[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

IL63596A - Automatic test system - Google Patents

Automatic test system

Info

Publication number
IL63596A
IL63596A IL63596A IL6359681A IL63596A IL 63596 A IL63596 A IL 63596A IL 63596 A IL63596 A IL 63596A IL 6359681 A IL6359681 A IL 6359681A IL 63596 A IL63596 A IL 63596A
Authority
IL
Israel
Prior art keywords
test system
automatic test
automatic
test
Prior art date
Application number
IL63596A
Other languages
English (en)
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of IL63596A publication Critical patent/IL63596A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/865—Monitoring of software

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Human Computer Interaction (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Hardware Redundancy (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Selective Calling Equipment (AREA)
  • Testing And Monitoring For Control Systems (AREA)
IL63596A 1981-01-27 1981-08-17 Automatic test system IL63596A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/229,029 US4402055A (en) 1981-01-27 1981-01-27 Automatic test system utilizing interchangeable test devices

Publications (1)

Publication Number Publication Date
IL63596A true IL63596A (en) 1984-07-31

Family

ID=22859550

Family Applications (1)

Application Number Title Priority Date Filing Date
IL63596A IL63596A (en) 1981-01-27 1981-08-17 Automatic test system

Country Status (12)

Country Link
US (1) US4402055A (no)
EP (1) EP0056895B1 (no)
JP (1) JPS57125818A (no)
AU (1) AU7402581A (no)
CA (1) CA1174732A (no)
DE (1) DE3176236D1 (no)
DK (1) DK426981A (no)
ES (1) ES505763A0 (no)
GR (1) GR75766B (no)
IE (1) IE52897B1 (no)
IL (1) IL63596A (no)
NO (1) NO162438C (no)

