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NO812978L - Automatisk kontrollsystem - Google Patents

Automatisk kontrollsystem

Info

Publication number
NO812978L
NO812978L NO812978A NO812978A NO812978L NO 812978 L NO812978 L NO 812978L NO 812978 A NO812978 A NO 812978A NO 812978 A NO812978 A NO 812978A NO 812978 L NO812978 L NO 812978L
Authority
NO
Norway
Prior art keywords
control system
automatic control
automatic
control
Prior art date
Application number
NO812978A
Other languages
English (en)
Other versions
NO162438C (no
NO162438B (no
Inventor
Raymond Allen Lloyd
Larry Lee Charles
William Francis Susie
Allen Wesley Tate Jr
James Richard Reeder
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of NO812978L publication Critical patent/NO812978L/no
Publication of NO162438B publication Critical patent/NO162438B/no
Publication of NO162438C publication Critical patent/NO162438C/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/865—Monitoring of software

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Human Computer Interaction (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Selective Calling Equipment (AREA)
  • Hardware Redundancy (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
NO812978A 1981-01-27 1981-09-02 Automatisk testsystem. NO162438C (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/229,029 US4402055A (en) 1981-01-27 1981-01-27 Automatic test system utilizing interchangeable test devices

Publications (3)

Publication Number Publication Date
NO812978L true NO812978L (no) 1982-07-28
NO162438B NO162438B (no) 1989-09-18
NO162438C NO162438C (no) 1989-12-27

Family

ID=22859550

Family Applications (1)

Application Number Title Priority Date Filing Date
NO812978A NO162438C (no) 1981-01-27 1981-09-02 Automatisk testsystem.

Country Status (12)

Country Link
US (1) US4402055A (no)
EP (1) EP0056895B1 (no)
JP (1) JPS57125818A (no)
AU (1) AU7402581A (no)
CA (1) CA1174732A (no)
DE (1) DE3176236D1 (no)
DK (1) DK426981A (no)
ES (1) ES505763A0 (no)
GR (1) GR75766B (no)
IE (1) IE52897B1 (no)
IL (1) IL63596A (no)
NO (1) NO162438C (no)

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CN1045655A (zh) * 1988-11-23 1990-09-26 约翰弗兰克制造公司 系统自动诊断的内核测试接口和方法
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US4958347A (en) * 1988-11-23 1990-09-18 John Fluke Mfg. Co., Inc. Apparatus, method and data structure for validation of kernel data bus
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US5196803A (en) * 1991-08-01 1993-03-23 Xerox Corporation Apparatus and method for determining the voltage breakdown and conductivity of particulate material
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US5391984A (en) * 1991-11-01 1995-02-21 Sgs-Thomson Microelectronics, Inc. Method and apparatus for testing integrated circuit devices
US5349660A (en) * 1992-01-24 1994-09-20 Hewlett-Packard Company Method of improving performance in an automated test system
US5241277A (en) * 1992-02-28 1993-08-31 United Technologies Corporation Test system for automatic testing of insulation resistance, capacitance and attenuation of each contact pair in a filter pin connector
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Also Published As

Publication number Publication date
DE3176236D1 (en) 1987-07-09
EP0056895A2 (en) 1982-08-04
GR75766B (no) 1984-08-02
JPS57125818A (en) 1982-08-05
IE52897B1 (en) 1988-04-13
ES8303752A1 (es) 1983-02-01
IL63596A (en) 1984-07-31
EP0056895B1 (en) 1987-06-03
EP0056895A3 (en) 1983-11-16
NO162438C (no) 1989-12-27
IE811825L (en) 1982-07-27
US4402055A (en) 1983-08-30
ES505763A0 (es) 1983-02-01
CA1174732A (en) 1984-09-18
AU7402581A (en) 1982-08-05
NO162438B (no) 1989-09-18
DK426981A (da) 1982-07-28

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