FR2903226B1 - Transistor en couche mince,son procede de fabrication et dispositif d'affichage comportant un tel transistor. - Google Patents
Transistor en couche mince,son procede de fabrication et dispositif d'affichage comportant un tel transistor.Info
- Publication number
- FR2903226B1 FR2903226B1 FR0610454A FR0610454A FR2903226B1 FR 2903226 B1 FR2903226 B1 FR 2903226B1 FR 0610454 A FR0610454 A FR 0610454A FR 0610454 A FR0610454 A FR 0610454A FR 2903226 B1 FR2903226 B1 FR 2903226B1
- Authority
- FR
- France
- Prior art keywords
- transistor
- display device
- thin film
- manufacturing same
- film transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
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- H01L29/4908—
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- H01L27/1214—
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- H01L29/458—
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- H01L29/66765—
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- H01L29/78669—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/468—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
- H10K10/474—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure
- H10K10/476—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure comprising at least one organic layer and at least one inorganic layer
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- H01L27/1248—
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- H01L27/1292—
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Thin Film Transistor (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060061432A KR101243809B1 (ko) | 2006-06-30 | 2006-06-30 | 박막트랜지스터의 제조방법 및 이를 이용한 tft 어레이기판의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2903226A1 FR2903226A1 (fr) | 2008-01-04 |
FR2903226B1 true FR2903226B1 (fr) | 2013-08-02 |
Family
ID=38825390
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0610454A Active FR2903226B1 (fr) | 2006-06-30 | 2006-11-30 | Transistor en couche mince,son procede de fabrication et dispositif d'affichage comportant un tel transistor. |
Country Status (7)
Country | Link |
---|---|
US (2) | US7679085B2 (fr) |
JP (1) | JP5209203B2 (fr) |
KR (1) | KR101243809B1 (fr) |
CN (1) | CN100541742C (fr) |
DE (1) | DE102006055329B4 (fr) |
FR (1) | FR2903226B1 (fr) |
TW (1) | TWI332709B (fr) |
Families Citing this family (37)
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US6709078B2 (en) * | 2001-01-19 | 2004-03-23 | Gloria Johnson | Decorative, adjustable, protective, cover frame for electronic equipment and furniture |
JP5320746B2 (ja) * | 2007-03-28 | 2013-10-23 | 凸版印刷株式会社 | 薄膜トランジスタ |
TWI409556B (zh) * | 2008-01-09 | 2013-09-21 | Chunghwa Picture Tubes Ltd | 畫素結構與主動元件陣列基板 |
US8035107B2 (en) * | 2008-02-26 | 2011-10-11 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing display device |
US7855097B2 (en) * | 2008-07-11 | 2010-12-21 | Organicid, Inc. | Method of increasing yield in OFETs by using a high-K dielectric layer in a dual dielectric layer |
JP5185004B2 (ja) * | 2008-07-28 | 2013-04-17 | 太陽誘電株式会社 | 弾性境界波デバイスおよびその製造方法、デュープレクサの製造方法 |
