JP2013250110A - Calibration system, calibration method and calibration apparatus for laser measurement apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To calibrate a laser measurement apparatus without using a point whose spatial position relative to the laser measurement apparatus is known.SOLUTION: A calibration system includes a laser measurement apparatus, a calibration apparatus and a computer. The calibration apparatus has at least three markers including a first marker, a second marker and a third marker and at least the three markers are disposed in predetermined relative positional relation. The laser measurement apparatus measures positions of respective markers. The computer calculates a reference position to be a position of the first marker from the position of the second marker measured by the laser measurement apparatus and the position of the third marker measured by the measure measurement apparatus, calculates a measurement error of the laser measurement apparatus by a difference between the position of the first marker measured by the laser measurement apparatus and the reference position and generates a function of a distance up to a reflection object from the calculated measurement error.

Description

  The present invention relates to a calibration system that calibrates a laser measuring device that emits laser light and measures the position of a reflecting object using reflected light, and more particularly, a calibration device having a marker that reflects laser light and calibration using the calibration device. Regarding the method.

  The laser measuring device emits laser light and measures the distance to the reflecting object by the reflected light of the emitted laser light. Further, the direction of the reflecting object is measured by controlling the emitting direction of the laser light. Thereby, the laser measuring device can measure the relative position with respect to the reflecting object.

  The laser measuring device needs to calibrate the error by irradiating a reflecting object (for example, a reflecting mirror such as a prism) provided at a known distance with laser light. For example, a calibration method is disclosed that calibrates an error that occurs in distance data based on the color and gloss of an object to be measured when the distance is measured using a laser distance meter (see Patent Document 1).

JP 2004-333398 A

  The laser measuring device irradiates a reflecting object (for example, a reflecting mirror such as a prism) provided at a known distance with laser light, thereby reducing an error in a measurement result (for example, spatial position (x, y, z)). It is necessary to calibrate. For this reason, the point by which the relative spatial position was correctly measured with respect to the laser measuring device was required.

  However, when calibrating a laser measurement device, it is not always possible to prepare a point with an accurate spatial position, and the laser measurement device is calibrated without using a point whose spatial position is known relative to the laser measurement device. There is a need for a way to do that.

  An object of the present invention is to calibrate a laser measurement device without using a point whose spatial position is known relative to the laser measurement device.

  A typical example of the invention disclosed in the present application is as follows. That is, a laser measuring device that emits laser light and measures the position of a reflecting object by reflected light, a calibration device that has a marker that reflects the laser light emitted from the laser measuring device, and calibrates the laser measuring device A calibration system comprising: a calculator for performing a calculation, wherein the calibration apparatus includes at least three markers including a first marker, a second marker, and a third marker; The three markers are arranged in a predetermined relative positional relationship, the laser measurement device measures the position of each marker, and the calculator measures the second marker measured by the laser measurement device. A reference position which is the position of the first marker is calculated from the position of the first marker and the position of the third marker measured by the laser measuring apparatus, and the laser measuring apparatus Accordingly, the measurement error of the laser measurement device is calculated based on the difference between the measured position of the first marker and the reference position, and a function of the distance to the reflecting object is generated from the calculated measurement error. .

  According to the exemplary embodiment of the present invention, the laser measuring device can be calibrated without using a point whose spatial position is known relative to the laser measuring device.

It is a block diagram of the calibration system of the Example of this invention. It is a figure explaining the laser beam radiate | emitted from the laser measuring device of a present Example. It is a figure explaining the 1st structural example of the calibration apparatus of a present Example. It is a figure explaining the outline | summary of the calibration method of a present Example. It is a figure explaining the 2nd structural example of the calibration apparatus of a present Example. It is a figure explaining the 3rd structural example of the calibration apparatus of a present Example. It is a figure explaining the 4th structural example of the calibration apparatus of a present Example. It is a figure explaining the 5th structural example of the calibration apparatus of a present Example. It is a figure explaining the 6th structural example of the calibration apparatus of a present Example. It is a figure explaining the example of the measurement error obtained by the calibration method of a present Example. It is a figure explaining the relationship between the irradiation position of the laser beam in the disk-shaped marker of a present Example, and the center point of a marker. It is a figure explaining the relationship between the irradiation position of the laser beam in the spherical marker of a present Example, and the center point of a marker. It is a flowchart of the process which calculates | requires a calibration curve with the calibration method of a present Example. It is a flowchart of the process which calculates the calibration point of a present Example.

