JP2000026160A - Dielectric ceramic composition - Google Patents
Dielectric ceramic compositionInfo
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- JP2000026160A JP2000026160A JP10195378A JP19537898A JP2000026160A JP 2000026160 A JP2000026160 A JP 2000026160A JP 10195378 A JP10195378 A JP 10195378A JP 19537898 A JP19537898 A JP 19537898A JP 2000026160 A JP2000026160 A JP 2000026160A
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- mgo
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Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、ニッケル等の卑金
属を内部電極に用いる積層セラミックコンデンサ(以
降、積層コンデンサと称する)用の誘電体磁器組成物に
関する。The present invention relates to a dielectric ceramic composition for a multilayer ceramic capacitor (hereinafter, referred to as a multilayer capacitor) using a base metal such as nickel for an internal electrode.
【0002】[0002]
【従来の技術】積層コンデンサは、内部電極と誘電体セ
ラミックグリーンシートを交互に複数枚積層したグリー
ン積層体を所定形状に切断した後、一体焼成し作製され
る。前記内部電極材料には、従来Pd或いはPd合金が
使用されていたが、Pdは高価であるため近年比較的安
価なNi等の卑金属材料が用いられつつある。2. Description of the Related Art A multilayer capacitor is manufactured by cutting a green laminate in which a plurality of internal electrodes and dielectric ceramic green sheets are alternately laminated into a predetermined shape and then firing them integrally. Conventionally, Pd or a Pd alloy has been used for the internal electrode material. However, since Pd is expensive, a relatively inexpensive base metal material such as Ni has recently been used.
【0003】[0003]
【発明が解決しようとする課題】内部電極材料に卑金属
を用いた場合大気中で誘電体と一体焼成を行うと、内部
電極が酸化されて絶縁してしまうため、中性雰囲気また
は還元性雰囲気中で焼成を行う必要がある。Pd或いは
Pd合金を内部電極とする積層コンデンサ用の誘電体磁
器組成物は、還元性雰囲気中で焼成を行うと誘電体が還
元されてしまい比抵抗が低くなり所望の特性が得られな
い。この対策として特開昭61−155255号公報に
耐還元性の誘電体磁器組成物が提案されているが、この
耐還元性誘電体磁器組成物を用いた積層コンデンサは、
絶縁抵抗特性(IR寿命特性)の劣化が大きく信頼性に
課題があった。When a base metal is used as a material for an internal electrode, if the firing is performed integrally with a dielectric material in the air, the internal electrode is oxidized and insulated. Need to be fired. When firing in a reducing atmosphere, the dielectric ceramic composition for a multilayer capacitor having Pd or a Pd alloy as an internal electrode is reduced in dielectric and has low specific resistance, so that desired characteristics cannot be obtained. As a countermeasure, Japanese Unexamined Patent Publication (Kokai) No. 61-155255 has proposed a reduction-resistant dielectric ceramic composition. A multilayer capacitor using this reduction-resistant dielectric ceramic composition has a
The insulation resistance characteristics (IR life characteristics) deteriorated greatly, and there was a problem in reliability.
【0004】そこで本発明の誘電体磁器組成物は、中性
あるいは還元性雰囲気中で大量焼成を行っても、絶縁抵
抗特性の劣化がない信頼性の高い積層コンデンサを得る
ことのできる誘電体磁器組成物を提供することを目的と
するものである。[0004] Therefore, the dielectric ceramic composition of the present invention can provide a highly reliable multilayer capacitor with no deterioration in insulation resistance characteristics even when mass-fired in a neutral or reducing atmosphere. It is intended to provide a composition.
【0005】[0005]
【課題を解決するための手段】前記課題を解決するため
に本発明は、BaTiO3100モルに対し、BaOを
Ba/Tiの比が1.001〜1.04になるように添
加し、更にMgOを0.5〜5.0モル、Dy2O3を
0.1〜3.0モル、MnO2を0.01〜0.4モ
ル、BaO・MgO・SiO2化合物を0.6〜5.0
モル添加することによって中性あるいは還元性雰囲気中
で焼成を行っても、絶縁抵抗特性の劣化がない信頼性の
高い積層コンデンサを得ることができるものである。According to the present invention, BaO is added to 100 mol of BaTiO 3 so that the ratio of Ba / Ti becomes 1.001 to 1.04. MgO 0.5 to 5.0 mol, 0.1 to 3.0 mol of Dy 2 O 3, the MnO 2 0.01 to 0.4 mol, the BaO · MgO · SiO 2 compound 0.6 to 5 .0
By adding in a molar amount, a highly reliable multilayer capacitor having no deterioration in insulation resistance characteristics can be obtained even when firing in a neutral or reducing atmosphere.
