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JP2020159477A - Valve device, fluid control device using this valve device and semiconductor manufacturing device - Google Patents

Valve device, fluid control device using this valve device and semiconductor manufacturing device Download PDF

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JP2020159477A
JP2020159477A JP2019059802A JP2019059802A JP2020159477A JP 2020159477 A JP2020159477 A JP 2020159477A JP 2019059802 A JP2019059802 A JP 2019059802A JP 2019059802 A JP2019059802 A JP 2019059802A JP 2020159477 A JP2020159477 A JP 2020159477A
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flow path
valve
valve body
path
joint block
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JP7333577B2 (en
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隆司 余湖
Takashi Yoko
隆司 余湖
優樹 里見
Yuki Satomi
優樹 里見
雄太 茂木
Yuta Mogi
雄太 茂木
敏之 稲田
Toshiyuki Inada
敏之 稲田
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Fujikin Inc
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Abstract

To provide a valve device which allows a constant flow rate of fluid to flow from an inflow path to an outflow path even when the valve is closed, and which may easily respond to changes in bleed flow rate, and has improved maintainability.SOLUTION: A valve device comprises a valve body 11 having a first flow path 12, a second flow path 13A that communicates with the first flow path 12 when a valve opens, and a third flow path 13B that always communicates with the first flow path 12, a joint block 20 that has a common flow path 23 where the first flow path 22A connected to the second flow path 13A, the second flow path 22B connected to the third flow path 13B a fourth flow path 22A and a fifth flow path 22B merge, and is jointed by the valve body 11 and a fastening member BT, and a metal orifice gasket 50 that is arranged between the third flow path 13B of the valve body 11 and the fifth flow path 22B of the joint block 20 and is pressed by the valve body 11 and the joint block 20.SELECTED DRAWING: Figure 1

Description

この発明は、バルブ装置、このバルブ装置を用いた流体制御装置および半導体製造装置に関する。 The present invention relates to a valve device, a fluid control device using the valve device, and a semiconductor manufacturing device.

半導体製造プロセス等の各種製造プロセスにおいては、バルブが閉じた状態においても流入口から流出路に一定流量のガス等の流体を流すいわゆるブリードバルブが用いられることがある。
たとえば、特許文献1は、バルブシートにブリード用の流通孔を設けることにより、バルブ閉状態であっても流入路から流出路に一定流量のガスを流すことができるバルブ装置を開示している。
In various manufacturing processes such as a semiconductor manufacturing process, a so-called bleed valve that allows a constant flow rate of a fluid such as gas to flow from the inflow port to the outflow path may be used even when the valve is closed.
For example, Patent Document 1 discloses a valve device capable of flowing a constant flow rate of gas from an inflow path to an outflow path even when the valve is closed by providing a flow hole for bleeding in the valve seat.

特開平8−14415号公報Japanese Unexamined Patent Publication No. 8-14415

特許文献1に開示されたバルブ装置では、ブリード用の流通孔を変更して流量を変更するのは容易ではない。また、ブリード用の流通孔に塵等が詰まって流量が変化したような場合に、メインテナンス性が良くない。 In the valve device disclosed in Patent Document 1, it is not easy to change the flow rate by changing the flow hole for bleeding. Further, when the flow hole for bleeding is clogged with dust or the like and the flow rate changes, the maintainability is not good.

本発明の一の目的は、バルブ閉状態であっても流入路から流出路に一定流量のガスを流すことができるバルブ装置であって、ブリード流量の変化に容易に対応でき、メインテナンス性も改善したバルブ装置を提供することにある。
本発明の他の目的は、上記のバルブ装置を用いた流体制御装置、半導体製造装置を提供することにある。
One object of the present invention is a valve device capable of flowing a constant flow rate of gas from the inflow path to the outflow path even when the valve is closed, which can easily respond to changes in the bleed flow rate and improve maintainability. The purpose is to provide a valve device.
Another object of the present invention is to provide a fluid control device and a semiconductor manufacturing device using the above valve device.