  FIG. 1 is a configuration diagram of a calibration system according to an embodiment of the present invention.

  The calibration system of this embodiment includes a computer 10, a laser measurement device 20, and a calibration device 30.

  The laser measuring device 20 emits laser light 21 and measures the distance to the reflecting object by measuring the phase of the reflected light of the emitted laser light 21. The laser measuring device 20 is mounted on a table such as a tripod and has a mechanism for changing the emitting direction of the laser light 21 up and down and left and right, and this mechanism measures the direction of the reflecting object. Thereby, the laser measuring device 20 can measure a relative position with respect to the reflecting object.

  In the calibration device 30, three or more markers 31, 32, 33 are connected by a frame 37, and the frame 37 is attached to an upper portion of a rod-shaped stand 36. The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed substantially horizontally on the ground, and holds the stand 36 substantially vertically. Details of the calibration of the calibration device 30 will be described later with reference to FIGS. 3, 5, 6, 7, 8, and 9.

  The computer 10 includes a calculation unit 11, an I / O interface 12, a display device 13, storage units 14 and 15, and a calibration parameter DB interface 16.

  The calculation unit 11 includes a processor that executes a program and a memory that stores the program. The memory of the calculation unit 11 stores a parameter management program, a data calibration calculation program, and a data synthesis program.

  The I / O interface 12 is a serial interface such as USB or RS-232C, or another parallel interface. A laser measuring device 20 is connected to the I / O interface 12, and the computer 10 can acquire the relative position data of the reflecting object from the laser measuring device 20.

  The display device 13 is a display device such as a liquid crystal display device, and displays a program execution result by the computer 10.

  The storage units 14 and 15 are nonvolatile storage devices such as a magnetic disk drive or a flash memory (SSD). The storage unit 14 stores laser measurement data acquired from the laser measurement device 20, and the storage unit 15 stores a calibration parameter DB calculated by a data calibration calculation program. The storage units 14 and 15 may be configured by physically or logically separate storage devices, or may be configured by one storage device.

  The calibration parameter DB interface 16 is an interface (database management system) for accessing the calibration parameter DB stored in the storage unit 15.

  As illustrated, the computer 10 may be configured separately from the laser measurement device 20 or may be incorporated in the laser measurement device 20.

  Further, the computer 10 may be physically constructed on one computer or physically constructed on a logical partition configured on one or a plurality of computers.

  Note that the program executed by the processor of the computer 10 is provided to the computer 10 via a non-volatile storage medium or a network. Therefore, the computer 10 may include an interface for reading a storage medium (CD-ROM, flash memory, etc.).

  FIG. 2 is a diagram for explaining the laser light 21 emitted from the laser measuring device 20 of the present embodiment.

  The laser beam 21 emitted from the laser measuring device 20 becomes an irradiation range 22 having a certain spread at a distance d from the laser measuring device 20.

  As described above, the laser measurement device 20 has a mechanism for changing the emission direction of the laser beam 21 up and down and left and right, and irradiates the laser beam by changing the emission direction of the laser beam 21 up and down and left and right, and reaches the reflection object. The distance and the direction of the reflecting object are measured, and the surrounding objects are scanned.

  FIG. 3 is a diagram illustrating a first configuration example of the calibration device 30 according to the present embodiment.

  In the calibration device 30 of the first example, as described above, the three markers 31, 32, and 33 are connected by the linear frame 37 so that the marker 31 is located in the center and the markers 32 and 33 are located on both sides. The frame 37 is attached to the upper part of a rod-shaped stand 36. The markers 31, 32, and 33 are disks or spheres having high light reflectance (for example, white), and are attached to the frame 37 so that the frame 37 passes through the center point of each marker.