【0006】[0006]
【発明の実施の形態】本発明の請求項1に記載の発明
は、BaTiO3100モルに対し、BaOもしくはB
aCO3をBa/Tiの比が1.001〜1.04にな
るように添加し、更にMgOを0.5〜5.0モル、D
y2O3を0.1〜3.0モル、MnO2を0.01〜
0.4モル、BaO・MgO・SiO2化合物を0.6
〜5.0モル添加することを特徴とする誘電体磁器組成
物であり、基本成分のBa/Ti比を調整するために加
えた過剰のBaOあるいはBaCO3とMnO2は誘電体
組成物の耐還元性を強化し、特にMnO2の添加は中性
あるいは還元性雰囲気中での積層コンデンサの焼成にお
いて、誘電体組成物の絶縁抵抗特性の劣化を防ぐと共
に、積層コンデンサの静電容量のバラツキを抑制して均
質な焼結体が得られるという効果がある。MgO、Dy
2O3の添加は誘電率、静電容量温度特性、誘電正接等の
電気特性を満足させるという効果を有し、BaO・Mg
O・SiO2化合物の添加は比較的焼成温度が低い場合
でも誘電体組成の焼結を促進し緻密な焼結体が得られる
ので、絶縁抵抗を安定させ電気的性能を満足させること
ができるという作用を有するものである。BEST MODE FOR CARRYING OUT THE INVENTION The invention described in claim 1 of the present invention is characterized in that BaO or B is added to 100 moles of BaTiO 3.
aCO 3 was added so that the ratio of Ba / Ti became 1.001 to 1.04, and MgO was further added to 0.5 to 5.0 mol.
0.1-3.0 moles of y 2 O 3, 0.01~ the MnO 2
0.4 mol, 0.6 mol of BaO.MgO.SiO 2 compound
This is a dielectric porcelain composition characterized in that it is added in an amount of up to 5.0 moles, and an excess of BaO or BaCO 3 and MnO 2 added to adjust the Ba / Ti ratio of the basic component is a property of the dielectric composition. The addition of MnO 2 enhances the reducibility, and in particular, prevents the deterioration of the insulation resistance characteristics of the dielectric composition and reduces the variation in the capacitance of the multilayer capacitor during firing of the multilayer capacitor in a neutral or reducing atmosphere. There is an effect that a homogeneous sintered body can be obtained by suppressing this. MgO, Dy
The addition of 2 O 3 has the effect of satisfying electrical characteristics such as dielectric constant, capacitance temperature characteristics, and dielectric loss tangent.
The addition of the O.SiO 2 compound promotes sintering of the dielectric composition even when the firing temperature is relatively low, so that a dense sintered body can be obtained, so that the insulation resistance can be stabilized and the electrical performance can be satisfied. It has an action.
【0007】本発明の請求項2に記載の発明は、アルミ
ニウム原子をAl2O3に換算し、BaTiO3100モ
ルに対して0.1〜3.0モル添加することを特徴とす
る請求項1に記載の誘電体磁器組成物であり、Al2O3
を添加することにより焼成過程において、均一な成分相
を形成する作用を有し、焼結性と電気特性を安定させる
ものである。According to a second aspect of the present invention, aluminum atoms are converted to Al 2 O 3 , and 0.1 to 3.0 mol is added to 100 mol of BaTiO 3. 2. The dielectric porcelain composition according to 1, wherein Al 2 O 3
Has the effect of forming a uniform component phase in the firing process, and stabilizes sinterability and electrical characteristics.
【0008】本発明の請求項3に記載の発明は、バナジ
ウム原子をV2O5に換算し、BaTiO3100モルに
対して0.01〜0.26モル添加することを特徴とす
る請求項1または2に記載の誘電体磁器組成物であり、
V2O5の添加は、還元雰囲気の焼成で還元されやすい基
本成分BaTiO3を構成するTiO2の還元を抑制して
積層コンデンサの絶縁抵抗の低下を防ぎ、静電容量バラ
ツキの小さい積層コンデンサを得ることができるという
作用を有するものである。[0008] The invention according to claim 3 of the present invention, the claims in terms of vanadium atoms in V 2 O 5, characterized by 0.01 to 0.26 mol added to BaTiO 3 100 moles 3. The dielectric ceramic composition according to 1 or 2,
The addition of V 2 O 5 suppresses the reduction of TiO 2 , which constitutes the basic component BaTiO 3 , which is easily reduced by firing in a reducing atmosphere, thereby preventing a decrease in the insulation resistance of the multilayer capacitor. It has the effect that it can be obtained.
【0009】以下に本発明の一実施形態について説明す
る。 (実施の形態1)先ず(表1)に示す組成となるよう
に、出発原料としてBaTiO3100モルに対し、B
aCO3、Dy2O3、MgO、MnO2、BaO・MgO
・SiO2をそれぞれ秤量し、これらの出発原料に純水
を加え、部分安定化ジルコニア玉石を媒体としてボール
ミルで17時間湿式混合粉砕を行った後、脱水乾燥す
る。尚、BaTiO3、及びBaO・MgO・SiO2化
合物は予め固相法で合成した微粉砕材料を用いた。また
表中試料Noに*を付した試料は本発明の範囲外のもの
であるが比較のために記載しているものである。An embodiment of the present invention will be described below. (Embodiment 1) First, 100 mol of BaTiO 3 and B
aCO 3 , Dy 2 O 3 , MgO, MnO 2 , BaO.MgO
· SiO 2 were weighed, pure water was added to these starting materials, after the ball mill for 17 hours wet mixing pulverization partially stabilized zirconia boulders as a medium, it is dehydrated and dried. The BaTiO 3 and BaO.MgO.SiO 2 compounds used were finely pulverized materials synthesized in advance by a solid phase method. In addition, samples with * added to the sample No. in the table are out of the scope of the present invention, but are described for comparison.