本発明のバルブ装置は、流体が流入する第1流路と、前記第1流路と弁が開くと連通する第2流路と、前記第1流路と常時連通する第3流路とを有するバルブボディと、
前記第2流路と接続される第4流路と前記第3流路と接続される第5流路と、前記第4流路と前記第5流路とが合流する共通流路とを有し、前記バルブボディと締結部材により連結される継手ブロックと、
前記バルブボディの第3流路の開口と前記継手ブロックの第5流路の開口との間に設けられ、かつ、前記バルブボディと前記継手ブロックにより圧せられる金属製のオリフィスガスケットと、を有する。
The valve device of the present invention has a first flow path through which a fluid flows, a second flow path that communicates with the first flow path when the valve opens, and a third flow path that always communicates with the first flow path. With the valve body
It has a fourth flow path connected to the second flow path, a fifth flow path connected to the third flow path, and a common flow path where the fourth flow path and the fifth flow path merge. Then, the joint block connected to the valve body by the fastening member,
It has a metal orifice gasket provided between the opening of the third flow path of the valve body and the opening of the fifth flow path of the joint block, and pressed by the valve body and the joint block. ..

好適には、前記バルブボディの第2流路の開口と前記継手ブロックの第4流路の開口との周囲に設けられ、かつ、前記バルブボディと前記継手ブロックにより圧せられる金属製のガスケットをさらに有する。 Preferably, a metal gasket provided around the opening of the second flow path of the valve body and the opening of the fourth flow path of the joint block and pressed by the valve body and the joint block. Have more.

さらに好適には、前記第1流路と前記第2流路と前記第3流路は、前記バルブボディの共通面で開口している。 More preferably, the first flow path, the second flow path, and the third flow path are open on a common surface of the valve body.

本発明の流体制御装置は、複数の流体機器が配列された流体制御装置であって、
前記複数の流体機器は、上記のバルブ装置を含む、構成である。
The fluid control device of the present invention is a fluid control device in which a plurality of fluid devices are arranged.
The plurality of fluid devices are configured to include the valve device described above.

本発明の半導体製造装置は、密閉されたチャンバ内においてプロセスガスによる処理工程を要する半導体装置の製造プロセスにおいて、前記プロセスガスの流量制御に上記のバルブ装置を用いた、構成である。 The semiconductor manufacturing apparatus of the present invention has a configuration in which the above valve device is used for controlling the flow rate of the process gas in the manufacturing process of the semiconductor device that requires a processing step with a process gas in a closed chamber.

本発明によれば、バルブ閉状態であっても流入路から流出路に一定流量の流体を流すことができるとともに、ブリード流量の変化に容易に対応でき、メインテナンス性も改善したバルブ装置が提供される。 According to the present invention, there is provided a valve device capable of flowing a constant flow rate of fluid from the inflow path to the outflow path even when the valve is closed, easily responding to changes in the bleed flow rate, and having improved maintainability. To.

本発明の一実施形態に係るバルブ装置の外観斜視図。The external perspective view of the valve device which concerns on one Embodiment of this invention. 図1のバルブ装置の内部構造を概略的に示す部分断面図。FIG. 3 is a partial cross-sectional view schematically showing the internal structure of the valve device of FIG. 半導体製造装置の構成の一例を示す概略図。The schematic which shows an example of the structure of the semiconductor manufacturing apparatus. 流体制御装置の一例を示す外観斜視図。The external perspective view which shows an example of the fluid control device.

以下、図面に基づいて、本発明の実施の形態について説明する。なお、本明細書および図面においては、機能が実質的に同様の構成要素には、同じ符号を使用することにより重複した説明を省略する。
なお、図中に示す矢印A,Bは、バルブ装置10に流れる流体の流れを示すものであって、矢印Aがバルブ装置10への流体の流入方向を示し、矢印Bがバルブ装置10からの流体の流出方向を示しているが、逆方向になってもよい。
Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the present specification and the drawings, the same reference numerals are used for components having substantially the same functions, thereby omitting duplicate description.
The arrows A and B shown in the figure indicate the flow of the fluid flowing through the valve device 10, the arrow A indicates the inflow direction of the fluid into the valve device 10, and the arrow B indicates the flow of the fluid from the valve device 10. The outflow direction of the fluid is shown, but it may be in the opposite direction.