  The relative positional relationship between the markers 31, 32, and 33 is determined by the position at which the markers 31, 32, and 33 are attached to the frame 37. That is, on the X axis, the marker 31 is attached to the midpoint of the markers 32 and 33, and the Y coordinate and Z coordinate of the markers 31, 32, and 33 are the same (in the actual calculation, the marker 32 And the average value of the coordinates of 33 may be the coordinates of the marker 31).

  The calibration device 30 of the first example is arranged so that the frame 37 extends in the X-axis direction and the markers are arranged in a direction orthogonal to the laser light irradiation direction (Y-axis direction). Further, when the markers 31, 32, and 33 are discs, they are arranged vertically (in a direction perpendicular to the laser light irradiation direction).

  The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed on the ground (horizontal plane) and holds the stand 36 substantially vertically. The stand 36 may be a tripod and may not have the base 35.

  The calibration device 30 of the first example can perform accurate calibration with a simple configuration with a small number of markers.

  FIG. 4 is a diagram for explaining the outline of the calibration method of this embodiment.

  The three markers of the calibration device 30 are Q (31), A (32), and B (33), respectively, the actual distance between AB is d, and the actual distance between AQ is t.

  The original position of the marker Q (its center is the reference point) is P, and the distance between APs is s. When the distance between AB measured by the laser measuring device 20 is 1 and the distance between AQ is q, d, t, s, and l have the relationship of the following formula (1).

  The position error x of the marker Q in the X-axis direction is expressed by the following equation (2).

  The measurement by the laser measuring device 20 causes errors not only in the X-axis direction but also in the Y-axis and Z-axis directions. Although FIG. 4 shows a calculation method for the X-axis direction, the same calculation is necessary for the Y-axis direction and the Z-axis direction.

  The position error (x, y, z) obtained in this way becomes a measurement error in the X-axis, Y-axis, and Z-axis directions at the distance D.

  FIG. 5 is a diagram illustrating a second configuration example of the calibration apparatus 30 according to the present embodiment.

  In the calibration device 30 of the second example, three markers 31, 32, 33 are connected by an equilateral triangle frame 37, and each marker is located at each vertex of an equilateral triangle constituted by the frame 37. The frame 37 is attached to the upper part of the rod-like stand 36 so that the apex to which the marker 31 is attached is in the vertical direction located at the upper part. The markers 31, 32, and 33 are disks or spheres having high light reflectance (for example, white), and are attached to the frame 37 so that the frame 37 passes through the center point of each marker.

  The relative positional relationship between the markers 31, 32, and 33 is determined by the position at which the markers 31, 32, and 33 are attached to the frame 37. That is, the X coordinate of the marker 31 is an average value of the X coordinate of the marker 32 and the X coordinate of the marker 33, and the Y coordinates of the markers 31, 32, and 33 are the same (in the actual calculation, the marker 32 and The average value of the 33 Y coordinates may be the Y coordinate of the marker 31). The Z coordinate of the marker 31 is obtained by multiplying the Z coordinate of the markers 32 and 33 (or an average value thereof) by the length of one side of the equilateral triangle and sin 60 ° (square root of 3/2). It is.

  In the calibration device 30 of the second example, the frame 37 exists in the ZX plane, and the markers are arranged in a plane orthogonal to the laser light irradiation direction (Y-axis direction). Further, when the markers 31, 32, and 33 are discs, the markers 31 are placed so as to be oriented in a direction perpendicular to the laser light irradiation direction.

  A weight 38 hangs down from the marker 31 with a thread, and the frame 37 is placed in a position that coincides with a target 39 provided at the center of the frame 37 on the lowermost side. . A level may be provided on the lowermost frame 37.

  The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed on the ground (horizontal plane) and holds the stand 36 substantially vertically. The stand 36 may be a tripod and may not have the base 35.

  The calibration device 30 of the second example can perform accurate calibration with a small number of markers. Further, since the frame 37 is triangular, its strength is strong and the marker position accuracy is high.

  FIG. 6 is a diagram illustrating a third configuration example of the calibration apparatus 30 according to the present embodiment.

  The calibration device 30 of the third example has four markers 31, 32, 33, and 34. The three markers 32, 33, and 34 are connected by an equilateral triangle frame 37, and each marker 32, 33, and 34 is located at each vertex of the equilateral triangle constituted by the frame 37. The marker 31 is arranged at the center of an equilateral triangle constituted by an equilateral triangle frame 37.