【0010】[0010]
【表1】 [Table 1]
【0011】次に、この脱水乾燥材料を解砕し、32メ
ッシュ篩を全通させた後、アルミナ質の坩堝に入れ、1
100℃の温度で2時間保持し仮焼を行った。このと
き、仮焼温度が高すぎると得られた積層コンデンサの静
電容量の温度変化率が大きくなり過ぎることがあり注意
が必要である。Next, the dehydrated and dried material is crushed, passed through a 32-mesh sieve, put into an alumina crucible, and put into a crucible.
Calcination was performed by holding at a temperature of 100 ° C. for 2 hours. At this time, if the calcination temperature is too high, the temperature change rate of the capacitance of the obtained multilayer capacitor may become too large, and care must be taken.
【0012】次いで、仮焼材料を混合と同様にボールミ
ルで平均粒径が1.0μm以下になるように湿式粉砕を
行った後、脱水乾燥と32メッシュ篩の全通を行い誘電
体磁器材料を得た。Next, the calcined material is wet-pulverized in a ball mill in the same manner as in the mixing so that the average particle size is 1.0 μm or less, and then dehydrated and dried and passed through a 32-mesh sieve to remove the dielectric ceramic material. Obtained.
【0013】この誘電体磁器材料にバインダーとしてポ
リビニルブチラール樹脂、溶剤として酢酸nブチル、可
塑剤としてフタル酸ジブチルを加え、部分安定化ジルコ
ニアボールを用いボールミルで72時間混合しスラリー
を作製した。A polyvinyl butyral resin as a binder, n-butyl acetate as a solvent, and dibutyl phthalate as a plasticizer were added to the dielectric ceramic material, and mixed with a partially stabilized zirconia ball in a ball mill for 72 hours to prepare a slurry.
【0014】得られたスラリーを公知のドクターブレー
ド法を用いてポリエステルフィルム上に誘電体セラミッ
クグリーンシート(以降、グリーンシートと称する)を
作製した。A dielectric ceramic green sheet (hereinafter, referred to as a green sheet) was formed from the obtained slurry on a polyester film by using a known doctor blade method.
【0015】作製したグリーンシートの上面にNiを主
成分とする内部電極ペーストをスクリーン印刷し、乾燥
を行う。このNi内部電極ペーストを印刷したグリーン
シートを、公知の積層コンデンサ製造方法に従って、複
数枚積み重ね熱圧着してグリーン積層体を形成した後、
3.3mm×1.7mmの積層コンデンサグリーンチップ
(以降、グリーンチップと称する)形状に切断を行う。An internal electrode paste containing Ni as a main component is screen-printed on the upper surface of the produced green sheet, and dried. A green sheet on which the Ni internal electrode paste is printed is stacked and thermocompressed to form a green laminate according to a known multilayer capacitor manufacturing method.
A multilayer capacitor green chip (hereinafter, referred to as a green chip) of 3.3 mm × 1.7 mm is cut.
【0016】これらのグリーンチップをジルコニア敷粉
と混ぜ合わせアルミナ質のサヤに1万個いれ、窒素混合
空気雰囲気中400℃の温度で12時間バインダー除去
を行った後、引き続き窒素と水素の混合グリーンガス雰
囲気中で1220℃〜1340℃の温度で2時間保持し
焼成を行う。この後、降温冷却過程の900℃の温度で
1時間、窒素、水素、酸素で調整した雰囲気中に保持し
焼結体の再酸化を行った後、室温まで冷却し積層コンデ
ンサの焼結体を作製した。尚、各組成の焼成温度は、前
記1220〜1340℃の温度範囲においてそれぞれの
組成の焼結体密度が最大となる最適焼成温度を用いた。[0016] These green chips are mixed with zirconia bedding powder, and 10,000 pieces are put in an alumina-based sheath. The binder is removed at 400 ° C. for 12 hours in a nitrogen-mixed air atmosphere. The firing is carried out at a temperature of 1220 ° C. to 1340 ° C. for 2 hours in a gas atmosphere. After that, the sintered body of the multilayer capacitor is cooled down to room temperature after being held in an atmosphere adjusted with nitrogen, hydrogen and oxygen for 1 hour at a temperature of 900 ° C. in a cooling and cooling process, and then cooled to room temperature. Produced. In addition, the firing temperature of each composition used the optimal firing temperature at which the density of the sintered body of each composition becomes maximum in the above temperature range of 1,220 to 1,340 ° C.
