EP2297274B1 - Chlorinated naphthalenetetracarboxylic acid derivatives, preparation thereof and use thereof in organic electronics - Google Patents
Chlorinated naphthalenetetracarboxylic acid derivatives, preparation thereof and use thereof in organic electronics Download PDFInfo
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- EP2297274B1 EP2297274B1 EP09757618.5A EP09757618A EP2297274B1 EP 2297274 B1 EP2297274 B1 EP 2297274B1 EP 09757618 A EP09757618 A EP 09757618A EP 2297274 B1 EP2297274 B1 EP 2297274B1
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- European Patent Office
- Prior art keywords
- formula
- alkyl
- compound
- hydrogen
- compounds
- Prior art date
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- 238000002360 preparation method Methods 0.000 title description 6
- MZYHMUONCNKCHE-UHFFFAOYSA-N naphthalene-1,2,3,4-tetracarboxylic acid Chemical class C1=CC=CC2=C(C(O)=O)C(C(=O)O)=C(C(O)=O)C(C(O)=O)=C21 MZYHMUONCNKCHE-UHFFFAOYSA-N 0.000 title description 4
- 150000001875 compounds Chemical class 0.000 claims description 133
- 239000004065 semiconductor Substances 0.000 claims description 86
- 239000000758 substrate Substances 0.000 claims description 65
- 239000000463 material Substances 0.000 claims description 62
- 239000000460 chlorine Substances 0.000 claims description 53
- 239000001257 hydrogen Substances 0.000 claims description 46
- 229910052739 hydrogen Inorganic materials 0.000 claims description 46
- 238000000034 method Methods 0.000 claims description 32
- 125000000217 alkyl group Chemical group 0.000 claims description 27
- 229910052801 chlorine Inorganic materials 0.000 claims description 27
- 230000005669 field effect Effects 0.000 claims description 27
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims description 26
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 20
- 125000003118 aryl group Chemical group 0.000 claims description 19
- 150000002431 hydrogen Chemical class 0.000 claims description 19
- 230000008569 process Effects 0.000 claims description 19
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 18
- 125000000592 heterocycloalkyl group Chemical group 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 claims description 16
- 125000001072 heteroaryl group Chemical group 0.000 claims description 16
- 238000004519 manufacturing process Methods 0.000 claims description 13
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 claims description 10
- 150000001602 bicycloalkyls Chemical group 0.000 claims description 10
- 238000005660 chlorination reaction Methods 0.000 claims description 10
- 229910052740 iodine Inorganic materials 0.000 claims description 10
- 239000011630 iodine Substances 0.000 claims description 10
- 150000001412 amines Chemical class 0.000 claims description 9
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 9
- 125000000547 substituted alkyl group Chemical group 0.000 claims description 6
- KEQGZUUPPQEDPF-UHFFFAOYSA-N 1,3-dichloro-5,5-dimethylimidazolidine-2,4-dione Chemical compound CC1(C)N(Cl)C(=O)N(Cl)C1=O KEQGZUUPPQEDPF-UHFFFAOYSA-N 0.000 claims description 5
- XTHPWXDJESJLNJ-UHFFFAOYSA-N chlorosulfonic acid Substances OS(Cl)(=O)=O XTHPWXDJESJLNJ-UHFFFAOYSA-N 0.000 claims description 5
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 claims description 5
- 239000003054 catalyst Substances 0.000 claims description 4
- 230000003197 catalytic effect Effects 0.000 claims description 3
- -1 radical anion salts Chemical class 0.000 description 584
- 239000010410 layer Substances 0.000 description 60
- 150000003254 radicals Chemical class 0.000 description 53
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 35
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 27
- 125000001424 substituent group Chemical group 0.000 description 21
- 230000037230 mobility Effects 0.000 description 19
- 229910052757 nitrogen Inorganic materials 0.000 description 18
- 239000000243 solution Substances 0.000 description 18
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 16
- 229910052681 coesite Inorganic materials 0.000 description 16
- 229910052906 cristobalite Inorganic materials 0.000 description 16
- 239000000377 silicon dioxide Substances 0.000 description 16
- 229910052682 stishovite Inorganic materials 0.000 description 16
- 229910052905 tridymite Inorganic materials 0.000 description 16
- 230000032258 transport Effects 0.000 description 15
- 238000000151 deposition Methods 0.000 description 14
- 230000008021 deposition Effects 0.000 description 14
- 150000002367 halogens Chemical group 0.000 description 13
- 229920000642 polymer Polymers 0.000 description 13
- RFFLAFLAYFXFSW-UHFFFAOYSA-N 1,2-dichlorobenzene Chemical compound ClC1=CC=CC=C1Cl RFFLAFLAYFXFSW-UHFFFAOYSA-N 0.000 description 12
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 12
- 229910052736 halogen Inorganic materials 0.000 description 11
- 239000002904 solvent Substances 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical group N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- 235000012431 wafers Nutrition 0.000 description 10
- 125000003342 alkenyl group Chemical group 0.000 description 9
- 125000003545 alkoxy group Chemical group 0.000 description 9
- 229910052737 gold Inorganic materials 0.000 description 9
- 239000010931 gold Substances 0.000 description 9
- 239000012212 insulator Substances 0.000 description 9
- SLYCYWCVSGPDFR-UHFFFAOYSA-N octadecyltrimethoxysilane Chemical compound CCCCCCCCCCCCCCCCCC[Si](OC)(OC)OC SLYCYWCVSGPDFR-UHFFFAOYSA-N 0.000 description 9
- 125000004093 cyano group Chemical group *C#N 0.000 description 8
- 229910052731 fluorine Inorganic materials 0.000 description 8
- 239000000203 mixture Substances 0.000 description 8
- 238000007639 printing Methods 0.000 description 8
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 7
- 239000003570 air Substances 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 239000011737 fluorine Substances 0.000 description 7
- 230000006870 function Effects 0.000 description 7
- 239000005054 phenyltrichlorosilane Substances 0.000 description 7
- 229910052709 silver Inorganic materials 0.000 description 7
- ORVMIVQULIKXCP-UHFFFAOYSA-N trichloro(phenyl)silane Chemical compound Cl[Si](Cl)(Cl)C1=CC=CC=C1 ORVMIVQULIKXCP-UHFFFAOYSA-N 0.000 description 7
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 6
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 6
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 6
- 229910052794 bromium Inorganic materials 0.000 description 6
- 150000007942 carboxylates Chemical class 0.000 description 6
- 229920001577 copolymer Polymers 0.000 description 6
- 239000013078 crystal Substances 0.000 description 6
- 150000002739 metals Chemical class 0.000 description 6
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 6
- 238000005240 physical vapour deposition Methods 0.000 description 6
- 230000002829 reductive effect Effects 0.000 description 6
- 238000010008 shearing Methods 0.000 description 6
- 238000000859 sublimation Methods 0.000 description 6
- 230000008022 sublimation Effects 0.000 description 6
- 239000010409 thin film Substances 0.000 description 6
- 229910052725 zinc Inorganic materials 0.000 description 6
- 239000011701 zinc Substances 0.000 description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 5
- 239000004793 Polystyrene Substances 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 5
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 5
- 125000004414 alkyl thio group Chemical group 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical class C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 5
- 125000004429 atom Chemical group 0.000 description 5
- 238000009835 boiling Methods 0.000 description 5
- 239000004020 conductor Substances 0.000 description 5
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 5
- 230000003993 interaction Effects 0.000 description 5
- 229920002223 polystyrene Polymers 0.000 description 5
- 239000010944 silver (metal) Substances 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 5
- 125000000923 (C1-C30) alkyl group Chemical group 0.000 description 4
- 125000004169 (C1-C6) alkyl group Chemical group 0.000 description 4
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 4
- 229910006069 SO3H Inorganic materials 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 125000000304 alkynyl group Chemical group 0.000 description 4
- 125000003710 aryl alkyl group Chemical group 0.000 description 4
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 4
- 125000000392 cycloalkenyl group Chemical group 0.000 description 4
- 238000001704 evaporation Methods 0.000 description 4
- 230000008020 evaporation Effects 0.000 description 4
- 229910003472 fullerene Inorganic materials 0.000 description 4
- 125000001624 naphthyl group Chemical group 0.000 description 4
- 238000013086 organic photovoltaic Methods 0.000 description 4
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 4
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 4
- 125000005346 substituted cycloalkyl group Chemical group 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 4
- 125000004400 (C1-C12) alkyl group Chemical group 0.000 description 3
- 125000004209 (C1-C8) alkyl group Chemical group 0.000 description 3
- XMXCPDQUXVZBGQ-UHFFFAOYSA-N 2,3,6,7-tetrachloronaphthalene-1,4,5,8-tetracarboxylic acid Chemical compound ClC1=C(Cl)C(C(O)=O)=C2C(C(=O)O)=C(Cl)C(Cl)=C(C(O)=O)C2=C1C(O)=O XMXCPDQUXVZBGQ-UHFFFAOYSA-N 0.000 description 3
- 229920003026 Acene Polymers 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000002425 crystallisation Methods 0.000 description 3
- 125000000582 cycloheptyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 3
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 3
- 125000000640 cyclooctyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 3
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 150000008056 dicarboxyimides Chemical class 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 229920002313 fluoropolymer Polymers 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229910052749 magnesium Inorganic materials 0.000 description 3
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 3
- 230000000737 periodic effect Effects 0.000 description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 229920000553 poly(phenylenevinylene) Polymers 0.000 description 3
- 229920000573 polyethylene Polymers 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- 229920000098 polyolefin Polymers 0.000 description 3
- 229920001155 polypropylene Polymers 0.000 description 3
- 229920000915 polyvinyl chloride Polymers 0.000 description 3
- 239000004800 polyvinyl chloride Substances 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 239000011541 reaction mixture Substances 0.000 description 3
- YYMBJDOZVAITBP-UHFFFAOYSA-N rubrene Chemical compound C1=CC=CC=C1C(C1=C(C=2C=CC=CC=2)C2=CC=CC=C2C(C=2C=CC=CC=2)=C11)=C(C=CC=C2)C2=C1C1=CC=CC=C1 YYMBJDOZVAITBP-UHFFFAOYSA-N 0.000 description 3
- 125000003548 sec-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 125000004426 substituted alkynyl group Chemical group 0.000 description 3
- 125000003107 substituted aryl group Chemical group 0.000 description 3
- 125000000020 sulfo group Chemical group O=S(=O)([*])O[H] 0.000 description 3
- 238000010345 tape casting Methods 0.000 description 3
- 125000003396 thiol group Chemical class [H]S* 0.000 description 3
- FZMJEGJVKFTGMU-UHFFFAOYSA-N triethoxy(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](OCC)(OCC)OCC FZMJEGJVKFTGMU-UHFFFAOYSA-N 0.000 description 3
- 238000002371 ultraviolet--visible spectrum Methods 0.000 description 3
- 238000001771 vacuum deposition Methods 0.000 description 3
- 0 *c(c(*)c(c1c2c(C(N3*#I)=O)c(*)c(*)c1*(N1*)=O)C1=O)c2C3=O Chemical compound *c(c(*)c(c1c2c(C(N3*#I)=O)c(*)c(*)c1*(N1*)=O)C1=O)c2C3=O 0.000 description 2
- CLZAEVAEWSHALL-UHFFFAOYSA-N 1,1,1,2,2,3,3-heptafluoropropane Chemical compound F[C](F)C(F)(F)C(F)(F)F CLZAEVAEWSHALL-UHFFFAOYSA-N 0.000 description 2
- PCTZLSCYMRXUGW-UHFFFAOYSA-N 1,1,1,2,2-pentafluorobutane Chemical group [CH2]CC(F)(F)C(F)(F)F PCTZLSCYMRXUGW-UHFFFAOYSA-N 0.000 description 2
- FKTXDTWDCPTPHK-UHFFFAOYSA-N 1,1,1,2,3,3,3-heptafluoropropane Chemical group FC(F)(F)[C](F)C(F)(F)F FKTXDTWDCPTPHK-UHFFFAOYSA-N 0.000 description 2
- 125000006218 1-ethylbutyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000006219 1-ethylpentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000004206 2,2,2-trifluoroethyl group Chemical group [H]C([H])(*)C(F)(F)F 0.000 description 2
- SDWGBHZZXPDKDZ-UHFFFAOYSA-N 2,6-dichloronaphthalene-1,4,5,8-tetracarboxylic acid Chemical compound C1=C(Cl)C(C(O)=O)=C2C(C(=O)O)=CC(Cl)=C(C(O)=O)C2=C1C(O)=O SDWGBHZZXPDKDZ-UHFFFAOYSA-N 0.000 description 2
- STTGYIUESPWXOW-UHFFFAOYSA-N 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline Chemical compound C=12C=CC3=C(C=4C=CC=CC=4)C=C(C)N=C3C2=NC(C)=CC=1C1=CC=CC=C1 STTGYIUESPWXOW-UHFFFAOYSA-N 0.000 description 2
- JESXATFQYMPTNL-UHFFFAOYSA-N 2-ethenylphenol Chemical compound OC1=CC=CC=C1C=C JESXATFQYMPTNL-UHFFFAOYSA-N 0.000 description 2
- UJOBWOGCFQCDNV-UHFFFAOYSA-N 9H-carbazole Chemical compound C1=CC=C2C3=CC=CC=C3NC2=C1 UJOBWOGCFQCDNV-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 241000397426 Centroberyx lineatus Species 0.000 description 2
- 241000252506 Characiformes Species 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 2
- 229920001665 Poly-4-vinylphenol Polymers 0.000 description 2
- 239000004952 Polyamide Substances 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical group [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 239000012080 ambient air Substances 0.000 description 2
- 239000003849 aromatic solvent Substances 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical group [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 2
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 150000001733 carboxylic acid esters Chemical class 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 2
- 238000004440 column chromatography Methods 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000004132 cross linking Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 150000004292 cyclic ethers Chemical class 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- 125000001995 cyclobutyl group Chemical group [H]C1([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 2
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 2
- NNBZCPXTIHJBJL-UHFFFAOYSA-N decalin Chemical compound C1CCCC2CCCCC21 NNBZCPXTIHJBJL-UHFFFAOYSA-N 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 150000002148 esters Chemical group 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- FKRCODPIKNYEAC-UHFFFAOYSA-N ethyl propionate Chemical compound CCOC(=O)CC FKRCODPIKNYEAC-UHFFFAOYSA-N 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000007850 fluorescent dye Substances 0.000 description 2
- 239000004811 fluoropolymer Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 125000006342 heptafluoro i-propyl group Chemical group FC(F)(F)C(F)(*)C(F)(F)F 0.000 description 2
- 125000005842 heteroatom Chemical group 0.000 description 2
- PQAXGPJSVFSKAI-UHFFFAOYSA-N hexadecachlorophthalocyanine Chemical compound C12=C(Cl)C(Cl)=C(Cl)C(Cl)=C2C(N=C2NC(C3=C(Cl)C(Cl)=C(Cl)C(Cl)=C32)=N2)=NC1=NC([C]1C(Cl)=C(Cl)C(Cl)=C(Cl)C1=1)=NC=1N=C1[C]3C(Cl)=C(Cl)C(Cl)=C(Cl)C3=C2N1 PQAXGPJSVFSKAI-UHFFFAOYSA-N 0.000 description 2
- 230000005525 hole transport Effects 0.000 description 2
- 125000002632 imidazolidinyl group Chemical group 0.000 description 2
- 125000002883 imidazolyl group Chemical group 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 125000001041 indolyl group Chemical group 0.000 description 2
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 125000002950 monocyclic group Chemical group 0.000 description 2
- 239000002048 multi walled nanotube Substances 0.000 description 2
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 description 2
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 125000004430 oxygen atom Chemical group O* 0.000 description 2
- 125000006340 pentafluoro ethyl group Chemical group FC(F)(F)C(F)(F)* 0.000 description 2
- 125000003538 pentan-3-yl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])[H] 0.000 description 2
- 150000002979 perylenes Chemical class 0.000 description 2
- 125000004193 piperazinyl group Chemical group 0.000 description 2
- 125000003386 piperidinyl group Chemical group 0.000 description 2
- 229920001467 poly(styrenesulfonates) Polymers 0.000 description 2
- 229920002647 polyamide Polymers 0.000 description 2
- 229920000767 polyaniline Polymers 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920002098 polyfluorene Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 235000019422 polyvinyl alcohol Nutrition 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 125000003373 pyrazinyl group Chemical group 0.000 description 2
- 125000003072 pyrazolidinyl group Chemical group 0.000 description 2
- 125000003226 pyrazolyl group Chemical group 0.000 description 2
- 125000002098 pyridazinyl group Chemical group 0.000 description 2
- 125000004076 pyridyl group Chemical group 0.000 description 2
- 125000000714 pyrimidinyl group Chemical group 0.000 description 2
- 125000000719 pyrrolidinyl group Chemical group 0.000 description 2
- 125000000168 pyrrolyl group Chemical group 0.000 description 2
- 125000002943 quinolinyl group Chemical group N1=C(C=CC2=CC=CC=C12)* 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 125000006413 ring segment Chemical group 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 150000004756 silanes Chemical class 0.000 description 2
- 239000002109 single walled nanotube Substances 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 125000005017 substituted alkenyl group Chemical group 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 239000011593 sulfur Chemical group 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 2
- CWERGRDVMFNCDR-UHFFFAOYSA-N thioglycolic acid Chemical compound OC(=O)CS CWERGRDVMFNCDR-UHFFFAOYSA-N 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 125000005369 trialkoxysilyl group Chemical group 0.000 description 2
- 239000008096 xylene Substances 0.000 description 2
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 1
- 125000006832 (C1-C10) alkylene group Chemical group 0.000 description 1
- 125000003837 (C1-C20) alkyl group Chemical group 0.000 description 1
- 125000006273 (C1-C3) alkyl group Chemical group 0.000 description 1
- 125000004191 (C1-C6) alkoxy group Chemical group 0.000 description 1
- 125000006710 (C2-C12) alkenyl group Chemical group 0.000 description 1
- 125000006552 (C3-C8) cycloalkyl group Chemical group 0.000 description 1
- JVPUTYICKDDWCU-UHFFFAOYSA-N 1,1,2,2-tetrafluoroethane-1,2-diol Chemical compound OC(F)(F)C(O)(F)F JVPUTYICKDDWCU-UHFFFAOYSA-N 0.000 description 1
- XZUFJUJMSCHNDB-UHFFFAOYSA-N 1,1,2,3,3,3-hexafluoropropane-1,2-diol Chemical compound OC(F)(F)C(O)(F)C(F)(F)F XZUFJUJMSCHNDB-UHFFFAOYSA-N 0.000 description 1
- POPHMOPNVVKGRW-UHFFFAOYSA-N 1,2,3,4,4a,5,6,7-octahydronaphthalene Chemical compound C1CCC2CCCCC2=C1 POPHMOPNVVKGRW-UHFFFAOYSA-N 0.000 description 1
- 125000001399 1,2,3-triazolyl group Chemical group N1N=NC(=C1)* 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- OCJBOOLMMGQPQU-UHFFFAOYSA-N 1,4-dichlorobenzene Chemical compound ClC1=CC=C(Cl)C=C1 OCJBOOLMMGQPQU-UHFFFAOYSA-N 0.000 description 1
- 125000004973 1-butenyl group Chemical group C(=CCC)* 0.000 description 1
- 125000004972 1-butynyl group Chemical group [H]C([H])([H])C([H])([H])C#C* 0.000 description 1
- 125000006039 1-hexenyl group Chemical group 0.000 description 1
- LDKSCZJUIURGMW-UHFFFAOYSA-N 1-isothiocyanato-3-methylsulfanylpropane Chemical group CSCCCN=C=S LDKSCZJUIURGMW-UHFFFAOYSA-N 0.000 description 1
- 125000006023 1-pentenyl group Chemical group 0.000 description 1
- 125000006017 1-propenyl group Chemical group 0.000 description 1
- 125000000530 1-propynyl group Chemical group [H]C([H])([H])C#C* 0.000 description 1
- HFZLSTDPRQSZCQ-UHFFFAOYSA-N 1-pyrrolidin-3-ylpyrrolidine Chemical compound C1CCCN1C1CNCC1 HFZLSTDPRQSZCQ-UHFFFAOYSA-N 0.000 description 1
- 125000004214 1-pyrrolidinyl group Chemical group [H]C1([H])N(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- ABFKYPFPQRDCGM-UHFFFAOYSA-N 14832-14-5 Chemical compound [Cu+2].[N-]1C(N=C2C3=C(Cl)C(Cl)=C(Cl)C(Cl)=C3C(N=C3C4=C(Cl)C(Cl)=C(Cl)C(Cl)=C4C(=N4)[N-]3)=N2)=C(C(Cl)=C(Cl)C(Cl)=C2Cl)C2=C1N=C1C2=C(Cl)C(Cl)=C(Cl)C(Cl)=C2C4=N1 ABFKYPFPQRDCGM-UHFFFAOYSA-N 0.000 description 1
- YBYIRNPNPLQARY-UHFFFAOYSA-N 1H-indene Natural products C1=CC=C2CC=CC2=C1 YBYIRNPNPLQARY-UHFFFAOYSA-N 0.000 description 1
- WBGBQSRNXPVFDB-UHFFFAOYSA-N 2,2,3,3,4,4,4-heptafluorobutan-1-amine Chemical compound NCC(F)(F)C(F)(F)C(F)(F)F WBGBQSRNXPVFDB-UHFFFAOYSA-N 0.000 description 1
- SUNUNYBGDFIAME-UHFFFAOYSA-N 2,2,3,3,4,4,5,5,5-nonafluoropentan-1-amine Chemical compound NCC(F)(F)C(F)(F)C(F)(F)C(F)(F)F SUNUNYBGDFIAME-UHFFFAOYSA-N 0.000 description 1
- ATXGLSORWQBLBD-UHFFFAOYSA-N 2,3,6,7,10,11-hexa(undecoxy)triphenylene Chemical group C12=CC(OCCCCCCCCCCC)=C(OCCCCCCCCCCC)C=C2C2=CC(OCCCCCCCCCCC)=C(OCCCCCCCCCCC)C=C2C2=C1C=C(OCCCCCCCCCCC)C(OCCCCCCCCCCC)=C2 ATXGLSORWQBLBD-UHFFFAOYSA-N 0.000 description 1
- NPZFFXIUURRHIH-UHFFFAOYSA-N 2,3,6,7,10,11-hexakis(4-nonylphenyl)triphenylene Chemical group C1=CC(CCCCCCCCC)=CC=C1C1=CC(C2=CC(=C(C=3C=CC(CCCCCCCCC)=CC=3)C=C2C2=CC(=C(C=3C=CC(CCCCCCCCC)=CC=3)C=C22)C=3C=CC(CCCCCCCCC)=CC=3)C=3C=CC(CCCCCCCCC)=CC=3)=C2C=C1C1=CC=C(CCCCCCCCC)C=C1 NPZFFXIUURRHIH-UHFFFAOYSA-N 0.000 description 1
- XUGANSMMMYTZPV-UHFFFAOYSA-N 2,3,6,7,10,11-hexakis(hexylsulfanyl)triphenylene Chemical group C12=CC(SCCCCCC)=C(SCCCCCC)C=C2C2=CC(SCCCCCC)=C(SCCCCCC)C=C2C2=C1C=C(SCCCCCC)C(SCCCCCC)=C2 XUGANSMMMYTZPV-UHFFFAOYSA-N 0.000 description 1
- YMMGRPLNZPTZBS-UHFFFAOYSA-N 2,3-dihydrothieno[2,3-b][1,4]dioxine Chemical compound O1CCOC2=C1C=CS2 YMMGRPLNZPTZBS-UHFFFAOYSA-N 0.000 description 1
- 125000005808 2,4,6-trimethoxyphenyl group Chemical group [H][#6]-1=[#6](-[#8]C([H])([H])[H])-[#6](-*)=[#6](-[#8]C([H])([H])[H])-[#6]([H])=[#6]-1-[#8]C([H])([H])[H] 0.000 description 1