Families Citing this family (96)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3116079A1 (de) * 1981-04-23 1982-11-11 Robert Bosch Gmbh, 7000 Stuttgart Pruefsystem
FR2506045A1 (fr) * 1981-05-15 1982-11-19 Thomson Csf Procede et dispositif de selection de circuits integres a haute fiabilite
US4397021A (en) * 1981-06-15 1983-08-02 Westinghouse Electric Corp. Multi-processor automatic test system
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4507740A (en) * 1981-09-08 1985-03-26 Grumman Aerospace Corporation Programmable signal analyzer
US4626996A (en) * 1982-02-17 1986-12-02 British Aerospace Plc Aircraft data instrumentation and acquisition system
US4617642A (en) * 1982-05-06 1986-10-14 Data General Corporation Select switch responsive to a break code
DE3267548D1 (en) * 1982-05-28 1986-01-02 Ibm Deutschland Process and device for an automatic optical inspection
US4592003A (en) * 1982-08-12 1986-05-27 Omron Tateisi Electronics Co. Measuring circuit device
JPS59111596A (ja) * 1982-12-16 1984-06-27 横河電機株式会社 テストシステム
US4578761A (en) * 1983-03-25 1986-03-25 At&T Bell Laboratories Separating an equivalent circuit into components to detect terminating networks
US4617663A (en) * 1983-04-13 1986-10-14 At&T Information Systems Inc. Interface testing of software systems
US4538269A (en) * 1983-04-18 1985-08-27 International Telephone And Telegraph Corporation Programmable coding and decoding arrangement
US4590581A (en) * 1983-05-09 1986-05-20 Valid Logic Systems, Inc. Method and apparatus for modeling systems of complex circuits
US4606025A (en) * 1983-09-28 1986-08-12 International Business Machines Corp. Automatically testing a plurality of memory arrays on selected memory array testers
CA1242486A (en) * 1983-11-25 1988-09-27 John J. Comfort Automatic test equipment
US4558426A (en) * 1983-12-14 1985-12-10 Mcdonnell Douglas Corporation Transducer multiplexer
US4644486A (en) * 1984-01-09 1987-02-17 Hewlett-Packard Company Vector network analyzer with integral processor
JPS60195417A (ja) * 1984-03-19 1985-10-03 Toshiba Corp 発電プラントの警報監視装置
US4630224A (en) * 1984-04-19 1986-12-16 The United States Of America As Represented By The Secretary Of The Navy Automation initialization of reconfigurable on-line automatic test system
JPS6125229A (ja) * 1984-07-13 1986-02-04 Sony Corp Ｉｃ装置
EP0175995B1 (de) * 1984-09-21 1990-01-03 Siemens Aktiengesellschaft Einrichtung für die Funktionsprüfung integrierter Schaltkreise
US4686627A (en) * 1984-12-24 1987-08-11 Honeywell Inc. Electrical test apparatus
US4937827A (en) * 1985-03-01 1990-06-26 Mentor Graphics Corporation Circuit verification accessory
DE3515802A1 (de) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Anordnung zur schnellen erzeugung von grossen pruefdatenwortmengen in einer pruefeinrichtung
US4687107A (en) * 1985-05-02 1987-08-18 Pennwalt Corporation Apparatus for sizing and sorting articles
IE851998L (en) * 1985-08-14 1987-05-11 Francis Anthony Purcell Test apparatus for electronic equipment
US4899306A (en) * 1985-08-26 1990-02-06 American Telephone And Telegraph Company, At&T Bell Laboratories Test interface circuit which generates different interface control signals for different target computers responding to control signals from host computer
US4706208A (en) * 1985-09-03 1987-11-10 American Telephone And Telegraph Company, At&T Bell Laboratories Technique for the operational life test of microprocessors
US4775930A (en) * 1985-11-12 1988-10-04 Westinghouse Electric Corp. Electronic key check for ensuring proper cradles insertion by respective processing board
US4831560A (en) * 1986-01-15 1989-05-16 Zaleski James V Method for testing auto electronics systems
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits
US4719459A (en) * 1986-03-06 1988-01-12 Grumman Aerospace Corporation Signal distribution system switching module
US4864512A (en) * 1986-08-20 1989-09-05 John Fluke Mfg. Co., Inc. Measurement apparatus with plural displays of measured parameter and selectable function thereof
US4841456A (en) * 1986-09-09 1989-06-20 The Boeing Company Test system and method using artificial intelligence control
US5021997A (en) * 1986-09-29 1991-06-04 At&T Bell Laboratories Test automation system
US4816750A (en) * 1987-01-16 1989-03-28 Teradyne, Inc. Automatic circuit tester control system
US4760329A (en) * 1987-04-23 1988-07-26 Grumman Aerospace Corporation Programmable tester with bubble memory
FR2615975A1 (fr) * 1987-05-29 1988-12-02 Mo Aviat I Formateur de donnees et testeur automatique mettant des groupes de tels formateurs en application
US4982325A (en) * 1988-03-18 1991-01-01 At&T Bell Laboratories Applications processor module for interfacing to a database system
US4894829A (en) * 1988-04-21 1990-01-16 Honeywell Inc. Comprehensive design and maintenance environment for test program sets
US4926363A (en) * 1988-09-30 1990-05-15 Advanced Micro Devices, Inc. Modular test structure for single chip digital exchange controller
US5307290A (en) * 1988-10-18 1994-04-26 Fiat Auto S.P.A. System for the automatic testing, preferably on a bench, of electronic control systems which are intended to be fitted in vehicles
JPH07101474B2 (ja) * 1988-10-20 1995-11-01 ニッタン株式会社 監視警報装置
CN1045655A (zh) * 1988-11-23 1990-09-26 约翰弗兰克制造公司 系统自动诊断的内核测试接口和方法
US4989207A (en) * 1988-11-23 1991-01-29 John Fluke Mfg. Co., Inc. Automatic verification of kernel circuitry based on analysis of memory accesses
US4958347A (en) * 1988-11-23 1990-09-18 John Fluke Mfg. Co., Inc. Apparatus, method and data structure for validation of kernel data bus
US5293374A (en) * 1989-03-29 1994-03-08 Hewlett-Packard Company Measurement system control using real-time clocks and data buffers