【0017】次に、得られた積層コンデンサ焼結体をバ
レル研磨した後、焼結体端面に露出させた内部電極端部
と電気的に接続するようにCuを主成分とする外部電極
ペーストを焼結体端面に塗布した後、窒素と水素の混合
グリーンガスで酸素濃度を制御した雰囲気中において8
50℃の温度で15分間焼付を行い外部電極を形成し
た。Next, after the obtained multilayer capacitor sintered body is barrel-polished, an external electrode paste containing Cu as a main component is electrically connected to the internal electrode end exposed on the end face of the sintered body. After being applied to the end face of the sintered body, the mixture is treated in an atmosphere where the oxygen concentration is controlled by a mixed green gas of nitrogen and hydrogen.
Baking was performed at a temperature of 50 ° C. for 15 minutes to form external electrodes.
【0018】形成した外部電極表面に、電解メッキ法を
用いてニッケル膜、更にニッケル膜の表面に半田膜を形
成し積層コンデンサを完成した。A nickel film was formed on the surface of the formed external electrode by electrolytic plating, and a solder film was further formed on the surface of the nickel film to complete a multilayer capacitor.
【0019】こうして得られた積層コンデンサを、20
℃(室温)、周波数1KHzにおける誘電率、誘電正接
(tanδ)、容量温度変化率(−55〜+25℃の温
度範囲での20℃の静電容量に対する静電容量の変化
率)室温においてDC電圧25Vを印加したときの絶縁
抵抗(IR)を測定しその結果を(表2)に示してい
る。さらに初期特性としての容量のバラツキ、放置試験
として、積層コンデンサを150℃の恒温槽に1時間保
持した後室温に戻し48時間放置した時の静電容量
(C)を基準として、その後室温放置1000時間後の
静電容量との差(△C)の静電容量経時変化率(△C/
C)、及び加速寿命試験として、125℃の温度下でD
C200Vの電圧を250時間連続印加した後の絶縁抵
抗値を測定した劣化状況を(表3)に示している。尚、
(表2)、(表3)の試料No.は(表1)と共通であ
り、同一の番号は同一組成の試料であることを示してい
る。The multilayer capacitor thus obtained is
° C (room temperature), dielectric constant at a frequency of 1 KHz, dielectric loss tangent (tan δ), capacitance temperature change rate (change rate of capacitance with respect to capacitance of 20 ° C in a temperature range of -55 to + 25 ° C) DC voltage at room temperature The insulation resistance (IR) when 25 V was applied was measured, and the results are shown in (Table 2). Further, as the initial characteristics, the variation of the capacitance, as a standing test, was based on the capacitance (C) when the multilayer capacitor was kept in a thermostat at 150 ° C. for 1 hour, returned to room temperature and left for 48 hours, and then left at room temperature for 1000 hours. Change with time of capacitance (ΔC) with capacitance after time (ΔC /
C), and as an accelerated life test, D at 125 ° C.
Table 3 shows how the insulation resistance was measured after continuously applying a voltage of 200 V for 250 hours. still,
(Table 2), sample No. of (Table 3). Is common to (Table 1), and the same numbers indicate samples having the same composition.
【0020】[0020]
【表2】 [Table 2]
【0021】[0021]
【表3】 [Table 3]
【0022】(表2)、(表3)から明らかなように、
本発明の誘電体磁器組成物(試料No.3,4,6,9
〜12,15〜18,21〜24,28〜31)は誘電
率が2300以上と高く、静電容量バラツキは±5%以
内と小さく、静電容量の温度変化率が±15%以内と小
さく、絶縁抵抗値も1×1012以上と高い。また、放置
試験での静電容量経時変化率は−1.0〜−1.3%と
小さく、更に焼結体内部に副成分相も発生していないこ
とが分かった。これに対しBa/Ti比が1.001よ
り小さいと(試料No.1〜2)還元雰囲気中での大量
焼成で誘電体が還元され半導体化してしまい、逆にBa
/Ti比が1.04を超えると(試料No.5)誘電体
の焼結が不十分となり良好な焼結体が得られない。Mg
Oの添加量が0.5モルより少ないと(試料No.7)
焼結不十分となり、逆に5モルを超えると(試料No.
8)積層コンデンサの容量温度変化率が大きくなってし
まうと共に、静電容量の経時変化率が大きくなって好ま
しくない。Dy2O3の添加量が0.1モルより少ないと
(試料No.13)容量温度変化率が大きくなると共
に、静電容量の経時変化率とtanδが大きくなって好
ましくなく、逆に3モルを超えると(試料No.14)
誘電率が2000以下に低下し実用的でなくなる。Mn
O2の添加量が、0.01モルより少ないと(試料N
o.19)焼結体が部分的に半導体化され初期の静電容
量のバラツキが大きく、また絶縁抵抗値が小さくなり、
その結果加速寿命試験において絶縁抵抗値が大幅に劣化
してしまう。添加量が0.4モルを超えると(試料N
o.20)静電容量の温度変化率、経時変化率も大き
く、また絶縁抵抗の劣化も大きくなる。BaO・MgO
・SiO 2化合物の添加量が0.6モルより少ないと
(試料No.25,26)大量焼成した焼結体は十分な
焼結密度が得られず、静電容量、絶縁抵抗にバラツキを
生じる。また、添加量が5.0モルを超えると(試料N
o.27)焼結性は向上するものの誘電率が低下し、静
電容量の温度変化率も大きくなり実用的でない。As is clear from (Table 2) and (Table 3),
Dielectric ceramic composition of the present invention (Sample Nos. 3, 4, 6, 9)
~ 12,15 ~ 18,21 ~ 24,28 ~ 31) are dielectric
The rate is as high as 2300 or more, and the variation in capacitance is ± 5% or less.
