of the accumulated laser emission time and the progress of the real time, and how much the semiconductor laser is used to reach the replacement time based on the accumulated laser emission time. The user can judge more accurately. A temperature correction function f (T) for deriving a lifetime coefficient by substituting the temperature of the semiconductor laser is stored in memory instead of the temperature table, and the laser emission time is calculated using this temperature correction function f (T). May be corrected.

  FIG. 2 is a block diagram showing an example of the configuration of the life presentation circuit according to the first embodiment of the present invention. As shown in FIG. 2, this life presentation circuit includes a temperature detection means 2 for detecting the temperature of the semiconductor laser 1, a laser drive circuit 3, a timer 4, a ROM (Read Only Memory) 5, a display means 6 and a control unit 20. Prepare.

  The semiconductor laser 1 is a group III nitride semiconductor laser such as a GaN / GaInN semiconductor laser, and is configured to emit laser light having a wavelength of 395 nm to 415 nm, more specifically 405 nm, for example.

  The temperature detection unit 2 detects the temperature of the semiconductor laser 1 and supplies the detected temperature to the control unit 20. The laser drive circuit 3 controls the semiconductor laser 1 based on a signal supplied from the outside. The timer 4 measures time and supplies the measured time to the control unit 20. The control unit 20 controls each unit provided in the life presentation circuit. For example, a life presentation operation described later is performed by controlling each unit.

  The ROM 5 stores a temperature table and an operation guarantee time. The temperature table is a table in which the temperature of the semiconductor laser 1 is associated with the lifetime coefficient corresponding to the temperature of the semiconductor laser 1. As the ROM 5, it is preferable to use a rewritable ROM such as an EEPROM (Electrical Erasable Programmable ROM) in consideration of compatibility with data rewriting.

  This temperature table is created as follows, for example. First, a temperature table is created based on the “life temperature characteristics” of the semiconductor laser 1 presented by the semiconductor laser manufacturer. Then, the average temperature in the actual use environment of the semiconductor laser 1 is calculated, and the above-described temperature table is converted so that the calculated average temperature becomes the reference temperature. That is, the temperature table is converted so that the lifetime coefficient of the temperature table becomes “1” at the calculated average temperature.

  FIG. 3 is a schematic diagram illustrating an example of a temperature table stored in the ROM 5. The temperature center is a representative temperature when the temperature of the semiconductor laser 1 is in the temperature range a ≦ T <b, for example. The lifetime coefficient k is a weighting coefficient for weighting the laser emission time, and is a weighting coefficient for the laser emission time at the temperature center, for example.

  The operation guarantee time is a time for guaranteeing the operation of the semiconductor laser 1 at an average temperature in an actual use environment, and is predetermined by, for example, a semiconductor manufacturer. This guaranteed operation time is preferably defined in accordance with the device on which the semiconductor laser 1 is mounted and the use environment of the device. In order to avoid problems caused by the deterioration of the semiconductor laser 1 more reliably, the operation guarantee time is allowed to the maximum. It is preferable to make it shorter than the guaranteed operation time.

  The display means 6 includes, for example, a liquid crystal display unit, and displays various information on the liquid crystal display unit based on a signal supplied from the control unit 20. For example, the accumulated laser emission time and operation guarantee time are displayed. For example, the operation guarantee time is displayed by appropriately operating an operation unit (not shown).

  FIG. 4 is a flowchart for explaining an example of the life presentation operation of the life presentation circuit according to the first embodiment of the present invention.

  In step S11, a determination is made as to which range the temperature T supplied from the temperature detection means 2 belongs to within the temperature range a ≦ T <b (see FIG. 3) of the converted temperature table.

  In step S12, the life coefficient k corresponding to the temperature range determined in step S11 is extracted from the temperature table.

  In step S13, the laser emission time Δt is corrected using the lifetime coefficient k extracted in step S12. Specifically, the laser emission time Δt is multiplied by the reciprocal 1 / k of the life coefficient k.

  In step S14, a cumulative value Σ (Δt × 1 / k) is calculated. In step S15, the cumulative value Σ (Δt × 1 / k) is displayed on the display means 6.

  In step S16, it is determined whether or not the cumulative value Σ (Δt × 1 / k) exceeds the operation guarantee time stored in the ROM 5. If it is determined in step S16 that the guaranteed operation time has been exceeded, information for prompting the user that the semiconductor laser 1 has reached the end of its life is displayed on the display means 6 in step S17. If it is determined in step S16 that the guaranteed operation time has not been exceeded, the process returns to step S11.