  The frame 37 is attached to the upper part of the bar-shaped stand 36 so that the apex to which the marker 34 is attached is located at the upper part. The markers 31, 32, 33, and 34 are discs or spheres having a high light reflectance (for example, white), and are attached to the frame 37 so that the frame 37 passes through the center point of each marker.

  The relative positional relationship between the markers 31, 32, 33, and 34 is determined by the position at which the markers 31, 32, 33, and 34 are attached to the frame 37. That is, the X coordinate of the marker 31 is an average value of the X coordinates of the markers 32, 33, and 34, and the Y coordinates of the markers 31, 32, 33, and 34 are the same (in the actual calculation, the marker 32, The average value of the coordinates of 33 and 34 may be the coordinates of the marker 31). The Z coordinate of the marker 31 is an average value of the Z coordinates of the markers 32, 33 and 34.

  In the calibration device 30 of the third example, the frame 37 exists in the ZX plane, and the markers are arranged in a plane orthogonal to the laser light irradiation direction (Y-axis direction). Further, when the markers 31, 32, 33, and 34 are discs, the markers 31 are arranged so as to be oriented perpendicular to the irradiation direction of the laser light.

  The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed on the ground (horizontal plane) and holds the stand 36 substantially vertically. The stand 36 may be a tripod and may not have the base 35.

  The calibration device 30 of the third example can calibrate more accurately than the calibration device using three markers by using four markers. Further, since the frame 37 is a triangle and a frame connecting the midpoints of the frames for calibrating the sides of the equilateral triangle is provided, the strength thereof is strong and the marker position accuracy is high.

  FIG. 7 is a diagram illustrating a fourth configuration example of the calibration apparatus 30 according to the present embodiment.

  As in the first example described above, the calibration device 30 of the fourth example has three markers 31, 32, 33 that are linear so that the marker 31 is located in the center and the markers 32, 33 are located on both sides. The frames 37 are connected to each other, and the frame 37 is attached to an upper portion of a rod-shaped stand 36. The markers 31, 32, and 33 are disks or spheres having high light reflectance (for example, white), and are attached to the frame 37 so that the frame 37 passes through the center point of each marker.

  The relative positional relationship between the markers 31, 32, and 33 is determined by the position at which the markers 31, 32, and 33 are attached to the frame 37. That is, on the X axis, the marker 31 is attached to the midpoint of the markers 32 and 33, and the Y coordinate and Z coordinate of the markers 31, 32, and 33 are the same (in the actual calculation, the marker 32 And the average value of the coordinates of 33 may be the coordinates of the marker 31).

  The calibration device 30 of the fourth example is a calibration device used when laser light is irradiated from above (for example, an aircraft), and markers are arranged in a direction orthogonal to the Z-axis direction (for example, the X-axis direction). Are arranged as follows. In addition, when the markers 31, 32, and 33 are discs, they are installed horizontally (the direction in which the markers 31 are perpendicular to the laser light irradiation direction). In addition, by providing a joint that can change the orientation of the frame 37 between the stand 36 and the frame 37 so that the marker faces upward, the calibration device of the first example described above can be used in the fourth example. It can also be used as a calibration device.

  The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed on the ground (horizontal plane) and holds the stand 36 substantially vertically. The stand 36 may be a tripod and may not have the base 35.

  The calibration device 30 of the fourth example can perform accurate calibration with a simple configuration with a small number of markers.

  FIG. 8 is a diagram illustrating a fifth configuration example of the calibration apparatus 30 according to the present embodiment.

  In the calibration device 30 of the fifth example, three markers 31, 32, and 33 are connected by an equilateral triangle frame 37, and each marker is located at each vertex of an equilateral triangle constituted by the frame 37. The frame 37 is attached to the upper part of the rod-shaped stand 36 so that the regular triangle formed by the frame 37 is positioned horizontally. For this reason, the level 37 is attached to the frame 37, and an equilateral triangle constituted by the frame 37 can be arranged horizontally. The frame 37 is attached to the upper part of a rod-shaped stand 36. The markers 31, 32, and 33 are disks or spheres having high light reflectance (for example, white), and are attached to the frame 37 so that the frame 37 passes through the center point of each marker.

