JP3905889B2 - ドライバ回路 - Google Patents
ドライバ回路 Download PDFInfo
- Publication number
- JP3905889B2 JP3905889B2 JP2004024464A JP2004024464A JP3905889B2 JP 3905889 B2 JP3905889 B2 JP 3905889B2 JP 2004024464 A JP2004024464 A JP 2004024464A JP 2004024464 A JP2004024464 A JP 2004024464A JP 3905889 B2 JP3905889 B2 JP 3905889B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- output
- buffer circuit
- circuit
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004088 simulation Methods 0.000 claims description 63
- 230000000295 complement effect Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
- H03F1/302—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in bipolar transistor amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
- H03F3/3069—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor the emitters of complementary power transistors being connected to the output
- H03F3/3076—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor the emitters of complementary power transistors being connected to the output with symmetrical driving of the end stage
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/4508—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using bipolar transistors as the active amplifying circuit
- H03F3/45085—Long tailed pairs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/50—Amplifiers in which input is applied to, or output is derived from, an impedance common to input and output circuits of the amplifying element, e.g. cathode follower
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/018—Coupling arrangements; Interface arrangements using bipolar transistors only
- H03K19/01825—Coupling arrangements, impedance matching circuits
- H03K19/01831—Coupling arrangements, impedance matching circuits with at least one differential stage
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/504—Indexing scheme relating to amplifiers the supply voltage or current being continuously controlled by a controlling signal, e.g. the controlling signal of a transistor implemented as variable resistor in a supply path for, an IC-block showed amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/516—Some amplifier stages of an amplifier use supply voltages of different value
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45508—Indexing scheme relating to differential amplifiers the CSC comprising a voltage generating circuit as bias circuit for the CSC
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45702—Indexing scheme relating to differential amplifiers the LC comprising two resistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/72—Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
- H03F2203/7203—Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal the gated amplifier being switched on or off by a switch in the bias circuit of the amplifier controlling a bias current in the amplifier