And the temperature change rate of the capacitance is as small as ± 15% or less.
The insulation resistance is also 1 × 1012Above and high. Also leave
The capacitance change with time in the test was -1.0 to -1.3%.
Small and no sub-component phase is generated inside the sintered body.
I understood. On the other hand, the Ba / Ti ratio is 1.001.
Small (sample Nos. 1 and 2) in a reducing atmosphere
The firing reduces the dielectric and turns it into a semiconductor.
If the / Ti ratio exceeds 1.04 (Sample No. 5)
Sintering becomes insufficient and a good sintered body cannot be obtained. Mg
When the added amount of O is less than 0.5 mol (Sample No. 7)
If sintering becomes insufficient, and if it exceeds 5 moles (sample No.
8) The capacitance temperature change rate of the multilayer capacitor has increased.
And the rate of change of the capacitance with time increases.
Not good. DyTwoOThreeIs less than 0.1 mol
(Sample No. 13) When the rate of change in capacitance with temperature increased,
In particular, the rate of change of capacitance with time and tan δ increase,
On the contrary, if it exceeds 3 moles (sample No. 14)
The dielectric constant drops below 2000, making it impractical. Mn
OTwoIs less than 0.01 mol (sample N
o. 19) Initial capacitance of the sintered body partially converted into a semiconductor
The variation in the amount is large, the insulation resistance value is small,
As a result, the insulation resistance value deteriorates significantly in the accelerated life test.
Resulting in. If the amount exceeds 0.4 mol (sample N
o. 20) Large rate of change of capacitance and temperature over time
And the deterioration of the insulation resistance also increases. BaO ・ MgO
・ SiO TwoWhen the amount of the compound added is less than 0.6 mol,
(Sample Nos. 25 and 26) Sintered bodies fired in large quantities are sufficient
Unable to obtain sintering density, variation in capacitance and insulation resistance
Occurs. On the other hand, if the addition amount exceeds 5.0 mol (sample N
o. 27) Although the sinterability is improved, the dielectric constant is reduced,
The rate of change in capacitance with temperature also increases, which is not practical.
【0023】以上の結果から主成分のBaTiO310
0モルに対し、BaCO3をBa/Ti比が0.001
〜0.04になるように過剰添加することにより、還元
雰囲気中での大量焼成において誘電体が還元される事な
く良好な焼結体が得られる。MgOを0.5〜5.0モ
ル添加することにより誘電率の温度変化率を小さくする
と共に、絶縁抵抗値を向上させる効果があり、Dy2O3
を0.1〜3.0モル添加することにより静電容量の温
度変化率、及び絶縁抵抗値を向上させる効果がある。M
nO2を0.01〜0.4モル添加することで主成分の
BaTiO3中のTiO2の還元を防止し絶縁抵抗特性を
向上させることができる。BaO・MgO・SiO2化
合物を0.6〜5.0モル添加することで比較的低温で
の焼結を可能にし、静電容量、絶縁抵抗のバラツキを小
さくする効果があることが明らかとなる。但し各添加物
の添加量が前記本発明の範囲を外れると焼成時に誘電体
磁器組成物が半導体化してしまったり、電気特性のバラ
ツキが大きくなる、静電容量温度変化率が大きくなるな
ど好ましくないことが分かる。尚、本実施の形態におい
てはBaTiO3及びBaO・MgO・SiO2化合物を
予め固相法で作製した微粉末を用いたが、固相法以外の
方法で作製した化合物を用いても同様な効果が得られる
ことを確認している。From the above results, the main component of BaTiO 3 10
BaCO 3 has a Ba / Ti ratio of 0.001 to 0 mol.
By adding excessively so as to be 0.04 or less, a good sintered body can be obtained without reduction of the dielectric during mass firing in a reducing atmosphere. By 0.5 to 5.0 mol per mol of MgO as to reduce the temperature change of the dielectric constant, has the effect of improving the insulation resistance value, Dy 2 O 3
Of 0.1 to 3.0 mol has an effect of improving the temperature change rate of the capacitance and the insulation resistance value. M
By adding 0.01 to 0.4 mol of nO 2 , reduction of TiO 2 in BaTiO 3 as a main component can be prevented and insulation resistance characteristics can be improved. It becomes clear that adding 0.6 to 5.0 moles of the BaO.MgO.SiO 2 compound enables sintering at a relatively low temperature and has the effect of reducing variations in capacitance and insulation resistance. . However, when the addition amount of each additive is out of the range of the present invention, the dielectric ceramic composition becomes a semiconductor at the time of firing, the variation in electric characteristics increases, the capacitance temperature change rate increases, and it is not preferable. You can see that. In this embodiment, BaTiO 3 and BaO.MgO.SiO 2 compounds are used as fine powders prepared in advance by a solid phase method. However, similar effects can be obtained by using compounds prepared by a method other than the solid phase method. Has been confirmed.