  The relative positional relationship between the markers 31, 32, and 33 is determined by the position at which the markers 31, 32, and 33 are attached to the frame 37. That is, the X coordinate of the marker 31 is the average value of the X coordinate of the marker 32 and the X coordinate of the marker 33, the Y coordinate of the marker 31 is the Y coordinate of the markers 32 and 33, and the length of one side of the equilateral triangle is sin60. A value obtained by multiplying by a value obtained by multiplying by (square root of 3/2), and the Z coordinates of the markers 31, 32 and 33 are the same (in the actual calculation, the average of the Z coordinates of the markers 32 and 33) The value may be the Z coordinate of the marker 31).

  The calibration device 30 of the fifth example is a calibration device used when laser light is irradiated from above (for example, an aircraft) so that markers are arranged in a plane (XY plane) orthogonal to the Z-axis direction. Be placed. When the markers 31, 32, and 33 are discs, they are installed horizontally (the level 40 is oriented perpendicular to the direction of laser light irradiation). In addition, by providing a joint that can change the orientation of the frame 37 between the stand 36 and the frame 37 so that the marker faces upward, the calibration device of the second example described above can be used in the fifth example. It can also be used as a calibration device.

  The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed on the ground (horizontal plane) and holds the stand 36 substantially vertically. The stand 36 may be a tripod and may not have the base 35.

  The calibration device 30 of the fifth example can perform accurate calibration with a small number of markers. Further, since the frame 37 is triangular, its strength is strong and the marker position accuracy is high.

  FIG. 9 is a diagram illustrating a sixth configuration example of the calibration apparatus 30 according to the present embodiment.

  The calibration device 30 of the sixth example has four markers 31, 32, 33, and 34. The three markers 32, 33, and 34 are connected by an equilateral triangle frame 37, and each marker 32, 33, and 34 is located at each vertex of the equilateral triangle constituted by the frame 37. The marker 31 is arranged at the center of an equilateral triangle constituted by an equilateral triangle frame 37.

  The frame 37 is attached to the upper part of the rod-shaped stand 36 so that the regular triangle formed by the frame 37 is positioned horizontally. The frame 37 is attached to the upper part of a rod-shaped stand 36.

  The relative positional relationship between the markers 31, 32, 33, and 34 is determined by the position at which the markers 31, 32, 33, and 34 are attached to the frame 37. That is, the X coordinate of the markers 31 and 34 is the average value of the X coordinate of the marker 32 and the X coordinate of the marker 33, and the Y coordinate of the marker 31 is the average value of the Y coordinates of the markers 32, 33 and 34. , 32, 33 and 34 are the same (in the actual calculation, the average value of the Z coordinates of the markers 32, 33 and 34 may be used as the Z coordinate of the marker 31).

  The calibration device 30 of the sixth example is a calibration device used when laser light is irradiated from above (for example, an aircraft) so that markers are arranged in a plane (XY plane) orthogonal to the Z-axis direction. Be placed. In addition, when the markers 31, 32, and 33 are discs, they are installed horizontally (the direction in which the markers 31 are perpendicular to the laser light irradiation direction). In addition, by providing a joint that can change the orientation of the frame 37 between the stand 36 and the frame 37 so that the marker faces upward, the above-described calibration device of the third example is changed to that of the sixth example. It can also be used as a calibration device.

  The stand 36 is attached to the flat base 35 substantially vertically. The base 35 is placed on the ground (horizontal plane) and holds the stand 36 substantially vertically. The stand 36 may be a tripod and may not have the base 35.

  The calibration device 30 of the sixth example can calibrate more accurately than the calibration device using three markers by using four markers. Further, since the frame 37 is a triangle and a frame connecting the midpoints of the frames for calibrating the sides of the equilateral triangle is provided, the strength thereof is strong and the marker position accuracy is high.

  FIG. 10 is a diagram for explaining an example of the measurement error obtained by the calibration method of the present embodiment. This measurement error is stored in the storage unit (calibration parameter DB) 15 as a calibration curve.

