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FR2199613A1 - - Google Patents

Info

Publication number
FR2199613A1
FR2199613A1 FR7330655A FR7330655A FR2199613A1 FR 2199613 A1 FR2199613 A1 FR 2199613A1 FR 7330655 A FR7330655 A FR 7330655A FR 7330655 A FR7330655 A FR 7330655A FR 2199613 A1 FR2199613 A1 FR 2199613A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7330655A
Other languages
French (fr)
Other versions
FR2199613B1 (ru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of FR2199613A1 publication Critical patent/FR2199613A1/fr
Application granted granted Critical
Publication of FR2199613B1 publication Critical patent/FR2199613B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/06—Electron sources; Electron guns
    • H01J37/073—Electron guns using field emission, photo emission, or secondary emission electron sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/063—Electron sources
    • H01J2237/06308—Thermionic sources
    • H01J2237/06316—Schottky emission

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Cold Cathode And The Manufacture (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7330655A 1972-08-17 1973-08-16 Expired FR2199613B1 (ru)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00281375A US3809899A (en) 1972-08-17 1972-08-17 Electron-beam tube including a thermionic-field emission cathode for a scanning electron microscope

Publications (2)

Publication Number Publication Date
FR2199613A1 true FR2199613A1 (ru) 1974-04-12
FR2199613B1 FR2199613B1 (ru) 1977-02-25

Family

ID=23077025

Family Applications (2)

Application Number Title Priority Date Filing Date
FR7330655A Expired FR2199613B1 (ru) 1972-08-17 1973-08-16
FR7412881A Expired FR2214962B1 (ru) 1972-08-17 1974-04-04

Family Applications After (1)

Application Number Title Priority Date Filing Date
FR7412881A Expired FR2214962B1 (ru) 1972-08-17 1974-04-04

Country Status (7)

Country Link
US (1) US3809899A (ru)
JP (3) JPS557661B2 (ru)
CA (1) CA1031080A (ru)
DE (2) DE2341377A1 (ru)
FR (2) FR2199613B1 (ru)
GB (2) GB1433944A (ru)
NL (2) NL7311344A (ru)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0026427A1 (en) * 1979-09-26 1981-04-08 Kabushiki Kaisha Toshiba Electron gun

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2514266C2 (de) * 1975-03-27 1977-04-28 Siemens Ag Korpuskularstrahloptisches geraet mit zwei in strahlrichtung aufeinanderfolgenden teilraeumen unterschiedlicher druecke
US4175234A (en) * 1977-08-05 1979-11-20 University Of Virginia Apparatus for producing ions of thermally labile or nonvolatile solids
US4139773A (en) * 1977-11-04 1979-02-13 Oregon Graduate Center Method and apparatus for producing bright high resolution ion beams
US4379250A (en) * 1979-10-19 1983-04-05 Hitachi, Ltd. Field emission cathode and method of fabricating the same
US4468586A (en) * 1981-05-26 1984-08-28 International Business Machines Corporation Shaped electron emission from single crystal lanthanum hexaboride with intensity distribution
EP0189498B1 (en) * 1985-01-29 1989-05-03 International Business Machines Corporation Field-emission scanning auger electron microscope
EP0462554B1 (en) * 1990-06-20 2000-10-11 Hitachi, Ltd. Charged particle beam apparatus
DE69125229T2 (de) * 1990-08-10 1997-08-28 Koninkl Philips Electronics Nv Ladungspartikelstrahlanordnung
JP3148353B2 (ja) * 1991-05-30 2001-03-19 ケーエルエー・インストルメンツ・コーポレーション 電子ビーム検査方法とそのシステム
US5616926A (en) * 1994-08-03 1997-04-01 Hitachi, Ltd. Schottky emission cathode and a method of stabilizing the same
JP2951609B2 (ja) * 1997-01-20 1999-09-20 株式会社日立製作所 電子ビーム検査装置
JP2951610B2 (ja) * 1997-01-20 1999-09-20 株式会社日立製作所 欠陥検査方法
JP2969091B2 (ja) * 1997-01-20 1999-11-02 株式会社日立製作所 電子ビーム検査装置
EP2365511B1 (en) * 2010-03-10 2013-05-08 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Feedback loop for emitter flash cleaning

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE438468A (ru) * 1939-05-08
NL112758C (ru) * 1942-10-28
NL102095C (ru) * 1955-07-01
NL289910A (ru) * 1962-03-08
US3174026A (en) * 1962-06-20 1965-03-16 Budd Co Method and means of circumventing cathode maintenance in electron beam devices
US3374386A (en) * 1964-11-02 1968-03-19 Field Emission Corp Field emission cathode having tungsten miller indices 100 plane coated with zirconium, hafnium or magnesium on oxygen binder
US3678333A (en) * 1970-06-15 1972-07-18 American Optical Corp Field emission electron gun utilizing means for protecting the field emission tip from high voltage discharges
JPS5852244B2 (ja) * 1977-05-04 1983-11-21 松下電器産業株式会社 モ−タの回転数調整装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
NEANT *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0026427A1 (en) * 1979-09-26 1981-04-08 Kabushiki Kaisha Toshiba Electron gun

Also Published As

Publication number Publication date
JPS557661B2 (ru) 1980-02-27
JPS49132975A (ru) 1974-12-20
NL7311344A (ru) 1974-02-19
DE2341377A1 (de) 1974-03-07
DE2366144C2 (de) 1982-12-30
FR2214962B1 (ru) 1978-07-07
GB1433945A (en) 1976-04-28
US3809899A (en) 1974-05-07
GB1433944A (en) 1976-04-28
JPS54161263A (en) 1979-12-20
NL7908479A (nl) 1980-03-31
FR2199613B1 (ru) 1977-02-25
JPS5661960U (ru) 1981-05-26
CA1031080A (en) 1978-05-09
FR2214962A1 (ru) 1974-08-19

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Legal Events

Date Code Title Description
ST Notification of lapse