【0024】(実施の形態2)先ず、BaTiO310
0モルに対し、BaOを0.02モル、MgOを2.5
モル、Dy2O3を1.0モル、MnO2を0.2モル、
BaO・MgO・SiO2化合物を2.1モル添加した
組成に、更に(表4)に示す量のAl2O3、及びV2O5
を各々秤量して添加した。(Embodiment 2) First, BaTiO 3 10
0.02 mol of BaO and 2.5 mol of MgO with respect to 0 mol.
Mol, Dy 2 O 3 1.0 mol, MnO 2 0.2 mol,
The composition obtained by adding 2.1 mol of the BaO.MgO.SiO 2 compound was further added with the amounts of Al 2 O 3 and V 2 O 5 shown in (Table 4).
Was weighed and added.
【0025】[0025]
【表4】 [Table 4]
【0026】次に、実施の形態1と同条件で誘電体磁器
材料を作製した後、この材料を用いて積層コンデンサを
作製した。尚、焼成時一サヤ当たりのグリーンチップの
サヤ詰め量を実施の形態1の1.5倍の15000個と
し、他の条件は同条件で行い、最高温度は1220〜1
280℃の範囲で行った。Next, after a dielectric ceramic material was manufactured under the same conditions as in the first embodiment, a multilayer capacitor was manufactured using this material. In addition, the amount of green chips packed per sheath during firing was set to 15,000 pieces, which is 1.5 times that of the first embodiment, and the other conditions were the same.
The test was performed in the range of 280 ° C.
【0027】その後、得られた積層コンデンサを実施の
形態1と同様に評価し、その結果を(表5)、及び(表
6)に示した。尚、(表4)〜(表6)において同一の
試料No.は同一組成の試料を示している。また*を付
したものは本発明の範囲外であるが比較のために示して
いる。Thereafter, the obtained multilayer capacitor was evaluated in the same manner as in the first embodiment, and the results are shown in (Table 5) and (Table 6). In Tables 4 to 6, the same sample No. was used. Indicates a sample having the same composition. Those marked with * are out of the scope of the present invention but are shown for comparison.
【0028】[0028]
【表5】 [Table 5]
【0029】[0029]
【表6】 [Table 6]
【0030】(表5)、(表6)に示すように、本発明
のBaTiO3100モルに対しBaOを0.02モ
ル、MgOを2.5モル、Dy2O3を1.0モル、Mn
O2を0.2モル、BaO・MgO・SiO2化合物を
2.1モル添加した組成に、更にV2O5、Al2O3を添
加した誘電体磁器組成で、V2O5を0.01〜0.26
モル(V原子としてはBaTiO3100モルに対し
0.02〜0.52モル)添加した組成(試料No.3
2〜34,37,38)は、焼成時にサヤ詰め量を増や
した場合においてV2O5が主成分のTiO2の還元を抑
制し、1220〜1280℃の低温焼成においても高い
絶縁抵抗と、絶縁抵抗の劣化のない優れた積層コンデン
サを得ることができる。これに対し、V2O5の添加量が
0.26モル(V原子の添加量としては0.52モル)
を超えると(試料No.36)、静電容量の温度変化率
が大きくなると共に、絶縁抵抗の劣化が大きくなり、ま
た0.01モルより少ないと(試料No.35)大量焼
成した場合、絶縁抵抗のバラツキが大きくなる。一方
(表6)に示すように、Al2O3を0.1〜3.0モル
(Al原子としては0.2〜6.0モル)添加した組成
(試料32〜34,37,38)は、副成分に作用して
焼結を促進させ、副成分相のない均一な焼結体を得るこ
とができる。これに対し添加量が3モルを超えると(試
料No.40)、容量温度変化率とtanδが大きくな
り、また0.1モルより少ないと(試料No.39)副
成分相が発生して均一な焼結体を得ることができず好ま
しくないことが分かる。As shown in Tables 5 and 6, 0.02 mol of BaO, 2.5 mol of MgO, 1.0 mol of Dy 2 O 3 , 100 mol of BaTiO 3 of the present invention, Mn
O 2 0.2 moles, in a BaO · MgO · SiO 2 compound 2.1 mol per mol of the composition, further added the dielectric ceramic composition of V 2 O 5, Al 2 O 3, the V 2 O 5 0 .01 to 0.26
Moles (0.02-0.52 moles per 100 moles of BaTiO 3 as V atoms) (Sample No. 3)
Nos. 2 to 34, 37, 38) suppress the reduction of TiO 2 , which is mainly composed of V 2 O 5 when the sheath filling amount is increased at the time of firing, and have a high insulation resistance even at a low temperature firing of 1220 to 1280 ° C. An excellent multilayer capacitor without deterioration of the insulation resistance can be obtained. On the other hand, the added amount of V 2 O 5 is 0.26 mol (the added amount of V atoms is 0.52 mol)
(Sample No. 36), the temperature change rate of the capacitance becomes large, and the deterioration of the insulation resistance becomes large. Variation in resistance increases. On the other hand, as shown in (Table 6), a composition in which Al 2 O 3 was added in an amount of 0.1 to 3.0 mol (0.2 to 6.0 mol as Al atoms) (samples 32 to 34, 37, and 38) Acts on the sub-components to promote sintering, so that a uniform sintered body having no sub-component phase can be obtained. On the other hand, when the addition amount exceeds 3 mol (Sample No. 40), the rate of change in capacity with temperature and tan δ increase, and when the addition amount is less than 0.1 mol (Sample No. 39), a sub-component phase is generated and uniform. It can be seen that a good sintered body cannot be obtained, which is not preferable.