  The measurement error (x, y, z) when the distance between the laser measuring device 20 and the calibration device 30 is D is obtained by the method shown in FIG. Then, at a plurality of distances D1, D2, and D3, a measurement error is obtained, a curve is fitted to the obtained measurement error, and calibration curves (ΔX, ΔY, ΔZ) are obtained.

  FIG. 11 is a diagram illustrating the relationship between the irradiation position of the laser beam and the center point of the marker in the disk-shaped marker of the present embodiment.

  One marker is irradiated with laser light a plurality of times, and the distance to the marker is measured in each irradiation. The average value of the measured distances is the distance to the marker center point.

  FIG. 12 is a diagram illustrating the relationship between the irradiation position of the laser beam and the center point of the marker in the spherical marker of the present embodiment.

  One marker is irradiated with laser light a plurality of times, and the distance to the marker is measured in each irradiation. If a known sphere equation is used, the coordinates of the center of the sphere can be obtained from the coordinates of the measurement point.

  That is, if the coordinates (xi, yi, zi) of each measurement point are substituted into the equation of a sphere whose center is the point C (xc, yc, zc) and radius r, the following three equations (3) (3 ') (3 ") is obtained.

  Using these three equations as a ternary quadratic equation for xc, yc, zc, the center coordinates (xc, yc, zc) of the sphere can be obtained.

  Whether the marker is a disk or a sphere, if the center point of the marker is included in the polygon connecting the irradiation points of the laser light irradiated multiple times, the accuracy is improved. Can be improved.

  FIG. 13 is a flowchart of processing for obtaining a calibration curve by the calibration method of the present embodiment. The calibration curves are calculated separately for the X direction, the Y direction, and the Z direction, as described above with reference to FIG.

  First, a parameter j for controlling the loop is set to 1 which is an initial value (S1).

  Thereafter, it is determined whether the parameter j is equal to or less than the number (m) of measurements for calibration (S2). If the parameter j is less than the number of measurements (m), the calibration point of this measurement point is calculated (S3). Details of the calculation of the calibration point are calculated using FIG.

  On the other hand, if the parameter j exceeds the number of measurements (m), the calibration points have been calculated for all the measurement points, and a calibration curve is obtained using the calculated calibration points (S4). For the curve fitting, a polynomial curve fitting by the least square method can be used.

  The calculated calibration curve is stored in the storage unit (calibration parameter DB) 15.

  FIG. 14 is a flowchart of the process for calculating the calibration point of this embodiment, and shows details of step S3 of the process for obtaining the calibration curve (FIG. 13).

  First, the coordinates of the reference point P are calculated using the coordinates of the m measurement points. The coordinates of the reference point P are calculated based on the relative positional relationship between the markers using the coordinates of the markers other than the marker Q (31).

  For example, in the calibration device 30 of the first example shown in FIG. 3, the coordinates of the reference point P can be calculated by the following equation (4).

  Further, in the calibration device 30 of the second example shown in FIG. 5, the coordinates of the reference point P can be calculated by the following equation (5).

  Moreover, in the calibration apparatus 30 of the 3rd example shown in FIG. 6, the coordinate of the reference point P is computable by the following formula | equation (6).

  Thereafter, the calibration parameter Δ is calculated using the following equation (7) (S32). In Expression (7), (xp, yp, zp) is the coordinates of the reference point P, and (xq, yq, zq) is the coordinates of the center point of the marker Q.

  Thereafter, the distance Dp from the reference point P is calculated using the following equation (8) (S33). In equation (8), (x0, y0, z0) are the coordinates of the origin O.

  Thereafter, a calibration point (Dp, Δ) is created (S34).

  According to the embodiment of the present invention, the laser measuring device can be accurately calibrated without using a point whose spatial position is known relative to the laser measuring device. More specifically, in the conventional calibration method, it is necessary to accurately know the spatial position (x, y, z) of the marker, but in the embodiment of the present invention, the relative space of a plurality of markers is determined. If only the position is known, the laser measuring device can be accurately calibrated. Therefore, the calibration method according to the embodiment of the present invention can be configured accurately at a low cost.

  Although the present invention has been described in detail with reference to the accompanying drawings, the present invention is not limited to such specific configurations, and various modifications and equivalents within the spirit of the appended claims Includes configuration.

