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IN2012DN02779A - - Google Patents

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Publication number
IN2012DN02779A
IN2012DN02779A IN2779DEN2012A IN2012DN02779A IN 2012DN02779 A IN2012DN02779 A IN 2012DN02779A IN 2779DEN2012 A IN2779DEN2012 A IN 2779DEN2012A IN 2012DN02779 A IN2012DN02779 A IN 2012DN02779A
Authority
IN
India
Prior art keywords
plant
operator
external input
input device
diagnostic equipment
Prior art date
Application number
Other languages
English (en)
Inventor
Takaaki Sekiai
Toru Eguchi
Naohiro Kusumi
Yoshinari Hori
Massayuki Fukai
Satoru Shimizu
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of IN2012DN02779A publication Critical patent/IN2012DN02779A/en

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
IN2779DEN2012 2009-10-02 2009-10-02 IN2012DN02779A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2009/005123 WO2011039823A1 (ja) 2009-10-02 2009-10-02 プラント診断装置

Publications (1)

Publication Number Publication Date
IN2012DN02779A true IN2012DN02779A (zh) 2015-09-18

Family

ID=43825680

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2779DEN2012 IN2012DN02779A (zh) 2009-10-02 2009-10-02

Country Status (4)

Country Link
JP (1) JP5199478B2 (zh)
CN (1) CN102576227B (zh)
IN (1) IN2012DN02779A (zh)
WO (1) WO2011039823A1 (zh)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103454515B (zh) * 2012-05-31 2017-06-23 Ge医疗系统环球技术有限公司 图形化自诊断系统和方法
JP6078019B2 (ja) * 2014-04-02 2017-02-08 三菱電機ビルテクノサービス株式会社 設備監視装置及びプログラム
JP6685124B2 (ja) * 2015-12-22 2020-04-22 株式会社日立製作所 診断装置及び診断方法
JP6620056B2 (ja) * 2016-03-31 2019-12-11 三菱日立パワーシステムズ株式会社 機器の異常診断方法及び機器の異常診断装置
JP6591937B2 (ja) * 2016-06-29 2019-10-16 株式会社日立製作所 運用保守知識情報の策定支援システムおよび策定支援方法
JP2018106432A (ja) * 2016-12-27 2018-07-05 株式会社日立製作所 オンライン監視装置、及びオンライン監視方法
JP6842299B2 (ja) * 2016-12-28 2021-03-17 三菱パワー株式会社 診断装置、診断方法及びプログラム
US11112782B2 (en) * 2017-06-19 2021-09-07 Jfe Steel Corporation Process anomalous state diagnostic device and process anomalous state diagnosis method
US10838413B2 (en) * 2017-10-02 2020-11-17 Fisher-Rosemount Systems, Inc. Systems and methods for multi-site performance monitoring of process control systems
JP6861653B2 (ja) * 2018-01-10 2021-04-21 三菱電機株式会社 監視制御支援装置
JP7180985B2 (ja) * 2018-03-01 2022-11-30 株式会社日立製作所 診断装置および診断方法
MX2021001101A (es) 2018-07-31 2021-03-31 Nissan Motor Dispositivo de determinacion de anormalidad y metodo de determinacion de anormalidad.
WO2020027207A1 (ja) * 2018-08-03 2020-02-06 パナソニックIpマネジメント株式会社 異常検出方法、情報処理装置及び異常検出システム
JP7184636B2 (ja) * 2018-12-27 2022-12-06 三菱重工業株式会社 データ選別装置及び方法、ならびに監視診断装置
CN109885951A (zh) * 2019-02-28 2019-06-14 中科云创(厦门)科技有限公司 设备故障诊断方法及装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004206583A (ja) * 2002-12-26 2004-07-22 Nisshin Flour Milling Inc 学習型異常通知装置及びその方法
JP4676149B2 (ja) * 2004-03-10 2011-04-27 株式会社日立製作所 データ分類装置
JP4922597B2 (ja) * 2005-10-27 2012-04-25 株式会社日立製作所 燃料電池システムの診断方法および診断装置
JP4641537B2 (ja) * 2007-08-08 2011-03-02 株式会社日立製作所 データ分類方法および装置

Also Published As

Publication number Publication date
JP5199478B2 (ja) 2013-05-15
CN102576227B (zh) 2014-06-25
CN102576227A (zh) 2012-07-11
WO2011039823A1 (ja) 2011-04-07
JPWO2011039823A1 (ja) 2013-02-21

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