JP4024531B2 - Thermistor built-in power semiconductor module - Google Patents
Thermistor built-in power semiconductor module Download PDFInfo
- Publication number
- JP4024531B2 JP4024531B2 JP2001383927A JP2001383927A JP4024531B2 JP 4024531 B2 JP4024531 B2 JP 4024531B2 JP 2001383927 A JP2001383927 A JP 2001383927A JP 2001383927 A JP2001383927 A JP 2001383927A JP 4024531 B2 JP4024531 B2 JP 4024531B2
- Authority
- JP
- Japan
- Prior art keywords
- power semiconductor
- semiconductor chip
- thermistor
- power
- copper circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
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- Power Conversion In General (AREA)
Abstract
Description
【0001】
【発明の属する技術分野】
本発明は,サーミスタを内蔵した電力用半導体モジュールに関するものである。
【0002】
【従来の技術】
IGBTまたはFETの電力用半導体チップを複数個,銅回路に固着して電気回路たとえばインバータを形成し,放熱用金属ベース下面及び端子金具の先端を除く全体を樹脂モールドした電力用半導体モジュールでは,通電する電流が大きくなりIGBT又はFETの温度が高くなるほどスイッチング損失が大きくなって,この損失が熱となって益々高温になり遂に半導体チップを焼損することがあった。このため上記半導体チップに通電する電流が制限値を越えるときはこれを検出するための電流検出手段と電流を停止する為の電流遮断手段を必要とした。使用環境の温度が高い場合には,負荷電流の変化が起こったとき使用中突然に電流が停止する事態も発生した。
【0003】
【発明が解決しようとする課題】
上記のようなIGBT又はFETなど半導体チップの温度が高くなるほどスイッチング損失が大きくなって,遂に半導体チップを焼損する従来の欠点を排除し,温度が高くなっても,これに伴ってスイッチング損失が大きくならない電力用半導体モジュールに改良することが本発明の目的である。
【0004】
【課題を解決するための手段】
上記の目的を達成するため、半導体チップの接合温度とスイッチング損失の関係を究明した。一方でIGBTまたはFETのゲート抵抗値とスイッチング損失の関係を究明し、スイッチング損失はゲート抵抗値の減少と共に小さくなる特性を見出したので、この特性を応用して以下に述べる構成とした。金属ベース上面に絶縁層を介して銅回路を形成し、該銅回路上には直列接続された2つのIGBT又はFETの電力用半導体チップを2組並列接続して、インバータ等の電気回路を形成した電力用半導体モジュールに於いて、電気回路を構成する要素である複数のIGBTまたはFETの各ゲートにそれぞれ直列に温度が高くなるにつれて抵抗値が小さくなるサーミスタを接続し、該サーミスタはIGBTまたはFETの電力用半導体チップに略同等の温度となるように電力用半導体チップに近い位置の銅回路に配置した。該半導体チップのゲートに該サーミスタが直列に接続されて制御端子金具に接続されて外部に導出される。該半導体チップの電力を外部へ接続するための電力端子金具を具備し、銅回路と該半導体チップとサーミスタ及び、電力端子金具と制御端子金具の先端を除く部分とを覆う充填材によって充填され、上記金属ベースの下面を露出して電力用半導体モジュールが形成される。
【0005】
上記半導体チップの近傍にサーミスタを配置し,該半導体チップのゲートに該サーミスタを直列接続して該サーミスタに直列に抵抗器を接続したり,更に該サーミスタと直列抵抗を接続したものに並列に抵抗器を接続して制御用端子に接続し導出されることも有効である。
【0006】
上記IGBT又はFETのゲートに直列にサーミスタが接続されると温度が高くなるにつれて抵抗値が小さくなるサーミスタの特性の影響を受けて,全合成抵抗のゲート抵抗値は高温になればなるほど小さくなる方向に作用する。従って上記のようにゲート抵抗が小であるとき,スイッチング損失が小であるから,高温になるにつれてスイッチング損失が小さくなる。
【0007】
【発明の実施の形態】
本発明による実施の形態を図1と図2によって説明する。図2おいて,5,6,7,8はIGBTまたはFETの電力用半導体素子で,電力用半導体素子5と6は直列に接続され,電力用半導体素子7と8は直列に接続されている。この電力用半導体素子の直列回路は並列に接続されてインバータの機能を持つ電気回路が構成されている。それぞれの電力用半導体素子5,6,7,8のゲートには,直列にサーミスタ9が接続され,このサーミスタ9と直列に抵抗10が接続され,さらにサーミスタ9と抵抗10との直列回路と並列に抵抗11が接続されて,電力用半導体素子のスイッチング損失が大きくならないにしている。
【0008】
図1はインバータの機能を持つ電気回路を構成した場合の電力用半導体モジュールの構造図を示す。金属ベース1の表面に絶縁層2を介して銅回路3が形成されている回路基板に電力用半導体チップ5,6,7,8やサーミスタ9,抵抗器10、11などのチップ部品が固着され,半導体チップ間は金属片12で電気接続されたり銅回路3で電気接続されている。サーミスタ9は該半導体チップに近い位置の銅回路3に配置され,半導体チップ温度に略同等になるように固着されている。該半導体チップのゲートはボンディングワイヤ15で電気接続されて,抵抗器10を介して制御端子金具13に接続されて導出される。抵抗器10を省いて制御端子金具13に直接接続される場合も有効であり,抵抗器11がゲートと制御端子金具13との中間に接続されることも有効である。金属ベース1の部品搭載側全体を図示しない充填材で覆って電力用半導体モジュールが形成される。充填材は例えばエポキシ樹脂などの充填用絶縁物である。
【0009】
電力用半導体チップ5,6,7,8は銅回路3にそれぞれ固着されていて該銅回路に接続された電力端子金具14によって外部に導出されている。制御端子金具13と電力用半導体チップ5,6,7,8のゲートの中間に接続されたサーミスタ9に直列接続の抵抗器10は抵抗値ゼロの場合もある,すなわちサーミスタ単体で要求される抵抗値が得られる場合には抵抗器10も抵抗器11も不要でありサーミスタ9から制御端子金具に直接接続される銅回路を形成することも有効である。以上に述べた実施例は基本回路に対してのみ図示しているが,半導体の保護回路部品を組み込んで一体化してしまう場合や,交流を直流に整流する回路などの周辺回路を構成する回路部品を組み込んで総合的な機能を持つ電力用半導体モジュールとして形成されることも実施例の範囲に含むものとする。
【0010】
【発明の効果】
本発明によれば,IGBTまたはFETなど電力用半導体チップの温度が高くなるほどスイッチング損失が大きくなって,益々高温になり遂に半導体チップを焼損するという従来の欠点を排除することが出来たので,電流検出手段や電流遮断手段を必要とした従来の電力半導体モジュールより小型に形成することが可能となり製作工数が低減出来たほか材料の削減により安価に提供でき,そのうえ省資源,省エネルギーにも寄与できたので工業的価値が大きい。
【図面の簡単な説明】
【図1】 本発明による一実施形態を示すサーミスタ内蔵電力用半導体モジュールの構造斜視図。
【図2】 本発明による一実施形態を示すサーミスタ内蔵電力用半導体モジュールの回路図。