- KLIDCXVFHGNTTM-UHFFFAOYSA-N 2,6-dimethoxyphenol Chemical group COC1=CC=CC(OC)=C1O KLIDCXVFHGNTTM-UHFFFAOYSA-N 0.000 description 1
- JZWGLBCZWLGCDT-UHFFFAOYSA-N 2,7-dichloronaphthalene-1,4,5,8-tetracarboxylic acid Chemical compound ClC1=CC(C(O)=O)=C2C(C(=O)O)=CC(Cl)=C(C(O)=O)C2=C1C(O)=O JZWGLBCZWLGCDT-UHFFFAOYSA-N 0.000 description 1
- UHOPWFKONJYLCF-UHFFFAOYSA-N 2-(2-sulfanylethyl)isoindole-1,3-dione Chemical compound C1=CC=C2C(=O)N(CCS)C(=O)C2=C1 UHOPWFKONJYLCF-UHFFFAOYSA-N 0.000 description 1
- 125000005999 2-bromoethyl group Chemical group 0.000 description 1
- 125000004974 2-butenyl group Chemical group C(C=CC)* 0.000 description 1
- 125000000069 2-butynyl group Chemical group [H]C([H])([H])C#CC([H])([H])* 0.000 description 1
- 125000000143 2-carboxyethyl group Chemical group [H]OC(=O)C([H])([H])C([H])([H])* 0.000 description 1
- 125000001340 2-chloroethyl group Chemical group [H]C([H])(Cl)C([H])([H])* 0.000 description 1
- 125000001731 2-cyanoethyl group Chemical group [H]C([H])(*)C([H])([H])C#N 0.000 description 1
- 125000003006 2-dimethylaminoethyl group Chemical group [H]C([H])([H])N(C([H])([H])[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000006040 2-hexenyl group Chemical group 0.000 description 1
- KGJQHEPGNCWZRN-UHFFFAOYSA-N 2-hexyl-5-[5-[5-(5-hexylthiophen-2-yl)thiophen-2-yl]thiophen-2-yl]thiophene Chemical compound S1C(CCCCCC)=CC=C1C1=CC=C(C=2SC(=CC=2)C=2SC(CCCCCC)=CC=2)S1 KGJQHEPGNCWZRN-UHFFFAOYSA-N 0.000 description 1
- QCMASTUHHXPVGT-UHFFFAOYSA-N 2-hexyl-5-[5-[5-[5-[5-(5-hexylthiophen-2-yl)thiophen-2-yl]thiophen-2-yl]thiophen-2-yl]thiophen-2-yl]thiophene Chemical compound S1C(CCCCCC)=CC=C1C1=CC=C(C=2SC(=CC=2)C=2SC(=CC=2)C=2SC(=CC=2)C=2SC(CCCCCC)=CC=2)S1 QCMASTUHHXPVGT-UHFFFAOYSA-N 0.000 description 1
- NEAQRZUHTPSBBM-UHFFFAOYSA-N 2-hydroxy-3,3-dimethyl-7-nitro-4h-isoquinolin-1-one Chemical class C1=C([N+]([O-])=O)C=C2C(=O)N(O)C(C)(C)CC2=C1 NEAQRZUHTPSBBM-UHFFFAOYSA-N 0.000 description 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 1
- 125000004200 2-methoxyethyl group Chemical group [H]C([H])([H])OC([H])([H])C([H])([H])* 0.000 description 1
- 125000004204 2-methoxyphenyl group Chemical group [H]C1=C([H])C(*)=C(OC([H])([H])[H])C([H])=C1[H] 0.000 description 1
- 125000006024 2-pentenyl group Chemical group 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- 125000001494 2-propynyl group Chemical group [H]C#CC([H])([H])* 0.000 description 1
- 125000004485 2-pyrrolidinyl group Chemical group [H]N1C([H])([H])C([H])([H])C([H])([H])C1([H])* 0.000 description 1
- XDXWNHPWWKGTKO-UHFFFAOYSA-N 207739-72-8 Chemical compound C1=CC(OC)=CC=C1N(C=1C=C2C3(C4=CC(=CC=C4C2=CC=1)N(C=1C=CC(OC)=CC=1)C=1C=CC(OC)=CC=1)C1=CC(=CC=C1C1=CC=C(C=C13)N(C=1C=CC(OC)=CC=1)C=1C=CC(OC)=CC=1)N(C=1C=CC(OC)=CC=1)C=1C=CC(OC)=CC=1)C1=CC=C(OC)C=C1 XDXWNHPWWKGTKO-UHFFFAOYSA-N 0.000 description 1
- GSOFREOFMHUMMZ-UHFFFAOYSA-N 3,4-dicarbamoylnaphthalene-1,2-dicarboxylic acid Chemical class C1=CC=CC2=C(C(O)=N)C(C(=N)O)=C(C(O)=O)C(C(O)=O)=C21 GSOFREOFMHUMMZ-UHFFFAOYSA-N 0.000 description 1
- YEWTUGLUENRXFN-UHFFFAOYSA-N 3-(4-octylphenyl)-2-thiophen-2-ylthiophene Chemical compound C1=CC(CCCCCCCC)=CC=C1C1=C(C=2SC=CC=2)SC=C1 YEWTUGLUENRXFN-UHFFFAOYSA-N 0.000 description 1
- 125000004975 3-butenyl group Chemical group C(CC=C)* 0.000 description 1
- 125000000474 3-butynyl group Chemical group [H]C#CC([H])([H])C([H])([H])* 0.000 description 1
- 125000006041 3-hexenyl group Chemical group 0.000 description 1
- QOXOZONBQWIKDA-UHFFFAOYSA-N 3-hydroxypropyl Chemical group [CH2]CCO QOXOZONBQWIKDA-UHFFFAOYSA-N 0.000 description 1
- OBDVFOBWBHMJDG-UHFFFAOYSA-N 3-mercapto-1-propanesulfonic acid Chemical compound OS(=O)(=O)CCCS OBDVFOBWBHMJDG-UHFFFAOYSA-N 0.000 description 1
- DKIDEFUBRARXTE-UHFFFAOYSA-N 3-mercaptopropanoic acid Chemical compound OC(=O)CCS DKIDEFUBRARXTE-UHFFFAOYSA-N 0.000 description 1
- 125000004575 3-pyrrolidinyl group Chemical group [H]N1C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- XDQWJFXZTAWJST-UHFFFAOYSA-N 3-triethoxysilylpropyl prop-2-enoate Chemical compound CCO[Si](OCC)(OCC)CCCOC(=O)C=C XDQWJFXZTAWJST-UHFFFAOYSA-N 0.000 description 1
- GZEFZLXJPGMRSP-UHFFFAOYSA-N 37,38,39,40-tetrazanonacyclo[28.6.1.13,10.112,19.121,28.04,9.013,18.022,27.031,36]tetraconta-1(37),2,4,6,8,10,12(39),13,15,17,19,21,23,25,27,29,31,33,35-nonadecaene Chemical compound c1ccc2c3cc4[nH]c(cc5nc(cc6[nH]c(cc(n3)c2c1)c1ccccc61)c1ccccc51)c1ccccc41 GZEFZLXJPGMRSP-UHFFFAOYSA-N 0.000 description 1
- UZVMVUUAAXJDIL-UHFFFAOYSA-N 37,38,39,40-tetrazanonacyclo[28.6.1.13,10.112,19.121,28.04,9.013,18.022,27.031,36]tetraconta-1(37),2,4,6,8,10,12(39),13,15,17,19,21,23,25,27,29,31,33,35-nonadecaene zinc Chemical compound [Zn].N1C(C=C2C3=CC=CC=C3C(C=C3C4=CC=CC=C4C(=C4)N3)=N2)=C(C=CC=C2)C2=C1C=C1C2=CC=CC=C2C4=N1 UZVMVUUAAXJDIL-UHFFFAOYSA-N 0.000 description 1
- 125000004801 4-cyanophenyl group Chemical group [H]C1=C([H])C(C#N)=C([H])C([H])=C1* 0.000 description 1
- 125000004860 4-ethylphenyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000006042 4-hexenyl group Chemical group 0.000 description 1
- SXIFAEWFOJETOA-UHFFFAOYSA-N 4-hydroxy-butyl Chemical group [CH2]CCCO SXIFAEWFOJETOA-UHFFFAOYSA-N 0.000 description 1
- 125000004861 4-isopropyl phenyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000004172 4-methoxyphenyl group Chemical group [H]C1=C([H])C(OC([H])([H])[H])=C([H])C([H])=C1* 0.000 description 1
- DIVZFUBWFAOMCW-UHFFFAOYSA-N 4-n-(3-methylphenyl)-1-n,1-n-bis[4-(n-(3-methylphenyl)anilino)phenyl]-4-n-phenylbenzene-1,4-diamine Chemical compound CC1=CC=CC(N(C=2C=CC=CC=2)C=2C=CC(=CC=2)N(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)=C1 DIVZFUBWFAOMCW-UHFFFAOYSA-N 0.000 description 1
- GZKPUYJFADMBGO-UHFFFAOYSA-N 5,10,15,20-tetrapyridin-3-yl-21,23-dihydroporphyrin Chemical compound c1cc2nc1c(-c1cccnc1)c1ccc([nH]1)c(-c1cccnc1)c1ccc(n1)c(-c1cccnc1)c1ccc([nH]1)c2-c1cccnc1 GZKPUYJFADMBGO-UHFFFAOYSA-N 0.000 description 1
- ZCAPDAJQDNCVAE-UHFFFAOYSA-N 5,6,7,8,14,15,16,17,23,24,25,26,32,33,34,35-hexadecafluoro-2,11,20,29,37,38,39,40-octazanonacyclo[28.6.1.13,10.112,19.121,28.04,9.013,18.022,27.031,36]tetraconta-1,3,5,7,9,11,13(18),14,16,19,21(38),22(27),23,25,28,30(37),31(36),32,34-nonadecaene Chemical compound C12=C(F)C(F)=C(F)C(F)=C2C(N=C2NC(C3=C(F)C(F)=C(F)C(F)=C32)=N2)=NC1=NC([C]1C(F)=C(F)C(F)=C(F)C1=1)=NC=1N=C1[C]3C(F)=C(F)C(F)=C(F)C3=C2N1 ZCAPDAJQDNCVAE-UHFFFAOYSA-N 0.000 description 1
- SLEHYHDOAKMPAA-UHFFFAOYSA-N 5,6-dichloronaphthalene-1,2,3,4-tetracarboxylic acid Chemical compound ClC1=C(Cl)C=CC2=C(C(O)=O)C(C(=O)O)=C(C(O)=O)C(C(O)=O)=C21 SLEHYHDOAKMPAA-UHFFFAOYSA-N 0.000 description 1
- 125000006043 5-hexenyl group Chemical group 0.000 description 1
- PONZBUKBFVIXOD-UHFFFAOYSA-N 9,10-dicarbamoylperylene-3,4-dicarboxylic acid Chemical compound C=12C3=CC=C(C(O)=O)C2=C(C(O)=O)C=CC=1C1=CC=C(C(O)=N)C2=C1C3=CC=C2C(=N)O PONZBUKBFVIXOD-UHFFFAOYSA-N 0.000 description 1
- 239000005964 Acibenzolar-S-methyl Substances 0.000 description 1
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- FSQKVOCNJMOLSE-UHFFFAOYSA-N CCCCC(CCCC)N(C(c(c(c1c2C(N3C(CCCC)CCCC)=O)c4cc2Cl)cc(Cl)c1C3=O)=O)C4=O Chemical compound CCCCC(CCCC)N(C(c(c(c1c2C(N3C(CCCC)CCCC)=O)c4cc2Cl)cc(Cl)c1C3=O)=O)C4=O FSQKVOCNJMOLSE-UHFFFAOYSA-N 0.000 description 1
- CUMLTTPGILOKKK-UHFFFAOYSA-N CCCCC(CCCC)N(C(c(cc(c(C(N(C(CCCC)CCCC)C1=O)=O)c2c1c1)Cl)c2c2c1Cl)=O)C2=O Chemical compound CCCCC(CCCC)N(C(c(cc(c(C(N(C(CCCC)CCCC)C1=O)=O)c2c1c1)Cl)c2c2c1Cl)=O)C2=O CUMLTTPGILOKKK-UHFFFAOYSA-N 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 1
- 238000003775 Density Functional Theory Methods 0.000 description 1
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- RJUFJBKOKNCXHH-UHFFFAOYSA-N Methyl propionate Chemical compound CCC(=O)OC RJUFJBKOKNCXHH-UHFFFAOYSA-N 0.000 description 1
- BZLVMXJERCGZMT-UHFFFAOYSA-N Methyl tert-butyl ether Chemical compound COC(C)(C)C BZLVMXJERCGZMT-UHFFFAOYSA-N 0.000 description 1
- 229910000861 Mg alloy Inorganic materials 0.000 description 1
- RYAHYXHXCGXUOK-UHFFFAOYSA-N N-ethenylbutan-2-imine Chemical group CCC(C)=NC=C RYAHYXHXCGXUOK-UHFFFAOYSA-N 0.000 description 1
- URLKBWYHVLBVBO-UHFFFAOYSA-N Para-Xylene Chemical group CC1=CC=C(C)C=C1 URLKBWYHVLBVBO-UHFFFAOYSA-N 0.000 description 1
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 1
- 229920000280 Poly(3-octylthiophene) Polymers 0.000 description 1
- 229920002367 Polyisobutene Polymers 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- XBDYBAVJXHJMNQ-UHFFFAOYSA-N Tetrahydroanthracene Natural products C1=CC=C2C=C(CCCC3)C3=CC2=C1 XBDYBAVJXHJMNQ-UHFFFAOYSA-N 0.000 description 1
- XSTXAVWGXDQKEL-UHFFFAOYSA-N Trichloroethylene Chemical group ClC=C(Cl)Cl XSTXAVWGXDQKEL-UHFFFAOYSA-N 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- MCEWYIDBDVPMES-UHFFFAOYSA-N [60]pcbm Chemical compound C123C(C4=C5C6=C7C8=C9C%10=C%11C%12=C%13C%14=C%15C%16=C%17C%18=C(C=%19C=%20C%18=C%18C%16=C%13C%13=C%11C9=C9C7=C(C=%20C9=C%13%18)C(C7=%19)=C96)C6=C%11C%17=C%15C%13=C%15C%14=C%12C%12=C%10C%10=C85)=C9C7=C6C2=C%11C%13=C2C%15=C%12C%10=C4C23C1(CCCC(=O)OC)C1=CC=CC=C1 MCEWYIDBDVPMES-UHFFFAOYSA-N 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- 125000000641 acridinyl group Chemical group C1(=CC=CC2=NC3=CC=CC=C3C=C12)* 0.000 description 1
- 239000011149 active material Substances 0.000 description 1
- 238000007754 air knife coating Methods 0.000 description 1
- 125000001931 aliphatic group Chemical group 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 125000003302 alkenyloxy group Chemical group 0.000 description 1
- 125000005108 alkenylthio group Chemical group 0.000 description 1
- 229920000109 alkoxy-substituted poly(p-phenylene vinylene) Polymers 0.000 description 1
- 125000003282 alkyl amino group Chemical group 0.000 description 1
- 125000004644 alkyl sulfinyl group Chemical group 0.000 description 1
- 125000004390 alkyl sulfonyl group Chemical group 0.000 description 1
- 125000002947 alkylene group Chemical group 0.000 description 1
- 125000005133 alkynyloxy group Chemical group 0.000 description 1
- 125000005109 alkynylthio group Chemical group 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 235000019270 ammonium chloride Nutrition 0.000 description 1
- 150000003863 ammonium salts Chemical class 0.000 description 1
- OXWLTIXJYVNZFV-UHFFFAOYSA-N anisole;phenoxybenzene Chemical compound COC1=CC=CC=C1.C=1C=CC=CC=1OC1=CC=CC=C1 OXWLTIXJYVNZFV-UHFFFAOYSA-N 0.000 description 1
- 125000002178 anthracenyl group Chemical group C1(=CC=CC2=CC3=CC=CC=C3C=C12)* 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 150000008378 aryl ethers Chemical class 0.000 description 1
- 125000000732 arylene group Chemical group 0.000 description 1
- XJHABGPPCLHLLV-UHFFFAOYSA-N benzo[de]isoquinoline-1,3-dione Chemical class C1=CC(C(=O)NC2=O)=C3C2=CC=CC3=C1 XJHABGPPCLHLLV-UHFFFAOYSA-N 0.000 description 1
- 125000003354 benzotriazolyl group Chemical group N1N=NC2=C1C=CC=C2* 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229940043232 butyl acetate Drugs 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 125000000609 carbazolyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3NC12)* 0.000 description 1
- 150000001721 carbon Chemical group 0.000 description 1
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 1
- HDFRDWFLWVCOGP-UHFFFAOYSA-N carbonothioic O,S-acid Chemical class OC(S)=O HDFRDWFLWVCOGP-UHFFFAOYSA-N 0.000 description 1
- 150000003857 carboxamides Chemical class 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical group 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 125000002057 carboxymethyl group Chemical group [H]OC(=O)C([H])([H])[*] 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 125000002676 chrysenyl group Chemical group C1(=CC=CC=2C3=CC=C4C=CC=CC4=C3C=CC12)* 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- DLKOGKBOBOTEFO-UHFFFAOYSA-N copper 37,38,39,40-tetrazanonacyclo[28.6.1.13,10.112,19.121,28.04,9.013,18.022,27.031,36]tetraconta-1(37),2,4,6,8,10,12(39),13,15,17,19,21,23,25,27,29,31,33,35-nonadecaene Chemical compound [Cu].N1C(C=C2C3=CC=CC=C3C(C=C3C4=CC=CC=C4C(=C4)N3)=N2)=C(C=CC=C2)C2=C1C=C1C2=CC=CC=C2C4=N1 DLKOGKBOBOTEFO-UHFFFAOYSA-N 0.000 description 1
- 150000001882 coronenes Chemical class 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 239000012043 crude product Substances 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 125000002993 cycloalkylene group Chemical group 0.000 description 1
- 125000004145 cyclopenten-1-yl group Chemical group [H]C1=C(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 229940117389 dichlorobenzene Drugs 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 125000000532 dioxanyl group Chemical group 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 229940093499 ethyl acetate Drugs 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 125000003983 fluorenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3CC12)* 0.000 description 1
- 125000001207 fluorophenyl group Chemical group 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 150000002343 gold Chemical class 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- RBTKNAXYKSUFRK-UHFFFAOYSA-N heliogen blue Chemical compound [Cu].[N-]1C2=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=NC([N-]1)=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=N2 RBTKNAXYKSUFRK-UHFFFAOYSA-N 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- QRRKXCPLJGPVHN-UHFFFAOYSA-N hexabenzocoronene Chemical compound C12C(C(=C34)C(=C56)C7=C89)=C%10C7=C7C%11=CC=CC7=C8C=CC=C9C5=CC=CC6=C3C=CC=C4C1=CC=CC2=C1C%10=C%11C=CC1 QRRKXCPLJGPVHN-UHFFFAOYSA-N 0.000 description 1
- ORTRWBYBJVGVQC-UHFFFAOYSA-N hexadecane-1-thiol Chemical compound CCCCCCCCCCCCCCCCS ORTRWBYBJVGVQC-UHFFFAOYSA-N 0.000 description 1
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical group 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 230000005661 hydrophobic surface Effects 0.000 description 1
- 125000002636 imidazolinyl group Chemical group 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 125000003453 indazolyl group Chemical group N1N=C(C2=C1C=CC=C2)* 0.000 description 1
- 125000003454 indenyl group Chemical group C1(C=CC2=CC=CC=C12)* 0.000 description 1
- HRHKULZDDYWVBE-UHFFFAOYSA-N indium;oxozinc;tin Chemical compound [In].[Sn].[Zn]=O HRHKULZDDYWVBE-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000000976 ink Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 229910003480 inorganic solid Inorganic materials 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 125000002183 isoquinolinyl group Chemical group C1(=NC=CC2=CC=CC=C12)* 0.000 description 1
- 125000004628 isothiazolidinyl group Chemical group S1N(CCC1)* 0.000 description 1
- 125000001786 isothiazolyl group Chemical group 0.000 description 1
- 125000003965 isoxazolidinyl group Chemical group 0.000 description 1
- 238000007759 kiss coating Methods 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 239000000990 laser dye Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 125000000040 m-tolyl group Chemical group [H]C1=C([H])C(*)=C([H])C(=C1[H])C([H])([H])[H] 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 description 1
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- JIQNWFBLYKVZFY-UHFFFAOYSA-N methoxycyclohexatriene Chemical compound COC1=C[C]=CC=C1 JIQNWFBLYKVZFY-UHFFFAOYSA-N 0.000 description 1
- 229940017219 methyl propionate Drugs 0.000 description 1
- 238000000302 molecular modelling Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 125000005322 morpholin-1-yl group Chemical group 0.000 description 1
- YKYONYBAUNKHLG-UHFFFAOYSA-N n-Propyl acetate Natural products CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 1
- HAGWGWQUZPWZER-UHFFFAOYSA-N n-prop-1-enylbutan-2-imine Chemical group CCC(C)=NC=CC HAGWGWQUZPWZER-UHFFFAOYSA-N 0.000 description 1
- 150000002790 naphthalenes Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 125000003261 o-tolyl group Chemical group [H]C1=C([H])C(*)=C(C([H])=C1[H])C([H])([H])[H] 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 125000000160 oxazolidinyl group Chemical group 0.000 description 1
- 125000002971 oxazolyl group Chemical group 0.000 description 1
- 125000001037 p-tolyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])([H])[H] 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- FZYQHMHIALEGMG-MVOHYUIRSA-N pcbb Chemical compound CCCCOC(=O)CCCC1([C@]23C4=C5C=CC6=C7C=CC8=C9C=CC%10=C%11C=CC%12=C(C=C4)[C@]31C1=C3C4=C2C5=C6C=2C7=C8C5=C9C%10=C(C3=C5C4=2)C%11=C%121)C1=CC=CC=C1 FZYQHMHIALEGMG-MVOHYUIRSA-N 0.000 description 1
- BRVSNRNVRFLFLL-HQSVLGJOSA-N pcbo Chemical compound CCCCCCCCOC(=O)CCCC1([C@]23C4=C5C=CC6=C7C=CC8=C9C=CC%10=C%11C=CC%12=C(C=C4)[C@]31C1=C3C4=C2C5=C6C=2C7=C8C5=C9C%10=C(C3=C5C4=2)C%11=C%121)C1=CC=CC=C1 BRVSNRNVRFLFLL-HQSVLGJOSA-N 0.000 description 1
- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 description 1
- 150000002964 pentacenes Chemical class 0.000 description 1
- 239000010702 perfluoropolyether Substances 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- LBOJSACZVLWUHN-UHFFFAOYSA-N perylene-3,4-dicarboximide Chemical class C=12C3=CC=CC2=CC=CC=1C1=CC=C2C(=O)NC(=O)C4=CC=C3C1=C42 LBOJSACZVLWUHN-UHFFFAOYSA-N 0.000 description 1
- 125000001792 phenanthrenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3C=CC12)* 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 150000003009 phosphonic acids Chemical class 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920000264 poly(3',7'-dimethyloctyloxy phenylene vinylene) Polymers 0.000 description 1
- 229920000301 poly(3-hexylthiophene-2,5-diyl) polymer Polymers 0.000 description 1
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920001088 polycarbazole Polymers 0.000 description 1
- 125000003367 polycyclic group Chemical group 0.000 description 1
- 229920000414 polyfuran Polymers 0.000 description 1
- 229920000128 polypyrrole Polymers 0.000 description 1
- 229920000123 polythiophene Polymers 0.000 description 1
- 150000004032 porphyrins Chemical class 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 229940090181 propyl acetate Drugs 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000012264 purified product Substances 0.000 description 1
- 125000000561 purinyl group Chemical group N1=C(N=C2N=CNC2=C1)* 0.000 description 1
- 125000002755 pyrazolinyl group Chemical group 0.000 description 1
- 125000001725 pyrenyl group Chemical group 0.000 description 1
- CXZRDVVUVDYSCQ-UHFFFAOYSA-M pyronin B Chemical compound [Cl-].C1=CC(=[N+](CC)CC)C=C2OC3=CC(N(CC)CC)=CC=C3C=C21 CXZRDVVUVDYSCQ-UHFFFAOYSA-M 0.000 description 1
- 238000006862 quantum yield reaction Methods 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- PYWVYCXTNDRMGF-UHFFFAOYSA-N rhodamine B Chemical class [Cl-].C=12C=CC(=[N+](CC)CC)C=C2OC2=CC(N(CC)CC)=CC=C2C=1C1=CC=CC=C1C(O)=O PYWVYCXTNDRMGF-UHFFFAOYSA-N 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 1
- 238000000935 solvent evaporation Methods 0.000 description 1
- 238000000527 sonication Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000012430 stability testing Methods 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 125000000565 sulfonamide group Chemical group 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
- DHCDFWKWKRSZHF-UHFFFAOYSA-N sulfurothioic S-acid Chemical class OS(O)(=O)=S DHCDFWKWKRSZHF-UHFFFAOYSA-N 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 1
- 125000001935 tetracenyl group Chemical group C1(=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C12)* 0.000 description 1
- 125000003718 tetrahydrofuranyl group Chemical group 0.000 description 1
- 125000001412 tetrahydropyranyl group Chemical group 0.000 description 1
- 125000003507 tetrahydrothiofenyl group Chemical group 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
- 238000001149 thermolysis Methods 0.000 description 1
- 125000001984 thiazolidinyl group Chemical group 0.000 description 1
- 125000000335 thiazolyl group Chemical group 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 125000005309 thioalkoxy group Chemical group 0.000 description 1
- 150000003573 thiols Chemical class 0.000 description 1
- NJRXVEJTAYWCQJ-UHFFFAOYSA-N thiomalic acid Chemical compound OC(=O)CC(S)C(O)=O NJRXVEJTAYWCQJ-UHFFFAOYSA-N 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- 150000003577 thiophenes Chemical class 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 125000005259 triarylamine group Chemical group 0.000 description 1
- 125000004306 triazinyl group Chemical group 0.000 description 1
- 125000001425 triazolyl group Chemical group 0.000 description 1
- PYJJCSYBSYXGQQ-UHFFFAOYSA-N trichloro(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](Cl)(Cl)Cl PYJJCSYBSYXGQQ-UHFFFAOYSA-N 0.000 description 1
- UBOXGVDOUJQMTN-UHFFFAOYSA-N trichloroethylene Natural products ClCC(Cl)Cl UBOXGVDOUJQMTN-UHFFFAOYSA-N 0.000 description 1
- LFRDHGNFBLIJIY-UHFFFAOYSA-N trimethoxy(prop-2-enyl)silane Chemical compound CO[Si](OC)(OC)CC=C LFRDHGNFBLIJIY-UHFFFAOYSA-N 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- 150000003643 triphenylenes Chemical class 0.000 description 1
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
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Definitions
- the present invention relates to chlorinated naphthalenetetracarboxylic acid derivatives, preparation thereof and use thereof as charge transport materials, exciton transport materials or emitter materials.
- organic semiconductors have advantages over the classical inorganic semiconductors, for example better substrate compatibility and better processibility of the semiconductor components based on them. They allow processing on flexible substrates and enable their interface orbital energies to be adjusted precisely to the particular application sector by the methods of molecular modeling. The significantly reduced costs of such components have brought a renaissance to the field of research of organic electronics. "Organic electronics" is concerned principally with the development of new materials and manufacturing processes for the production of electronic components based on organic semiconductor layers.