【0031】以上の結果から、本発明のBaTiO3を
主成分とし、これにBaO、MgO、Dy2O3、MnO
2、BaO・MgO・SiO2を添加した組成に、更にバ
ナジウム原子をV2O5として添加することにより、還元
性雰囲気での焼成において、誘電体の還元を防止し絶縁
抵抗性能を向上させ、またアルミニウム原子をAl2O3
として添加することにより焼結体内部に発生しやすい副
成分相の発生を抑制して均一な焼結体を得ることがで
き、優れた性能の積層コンデンサが得られることが明ら
かとなる。From the above results, it is found that the main component is BaTiO 3 of the present invention, and BaO, MgO, Dy 2 O 3 , MnO 3
2 , by adding a vanadium atom as V 2 O 5 to the composition to which BaO · MgO · SiO 2 is added, in firing in a reducing atmosphere, preventing reduction of the dielectric and improving insulation resistance performance, In addition, aluminum atoms are replaced with Al 2 O 3
It is evident that by adding as a component, a uniform sintered body can be obtained by suppressing the generation of a subcomponent phase which is likely to be generated inside the sintered body, and a multilayer capacitor having excellent performance can be obtained.
【0032】[0032]
【発明の効果】以上本発明によれば、BaTiO3に対
して、BaOもしくはBaCO3、MgO、Dy2O3、
MnO2、更にBaO・MgO・SiO2化合物を所定量
添加することにより、還元雰囲気中の比較的低温での焼
成においても電気特性の安定した優れた積層コンデンサ
用誘電体磁器組成物が得られるので、内部電極材料に卑
金属を用いた場合でも、誘電体を一体焼成を行うことが
できるものとなる。またAl原子、V原子を添加するこ
とにより中性、或いは還元性雰囲気中での大量生産にお
いて焼成を促進して均一な焼結体を得、誘電体の還元を
防止することができるので、更に絶縁抵抗、静電容量の
バラツキが小さく、かつ容量温度変化率の優れたものと
なる。According to the present invention as described above, with respect to BaTiO 3, BaO or BaCO 3, MgO, Dy 2 O 3,
By adding a predetermined amount of MnO 2 and further a BaO.MgO.SiO 2 compound, a dielectric ceramic composition for a multilayer capacitor having excellent electric characteristics can be obtained even when firing at a relatively low temperature in a reducing atmosphere. Also, even when a base metal is used as the internal electrode material, the dielectric can be integrally fired. Further, by adding Al atoms and V atoms, it is possible to promote sintering in mass production in a neutral or reducing atmosphere to obtain a uniform sintered body and prevent the dielectric from being reduced. Variations in insulation resistance and capacitance are small, and the capacitance temperature change rate is excellent.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 渡邊 靖夫 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 小林 恵治 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 Fターム(参考) 4G031 AA03 AA06 AA07 AA11 AA13 AA19 AA29 AA30 BA09 GA02 5E001 AB03 AC09 AE00 AE02 AE03 AE04 AF00 AF06 AH01 AH05 AH06 AH09 AJ01 AJ02 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Yasuo Watanabe 1006 Kazuma Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (72) Keiji Kobayashi 1006 Kadoma Kadoma, Kadoma City Osaka Prefecture Matsushita Electric Industrial Co., Ltd. F Terms (reference) 4G031 AA03 AA06 AA07 AA11 AA13 AA19 AA29 AA30 BA09 GA02 5E001 AB03 AC09 AE00 AE02 AE03 AE04 AF00 AF06 AH01 AH05 AH06 AH09 AJ01 AJ02
Claims (3)
もしくはBaCO3をBa/Tiの比が1.001〜
1.04になるように添加し、更にMgOを0.5〜
5.0モル、Dy2O3を0.1〜3.0モル、MnO2
を0.01〜0.4モル、BaO・MgO・SiO2化
合物を0.6〜5.0モル添加することを特徴とする誘
電体磁器組成物。1. A method according to claim 1, wherein 100 moles of BaTiO 3 and BaO 3
Alternatively, BaCO 3 may be converted to a Ba / Ti ratio of 1.001 to
1.04, and further added MgO to 0.5 to
5.0 mol of Dy 2 O 3 0.1 to 3.0 moles, MnO 2
The 0.01 to 0.4 mol, the dielectric ceramic composition, characterized in that 0.6 to 5.0 mol per mol of BaO · MgO · SiO 2 compound.