図1および図2に示すように、バルブ装置10は、バルブボディ11、アクチュエータ15、ダイヤフラム19、下流側の継手ブロック20、上流側の継手ブロック40、オリフィスガスケット50、ガスケット51,52を有する。 As shown in FIGS. 1 and 2, the valve device 10 includes a valve body 11, an actuator 15, a diaphragm 19, a joint block 20 on the downstream side, a joint block 40 on the upstream side, an orifice gasket 50, and gaskets 51 and 52.

バルブボディ11は、上面視において矩形状を有しており、それぞれ底面から弁室11aに向かって延びる、本発明の第1流路としての流入路12と本発明の第2流路としての第1の流出路13Aおよび本発明の第3流路としての第2の流出路13Bが形成されている。
第1の流出路13Aは、弁室11aの底面で開口し、この開口の周囲にバルブシート16が設けられている。
流入路12および第2の流出路13Bの弁室11a側の端部は、環状の接続流路14により接続され、流入路12および第2の流出路13Bは常時連通している。
ダイヤフラム19は、接続流路14、バルブシート16および第1の流出路13Aの開口を覆うように配置され、ダイヤフラム19の外周縁部が押えアダプタ17を介してアクチュエータ15のケーシング15aの下端部によりバルブボディ11に押圧固定されている。
The valve body 11 has a rectangular shape when viewed from above, and extends from the bottom surface toward the valve chamber 11a, respectively, as an inflow path 12 as a first flow path of the present invention and a second flow path of the present invention. The outflow passage 13A of No. 1 and the second outflow passage 13B as the third flow path of the present invention are formed.
The first outflow passage 13A opens at the bottom surface of the valve chamber 11a, and a valve seat 16 is provided around the opening.
The ends of the inflow passage 12 and the second outflow passage 13B on the valve chamber 11a side are connected by an annular connecting flow path 14, and the inflow passage 12 and the second outflow passage 13B are always in communication with each other.
The diaphragm 19 is arranged so as to cover the opening of the connection flow path 14, the valve seat 16, and the first outflow path 13A, and the outer peripheral edge portion of the diaphragm 19 is formed by the lower end portion of the casing 15a of the actuator 15 via the pressing adapter 17. It is pressed and fixed to the valve body 11.

ダイヤフラム押え18は、アクチュエータ15により上下方向に駆動され、ダイヤフラム押え18によって弁体としてのダイヤフラム19がバルブシート16に押し付けられているバルブ閉状態では、流入路12と第1の流出路13Aとの連通は遮断される。ダイヤフラム19がバルブシート16から離れると、流入路12と第1の流出路13Aとが連通する。このように、バルブ装置10では、三方弁が構成されている。
アクチュエータ15は、例えば、空圧により駆動されるものが採用されるが、これに限定されるわけではない。
The diaphragm retainer 18 is driven in the vertical direction by the actuator 15, and the diaphragm 19 as a valve body is pressed against the valve seat 16 by the diaphragm retainer 18. In the valve closed state, the inflow passage 12 and the first outflow passage 13A are connected. Communication is cut off. When the diaphragm 19 is separated from the valve seat 16, the inflow path 12 and the first outflow path 13A communicate with each other. As described above, the valve device 10 is configured with a three-way valve.
As the actuator 15, for example, one driven by pneumatic pressure is adopted, but the actuator 15 is not limited to this.

継手ブロック20は、第1の流出路13Aと接続される本発明の第4流路としての第1流路22Aと、第2の流出路13Bと接続される本発明の第4流路としての第2流路22Bと、第1流路22Aと第2流路22Bとが合流する共通流路23とが形成されている。
継手ブロック40は、流入路12と接続される流路41が形成されている。
継手ブロック20,40は、複数の締結部材BTにより、バルブボディ11に締結される。
The joint block 20 serves as the first flow path 22A as the fourth flow path of the present invention connected to the first outflow path 13A and the fourth flow path of the present invention connected to the second outflow path 13B. A second flow path 22B and a common flow path 23 at which the first flow path 22A and the second flow path 22B merge are formed.
The joint block 40 is formed with a flow path 41 connected to the inflow path 12.
The joint blocks 20 and 40 are fastened to the valve body 11 by a plurality of fastening members BT.