- OLEDs organic field-effect transistors
- OLEDs organic light-emitting diodes
- photovoltaics photovoltaics
- OLEDs organic field-effect transistors
- OLEDs exploit the property of materials of emitting light when they are excited by electrical current.
- OLEDs are particularly of interest as alternatives to cathode ray tubes and liquid-crystal displays for producing flat visual display units. Owing to the very compact design and the intrinsically lower power consumption, devices which comprise OLEDs are suitable especially for mobile applications, for example for applications in cellphones, laptops, etc.
- H. Tachikawa and H. Kawabata describe, in Jpn. J. Appl. Phys., volume 44, No. 6A (2005), p. 3769 - 3773 , hybrid density functional theory studies on complexes of halogenated naphthalene-1,8:4,5-tetracarboxylic bisanhydrides. In these studies, the effects of the halogen substitution on the electronic states were exclusively computer-modeled. A performable synthesis of halogenated naphthalene-1,8:4,5-tetracarboxylic bisanhydrides and measurements on real existing compounds are not described.
- JP 11149984 describes organic electroluminescence devices containing a layer based on at least one of the following compounds: wherein R 1 to R 12 and R 21 to R 32 , respectively, represent i.a. a hydrogen atom, a halogen atom, an alkyl group, a cycloalkyl group, an alkoxy group, an annular alkoxy group or a substituted or unsubstituted aryl group.
- US 2005/0176970 A1 describes n-semiconductors based on substituted perylene-3,4-dicarboximides and perylene-3,4:9,10-bis(dicarboximides). This document also describes, in quite general terms and without any proof by a preparation example, substituted naphthalene-1,8-dicarboximides and naphthalene-1,4,5,8-bis(dicarboximides) and use thereof as n-semiconductors.
- JP 02255789 describes an organic electric field luminescent element having successively a positive pore injection and transportation layer.
- JP 05027469 again describes an electrophotographic sensitive body, wherein a middle layer and a photosensitive layer are successively formed on an electric conductive substrate.
- the middle layer contains a naphthalene tetracarboxylic acid diimide compound of the following formula: where R is ⁇ 8 C alkyl or aralkyl, each of R' and R" is ⁇ 8 C alkylene, R' and R" may be different from each other, Rc is ⁇ 8 C cycloalkylene or arylene, each of A 1 and A 2 is H, ⁇ 4 C alkyl, nitro, cyano, carboxylic ester or halogen, and each of k, m and n is 0 or 1, but all of k, m and n are not 0.
- EP 0033015 describes the use of electrically conductive cyclic polyimides of the following formula: wherein R represents a divalent aliphatic group containing an electric donor; R 1 represents hydrogen, halogen, -SO 3 H, -CN, -COOR 2 , -N(R 3 ) 2 , -OR 4 or - NO 2 ; R 2 , R 3 and R 4 represent hydrogen or C 1 -C 6 alkyl; and n represents an integer of from 2 to 1000, and m is 1 or 2.
- semiconductor materials which are advantageously suitable for use in organic electronics, specifically for field-effect transistors and organic solar cells.
- semiconductor materials which are virtually transparent in the visible wavelength range, especially in the wavelength range above 450 nm.
- the semiconductor materials have absorption of less than 10%, in particular no absorption, in the wavelength range above 450 nm, which are air-stable and have high charge mobilities.
- semiconductor materials which are processible in liquid form; i.e. the semiconductor materials should be sufficiently soluble, which permits wet processing directly and allows the fabrication of low-cost organic electronics.
- the semiconductor materials should have charge mobilities of least 0.1 cm 2 V -1 s -1 when deposited by vacuum-deposition methods or e.g. of least 0.01 cm 2 V -1 s -1 when deposited in liquid form.
- chlorinated naphthalenetetracarboxylic acid derivatives are particularly advantageously suitable as charge transport materials, exciton transport materials or emitter materials. They are notable especially as n-type semiconductors with high charge mobilities preferably e.g. of at least 0.01 cm 2 V -1 s -1 . In addition, the components resulting therefrom are air-stable.
- the invention therefore firstly provides for the use of compounds of the general formula (I.B) where
- the invention further provides compounds of the formula (I.Ba) in which
- the invention further provides a process for preparing compounds of the general formula (I.B). in which
- the invention further relates to the use of compounds of the formula (I.B) as emitter materials, charge transport materials or exciton transport materials.
- the invention also provides organic field-effect transistors (OFETs), substrates comprising a multitude of organic field-effect transistors, semiconductor units, organic light-emitting diodes (OLEDs) and organic solar cells, which comprise at least one compound of the formula (I.B).
- OFETs organic field-effect transistors
- substrates comprising a multitude of organic field-effect transistors, semiconductor units, organic light-emitting diodes (OLEDs) and organic solar cells, which comprise at least one compound of the formula (I.B).
- R a and R b are each independently 1H,1H-perfluoro-C 2 -C 30 -alkyl, 1H,1H,2H,2H-perfluoro-C 3 -C 30 -alkyl or branched C 3 -C 30 -alkyl.
- the R 1 and R 3 radicals are each chlorine and the R 2 and R 4 radicals are each hydrogen.
- the R 1 and R 4 radicals are each chlorine and the R 2 and R 3 radicals are each hydrogen.
- the R 1 , R 2 and R 3 radicals are each chlorine and the R 4 radicals are each hydrogen.
- the R 1 , R 2 , R 3 and R 4 radicals are each chlorine.
- unsubstituted or substituted alkyl, alkenyl, alkadienyl, alkynyl, cycloalkyl, bicycloalkyl, cycloalkenyl, heterocycloalkyl, aryl or heteroaryl refers to unsubstituted or substituted alkyl, unsubstituted or substituted alkenyl, unsubstituted or substituted alkadienyl, unsubstituted or substituted alkynyl, unsubstituted or substituted cycloalkyl, unsubstituted or substituted bicycloalkyl, unsubstituted or substituted cycloalkenyl, unsubstituted or substituted heterocycloalkyl, unsubstituted or substituted aryl or unsubstituted or substituted heteroaryl.
- alkyl comprises straight-chain or branched alkyl. It is preferably straight-chain or branched C 1 -C 70 -alkyl, especially C 1 -C 30 -alkyl, more especially C 1 -C 20 -alkyl, e.g. C 1 -C 12 -alkyl.
- alkyl groups are especially methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, sec-butyl, tert-butyl, n-pentyl, n-hexyl, n-heptyl, n-octyl, n-nonyl, n-decyl, n-undecyl, n-dodecyl, n-tridecyl, n-tetradecyl, n-hexadecyl, n-octadecyl and n-eicosyl.
- Preferred branched alkyl groups are swallowtail alkyl groups (see below).
- R e is preferably hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl.
- alkyl also comprises substituted alkyl radicals. Substituted alkyl groups may, depending on the length of the alkyl chain, have one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents.
- Halogen substituents are preferably fluorine, chlorine or bromine.
- Carboxylate and sulfonate are, respectively, a derivative of a carboxylic acid function or a sulfonic acid function, especially a metal carboxylate or sulfonate, a carboxylic ester or sulfonic ester function or a carboxamide or sulfonamide function.
- Cycloalkyl, heterocycloalkyl, aryl and hetaryl substituents of the alkyl groups may in turn be unsubstituted or substituted; suitable substituents are those specified below for these groups.
- alkyl also apply to the alkyl moieties in alkoxy, alkylamino, alkylthio, alkylsulfinyl, alkylsulfonyl, etc.
- Aryl-substituted alkyl radicals (“arylalkyl”) have at least one unsubstituted or substituted aryl group as defined below.
- the alkyl group in "arylalkyl” may bear at least one further substituent and/or be interrupted by one or more nonadjacent groups which are selected from -O-, -S-, -NR e -, -CO- and/or -SO 2 -.
- R e has one of the meanings given above.
- Arylalkyl is preferably phenyl-C 1 -C 10 -alkyl, more preferably phenyl-C 1 -C 4 -alkyl, for example benzyl, 1-phenethyl, 2-phenethyl, 1-phenprop-1-yl, 2-phenprop-1-yl, 3-phenprop-1-yl, 1-phenbut-1-yl, 2-phenbut-1-yl, 3-phenbut-1-yl, 4-phenbut-1-yl, 1-phenbut-2-yl, 2-phenbut-2-yl, 3-phenbut-2-yl, 4-phenbut-2-yl, 1-(phenmeth)eth-1-yl, 1-(phenmethyl)-1-(methyl)eth-1-yl or (phenmethyl)-1-(methyl)prop-1-yl; preferably benzyl and 2-phenethyl.
- alkenyl comprises straight-chain and branched alkenyl groups which, depending on the chain length, may bear one or more noncumulated carbon-carbon double bonds (e.g. 1, 2, 3, 4 or more than 4). Alkenyl which has two double bonds is also referred to hereinafter as alkadienyl. Preference is given to C 2 -C 18 -, particular preference to C 2 -C 12 -alkenyl groups.
- alkenyl also comprises substituted alkenyl groups which may bear one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents.
- Suitable substituents are, for example, selected from cycloalkyl, heterocycloalkyl, aryl, hetaryl, halogen, hydroxyl, alkoxy, alkylthio, mercapto, COOH, carboxylate, SO 3 H, sulfonate, NE 3 E 4 , nitro and cyano, where E 3 and E 4 are each independently hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl.
- Alkenyl is then, for example, ethenyl, 1-propenyl, 2-propenyl, 1-butenyl, 2-butenyl, 3-butenyl, 1-pentenyl, 2-pentenyl, 3-pentenyl, 4-pentenyl, 1-hexenyl, 2-hexenyl, 3-hexenyl, 4-pentenyl, 1-hexenyl, 2-hexenyl, 3-hexenyl, 4-hexenyl, 5-hexenyl, penta-1,3-dien-1-yl, hexa-1,4-dien-1-yl, hexa-1,4-dien-3-yl, hexa-1,4-dien-6-yl, hexa-1,5-dien-1-yl, hexa-1,5-dien-3-yl, hexa-1,5-dien-4-yl, hepta-1,4-dien-1-yl, h
- alkynyl comprises unsubstituted or substituted alkynyl groups which have one or more nonadjacent triple bonds, such as ethynyl, 1-propynyl, 2-propynyl, 1-butynyl, 2-butynyl, 3-butynyl, 1-pentynyl, 2-pentynyl, 3-pentynyl, 4-pentynyl, 1-hexynyl, 2-hexynyl, 3-hexynyl, 4-hexynyl, 5-hexynyl.
- Substituted alkynyls preferably bear one or more (e.g. 1, 2, 3, 4, 5 or more than 5) of the substituents specified above for alkenyl.
- cycloalkyl comprises unsubstituted or else substituted cycloalkyl groups, preferably C 3 -C 8 -cycloalkyl groups such as cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, cycloheptyl or cyclooctyl, especially C 5 -C 8 -cycloalkyl.
- Substituted cycloalkyl groups may have one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents. These are preferably each independently selected from alkyl, alkoxy, alkylthio and the substituents specified above for the alkyl groups.
- the cycloalkyl groups preferably bear one or more, for example one, two, three, four or five, C 1 -C 6 -alkyl groups.
- cycloalkyl groups are cyclopentyl, 2- and 3-methylcyclopentyl, 2-and 3-ethylcyclopentyl, cyclohexyl, 2-, 3- and 4-methylcyclohexyl, 2-, 3- and 4-ethylcyclohexyl, 2-, 3- and 4-propylcyclohexyl, 2-, 3- and 4-isopropylcyclohexyl, 2-, 3-and 4-butylcyclohexyl, 2-, 3- and 4-sec-butylcyclohexyl, 2-, 3- and 4-tert-butylcyclohexyl, cycloheptyl, 2-, 3- and 4-methylcycloheptyl, 2-, 3- and 4-ethylcycloheptyl, 2-, 3- and 4-propylcycloheptyl, 2-, 3- and 4-isopropylcycloheptyl, 2-, 3- and 4-butylcycloheptyl, 2-, 3- and 4-sec-butylcyclohe
- cycloalkenyl comprises unsubstituted and substituted monounsaturated hydrocarbon groups having from 3 to 8, preferably from 5 to 6 carbon ring members, such as cyclopenten-1-yl, cyclopenten-3-yl, cyclohexen-1-yl, cyclohexen-3-yl, cyclohexen-4-yl. Suitable substituents are those specified above for cycloalkyl.
- bicycloalkyl preferably comprises bicyclic hydrocarbon radicals having from 5 to 10 carbon atoms, such as bicyclo[2.2.1]hept-1-yl, bicyclo[2.2.1]hept-2-yl, bicyclo[2.2.1]hept-7-yl, bicyclo[2.2.2]oct-1-yl, bicyclo[2.2.2]oct-2-yl, bicyclo[3.3.0]octyl, bicyclo[4.4.0]decyl.
- the expression "bicycloalkyl” comprises unsubstituted or else substituted bicycloalkyl groups.
- Substituted bicycloalkyl groups may have one or more (e.g. 1, 2, 3 or more than 3) substituents. These are preferably each independently selected from alkyl, alkoxy, alkylthio, and the substituents specified above for the alkyl groups.
- aryl comprises mono- or polycyclic aromatic hydrocarbon radicals which may be unsubstituted or substituted.
- Aryl is preferably unsubstituted or substituted phenyl, naphthyl, indenyl, fluorenyl, anthracenyl, phenanthrenyl, naphthacenyl, chrysenyl, pyrenyl, etc., and more preferably phenyl or naphthyl.
- Substituted aryls may, depending on the number and size of their ring systems, have one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents.
- E 5 and E 6 are each independently hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl.
- Halogen substituents are preferably fluorine, chlorine or bromine.
- Aryl is more preferably phenyl which, in the case of substitution, may bear generally 1, 2, 3, 4 or 5, preferably 1, 2 or 3 substituents.
- Aryl which bears one or more radicals is, for example, 2-, 3- and 4-methylphenyl, 2,4-, 2,5-, 3,5- and 2,6-dimethylphenyl, 2,4,6-trimethylphenyl, 2-, 3- and 4-ethylphenyl, 2,4-, 2,5-, 3,5- and 2,6-diethylphenyl, 2,4,6-triethylphenyl, 2-, 3- and 4-propylphenyl, 2,4-, 2,5-, 3,5- and 2,6-dipropylphenyl, 2,4,6-tripropylphenyl, 2-, 3- and 4-isopropylphenyl, 2,4-, 2,5-, 3,5- and 2,6-diisopropylphenyl, 2,4,6-triisopropylphenyl, 2-, 3- and 4-butylphenyl, 2,4-, 2,5-, 3,5- and 2,6-dibutylphenyl, 2,4,6-tributylphenyl, 2-, 3-
- heterocycloalkyl comprises nonaromatic, unsaturated or fully saturated, cycloaliphatic groups having generally from 5 to 8 ring atoms, preferably 5 or 6 ring atoms, in which 1, 2 or 3 of the ring carbon atoms are replaced by heteroatoms selected from oxygen, nitrogen, sulfur and an -NRe- group and which is unsubstituted or substituted by one or more, for example 1, 2, 3, 4, 5 or 6 C 1 -C 6 -alkyl groups.
- R e is as defined above.
- heterocycloaliphatic groups include pyrrolidinyl, piperidinyl, 2,2,6,6-tetramethylpiperidinyl, imidazolidinyl, pyrazolidinyl, oxazolidinyl, morpholidinyl, thiazolidinyl, isothiazolidinyl, isoxazolidinyl, piperazinyl, tetrahydrothiophenyl, dihydrothien-2-yl, tetrahydrofuranyl, dihydrofuran-2-yl, tetrahydropyranyl, 1,2-oxazolin-5-yl, 1,3-oxazolin-2-yl and dioxanyl.
- heteroaryl comprises unsubstituted or substituted, heteroaromatic, mono- or polycyclic groups, preferably the pyridyl, quinolinyl, acridinyl, pyridazinyl, pyrimidinyl, pyrazinyl, pyrrolyl, imidazolyl, pyrazolyl, indolyl, purinyl, indazolyl, benzotriazolyl, 1,2,3-triazolyl, 1,3,4-triazolyl and carbazolyl groups, where these heterocycloaromatic groups, in the case of substitution, may bear generally 1, 2 or 3 substituents.
- the substituents are preferably selected from C 1 -C 6 -alkyl, C 1 -C 6 -alkoxy, hydroxyl, carboxyl, halogen and cyano.
- Nitrogen-containing 5- to 7-membered heterocycloalkyl or heteroaryl radicals which optionally comprise further heteroatoms selected from oxygen and sulfur comprise, for example, pyrrolyl, pyrazolyl, imidazolyl, triazolyl, pyrrolidinyl, pyrazolinyl, pyrazolidinyl, imidazolinyl, imidazolidinyl, pyridinyl, pyridazinyl, pyrimidinyl, pyrazinyl, triazinyl, piperidinyl, piperazinyl, oxazolyl, isooxazolyl, thiazolyl, isothiazolyl, indolyl, quinolinyl, isoquinolinyl or quinaldinyl.
- Halogen is fluorine, chlorine, bromine or iodine.
- R a and R b radicals may be defined identically or differently.
- the R a und R b radicals have identical definitions.
- the R a und R b radicals are both hydrogen.
- R a und R b radicals other than hydrogen are:
- R a and R b radicals are as follows:
- the R a and R b radicals are each independently 1H,1H-perfluoro-C 2 -C 30 -alkyl or 1H,1H,2H,2H-perfluoro-C 3 -C 30 -alkyl, preferably 1H,1H-perfluoro-C 2 -C 20 -alkyl or 1H,1H,2H,2H-perfluoro-C 3 -C 20 -alkyl, in particular 1H,1H-perfluoro-C 2 -C 10 -alkyl or 1H,1H,2H,2H-perfluoro-C 3 -C 10 -alkyl such as 2,2,2-trifluoroethyl, 2,2,3,3,3-pentafluoropropyl, 2,2,3,3,4,4,4-heptafluorobutyl, 1 H, 1 H-perfluoropentyl, 1H,1H-perfluorohexyl
- R a and R b radicals are selected from groups of the general formula (II) #-(A) p -C(R f ) x (II) in which
- a preferred radical of the formula (II) is, for example, 2-ethylhex-1-yl.
- the R a and R b radicals are more preferably selected from groups of the formula (II.1) (so-called swallowtail radicals).
- the R f radicals are selected from C 1 -C 30 -alkyl, preferably C 1 -C 12 -alkyl, more preferably C 1 -C 8 -alkyl, e.g. C 4 -C 8 -alkyl, preferably C 5 -C 7 -alkyl.
- the R a and R b radicals are then preferably both a group of the formula in which
- Preferred radicals of the formula II.1 are for example:
- More preferred radicals are for example:
- Very preferred examples of a group of the formula II.1), wherein each R f has the same meaning are 1-butylpent-1-yl, 1-pentylhex-1-yl and 1-hexylhept-1-yl.
- Preferred examples of a group of the formula II.1), wherein each R f has a different meaning are 2-ethylhexyl, 1-methylbutyl, 1-methylpentyl or 1-methylhexyl.
- R a is selected from groups of the formula (III.A): -(C n H 2n )-R a1 and R b is selected from groups of the formula (III.B):
- R a is then preferably selected from -CH 2 -R a1 , -CH 2 CH 2 -R a1 , -CH 2 CH 2 CH 2 -R a1 and -CH 2 CH 2 CH 2 CH 2 -R a1 .
- R b is then preferably selected from -CH 2 -R b1 , -CH 2 CH 2 -R b1 , -CH 2 CH 2 CH 2 -R b1 and -CH 2 CH 2 CH 2 CH 2 -R b1 .
- R a1 and R b1 are then preferably selected from groups of the general formulae (1) to (16) in which
- n in the formulae (C n H 2n )-R a1 and (C n H 2n )-R b1 is 1 or 2.
- R a and R b are both in which # represents the bonding site to an imide nitrogen atom.
- R a and R b are selected from 1,1-dihydroperfluoro-C 2 -C 9 -alkyl groups, in particular 1,1-dihydroperfluoro-C 2 -C 6 -alkyl groups.
- R a and R b are then selected from groups of the general formula (IV) #-CH 2 -(perfluoro-C 1 -C 9 -alkyl) (IV) in which # represents the bonding site to an imide nitrogen atom, in particular from #-CH 2 -(perfluoro-C 1 -C 5 -alkyl).
- Preferred perfluoro-C 1 -C 5 -alkyl radicals in the formula (IV) are trifluoromethyl, pentafluoroethyl, n-heptafluoropropyl (n-C 3 F 7 ), heptafluoroisopropyl (CF(CF 3 ) 2 ), n-nonafluorobutyl (n-C 4 F 9 ), n-undecafluoropentyl (n-C 5 F 11 ), and also C(CF 3 ) 3 , CF 2 CF(CF 3 ) 2 , CF(CF 3 )(C 2 F 5 ).
- Preferred perfluoro-C 6 -C 9 -alkyl radicals in the formula (IV) include n-C 6 F 13 , n-C 7 F 15 , n-C 8 F 17 or n-C 9 F 19 .
- R a and R b are the same.
- R a and R b are both -CH 2 -(n-C 3 F 7 ) or CH 2 -(n-C 4 F 9 ).
- R a and R b are selected from 1,1, 2,2-tetrahydroperfluoro-C 3 -C 10 -alkyl groups.
- R a and R b are then selected from groups of the general formula (V) #-CH 2 -CH 2 -(perfluoro-C 1 -C 8 -alkyl) (V) in which # represents the bonding site to an imide nitrogen atom.
- Preferred perfluoro-C 1 -C 8 -alkyl radicals in the formula (V) are trifluoromethyl, pentafluoroethyl, n-heptafluoropropyl (n-C 3 F 7 ), heptafluoroisopropyl (CF(CF 3 ) 2 ), n-nonafluorobutyl (n-C 4 F 9 ), n-undecafluoropentyl (n-C 5 F 11 ), n-C 6 F 13 , n-C 7 F 15 , n-C 8 F 17 , C(CF 3 ) 3 , CF 2 CF(CF 3 ) 2 , or CF(CF 3 )(C 2 F 5 ).
- R a and R b are the same.
- R a and R b are each selected from fluorophenylalkyl groups of the general formula (VI)
- m is preferably 5.
- n is preferably 2.
- the fluorophenylalkyl groups of the general formula (VI) are preferably selected from
- the fluorophenylalkyl groups are more preferably selected from groups of the formulae in which # represents the bonding site to an imide nitrogen atom, and
- R a and R b are both in which # represents the bonding site to an imide nitrogen atom.
- R a and R b are selected from fluorophenyl groups of the general formula (VII)
- R a and R b are both in which # represents the bonding site to an imide nitrogen atom.
- a further object of the present invention are dichlorinated naphthalenetetracarboxylic diimide compounds of the formula (I.Ba) wherein
- the invention further provides a process for preparing compounds of the formulae (I.B) in which
- the naphthalene-1,8:4,5-tetracarboxylic dianhydride is converted in step a2) by using amines of the formula R a -NH 2 and if appropriate one of the formula R b -NH 2 , in which R a and R b are each groups which cannot be chlorinated by reaction with chlorine in the presence of iodine as a catalyst.
- the chlorination of the compound of the formula (D) in step b2) is brought about by reaction with chlorine in chlorosulfonic acid and in the presence of catalytic amounts of iodine.
- the amount of iodine is 1 to 10% by weight, preferably 2 to 5% by weight, based on the amount of chlorine.
- the reaction temperature for the reaction with chlorine is typically within a range from 40 to 150°C, preferably from 60 to 100°C.
- the reaction of the naphthalene-1,8:4,5-tetracarboxylic dianhydride with chlorine can be brought about under standard pressure or under elevated pressure, e. g. the chlorination pressure is in the range from 1 bar to 100 bar. Usually the chlorination pressure is in the range from 1 bar to 10 bar.
- the reaction times usually range from 2 to 48 hours, preferably 4 to 16 hours.
- the reaction temperature and the reaction time of the chlorination can be used to control the degree of chlorination.
- R a and R b are as defined above.
- the dichloronaphthalenetetracarboxylic bisanhydrides of formulae (IX) and (X), respectively, are treated with an amine of the formula R a -NH 2 and if appropriate one of the formula R b -NH 2 , in the case that R a is different from R b .
- the reaction is usually carried out in a solvent. Suitable solvents include C 1 -C 6 alkane carboxylic acids, e.g. acetic acid.
- 2,6-Dichloronaphthalene-1,4,5,8-tetracarboxylic acid dianhydride of the formula (IX) and 2,7-dichloronaphthalene-1,4,5,8-tetracarboxylic acid dianhydride of the formula (X) can be prepared according to the method described in J. Org. Chem. 2006, 71, 8098-8105 .
- the compounds of the formula (I.B) are particularly advantageously suitable as organic semiconductors. They generally function as n-type semiconductors. When the compounds of the formula (I.B) used in accordance with the invention are combined with other semiconductors and the position of the energy levels has the result that the other semiconductors function as n-type semiconductors, the compounds (I.B) can also function as p-semiconductors in exceptional cases.
- the compounds of the formula (I.B) are notable for their air stability.
- organic field-effect transistors comprising a compound of formula (I.B) are notable for their air stability and humidity stability.
- the compounds of the formula (I.B) possess a high charge transport mobility and/or have a high on/off ratio.
- the compounds of the formula (I.B) have charge mobilities of least 0.1 cm 2 V -1 s -1 when deposited by vacuum-deposition methods or of least 0.01 cm 2 V -1 s -1 when deposited in liquid form.
- the average on/off ratio is at least 10 4 , preferably at least 10 5 . They are suitable in a particularly advantageous manner for organic field-effect transistors (OFETs).
- inventive compounds are suitable particularly advantageously for the production of integrated circuits (ICs), for which the n-channel MOSFETs (metal oxide semiconductor field-effect transistors (MOSFETs)) customary to date are used.
