JP2012235181A - 双方向スイッチおよびそれを利用した充放電保護装置 - Google Patents
双方向スイッチおよびそれを利用した充放電保護装置 Download PDFInfo
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- 230000002457 bidirectional effect Effects 0.000 title claims abstract description 78
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- 108091006146 Channels Proteins 0.000 description 7
- 230000003071 parasitic effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 101100464782 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) CMP2 gene Proteins 0.000 description 5
- 101100464779 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) CNA1 gene Proteins 0.000 description 5
- 239000000758 substrate Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 229910001416 lithium ion Inorganic materials 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 1
- 108010075750 P-Type Calcium Channels Proteins 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
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- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
- H01L29/7786—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT
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- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
- H01L29/7835—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with asymmetrical source and drain regions, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs
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- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
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Abstract
【解決手段】双方向スイッチ装置は,HEMTを有する双方向スイッチと,第1の条件時にHEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧未満の第1の電圧を印加してソースまたはドレインの他方の端子から一方の端子への第1の電流パスをオフにし,第2の条件時に他方の端子とゲートとの間に閾値電圧未満の第2の電圧を印加して一方の端子から他方の端子への第2の電流パスをオフにし,第3の条件時にHEMTのソース及びドレインとゲートとの間に閾値電圧より高い第3の電圧を印加して第1,第2の電流パスをオンにする制御回路とを有する。
【選択図】 図3
Description
図3は,本実施の形態における二次電池とそれに接続される負荷または充電器の構成を示す図である。二次電池100内には,電池を蓄積する電池セルCELLと,その電池セルCELLの2端子V1+,V1−のいずれかの電流路(図3の例では電池セルCELLの負端子V1−と外部端子102との間の電流路)に設けられた双方向スイッチQ0と,それを制御する制御回路110とを有する。双方向スイッチQ0は,電池セルCELLの正端子V1+と外部端子101との間の電流路に設けられてもよい。
HEMTを有する双方向スイッチと,
第1の条件時に前記HEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧未満の第1の電圧を印加して前記ソースまたはドレインの他方の端子から前記一方の端子への第1の電流パスをオフにし,第2の条件時に前記他方の端子とゲートとの間に前記閾値電圧未満の第2の電圧を印加して前記一方の端子から他方の端子への第2の電流パスをオフにし,第3の条件時に前記HEMTのソース及びドレインとゲートとの間に前記閾値電圧より高い第3の電圧を印加して前記第1,第2の電流パスをオンにする制御回路とを有する双方向スイッチ装置。
付記1において,
前記双方向スイッチは,双方向の電流経路に設けられ,
前記双方向スイッチは,単一の前記HEMTを有する双方向スイッチ装置。
電池セルの2端子のいずれかの電流経路に設けられ,HEMTを有する双方向スイッチと,
前記電池セルが第1の充電電圧を超える時に,前記HEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧未満の第1の電圧を印加して前記HEMTの充電電流パス方向をオフにし,前記前記第1の充電電圧より低い第2の充電電圧未満の時に,前記HEMTのソースまたはドレインの他方の端子とゲートとの間に前記閾値電圧未満の第2の電圧を印加して前記HEMTの放電電流パス方向をオフにし,前記第1の充電電圧より低く前記第2の充電電圧より高い時に,前記HEMTのソース及びドレインとゲートとの間に前記閾値電圧より高い第3の電圧を印加し前記HEMTの充電電流パスと放電電流パスの双方向パスをオンにする制御回路とを有する充放電保護装置。
付記3において,
前記制御回路は,前記電池セルの2端子間の充電電圧を監視する回路を有する充放電保護装置。
HEMTを有する双方向スイッチと,