オリフィスガスケット50は、バルブボディ11の第2の流出路13Bの開口と継手ブロック20の第2流路22Bの開口との間に設けられ、かつ、前記と前記継手ブロックにより圧せられる。オリフィスガスケット50は、金属製や合成樹脂製で、流体が通過するオリフィス孔(第2の流出路13Bおよび第2流路22Bの径よりも小径)を有し、バルブボディ11の第2の流出路13Bと継手ブロック20の第2流路22Bとの間をシールするシール部材としての役割と、オリフィス孔により流量を制限する役割とを果たす。 The orifice gasket 50 is provided between the opening of the second outflow passage 13B of the valve body 11 and the opening of the second flow path 22B of the joint block 20, and is pressed by the joint block. The orifice gasket 50 is made of metal or synthetic resin, has an orifice hole through which a fluid passes (a diameter smaller than the diameter of the second outflow path 13B and the second flow path 22B), and has a second outflow of the valve body 11. It serves as a sealing member that seals between the path 13B and the second flow path 22B of the joint block 20, and also serves to limit the flow rate by the orifice hole.

ガスケット51は、金属製や合成樹脂製で、バルブボディ11の第1の流出路13Aの開口と継手ブロック20の第1流路22Aの開口の周囲に設けられ、第1の流出路13Aと第1流路22Aとの間をシールする。
ガスケット52は、金属製や合成樹脂製で、バルブボディ11の流入路12の開口と継手ブロック40の流路41の開口の周囲に設けられ、流入路12と流路41の間をシールする。
The gasket 51 is made of metal or synthetic resin and is provided around the opening of the first outflow passage 13A of the valve body 11 and the opening of the first flow path 22A of the joint block 20, and is provided with the first outflow passage 13A and the first outflow passage 13A. Seal between 1 flow path 22A.
The gasket 52 is made of metal or synthetic resin and is provided around the opening of the inflow path 12 of the valve body 11 and the opening of the flow path 41 of the joint block 40 to seal between the inflow path 12 and the flow path 41.

上記構成のバルブ装置10では、バルブ閉状態では、継手ブロック40の流路41、バルブボディ11の流入路12、第2の流出路13Bを介してオリフィスガスケット50のオリフィス孔から一定流量の流体が共通流路23に供給される。すなわち、バルブ閉状態であっても流入路から流出路に一定流量の流体を流すことができるバルブ装置10が提供される。オリフィス孔を通じて流すブリード流量を変更したい場合には、その流量に合わせた径のオリフィスガスケット50に交換すれば容易に対応できる。オリフィスガスケット50の交換は、バルブボディ11を取り外すことで実施できるので、保守が非常に容易である。すなわち、バルブボディ11の底面(共通面)で3本の流路が開口されているので、バルブボディ11のみを取り外せば、ガスケットの交換が容易可能となる。また、バルブ開状態では、第2の流出路13Bはオリフィス孔により流量を制限されているので、第1の流出路13Aへの流体の供給が支配的になる。すなわち、1つのバルブを開閉することで、流量の異なる流体を提供することができる。言い換えれば、弁開閉で、選択的に大流量/小流量の供給ができる In the valve device 10 having the above configuration, when the valve is closed, a constant flow rate of fluid flows from the orifice hole of the orifice gasket 50 through the flow path 41 of the joint block 40, the inflow path 12 of the valve body 11, and the second outflow path 13B. It is supplied to the common flow path 23. That is, a valve device 10 capable of flowing a constant flow rate of fluid from the inflow path to the outflow path even when the valve is closed is provided. If it is desired to change the bleed flow rate flowing through the orifice hole, it can be easily dealt with by replacing it with an orifice gasket 50 having a diameter corresponding to the flow rate. Since the orifice gasket 50 can be replaced by removing the valve body 11, maintenance is very easy. That is, since the three flow paths are opened on the bottom surface (common surface) of the valve body 11, the gasket can be easily replaced by removing only the valve body 11. Further, in the valve open state, the flow rate of the second outflow passage 13B is restricted by the orifice hole, so that the supply of the fluid to the first outflow passage 13A becomes dominant. That is, by opening and closing one valve, fluids having different flow rates can be provided. In other words, by opening and closing the valve, it is possible to selectively supply a large flow rate / small flow rate.

