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DK1979764T3 - Fremgangsmåde til måling af lysets løbetid - Google Patents

Fremgangsmåde til måling af lysets løbetid

Info

Publication number
DK1979764T3
DK1979764T3 DK07702886.8T DK07702886T DK1979764T3 DK 1979764 T3 DK1979764 T3 DK 1979764T3 DK 07702886 T DK07702886 T DK 07702886T DK 1979764 T3 DK1979764 T3 DK 1979764T3
Authority
DK
Denmark
Prior art keywords
signal
light
filter
mixed
common received
Prior art date
Application number
DK07702886.8T
Other languages
English (en)
Inventor
Gerd Reime
Peter Langer
Bernd Mayer
Original Assignee
Mechaless Systems Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mechaless Systems Gmbh filed Critical Mechaless Systems Gmbh
Application granted granted Critical
Publication of DK1979764T3 publication Critical patent/DK1979764T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
    • G01S17/36—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated with phase comparison between the received signal and the contemporaneously transmitted signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4816—Constructional features, e.g. arrangements of optical elements of receivers alone

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Measurement Of Optical Distance (AREA)
  • Optical Communication System (AREA)
DK07702886.8T 2006-01-24 2007-01-19 Fremgangsmåde til måling af lysets løbetid DK1979764T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006003269A DE102006003269A1 (de) 2006-01-24 2006-01-24 Verfahren zur Lichtlaufzeitmessung
PCT/EP2007/000454 WO2007085382A1 (de) 2006-01-24 2007-01-19 Verfahren zur lichtlaufzeitmessung

Publications (1)

Publication Number Publication Date
DK1979764T3 true DK1979764T3 (da) 2012-07-23

Family

ID=37905834

Family Applications (1)

Application Number Title Priority Date Filing Date
DK07702886.8T DK1979764T3 (da) 2006-01-24 2007-01-19 Fremgangsmåde til måling af lysets løbetid

Country Status (9)

Country Link
US (1) US8643827B2 (da)
EP (1) EP1979764B8 (da)
JP (1) JP2009524072A (da)
KR (1) KR101266687B1 (da)
AT (1) ATE555398T1 (da)
DE (1) DE102006003269A1 (da)
DK (1) DK1979764T3 (da)
ES (1) ES2383544T3 (da)
WO (1) WO2007085382A1 (da)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7945408B2 (en) * 2007-09-20 2011-05-17 Voxis, Inc. Time delay estimation
WO2012073378A1 (ja) * 2010-12-03 2012-06-07 ジックオプテックス株式会社 光波測距装置
EP2631674A1 (de) * 2012-02-23 2013-08-28 ELMOS Semiconductor AG Verfahren und Sensorsystem zur Vermessung der Eigenschaften einer Übertragungsstrecke eines Messsystems zwischen Sender und Empfänger
EP2653885A1 (de) * 2012-04-18 2013-10-23 ELMOS Semiconductor AG Sensorsystem und Verfahren zur Vermessung der Übertragungseigenschaften einer Übertragungsstrecke eines Messsystems zwischen einem Sender und einem Empfänger
WO2014131385A1 (de) * 2013-02-27 2014-09-04 Elmos Semiconductor Ag Multifunktionales optisches mikro-sensor-system
US9300397B2 (en) 2013-02-27 2016-03-29 Elmos Semiconductor Ag Multifunctional optical micro sensor system
WO2015140610A1 (en) 2014-03-20 2015-09-24 Ariel-University Research And Development Company Ltd. Method and system for controlling phase of a signal
EP3036561B1 (de) 2013-08-22 2018-01-31 Elmos Semiconductor Aktiengesellschaft Störkompensierte vorrichtung zur vermessung einer optischen signalübertragungsstrecke
DE102014012158A1 (de) 2013-09-12 2015-03-12 Mechaless Systems Gmbh Gestenerkennungsverfahren und Gestenerkennungsvorrichtung
DE102015002283B4 (de) 2014-05-09 2023-01-19 Elmos Semiconductor Se Vorrichtung zum insbesondere dreidimensionalen optischen Scannen und Vermessen von Objekten und zur Objekterkennung mittels Lichtlaufzeitmessung und objektabhängiger Ortsauflösung mehrerer verschiedener Einzelscanner
DE102014019172B4 (de) 2014-12-17 2023-12-07 Elmos Semiconductor Se Vorrichtung und Verfahren zur Unterscheidung von festen Objekten, Kochdunst und Rauch mit einem kompensierenden optischen Messsystem
DE102014019773B4 (de) 2014-12-17 2023-12-07 Elmos Semiconductor Se Vorrichtung und Verfahren zur Unterscheidung von festen Objekten, Kochdunst und Rauch mittels des Displays eines Mobiltelefons
JP7242183B2 (ja) * 2015-06-03 2023-03-20 ヘプタゴン・マイクロ・オプティクス・プライベート・リミテッド 距離測定を行うための動作可能な光電子モジュール
WO2017060908A1 (en) 2015-10-08 2017-04-13 Ariel-University Research And Development Company Ltd. Method and system for controlling phase of a signal
DE102015015246A1 (de) 2015-11-18 2017-05-18 Elmos Semiconductor Aktiengesellschaft Einfache Gestenerkennungsvorrichtung
DE102015015244A1 (de) 2015-11-18 2017-05-18 Elmos Semiconductor Aktiengesellschaft Einfache Gestenerkennungsvorrichtung
DE102015015248A1 (de) 2015-11-18 2017-05-18 Elmos Semiconductor Aktiengesellschaft Einfache Gestenerkennungsvorrichtung
DE102015015389A1 (de) 2015-11-18 2017-05-18 Elmos Semiconductor Ag Einfache Gestenerkennungsvorrichtung
DE102015015245A1 (de) 2015-11-18 2017-05-18 Elmos Semiconductor Aktiengesellschaft Einfache Gestenerkennungsvorrichtung
DE102015015390A1 (de) 2015-11-18 2017-05-18 Elmos Semiconductor Ag Einfache Gestenerkennungsvorrichtung