- ICs integrated circuits
- MOSFETs metal oxide semiconductor field-effect transistors
- CMOS-like semiconductor units for example for microprocessors, microcontrollers, static RAM, and other digital logic units.
- inventive compounds of the formula (I.B) can be processed further by one of the following processes: printing (offset, flexographic, gravure, screen, inkjet, electrophotography), evaporation, laser transfer, spin-coating, photolithography, dropcasting. They are suitable especially for use in displays (especially large-area and/or flexible displays) and RFID tags.
- inventive compounds are also suitable particularly as fluorescence emitters in OLEDs, in which they are excited either by electroluminescence or by an appropriate phosphorescence emitter via Förster energy transfer (FRET).
- FRET Förster energy transfer
- inventive compounds of the formula (I.B) are also particularly suitable in displays which switch colors on and off based on an electrophoretic effect via charged pigment dyes.
- Such electrophoretic displays are described, for example, in US 2004/0130776 .
- the invention further provides organic field-effect transistors comprising a substrate having at least one gate structure, a source electrode and a drain electrode and at least one compound of the formula (I.B) as defined above as an n-type semiconductor.
- the invention further provides substrates comprising a multitude of organic field-effect transistors, wherein at least some of the field-effect transistors comprise at least one compound of the formula I as defined above as an n-type semiconductor.
- the invention also provides semiconductor units which comprise at least one such substrate.
- a specific embodiment is a substrate with a pattern (topography) of organic field-effect transistors, each transistor comprising
- a further specific embodiment is a substrate having a pattern of organic field-effect transistors, each transistor forming an integrated circuit or being part of an integrated circuit and at least some of the transistors comprising at least one compound of the formula (I.B).
- Suitable substrates are in principle the materials known for this purpose.
- Suitable substrates comprise, for example, metals (preferably metals of groups 8, 9, 10 or 11 of the Periodic Table, such as Au, Ag, Cu), oxidic materials (such as glass, quartz, ceramics, SiO 2 ), semiconductors (e.g. doped Si, doped Ge), metal alloys (for example based on Au, Ag, Cu, etc.), semiconductor alloys, polymers (e.g.
- the substrates may be flexible or inflexible, and have a curved or planar geometry, depending on the desired use.
- a typical substrate for semiconductor units comprises a matrix (for example a quartz or polymer matrix) and, optionally, a dielectric top layer.
- Suitable dielectrics are SiO 2 , polystyrene, poly- ⁇ -methylstyrene, polyolefins (such as polypropylene, polyethylene, polyisobutene), polyvinylcarbazole, fluorinated polymers (e.g. Cytop, CYMM), cyanopullulans, polyvinylphenol, poly-p-xylene, polyvinyl chloride, or polymers crosslinkable thermally or by atmospheric moisture.
- Specific dielectrics are "self-assembled nanodielectrics", i.e.
- polymers which are obtained from monomers comprising SiCl functionalities, for example Cl 3 SiOSiCl 3 , Cl 3 Si-(CH 2 ) 6 -SiCl 3 , Cl 3 Si-(CH 2 ) 12 -SiCl 3 , and/or which are crosslinked by atmospheric moisture or by addition of water diluted with solvents (see, for example, Faccietti Adv. Mat. 2005, 17, 1705-1725 ).
- hydroxyl-containing polymers such as polyvinylphenol or polyvinyl alcohol or copolymers of vinylphenol and styrene to serve as crosslinking components.
- at least one further polymer to be present during the crosslinking operation, for example polystyrene, which is then also crosslinked (see Facietti, US patent application 2006/0202195 ).
- the substrate may additionally have electrodes, such as gate, drain and source electrodes of OFETs, which are normally localized on the substrate (for example deposited onto or embedded into a nonconductive layer on the dielectric).
- the substrate may additionally comprise conductive gate electrodes of the OFETs, which are typically arranged below the dielectric top layer (i.e. the gate dielectric).
- an insulator layer (gate insulating layer) is present on at least part of the substrate surface.
- the insulator layer comprises at least one insulator which is preferably selected from inorganic insulators such as SiO 2 , SiN, etc., ferroelectric insulators such as Al 2 O 3 , Ta 2 O 5 La 2 O 5 , TiO 2 , Y 2 O 3 , etc., organic insulators such as polyimides, benzocyclobutene (BCB), polyvinyl alcohols, polyacrylates, etc., and combinations thereof.
- inorganic insulators such as SiO 2 , SiN, etc.
- ferroelectric insulators such as Al 2 O 3 , Ta 2 O 5 La 2 O 5 , TiO 2 , Y 2 O 3 , etc.
- organic insulators such as polyimides, benzocyclobutene (BCB), polyvinyl alcohols, polyacrylates, etc., and combinations thereof.
- Preferred electrically conductive materials have a specific resistance of less than 10 -3 ohm x meter, preferably less than 10 -4 ohm x meter, especially less than 10 -6 or 10 -7 ohm x meter.
- drain and source electrodes are present at least partly on the organic semiconductor material.
- the substrate may comprise further components as used customarily in semiconductor materials or ICs, such as insulators, resistors, capacitors, conductor tracks, etc.
- the electrodes may be applied by customary processes, such as evaporation, lithographic processes or another structuring process.
- the semiconductor materials may also be processed with suitable auxiliaries (polymers, surfactants) in disperse phase by printing.
- auxiliaries polymers, surfactants
- the deposition of at least one compound of the general formula (I.B) is carried out by a gas phase deposition process (physical vapor deposition, PVD).
- PVD processes are performed under high-vacuum conditions and comprise the following steps: evaporation, transport, deposition.
- the compounds of the general formula (I.B) are suitable particularly advantageously for use in a PVD process, since they essentially do not decompose and/or form undesired by-products.
- the material deposited is obtained in high purity. In a specific embodiment, the deposited material is obtained in the form of crystals or comprises a high crystalline content.
- At least one compound of the general formula (I.B) is heated to a temperature above its evaporation temperature and deposited on a substrate by cooling below the crystallization temperature.
- the temperature of the substrate in the deposition is preferably within a range from about 20 to 250°C, more preferably from 50 to 200°C.
- the resulting semiconductor layers generally have a thickness which is sufficient for ohmic contact between source and drain electrodes.
- the deposition can be effected under an inert atmosphere, for example under nitrogen, argon or helium.
- the deposition is effected typically at ambient pressure or under reduced pressure.
- a suitable pressure range is from about 10 -7 to 1.5 bar.
- the compound of the formula (I.B) is preferably deposited on the substrate in a thickness of from 10 to 1000 nm, more preferably from 15 to 250 nm.
- the compound of the formula (I.B) is deposited at least partly in crystalline form.
- the above-described PVD process is suitable.
- it is possible to use previously prepared organic semiconductor crystals. Suitable processes for obtaining such crystals are described by R.A. Laudise et al.
- the compounds of the general formula (I.B) can also advantageously be processed from solution.
- at least one compound of the general formula (I.B) is applied to a substrate (and if appropriate further semiconductor materials), for example, by spin-coating.
- at least one compound of the formula (I.B) is applied to a substrate by solution shearing.
- This type of deposition is described e.g. in Adv. Mater. 2008, 20, 2588-2594 .
- This includes the typical knife-coating methods such as airknife-coating, knife-coating, airblade-coating, squeeze-coating, roll-coating and kiss-coating.
- a solution of the compound of the formula (I.B) is applied to a first substrate and then a second substrate is brought into contact with the solution. Then shear energy is introduced.
- a small amount of a solution of at least one compound of the formula (I.B),e.g. a drop, is added on a substrate.
- the substrate temperatures range between room temperature and a temperature being 60 to 80% of the boiling point of the used solvent to control the solvent evaporation rate. Pulling the top wafer against the stationary wafer exerts a shearing force between wafers on the solution.
- the shearing speed is usually in the range from 0.01 to 0.5 mm/sec, preferably from 0.0866 to 0.1732 mm/sec.
- Suitable compounds for hydrophobizing substrate surfaces comprise alkyltrialkoxysilanes, such as n-octadecyltrimethoxysilane, n-octadecyltriethoxysilane, n-octadecyltri(n-propyl)-oxysilane or n-octadecyltri(isopropyl)oxysilane or phenyltrichlorosilane.
- alkyltrialkoxysilanes such as n-octadecyltrimethoxysilane, n-octadecyltriethoxysilane, n-octadecyltri(n-propyl)-oxysilane or n-octadecyltri(isopropyl)oxysilane or phenyltrichlorosilane.
- the used solvent may have a low boiling point or a high boiling point.
- Suitable solvents are aromatic solvents such as toluene, xylene, mesitylene, naphthalene, decahydronaphthalene, octahydronaphthalene, chlorobenzene or dichlorobenzene, especially ortho-dichlorobenzene, or linear or cyclic ethers, e.g.
- tetrahydrofuran diglycol methyl ether, or aromatic ethers such as diphenylether methoxybenzene, perfluoropolyethers such as HT-60 or HT 90 CT 135 (from Solvay, copolymers of perfluoroethyleneglycol, perfluoropropyleneglycol with CF 3 radicals at the beginning and the end of the chain), C 1 -C 6 -alkylesters of C 1 -C 6 -carboxylic acids such as methyl acetate, ethyl acetate, propyl acetate, butyl acetate, methyl propionate, ethyl propionate, propyl propionate, butyl propionate and mixtures thereof.
- a mixture of solvents is used, especially one, wherein the at least two solvents have different boiling points.
- the difference in the boiling points is greater than 30 °C.
- the compounds of the formula (I.B) are also suitable for producing semiconductor elements, especially OFETs, by a printing process. It is possible for this purpose to use customary printing processes (inkjet, flexographic, offset, gravure; intaglio printing, nanoprinting).
- Preferred solvents for the use of the compounds of the formula (I.B) in a printing process are aromatic solvents such as toluene, xylene, cyclic ethers such as dioxane, tetrahydrofuran, or linear ethers such as dimethoxyethane, ethylene glycol diethlyether, tert-butylmethylether etc. It is also possible to add thickening substances such as polymers, for example polystyrene, etc., to these "semiconductor inks". In this case, the dielectrics used are the aforementioned compounds.
- the inventive field-effect transistor is a thin-film transistor (TFT).
- TFT thin-film transistor
- a thin-film transistor has a gate electrode disposed on the substrate, a gate insulator layer disposed thereon and on the substrate, a semiconductor layer disposed on the gate insulator layer, an ohmic contact layer on the semiconductor layer, and a source electrode and a drain electrode on the ohmic contact layer.
- the surface of the substrate before the deposition of at least one compound of the general formula (I.B) (and if appropriate of at least one further semiconductor material), is subjected to a modification.
- This modification serves to form regions which bind the semiconductor materials and/or regions on which no semiconductor materials can be deposited.
- the surface of the substrate is preferably modified with at least one compound (C1) which is suitable for binding to the surface of the substrate and to the compounds of the formula (I.B).
- a portion of the surface or the complete surface of the substrate is coated with at least one compound (C1) in order to enable improved deposition of at least one compound of the general formula (I.B) (and if appropriate further semiconductive compounds).
- a further embodiment comprises the deposition of a pattern of compounds of the general formula (C1) on the substrate by a corresponding production process.
- These include the mask processes known for this purpose and so-called “patterning” processes, as described, for example, in US-2007-0190783-A1 .
- Suitable compounds of the formula (C1) are capable of a binding interaction both with the substrate and with at least one semiconductor compound of the general formula (I.B).
- binding interaction comprises the formation of a chemical bond (covalent bond), ionic bond, coordinative interaction, van der Waals interactions, e.g. dipole-dipole interactions etc., and combinations thereof.
- Suitable compounds of the general formula (C1) are:
- the compound (C1) is preferably selected from alkyltrialkoxysilanes, especially n-octadecyltrimethoxysilane, n-octadecyltriethoxysilane; phenyltrichlorosiliane; hexaalkyldisilazanes, and especially hexamethyldisilazane (HMDS); C 8 -C 30 -alkylthiols, especially hexadecanethiol; mercaptocarboxylic acids and mercaptosulfonic acids, especially mercaptoacetic acid, 3-mercaptopropionic acid, mercaptosuccinic acid, 3-mercapto-1-propanesulfonic acid and the alkali metal and ammonium salts thereof.
- top contact for example top contact, top gate, bottom contact, bottom gate, or else a vertical construction, for example a VOFET (vertical organic field-effect transistor), as described, for example, in US 2004/0046182 .
- VOFET vertical organic field-effect transistor
- the layer thicknesses are, for example, from 10 nm to 5 ⁇ m in semiconductors, from 50 nm to 10 ⁇ m in the dielectric; the electrodes may, for example, be from 20 nm to 1 ⁇ m thick.
- the OFETs may also be combined to form other components such as ring oscillators or inverters.
- a further aspect of the invention is the provision of electronic components which comprise a plurality of semiconductor components, which may be n- and/or p-semiconductors.
- semiconductor components which may be n- and/or p-semiconductors.
- FETs field-effect transistors
- BJTs bipolar junction transistors
- tunnel diodes converters
- light-emitting components biological and chemical detectors or sensors
- temperature-dependent detectors temperature-dependent detectors
- photodetectors such as polarization-sensitive photodetectors, gates, AND, NAND, NOT, OR, TOR and NOR gates, registers, switches, timer units, static or dynamic stores and other dynamic or sequential, logical or other digital components including programmable circuits.
- a specific semiconductor element is an inverter.
- the inverter is a gate which inverts an input signal.
- the inverter is also referred to as a NOT gate.
- Real inverter circuits have an output current which constitutes the opposite of the input current. Typical values are, for example, (0, +5V) for TTL circuits.
- the performance of a digital inverter reproduces the voltage transfer curve (VTC), i.e. the plot of input current against output current. Ideally, it is a staged function, and the closer the real measured curve approximates to such a stage, the better the inverter is.
- VTC voltage transfer curve
- the compounds of the formula (I.B) are used as organic n-type semiconductors in an inverter.
- inventive compounds of the formula (I.B), are also suitable particularly advantageously for use in organic photovoltaics (OPV).
- Organic solar cells generally have a layer structure and generally comprise at least the following layers: anode, photoactive layer and cathode. These layers are generally situated on a substrate customary therefore.
- the structure of organic solar cells is described, for example, in US 2005/0098726 and US 2005/0224905 .
- the invention further provides an organic solar cell comprising at least one compound of the formula I as defined above as a photoactive material.
- Suitable substrates for organic solar cells are, for example, oxidic materials (such as glass, ceramic, SiO 2 , in particular quartz, etc.), polymers (e.g. polyvinyl chloride, polyolefins such as polyethylene and polypropylene, polyesters, fluoropolymers, polyamides, polyurethanes, polyalkyl (meth)acrylates, polystyrene and mixtures and composites thereof) and combinations thereof.
- oxidic materials such as glass, ceramic, SiO 2 , in particular quartz, etc.
- polymers e.g. polyvinyl chloride, polyolefins such as polyethylene and polypropylene, polyesters, fluoropolymers, polyamides, polyurethanes, polyalkyl (meth)acrylates, polystyrene and mixtures and composites thereof.
- Suitable electrodes are in principle metals (preferably of groups 8, 9, 10 or 11 of the Periodic Table, e.g. Pt, Au, Ag, Cu, Al, In, Mg, Ca), semiconductors (e.g. doped Si, doped Ge, indium tin oxide (ITO), gallium indium tin oxide (GITO), zinc indium tin oxide (ZITO), etc.), metal alloys (e.g. based on Pt, Au, Ag, Cu, etc., especially Mg/Ag alloys), semiconductor alloys, etc.
- One of the electrodes, e.g. theanode used is preferably a material essentially transparent to incident light.
- the other electrode e.g. the cathode used is preferably a material which essentially reflects the incident light.
- the photoactive layer itself comprises at least one, or consists of at least one, layer which has been provided by a process according to the invention and comprises, as an organic semiconductor material, at least one compound of the formula la and/or Ib as defined above.
- further layers include, for example,
- Suitable exciton- and hole-blocking layers are described, for example, in US 6,451,415 .
- Suitable materials for exciton blocker layers are, for example, bathocuproin (BCP), 4,4',4"-tris[3-methyfphenyl-N-phenylamino]triphenylamine (m-MTDATA) or poly-ethylenedioxythiophene (PEDOT).
- BCP bathocuproin
- m-MTDATA 4,4',4"-tris[3-methyfphenyl-N-phenylamino]triphenylamine
- PEDOT poly-ethylenedioxythiophene
- the inventive solar cells may be based on photoactive donor-acceptor heterojunctions.
- HTM hole transport material
- ETM electron transport material
- Suitable ETMs are, for example, C60 and other fullerenes, perylene-3,4:9,10-bis(dicarboximides) (PTCDI), etc.
- PTCDI perylene-3,4:9,10-bis(dicarboximides)
- the heterojunction may have a flat (smooth) design (cf. Two layer organic photovoltaic cell, C. W. Tang, Appl. Phys. Lett., 48 (2), 183-185 (1986 ) or N. Karl, A. Bauer, J. Holzäpfel, J. Tanner, M. Möbus, F. Stölzle, Mol. Cryst. Liq. Cryst., 252, 243-258 (1994 )).
- the heterojunction may also be designed as a bulk heterojunction or interpenetrating donor-acceptor network (cf., for example, C. J. Brabec, N. S. Sariciftci, J. C. Hummelen, Adv. Funct. Mater., 11 (1), 15 (2001 )).
- the compounds of the formula (I.B) may be used as a photoactive material in solar cells with MiM, pin, pn, Mip or Min structure
- M metal
- p p-doped organic or inorganic semiconductor
- n n-doped organic or inorganic semiconductor
- i intrinsically conductive system composed of organic layers; cf., for example, B. J. Drechsel et al., Org. Eletron., 5 (4), 175 (2004 ) or Maennig et al., Appl. Phys. A 79, 1-14 (2004 )).
- the compounds of the formula (I.B) can also be used as photoactive material in tandem cells, as described by P. Peumans, A. Yakimov, S. R. Forrest in J. Appl. Phys, 93 (7), 3693-3723 (2003 ) (cf. patents US 4,461,922 , US 6,198,091 and US 6,198,092 ).
- the compounds of the formula (I.B) may also be used as photoactive material in tandem cells composed of two or more stacked MiM, pin, Mip or Min diodes (cf. patent application DE 103 13 232.5 ) ( J. Drechsel et al., Thin Solid Films, 451452, 515-517 (2004 )).
- the layer thicknesses of the M, n, i and p layers are typically from 10 to 1000 nm, preferably from 10 to 400 nm, more preferably from 10 to 100 nm.
- Thin layers can be produced by vapor deposition under reduced pressure or in inert gas atmosphere, by laser ablation or by solution- or dispersion-processible processes such as spin-coating, knife-coating, casting processes, spraying, dip-coating or printing (e.g. inkjet, flexographic, offset, gravure; intaglio printing, nanoimprinting).
- Suitable organic solar cells may, as mentioned above, comprise at least one inventive compound of the formula (I.B) as an electron donor (n-type semiconductor) or electron acceptor (p-semiconductor).
- inventive compound of the formula (I.B) as an electron donor (n-type semiconductor) or electron acceptor (p-semiconductor).
- the following semiconductor materials are suitable for use in organic photovoltaics:
- Phthalocyanines which are unhalogenated or halogenated. These include metal-free phthalocyanines or phthalocyanines comprising divalent metals or groups containing metal atoms, especially those of titanyloxy, vanadyloxy, iron, copper, zinc, etc. Suitable phthalocyanines are especially copper phthalocyanine, zinc phthalocyanine and metal-free phthalocyanine. In a specific embodiment, a halogenated phthalocyanine is used. These include:
- Porphyrins for example 5,10,15,20-tetra(3-pyridyl)porphyrin (TpyP), or else tetrabenzoporphyrins, for example metal-free tetrabenzoporphyrin, copper tetrabenzoporphyrin or zinc tetrabenzoporphyrin.
- tetrabenzoporphyrins which, like the compounds of the formula (I) used in accordance with the invention, are processed from solution as soluble precursors and are converted to the pigmentary photoactive component by thermolysis on the substrate.
- Acenes such as anthracene, tetracene, pentacene, each of which may be unsubstituted or substituted.
- Substituted acenes preferably comprise at least one substituent which is selected from electron-donating substituents (e.g. alkyl, alkoxy, ester, carboxylate or thioalkoxy), electron-withdrawing substituents (e.g. halogen, nitro or cyano) and combinations thereof.
- LC materials for example coronenes, such as hexabenzocoronene (HBC-PhC 12 ), coronenediimides, or triphenylenes such as
- oligothiophenes are quaterthiophenes, quinquethiophenes, sexithiophenes, ⁇ , ⁇ -di(C 1 -C 8 )-alkyloligothiophenes, such as ⁇ , ⁇ -dihexylquaterthiophene, ⁇ , ⁇ -dihexylquinquethiophene and ⁇ , ⁇ -dihexylsexithiophene, poly(alkylthiophenes), such as poly(3-hexylthiophene), bis(dithienothiophenes), anthradithiophenes and dialkylanthradithiophenes such as dihexylanthradithiophene, phenylene-thiophene (P-T) oligomers and derivatives thereof, especially ⁇ , ⁇ -alkyl-substituted
- DCV5T 3-(4-octylphenyl)-2,2'-bithiophene
- POPT poly(3-(4'-(1,4,7-trioxaoctyl)phenyl)thiophene)
- POMeOPT poly(3-(2'-methoxy-5'-octylphenyl)thiophene)
- P 3 OT poly(pyridopyrazine-vinylene)-polythiophene blends, such as EHH-PpyPz, PTPTB copolymers, BBL copolymers, F 8 BT copolymers, PFMO copolymers; see Brabec C., Adv.
- PCPDTBT poly[2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta[2,1 b;3,4 b']dithiophene)-4,7-(2,1,3-benzothiadiazole).
- Paraphenylenevinylene and oligomers or polymers comprising paraphenylenevinylene for example polyparaphenylenevinylene, MEH-PPV (poly(2-methoxy-5-(2'-ethylhexyl-oxy)-1,4-phenylenevinylene), MDMO-PPV (poly(2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene)), PPV, CN-PPV (with various alkoxy derivatives).
- MEH-PPV poly(2-methoxy-5-(2'-ethylhexyl-oxy)-1,4-phenylenevinylene
- MDMO-PPV poly(2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene)
- PPV CN-PPV (with various alkoxy derivatives).
- Phenyleneethynylene/phenylenevinylene hybrid polymers (PPE-PPV).
- Polyfluorenes and alternating polyfluorene copolymers for example with 4,7-dithien-2'-yl-2,1,3-benzothiadiazole; also suitable are poly(9,9'-dioctylfluorene-co-benzothiadiazole) (F 8 BT), poly(9,9'-dioctylfluorene-co-bis-N,N'-(4-butylphenyl)bis-N,N'-phenyl-1,4-phenylenediamine (PFB).
- F 8 BT poly(9,9'-dioctylfluorene-co-bis-N,N'-(4-butylphenyl)bis-N,N'-phenyl-1,4-phenylenediamine
- Polycarbazoles i.e. oligomers and polymers comprising carbazole.
- Polyanilines i.e. oligomers and polymers comprising aniline.
- Triarylamines polytriarylamines, polycyclopentadienes, polypyrroles, polyfurans, polysiloles, polyphospholes, TPD, CBP, Spiro-MeOTAD.
- fullerenes in such cells, the fullerene derivative is a hole conductor.
- fullerene refers to a material which is composed of carbon and has a regular, three-dimensional network of fused carbon rings. These may have spherical, cylindrical, ovoid, flattened or angular structures. Suitable fullerenes are, for example, C60, C70, C76, C80, C82, C84, C86, C90, C96, C120, single-walled carbon nanotubes (SWNT) and multi-walled carbon nanotubes (MWNT).
- SWNT single-walled carbon nanotubes
- MWNT multi-walled carbon nanotubes
- fullerene derivatives are phenyl-C 61 -butyric acid methyl ester (PCBM), phenyl-C 71 -butyric acid methyl ester ([71]PCBM), phenyl-C 84 -butyric acid methyl ester ([84]PCBM), phenyl-C 61 -butyric acid butyl ester ([60]PCBB), phenyl-C 61 -butyric acid octyl ester ([60]PCBO) and thienyl-C 61 -butyric acid methyl ester([60]ThCBM).
- PCBM phenyl-C 61 -butyric acid methyl ester
- PCBM phenyl-C 71 -butyric acid methyl ester
- 84]PCBM phenyl-C 61 -butyric acid butyl ester
- All aforementioned semiconductor materials may also be doped.
- the compound of the formula (I.B) and/or (if present) a further semiconductor material different therefrom is thus used in combination with at least one dopant.
- Suitable dopants for use of the compounds (I.B) as n-type semiconductors are, for example, pyronin B and rhodamine derivatives.
- the invention further relates to an organic light-emitting diode (OLED) which comprises at least one compound of the formula (I.B).
- OLED organic light-emitting diode
- Organic light-emitting diodes are in principle formed from a plurality of layers. These include: 1. anode, 2. hole-transporting layer, 3. light-emitting layer, 4. electron-transporting layer and 5. cathode. It is also possible that the organic light-emitting diode does not have all of the layers mentioned; for example, an organic light-emitting diode comprising layers (1) (anode), (3) (light-emitting layer) and (5) (cathode) is likewise suitable, in which case the functions of layers (2) (hole-transporting layer) and (4) (electron-transporting layer) are assumed by the adjacent layers. OLEDs which have layers (1), (2), (3) and (5) or layers (1), (3), (4) and (5) are likewise suitable.
- the purification is effected by three-zone gradient sublimation, the zones being at 200°C, 150°C and 116°C. From a loading of 300 mg, 157 mg of sublimed product are obtained.
- the title compound showed a toluene solubility of 1 % by weight at room temperature and a tetrahydrofuran solubility of 3% by weight at room temperature.