次に、図3を参照して、上記したバルブ装置10の適用される半導体製造装置の一構成例について説明する。 Next, with reference to FIG. 3, a configuration example of a semiconductor manufacturing apparatus to which the valve device 10 described above is applied will be described.

図3に示す半導体製造装置1000は、密閉されたチャンバ(処理チャンバ800)内においてプロセスガスによる処理工程を要する半導体装置の製造プロセスにおいて、プロセスガスの流量制御にバルブ装置10を用いたものである。たとえば、図3に示す半導体製造装置1000は、原子層堆積法(ALD:Atomic Layer Deposition 法)による半導体製造プロセスを実行するためのシステムであり、600はプロセスガス供給源、700はガスボックス、710はタンク、800は処理チャンバ、900は排気ポンプを示している。 The semiconductor manufacturing apparatus 1000 shown in FIG. 3 uses a valve device 10 for controlling the flow rate of the process gas in the manufacturing process of the semiconductor device that requires a processing step with a process gas in a closed chamber (processing chamber 800). .. For example, the semiconductor manufacturing apparatus 1000 shown in FIG. 3 is a system for executing a semiconductor manufacturing process by an atomic layer deposition method (ALD), 600 is a process gas supply source, 700 is a gas box, and 710. Indicates a tank, 800 indicates a processing chamber, and 900 indicates an exhaust pump.

基板に膜を堆積させる処理プロセスにおいては、処理ガスを安定的に供給するためにガスボックス700から供給される処理ガスをバッファとしてのタンク710に一時的に貯留し、処理チャンバ800の直近に設けられたバルブ720を高頻度で開閉させてタンクからの処理ガスを真空雰囲気の処理チャンバへ供給する。 In the processing process of depositing a film on the substrate, the processing gas supplied from the gas box 700 is temporarily stored in the tank 710 as a buffer in order to stably supply the processing gas, and is provided in the immediate vicinity of the processing chamber 800. The valve 720 is opened and closed frequently to supply the processing gas from the tank to the processing chamber in a vacuum atmosphere.

ALD法は、化学気相成長法の1つであり、温度や時間等の成膜条件の下で、2種類以上の処理ガスを1種類ずつ基板表面上に交互に流し、基板表面上原子と反応させて単層ずつ膜を堆積させる方法であり、単原子層ずつ制御が可能であるため、均一な膜厚を形成させることができ、膜質としても非常に緻密に膜を成長させることができる。
ALD法による半導体製造プロセスでは、処理ガス(プロセスガス)の流量を精密に調整する必要があるとともに、基板の大口径化等により、処理ガスの流量をある程度確保する必要もある。
The ALD method is one of the chemical vapor deposition methods, in which two or more types of processing gases are alternately flowed onto the substrate surface one by one under film formation conditions such as temperature and time to form atoms on the substrate surface. It is a method of depositing films by reacting them one by one, and since it is possible to control each monatomic layer, it is possible to form a uniform film thickness and to grow the film very finely as a film quality. ..
In the semiconductor manufacturing process by the ALD method, it is necessary to precisely adjust the flow rate of the processing gas (process gas), and it is also necessary to secure the flow rate of the processing gas to some extent by increasing the diameter of the substrate.

ガスボックス700は、正確に計量したプロセスガスを処理チャンバ800に供給するために、各種の流体機器を集積化した流体制御装置をボックスに収容したものである。流体制御装置は、複数の流体機器が配列されたものである。バルブ装置10は、ガスボックス内に一流体機器として設けられる。 The gas box 700 houses a fluid control device in which various fluid devices are integrated in order to supply the accurately weighed process gas to the processing chamber 800. A fluid control device is an array of a plurality of fluid devices. The valve device 10 is provided as a one-fluid device in the gas box.