【符号の説明】
1 金属ベース
2 絶縁層
3 銅回路
4 回路基板
5,6,7,8 電力用半導体チップ
9 サーミスタ
10,11 抵抗器
12 金属片
13 制御端子金具
14 電力端子金具
15 ボンディングワイヤ
16 充填材[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a power semiconductor module incorporating a thermistor.
[0002]
[Prior art]
In a power semiconductor module in which a plurality of IGBT or FET power semiconductor chips are fixed to a copper circuit to form an electric circuit, for example, an inverter, and the entire surface except the bottom surface of the heat dissipating metal base and the terminal fitting is resin molded. As the current flowing increases and the temperature of the IGBT or FET increases, the switching loss increases. This loss becomes heat, and the semiconductor chip may eventually burn out. For this reason, when the current applied to the semiconductor chip exceeds the limit value, a current detecting means for detecting this and a current interrupting means for stopping the current are required. When the temperature of the usage environment was high, there was a situation where the current suddenly stopped during use when the load current changed.
[0003]
[Problems to be solved by the invention]
As the temperature of the semiconductor chip such as IGBT or FET as described above increases, the switching loss increases. Finally, the conventional defect of burning the semiconductor chip is eliminated, and the switching loss increases as the temperature increases. It is an object of the present invention to improve to a power semiconductor module that does not become.
[0004]
[Means for Solving the Problems]
In order to achieve the above object, the relationship between the semiconductor chip junction temperature and the switching loss was investigated. On the other hand, the relationship between the gate resistance value of the IGBT or FET and the switching loss was investigated, and the characteristic that the switching loss becomes smaller as the gate resistance value decreases was found. A copper circuit is formed on the upper surface of the metal base via an insulating layer, and two sets of power semiconductor chips of two IGBTs or FETs connected in series are connected in parallel on the copper circuit to form an electric circuit such as an inverter. In the power semiconductor module, a thermistor having a resistance value that decreases as the temperature rises in series is connected to each gate of a plurality of IGBTs or FETs that are elements constituting an electric circuit, and the thermistors are IGBTs or FETs. It was arranged on a copper circuit at a position close to the power semiconductor chip so as to have a temperature substantially equal to that of the power semiconductor chip . The thermistor is connected in series to the gate of the semiconductor chip, is connected to the control terminal fitting, and is led out to the outside. A power terminal fitting for connecting the power of the semiconductor chip to the outside is provided, and is filled with a filler that covers the copper circuit, the semiconductor chip and the thermistor, and the power terminal fitting and the portion excluding the tip of the control terminal fitting, A power semiconductor module is formed by exposing the lower surface of the metal base.
[0005]
A thermistor is disposed in the vicinity of the semiconductor chip, the thermistor is connected in series to the gate of the semiconductor chip, and a resistor is connected in series to the thermistor. It is also effective to connect and connect to a control terminal.