US5036479A (en) * 1989-04-20 1991-07-30 Trw Inc. Modular automated avionics test system
IE80813B1 (en) * 1989-05-16 1999-03-10 Formia Limited Electronic test systems
US5029166A (en) * 1989-05-31 1991-07-02 At&T Bell Laboratories Method and apparatus for testing circuit boards
US5025205A (en) * 1989-06-22 1991-06-18 Texas Instruments Incorporated Reconfigurable architecture for logic test system
US5068852A (en) * 1989-11-23 1991-11-26 John Fluke Mfg. Co., Inc. Hardware enhancements for improved performance of memory emulation method
US5131272A (en) * 1990-03-15 1992-07-21 Harris Corporation Portable deployable automatic test system
EP0454316A3 (en) * 1990-04-23 1993-08-18 Communications Manufacturing Company Data terminal for communicating over a telephone circuit
US5287528A (en) * 1990-07-03 1994-02-15 National Instruments Corporation IEEE 488 interface for message handling method
JP2608167B2 (ja) * 1990-08-21 1997-05-07 三菱電機株式会社 Ｉｃテスタ
US5343144A (en) * 1991-02-28 1994-08-30 Sony Corporation Electronic device
JP2641816B2 (ja) * 1991-07-23 1997-08-20 三菱電機株式会社 半導体集積回路の測定方法
US5774377A (en) * 1991-07-30 1998-06-30 Hewlett-Packard Company Method and apparatus for monitoring a subsystem within a distributed system for providing an archive of events within a certain time of a trap condition
US5196803A (en) * 1991-08-01 1993-03-23 Xerox Corporation Apparatus and method for determining the voltage breakdown and conductivity of particulate material
US5223788A (en) * 1991-09-12 1993-06-29 Grumman Aerospace Corporation Functional avionic core tester
US5391984A (en) * 1991-11-01 1995-02-21 Sgs-Thomson Microelectronics, Inc. Method and apparatus for testing integrated circuit devices
US5349660A (en) * 1992-01-24 1994-09-20 Hewlett-Packard Company Method of improving performance in an automated test system
US5241277A (en) * 1992-02-28 1993-08-31 United Technologies Corporation Test system for automatic testing of insulation resistance, capacitance and attenuation of each contact pair in a filter pin connector
US5638383A (en) * 1992-07-24 1997-06-10 Trw Inc. Advanced integrated avionics testing system
US5432711A (en) * 1992-10-16 1995-07-11 Elcon Instruments, Inc. Interface for use with a process instrumentation system
JPH06167362A (ja) * 1992-11-27 1994-06-14 Matsushita Electric Ind Co Ltd マスタ・スレーブ切り替え式計測装置
DE69326004T2 (de) * 1993-09-20 1999-11-25 Hewlett-Packard Gmbh Testapparat mit grosser Kapazität
US5497378A (en) * 1993-11-02 1996-03-05 International Business Machines Corporation System and method for testing a circuit network having elements testable by different boundary scan standards
US5696772A (en) * 1994-05-06 1997-12-09 Credence Systems Corporation Test vector compression/decompression system for parallel processing integrated circuit tester
US5566088A (en) * 1994-06-13 1996-10-15 Motorola, Inc. Modular radio test system and method
US5748642A (en) * 1995-09-25 1998-05-05 Credence Systems Corporation Parallel processing integrated circuit tester
GB2307051B (en) * 1995-11-06 1999-11-03 Marconi Instruments Ltd An equipment for testing electronic circuitry
US5793218A (en) * 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
FR2751082B1 (fr) * 1996-07-10 1998-11-06 Aerospatiale Dispositif de commutation notamment de systeme sous test
US6134674A (en) * 1997-02-28 2000-10-17 Sony Corporation Computer based test operating system
US6064721A (en) * 1997-10-22 2000-05-16 Telecommunications Techniques Corporation Modular test instrument
US6100815A (en) * 1997-12-24 2000-08-08 Electro Scientific Industries, Inc. Compound switching matrix for probing and interconnecting devices under test to measurement equipment
US6891803B1 (en) 1998-12-18 2005-05-10 Sunrise Telecom, Inc. Telecommunications transmission test set
US6269319B1 (en) * 1999-01-29 2001-07-31 The Mcdonnell Douglas Corporation Reconfigurable integration test station
US6629048B1 (en) * 2000-11-20 2003-09-30 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
US6971045B1 (en) 2002-05-20 2005-11-29 Cyress Semiconductor Corp. Reducing tester channels for high pinout integrated circuits
AU2003280452A1 (en) * 2002-06-28 2004-01-19 Teradyne, Inc. Instrument initiated communication for automatic test equipment
US6966019B2 (en) * 2002-06-28 2005-11-15 Teradyne, Inc. Instrument initiated communication for automatic test equipment
US20040066794A1 (en) * 2002-10-08 2004-04-08 Hill Gregory S. Instrument module locator
US7188044B1 (en) * 2004-07-29 2007-03-06 National Semiconductor Corporation World-wide distributed testing for integrated circuits
US7627456B2 (en) * 2005-02-03 2009-12-01 Raytheon Company Dynamically tasking one or more surveillance resources
ES2303415B2 (es) * 2005-10-20 2010-03-04 Universidad De Malaga Banco de ensayos automatizado para ensayos de rutina segun dc 73/23/cee.
US7532492B2 (en) * 2005-12-20 2009-05-12 Tektronix, Inc. Host controlled voltage input system for an accessory device
US20080133308A1 (en) * 2006-11-27 2008-06-05 Harris James E Leakage location methods
US7707000B2 (en) * 2007-04-19 2010-04-27 Agilent Technologies, Inc. Test instrument and system responsive to execution time data
US20090300534A1 (en) * 2008-05-30 2009-12-03 Trilithic, Inc. Apparatus and method for displaying network status
US20100064078A1 (en) * 2008-08-15 2010-03-11 Powell Thomas J Wireless communication between testing instrument and network
US9672127B2 (en) * 2015-04-16 2017-06-06 Teradyne, Inc. Bus interface system for interfacing to different buses
US20180225249A1 (en) * 2017-02-08 2018-08-09 Automatic Labs, Inc. Application-specific integrated circuit configured to interface with automotive diagnostic port