- the synthesis was effected as described in example 1, except that 1H,1H-perfluorobutylamine was used.
- the compound was purified by sublimation using a three zone furnace at 180, 130 and 100°C. Starting from 302 mg of the title compound, 177 mg of purified product were obtained.
- the title compound showed a toluene solubility of 0.8% by weight at room temperature and a tetrahydrofuran solubility of 1.5% by weight at room temperature.
- the compounds can be further purified by sublimation using a three zone furnace.
- a three zone furnace For example:
- n toluene solubility in % by weight THF solubility in % by weight 4.1 1 1 4 4.2 2 2 4 4.3 3 2 4 4.4 4 1.5 4
- the SiO 2 /Si substrates were then cleaned with a piranha solution (a 7:3 mixture of H 2 SO 4 and H 2 O 2 by vol%) for 30 min, rinsed with deionized water and dried using a nitrogen gun, the SiO 2 /Si water were subsequently treated with UV-ozone plasma (Jetlight UVO-cleaner Model 42 - 100V) for 20 min.
- Organic semiconductor thin films (45 nm) were vapor-deposited onto the Si/SiO 2 substrates held at well-defined temperatures (see table 1) with a deposition rate in the range from 0.2 to 0.3 ⁇ /s and a pressure of 10 -6 torr employing a vacuum deposition chamber (Angstrom Engineering Inc., Canada). Thin film transistors in top-contact configuration were used to measure the charge mobility of the materials. Gold source and drain electrodes (typical channel length were 100 ⁇ m with width/length ratios about 20) were vapor-deposited through a shadow mask. The current-voltage (I-V) characteristics of the devices were measured using Keithley 4200-SCS semiconductor parameter analyzer.
- the SiO 2 /Si substrates were spin-coated with a 3 mM solution of octadecyltrimethoxysilane (OTS) in trichloroethylene, then placed in an environment saturated with ammonia vapor for 12 h, followed by sonication cleaning, sequential washing and drying. Finally, the organic semiconductor was vacuum-deposited as described above.
- OTS octadecyltrimethoxysilane
- Table 1 Field field-effect mobilities ( ⁇ ), on/off ratios (Ion/Ioft), and threshold voltages (Vt) for compounds of formula (I.B) at various substrate temperatures (T sub ) measured in nitrogen atmosphere
- T sub substrate temperatures
- T sub substrate temperatures
- Table 2 Field field-effect mobilities ( ⁇ ), on/off ratios (Ion/Ioff), and threshold voltages (Vt) for compounds of formula (I.B) at various substrate temperatures (T sub ) measured in ambient air Compound from example T sub [°C] Substrate In ambient air ⁇ (cm 2 V -1 s -1 ) a I on / I off V t (V) 1 70 OTS 1.32 ⁇ 0.10 (1.43) b (5.3 ⁇ 0.6) ⁇ 10 7 23 ⁇ 2 2 50 OTS 0.61 ⁇ 0.15 (0.80) (1.9 ⁇ 0.9) ⁇ 10 6 39 ⁇ 4 50 Bare 0.75 ⁇ 0.13 (0.91) (3.8 ⁇ 1.7) ⁇ 10 6 25 ⁇ 2 a The average values obtained for at least 3 devices. b the maximum mobility recorded.
- n-type Si (100) wafers ( ⁇ 0.004 ⁇ cm) were used as substrates.
- a 300 nm SiO 2 layer (capacitance per unit area Ci 10 nF/cm 2 ) as a gate dielectric was thermally grown onto the Si substrates.
- These wafers were cleaned in piranha solution, a 7:3 mixture of H 2 SO 4 and H 2 O 2 by volume, rinsed with deionized water, and then dried by N 2 .
- the phenyltrichlorosilane (PTS)-treated surface on SiO 2 /Si substrates were obtained by the following procedures: a cleaning SiO 2 /Si substrate was immersed into a 3 wt% solution of PTS in toluene at 80°C for overnight. Then, the substrates were rinsed with toluene, acetone, isopropanol, and dried with a steam of nitrogen. The contact angle of the PTS-treated SiO 2 /Si substrates was approximately 70°C.
- the organic semiconductor thin films were deposited on SiO 2 /Si substrates through solution-sheared methods.
- Solution-sheared thin films were prepared as described below: After drying these samples overnight at 70°C, 40 nm gold contacts were evaporated onto the films to fabricate devices with a 50 ⁇ m channel length (L), and a W/L ratio of approximately 20.
- the OTFT transfer and output characteristics were recorded in a N 2 -filled glove box by using a Keithley 4200 semiconductor parametric analyzer (Keithley Instruments, Cleveland OH). For air-stability, the samples were also monitored as functions of time after exposing in air. If not stated to contrary, the devices have channel length parallel to the shearing direction.
- the compounds were dissolved in ortho-dichlorobenzene (5 or 10 mg ml -1 ) and the solution was dropped on the wafer substrate placed on a hot spot. A hydrophobic SiO 2 /Si wafer treated with PTS was placed on top of the solution drop. The top wafer was pulled over at a constant rate to apply shear on the solution. Shearing rate: 0.0086 mm/s; temperature: 126°C.
- the average values were obtained from at least 4 devices.
- the air-stability testing of the studied molecules was monitored by measuring mobility, on/off ratios, and threshold voltages (Vt) as a function of time.
- the fluctuations of the electric properties of the OTFTs in air are often attributed to the influences of the relative humidity.
- the average mobility of 1, 2 and 4.3 decreased slightly from 4.50 ⁇ 10 -2 , 1.73 ⁇ 10 -1 , 2.20 ⁇ 10 -2 to 1.88 ⁇ 10 -2 , 1.09 ⁇ 10 -1 , 8.63 ⁇ 10 -3 cm -2 V -1 s -1 respectively, after exposure to air for one and a half months.
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Description
- The present invention relates to chlorinated naphthalenetetracarboxylic acid derivatives, preparation thereof and use thereof as charge transport materials, exciton transport materials or emitter materials.
- It is expected that, in the future, not only the classical inorganic semiconductors but increasingly also organic semiconductors based on low molecular weight or polymeric materials will be used in many sectors of the electronics industry. In many cases, these organic semiconductors have advantages over the classical inorganic semiconductors, for example better substrate compatibility and better processibility of the semiconductor components based on them. They allow processing on flexible substrates and enable their interface orbital energies to be adjusted precisely to the particular application sector by the methods of molecular modeling. The significantly reduced costs of such components have brought a renaissance to the field of research of organic electronics. "Organic electronics" is concerned principally with the development of new materials and manufacturing processes for the production of electronic components based on organic semiconductor layers. These include in particular organic field-effect transistors (OFETs) and organic light-emitting diodes (OLEDs), and photovoltaics. Great potential for development is ascribed to organic field-effect transistors, for example in memory elements and integrated optoelectronic devices. Organic light-emitting diodes (OLEDs) exploit the property of materials of emitting light when they are excited by electrical current. OLEDs are particularly of interest as alternatives to cathode ray tubes and liquid-crystal displays for producing flat visual display units. Owing to the very compact design and the intrinsically lower power consumption, devices which comprise OLEDs are suitable especially for mobile applications, for example for applications in cellphones, laptops, etc. Great potential for development is also ascribed to materials which have maximum transport widths and high mobilities for light-induced excited states (high exciton diffusion lengths) and which are thus advantageously suitable for use as an active material in so-called excitonic solar cells. It is generally possible with solar cells based on such materials to achieve very good quantum yields.
- H. Tachikawa and H. Kawabata describe, in Jpn. J. Appl. Phys., volume 44, No. 6A (2005), p. 3769 - 3773, hybrid density functional theory studies on complexes of halogenated naphthalene-1,8:4,5-tetracarboxylic bisanhydrides. In these studies, the effects of the halogen substitution on the electronic states were exclusively computer-modeled. A performable synthesis of halogenated naphthalene-1,8:4,5-tetracarboxylic bisanhydrides and measurements on real existing compounds are not described.
-
DE 36 20 332 describes 2,3,6,7-tetrachloronaphthalene-1,4,5,8-tetracarboxylic dianhydride and 2,3,6,7-tetrachloronaphthalene-1,4,5,8-tetracarboxylic dimide and a process for preparing these compounds. -
DE 37 03 131 A1 describes 2,3,6,7-tetrafluoronaphthalene-1,8:4,5-tetracarboxylic bisimides, processes for preparation thereof and use thereof for preparing radical anion salts with electrical conductivity. -
DE 101 48 172 A1 describes fluorescent naphthalene-1,8:4,5-tetracarboximides with electron-donating substituents in the 2 and 6 position on the ring and the use thereof as fluorescent dyes, for coloring high molecular weight organic and inorganic materials, as laser dyes, for fluorescent marking and as a fluorescent label for biomolecules. -
JP 11149984 - B. A. Jones, A. Facchetti, M. R. Wasiliewski and T. J. Marks describe, in JACS ARTICLES, published on Web 11/14/2007, structural and electronic criteria for the stability of n-semiconductors under ambient conditions. Also mentioned are cyanated naphthalenetetracarboxylic acid derivatives, though the mobilities achieved are still in need of improvement.
-
US 2005/0176970 A1 describes n-semiconductors based on substituted perylene-3,4-dicarboximides and perylene-3,4:9,10-bis(dicarboximides). This document also describes, in quite general terms and without any proof by a preparation example, substituted naphthalene-1,8-dicarboximides and naphthalene-1,4,5,8-bis(dicarboximides) and use thereof as n-semiconductors. -
-
WO 2007/074137 describes compounds of the general formula (A) - at least one of the R1, R2, R3 and R4 radicals is a substituent which is selected from Br, F and CN,
- Y1 is O or NRa where Ra is hydrogen or an organyl radical,
- Y2 is O or NRb where Rb is hydrogen or an organyl radical,
- Z1 and Z2 are each independently O or NRc where Rc is an organyl radical,
- Z3 and Z4 are each independently O or NRd where Rd is an organyl radical,
-
WO 2007/093643 describes the use of compounds of the general formula (B) - n is 2, 3 or 4,
- at least one of the Rn1, Rn2, Rn3 and Rn4 radicals is fluorine,
- if appropriate at least one further Rn1, Rn2, Rn3 or Rn4 radical is a substituent which is independently selected from Cl and Br, and the remaining radicals are each hydrogen,
- Y1 is O or NRa where Ra is hydrogen or an organyl radical,
- Y2 is O or NRb where Rb is hydrogen or an organyl radical,
- Z1, Z2, Z3 and Z4 are each O,
- where, in the case that Y1 is NRa, one of the Z1 and Z2 radicals may also be NRc, where the Ra and Rc radicals together are a bridging group,
- where, in the case that Y2 is NRb, one of the Z3 and Z4 radicals may also be NRd, where the Rb and Rd radicals together are a bridging group,
- as semiconductors, especially n-semiconductors, in organic electronics, especially for organic field-effect transistors, solar cells and organic light-emitting diodes.
-
- Y1 is O or NRa where Ra is hydrogen or an organyl radical,
- Y2 is O or NRb where Rb is hydrogen or an organyl radical,
- Z1, Z2, Z3 and Z4 are each O,
- the R11, R12, R13, R14, R21, R22, R23 and R24 radicals are each chlorine and/or fluorine,
- where 1 or 2 of the R11, R12, R13, R14, R21, R22, R23 and R24 radicals may also be CN and/or 1 R11, R12, R13, R14, R21, R22, R23 and R24 radical may also be hydrogen, and
- where, in the case that Y1 is NRa, one of the Z1 and Z2 radicals may also be NRc, where the Ra and Rc radicals together are a bridging X group,
- where, in the case that Y2 is NRb, one of the Z3 and Z4 radicals may also be NRd, where the Rb and Rd radicals together are a bridging X group,
- as emitter materials, charge transport materials or exciton transport materials. Likewise described is the preparation of the chlorinated compounds, wherein the chlorination is brought about by reaction with chlorine in chlorosulfonic acid and in the presence of catalytic amounts of iodine.
-
JP 02255789 -
JP 05027469 -
EP 0033015 describes the use of electrically conductive cyclic polyimides of the following formula: - There is still a need for semiconductor materials which are advantageously suitable for use in organic electronics, specifically for field-effect transistors and organic solar cells. What are being sought are especially semiconductor materials which are virtually transparent in the visible wavelength range, especially in the wavelength range above 450 nm. Preferably, the semiconductor materials have absorption of less than 10%, in particular no absorption, in the wavelength range above 450 nm, which are air-stable and have high charge mobilities. Likewise, what are being sought are especially semiconductor materials which are processible in liquid form; i.e. the semiconductor materials should be sufficiently soluble, which permits wet processing directly and allows the fabrication of low-cost organic electronics. Preferably, e.g. the semiconductor materials should have charge mobilities of least 0.1 cm2V-1s-1 when deposited by vacuum-deposition methods or e.g. of least 0.01 cm2V-1s-1 when deposited in liquid form.
- It has now been found that, surprisingly, chlorinated naphthalenetetracarboxylic acid derivatives are particularly advantageously suitable as charge transport materials, exciton transport materials or emitter materials. They are notable especially as n-type semiconductors with high charge mobilities preferably e.g. of at least 0.01 cm2V-1s-1. In addition, the components resulting therefrom are air-stable.
-
- at least two of the R1, R2, R3 and R4 radicals are Cl and the remaining radicals are hydrogen,
- Ra and Rb are each independently 1H,1H-perfluoro-C2-C30-alkyl. 1H,1H,2H,2H-perfluoro-C3-C30-alkyl, or straight-chain -alkyl or branched C3-C30-alkyl
-
- R1 and R4 are each Cl and R2 and R3 are each hydrogen, or
- R1 and R3 are each Cl and R2 and R4 are each hydrogen, and
- Ra and Rb are each independently 1H,1H-perfluoro-C2-C30-alkyl or 1H,1H,2H,2H-perfluoro-C2-C30-alkyl.
-
- R1 and R4 are each Cl and R2 and R3 are each hydrogen or
R1 and R3 are each Cl and R2 and R4 are each hydrogen, or
R1, R2 and R3 are each Cl and R4 is hydrogen, or
R1, R2, R3 and R4 are each Cl, - Ra and Rb are each independently hydrogen or unsubstituted or substituted alkyl, cycloalkyl, bicycloalkyl, heterocycloalkyl, chlorinated aryl or chlorinated hetaryl,
- in which
- a2) naphthalene-1,8:4,5-tetracarboxylic dianhydride is subjected to a reaction with an amine of the formula Ra-NH2 and if appropriate an amine of the formula Rb-NH2 to obtain a compound of the formula (D)
- b2) the compound obtained in step a2) is subjected to a chlorination by reaction with chlorine in the presence of iodine as a catalyst.
- a2) naphthalene-1,8:4,5-tetracarboxylic dianhydride is subjected to a reaction with an amine of the formula Ra-NH2 and if appropriate an amine of the formula Rb-NH2 to obtain a compound of the formula (D)
- The invention further relates to the use of compounds of the formula (I.B) as emitter materials, charge transport materials or exciton transport materials.
- The invention also provides organic field-effect transistors (OFETs), substrates comprising a multitude of organic field-effect transistors, semiconductor units, organic light-emitting diodes (OLEDs) and organic solar cells, which comprise at least one compound of the formula (I.B).
- Preferably, in the compounds of the formula (I.B), Ra and Rb are each independently 1H,1H-perfluoro-C2-C30-alkyl, 1H,1H,2H,2H-perfluoro-C3-C30-alkyl or branched C3-C30-alkyl.
- Preferably, in the compounds of the formula (I.B), the R1 and R3 radicals are each chlorine and the R2 and R4 radicals are each hydrogen.
- Additionally preferably, in the compounds of the formula (I.B), the R1 and R4 radicals are each chlorine and the R2 and R3 radicals are each hydrogen.
- Additionally preferably, in the compounds of the formula (I.B), the R1, R2 and R3 radicals are each chlorine and the R4 radicals are each hydrogen.
- Additionally preferably, in the compounds of the formula (I.B), the R1, R2, R3 and R4 radicals are each chlorine.
- As used herein, the expression "unsubstituted or substituted alkyl, alkenyl, alkadienyl, alkynyl, cycloalkyl, bicycloalkyl, cycloalkenyl, heterocycloalkyl, aryl or heteroaryl" refers to unsubstituted or substituted alkyl, unsubstituted or substituted alkenyl, unsubstituted or substituted alkadienyl, unsubstituted or substituted alkynyl, unsubstituted or substituted cycloalkyl, unsubstituted or substituted bicycloalkyl, unsubstituted or substituted cycloalkenyl, unsubstituted or substituted heterocycloalkyl, unsubstituted or substituted aryl or unsubstituted or substituted heteroaryl.
- In the context of the present invention, the expression "alkyl" comprises straight-chain or branched alkyl. It is preferably straight-chain or branched C1-C70-alkyl, especially C1-C30-alkyl, more especially C1-C20-alkyl, e.g. C1-C12-alkyl. Examples of alkyl groups are especially methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, sec-butyl, tert-butyl, n-pentyl, n-hexyl, n-heptyl, n-octyl, n-nonyl, n-decyl, n-undecyl, n-dodecyl, n-tridecyl, n-tetradecyl, n-hexadecyl, n-octadecyl and n-eicosyl. Preferred branched alkyl groups are swallowtail alkyl groups (see below).
- The expression "alkyl" also comprises alkyl radicals whose carbon chains may be interrupted by one or more nonadjacent groups which are selected from -O-, -S-, -NRe-, -C(=O)-, -S(=O)- and/or -S(=O)2-. Re is preferably hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl. The expression alkyl also comprises substituted alkyl radicals. Substituted alkyl groups may, depending on the length of the alkyl chain, have one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents. These are preferably each independently selected from cycloalkyl, heterocycloalkyl, aryl, hetaryl, halogen, hydroxyl, mercapto, COOH, carboxylate, SO3H, sulfonate, NE1E2, nitro and cyano, where E1 and E2 are each independently hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl. Halogen substituents are preferably fluorine, chlorine or bromine.
- Carboxylate and sulfonate are, respectively, a derivative of a carboxylic acid function or a sulfonic acid function, especially a metal carboxylate or sulfonate, a carboxylic ester or sulfonic ester function or a carboxamide or sulfonamide function. Cycloalkyl, heterocycloalkyl, aryl and hetaryl substituents of the alkyl groups may in turn be unsubstituted or substituted; suitable substituents are those specified below for these groups.
- The above remarks regarding alkyl also apply to the alkyl moieties in alkoxy, alkylamino, alkylthio, alkylsulfinyl, alkylsulfonyl, etc.
- Aryl-substituted alkyl radicals ("arylalkyl") have at least one unsubstituted or substituted aryl group as defined below. The alkyl group in "arylalkyl" may bear at least one further substituent and/or be interrupted by one or more nonadjacent groups which are selected from -O-, -S-, -NRe-, -CO- and/or -SO2-. Re has one of the meanings given above. Arylalkyl is preferably phenyl-C1-C10-alkyl, more preferably phenyl-C1-C4-alkyl, for example benzyl, 1-phenethyl, 2-phenethyl, 1-phenprop-1-yl, 2-phenprop-1-yl, 3-phenprop-1-yl, 1-phenbut-1-yl, 2-phenbut-1-yl, 3-phenbut-1-yl, 4-phenbut-1-yl, 1-phenbut-2-yl, 2-phenbut-2-yl, 3-phenbut-2-yl, 4-phenbut-2-yl, 1-(phenmeth)eth-1-yl, 1-(phenmethyl)-1-(methyl)eth-1-yl or (phenmethyl)-1-(methyl)prop-1-yl; preferably benzyl and 2-phenethyl.
- In the context of the present invention, the expression "alkenyl" comprises straight-chain and branched alkenyl groups which, depending on the chain length, may bear one or more noncumulated carbon-carbon double bonds (e.g. 1, 2, 3, 4 or more than 4). Alkenyl which has two double bonds is also referred to hereinafter as alkadienyl. Preference is given to C2-C18-, particular preference to C2-C12-alkenyl groups. The expression "alkenyl" also comprises substituted alkenyl groups which may bear one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents. Suitable substituents are, for example, selected from cycloalkyl, heterocycloalkyl, aryl, hetaryl, halogen, hydroxyl, alkoxy, alkylthio, mercapto, COOH, carboxylate, SO3H, sulfonate, NE3E4, nitro and cyano, where E3 and E4 are each independently hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl.
- Alkenyl is then, for example, ethenyl, 1-propenyl, 2-propenyl, 1-butenyl, 2-butenyl, 3-butenyl, 1-pentenyl, 2-pentenyl, 3-pentenyl, 4-pentenyl, 1-hexenyl, 2-hexenyl, 3-hexenyl, 4-hexenyl, 5-hexenyl, penta-1,3-dien-1-yl, hexa-1,4-dien-1-yl, hexa-1,4-dien-3-yl, hexa-1,4-dien-6-yl, hexa-1,5-dien-1-yl, hexa-1,5-dien-3-yl, hexa-1,5-dien-4-yl, hepta-1,4-dien-1-yl, hepta-1,4-dien-3-yl, hepta-1,4-dien-6-yl, hepta-1,4-dien-7-yl, hepta-1,5-dien-1-yl, hepta-1,5-dien-3-yl, hepta-1,5-dien-4-yl, hepta-1,5-dien-7-yl, hepta-1,6-dien-1-yl, hepta-1,6-dien-3-yl, hepta-1,6-dien-4-yl, hepta-1,6-dien-5-yl, hepta-1,6-dien-2-yl, octa-1,4-dien-1-yl, octa-1,4-dien-2-yl, octa-1,4-dien-3-yl, octa-1,4-dien-6-yl, octa-1,4-dien-7-yl, octa-1,5-dien-1-yl, octa-1,5-dien-3-yl, octa-1,5-dien-4-yl, octa-1,5-dien-7-yl, octa-1,6-dien-1-yl, octa-1,6-dien-3-yl, octa-1,6-dien-4-yl, octa-1,6-dien-5-yl, octa-1,6-dien-2-yl, deca-1,4-dienyl, deca-1,5-dienyl, deca-1,6-dienyl, deca-1,7-dienyl, deca-1,8-dienyl, deca-2,5-dienyl, deca-2,6-dienyl, deca-2,7-dienyl, deca-2,8-dienyl. The remarks regarding alkenyl also apply to the alkenyl groups in alkenyloxy, alkenylthio, etc.
- The expression "alkynyl" comprises unsubstituted or substituted alkynyl groups which have one or more nonadjacent triple bonds, such as ethynyl, 1-propynyl, 2-propynyl, 1-butynyl, 2-butynyl, 3-butynyl, 1-pentynyl, 2-pentynyl, 3-pentynyl, 4-pentynyl, 1-hexynyl, 2-hexynyl, 3-hexynyl, 4-hexynyl, 5-hexynyl. The remarks regarding alkynyl also apply to the alkynyl groups in alkynyloxy, alkynylthio, etc. Substituted alkynyls preferably bear one or more (e.g. 1, 2, 3, 4, 5 or more than 5) of the substituents specified above for alkenyl.
- In the context of the present invention, the expression "cycloalkyl" comprises unsubstituted or else substituted cycloalkyl groups, preferably C3-C8-cycloalkyl groups such as cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, cycloheptyl or cyclooctyl, especially C5-C8-cycloalkyl. Substituted cycloalkyl groups may have one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents. These are preferably each independently selected from alkyl, alkoxy, alkylthio and the substituents specified above for the alkyl groups. In the case of substitution, the cycloalkyl groups preferably bear one or more, for example one, two, three, four or five, C1-C6-alkyl groups.
- Examples of preferred cycloalkyl groups are cyclopentyl, 2- and 3-methylcyclopentyl, 2-and 3-ethylcyclopentyl, cyclohexyl, 2-, 3- and 4-methylcyclohexyl, 2-, 3- and 4-ethylcyclohexyl, 2-, 3- and 4-propylcyclohexyl, 2-, 3- and 4-isopropylcyclohexyl, 2-, 3-and 4-butylcyclohexyl, 2-, 3- and 4-sec-butylcyclohexyl, 2-, 3- and 4-tert-butylcyclohexyl, cycloheptyl, 2-, 3- and 4-methylcycloheptyl, 2-, 3- and 4-ethylcycloheptyl, 2-, 3- and 4-propylcycloheptyl, 2-, 3- and 4-isopropylcycloheptyl, 2-, 3- and 4-butylcycloheptyl, 2-, 3- and 4-sec-butylcycloheptyl, 2-, 3- and 4-tert-butylcycloheptyl, cyclooctyl, 2-, 3-, 4- and 5-methylcyclooctyl, 2-, 3-, 4- and 5-ethylcyclooctyl, 2-, 3-, 4- and 5-propylcyclooctyl.
- The expression cycloalkenyl comprises unsubstituted and substituted monounsaturated hydrocarbon groups having from 3 to 8, preferably from 5 to 6 carbon ring members, such as cyclopenten-1-yl, cyclopenten-3-yl, cyclohexen-1-yl, cyclohexen-3-yl, cyclohexen-4-yl. Suitable substituents are those specified above for cycloalkyl.
- The expression bicycloalkyl preferably comprises bicyclic hydrocarbon radicals having from 5 to 10 carbon atoms, such as bicyclo[2.2.1]hept-1-yl, bicyclo[2.2.1]hept-2-yl, bicyclo[2.2.1]hept-7-yl, bicyclo[2.2.2]oct-1-yl, bicyclo[2.2.2]oct-2-yl, bicyclo[3.3.0]octyl, bicyclo[4.4.0]decyl. The expression "bicycloalkyl" comprises unsubstituted or else substituted bicycloalkyl groups. Substituted bicycloalkyl groups may have one or more (e.g. 1, 2, 3 or more than 3) substituents. These are preferably each independently selected from alkyl, alkoxy, alkylthio, and the substituents specified above for the alkyl groups.