Claims (11)

A laser measuring device that emits laser light and measures the position of a reflecting object by reflected light; and
A calibration device having a marker that reflects the laser light emitted from the laser measurement device;
A calibration system comprising: a calculator that performs calculations for calibrating the laser measuring device;
The calibration apparatus includes at least three markers including a first marker, a second marker, and a third marker, and the at least three markers are arranged in a predetermined relative positional relationship. And
The laser measurement device measures the position of each marker,
The calculator is
Calculating a reference position which is the position of the first marker from the position of the second marker measured by the laser measuring device and the position of the third marker measured by the laser measuring device;
The measurement error of the laser measurement device is calculated by the difference between the position of the first marker measured by the laser measurement device and the reference position,
A calibration system, wherein a function of a distance to the reflecting object is generated from the calculated measurement error. The calibration system according to claim 1,
The calibration system, wherein the second marker, the first marker, and the third marker are arranged on a horizontal straight line. The calibration system according to claim 1,
The first marker, the second marker, and the third marker are arranged on vertices of an equilateral triangle placed vertically,
The calibration system, wherein the second marker and the third marker are horizontally disposed on a base of the equilateral triangle. The calibration system according to claim 1,
The calibration apparatus includes a first marker, a second marker, a third marker, and a fourth marker,
The second marker, the third marker, and the fourth marker are arranged on vertices of an equilateral triangle that is installed vertically,
The calibration system according to claim 1, wherein the first marker is arranged at the center of the equilateral triangle. The calibration system according to any one of claims 1 to 4,
Each said marker is a disk or a sphere, The calibration system characterized by the above-mentioned. A calibration method for a laser measurement device using a calibration device having a marker that reflects a laser beam emitted from a laser measurement device, and a calculator that performs a calculation for calibrating the laser measurement device,
The calibration apparatus includes at least three markers including a first marker, a second marker, and a third marker, and the at least three markers are arranged in a predetermined relative positional relationship. And
The method
The calculator obtains the position of each marker measured by the laser measuring device,
The calculator calculates a reference position that is the position of the first marker from the acquired position of the second marker and the position of the third marker,
The calculator calculates a measurement error of the laser measurement device by a difference between the acquired position of the first marker and the reference position,
A calibration method, wherein the computer generates a function of a distance to the reflecting object from the calculated measurement error. A calibration device having a marker that reflects laser light emitted from a laser measuring device,
Having at least three of the markers, including a first marker, a second marker, and a third marker;
The at least three markers are arranged in a predetermined relative positional relationship,
The laser measuring device is connected to a computer that performs calculations for calibrating the device,
The positions of the second marker and the third marker are measured in order to calculate a reference position that is the position of the first marker,
The calibration device according to claim 1, wherein the first marker is measured in order to calculate a measurement error of the laser measurement device based on a difference from the reference position. The calibration device according to claim 7,
A frame that holds the marker in place;
A stand for holding the frame;
The frame is rod-shaped,
The second marker and the third marker are each attached to both ends of the frame,
The first marker is attached to a central portion of the frame;
Accordingly, the calibration apparatus is characterized in that the second marker, the first marker, and the third marker are arranged on a horizontal straight line. The calibration device according to claim 7,
A frame that holds the marker in place;
A stand for holding the frame;
The frame forms an equilateral triangle held vertically by the stand;
The second marker and the third marker are arranged at the apex of the equilateral triangle at the base of the equilateral triangle,
The calibration apparatus according to claim 1, wherein the first marker is arranged at another vertex of the equilateral triangle. The calibration device according to claim 7,
A frame that holds the marker in place;
A stand for holding the frame;
The frame forms an equilateral triangle held vertically by the stand;
The second marker, the third marker, and the fourth marker are arranged at vertices of the equilateral triangle,
From each side of the frame constituting the equilateral triangle, the frame extends to the inside of the equilateral triangle,
The calibration device according to claim 1, wherein the first marker is disposed at a center of the equilateral triangle by being attached to the frame extending inward. The calibration device according to any one of claims 7 to 10,
Each of the markers is a disk or a sphere.

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