BaTiO3100モルに対して0.1〜3.0モル添
加する事を特徴とする請求項1に記載の誘電体磁器組成
物。2. An aluminum atom is converted to Al 2 O 3 ,
The dielectric ceramic composition according to claim 1, characterized in that to 0.1 to 3.0 mol added to BaTiO 3 100 moles.
TiO3100モルに対し0.01〜0.26モル添加
する事を特徴とする請求項1または2に記載の誘電体磁
器組成物。3. Conversion of vanadium atom to V 2 O 5 ,
3. The dielectric ceramic composition according to claim 1, wherein 0.01 to 0.26 mol is added to 100 mol of TiO3.
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JP10195378A JP2000026160A (en) | 1998-07-10 | 1998-07-10 | Dielectric ceramic composition |
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000048963A1 (en) | 1999-02-19 | 2000-08-24 | Matsushita Electric Industrial Co., Ltd. | Dielectric ceramic composition, capacitor using this and production method thereof |
WO2002051770A1 (en) * | 2000-12-25 | 2002-07-04 | Tdk Corporation | Dielectric porcelain composition and electronic parts |
US6548437B2 (en) | 2000-06-20 | 2003-04-15 | Tdk Corporation | Dielectric ceramics and electronic component |
US6746980B2 (en) * | 2000-12-15 | 2004-06-08 | Toho Titanium Co., Ltd. | Dielectric ceramic composition and multilayer ceramic capacitor used the same |
WO2009016860A1 (en) * | 2007-07-27 | 2009-02-05 | Kyocera Corporation | Dielectric ceramic and laminated ceramic capacitor |
JP2009073721A (en) * | 2007-07-27 | 2009-04-09 | Kyocera Corp | Dielectric porcelain and laminated ceramic capacitor |
KR20150091758A (en) * | 2014-02-04 | 2015-08-12 | 삼성전기주식회사 | Dielectric composition for low temperature sintering, multilayer ceramic electronic device including the same and method for fabricating the multilayer ceramic electronic device |
CN113277847A (en) * | 2021-06-10 | 2021-08-20 | 天津大学 | Anti-reduction X8R type BaTiO3Base medium ceramic material and preparation method thereof |
-
1998
- 1998-07-10 JP JP10195378A patent/JP2000026160A/en active Pending
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000048963A1 (en) | 1999-02-19 | 2000-08-24 | Matsushita Electric Industrial Co., Ltd. | Dielectric ceramic composition, capacitor using this and production method thereof |
EP1095917A1 (en) * | 1999-02-19 | 2001-05-02 | Matsushita Electric Industrial Co., Ltd. | Dielectric ceramic composition, capacitor using this and production method thereof |
EP1095917A4 (en) * | 1999-02-19 | 2007-04-04 | Matsushita Electric Ind Co Ltd | Dielectric ceramic composition, capacitor using this and production method thereof |
US6548437B2 (en) | 2000-06-20 | 2003-04-15 | Tdk Corporation | Dielectric ceramics and electronic component |
US6746980B2 (en) * | 2000-12-15 | 2004-06-08 | Toho Titanium Co., Ltd. | Dielectric ceramic composition and multilayer ceramic capacitor used the same |
US6764976B2 (en) | 2000-12-25 | 2004-07-20 | Tdk Corporation | Dielectric ceramic composition and electronic device |
WO2002051770A1 (en) * | 2000-12-25 | 2002-07-04 | Tdk Corporation | Dielectric porcelain composition and electronic parts |
CN100400463C (en) * | 2000-12-25 | 2008-07-09 | Tdk株式会社 | Dielectric procelain composition and electronic parts |
WO2009016860A1 (en) * | 2007-07-27 | 2009-02-05 | Kyocera Corporation | Dielectric ceramic and laminated ceramic capacitor |
JP2009073721A (en) * | 2007-07-27 | 2009-04-09 | Kyocera Corp | Dielectric porcelain and laminated ceramic capacitor |
KR20150091758A (en) * | 2014-02-04 | 2015-08-12 | 삼성전기주식회사 | Dielectric composition for low temperature sintering, multilayer ceramic electronic device including the same and method for fabricating the multilayer ceramic electronic device |
KR101973414B1 (en) * | 2014-02-04 | 2019-04-29 | 삼성전기주식회사 | Dielectric composition for low temperature sintering, multilayer ceramic electronic device including the same and method for fabricating the multilayer ceramic electronic device |
CN113277847A (en) * | 2021-06-10 | 2021-08-20 | 天津大学 | Anti-reduction X8R type BaTiO3Base medium ceramic material and preparation method thereof |
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