- In the context of the present invention, the expression "aryl" comprises mono- or polycyclic aromatic hydrocarbon radicals which may be unsubstituted or substituted. Aryl is preferably unsubstituted or substituted phenyl, naphthyl, indenyl, fluorenyl, anthracenyl, phenanthrenyl, naphthacenyl, chrysenyl, pyrenyl, etc., and more preferably phenyl or naphthyl. Substituted aryls may, depending on the number and size of their ring systems, have one or more (e.g. 1, 2, 3, 4, 5 or more than 5) substituents. They are preferably each independently selected from alkyl, alkoxy, alkylthio, cycloalkyl, heterocycloalkyl, aryl, hetaryl, halogen, hydroxyl, mercapto, COOH, carboxylate, SO3H, sulfonate, NE5E6, nitro and cyano, where E5 and E6 are each independently hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl. Halogen substituents are preferably fluorine, chlorine or bromine. Aryl is more preferably phenyl which, in the case of substitution, may bear generally 1, 2, 3, 4 or 5, preferably 1, 2 or 3 substituents.
- Aryl which bears one or more radicals is, for example, 2-, 3- and 4-methylphenyl, 2,4-, 2,5-, 3,5- and 2,6-dimethylphenyl, 2,4,6-trimethylphenyl, 2-, 3- and 4-ethylphenyl, 2,4-, 2,5-, 3,5- and 2,6-diethylphenyl, 2,4,6-triethylphenyl, 2-, 3- and 4-propylphenyl, 2,4-, 2,5-, 3,5- and 2,6-dipropylphenyl, 2,4,6-tripropylphenyl, 2-, 3- and 4-isopropylphenyl, 2,4-, 2,5-, 3,5- and 2,6-diisopropylphenyl, 2,4,6-triisopropylphenyl, 2-, 3- and 4-butylphenyl, 2,4-, 2,5-, 3,5- and 2,6-dibutylphenyl, 2,4,6-tributylphenyl, 2-, 3- and 4-isobutylphenyl, 2,4-, 2,5-, 3,5- and 2,6-diisobutylphenyl, 2,4,6-triisobutylphenyl, 2-, 3-and 4-sec-butylphenyl, 2,4-, 2,5-, 3,5- and 2,6-di-sec-butylphenyl, 2,4,6-tri-sec-butylphenyl, 2-, 3- and 4-tert-butylphenyl, 2,4-, 2,5-, 3,5- and 2,6-di-tert-butylphenyl and 2,4,6-tri-tert-butylphenyl; 2-, 3- and 4-methoxyphenyl, 2,4-, 2,5-, 3,5- and 2,6-dimethoxyphenyl, 2,4,6-trimethoxyphenyl, 2-, 3- and 4-ethoxyphenyl, 2,4-, 2,5-, 3,5-and 2,6-diethoxyphenyl, 2,4,6-triethoxyphenyl, 2-, 3- and 4-propoxyphenyl, 2,4-, 2,5-, 3,5- and 2,6-dipropoxyphenyl, 2-, 3- and 4-isopropoxyphenyl, 2,4-, 2,5-, 3,5- and 2,6-diisopropoxyphenyl and 2-, 3- and 4-butoxyphenyl; 2-, 3- and 4-cyanophenyl.
- In the context of the present invention, the expression "heterocycloalkyl" comprises nonaromatic, unsaturated or fully saturated, cycloaliphatic groups having generally from 5 to 8 ring atoms, preferably 5 or 6 ring atoms, in which 1, 2 or 3 of the ring carbon atoms are replaced by heteroatoms selected from oxygen, nitrogen, sulfur and an -NRe- group and which is unsubstituted or substituted by one or more, for example 1, 2, 3, 4, 5 or 6 C1-C6-alkyl groups. Re is as defined above. Examples of such heterocycloaliphatic groups include pyrrolidinyl, piperidinyl, 2,2,6,6-tetramethylpiperidinyl, imidazolidinyl, pyrazolidinyl, oxazolidinyl, morpholidinyl, thiazolidinyl, isothiazolidinyl, isoxazolidinyl, piperazinyl, tetrahydrothiophenyl, dihydrothien-2-yl, tetrahydrofuranyl, dihydrofuran-2-yl, tetrahydropyranyl, 1,2-oxazolin-5-yl, 1,3-oxazolin-2-yl and dioxanyl.
- In the context of the present invention, the expression "heteroaryl" comprises unsubstituted or substituted, heteroaromatic, mono- or polycyclic groups, preferably the pyridyl, quinolinyl, acridinyl, pyridazinyl, pyrimidinyl, pyrazinyl, pyrrolyl, imidazolyl, pyrazolyl, indolyl, purinyl, indazolyl, benzotriazolyl, 1,2,3-triazolyl, 1,3,4-triazolyl and carbazolyl groups, where these heterocycloaromatic groups, in the case of substitution, may bear generally 1, 2 or 3 substituents. The substituents are preferably selected from C1-C6-alkyl, C1-C6-alkoxy, hydroxyl, carboxyl, halogen and cyano.
- Nitrogen-containing 5- to 7-membered heterocycloalkyl or heteroaryl radicals which optionally comprise further heteroatoms selected from oxygen and sulfur comprise, for example, pyrrolyl, pyrazolyl, imidazolyl, triazolyl, pyrrolidinyl, pyrazolinyl, pyrazolidinyl, imidazolinyl, imidazolidinyl, pyridinyl, pyridazinyl, pyrimidinyl, pyrazinyl, triazinyl, piperidinyl, piperazinyl, oxazolyl, isooxazolyl, thiazolyl, isothiazolyl, indolyl, quinolinyl, isoquinolinyl or quinaldinyl.
- Halogen is fluorine, chlorine, bromine or iodine.
- In the compounds of the formula (I.B), the Ra and Rb radicals may be defined identically or differently. In a preferred embodiment, the Ra und Rb radicals have identical definitions.
- In a first preferred embodiment, the Ra und Rb radicals are both hydrogen.
- Specific examples of Ra und Rb radicals other than hydrogen are:
- methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, sec-butyl, tert-butyl, n-pentyl, n-hexyl, n-heptyl, n-octyl, n-nonyl, n-decyl, n-undecyl, n-dodecyl, n-tridecyl, n-tetradecyl, n-hexadecyl, n-octadecyl and n-eicosyl, 2-methoxyethyl, 2-ethoxyethyl, 2-propoxyethyl, 2-butoxyethyl, 3-methoxypropyl, 3-ethoxypropyl, 3-propoxypropyl, 3-butoxypropyl, 4-methoxybutyl, 4-ethoxybutyl, 4-propoxybutyl, 3,6-dioxaheptyl, 3,6-dioxaoctyl, 4,8-dioxanonyl, 3,7-dioxaoctyl, 3,7-dioxanonyl, 4,7-dioxaoctyl, 4,7-dioxanonyl, 2- and 4-butoxybutyl, 4,8-dioxadecyl, 3,6,9-trioxadecyl, 3,6,9-trioxaundecyl, 3,6,9-trioxadodecyl, 3,6,9,12-tetraoxatridecyl and 3,6,9,12-tetraoxatetradecyl;
- 2-methylthioethyl, 2-ethylthioethyl, 2-propylthioethyl, 2-butylthioethyl, 3-methylthiopropyl, 3-ethylthiopropyl, 3-propylthiopropyl, 3-butylthiopropyl, 4-methylthiobutyl, 4-ethylthiobutyl, 4-propylthiobutyl, 3,6-dithiaheptyl, 3,6-dithiaoctyl, 4,8-dithianonyl, 3,7-dithiaoctyl, 3,7-di-thianonyl, 2- and 4-butylthiobutyl, 4,8-dithiadecyl, 3,6,9-trithiadecyl, 3,6,9-trithiaundecyl, 3,6,9-trithiadodecyl, 3,6,9,12-tetrathiatridecyl and 3,6,9,12-tetrathiatetradecyl;
- 2-monomethyl- and 2-monoethylaminoethyl, 2-dimethylaminoethyl, 2- and 3-dimethylaminopropyl, 3-monoisopropylaminopropyl, 2- and 4-monopropylaminobutyl, 2- and 4-dimethylaminobutyl, 6-methyl-3,6-diazaheptyl, 3,6-dimethyl-3,6-diazaheptyl, 3,6-diazaoctyl, 3,6-dimethyl-3,6-diazaoctyl, 9-methyl-3,6,9-triazadecyl, 3,6,9-trimethyl-3,6,9-triazadecyl, 3,6,9-triazaundecyl, 3,6,9-trimethyl-3,6,9-triazaundecyl, 12-methyl-3,6,9,12-tetraazatridecyl and 3,6,9,12-tetramethyl-3,6,9,12-tetraazatridecyl;
- (1-ethylethylidene)aminoethylene, (1-ethylethylidene)aminopropylene, (1-ethylethylidene)aminobutylene, (1-ethylethylidene)aminodecylene and (1-ethylethylidene)aminododecylene;
- propan-2-on-1-yl, butan-3-on-1-yl, butan-3-on-2-yl and 2-ethylpentan-3-on-1-yl;
- 2-methylsulfinylethyl, 2-ethylsulfinylethyl, 2-propylsulfinylethyl, 2-isopropylsulfinylethyl, 2-butylsulfinylethyl, 2- and 3-methylsulfinylpropyl, 2- and 3-ethylsulfinylpropyl, 2- and 3-propylsulfinylpropyl, 2- and 3-butylsulfinylpropyl, 2- and 4-methylsulfinylbutyl, 2- and 4-ethylsulfinylbutyl, 2- and 4-propylsulfinylbutyl and 4-butylsulfinylbutyl;
- 2-methylsulfonylethyl, 2-ethylsulfonylethyl, 2-propylsulfonylethyl, 2-isopropylsulfonylethyl, 2-butylsulfonylethyl, 2- and 3-methylsulfonylpropyl, 2- and 3-ethylsulfonylpropyl, 2- and 3-propylsulfonylpropyl, 2- and 3-butylsulfonylpropyl, 2-and 4-methylsulfonylbutyl, 2- and 4-ethylsulfonylbutyl, 2- and 4-propylsulfonylbutyl and 4-butylsulfonylbutyl;
- carboxymethyl, 2-carboxyethyl, 3-carboxypropyl, 4-carboxybutyl, 5-carboxypentyl, 6-carboxyhexyl, 8-carboxyoctyl, 10-carboxydecyl, 12-carboxydodecyl and 14-carboxytetradecyl;
- sulfomethyl, 2-sulfoethyl, 3-sulfopropyl, 4-sulfobutyl, 5-sulfopentyl, 6-sulfohexyl, 8-sulfooctyl, 10-sulfodecyl, 12-sulfododecyl and 14-sulfotetradecyl;
- 2-hydroxyethyl, 2- and 3-hydroxypropyl, 3- and 4-hydroxybutyl and 8-hydroxy-4-oxaoctyl;
- 2-cyanoethyl, 3-cyanopropyl, 3- and 4-cyanobutyl;
- 2-chloroethyl, 2- and 3-chloropropyl, 2-, 3- and 4-chlorobutyl, 2-bromoethyl, 2- and 3-bromopropyl and 2-, 3- and 4-bromobutyl;
- 2-nitroethyl, 2- and 3-nitropropyl and 2-, 3- and 4-nitrobutyl;
- cyclopropyl, cyclobutyl, cyclopentyl, 2- and 3-methylcyclopentyl, 2- and 3-ethylcyclopentyl, cyclohexyl, 2-, 3- and 4-methylcyclohexyl, 2-, 3- and 4-ethylcyclohexyl, 3- and 4-propylcyclohexyl, 3- and 4-isopropylcyclohexyl, 3- and 4-butylcyclohexyl, 3- and 4-sec-butylcyclohexyl, 3- and 4-tert-butylcyclohexyl, cycloheptyl, 2-, 3- and 4-methylcycloheptyl, 2-, 3- and 4-ethylcycloheptyl, 3- and 4-propylcycloheptyl, 3- and 4-isopropylcycloheptyl, 3- and 4-butylcycloheptyl, 3- and 4-sec-butylcycloheptyl, 3- and 4-tert-butylcycloheptyl, cyclooctyl, 2-, 3-, 4- and 5-methylcyclooctyl, 2-, 3-, 4- and 5-ethylcyclooctyl and 3-, 4- and 5-propylcyclooctyl; 3-and 4-hydroxycyclohexyl, 3- and 4-nitrocyclohexyl and 3- and 4-chlorocyclohexyl;
- 2-dioxanyl, 1-morpholinyl, 1-thiomorpholinyl, 2- and 3-tetrahydrofuryl, 1-, 2- and 3-pyrrolidinyl, 1-piperazyl, 1-diketopiperazyl and 1-, 2-, 3- and 4-piperidyl;
- Preferred fluorinated Ra and Rb radicals are as follows:
- 2,2,2-trifluoroethyl, 2,2,3,3,3-pentafluoropropyl, 2,2,3,3,4,4,4-heptafluorobutyl, , 1H,1H-perfluoropentyl, 1H,1H-perfluorohexyl, 1H,1H-perfluoroheptyl,
- 1H,1H-pentadecafluorooctyl, 1H,1H-perfluorononyl, 1H,1H-perfluorodecyl, 3,3,4,4,4-pentafluorobutyl, 1H,1H,2H,2H-perfluoropentyl, 1H,1H,2H,2H-perfluorohexyl, 1H,1H,2H,2H-perfluoroheptyl, 1H,1H,2H,2H-perfluorooctyl, 1H,1H,2H,2H-perfluorononyl, 1H,1H,2H,2H-perfluorodecyl, 3,3,3-trifluoro-n-propyl,
- In a very preferred embodiment, the Ra and Rb radicals are each independently 1H,1H-perfluoro-C2-C30-alkyl or 1H,1H,2H,2H-perfluoro-C3-C30-alkyl, preferably 1H,1H-perfluoro-C2-C20-alkyl or 1H,1H,2H,2H-perfluoro-C3-C20-alkyl, in particular 1H,1H-perfluoro-C2-C10-alkyl or 1H,1H,2H,2H-perfluoro-C3-C10-alkyl such as 2,2,2-trifluoroethyl, 2,2,3,3,3-pentafluoropropyl, 2,2,3,3,4,4,4-heptafluorobutyl, 1 H, 1 H-perfluoropentyl, 1H,1H-perfluorohexyl, 1H,1H-perfluoroheptyl, 1H,1H-pentadecafluorooctyl, 1H,1H-perfluorononyl, 1H,1H-pertluorodecyl, 3,3,3-trifluoropropyl, 3,3,4,4,4-pentafluorobutyl, 1H,1H,2H,2H-perfluoropentyl, 1H,1H,2H,2H-perfluorohexyl, 1 H,1 H,2H,2H-perfluoroheptyl, 1 H,1 H,2H,2H-perfluorooctyl, 1 H, 1 H,2H,2H-perfluorononyl.
- In a further preferred embodiment, the Ra and Rb radicals are selected from groups of the general formula (II)
#-(A)p-C(Rf)x (II)
in which - # represents the bonding site to the imide nitrogen atom,
- p is 0 or 1,
- x is 2 or 3,
- A where present is a C1-C10-alkylene group which may be interrupted by one or more nonadjacent groups selected from -O- and -S-,
- where, in the case that x is 2, the carbon atom which bears the Rf radicals additionally bears a hydrogen atom,
- the Rf radicals are each independently selected from C1-C30-alkyl, e.g. C4-C30-alkyl which may be interrupted by one or more nonadjacent oxygen atom(s), where at least one of the Rf radicals may also be C4-C30-alkyloxy or C4-C30-alkylthio.
- A preferred radical of the formula (II) is, for example, 2-ethylhex-1-yl.
- The Ra and Rb radicals are more preferably selected from groups of the formula (II.1) (so-called swallowtail radicals). Preferably, in the groups of the formula (II.1), the Rf radicals are selected from C1-C30-alkyl, preferably C1-C12-alkyl, more preferably C1-C8-alkyl, e.g. C4-C8-alkyl, preferably C5-C7-alkyl. The Ra and Rb radicals are then preferably both a group of the formula in which
- # represents the bonding site to the imide nitrogen atom, and
- the Rf radicals are independently selected from C1-C30-alkyl, preferably C1-C12-alkyl, more preferably C1-C8-alkyl. In one embodiment, each Rf radical is independently selected from C1-C8-alkyl, e.g. C4-C8-alkyl, preferably C5-C7-alkyl. The Rf radicals are then specifically linear alkyl radicals which are not interrupted by oxygen atoms. In one embodiment, each Rf has the same meaning. In a further embodiment, each Rf has a different meaning.
- Preferred radicals of the formula II.1 are for example:
- 1-ethylpropyl, 1-methylpropyl, 1-propylbutyl, 1-ethylbutyl, 1-methylbutyl, 1-butylpentyl, 1-propylpentyl, 1-ethylpentyl, 1-methylpentyl, 1-pentylhexyl, 1-butylhexyl, 1-propylhexyl, 1-ethylhexyl, 1-methylhexyl, 1-hexylheptyl, 1-pentylheptyl, 1-butylheptyl, 1-propylheptyl, 1-ethylheptyl, 1-methylheptyl, 1-heptyloctyl, 1-hexyloctyl, 1-pentyloctyl, 1-butyloctyl, 1-propyloctyl, 1-ethyloctyl, 1-methyloctyl, 1-octylnonyl, 1-heptylnonyl, 1-hexylnonyl, 1-pentylnonyl, 1-butylnonyl, 1-propylnonyl, 1-ethylnonyl, 1-methylnonyl, 1-nonyldecyl, 1-octyldecyl, 1-heptyldecyl, 1-hexyldecyl, 1-pentyldecyl, 1-butyldecyl, 1-propyldecyl, 1-ethyldecyl, 1-methyldecyl, 1-decylundecyl, 1-nonylundecyl, 1-octylundecyl, 1-heptylundecyl, 1-hexylundecyl, 1-pentylundecyl, 1-butylundecyl, 1-propylundecyl, 1-ethylundecyl, 1-methylundecyl, 1-undecyldodecyl, 1-decyldodecyl, 1-nonyldodecyl, 1-octyldodecyl, 1-heptyldodecyl, 1-hexyldodecyl, 1-pentyldodecyl, 1-butyldodecyl, 1-propyldodecyl, 1-ethyldodecyl, 1-methyldodecyl, 1-dodecyltridecyl, 1-undecyltridecyl, 1-decyltridecyl, 1-nonyltridecyl, 1-octyltridecyl, 1-heptyltridecyl, 1-hexyltridecyl, 1-pentyltridecyl, 1-butyltridecyl, 1-propyltridecyl, 1-ethyltridecyl, 1-methyltridecyl, 1-tridecyltetradecyl, 1-undecyltetradecyl, 1-decyltetradecyl, 1-nonyltetradecyl, 1-octyltetradecyl, 1-hetyltetradecyl, 1-hexyltetradecyl, 1-pentyltetradecyl, 1-butyltetradecyl, 1-propyltetradecyl, 1-ethyltetradecyl, 1-methyltetradecyl, 1-pentadecylhexadecyl, 1-tetradecylhexadecyl, 1-tridecylhexadecyl, 1-dodecylhexadecyl, 1-undecylhexadecyl, 1-decylhexadecyl, 1-nonylhexadecyl, 1-octylhexadecyl, 1-heptylhexadecyl, 1-hexylhexadecyl, 1-pentylhexadecyl, 1-butylhexadecyl, 1-propylhexadecyl, 1-ethylhexadecyl, 1-methylhexadecyl, 1-hexadecyloctadecyl, 1-pentadecyloctadecyl, 1-tetradecyloctadecyl, 1-tridecyloctadecyl, 1-dodecyloctadecyl, 1-undecyloctadecyl, 1-decyloctadecyl, 1-nonyloctadecyl, 1-octyloctadecyl, 1-heptyloctadecyl, 1-hexyloctadecyl, 1-pentyloctadecyl, 1-butyloctadecyl, 1-propyloctadecyl, 1-ethyloctadecyl, 1-methyloctadecyl, 1-nonadecyleicosanyl, 1-octadecyleicosanyl, 1-heptadecyleicosanyl, 1-hexadecyleicosanyl, 1-pentadecyleicosanyl, 1-tetradecyleicosanyl, 1-tridecyleicosanyl, 1-dodecyleicosanyl, 1-undecyleicosanyl, 1-decyleicosanyl, 1-nonyleicosanyl, 1-octyleicosanyl, 1-heptyleicosanyl, 1-hexyleicosanyl, 1-pentyleicosanyl, 1-butyleicosanyl, 1-propyleicosanyl, 1-ethyleicosanyl, 1-methyleicosanyl, 1-eicosanyldocosanyl, 1-nonadecyldocosanyl, 1-octadecyldocosanyl, 1-heptadecyldocosanyl, 1-hexadecyldocosanyl, 1-pentadecyldocosanyl, 1-tetradecyldocosanyl, 1-tridecyldocosanyl, 1-undecyldocosanyl, 1-decyldocosanyl, 1-nonyldocosanyl, 1-octyldocosanyl, 1-heptyldocosanyl, 1-hexyldocosanyl, 1-pentyldocosanyl, 1-butyldocosanyl, 1-propyldocosanyl, 1-ethyldocosanyl, 1-methyldocosanyl, 1-tricosanyltetracosanyl, 1-docosanyltetracosanyl, 1-nonadecyltetracosanyl, 1-octadecyltetracosanyl, 1-heptadecyltetracosanyl, 1-hexadecyltetracosanyl, 1-pentadecyltetracosanyl, 1-pentadecyltetracosanyl, 1-tetradecyltetracosanyl, 1-tridecyltetracosanyl, 1-dodecyltetracosanyl, 1-undecyltetracosanyl, 1-decyltetracosanyl, 1-nonyltetracosanyl, 1-octyltetracosanyl, 1-heptyltetracosanyl, 1-hexyltetracosanyl, 1-pentyltetracosanyl, 1-butyltetracosanyl, 1-propyltetracosanyl, 1-ethyltetracosanyl, 1-methyltetracosanyl, 1-heptacosanyloctacosanyl, 1-hexacosanyloctacosanyl, 1-pentacosanyloctacosanyl, 1-tetracosanyloctacosanyl, 1-tricosanyloctacosanyl, 1-docosanyloctacosanyl, 1-nonadecyloctacosanyl, 1-octadecyloctacosanyl, 1-heptadecyloctacosanyl, 1-hexadecyloctacosanyl, 1-hexadecyloctacosanyl, 1-pentadecyloctacosanyl, 1-tetradecyloctacosanyl, 1-tridecyloctacosanyl, 1-dodecyloctacosanyl, 1-undecyloctacosanyl, 1-decyloctacosanyl, 1-nonyloctacosanyl, 1-octyloctacosanyl, 1-heptyloctacosanyl, 1-hexyloctacosanyl, 1-pentyloctacosanyl, 1-butyloctacosanyl, 1-propyloctacosanyl, 1-ethyloctacosanyl, 1-methyloctacosanyl.
- More preferred radicals are for example:
- 1-methylethyl, 1-methylpropyl, 1-methylbutyl, 1-methylpentyl, 1-methylhexyl, 1-methylheptyl, 1-methyloctyl, 1-ethylpropyl, 1-ethylbutyl, 1-ethylpentyl, 1-ethylhexyl, 1-ethylheptyl, 1-ethyloctyl, 1-propylbutyl, 1-propylpentyl, 1-propylhexyl, 1-propylheptyl, 1-propyloctyl, 1-butylpentyl, 1-butylhexyl, 1-butylheptyl, 1-butyloctyl, 1-pentylhexyl, 1-pentylheptyl, 1-pentyloctyl, 1-hexylheptyl, 1-hexyloctyl, 1-heptyloctyl.
- Very preferred examples of a group of the formula II.1), wherein each Rf has the same meaning are 1-butylpent-1-yl, 1-pentylhex-1-yl and 1-hexylhept-1-yl. Preferred examples of a group of the formula II.1), wherein each Rf has a different meaning are 2-ethylhexyl, 1-methylbutyl, 1-methylpentyl or 1-methylhexyl.
- In a further preferred embodiment, Ra is selected from groups of the formula (III.A): -(CnH2n)-Ra1 and Rb is selected from groups of the formula (III.B):
- (CnH2n)-Rb1, where Ra1 and Rb1 are each independently selected from unsubstituted or substituted cycloalkyl, bicycloalkyl, cycloalkenyl, heterocycloalkyl, aryl and hetaryl, and n is an integer from 1 to 4.
- Ra is then preferably selected from -CH2-Ra1, -CH2CH2-Ra1, -CH2CH2CH2-Ra1 and -CH2CH2CH2CH2-Ra1. Rb is then preferably selected from -CH2-Rb1, -CH2CH2-Rb1, -CH2CH2CH2-Rb1 and -CH2CH2CH2CH2-Rb1.
-
- # represents the bonding site to a (CnH2n) group,
- the Rh radicals in the formulae 5, 8, 11 and 14 are each independently selected from C1-C3-alkyl, C1-C3-fluoroalkyl, fluorine, chlorine, bromine, NE1E2, nitro and cyano, where E1 and E2 are each independently hydrogen, alkyl, cycloalkyl, heterocycloalkyl, aryl or hetaryl,
- the Ri radicals in the
formulae 6, 7, 9, 10, 12, 13, 15 and 16 are each independently selected from C1-C3-alkyl radicals, - x in the formulae 5, 6 and 7 is 1, 2, 3, 4 or 5,
in theformulae 8, 9 and 10 is 1, 2, 3 or 4,
in the formulae 11, 12 and 13 is 1, 2 or 3,
in the formulae 14, 15 and 16 is 1 or 2. - Preferably, n in the formulae (CnH2n)-Ra1 and (CnH2n)-Rb1 is 1 or 2.
-
- In a further preferred embodiment, Ra and Rb are selected from 1,1-dihydroperfluoro-C2-C9-alkyl groups, in particular 1,1-dihydroperfluoro-C2-C6-alkyl groups.