JP5590366B2 (ja) * | 2008-08-29 | 2014-09-17 | 日立化成株式会社 | アルミニウム含有有機化合物溶液、電界効果型トランジスタ及び電界効果型トランジスタの作製方法 |
JP5442234B2 (ja) | 2008-10-24 | 2014-03-12 | 株式会社半導体エネルギー研究所 | 半導体装置及び表示装置 |
JP5429454B2 (ja) * | 2009-04-17 | 2014-02-26 | ソニー株式会社 | 薄膜トランジスタの製造方法および薄膜トランジスタ |
WO2010122274A1 (fr) * | 2009-04-24 | 2010-10-28 | Panasonic Corporation | Semi-conducteur à oxyde |
WO2011010542A1 (fr) * | 2009-07-23 | 2011-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Dispositif à semi-conducteurs et son procédé de fabrication |
KR101424950B1 (ko) * | 2009-10-09 | 2014-08-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 |
US10020374B2 (en) | 2009-12-25 | 2018-07-10 | Ricoh Company, Ltd. | Field-effect transistor, semiconductor memory display element, image display device, and system |
JP5899615B2 (ja) * | 2010-03-18 | 2016-04-06 | 株式会社リコー | 絶縁膜の製造方法及び半導体装置の製造方法 |
JPWO2011142088A1 (ja) * | 2010-05-14 | 2013-07-22 | パナソニック株式会社 | フレキシブル半導体装置およびその製造方法ならびに画像表示装置 |
KR20120061383A (ko) * | 2010-12-03 | 2012-06-13 | 삼성전자주식회사 | 표시 장치 및 그 제조 방법 |
KR20120063809A (ko) * | 2010-12-08 | 2012-06-18 | 삼성전자주식회사 | 박막 트랜지스터 표시판 |
CN102629620B (zh) * | 2011-05-16 | 2015-04-01 | 京东方科技集团股份有限公司 | 一种有机薄膜晶体管阵列基板及其制造方法 |
CN102779942B (zh) * | 2011-05-24 | 2015-11-25 | 京东方科技集团股份有限公司 | 一种有机薄膜晶体管阵列基板及其制作方法 |
KR20130052216A (ko) * | 2011-11-11 | 2013-05-22 | 한국전자통신연구원 | 박막 트랜지스터 및 그 제조방법 |
JP2013115098A (ja) * | 2011-11-25 | 2013-06-10 | Sony Corp | トランジスタ、トランジスタの製造方法、表示装置および電子機器 |
TWI584383B (zh) | 2011-12-27 | 2017-05-21 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
TWI500162B (zh) * | 2012-04-03 | 2015-09-11 | E Ink Holdings Inc | 薄膜電晶體及其製造方法 |
CN103367458B (zh) * | 2012-04-03 | 2017-03-01 | 元太科技工业股份有限公司 | 薄膜晶体管及其制造方法 |
JP2014056850A (ja) * | 2012-09-11 | 2014-03-27 | Sony Corp | トランジスタおよびその製造方法、並びに半導体装置の製造方法および表示装置の製造方法 |
CN103296034A (zh) * | 2013-05-28 | 2013-09-11 | 京东方科技集团股份有限公司 | 一种阵列基板、制备方法以及显示装置 |
CN103456745B (zh) * | 2013-09-10 | 2016-09-07 | 北京京东方光电科技有限公司 | 一种阵列基板及其制备方法、显示装置 |
CN103489766A (zh) * | 2013-09-16 | 2014-01-01 | 复旦大学 | 一种氧化镁钛高介电常数薄膜及其制备方法和应用 |
CN104795496A (zh) * | 2015-04-08 | 2015-07-22 | 深圳市华星光电技术有限公司 | 双栅极器件以及双栅极器件的制造方法 |
KR102450399B1 (ko) * | 2015-10-06 | 2022-09-30 | 삼성전자주식회사 | 박막 트랜지스터, 그 제조 방법, 그리고 상기 박막 트랜지스터를 포함하는 전자 장치 |
US10388895B2 (en) * | 2017-11-07 | 2019-08-20 | Shenzhen China Star Optoelectonics Semiconductor Display Technology Co., Ltd. | Organic thin film transistor with charge injection layer and manufacturing method thereof |
CN107945728A (zh) * | 2017-12-15 | 2018-04-20 | 京东方科技集团股份有限公司 | 一种显示基板、显示基板的制作方法及显示装置 |
JP2019179861A (ja) * | 2018-03-30 | 2019-10-17 | 株式会社リコー | 電界効果型トランジスタ、表示素子、画像表示装置、及びシステム |
CN109742091B (zh) | 2019-01-10 | 2021-08-31 | 京东方科技集团股份有限公司 | 显示基板及其制备方法、显示装置 |
CN110164878B (zh) * | 2019-06-10 | 2022-05-03 | 惠科股份有限公司 | 阵列基板及其制备方法 |
KR102199223B1 (ko) | 2019-06-19 | 2021-01-06 | 광운대학교 산학협력단 | 저온 용액 공정 기반의 하이브리드 이중층 구조를 갖는 고성능 양극성 트랜지스터의 제조 방법 |
US11817460B2 (en) * | 2020-03-27 | 2023-11-14 | Boe Technology Group Co., Ltd. | Thin film transistor and method for manufacturing the same, array substrate, and display device |