  FIG. 5 shows an example of the configuration of a recording / reproducing apparatus provided with a life presentation circuit according to the first embodiment of the present invention. The optical disc D is formed by sequentially laminating, for example, an information signal portion and a light transmission layer on a substrate. For recording / reproducing information signals on this optical disc, for example, laser light having a wavelength in the range of 400 nm to 410 nm is condensed by an optical lens having a numerical aperture in the range of 0.84 to 0.86, and transmitted through the light. This is performed by irradiating the information signal portion from the layer side.

  At the time of recording, recording data to be recorded on the optical disc D is stored in the memory 18 via an ECC (Error Correction Coding) unit 19 and a memory controller 17. The memory controller 17 controls access to the memory 18 based on the control of the control unit 20. The control unit 20 includes a microcomputer and controls the recording / reproducing apparatus.

  For the recording data stored in the memory 18, an error correction code is generated for each error correction unit by the ECC unit 19. A product code can be used as an error correction code for video data and audio data. In the product code, the outer code is encoded in the vertical direction of the two-dimensional array of video data or audio data, the inner code is encoded in the horizontal direction, and the data symbols are encoded doubly. As the outer code and the inner code, a Reed-Solomon code can be used. A data unit completed with a product code is called an ECC block. The ECC block has a size of 64 kbytes (65536 bytes), for example. The memory controller 17 reads the ECC block from the memory 18 and supplies it as recording data to the modulation / demodulation unit 16. The modulation / demodulation unit 16 modulates the recording data to generate a recording signal, and supplies the recording signal to the laser driving circuit 3.

  The pickup unit 13 includes a semiconductor laser 1, a photoelectric conversion element 21, and temperature detection means 22. The semiconductor laser 1 outputs a laser beam based on the recording signal supplied from the laser driving circuit 3 and records the recording signal on the optical disc D that is rotationally driven by the spindle motor 12.

  The photoelectric conversion element 2 photoelectrically converts the reflected light from the optical disc D to generate a current signal and supplies it to an RF (Radio Frequency) amplifier 14. The RF amplifier 14 generates a focus error signal, a tracking error signal, and a reproduction signal based on the current signal from the photoelectric conversion element 21, and supplies the tracking error signal and the focus error signal to the servo control unit 15. Further, the RF amplifier 14 supplies a reproduction signal to the modulation / demodulation unit 16 during reproduction.

  The irradiation position of the laser beam is controlled to a predetermined position by a servo signal supplied from the servo control unit 15 to the pickup unit 13. That is, the servo control unit 15 controls the focus servo operation and the tracking servo operation. Specifically, the servo control unit 15 generates a focus servo signal and a tracking servo signal based on the focus error signal and the tracking error signal from the RF amplifier 14 and supplies them to an actuator (not shown) of the pickup unit 13. . The servo control unit 15 generates a spindle motor drive signal for driving the spindle motor 12 and controls a spindle servo operation for rotating the optical disc D at a predetermined rotation speed.

  Further, the servo control unit 15 performs thread control for moving the pickup unit 13 in the radial direction of the optical disc D and changing the irradiation position of the laser beam. The signal reading position of the optical disc D is set by the control unit 20, and the position of the pickup unit 13 is controlled so that a signal can be read from the set reading position.

  Based on the spindle motor drive signal from the servo controller 15, the spindle motor 12 rotationally drives the optical disc D with a constant linear velocity CLV (Constant Linear Velocity) or a constant angular velocity CAV (Constant Angler Velocity). The driving method of the spindle motor 12 can be switched between CLV and CAV based on a control signal from the control unit 20.

  At the time of reproduction, the pickup unit 13 condenses and irradiates the optical disc D with laser light, and supplies the RF amplifier 14 with a current signal obtained by photoelectrically converting reflected light from the optical disc D. The modulation / demodulation unit 16 demodulates the reproduction signal supplied from the RF amplifier 14 to generate reproduction data, and supplies the reproduction data to the memory controller 17. The memory controller 17 writes the supplied reproduction data into the memory 18. The reproduction data is read from the memory 18 in units of ECC blocks and supplied to the ECC unit 19.

  The ECC unit 19 performs error correction by decoding the error correction code of the supplied reproduction data in units of ECC blocks. When an error is detected exceeding the error correction capability of the error correction code, an error flag is set for the error correction unit without performing error correction.

According to the first embodiment of the present invention, the following effects can be obtained.
Since the temperature table is converted so that the average temperature in the actual use environment of the semiconductor laser 1 becomes the reference temperature, there is no significant difference between the progress of the accumulated light emission time and the progress of the real time. The user can more accurately determine how much the laser 1 is used and the time for replacement based on the accumulated value of the laser emission time displayed on the display means 6.