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Logic Circuits (AREA)
- Liquid Crystal Display Device Control (AREA)
- Manipulation Of Pulses (AREA)
- Amplifiers (AREA)
Description
Claims (9)
- 与えられる入力信号に応じた出力信号を出力するドライバ回路であって、
前記入力信号に応じた出力基本電圧を出力する電圧生成部と、
前記電圧生成部が出力した前記出力基本電圧に応じた出力電圧を出力する第1のバッファ回路と、
前記第1のバッファ回路より消費電力が大きく、前記出力電圧に応じた電圧を生成して前記出力信号として出力する第2のバッファ回路と、
前記第1のバッファ回路と略同一の特性の模擬バッファ回路を有し、前記電圧生成部が出力した前記出力基本電圧に応じた模擬電圧を生成する模擬回路と、
前記模擬電圧に基づいて、前記電圧生成部が出力する前記出力基本電圧を制御する制御部と
を備えるドライバ回路。 - 前記第2のバッファ回路は、前記第1のバッファ回路より、出力する電圧の温度依存性が小さい
請求項1に記載のドライバ回路。 - 前記制御部は、前記模擬電圧と、前記出力電圧の期待値との差分に基づいて、前記電圧生成部が出力する前記出力基本電圧を制御する
請求項2に記載のドライバ回路。 - 前記第1のバッファ回路は、コレクタ接地増幅回路であって、
前記第2のバッファ回路は、
前記ゲートに与えられる電圧に応じて前記出力信号を生成する出力トランジスタと、
前記出力トランジスタとコンプリメンタリ対を形成し、前記第1のバッファ回路が出力した前記出力電圧に応じた電圧を、前記出力トランジスタのゲートに供給する補償トランジスタと
を有する
請求項3に記載のドライバ回路。 - 前記電圧生成部は、
基準電流を生成する電流源と、
前記入力信号がHレベルを示す場合の前記出力電圧の期待値であるHレベル基準電圧が一端に与えられ、他端における電圧を前記第1のバッファ回路に出力する出力抵抗と、
前記入力信号がHレベルを示す場合に前記出力抵抗に前記基準電流を流さず、前記Hレベル基準電圧を前記第1バッファ回路に供給させ、前記入力信号がLレベルを示す場合に前記出力抵抗に前記基準電流を流し、前記Hレベル基準電圧から電圧降下した降下電圧を、前記第1のバッファ回路に供給させるスイッチと
を有し、
前記模擬回路は、前記第1のバッファ回路と略同一の特性を有し、前記降下電圧に応じた第1の模擬電圧を生成する第1の模擬バッファ回路を有し、
前記制御部は、前記第1の模擬電圧と、前記入力信号がLレベルを示す場合の前記出力電圧の期待値であるLレベル基準電圧との差分に基づいて、前記電流源が生成する前記基準電流の大きさを制御する第1のオペアンプを有する
請求項3に記載のドライバ回路。 - 前記制御部は、前記Hレベル基準電圧が与えられ、前記Hレベル基準電圧に応じた電圧を前記出力抵抗の前記一端に与える第2のオペアンプを更に有し、
前記模擬回路は、前記第1のバッファ回路と略同一の特性を有し、前記出力抵抗の前記一端に与えられる電圧に応じた第2の模擬電圧を生成する第2の模擬バッファ回路を更に有し、
前記第2のオペアンプは、前記第2の模擬電圧と、前記Hレベル基準電圧との差分に基づいて、前記出力抵抗の前記一端に与える電圧を制御する
請求項5に記載のドライバ回路。 - 前記模擬回路は、
前記電流源と並列に設けられ、前記基準電流の1/n倍(但しnは正の実数)の大きさの参照電流を生成する参照電流源と、
前記第2のオペアンプに対して前記出力抵抗と並列に設けられ、前記出力抵抗のn倍の抵抗値を有し、前記参照電流が流れることにより前記降下電圧と略同一の参照電圧を生成する参照抵抗と
を有し、
前記第1の模擬バッファ回路は、前記参照電圧に応じて前記第1の模擬電圧を生成し、
前記制御部は、前記第1の模擬電圧と、前記Lレベル基準電圧との差分に基づいて、前記参照電流源が生成する電流の大きさを更に制御する
請求項6に記載のドライバ回路。 - 前記電流源は、前記第1の駆動電流より小さい前記基準電流を生成する
請求項5に記載のドライバ回路。 - 前記第1のバッファ回路の電圧ゲインは略1であり、前記第2のバッファ回路の電圧ゲインは略1である
請求項3に記載のドライバ回路。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004024464A JP3905889B2 (ja) | 2004-01-30 | 2004-01-30 | ドライバ回路 |
PCT/JP2004/003041 WO2005074127A1 (en) | 2004-01-30 | 2004-03-09 | A driver circuit |
DE112004002703T DE112004002703T5 (de) | 2004-01-30 | 2004-03-09 | Treiberschaltkreis |
GB0617079A GB2430270B8 (en) | 2004-01-30 | 2004-03-09 | A driver circuit |
KR1020067017516A KR101126439B1 (ko) | 2004-01-30 | 2004-03-09 | 드라이버 회로 |
US11/495,144 US7528637B2 (en) | 2004-01-30 | 2006-07-28 | Driver circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004024464A JP3905889B2 (ja) | 2004-01-30 | 2004-01-30 | ドライバ回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005217949A JP2005217949A (ja) | 2005-08-11 |
JP3905889B2 true JP3905889B2 (ja) | 2007-04-18 |
Family
ID=34823938
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004024464A Expired - Fee Related JP3905889B2 (ja) | 2004-01-30 | 2004-01-30 | ドライバ回路 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7528637B2 (ja) |