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3694632A (en) * 1969-12-31 1972-09-26 Hawker Siddeley Dynamics Ltd Automatic test equipment utilizing a matrix of digital differential analyzer integrators to generate interrogation signals
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
US3825901A (en) * 1972-11-09 1974-07-23 Ibm Integrated diagnostic tool
GB1504112A (en) * 1976-03-17 1978-03-15 Ibm Interactive enquiry systems
US4212059A (en) * 1977-03-14 1980-07-08 Tokyo Shibaura Electric Co., Ltd. Information processing system
US4200930A (en) * 1977-05-23 1980-04-29 Burroughs Corporation Adapter cluster module for data communications subsystem
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4280220A (en) * 1979-09-17 1981-07-21 Fairchild Camera & Instrument Corp. Electronic testing system

Also Published As

Publication number Publication date
DE3176236D1 (en) 1987-07-09
DK426981A (da) 1982-07-28
ES8303752A1 (es) 1983-02-01
IE52897B1 (en) 1988-04-13
IE811825L (en) 1982-07-27
ES505763A0 (es) 1983-02-01
NO162438B (no) 1989-09-18
NO812978L (no) 1982-07-28
NO162438C (no) 1989-12-27
EP0056895B1 (en) 1987-06-03
AU7402581A (en) 1982-08-05
CA1174732A (en) 1984-09-18
GR75766B (no) 1984-08-02
US4402055A (en) 1983-08-30
JPS57125818A (en) 1982-08-05
EP0056895A2 (en) 1982-08-04
EP0056895A3 (en) 1983-11-16

Similar Documents

Publication Publication Date Title
DE3176236D1 (en) Automatic test system
DE3278545D1 (en) Automatic test system
DE3168922D1 (en) Automatic test system
DE3274326D1 (en) Automatic assembly system
DE3171862D1 (en) Test system
GB2140935B (en) Eye testing system
GB2187315B (en) Automatic test system
GB2104214B (en) Inspection system
DE3277290D1 (en) Automatic hemoclip applier
GB2118311B (en) Testing system
GB2104697B (en) Testing systems
MY8700785A (en) An automatic door system
DE3272904D1 (en) Automatic weighing apparatus
EP0076108A3 (en) Automatic weighing apparatus
GB8323820D0 (en) Automatic toolchanger system
SG72285G (en) Test system
JPS57185489A (en) Automatic performance apparatus
JPS57195292A (en) Automatic accompanying apparatus
JPS57127293A (en) Receiving indication system
GB8702862D0 (en) Automatic testing systems
JPS57159584A (en) Selector for test
JPS57185490A (en) Automatic performance apparatus
JPS57125100A (en) Automatic drawing device
GB2102777B (en) Automatic test equipment
JPS57151221A (en) Tester