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US5643804A (en) * | 1993-05-21 | 1997-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a hybrid integrated circuit component having a laminated body |
JPH10335671A (ja) | 1997-06-02 | 1998-12-18 | Sharp Corp | ドライバーモノリシック駆動素子 |
US6486080B2 (en) * | 2000-11-30 | 2002-11-26 | Chartered Semiconductor Manufacturing Ltd. | Method to form zirconium oxide and hafnium oxide for high dielectric constant materials |
US7498084B2 (en) | 2001-09-05 | 2009-03-03 | Sharp Kabushiki Kaisha | Macromolecular structure, functional device having the same, transistor, and display apparatus using the same |
KR100428643B1 (ko) * | 2001-09-13 | 2004-04-30 | 주식회사 엘지화학 | Tft-lcd의 게이트 절연막 피복 조성물 및 그의제조방법 |
JP2004055654A (ja) * | 2002-07-17 | 2004-02-19 | Pioneer Electronic Corp | 有機半導体素子 |
KR20040011158A (ko) * | 2002-07-29 | 2004-02-05 | 엘지.필립스 엘시디 주식회사 | 액정표시장치용 어레이기판과 그 제조방법 |
US7037767B2 (en) * | 2003-03-24 | 2006-05-02 | Konica Minolta Holdings, Inc. | Thin-film transistor, thin-film transistor sheet and their manufacturing method |
JP2005191437A (ja) * | 2003-12-26 | 2005-07-14 | Ricoh Co Ltd | 半導体装置、その製造方法、および表示装置 |
JP4100351B2 (ja) * | 2004-02-09 | 2008-06-11 | セイコーエプソン株式会社 | 薄膜トランジスタの製造方法 |
JP4785396B2 (ja) * | 2004-03-26 | 2011-10-05 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
WO2005122277A1 (fr) * | 2004-06-10 | 2005-12-22 | Konica Minolta Holdings, Inc. | Transistor en couche mince organique |
KR100560796B1 (ko) * | 2004-06-24 | 2006-03-13 | 삼성에스디아이 주식회사 | 유기 박막트랜지스터 및 그의 제조방법 |
JP4306607B2 (ja) * | 2004-12-24 | 2009-08-05 | 富士ゼロックス株式会社 | 電界効果トランジスタ |
KR20060125066A (ko) * | 2005-06-01 | 2006-12-06 | 삼성전자주식회사 | 개구율이 향상된 어레이 기판 및 이의 제조방법 |
US8049205B2 (en) * | 2006-04-06 | 2011-11-01 | Xerox Corporation | Poly(alkynylthiophene)s and electronic devices generated therefrom |
-
2006
- 2006-06-30 KR KR1020060061432A patent/KR101243809B1/ko active IP Right Grant
- 2006-11-23 DE DE102006055329.2A patent/DE102006055329B4/de active Active
- 2006-11-29 CN CN200610160656.5A patent/CN100541742C/zh active Active
- 2006-11-30 FR FR0610454A patent/FR2903226B1/fr active Active
- 2006-12-13 TW TW095146770A patent/TWI332709B/zh active
- 2006-12-25 JP JP2006348032A patent/JP5209203B2/ja active Active
- 2006-12-28 US US11/646,241 patent/US7679085B2/en active Active
-
2010
- 2010-01-25 US US12/656,316 patent/US8129233B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20080001151A1 (en) | 2008-01-03 |
DE102006055329A1 (de) | 2008-01-17 |
US7679085B2 (en) | 2010-03-16 |
JP2008016807A (ja) | 2008-01-24 |
US20100136755A1 (en) | 2010-06-03 |
CN101097868A (zh) | 2008-01-02 |
FR2903226A1 (fr) | 2008-01-04 |
KR20080002545A (ko) | 2008-01-04 |
DE102006055329B4 (de) | 2016-09-15 |
KR101243809B1 (ko) | 2013-03-18 |
US8129233B2 (en) | 2012-03-06 |
CN100541742C (zh) | 2009-09-16 |
TWI332709B (en) | 2010-11-01 |
TW200802885A (en) | 2008-01-01 |
JP5209203B2 (ja) | 2013-06-12 |
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