タンク710は、ガスボックス700から供給される処理ガスを一時的に貯留するバッファとして機能する。
処理チャンバ800は、ALD法による基板への膜形成のための密閉処理空間を提供する。
排気ポンプ900は、処理チャンバ800内を真空引きする。
The tank 710 functions as a buffer for temporarily storing the processing gas supplied from the gas box 700.
The processing chamber 800 provides a closed processing space for film formation on the substrate by the ALD method.
The exhaust pump 900 evacuates the inside of the processing chamber 800.

図4を参照して、本発明のバルブ装置10が適用される流体制御装置の一例を説明する。
図4に示す流体制御装置には、幅方向W1,W2に沿って配列され長手方向G1,G2に延びる金属製のベースプレートBSが設けられている。なお、W1は背面側、W2は正面側,G1は上流側、G2は下流側の方向を示している。ベースプレートBSには、複数の流路ブロック992を介して各種流体機器991A〜991Eが設置され、複数の流路ブロック992によって、上流側G1から下流側G2に向かって流体が流通する図示しない流路がそれぞれ形成されている。
An example of a fluid control device to which the valve device 10 of the present invention is applied will be described with reference to FIG.
The fluid control device shown in FIG. 4 is provided with a metal base plate BS arranged along the width directions W1 and W2 and extending in the longitudinal directions G1 and G2. W1 indicates the back side, W2 indicates the front side, G1 indicates the upstream side, and G2 indicates the downstream side. Various fluid devices 991A to 991E are installed in the base plate BS via a plurality of flow path blocks 992, and a flow path (not shown) in which a fluid flows from the upstream side G1 to the downstream side G2 by the plurality of flow path blocks 992. Are formed respectively.

ここで、「流体機器」とは、流体の流れを制御する流体制御装置に使用される機器であって、流体流路を画定するボディを備え、このボディの表面で開口する少なくとも2つの流路口を有する機器である。具体的には、開閉弁(二方弁)991A、レギュレータ991B、プレッシャーゲージ991C、開閉弁(三方弁)991D、マスフローコントローラ991E等が含まれるが、これらに限定されるわけではない。なお、導入管993は、上記した図示しない流路の上流側の流路口に接続されている。
バルブ装置10はこのような流体制御装置の一つの流体機器として用いられる。
Here, the "fluid device" is a device used for a fluid control device that controls a fluid flow, includes a body that defines a fluid flow path, and has at least two flow path ports that open on the surface of the body. It is a device having. Specifically, the on-off valve (two-way valve) 991A, the regulator 991B, the pressure gauge 991C, the on-off valve (three-way valve) 991D, the mass flow controller 991E, and the like are included, but the present invention is not limited thereto. The introduction pipe 993 is connected to a flow path port on the upstream side of the above-mentioned flow path (not shown).
The valve device 10 is used as one fluid device of such a fluid control device.

以上、本発明の実施の形態を説明したが、本発明は、上述した実施の形態に限定されるものではない。当業者であれば、本発明の範囲内で、種々の追加や変更等を行うことができる。 Although the embodiments of the present invention have been described above, the present invention is not limited to the above-described embodiments. A person skilled in the art can make various additions and changes within the scope of the present invention.

10 :バルブ装置
11 :バルブボディ
11a :弁室
12 :流入路(第1流路)
13A :第1の流出路(第2流路)
13B :第2の流出路(第3流路)
14 :接続流路
15 :アクチュエータ
15a :ケーシング
16 :バルブシート
17 :押えアダプタ
18 :ダイヤフラム押え
19 :ダイヤフラム
20 :継手ブロック
22A :第1流路(第4流路)
22B :第2流路(第5流路)
23 :共通流路
40 :継手ブロック
41 :流路
50 :オリフィスガスケット
51 :ガスケット
52 :ガスケット
600 :プロセスガス供給減
700 :ガスボックス
710 :タンク
720 :バルブ
800 :処理チャンバ
900 :排気ポンプ
991A :開閉弁(二方弁)
991B :レギュレータ
991C :プレッシャーゲージ
991D :開閉弁(三方弁)
991E :マスフローコントローラ
992 :流路ブロック
993 :導入管
1000 :半導体製造装置
BS :ベースプレート
BT :締結部材
10: Valve device 11: Valve body 11a: Valve chamber 12: Inflow path (first flow path)
13A: First outflow path (second flow path)
13B: Second outflow path (third channel)
14: Connection flow path 15: Actuator 15a: Casing 16: Valve seat 17: Presser adapter 18: Diaphragm presser 19: Diaphragm 20: Joint block 22A: First flow path (fourth flow path)
22B: 2nd flow path (5th flow path)
23: Common flow path 40: Joint block 41: Flow path 50: Orifice gasket 51: Gasket 52: Gasket 600: Process gas supply reduction 700: Gas box 710: Tank 720: Valve 800: Processing chamber 900: Exhaust pump 991A: Opening and closing Valve (two-way valve)
991B: Regulator 991C: Pressure gauge 991D: On-off valve (three-way valve)
991E: Mass flow controller 992: Flow path block 993: Introduction pipe 1000: Semiconductor manufacturing equipment BS: Base plate BT: Fastening member

