JP2006165586A5 - - Google Patents
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- Publication number
- JP2006165586A5 JP2006165586A5 JP2005373371A JP2005373371A JP2006165586A5 JP 2006165586 A5 JP2006165586 A5 JP 2006165586A5 JP 2005373371 A JP2005373371 A JP 2005373371A JP 2005373371 A JP2005373371 A JP 2005373371A JP 2006165586 A5 JP2006165586 A5 JP 2006165586A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- hand
- unit
- inspection apparatus
- transfer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 13
- 238000007689 inspection Methods 0.000 claims 11
- 238000011179 visual inspection Methods 0.000 claims 5
- 238000003780 insertion Methods 0.000 claims 2
- 238000005452 bending Methods 0.000 claims 1
- 238000009434 installation Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
Claims (8)
前記基板の検査を行う検査部と、を備えた外観検査装置であって、
前記搬送部は、前記検査部に対して独立に構成され、複数の装置レイアウトに対応して設置位置を変更可能であることを特徴とする外観検査装置。 A conveyance unit that performs retrieval and storage of the substrate from the receiving container receiving the substrate,
An inspection unit comprising an inspection unit for inspecting the substrate ,
The conveyance unit is configured independently for the inspection unit, inspection system, which is a capable of changing the installation position and corresponds to a plurality of devices layout.
前記他の搬送部は、先端部に前記第1のハンドが前記2方向から入り込むよう受け渡し空間を有する略L字形状に形成され、前記基板を吸着保持する第2のハンドと、を備え、
前記第1のハンドが前記第2のハンドの長辺側の挿入方向から前記基板を受け渡しする際に、前記第2のハンドの長辺との干渉を避ける逃げ部を前記第1のハンドに形成されることを特徴とする請求項4に記載の外観検査装置。 Before SL conveyance unit is articulated transfer robot having a plurality of connecting arms, comprising a first hand which is provided by bending the tip portion of the connecting arm of the transfer robot,
The other transport unit includes a second hand that is formed in a substantially L-shape having a transfer space so that the first hand enters from the two directions at a tip part, and holds the substrate by suction.
When the first hand delivers the substrate from the insertion direction on the long side of the second hand, an escape portion is formed in the first hand to avoid interference with the long side of the second hand. appearance inspection apparatus according to claim 4, characterized in that it is.
これら搬送アームは、前記第1の搬送部との前記基板受け渡し位置、前記検査位置との間を循環移送することを特徴とする請求項3から6のいずれか1項に記載の外観検査装置。 The other transport unit includes a plurality of transport arms,
The visual inspection apparatus according to claim 3 , wherein the transfer arms circulate and transfer between the substrate transfer position with the first transfer unit and the inspection position .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005373371A JP4671858B2 (en) | 2000-09-06 | 2005-12-26 | Appearance inspection device |
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000270330 | 2000-09-06 | ||
JP2000280883 | 2000-09-14 | ||
JP2000285640 | 2000-09-20 | ||
JP2000285988 | 2000-09-20 | ||
JP2005373371A JP4671858B2 (en) | 2000-09-06 | 2005-12-26 | Appearance inspection device |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002525910A Division JP3975164B2 (en) | 2000-09-06 | 2001-09-06 | Substrate transport device and visual inspection device |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006165586A JP2006165586A (en) | 2006-06-22 |
JP2006165586A5 true JP2006165586A5 (en) | 2008-10-16 |
JP4671858B2 JP4671858B2 (en) | 2011-04-20 |
Family
ID=36667152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005373371A Expired - Fee Related JP4671858B2 (en) | 2000-09-06 | 2005-12-26 | Appearance inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4671858B2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4914761B2 (en) * | 2007-05-16 | 2012-04-11 | オリンパス株式会社 | Appearance inspection device |
JP2010036467A (en) * | 2008-08-05 | 2010-02-18 | Sharp Corp | Module assembling device and its method |
JP2014035315A (en) * | 2012-08-10 | 2014-02-24 | Hitachi High-Technologies Corp | Disc conveyance unit and inspection device |
JP6422695B2 (en) | 2014-07-18 | 2018-11-14 | 株式会社Screenホールディングス | Substrate processing apparatus and substrate processing method |
KR101987895B1 (en) * | 2017-02-02 | 2019-06-12 | 주식회사 투윈테크 | Test dummy for precision transfer position measurement using the semiconductor system or display system and precision transfer position measurement method using the test dummy |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09148391A (en) * | 1995-11-21 | 1997-06-06 | Nikon Corp | Wafer observing apparatus |
-
2005
- 2005-12-26 JP JP2005373371A patent/JP4671858B2/en not_active Expired - Fee Related
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