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3788741A (en) * 1972-07-26 1974-01-29 Syst Res Labor Inc Distance indicating optical probe
EP0613653B1 (en) * 1990-02-15 1996-11-13 Hewlett-Packard GmbH Method for non-invasive measurement of oxygen saturation
DE19902612A1 (de) 1999-01-23 2000-07-27 Zeiss Carl Fa Optoelektronischer Mischer
US6307622B1 (en) * 1999-02-17 2001-10-23 Infineon Technologies North America Corp. Correlation based optical ranging and proximity detector
DE10006493C2 (de) * 2000-02-14 2002-02-07 Hilti Ag Verfahren und Vorrichtung zur optoelektronischen Entfernungsmessung
DE10300223B3 (de) 2003-01-03 2004-06-24 Gerd Reime Optoelektronische Messanordnung mit Fremdlichtkompensation sowie Verfahren zur phasenkorrekten Kompensation eines Signals der Messanordnung
DE10322552A1 (de) * 2003-05-20 2004-12-30 Gerd Reime Verfahren und Vorrichtung zum Messen eines modulierten Lichtsignals
JP2005091214A (ja) 2003-09-18 2005-04-07 Nec Viewtechnology Ltd 距離測定装置
DE10350489B4 (de) 2003-10-29 2005-10-13 Leuze Electronic Gmbh & Co Kg Optischer Sensor
US7218402B1 (en) * 2003-12-04 2007-05-15 Northrop Grumman Corporation Wavefront sensor using hybrid optical/electronic heterodyne techniques

Also Published As

Publication number Publication date
JP2009524072A (ja) 2009-06-25
US8643827B2 (en) 2014-02-04
KR101266687B1 (ko) 2013-05-28
ATE555398T1 (de) 2012-05-15
ES2383544T3 (es) 2012-06-22
KR20080091373A (ko) 2008-10-10
EP1979764B1 (de) 2012-04-25
US20120176596A1 (en) 2012-07-12
EP1979764A1 (de) 2008-10-15
WO2007085382A1 (de) 2007-08-02
DE102006003269A1 (de) 2007-07-26
EP1979764B8 (de) 2012-06-06

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