Claims (5)

第1流路と、弁が開くと前記第1流路と連通する第2流路と、前記第1流路と常時連通する第3流路とを有するバルブボディと、
前記第2流路と接続される第4流路と前記第3流路と接続される第5流路と、前記第4流路と前記第5流路とが合流する共通流路とを有し、前記バルブボディと締結部材により連結される継手ブロックと、
前記バルブボディの第3流路の開口と前記継手ブロックの第5流路の開口との間に設けられ、かつ、前記バルブボディと前記継手ブロックにより圧せられるオリフィスガスケットと、を有するバルブ装置。
A valve body having a first flow path, a second flow path that communicates with the first flow path when the valve opens, and a third flow path that always communicates with the first flow path.
It has a fourth flow path connected to the second flow path, a fifth flow path connected to the third flow path, and a common flow path where the fourth flow path and the fifth flow path merge. Then, the joint block connected to the valve body by the fastening member,
A valve device having an orifice gasket provided between an opening of a third flow path of the valve body and an opening of a fifth flow path of the joint block and pressed by the valve body and the joint block.
前記バルブボディの第2流路の開口と前記継手ブロックの第4流路の開口との周囲に設けられ、かつ、前記バルブボディと前記継手ブロックにより圧せられるガスケットをさらに有する、請求項1に記載のバルブ装置。 The first aspect of the present invention further comprises a gasket provided around the opening of the second flow path of the valve body and the opening of the fourth flow path of the joint block and pressed by the valve body and the joint block. The valve device described. 前記第1流路と前記第2流路と前記第3流路は、前記バルブボディの共通面で開口している、請求項1又は2に記載のバルブ装置。 The valve device according to claim 1 or 2, wherein the first flow path, the second flow path, and the third flow path are open on a common surface of the valve body. 複数の流体機器が配列された流体制御装置であって、
前記複数の流体機器は、請求項1ないし3のいずれかに記載のバルブ装置を含む、流体制御装置。
It is a fluid control device in which multiple fluid devices are arranged.
The plurality of fluid devices are fluid control devices including the valve device according to any one of claims 1 to 3.
密閉されたチャンバ内においてプロセスガスによる処理工程を要する半導体装置の製造プロセスにおいて、前記プロセスガスの流量制御に請求項1ないし3のいずれかに記載のバルブ装置を用いた半導体製造装置。
A semiconductor manufacturing device using the valve device according to any one of claims 1 to 3 for controlling the flow rate of the process gas in a manufacturing process of a semiconductor device that requires a processing step with a process gas in a closed chamber.
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JP2007057474A (en) * 2005-08-26 2007-03-08 Fujikin Inc Gasket type orifice and pressure type flow control device using the same
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JPH10169881A (en) * 1996-12-03 1998-06-26 Benkan Corp Integrated gas panel and assembly method thereof
JP2001235099A (en) * 2000-02-21 2001-08-31 Ckd Corp Remounting system of process gas supply unit
JP2002130479A (en) * 2000-10-23 2002-05-09 Tokyo Electron Ltd Integrated fluid supplying device, seal material used in it, and semiconductor manufacturing device fitted therewith
JP2007057474A (en) * 2005-08-26 2007-03-08 Fujikin Inc Gasket type orifice and pressure type flow control device using the same
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Publication number Priority date Publication date Assignee Title
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