FR2284186B1 - - Google Patents
Info
- Publication number
- FR2284186B1 FR2284186B1 FR7527498A FR7527498A FR2284186B1 FR 2284186 B1 FR2284186 B1 FR 2284186B1 FR 7527498 A FR7527498 A FR 7527498A FR 7527498 A FR7527498 A FR 7527498A FR 2284186 B1 FR2284186 B1 FR 2284186B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3007—Electron or ion-optical systems
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10196674A JPS5129091A (en) | 1974-09-06 | 1974-09-06 | PATAANKEISEISOCHI |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2284186A1 FR2284186A1 (en) | 1976-04-02 |
FR2284186B1 true FR2284186B1 (en) | 1979-01-19 |
Family
ID=14314598
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7527498A Granted FR2284186A1 (en) | 1974-09-06 | 1975-09-08 | Forming patterns on semiconductors using charged particle beam - with quadripole lens system to focus beam accurately |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS5129091A (en) |
FR (1) | FR2284186A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5360162A (en) * | 1976-11-10 | 1978-05-30 | Toshiba Corp | Electron beam irradiation device |
CA1100237A (en) * | 1977-03-23 | 1981-04-28 | Roger F.W. Pease | Multiple electron beam exposure system |
FR2412939A1 (en) * | 1977-12-23 | 1979-07-20 | Anvar | HIGH CURRENT ION IMPLANTER |
JPS6091630A (en) * | 1983-10-25 | 1985-05-23 | Matsushita Electric Ind Co Ltd | Impurity difusing process |
AT388628B (en) * | 1986-01-31 | 1989-08-10 | Ims Ionen Mikrofab Syst | DEVICE FOR PROJECTION DEVICES |
KR100538813B1 (en) * | 2004-07-31 | 2005-12-23 | 주식회사 하이닉스반도체 | Implanter for uniformity of transistor parameter and method for implantation using the same |
KR20200044097A (en) * | 2017-09-29 | 2020-04-28 | 에이에스엠엘 네델란즈 비.브이. | Sample pre-filling methods and devices for charged particle beam inspection |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL6807439A (en) * | 1968-05-27 | 1969-12-01 |
-
1974
- 1974-09-06 JP JP10196674A patent/JPS5129091A/en active Granted
-
1975
- 1975-09-08 FR FR7527498A patent/FR2284186A1/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5311828B2 (en) | 1978-04-25 |
JPS5129091A (en) | 1976-03-11 |
FR2284186A1 (en) | 1976-04-02 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |