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JP2006165586A5 - - Google Patents

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Publication number
JP2006165586A5
JP2006165586A5 JP2005373371A JP2005373371A JP2006165586A5 JP 2006165586 A5 JP2006165586 A5 JP 2006165586A5 JP 2005373371 A JP2005373371 A JP 2005373371A JP 2005373371 A JP2005373371 A JP 2005373371A JP 2006165586 A5 JP2006165586 A5 JP 2006165586A5
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JP
Japan
Prior art keywords
substrate
hand
unit
inspection apparatus
transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005373371A
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Japanese (ja)
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JP4671858B2 (en
JP2006165586A (en
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Publication date
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Priority to JP2005373371A priority Critical patent/JP4671858B2/en
Priority claimed from JP2005373371A external-priority patent/JP4671858B2/en
Publication of JP2006165586A publication Critical patent/JP2006165586A/en
Publication of JP2006165586A5 publication Critical patent/JP2006165586A5/ja
Application granted granted Critical
Publication of JP4671858B2 publication Critical patent/JP4671858B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Claims (8)

基板を収納する収納容器からの前記基板の取り出し及び収納を行なう送部と、
前記基板検査を行う検査部と、を備えた外観検査装置であって、
前記送部は、前記検査部に対して独立構成され、複数の装置レイアウトにして設置位置を変更可能であることを特徴とする外観検査装置。
A conveyance unit that performs retrieval and storage of the substrate from the receiving container receiving the substrate,
An inspection unit comprising an inspection unit for inspecting the substrate ,
The conveyance unit is configured independently for the inspection unit, inspection system, which is a capable of changing the installation position and corresponds to a plurality of devices layout.
送部は、前記検査部の操作部側に対して背面又は側面のいずれかの面を選択し、隣接して設置されることを特徴とする請求項1に記載の外観検査装置 Before SL conveyance unit, select one of the surfaces of the rear or side with respect to the operation portion side of the measurement part, the appearance inspection apparatus according to claim 1, characterized in that it is placed adjacent to. 検査部は、前記送部間で直接前記基板の受け渡しを行なう基板受け渡し位置を備え、前記基板受け渡し位置から検査位置に前記基板を移送する他の搬送部を備えることを特徴とする請求項1または2に記載の外観検査装置 Before SL inspection unit includes a substrate delivery position for delivery directly the substrate between the conveyance section, wherein Rukoto with other transport unit for transferring the substrate to the inspection position from the substrate transfer position The visual inspection apparatus according to claim 1 or 2 . 送部及び前記他の搬送部は、それぞれ前記基板を吸着保持するハンドを有し、前記基板の前記受け渡し位置において角度の異なる2方向の受け渡し方向からの前記搬送部の前記ハンド挿入に対して前記他の搬送部の前記ハンドが干渉しない配置とされたことを特徴とする請求項3に記載の外観検査装置 Before SL conveyance unit and the other transport unit, each said substrate has a hand held suction, to the hand insertion of the transport unit from the angle of two different directions of transfer direction in said delivery position of the substrate The appearance inspection apparatus according to claim 3, wherein the hand of the other transport unit is arranged so as not to interfere . 送部複数の連結アームを有する多関節型の搬送ロボットであり、前記搬送ロボットの前記連結アームの先端部に屈曲して設けられた第1のハンドを備え、
前記他の搬送部は、先端部に前記第1のハンドが前記2方向から入り込むよう受け渡し空間を有する略L字形状に形成され、前記基板を吸着保持する第2のハンドと、を備え、
前記第1のハンドが前記第2のハンドの長辺側の挿入方向から前記基板を受け渡しする際に、前記第2のハンドの長辺との干渉を避ける逃げ部を前記第1のハンドに形成されることを特徴とする請求項4に記載の外観検査装置
Before SL conveyance unit is articulated transfer robot having a plurality of connecting arms, comprising a first hand which is provided by bending the tip portion of the connecting arm of the transfer robot,
The other transport unit includes a second hand that is formed in a substantially L-shape having a transfer space so that the first hand enters from the two directions at a tip part, and holds the substrate by suction.
When the first hand delivers the substrate from the insertion direction on the long side of the second hand, an escape portion is formed in the first hand to avoid interference with the long side of the second hand. appearance inspection apparatus according to claim 4, characterized in that it is.
他の搬送部は、軸方向を中心に回転する回転軸を備えていることを特徴とする請求項3から5のいずれか1項に記載の外観検査装置 Before SL other transport unit, the appearance inspection apparatus according to any one of claims 3 5, characterized in that it comprises a rotary shaft that rotates about the axial direction. 前記他の搬送部は、複数の搬送アームからなり、
これら搬送アームは、前記第1の搬送部との前記基板受け渡し位置、前記検査位置との間を循環移送することを特徴とする請求項3から6のいずれか1項に記載の外観検査装置
The other transport unit includes a plurality of transport arms,
The visual inspection apparatus according to claim 3 , wherein the transfer arms circulate and transfer between the substrate transfer position with the first transfer unit and the inspection position .
前記搬送部又は前記他の搬送部は、前記基板を吸着保持する略L字形状に形成したハンドを有し、この略L字形状のハンドは、両端に設けた吸着孔を結ぶラインが前記基板の中心より外側に位置されたことを特徴とする請求項3から7のいずれか1項に記載の外観検査装置。 The transport unit or the other transport unit has a hand formed in a substantially L shape for sucking and holding the substrate, and the substantially L shaped hand has a line connecting suction holes provided at both ends. The visual inspection apparatus according to claim 3, wherein the visual inspection apparatus is located outside the center of the visual inspection apparatus.
JP2005373371A 2000-09-06 2005-12-26 Appearance inspection device Expired - Fee Related JP4671858B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005373371A JP4671858B2 (en) 2000-09-06 2005-12-26 Appearance inspection device

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2000270330 2000-09-06
JP2000280883 2000-09-14
JP2000285640 2000-09-20
JP2000285988 2000-09-20
JP2005373371A JP4671858B2 (en) 2000-09-06 2005-12-26 Appearance inspection device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2002525910A Division JP3975164B2 (en) 2000-09-06 2001-09-06 Substrate transport device and visual inspection device

Publications (3)

Publication Number Publication Date
JP2006165586A JP2006165586A (en) 2006-06-22
JP2006165586A5 true JP2006165586A5 (en) 2008-10-16
JP4671858B2 JP4671858B2 (en) 2011-04-20

Family

ID=36667152

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005373371A Expired - Fee Related JP4671858B2 (en) 2000-09-06 2005-12-26 Appearance inspection device

Country Status (1)

Country Link
JP (1) JP4671858B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4914761B2 (en) * 2007-05-16 2012-04-11 オリンパス株式会社 Appearance inspection device
JP2010036467A (en) * 2008-08-05 2010-02-18 Sharp Corp Module assembling device and its method
JP2014035315A (en) * 2012-08-10 2014-02-24 Hitachi High-Technologies Corp Disc conveyance unit and inspection device
JP6422695B2 (en) 2014-07-18 2018-11-14 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
KR101987895B1 (en) * 2017-02-02 2019-06-12 주식회사 투윈테크 Test dummy for precision transfer position measurement using the semiconductor system or display system and precision transfer position measurement method using the test dummy

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09148391A (en) * 1995-11-21 1997-06-06 Nikon Corp Wafer observing apparatus

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