[0006]
When a thermistor is connected in series to the gate of the IGBT or FET, the resistance value decreases as the temperature increases, and the gate resistance value of the total combined resistance decreases as the temperature increases. Act on. Therefore, when the gate resistance is small as described above, the switching loss is small, so that the switching loss decreases as the temperature increases.
[0007]
DETAILED DESCRIPTION OF THE INVENTION
An embodiment according to the present invention will be described with reference to FIGS. In FIG. 2,
[0008]
FIG. 1 is a structural diagram of a power semiconductor module when an electric circuit having an inverter function is configured. Chip components such as
[0009]
The
[0010]
【The invention's effect】
According to the present invention, since the switching loss increases as the temperature of the power semiconductor chip such as IGBT or FET increases, the conventional defect that the semiconductor chip is burned out at higher temperatures can be eliminated. It can be made smaller than conventional power semiconductor modules that require detection means and current interrupting means, and the number of manufacturing steps can be reduced. In addition, it can be provided at low cost by reducing the materials, and also contributes to resource and energy savings. So industrial value is great.
[Brief description of the drawings]
FIG. 1 is a structural perspective view of a power semiconductor module with a built-in thermistor according to an embodiment of the present invention.
FIG. 2 is a circuit diagram of a thermistor built-in power semiconductor module according to an embodiment of the present invention.
[Explanation of symbols]
DESCRIPTION OF
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2001383927A JP4024531B2 (en) | 2001-12-18 | 2001-12-18 | Thermistor built-in power semiconductor module |
Applications Claiming Priority (1)
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JP2001383927A JP4024531B2 (en) | 2001-12-18 | 2001-12-18 | Thermistor built-in power semiconductor module |
Publications (2)
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JP2003188336A JP2003188336A (en) | 2003-07-04 |
JP4024531B2 true JP4024531B2 (en) | 2007-12-19 |
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JP2001383927A Expired - Fee Related JP4024531B2 (en) | 2001-12-18 | 2001-12-18 | Thermistor built-in power semiconductor module |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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US9917435B1 (en) | 2016-09-13 | 2018-03-13 | Ford Global Technologies, Llc | Piecewise temperature compensation for power switching devices |
US10122357B2 (en) | 2016-11-14 | 2018-11-06 | Ford Global Technologies, Llc | Sensorless temperature compensation for power switching devices |
Families Citing this family (14)
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TW200530566A (en) | 2004-03-05 | 2005-09-16 | Hitachi Ind Equipment Sys | Method for detecting temperature of semiconductor element and semiconductor power converter |
JP4366269B2 (en) * | 2004-07-30 | 2009-11-18 | 株式会社日立産機システム | Semiconductor element temperature detection method and power conversion device |
JP4802499B2 (en) * | 2005-01-07 | 2011-10-26 | トヨタ自動車株式会社 | Power control circuit and vehicle |
JP4816182B2 (en) * | 2006-03-23 | 2011-11-16 | 株式会社日立製作所 | Switching element drive circuit |
US8420987B2 (en) | 2008-11-18 | 2013-04-16 | Electronics And Telecommunications Research Institute | Thermistor with 3 terminals, thermistor-transistor, circuit for controlling heat of power transistor using the thermistor-transistor, and power system including the circuit |
KR101312267B1 (en) * | 2008-11-18 | 2013-09-25 | 한국전자통신연구원 | Thermistor with 3 terminals, thermistor-transistor, circuit for controlling heat of power transistor using the same thermistor-transistor, and power system comprising the same circuit |
DE102011007271B4 (en) | 2010-04-19 | 2022-08-11 | Electronics And Telecommunications Research Institute | Variable gate field effect transistor |
JP6040656B2 (en) * | 2012-09-13 | 2016-12-07 | 富士電機株式会社 | Semiconductor device |
JP6044215B2 (en) | 2012-09-13 | 2016-12-14 | 富士電機株式会社 | Semiconductor device |
DE102013112261B4 (en) * | 2013-11-07 | 2023-01-26 | Semikron Elektronik Gmbh & Co. Kg | power semiconductor circuit |
DE112019007678T5 (en) | 2019-08-27 | 2022-06-15 | Mitsubishi Electric Corporation | POWER SEMICONDUCTOR MODULE AND POWER CONVERTER |
JP7322654B2 (en) | 2019-10-15 | 2023-08-08 | 富士電機株式会社 | semiconductor module |
JP7396118B2 (en) | 2020-02-28 | 2023-12-12 | 富士電機株式会社 | semiconductor module |
JP7508946B2 (en) | 2020-08-26 | 2024-07-02 | 富士電機株式会社 | Semiconductor Module |
-
2001
- 2001-12-18 JP JP2001383927A patent/JP4024531B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9917435B1 (en) | 2016-09-13 | 2018-03-13 | Ford Global Technologies, Llc | Piecewise temperature compensation for power switching devices |
US10122357B2 (en) | 2016-11-14 | 2018-11-06 | Ford Global Technologies, Llc | Sensorless temperature compensation for power switching devices |
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Publication number | Publication date |
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JP2003188336A (en) | 2003-07-04 |
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