Ra and Rb are then selected from groups of the general formula (IV)
#-CH2-(perfluoro-C1-C9-alkyl) (IV)
in which # represents the bonding site to an imide nitrogen atom, in particular from #-CH2-(perfluoro-C1-C5-alkyl). - Preferred perfluoro-C1-C5-alkyl radicals in the formula (IV) are trifluoromethyl, pentafluoroethyl, n-heptafluoropropyl (n-C3F7), heptafluoroisopropyl (CF(CF3)2), n-nonafluorobutyl (n-C4F9), n-undecafluoropentyl (n-C5F11), and also C(CF3)3, CF2CF(CF3)2, CF(CF3)(C2F5). Preferred perfluoro-C6-C9-alkyl radicals in the formula (IV) include n-C6F13, n-C7F15, n-C8F17 or n-C9F19.
- According to a preferred embodiment, Ra and Rb are the same. Preferably, Ra and Rb are both -CH2-(n-C3F7) or CH2-(n-C4F9).
- In a further preferred embodiment, Ra and Rb are selected from 1,1, 2,2-tetrahydroperfluoro-C3-C10-alkyl groups.
- Ra and Rb are then selected from groups of the general formula (V)
#-CH2-CH2-(perfluoro-C1-C8-alkyl) (V)
in which # represents the bonding site to an imide nitrogen atom. - Preferred perfluoro-C1-C8-alkyl radicals in the formula (V) are trifluoromethyl, pentafluoroethyl, n-heptafluoropropyl (n-C3F7), heptafluoroisopropyl (CF(CF3)2), n-nonafluorobutyl (n-C4F9), n-undecafluoropentyl (n-C5F11), n-C6F13, n-C7F15, n-C8F17, C(CF3)3, CF2CF(CF3)2, or CF(CF3)(C2F5). According to a preferred embodiment, Ra and Rb are the same.
-
- in which # represents the bonding site to an imide nitrogen atom,
- m is from 1 to 5, and
- n is from 1 to 10, preferably from 2 to 5.
- In the groups of the general formula (VI), m is preferably 5.
- In the compound of the general formula (VI), n is preferably 2.
-
- in which # represents the bonding site to an imide nitrogen atom, and
- A is CH2, (CH2)2 or (CH2)3.
-
- A is CH2, (CH2)2 or (CH2)3.
- In the formulae shown above, A is especially (CH2)2.
-
-
- in which # represents the bonding site to an imide nitrogen atom, and
- s is from 1 to 5.
-
-
- Ra and Rb independently are 1H,1H-perfluoro-C2-C30-alkyl or 1H,1H,2H,2H-perfluoro-C3-C30-alkyl; and
- R1 and R3 are each Cl and R2 and R4 are each hydrogen or
- R1 and R4 are each Cl and R2 and R3 are each hydrogen.
-
-
- R1 and R4 are each Cl and R2 and R3 are each hydrogen or R1 and R3 are each Cl and R2 and R4 are each hydrogen, or R1, R2 and R3 are each Cl and R4 is hydrogen, or R1, R2, R3 and R4 are each Cl,
- Ra and Rb are each independently hydrogen or unsubstituted or substituted alkyl, cycloalkyl, bicycloalkyl, heterocycloalkyl, chlorinated aryl or chlorinated hetaryl,
in which- a2) naphthalene-1,8;4,5-tetracarboxylic dianhydride is subjected to a reaction with an amine of the formula Ra-NH2 and if appropriate an amine of the formula Rb-NH2 to obtain a compound of the formula (D)
- b2) the compound obtained in step a2) is subjected to a chlorination by reaction with chlorine in the presence of iodine as a catalyst.
- a2) naphthalene-1,8;4,5-tetracarboxylic dianhydride is subjected to a reaction with an amine of the formula Ra-NH2 and if appropriate an amine of the formula Rb-NH2 to obtain a compound of the formula (D)
- In a preferred embodiment, the naphthalene-1,8:4,5-tetracarboxylic dianhydride is converted in step a2) by using amines of the formula Ra-NH2 and if appropriate one of the formula Rb-NH2, in which Ra and Rb are each groups which cannot be chlorinated by reaction with chlorine in the presence of iodine as a catalyst. Preferably, the chlorination of the compound of the formula (D) in step b2) is brought about by reaction with chlorine in chlorosulfonic acid and in the presence of catalytic amounts of iodine. The amount of iodine is 1 to 10% by weight, preferably 2 to 5% by weight, based on the amount of chlorine.
- The reaction temperature for the reaction with chlorine is typically within a range from 40 to 150°C, preferably from 60 to 100°C.
- The reaction of the naphthalene-1,8:4,5-tetracarboxylic dianhydride with chlorine can be brought about under standard pressure or under elevated pressure, e. g. the chlorination pressure is in the range from 1 bar to 100 bar. Usually the chlorination pressure is in the range from 1 bar to 10 bar.
- The reaction times usually range from 2 to 48 hours, preferably 4 to 16 hours. The reaction temperature and the reaction time of the chlorination can be used to control the degree of chlorination.
- Usually, about 50 ml of chlorosulfonic acid are used as solvent for 2 to 20 mmol of compound of formula (D).
-
- In
scheme 1, Ra and Rb are as defined above. The dichloronaphthalenetetracarboxylic bisanhydrides of formulae (IX) and (X), respectively, are treated with an amine of the formula Ra-NH2 and if appropriate one of the formula Rb-NH2, in the case that Ra is different from Rb. The reaction is usually carried out in a solvent. Suitable solvents include C1-C6 alkane carboxylic acids, e.g. acetic acid. 2,6-Dichloronaphthalene-1,4,5,8-tetracarboxylic acid dianhydride of the formula (IX) and 2,7-dichloronaphthalene-1,4,5,8-tetracarboxylic acid dianhydride of the formula (X) can be prepared according to the method described in J. Org. Chem. 2006, 71, 8098-8105. - Compounds of the formula (I.B) with R1, R2, R3 and R4 being chlorine can be prepared in analogy to the process depicted in
scheme 1 starting from 2,3,6,7-tetrachloronaphthalene-1,4,5,8-tetracarboxylic dianhydride which can be prepared according to the method described inDE 36 20 332 . - The compounds of the formula (I.B) are particularly advantageously suitable as organic semiconductors. They generally function as n-type semiconductors. When the compounds of the formula (I.B) used in accordance with the invention are combined with other semiconductors and the position of the energy levels has the result that the other semiconductors function as n-type semiconductors, the compounds (I.B) can also function as p-semiconductors in exceptional cases.
- The compounds of the formula (I.B) are notable for their air stability. Surprisingly, organic field-effect transistors comprising a compound of formula (I.B) are notable for their air stability and humidity stability.
- The compounds of the formula (I.B) possess a high charge transport mobility and/or have a high on/off ratio. The compounds of the formula (I.B) have charge mobilities of least 0.1 cm2V-1s-1 when deposited by vacuum-deposition methods or of least 0.01 cm2V-1s-1 when deposited in liquid form. The average on/off ratio is at least 104, preferably at least 105. They are suitable in a particularly advantageous manner for organic field-effect transistors (OFETs).
- The inventive compounds are suitable particularly advantageously for the production of integrated circuits (ICs), for which the n-channel MOSFETs (metal oxide semiconductor field-effect transistors (MOSFETs)) customary to date are used. These are then CMOS-like semiconductor units, for example for microprocessors, microcontrollers, static RAM, and other digital logic units.
- For the production of semiconductor materials, the inventive compounds of the formula (I.B) can be processed further by one of the following processes: printing (offset, flexographic, gravure, screen, inkjet, electrophotography), evaporation, laser transfer, spin-coating, photolithography, dropcasting. They are suitable especially for use in displays (especially large-area and/or flexible displays) and RFID tags.
- The inventive compounds are also suitable particularly as fluorescence emitters in OLEDs, in which they are excited either by electroluminescence or by an appropriate phosphorescence emitter via Förster energy transfer (FRET).
- The inventive compounds of the formula (I.B) are also particularly suitable in displays which switch colors on and off based on an electrophoretic effect via charged pigment dyes. Such electrophoretic displays are described, for example, in
US 2004/0130776 . - The invention further provides organic field-effect transistors comprising a substrate having at least one gate structure, a source electrode and a drain electrode and at least one compound of the formula (I.B) as defined above as an n-type semiconductor. The invention further provides substrates comprising a multitude of organic field-effect transistors, wherein at least some of the field-effect transistors comprise at least one compound of the formula I as defined above as an n-type semiconductor. The invention also provides semiconductor units which comprise at least one such substrate.
- A specific embodiment is a substrate with a pattern (topography) of organic field-effect transistors, each transistor comprising
- an organic semiconductor disposed on the substrate;
- a gate structure for controlling the conductivity of the conductive channel; and
- conductive source and drain electrodes at the two ends of the channel,
- A further specific embodiment is a substrate having a pattern of organic field-effect transistors, each transistor forming an integrated circuit or being part of an integrated circuit and at least some of the transistors comprising at least one compound of the formula (I.B).
- Suitable substrates are in principle the materials known for this purpose. Suitable substrates comprise, for example, metals (preferably metals of
groups 8, 9, 10 or 11 of the Periodic Table, such as Au, Ag, Cu), oxidic materials (such as glass, quartz, ceramics, SiO2), semiconductors (e.g. doped Si, doped Ge), metal alloys (for example based on Au, Ag, Cu, etc.), semiconductor alloys, polymers (e.g. polyvinyl chloride, polyolefins such as polyethylene and polypropylene, polyesters, fluoropolymers, polyamides, polyimides, polyurethanes, polyalkyl (meth)acrylates, polystyrene and mixtures and composites thereof), inorganic solids (e.g. ammonium chloride), paper and combinations thereof. The substrates may be flexible or inflexible, and have a curved or planar geometry, depending on the desired use. - A typical substrate for semiconductor units comprises a matrix (for example a quartz or polymer matrix) and, optionally, a dielectric top layer.
- Suitable dielectrics are SiO2, polystyrene, poly-α-methylstyrene, polyolefins (such as polypropylene, polyethylene, polyisobutene), polyvinylcarbazole, fluorinated polymers (e.g. Cytop, CYMM), cyanopullulans, polyvinylphenol, poly-p-xylene, polyvinyl chloride, or polymers crosslinkable thermally or by atmospheric moisture. Specific dielectrics are "self-assembled nanodielectrics", i.e. polymers which are obtained from monomers comprising SiCl functionalities, for example Cl3SiOSiCl3, Cl3Si-(CH2)6-SiCl3, Cl3Si-(CH2)12-SiCl3, and/or which are crosslinked by atmospheric moisture or by addition of water diluted with solvents (see, for example, Faccietti Adv. Mat. 2005, 17, 1705-1725). Instead of water, it is also possible for hydroxyl-containing polymers such as polyvinylphenol or polyvinyl alcohol or copolymers of vinylphenol and styrene to serve as crosslinking components. It is also possible for at least one further polymer to be present during the crosslinking operation, for example polystyrene, which is then also crosslinked (see
Facietti, US patent application 2006/0202195 ). - The substrate may additionally have electrodes, such as gate, drain and source electrodes of OFETs, which are normally localized on the substrate (for example deposited onto or embedded into a nonconductive layer on the dielectric). The substrate may additionally comprise conductive gate electrodes of the OFETs, which are typically arranged below the dielectric top layer (i.e. the gate dielectric).
- In a specific embodiment, an insulator layer (gate insulating layer) is present on at least part of the substrate surface. The insulator layer comprises at least one insulator which is preferably selected from inorganic insulators such as SiO2, SiN, etc., ferroelectric insulators such as Al2O3, Ta2O5 La2O5, TiO2, Y2O3, etc., organic insulators such as polyimides, benzocyclobutene (BCB), polyvinyl alcohols, polyacrylates, etc., and combinations thereof.
- Suitable materials for source and drain electrodes are in principle electrically conductive materials. These include metals, preferably metals of
groups 8, 9, 10 or 11 of the Periodic Table, such as Pd, Au, Ag, Cu, Al, Ni, Cr, etc. Also suitable are conductive polymers such as PEDOT (= poly(3,4-ethylenedioxythiophene)); PSS (= poly(styrenesulfonate)), polyaniline, surface-modified gold, etc. Preferred electrically conductive materials have a specific resistance of less than 10-3 ohm x meter, preferably less than 10-4 ohm x meter, especially less than 10-6 or 10-7 ohm x meter. - In a specific embodiment, drain and source electrodes are present at least partly on the organic semiconductor material. It will be appreciated that the substrate may comprise further components as used customarily in semiconductor materials or ICs, such as insulators, resistors, capacitors, conductor tracks, etc.
- The electrodes may be applied by customary processes, such as evaporation, lithographic processes or another structuring process.
- The semiconductor materials may also be processed with suitable auxiliaries (polymers, surfactants) in disperse phase by printing.
- In a preferred embodiment, the deposition of at least one compound of the general formula (I.B) (and if appropriate further semiconductor materials) is carried out by a gas phase deposition process (physical vapor deposition, PVD). PVD processes are performed under high-vacuum conditions and comprise the following steps: evaporation, transport, deposition. It has been found that, surprisingly, the compounds of the general formula (I.B) are suitable particularly advantageously for use in a PVD process, since they essentially do not decompose and/or form undesired by-products. The material deposited is obtained in high purity. In a specific embodiment, the deposited material is obtained in the form of crystals or comprises a high crystalline content. In general, for the PVD, at least one compound of the general formula (I.B) is heated to a temperature above its evaporation temperature and deposited on a substrate by cooling below the crystallization temperature. The temperature of the substrate in the deposition is preferably within a range from about 20 to 250°C, more preferably from 50 to 200°C.
- The resulting semiconductor layers generally have a thickness which is sufficient for ohmic contact between source and drain electrodes. The deposition can be effected under an inert atmosphere, for example under nitrogen, argon or helium.
- The deposition is effected typically at ambient pressure or under reduced pressure. A suitable pressure range is from about 10-7 to 1.5 bar.
- The compound of the formula (I.B) is preferably deposited on the substrate in a thickness of from 10 to 1000 nm, more preferably from 15 to 250 nm. In a specific embodiment, the compound of the formula (I.B) is deposited at least partly in crystalline form. For this purpose, especially the above-described PVD process is suitable. Moreover, it is possible to use previously prepared organic semiconductor crystals. Suitable processes for obtaining such crystals are described by R.A. Laudise et al. in "Physical Vapor Growth of Organic Semi-Conductors", Journal of Crystal Growth 187 (1998), pages 449-454, and in "Physical Vapor Growth of Centimeter-sized Crystals of α-Hexathiophene", Journal of Crystal Growth 1982 (1997), pages 416-427.
- The compounds of the general formula (I.B) can also advantageously be processed from solution. In that case, at least one compound of the general formula (I.B) is applied to a substrate (and if appropriate further semiconductor materials), for example, by spin-coating.In addition, at least one compound of the formula (I.B) is applied to a substrate by solution shearing. This type of deposition is described e.g. in Adv. Mater. 2008, 20, 2588-2594. This includes the typical knife-coating methods such as airknife-coating, knife-coating, airblade-coating, squeeze-coating, roll-coating and kiss-coating. For this purpose, for example, a solution of the compound of the formula (I.B) is applied to a first substrate and then a second substrate is brought into contact with the solution. Then shear energy is introduced. According to a preferred embodiment, a small amount of a solution of at least one compound of the formula (I.B),e.g. a drop, is added on a substrate. The substrate temperatures range between room temperature and a temperature being 60 to 80% of the boiling point of the used solvent to control the solvent evaporation rate. Pulling the top wafer against the stationary wafer exerts a shearing force between wafers on the solution. The shearing speed is usually in the range from 0.01 to 0.5 mm/sec, preferably from 0.0866 to 0.1732 mm/sec. It may be advantageous to use a substrate having a hydrophobic surface. Suitable compounds for hydrophobizing substrate surfaces comprise alkyltrialkoxysilanes, such as n-octadecyltrimethoxysilane, n-octadecyltriethoxysilane, n-octadecyltri(n-propyl)-oxysilane or n-octadecyltri(isopropyl)oxysilane or phenyltrichlorosilane.
- In the case, that the compounds of the general formula (I.B) are processed from solution, the used solvent may have a low boiling point or a high boiling point. Suitable solvents are aromatic solvents such as toluene, xylene, mesitylene, naphthalene, decahydronaphthalene, octahydronaphthalene, chlorobenzene or dichlorobenzene, especially ortho-dichlorobenzene, or linear or cyclic ethers, e.g. tetrahydrofuran, diglycol methyl ether, or aromatic ethers such as diphenylether methoxybenzene, perfluoropolyethers such as HT-60 or HT 90 CT 135 (from Solvay, copolymers of perfluoroethyleneglycol, perfluoropropyleneglycol with CF3 radicals at the beginning and the end of the chain), C1-C6-alkylesters of C1-C6-carboxylic acids such as methyl acetate, ethyl acetate, propyl acetate, butyl acetate, methyl propionate, ethyl propionate, propyl propionate, butyl propionate and mixtures thereof. According to a preferred embodiment, a mixture of solvents is used, especially one, wherein the at least two solvents have different boiling points. Preferably the difference in the boiling points is greater than 30 °C.
- The compounds of the formula (I.B) are also suitable for producing semiconductor elements, especially OFETs, by a printing process. It is possible for this purpose to use customary printing processes (inkjet, flexographic, offset, gravure; intaglio printing, nanoprinting). Preferred solvents for the use of the compounds of the formula (I.B) in a printing process are aromatic solvents such as toluene, xylene, cyclic ethers such as dioxane, tetrahydrofuran, or linear ethers such as dimethoxyethane, ethylene glycol diethlyether, tert-butylmethylether etc. It is also possible to add thickening substances such as polymers, for example polystyrene, etc., to these "semiconductor inks". In this case, the dielectrics used are the aforementioned compounds.
- In a specific embodiment, the inventive field-effect transistor is a thin-film transistor (TFT). In a customary construction, a thin-film transistor has a gate electrode disposed on the substrate, a gate insulator layer disposed thereon and on the substrate, a semiconductor layer disposed on the gate insulator layer, an ohmic contact layer on the semiconductor layer, and a source electrode and a drain electrode on the ohmic contact layer.
- In a preferred embodiment, the surface of the substrate, before the deposition of at least one compound of the general formula (I.B) (and if appropriate of at least one further semiconductor material), is subjected to a modification. This modification serves to form regions which bind the semiconductor materials and/or regions on which no semiconductor materials can be deposited. The surface of the substrate is preferably modified with at least one compound (C1) which is suitable for binding to the surface of the substrate and to the compounds of the formula (I.B). In a suitable embodiment, a portion of the surface or the complete surface of the substrate is coated with at least one compound (C1) in order to enable improved deposition of at least one compound of the general formula (I.B) (and if appropriate further semiconductive compounds). A further embodiment comprises the deposition of a pattern of compounds of the general formula (C1) on the substrate by a corresponding production process. These include the mask processes known for this purpose and so-called "patterning" processes, as described, for example, in
US-2007-0190783-A1 . - Suitable compounds of the formula (C1) are capable of a binding interaction both with the substrate and with at least one semiconductor compound of the general formula (I.B). The term "binding interaction" comprises the formation of a chemical bond (covalent bond), ionic bond, coordinative interaction, van der Waals interactions, e.g. dipole-dipole interactions etc., and combinations thereof. Suitable compounds of the general formula (C1) are:
- silanes, phosphonic acids, carboxylic acids, hydroxamic acids, such as alkyltrichlorosilanes, e.g. n-octadecyltrichlorosilane; aryltrichlorosilanes, e.g. phenyltrichlorosilane; compounds with trialkoxysilane groups, e.g. alkyltrialkoxysilanes such as n-octadecyltrimethoxy-silane, n-octadecyltriethoxysilane, n-octadecyltri(n-propyl)oxysilane, n-octadecyltri(isopropyl)oxysilane; trialkoxyaminoalkylsilanes such as triethoxyaminopropylsilane and N-[(3-triethoxysilyl)propyl]ethylenediamine; trialkoxyalkyl 3-glycidyl ether silanes such as triethoxypropyl 3-glycidyl ether silane; trialkoxyallylsilanes such as allyltrimethoxysilane; trialkoxy(isocyanato-alkyl)silanes; trialkoxysilyl(meth)acryloyloxyalkanes and trialkoxysilyl(meth)-acrylamidoalkanes such as 1-triethoxysilyl-3-acryloyloxypropane.
- amines, phosphines and sulfur-comprising compounds, especially thiols.
- The compound (C1) is preferably selected from alkyltrialkoxysilanes, especially n-octadecyltrimethoxysilane, n-octadecyltriethoxysilane; phenyltrichlorosiliane; hexaalkyldisilazanes, and especially hexamethyldisilazane (HMDS); C8-C30-alkylthiols, especially hexadecanethiol; mercaptocarboxylic acids and mercaptosulfonic acids, especially mercaptoacetic acid, 3-mercaptopropionic acid, mercaptosuccinic acid, 3-mercapto-1-propanesulfonic acid and the alkali metal and ammonium salts thereof.
- Various semiconductor architectures comprising the inventive semiconductors are also conceivable, for example top contact, top gate, bottom contact, bottom gate, or else a vertical construction, for example a VOFET (vertical organic field-effect transistor), as described, for example, in
US 2004/0046182 . - The layer thicknesses are, for example, from 10 nm to 5 µm in semiconductors, from 50 nm to 10 µm in the dielectric; the electrodes may, for example, be from 20 nm to 1 µm thick. The OFETs may also be combined to form other components such as ring oscillators or inverters.
- A further aspect of the invention is the provision of electronic components which comprise a plurality of semiconductor components, which may be n- and/or p-semiconductors. Examples of such components are field-effect transistors (FETs), bipolar junction transistors (BJTs), tunnel diodes, converters, light-emitting components, biological and chemical detectors or sensors, temperature-dependent detectors, photodetectors such as polarization-sensitive photodetectors, gates, AND, NAND, NOT, OR, TOR and NOR gates, registers, switches, timer units, static or dynamic stores and other dynamic or sequential, logical or other digital components including programmable circuits.
- A specific semiconductor element is an inverter. In digital logic, the inverter is a gate which inverts an input signal. The inverter is also referred to as a NOT gate. Real inverter circuits have an output current which constitutes the opposite of the input current. Typical values are, for example, (0, +5V) for TTL circuits. The performance of a digital inverter reproduces the voltage transfer curve (VTC), i.e. the plot of input current against output current. Ideally, it is a staged function, and the closer the real measured curve approximates to such a stage, the better the inverter is. In a specific embodiment of the invention, the compounds of the formula (I.B) are used as organic n-type semiconductors in an inverter.
- The inventive compounds of the formula (I.B), are also suitable particularly advantageously for use in organic photovoltaics (OPV).
- Organic solar cells generally have a layer structure and generally comprise at least the following layers: anode, photoactive layer and cathode. These layers are generally situated on a substrate customary therefore. The structure of organic solar cells is described, for example, in
US 2005/0098726 andUS 2005/0224905 . - The invention further provides an organic solar cell comprising at least one compound of the formula I as defined above as a photoactive material.
- Suitable substrates for organic solar cells are, for example, oxidic materials (such as glass, ceramic, SiO2, in particular quartz, etc.), polymers (e.g. polyvinyl chloride, polyolefins such as polyethylene and polypropylene, polyesters, fluoropolymers, polyamides, polyurethanes, polyalkyl (meth)acrylates, polystyrene and mixtures and composites thereof) and combinations thereof.
- Suitable electrodes (cathode, anode) are in principle metals (preferably of
groups 8, 9, 10 or 11 of the Periodic Table, e.g. Pt, Au, Ag, Cu, Al, In, Mg, Ca), semiconductors (e.g. doped Si, doped Ge, indium tin oxide (ITO), gallium indium tin oxide (GITO), zinc indium tin oxide (ZITO), etc.), metal alloys (e.g. based on Pt, Au, Ag, Cu, etc., especially Mg/Ag alloys), semiconductor alloys, etc. One of the electrodes, e.g. theanode used is preferably a material essentially transparent to incident light. This includes, for example, ITO, doped ITO, ZnO, FTO (fluorine doped tin oxide), AZO (aluminum doped ZnO), TiO2, Ag, Au, Pt. The other electrode, e.g. the cathode used is preferably a material which essentially reflects the incident light. This includes, for example, metal films, for example of Al, Ag, Au, In, Mg, Mg/Al, Ca, etc. - The photoactive layer itself comprises at least one, or consists of at least one, layer which has been provided by a process according to the invention and comprises, as an organic semiconductor material, at least one compound of the formula la and/or Ib as defined above. In addition to the photoactive layer, there may be one or more further layers. These include, for example,
- layers with electron-conducting properties (ETLs, electron transport layers)
- layers which comprise a hole-conducting material (hole transport layer, HTL) which must not absorb,
- exciton- and hole-blocking layers (e.g. exciton blocking layers, EBLs) which should not absorb, and
- multiplication layers.
- Suitable exciton- and hole-blocking layers are described, for example, in
US 6,451,415 . - Suitable materials for exciton blocker layers are, for example, bathocuproin (BCP), 4,4',4"-tris[3-methyfphenyl-N-phenylamino]triphenylamine (m-MTDATA) or poly-ethylenedioxythiophene (PEDOT).