  Next explained is the second embodiment of the invention. In the first embodiment described above, the temperature table is stored in the ROM 5 as an example. However, in the second embodiment of the present invention, the temperature correction function f (T) is stored in the ROM 5. A case will be described as an example.

  The temperature correction function stored in the ROM 5 is defined as follows, for example. First, for example, a temperature correction function f ′ (T) is defined based on a plurality of temperature correction coefficients presented by a manufacturer.

  FIG. 6 is a graph showing an example of the temperature correction function f ′ (T). The temperature correction function f ′ (T) is defined such that the life coefficient is “1” when the reference temperature is 60 ° C.

  Next, the temperature correction function f ′ (T) is converted so that the life coefficient corresponding to the average temperature in the actual use environment is “1”, and the temperature correction function f (T) is obtained.

  FIG. 7 is a graph showing an example of the temperature correction function f (T). The temperature correction function f (T) is defined so that the life factor is 1 when the reference temperature is 53 ° C. As shown in FIG. 7, the temperature correction function f (T) monotonously decreases as the temperature rises, and by giving the temperature T, the life coefficient is uniquely determined.

  Since the configuration other than this is the same as that of the first embodiment described above, description thereof is omitted.

  FIG. 8 is a flowchart for explaining the life presentation operation of the life presentation circuit according to the second embodiment of the present invention.

  In step S21, the lifetime coefficient f (T) is calculated by substituting the temperature T supplied from the temperature detecting means 2 into the temperature correction function f (T).

  In step S22, the laser emission time Δt is corrected using the lifetime coefficient f (T) calculated in step S21. Specifically, the laser emission time Δt is multiplied by the reciprocal of the life coefficient f (T).

  In step S23, a cumulative value Σ (Δt × 1 / f (T)) is calculated. In step S24, the cumulative value Σ (Δt × 1 / f (T)) is displayed on the display means 6.

  In step S25, it is determined whether or not the cumulative value Σ (Δt × 1 / f (T)) exceeds the operation guarantee time stored in the ROM 5. If it is determined in step S25 that the guaranteed operation time has been exceeded, information for prompting the user that the semiconductor laser 1 has reached the end of its life is displayed on the display means 6 in step S26. If it is determined in step S25 that the operation guarantee time has not been exceeded, the process returns to step S21.

According to the second embodiment of the present invention, the following effects can be obtained.
Since the lifetime coefficient is calculated by substituting the temperature of the semiconductor laser 1 into the temperature correction function f (T), the laser emission time Δt can be corrected using the lifetime coefficient having a continuous value. Therefore, the laser emission time can be corrected more accurately than in the first embodiment. That is, the accumulated value can be corrected more accurately than in the first embodiment.

  Although the first and second embodiments of the present invention have been specifically described above, the present invention is not limited to the first and second embodiments described above, and various types based on the technical idea of the present invention. Can be modified.

  For example, the numerical values given in the first and second embodiments are merely examples, and different numerical values may be used as necessary.

  In the above-described first and second embodiments, the example in which the present invention is applied to the lifetime presenting circuit for correcting the laser emission time of the semiconductor laser has been described. The present invention is also applicable to the presentation circuit. For example, the present invention is also applicable to a life presentation circuit that accumulates the light emission time of light emitting means such as a light emitting diode and a high-pressure mercury lamp. The present invention is not limited to the light emitting means, but can be applied to other electronic devices whose lifetime depends on temperature.

  In the first and second embodiments described above, an example in which the present invention is applied to a recording / reproducing apparatus having one optical pickup has been described. However, for a recording / reproducing apparatus having two or more optical pickups. It is also possible to apply this invention. In this case, a temperature table or a temperature correction function f (T) corresponding to the semiconductor laser provided in each optical pickup is stored in the ROM.

  In the first and second embodiments described above, the example in which the accumulated value of the laser emission time is displayed on the display means has been described. However, the remaining time until the replacement time of the semiconductor laser is displayed on the display means. May be.

  In the first and second embodiments described above, an example in which a temperature table and a temperature correction function converted in advance so that the average temperature under the actual use environment becomes the reference temperature is stored in the ROM 5 has been described. However, the temperature presentation circuit may perform the process of calculating the average temperature under the actual use environment and converting the temperature table and the temperature correction function based on the calculated average temperature.

