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IT8967702A0 - Procedimento interno di autodiagno si e di programmazione della ridon danza per circuiti di memoria e di sposizione per l attuazione del procedimento - Google Patents

Procedimento interno di autodiagno si e di programmazione della ridon danza per circuiti di memoria e di sposizione per l attuazione del procedimento

Info

Publication number
IT8967702A0
IT8967702A0 IT8967702A IT6770289A IT8967702A0 IT 8967702 A0 IT8967702 A0 IT 8967702A0 IT 8967702 A IT8967702 A IT 8967702A IT 6770289 A IT6770289 A IT 6770289A IT 8967702 A0 IT8967702 A0 IT 8967702A0
Authority
IT
Italy
Prior art keywords
procedure
ridon
dance
programming
implementation
Prior art date
Application number
IT8967702A
Other languages
English (en)
Other versions
IT1232516B (it
Inventor
Elschner Horst
Weisse Stefan
Original Assignee
Dresden Forschzentr Mikroelek
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dresden Forschzentr Mikroelek filed Critical Dresden Forschzentr Mikroelek
Publication of IT8967702A0 publication Critical patent/IT8967702A0/it
Application granted granted Critical
Publication of IT1232516B publication Critical patent/IT1232516B/it

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
IT8967702A 1988-08-16 1989-08-14 Procedimento interno di autodiagnosi e di programmazione della ridondanza per circuiti di memoria e disposizione per l'attuazione del procedimento IT1232516B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD88318971A DD274923A1 (de) 1988-08-16 1988-08-16 Internes selbsttest- und redundanzprogrammierungsverfahren fuer speicherschaltkreise und anordnung zur durchfuehrung des verfahrens

Publications (2)

Publication Number Publication Date
IT8967702A0 true IT8967702A0 (it) 1989-08-14
IT1232516B IT1232516B (it) 1992-02-19

Family

ID=5601766

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8967702A IT1232516B (it) 1988-08-16 1989-08-14 Procedimento interno di autodiagnosi e di programmazione della ridondanza per circuiti di memoria e disposizione per l'attuazione del procedimento

Country Status (5)

Country Link
DD (1) DD274923A1 (it)
DE (1) DE3924695A1 (it)
FR (1) FR2635607A1 (it)
IT (1) IT1232516B (it)
NL (1) NL8902076A (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0675436B1 (en) * 1994-03-31 1999-10-27 STMicroelectronics, Inc. Recoverable set associative cache
DE19963689A1 (de) * 1999-12-29 2001-07-12 Infineon Technologies Ag Schaltungsanordnung eines integrierten Halbleiterspeichers zum Speichern von Adressen fehlerhafter Speicherzellen
DE10002127B4 (de) * 2000-01-19 2012-12-27 Infineon Technologies Ag Testverfahren für einen Datenspeicher
DE10256487B4 (de) 2002-12-03 2008-12-24 Infineon Technologies Ag Integrierter Speicher und Verfahren zum Testen eines integrierten Speichers
DE102004047330B4 (de) 2004-09-29 2011-04-07 Qimonda Ag Integrierter Halbleiterspeicher

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2664137B2 (ja) * 1985-10-29 1997-10-15 凸版印刷株式会社 Ｉｃカード

Also Published As

Publication number Publication date
DE3924695A1 (de) 1990-02-22
NL8902076A (nl) 1990-03-16
DD274923A1 (de) 1990-01-03
FR2635607A1 (fr) 1990-02-23
IT1232516B (it) 1992-02-19

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