JP (1) | JP3905889B2 (ja) |
KR (1) | KR101126439B1 (ja) |
DE (1) | DE112004002703T5 (ja) |
GB (1) | GB2430270B8 (ja) |
WO (1) | WO2005074127A1 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1801975A1 (en) * | 2005-12-21 | 2007-06-27 | STMicroelectronics S.r.l. | Output buffer |
JP2008016561A (ja) * | 2006-07-04 | 2008-01-24 | Produce:Kk | コンデンサの減圧による急速放電方法 |
TW200820571A (en) * | 2006-10-27 | 2008-05-01 | Fitipower Integrated Tech Inc | Driving device |
JP4900471B2 (ja) * | 2007-02-22 | 2012-03-21 | 富士通株式会社 | 入出力回路装置 |
US20080265950A1 (en) * | 2007-04-20 | 2008-10-30 | Scott Gary Sorenson | Low-power impedance-matched driver |
JPWO2008155917A1 (ja) * | 2007-06-19 | 2010-08-26 | パナソニック株式会社 | スイッチング素子駆動回路 |
US7856212B2 (en) * | 2007-08-07 | 2010-12-21 | Intel Corporation | Millimeter-wave phase-locked loop with injection-locked frequency divider using quarter-wavelength transmission line and method of calibration |
JP5522818B2 (ja) | 2007-12-18 | 2014-06-18 | フリースケール セミコンダクター インコーポレイテッド | 増幅回路 |
JP2013098599A (ja) * | 2011-10-28 | 2013-05-20 | Advantest Corp | ドライバ回路および試験装置 |
TWI602001B (zh) * | 2016-09-13 | 2017-10-11 | 友達光電股份有限公司 | 壓電感應器讀取電路 |
JP7096478B2 (ja) * | 2017-12-18 | 2022-07-06 | オンキヨー株式会社 | 増幅装置 |
JP7206472B2 (ja) * | 2018-05-07 | 2023-01-18 | オンキヨー株式会社 | 増幅装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0677784A (ja) | 1992-08-27 | 1994-03-18 | Hitachi Ltd | ドライバ回路 |
US5377202A (en) * | 1993-05-03 | 1994-12-27 | Raytheon Company | Method and apparatus for limiting pin driver offset voltages |
JP4532670B2 (ja) | 1999-06-07 | 2010-08-25 | 株式会社アドバンテスト | 電圧駆動回路、電圧駆動装置および半導体デバイス試験装置 |
US6294949B1 (en) * | 1999-06-07 | 2001-09-25 | Advantest Corporation | Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus |
GB0212436D0 (en) * | 2002-05-30 | 2002-07-10 | Ibm | Voltage controlled oscillator circuit and method |
JP3903861B2 (ja) | 2002-06-26 | 2007-04-11 | 日本電気株式会社 | 情報処理装置及び診断プログラム |
-
2004
- 2004-01-30 JP JP2004024464A patent/JP3905889B2/ja not_active Expired - Fee Related
- 2004-03-09 KR KR1020067017516A patent/KR101126439B1/ko active IP Right Grant
- 2004-03-09 DE DE112004002703T patent/DE112004002703T5/de not_active Withdrawn
- 2004-03-09 GB GB0617079A patent/GB2430270B8/en not_active Expired - Fee Related
- 2004-03-09 WO PCT/JP2004/003041 patent/WO2005074127A1/en active Application Filing
-
2006
- 2006-07-28 US US11/495,144 patent/US7528637B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB2430270A8 (en) | 2007-10-02 |
US20070001717A1 (en) | 2007-01-04 |
GB0617079D0 (en) | 2006-10-11 |
DE112004002703T5 (de) | 2006-12-07 |
GB2430270A (en) | 2007-03-21 |
WO2005074127A1 (en) | 2005-08-11 |
KR20070007294A (ko) | 2007-01-15 |
GB2430270B8 (en) | 2007-10-02 |
JP2005217949A (ja) | 2005-08-11 |
KR101126439B1 (ko) | 2012-03-28 |
US7528637B2 (en) | 2009-05-05 |
GB2430270B (en) | 2007-08-29 |
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