第1の条件時に前記HEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧以上の第1の電圧を印加して前記ソースまたはドレインの他方の端子から前記一方の端子への第1の電流パスをオンにし,第2の条件時に前記一方の端子とゲートとの間と前記他方の端子とゲートとの間とに前記閾値電圧未満の第2の電圧を印加して前記第1の電流パスと前記一方の端子から他方の端子への第2の電流パスとをオフにする制御回路とを有する双方向スイッチ装置。
外部バス電源と内部回路との間に設けられ第1のHEMTを有する第1の双方向スイッチと,
内部電源と前記内部回路との間に設けられ第2のHEMTを有する第2の双方向スイッチと,
前記外部バス電源が規定の電圧を有し,前記内部電源が規定の電圧を有さない第1の条件のときに,前記第1のHEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧以上の第1の電圧を印加して前記第1のHEMTのソースまたはドレインの他方の端子から前記一方の端子への電流パスをオンにし,前記第2のHEMTのソース及びドレインとゲートとの間に閾値電圧未満の電圧を印加して双方向の電流パスをオフにし,前記内部電源が規定の電圧を有する第2の条件のときに,前記第1のHEMTのソース及びドレインとゲートとの間に閾値電圧未満の電圧を印加して双方向の電流パスをオフにし,前記第2のHEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧以上の第1の電圧を印加して前記第2のHEMTのソースまたはドレインの他方の端子から前記一方の端子への電流パスをオンにする制御回路とを有する双方向スイッチ装置。
付記6において,
前記外部バス電源は,USBバスの電源である双方向スイッチ装置。
付記1〜7のいずれかにおいて,
前記閾値電圧未満の第1または第2の定電圧は,ゼロ電圧より高く前記閾値電圧よりも低い電圧である双方向スイッチ装置。
付記1〜7のいずれかにおいて,
前記HEMTは,GaN半導体層の電子走行層を有する双方向スイッチ装置。
Q0:双方向スイッチ,HEMT CELL:電池セル
Claims (5)
- HEMTを有する双方向スイッチと,
第1の条件時に前記HEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧未満の第1の電圧を印加して前記ソースまたはドレインの他方の端子から前記一方の端子への第1の電流パスをオフにし,第2の条件時に前記他方の端子とゲートとの間に前記閾値電圧未満の第2の電圧を印加して前記一方の端子から他方の端子への第2の電流パスをオフにし,第3の条件時に前記HEMTのソース及びドレインとゲートとの間に前記閾値電圧より高い第3の電圧を印加して前記第1,第2の電流パスをオンにする制御回路とを有する双方向スイッチ装置。 - 請求項1において,
前記双方向スイッチは,双方向の電流経路に設けられ,
前記双方向スイッチは,単一の前記HEMTを有する双方向スイッチ装置。 - 電池セルの2端子のいずれかの電流経路に設けられ,HEMTを有する双方向スイッチと,
前記電池セルが第1の充電電圧を超える時に,前記HEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧未満の第1の電圧を印加して前記HEMTの充電電流パス方向をオフにし,前記前記第1の充電電圧より低い第2の充電電圧未満の時に,前記HEMTのソースまたはドレインの他方の端子とゲートとの間に前記閾値電圧未満の第2の電圧を印加して前記HEMTの放電電流パス方向をオフにし,前記第1の充電電圧より低く前記第2の充電電圧より高い時に,前記HEMTのソース及びドレインとゲートとの間に前記閾値電圧より高い第3の電圧を印加し前記HEMTの充電電流パスと放電電流パスの双方向パスをオンにする制御回路とを有する充放電保護装置。 - HEMTを有する双方向スイッチと,
第1の条件時に前記HEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧以上の第1の電圧を印加して前記ソースまたはドレインの他方の端子から前記一方の端子への第1の電流パスをオンにし,第2の条件時に前記一方の端子とゲートとの間と前記他方の端子とゲートとの間とに前記閾値電圧未満の第2の電圧を印加して前記第1の電流パスと前記一方の端子から他方の端子への第2の電流パスとをオフにする制御回路とを有する双方向スイッチ装置。 - 外部バス電源と内部回路との間に設けられ第1のHEMTを有する第1の双方向スイッチと,
内部電源と前記内部回路との間に設けられ第2のHEMTを有する第2の双方向スイッチと,
前記外部バス電源が規定の電圧を有し,前記内部電源が規定の電圧を有さない第1の条件のときに,前記第1のHEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧以上の第1の電圧を印加して前記第1のHEMTのソースまたはドレインの他方の端子から前記一方の端子への電流パスをオンにし,前記第2のHEMTのソース及びドレインとゲートとの間に閾値電圧未満の電圧を印加して双方向の電流パスをオフにし,前記内部電源が規定の電圧を有する第2の条件のときに,前記第1のHEMTのソース及びドレインとゲートとの間に閾値電圧未満の電圧を印加して双方向の電流パスをオフにし,前記第2のHEMTのソースまたはドレインの一方の端子とゲートとの間に閾値電圧以上の第1の電圧を印加して前記第2のHEMTのソースまたはドレインの他方の端子から前記一方の端子への電流パスをオンにする制御回路とを有する双方向スイッチ装置。
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JP2011100356A JP5711040B2 (ja) | 2011-04-28 | 2011-04-28 | 双方向スイッチおよびそれを利用した充放電保護装置 |
US13/368,763 US8675326B2 (en) | 2011-04-28 | 2012-02-08 | Bidirectional switch and charge/discharge protection device using same |
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JP5711040B2 (ja) | 2015-04-30 |
US20120275076A1 (en) | 2012-11-01 |
US8675326B2 (en) | 2014-03-18 |
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