It is a basic diagram for demonstrating the outline | summary of embodiment of this invention. It is a block diagram which shows one structural example of the lifetime presentation circuit by 1st Embodiment of this invention. It is a basic diagram which shows an example of a temperature table. It is a flowchart for demonstrating the lifetime presentation operation | movement of the lifetime presentation circuit by 1st Embodiment of this invention. It is a block diagram which shows the example of 1 structure of the recording / reproducing apparatus by 1st Embodiment of this invention. It is a graph which shows an example of temperature correction function f (T). It is a graph which shows an example of temperature correction function f '(T). It is a flowchart for demonstrating the lifetime presentation operation | movement of the lifetime presentation circuit by 2nd Embodiment of this invention.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Semiconductor laser, 2 ... Temperature detection means, 3 ... Laser drive circuit, 4 ... Timer, 5 ... ROM, 6 ... Display means

Claims (10)

Temperature detecting means for detecting the temperature of an electronic device whose lifetime depends on temperature;
Measuring means for measuring the operating time of the electronic device;
Deriving means for deriving a weighting coefficient according to the deviation from the average temperature of the actual use environment from the temperature at the time of operation of the electronic device,
Using the deriving means, a weighting coefficient is derived from the temperature of the electronic device detected by the temperature detecting means, the operating time is corrected using the derived weighting coefficient, and the corrected operating time is calculated. Accumulating means for accumulating;
Display means for displaying the accumulated operating time , and
The deriving means substitutes a temperature table in which a temperature at the time of operation of the electronic device and a weighting coefficient according to a deviation from an average temperature in an actual use environment are related, or a temperature at the time of operation of the electronic device. it the temperature correction function der Ru life presentation circuit for deriving a weighting factor corresponding to the deviation from the average temperature of the actual use environment.   2. The life presenting circuit according to claim 1, wherein when the accumulated operating time reaches a predetermined time, the display means displays the fact.   The life display circuit according to claim 1, wherein the display means displays the accumulated operation time and an operation guarantee time for guaranteeing an operation of the electronic device at an average temperature under an actual use environment.   The lifetime presentation circuit according to claim 1, wherein the weighting coefficient takes a value of “1” at an average temperature in an actual use environment. Detecting the temperature of an electronic device whose lifetime depends on temperature;
Measuring the operating time of the electronic device;
Deriving means for deriving the weighting coefficient according to the deviation from the average temperature in the actual use environment from the temperature at the time of operation of the electronic device, and deriving the weighting coefficient from the temperature of the electronic device detected by the detection step. And steps to
Correcting the operating time using the derived weighting factor, accumulating the corrected operating time, and displaying the accumulated operating time .
The deriving means substitutes a temperature table in which a temperature at the time of operation of the electronic device and a weighting coefficient according to a deviation from an average temperature in an actual use environment are related, or a temperature at the time of operation of the electronic device. it the temperature correction function der Ru life presentation method of deriving a weighted coefficient corresponding to the deviation from the average temperature of the actual use environment. The life presentation method according to claim 5 , further comprising a step of displaying on the display means when the accumulated operation time reaches a predetermined time after the step of accumulating the operation time. The life presentation method according to claim 5 , wherein in the step of displaying the operation time, the accumulated operation time and an operation guarantee time for guaranteeing an operation of the electronic device at an average temperature in an actual use environment are displayed. A semiconductor laser that emits laser light to the signal surface of a recordable optical disc;
A light receiving means for receiving the laser beam reflected by the optical disc and outputting a signal corresponding to the received laser beam;
Signal processing means for processing a recording signal supplied to the semiconductor laser and processing a reproduction signal supplied from the light receiving means;
Temperature detecting means for detecting the temperature of the semiconductor laser;
Measuring means for measuring the operating time of the semiconductor laser;
A deriving means for deriving a weighting coefficient according to a deviation from the average temperature of the actual use environment from the temperature at the time of operation of the semiconductor laser;
Using the deriving means, a weighting coefficient is derived from the temperature of the semiconductor laser detected by the temperature detecting means, the operating time is corrected using the derived weighting coefficient, and the corrected operating time is obtained. Accumulating means for accumulating;
Display means for displaying the accumulated operating time , and
The deriving means substitutes a temperature table in which a temperature during operation of the semiconductor laser is associated with a weighting coefficient corresponding to a deviation from an average temperature in an actual use environment, or a temperature during operation of the semiconductor laser. it the temperature correction function der Ru recording and reproducing apparatus for deriving a weighting factor corresponding to the deviation from the average temperature of the actual use environment. 9. The recording / reproducing apparatus according to claim 8, wherein when the accumulated operation time reaches a predetermined time, the display means displays the fact. 9. The recording / reproducing apparatus according to claim 8 , wherein the display means displays the accumulated operation time and an operation guarantee time for guaranteeing an operation of the semiconductor laser at an average temperature under an actual use environment.

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