- The inventive solar cells may be based on photoactive donor-acceptor heterojunctions. Where at least one compound of the formula (I.B) is used as an HTM (hole transport material), the corresponding ETM (electron transport material) must be selected such that, after excitation of the compounds, a rapid electron transition to the ETM takes place. Suitable ETMs are, for example, C60 and other fullerenes, perylene-3,4:9,10-bis(dicarboximides) (PTCDI), etc. When at least one compound of the formula (I.B) is used as an ETM, the complementary HTM has to be selected such that, after excitation of the compound, a rapid hole transition to the HTM takes place. The heterojunction may have a flat (smooth) design (cf. Two layer organic photovoltaic cell, C. W. Tang, Appl. Phys. Lett., 48 (2), 183-185 (1986) or N. Karl, A. Bauer, J. Holzäpfel, J. Marktanner, M. Möbus, F. Stölzle, Mol. Cryst. Liq. Cryst., 252, 243-258 (1994)). The heterojunction may also be designed as a bulk heterojunction or interpenetrating donor-acceptor network (cf., for example, C. J. Brabec, N. S. Sariciftci, J. C. Hummelen, Adv. Funct. Mater., 11 (1), 15 (2001)).
- The compounds of the formula (I.B) may be used as a photoactive material in solar cells with MiM, pin, pn, Mip or Min structure (M = metal, p = p-doped organic or inorganic semiconductor, n = n-doped organic or inorganic semiconductor, i = intrinsically conductive system composed of organic layers; cf., for example, B. J. Drechsel et al., Org. Eletron., 5 (4), 175 (2004) or Maennig et al., Appl. Phys. A 79, 1-14 (2004)).
- The compounds of the formula (I.B) can also be used as photoactive material in tandem cells, as described by P. Peumans, A. Yakimov, S. R. Forrest in J. Appl. Phys, 93 (7), 3693-3723 (2003) (cf. patents
US 4,461,922 ,US 6,198,091 andUS 6,198,092 ). - The compounds of the formula (I.B) may also be used as photoactive material in tandem cells composed of two or more stacked MiM, pin, Mip or Min diodes (cf.
patent application DE 103 13 232.5 ) (J. Drechsel et al., Thin Solid Films, 451452, 515-517 (2004)). - The layer thicknesses of the M, n, i and p layers are typically from 10 to 1000 nm, preferably from 10 to 400 nm, more preferably from 10 to 100 nm. Thin layers can be produced by vapor deposition under reduced pressure or in inert gas atmosphere, by laser ablation or by solution- or dispersion-processible processes such as spin-coating, knife-coating, casting processes, spraying, dip-coating or printing (e.g. inkjet, flexographic, offset, gravure; intaglio printing, nanoimprinting).
- Suitable organic solar cells may, as mentioned above, comprise at least one inventive compound of the formula (I.B) as an electron donor (n-type semiconductor) or electron acceptor (p-semiconductor). In addition to the compounds of the general formula (I.B), the following semiconductor materials are suitable for use in organic photovoltaics:
- Phthalocyanines which are unhalogenated or halogenated. These include metal-free phthalocyanines or phthalocyanines comprising divalent metals or groups containing metal atoms, especially those of titanyloxy, vanadyloxy, iron, copper, zinc, etc. Suitable phthalocyanines are especially copper phthalocyanine, zinc phthalocyanine and metal-free phthalocyanine. In a specific embodiment, a halogenated phthalocyanine is used. These include:
- 2,6,10,14-tetrafluorophthalocyanines,
e.g. copper zinc - 1,5,9,13-tetrafluorophthalocyanines,
e.g. copper 1,5,9,13-tetrafluorophthalocyanine andzinc 1,5,9,13-tetrafluorophthalocyanine; - 2,3,6,7,10,11,14,15-octafluorophthalocyanine, e.g. copper
- 2,3,6,7,10,11,14,15-octafluorophthalocyanine and zinc
- 2,3,6,7,10,11,14,15-octafluorophthalocyanine; hexadecachlorophthalocyanines and hexadecafluorophthalocyanines, such as copper hexadecachlorophthalocyanine, zinc hexadecachlorophthalocyanine, metal-free hexadecachlorophthalocyanine, copper hexadecafluorophthalocyanine, or metal-free hexadefluorophthalocyanine.
- Porphyrins, for example 5,10,15,20-tetra(3-pyridyl)porphyrin (TpyP), or else tetrabenzoporphyrins, for example metal-free tetrabenzoporphyrin, copper tetrabenzoporphyrin or zinc tetrabenzoporphyrin. Especially preferred are tetrabenzoporphyrins which, like the compounds of the formula (I) used in accordance with the invention, are processed from solution as soluble precursors and are converted to the pigmentary photoactive component by thermolysis on the substrate.
- Acenes, such as anthracene, tetracene, pentacene, each of which may be unsubstituted or substituted. Substituted acenes preferably comprise at least one substituent which is selected from electron-donating substituents (e.g. alkyl, alkoxy, ester, carboxylate or thioalkoxy), electron-withdrawing substituents (e.g. halogen, nitro or cyano) and combinations thereof. These include 2,9-dialkylpentacenes and 2,10-dialkylpentacenes, 2,10-dialkoxypentacenes, 1,4,8,11-tetraalkoxypentacenes and rubrene (5,6,11,12-tetraphenylnaphthacene). Suitable substituted pentacenes are described in
US 2003/0100779 andUS 6,864,396 . A preferred acene is rubrene. - Liquid-crystalline (LC) materials, for example coronenes, such as hexabenzocoronene (HBC-PhC12), coronenediimides, or triphenylenes such as
- 2,3,6,7,10,11-hexahexylthiotriphenylene (HTT6),
- 2,3,6,7,10,11-hexakis(4-n-nonylphenyl)triphenylene (PTP9) or
- 2,3,6,7,10,11-hexakis(undecyloxy)triphenylene (HAT11). Particular preference is given to liquid-crystalline materials which are discotic.
- Thiophenes, oligothiophenes and substituted derivatives thereof; suitable oligothiophenes are quaterthiophenes, quinquethiophenes, sexithiophenes, α,ω-di(C1-C8)-alkyloligothiophenes, such as α,ω-dihexylquaterthiophene, α,ω-dihexylquinquethiophene and α,ω-dihexylsexithiophene, poly(alkylthiophenes), such as poly(3-hexylthiophene), bis(dithienothiophenes), anthradithiophenes and dialkylanthradithiophenes such as dihexylanthradithiophene, phenylene-thiophene (P-T) oligomers and derivatives thereof, especially α,ω-alkyl-substituted phenylene-thiophene oligomers.
- Also suitable are compounds of the α,α'-bis(2,2-dicyanovinyl)quinquethiophene (DCV5T) type, 3-(4-octylphenyl)-2,2'-bithiophene (PTOPT) type, poly(3-(4'-(1,4,7-trioxaoctyl)phenyl)thiophene) (PEOPT) type, poly(3-(2'-methoxy-5'-octylphenyl)thiophene) (POMeOPT) type, poly(3-octylthiophene) (P3OT) type, poly(pyridopyrazine-vinylene)-polythiophene blends, such as EHH-PpyPz, PTPTB copolymers, BBL copolymers, F8BT copolymers, PFMO copolymers; see Brabec C., Adv. Mater., 2996, 18, 2884, (PCPDTBT) poly[2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta[2,1 b;3,4 b']dithiophene)-4,7-(2,1,3-benzothiadiazole).
- Paraphenylenevinylene and oligomers or polymers comprising paraphenylenevinylene, for example polyparaphenylenevinylene, MEH-PPV (poly(2-methoxy-5-(2'-ethylhexyl-oxy)-1,4-phenylenevinylene), MDMO-PPV (poly(2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene)), PPV, CN-PPV (with various alkoxy derivatives).
- Phenyleneethynylene/phenylenevinylene hybrid polymers (PPE-PPV).
- Polyfluorenes and alternating polyfluorene copolymers, for example with 4,7-dithien-2'-yl-2,1,3-benzothiadiazole; also suitable are poly(9,9'-dioctylfluorene-co-benzothiadiazole) (F8BT), poly(9,9'-dioctylfluorene-co-bis-N,N'-(4-butylphenyl)bis-N,N'-phenyl-1,4-phenylenediamine (PFB).
- Polycarbazoles, i.e. oligomers and polymers comprising carbazole.
- Polyanilines, i.e. oligomers and polymers comprising aniline.
- Triarylamines, polytriarylamines, polycyclopentadienes, polypyrroles, polyfurans, polysiloles, polyphospholes, TPD, CBP, Spiro-MeOTAD.
- Fullerenes; in such cells, the fullerene derivative is a hole conductor.
- In the context of this application, the term "fullerene" refers to a material which is composed of carbon and has a regular, three-dimensional network of fused carbon rings. These may have spherical, cylindrical, ovoid, flattened or angular structures. Suitable fullerenes are, for example, C60, C70, C76, C80, C82, C84, C86, C90, C96, C120, single-walled carbon nanotubes (SWNT) and multi-walled carbon nanotubes (MWNT). Examples of fullerene derivatives are phenyl-C61-butyric acid methyl ester (PCBM), phenyl-C71-butyric acid methyl ester ([71]PCBM), phenyl-C84-butyric acid methyl ester ([84]PCBM), phenyl-C61-butyric acid butyl ester ([60]PCBB), phenyl-C61-butyric acid octyl ester ([60]PCBO) and thienyl-C61-butyric acid methyl ester([60]ThCBM). Particular preference is given to using C60 or PCBM (= [6,6]-phenyl-C61-butyric acid methyl ester).
- Particular preference is given to using, in organic solar cells, a combination of semiconductor materials which comprises at least one inventive compound and a halogenated phthalocyanine.
- Rylenes. In this context, the term "rylenes" generally refers to compounds having a molecular moiety composed of peri-linked naphthalene units. According to the number of naphthalene units, they may be perylenes (n=2), terrylenes (n=3), quaterrylenes (n=4) or higher rylenes. Accordingly, they may be perylenes, terrylenes or quaterrylenes of the following formula
- the Rn1, Rn2, Rn3 and Rn4 radicals, when n = from 1 to 4, may each independently be hydrogen, halogen or groups other than halogen,
- Y1 is O or NRa, where Ra is hydrogen or an organyl radical,
- Y2 is O or NRb, where Rb is hydrogen or an organyl radical,
- Z1, Z2, Z3 and Z4 are each O,
- where, in the case that Y1 is NRa, one of the Z1 and Z2 radicals may also be NRc, where the Ra and Rc radicals together are a bridging group having from 2 to 5 atoms between the flanking bonds, and
- where, in the case that Y2 is NRb, one of the Z3 and Z4 radicals may also be NRd, where the Rb and Rd radicals together are a bridging group having from 2 to 5 atoms between the flanking bonds.
- Suitable rylenes are described, for example, in
WO2007/074137 ,WO2007/093643 andWO2007/116001 (=PCT/EP2007/053330 - Particular preference is given to using, in organic solar cells, a combination of semiconductor materials which comprises at least one inventive compound of the formula (I.B).
- All aforementioned semiconductor materials may also be doped. In a specific embodiment, in the inventive organic solar cells, the compound of the formula (I.B) and/or (if present) a further semiconductor material different therefrom is thus used in combination with at least one dopant. Suitable dopants for use of the compounds (I.B) as n-type semiconductors are, for example, pyronin B and rhodamine derivatives.
- The invention further relates to an organic light-emitting diode (OLED) which comprises at least one compound of the formula (I.B).
- Organic light-emitting diodes are in principle formed from a plurality of layers. These include: 1. anode, 2. hole-transporting layer, 3. light-emitting layer, 4. electron-transporting layer and 5. cathode. It is also possible that the organic light-emitting diode does not have all of the layers mentioned; for example, an organic light-emitting diode comprising layers (1) (anode), (3) (light-emitting layer) and (5) (cathode) is likewise suitable, in which case the functions of layers (2) (hole-transporting layer) and (4) (electron-transporting layer) are assumed by the adjacent layers. OLEDs which have layers (1), (2), (3) and (5) or layers (1), (3), (4) and (5) are likewise suitable. The structure of organic light-emitting diodes and processes for their production are known in principle to those skilled in the art, for example from
WO 2005/019373 . Suitable materials for the individual layers of OLEDs are disclosed, for example, inWO 00/70655 - The invention is illustrated in detail with reference to the following nonrestrictive examples.
-
- 550 mg (1.63 mmol) of isomer-pure 2,6-dichloro-1,4,5,8-naphthalenetetracarboxylic dianhydride (prepared as described in J. Org. Chem. 2006, 71, 8098-8105) are added to 25 ml of acetic acid together with 1.62 g (6.52 mmol) of 1H,1H-perfluoropentylamine and heated to 140°C for one hour. Thereafter, the acetic acid is removed under reduced pressure and the solids are washed several times with methanol. In order to remove excess reactant, the product is boiled with 2% NaHCO3 solution and the undissolved solids are purified by column chromatography (THF). 420 mg (32%) of a yellowish solid are obtained.
- The purification is effected by three-zone gradient sublimation, the zones being at 200°C, 150°C and 116°C. From a loading of 300 mg, 157 mg of sublimed product are obtained.
- The UV-vis spectrum of compound of example 4.3 in ortho-dichlorobenzene showed no absorption in the wavelength range above 450 nm.
- The title compound showed a toluene solubility of 1 % by weight at room temperature and a tetrahydrofuran solubility of 3% by weight at room temperature.
-
- The synthesis was effected as described in example 1, except that 1H,1H-perfluorobutylamine was used. The compound was purified by sublimation using a three zone furnace at 180, 130 and 100°C. Starting from 302 mg of the title compound, 177 mg of purified product were obtained.
- The UV-vis spectrum of the compound of example 2 in ortho-dichlorobenzene showed no absorption in the wavelength range above 450 nm.
- The title compound showed a toluene solubility of 0.8% by weight at room temperature and a tetrahydrofuran solubility of 1.5% by weight at room temperature.
-
- A mixture of 25 ml of N-methylpyrrolidone (NMP), 3 ml of acetic acid, 2.68 g (0.01 mol) of 1,4,5,8-naphthalenetetracarboxylic dianhydride and 0.05 mol 1H,1H-perfluoroalkylamine were heated at 90°C for 5 hours. Subsequently, the reaction mixture was poured onto 100 ml of diluted hydrochloric acid, filtrated and washed several times with about 50 ml of water and then with ethanol followed by drying at 70°C under reduced pressure. The crude products may be purified by crystallization from dichloromethane. The title compounds were obtained in a yield of 65 to 90%.
-
- The product obtained under example 3 (about 3.0 to 5.0 g) in chlorosulfonic acid (50 ml) was admixed with iodine (1.0 g) and heated. At a temperature of 85°C, 1 bar of chlorine was introduced into the reaction mixture over a period of 8 to 16 hours, the chlorine gas being introduced under the surface of the solution. The course of the reaction was monitored by DC. After cooling to room temperature, the reaction mixture is added to water. The solid which precipitates out is filtered off and washed with water and dried under reduced pressure. The yield of the title compound ranges from 62 to 98% with a purity of about 90 % (DC). The title compounds were purified by crystallisation from toluene and/or dichloromethane or by column chromatography.
- The compounds can be further purified by sublimation using a three zone furnace. For example:
- compound of example 4.3: sublimation at 200, 140 and 100°C;
- compound of example 4.4: sublimation at 230, 160 and 100°C. Starting from 591 mg of compound of example 4.4, 436 mg of sublimated compound were obtained.
- The UV-vis spectrum of the compound of example 4.3 in ortho-dichlorobenzene showed no absorption in the wavelength range above 450 nm.
- Toluene and tetrahydrofuran (THF) solubilities for title compounds with n = 1, 2, 3 and 4 were determined at room temperature.
Ex. n toluene solubility in % by weight THF solubility in % by weight 4.1 1 1 4 4.2 2 2 4 4.3 3 2 4 4.4 4 1.5 4 - All performance tests were carried out with compounds purified by gradient sublimation.
- Highly doped n-type (100) silicon wafers (conductivity < 0.004 Ω-1cm) were used as substrates for the devices. SiO2 layer (unit area capacitance Ci = 10 nF/cm2) as gate dielectric were thermally grown to 3000 Å thickness onto the Si substrates. The SiO2/Si substrates were then cleaned with a piranha solution (a 7:3 mixture of H2SO4 and H2O2 by vol%) for 30 min, rinsed with deionized water and dried using a nitrogen gun, the SiO2/Si water were subsequently treated with UV-ozone plasma (Jetlight UVO-cleaner Model 42 - 100V) for 20 min. Organic semiconductor thin films (45 nm) were vapor-deposited onto the Si/SiO2 substrates held at well-defined temperatures (see table 1) with a deposition rate in the range from 0.2 to 0.3 Å/s and a pressure of 10-6 torr employing a vacuum deposition chamber (Angstrom Engineering Inc., Canada). Thin film transistors in top-contact configuration were used to measure the charge mobility of the materials. Gold source and drain electrodes (typical channel length were 100 µm with width/length ratios about 20) were vapor-deposited through a shadow mask. The current-voltage (I-V) characteristics of the devices were measured using Keithley 4200-SCS semiconductor parameter analyzer. Key device parameters, such as charge carrier mobility (µ), threshold voltage (VT) and on-to-off current ratio (Ion/Ioff) were extracted from the source-drain current (Id) vs. gate voltage (Vg) characteristics employing standard procedures. The mobility was determined in the saturation regime from the slope of plots of (IDS)1/2 versus VG.
- After the cleaning of the SiO2-coated wafer, the SiO2/Si substrates were spin-coated with a 3 mM solution of octadecyltrimethoxysilane (OTS) in trichloroethylene, then placed in an environment saturated with ammonia vapor for 12 h, followed by sonication cleaning, sequential washing and drying. Finally, the organic semiconductor was vacuum-deposited as described above.
Table 1: Field field-effect mobilities (µ), on/off ratios (Ion/Ioft), and threshold voltages (Vt) for compounds of formula (I.B) at various substrate temperatures (Tsub) measured in nitrogen atmosphere Compound from example Tsub [°C] Substrate In N2 atmosphere µ (cm2V-1s-1)a I on/I off Vt (V) 1 70 OTS 1.12 ± 0.10 (1.26)b (2.2 ± 0.9) × 107 15 ± 2 2 50 OTS 0.65 ± 0.16 (0.85) (2.2 ± 0.8) × 106 29 ± 4 50 Bare 0.70 ± 0.09 (0.86) (5.3 ± 1.3) × 105 20 ± 1 aThe average values obtained for at least 3 devices. b the maximum mobility recorded. Table 2: Field field-effect mobilities (µ), on/off ratios (Ion/Ioff), and threshold voltages (Vt) for compounds of formula (I.B) at various substrate temperatures (Tsub) measured in ambient air Compound from example Tsub [°C] Substrate In ambient air µ (cm2V-1s-1)a I on/I off V t (V) 1 70 OTS 1.32 ± 0.10 (1.43)b (5.3 ± 0.6) × 107 23 ± 2 2 50 OTS 0.61 ± 0.15 (0.80) (1.9 ± 0.9) × 106 39 ± 4 50 Bare 0.75 ± 0.13 (0.91) (3.8 ± 1.7) × 106 25 ± 2 aThe average values obtained for at least 3 devices. b the maximum mobility recorded. - Highly doped n-type Si (100) wafers (<0.004 Ω cm) were used as substrates. A 300 nm SiO2 layer (capacitance per unit area Ci = 10 nF/cm2) as a gate dielectric was thermally grown onto the Si substrates. These wafers were cleaned in piranha solution, a 7:3 mixture of H2SO4 and H2O2 by volume, rinsed with deionized water, and then dried by N2. The phenyltrichlorosilane (PTS)-treated surface on SiO2/Si substrates were obtained by the following procedures: a cleaning SiO2/Si substrate was immersed into a 3 wt% solution of PTS in toluene at 80°C for overnight. Then, the substrates were rinsed with toluene, acetone, isopropanol, and dried with a steam of nitrogen. The contact angle of the PTS-treated SiO2/Si substrates was approximately 70°C. The organic semiconductor thin films were deposited on SiO2/Si substrates through solution-sheared methods. Solution-sheared thin films were prepared as described below: After drying these samples overnight at 70°C, 40 nm gold contacts were evaporated onto the films to fabricate devices with a 50 µm channel length (L), and a W/L ratio of approximately 20. The OTFT transfer and output characteristics were recorded in a N2-filled glove box by using a Keithley 4200 semiconductor parametric analyzer (Keithley Instruments, Cleveland OH). For air-stability, the samples were also monitored as functions of time after exposing in air. If not stated to contrary, the devices have channel length parallel to the shearing direction.
- The compounds were dissolved in ortho-dichlorobenzene (5 or 10 mg ml-1) and the solution was dropped on the wafer substrate placed on a hot spot. A hydrophobic SiO2/Si wafer treated with PTS was placed on top of the solution drop. The top wafer was pulled over at a constant rate to apply shear on the solution. Shearing rate: 0.0086 mm/s; temperature: 126°C.
Table 3: Electric properties of compounds of formula (I.B) deposited by the solution-sheared method (solvent: ortho-dichlorobenzene) Compound from example Tsub[°C] Maximum mobility [cm2V-1s-1] Mobility [cm2V-1s-1] Average On/off Vt (V) 1 126 6.50 x 10-2 (4.50±2.16) x10-2 1.92 x 105 -36 ± 13 2 126 2.16 × 10-1 (1.73 ±0.60) x 10-1 2.65 x 105 -23 ± 10 4.3 126 3.99 x 10-2 (2.20±1.20) x 10-2 1.03 x 105 2 ± 3 4.4 126 5.66 x 10-2 (3.66 ± 0.56) x 10-2 2.28 x 104 39 ± 4 Tsub = T substrate - The average values were obtained from at least 4 devices.
- The air-stability testing of the studied molecules was monitored by measuring mobility, on/off ratios, and threshold voltages (Vt) as a function of time. The fluctuations of the electric properties of the OTFTs in air are often attributed to the influences of the relative humidity. The average mobility of 1, 2 and 4.3 decreased slightly from 4.50×10-2, 1.73×10-1, 2.20×10-2 to 1.88×10-2, 1.09×10-1, 8.63×10-3 cm-2V-1s-1 respectively, after exposure to air for one and a half months. The fluctuations of the electric properties of OTFTs fabricated by solution-sheared deposition of the compound of example 2 in air depending on the relative humidity for a time of 50 days is shown in
Figures 1a (mobility) andFigure 1b (on/off).Figure 1c shows the correlation between threshold voltage and the time (50 days) in air. In thefigures 1a, 1b and1c , the black filled circle at each occurrence corresponds to an electrical performance in a nitrogen glove box and RH means relative humidity.
where, in the case that Y2 is NRb and at least one of the Z3 and Z4 radicals is NRd, Rb with an Rd radical may also together be a bridging group having from 2 to 5 atoms between the flanking bonds,
and the use thereof as n-semiconductors in organic field-effect transistors.
Claims (14)
- The use of compounds of the general formula (I.B)at least two of the R1, R2, R3 and R4 radicals are Cl and the remaining radicals are hydrogen,Ra and Rb are each independently 1H,1H-perfluoro-C2-C30-alkyl, 1H,1H,2H,2H-perfluoro-C3-C30-alkyl or straight-chain alkyl or branched C3-C30-alkyl.as n-semiconductors in organic field-effect transistors or as charge transport material and/or exciton transport material in solar cells.
- The use according to claims 1, wherein R1 and R3 are each chlorine.
- The use according to claims 1, wherein R1 and R4 are each chlorine.
- The use according to claims 1, wherein R1, R2 and R3 are each chlorine.
- The use according to claims 1, wherein R1, R2, R3 and R4 are each chlorine.
- The use according to any one of the preceding claims, as exciton transport material in excitonic solar cells.
- An organic field-effect transistor comprising a substrate with at least one gate structure, a source electrode and a drain electrode, and at least one compound of the formula (I.B) as defined in any one of claims 1 to 5 as an n-type semiconductor.
- A substrate comprising a multitude of organic field-effect transistors, wherein at least some of the field-effect transistors comprise at least one compound of the formula (I.B) as defined in any one of claims 1 to 5 as an n-semiconductor.
- A semiconductor unit comprising at least one substrate as defined in claim 8.
- An organic solar cell comprising at least one compound of the formula (I.B) as defined in any one of claims 1 to 5.
- A compound of the formula (I.Ba), wherein R1 and R4 are each Cl and R2 and R3 are each hydrogen
- A process for preparing compounds of the formula (I.B)R1 and R4 are each Cl and R2 and R3 are each hydrogen or
R1 and R3 are each Cl and R2 and R4 are each hydrogen, or
R1, R2 and R3 are each Cl and R4 is hydrogen, or
R1, R2, R3 and R4 are each Cl,Ra and Rb are each independently hydrogen or unsubstituted or substituted alkyl, cycloalkyl, bicycloalkyl, heterocycloalkyl, chlorinated aryl or chlorinated hetaryl,in whicha2) naphthalene-1,8:4,5-tetracarboxylic dianhydride is subjected to a reaction with an amine of the formula Ra-NH2 and if appropriate an amine of the formula Rb-NH2 to obtain a compound of the formula (D)b2) the compound obtained in step a2) is subjected to a chlorination by reaction with chlorine in the presence of iodine as a catalyst. - The process as claimed in claim 13, wherein the chlorination of the compound of the formula (D) in step b2) is brought about by reaction with chlorine in chlorosulfonic acid and in the presence of catalytic amounts of iodine.
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US20090301552A1 (en) | 2009-12-10 |
TWI480280B (en) | 2015-04-11 |
CN102057015A (en) | 2011-05-11 |
US20170174676A1 (en) | 2017-06-22 |
JP2011522097A (en) | 2011-07-28 |
EP2297274A1 (en) | 2011-03-23 |
JP5496189B2 (en) | 2014-05-21 |
CN102057015B (en) | 2015-07-22 |
KR20110015454A (en) | 2011-02-15 |
WO2009147237A1 (en) | 2009-12-10 |
TW201002709A (en) | 2010-01-16 |
US9512354B2 (en) | 2016-12-06 |
US10214525B2 (en) | 2019-02-26 |
WO2009147237A9 (en) | 2010-01-28 |
KR101702487B1 (en) | 2017-02-06 |
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