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GB2307568B - A test method for testing a micro-controller - Google Patents

A test method for testing a micro-controller

Info

Publication number
GB2307568B
GB2307568B GB9523910A GB9523910A GB2307568B GB 2307568 B GB2307568 B GB 2307568B GB 9523910 A GB9523910 A GB 9523910A GB 9523910 A GB9523910 A GB 9523910A GB 2307568 B GB2307568 B GB 2307568B
Authority
GB
United Kingdom
Prior art keywords
mode
test
micro
controller
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9523910A
Other versions
GB2307568A (en
GB9523910D0 (en
Inventor
I Liang Fang
Kuo Cheng Yu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Holtek Microelectronics Inc
Original Assignee
Holtek Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Holtek Microelectronics Inc filed Critical Holtek Microelectronics Inc
Priority to GB9523910A priority Critical patent/GB2307568B/en
Priority to DE19545156A priority patent/DE19545156A1/en
Publication of GB9523910D0 publication Critical patent/GB9523910D0/en
Publication of GB2307568A publication Critical patent/GB2307568A/en
Application granted granted Critical
Publication of GB2307568B publication Critical patent/GB2307568B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

A micro-controller 12 is operable in three test modes selectable by a register 42 and multiplexer 32 in response to a mode switching signal from a test instrument 28. In an "outer" mode, external instructions from the test instrument are executed in a circuit 30 and the results are sent back to the test instrument. In an "inner" mode, instructions of an in-built self-test program stored in a memory 36 are executed. In the third mode, a ROM read-out device 40 is used for reading the contents of an application program memory 34 so that they can be checked. Provision of the "outer" mode allows up-dating of test procedures.
GB9523910A 1995-11-22 1995-11-22 A test method for testing a micro-controller Expired - Fee Related GB2307568B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB9523910A GB2307568B (en) 1995-11-22 1995-11-22 A test method for testing a micro-controller
DE19545156A DE19545156A1 (en) 1995-11-22 1995-12-04 Testing method for efficient testing of micro-controllers

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9523910A GB2307568B (en) 1995-11-22 1995-11-22 A test method for testing a micro-controller
DE19545156A DE19545156A1 (en) 1995-11-22 1995-12-04 Testing method for efficient testing of micro-controllers

Publications (3)

Publication Number Publication Date
GB9523910D0 GB9523910D0 (en) 1996-01-24
GB2307568A GB2307568A (en) 1997-05-28
GB2307568B true GB2307568B (en) 1998-06-03

Family

ID=26020919

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9523910A Expired - Fee Related GB2307568B (en) 1995-11-22 1995-11-22 A test method for testing a micro-controller

Country Status (2)

Country Link
DE (1) DE19545156A1 (en)
GB (1) GB2307568B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH691248A5 (en) * 1997-03-11 2001-05-31 Siemens Building Tech Ag Circuit arrangement with a microcontroller to interrogate the contact of a pulse generator.

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0127440A2 (en) * 1983-05-23 1984-12-05 Kabushiki Kaisha Toshiba Integrated circuit device incorporating a data processing unit and a ROM storing applications program therein
US4839812A (en) * 1986-09-25 1989-06-13 Robert Bosch Gmbh Method and system for testing internal combustion engine computerized control units

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681757A (en) * 1970-06-10 1972-08-01 Cogar Corp System for utilizing data storage chips which contain operating and non-operating storage cells
JPS58907B2 (en) * 1979-06-13 1983-01-08 コニカ株式会社 Substrate coating method and hopper device
GB8518859D0 (en) * 1985-07-25 1985-08-29 Int Computers Ltd Digital integrated circuits

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0127440A2 (en) * 1983-05-23 1984-12-05 Kabushiki Kaisha Toshiba Integrated circuit device incorporating a data processing unit and a ROM storing applications program therein
US4839812A (en) * 1986-09-25 1989-06-13 Robert Bosch Gmbh Method and system for testing internal combustion engine computerized control units

Also Published As

Publication number Publication date
DE19545156A1 (en) 1997-06-05
GB2307568A (en) 1997-05-28
GB9523910D0 (en) 1996-01-24

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20101122