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DE60040128D1 - Optischer mikro-ausleger, herstellungsverfahren für einen solchen und mikro-ausleger-halter - Google Patents

Optischer mikro-ausleger, herstellungsverfahren für einen solchen und mikro-ausleger-halter

Info

Publication number
DE60040128D1
DE60040128D1 DE60040128T DE60040128T DE60040128D1 DE 60040128 D1 DE60040128 D1 DE 60040128D1 DE 60040128 T DE60040128 T DE 60040128T DE 60040128 T DE60040128 T DE 60040128T DE 60040128 D1 DE60040128 D1 DE 60040128D1
Authority
DE
Germany
Prior art keywords
microbucket
microbox
holder
optical
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60040128T
Other languages
English (en)
Inventor
Takashi Niwa
Kenji Kato
Susumu Ichihara
Norio Chiba
Yasuyuki Mitsuoka
Manabu Oumi
Nobuyuki Kasama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Application granted granted Critical
Publication of DE60040128D1 publication Critical patent/DE60040128D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G01Q60/06—SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optical Couplings Of Light Guides (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Optical Integrated Circuits (AREA)
  • Optical Head (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE60040128T 1999-03-17 2000-03-06 Optischer mikro-ausleger, herstellungsverfahren für einen solchen und mikro-ausleger-halter Expired - Fee Related DE60040128D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP7221899 1999-03-17
JP2000040030A JP2000329677A (ja) 1999-03-17 2000-02-17 光マイクロカンチレバーとその製造方法および光マイクロカンチレバーホルダ
PCT/JP2000/001361 WO2000055597A1 (en) 1999-03-17 2000-03-06 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder

Publications (1)

Publication Number Publication Date
DE60040128D1 true DE60040128D1 (de) 2008-10-16

Family

ID=26413352

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60040128T Expired - Fee Related DE60040128D1 (de) 1999-03-17 2000-03-06 Optischer mikro-ausleger, herstellungsverfahren für einen solchen und mikro-ausleger-halter

Country Status (5)

Country Link
US (4) US6834537B1 (de)
EP (2) EP1975598A3 (de)
JP (1) JP2000329677A (de)
DE (1) DE60040128D1 (de)
WO (1) WO2000055597A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4094229B2 (ja) * 1998-11-09 2008-06-04 セイコーインスツル株式会社 近視野光ヘッドおよびその製造方法
JP2000329677A (ja) * 1999-03-17 2000-11-30 Seiko Instruments Inc 光マイクロカンチレバーとその製造方法および光マイクロカンチレバーホルダ
JP2002005810A (ja) * 2000-06-16 2002-01-09 Canon Inc プローブ及びその製造方法、表面観察装置、露光装置、情報処理装置
JP3817498B2 (ja) * 2002-06-14 2006-09-06 キヤノン株式会社 近接場光用の探針を有するプローブの製造方法
US20050262923A1 (en) * 2004-05-27 2005-12-01 Lawrence Kates Method and apparatus for detecting conditions favorable for growth of fungus
WO2006001108A1 (ja) * 2004-06-25 2006-01-05 Japan Science And Technology Agency 探針装置
JP5172331B2 (ja) * 2005-03-31 2013-03-27 独立行政法人科学技術振興機構 走査型プローブ顕微鏡用カンチレバー及びそれを具備する走査型プローブ顕微鏡
EP1913393A4 (de) * 2005-06-16 2010-03-03 Univ California Paralleler allergietest auf immunbasis im grossmassstab und vorrichtung zur fluoreszenzanregung mit evaneszenzfeld
US20080011058A1 (en) * 2006-03-20 2008-01-17 The Regents Of The University Of California Piezoresistive cantilever based nanoflow and viscosity sensor for microchannels
US7665364B2 (en) * 2006-03-21 2010-02-23 Ut-Battelle, Llc Method and apparatus for remote sensing of molecular species at nanoscale utilizing a reverse photoacoustic effect
KR100851973B1 (ko) * 2006-11-02 2008-08-12 삼성전자주식회사 굽은 도파로, 이의 제조방법, 굽은 도파로를 이용한 광전송모듈 및 굽은 도파로를 채용한 열보조 자기기록 헤드
JP2008175651A (ja) * 2007-01-17 2008-07-31 Gunma Univ 近接場光探針、光学装置、プローブ顕微鏡、及びプローブ顕微鏡型記録再生ヘッド装置
US8191403B2 (en) * 2007-03-27 2012-06-05 Richmond Chemical Corporation Petroleum viscosity measurement and communication system and method
EP2477038A1 (de) * 2011-01-14 2012-07-18 Centre National de la Recherche Scientifique Herstellung einer optischen Nahfeldsonde mittels Organomineralmaterial und Sol-Gel-Verfahren
GB201105100D0 (en) * 2011-03-28 2011-05-11 Ucl Business Plc A stress relief interlayer for functional coatings on micromechanical devices
DE102011079447A1 (de) 2011-07-20 2013-01-24 Robert Bosch Gmbh Vorrichtung zur taktilen Formbestimmung
CN102809672A (zh) * 2012-08-06 2012-12-05 中国科学院化学研究所 超分辨共聚焦光学显微镜与扫描探针显微镜联用系统
US20150338627A1 (en) * 2014-05-22 2015-11-26 Multiprobe, Inc. Apparatus and method for atomic force, near-field scanning optical microscopy
US9329203B1 (en) * 2015-04-27 2016-05-03 The United States Of America, As Represented By The Secretary Of The Navy Ultra-sharp nanoprobes and methods
CN109406386B (zh) * 2017-10-30 2020-10-23 西南交通大学 超低摩擦系数测量用异形截面悬臂梁探针设计及加工方法
CN109827904A (zh) * 2019-03-19 2019-05-31 安徽理工大学 一种基于微悬臂梁传感器的反应池装置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0455802A (ja) * 1990-06-25 1992-02-24 Victor Co Of Japan Ltd 光集積回路の製造方法
IL97362A0 (en) * 1991-02-26 1992-08-18 Aaron Lewis Method for external excitation of subwavelength light sources that is integrated into feedback methodologies
JP2762792B2 (ja) * 1991-08-30 1998-06-04 日本電気株式会社 光半導体装置
JP3074357B2 (ja) * 1991-10-03 2000-08-07 セイコーインスツルメンツ株式会社 微細表面観察装置
JP3018787B2 (ja) * 1992-10-26 2000-03-13 松下電器産業株式会社 光導波路の製造方法
JP2704601B2 (ja) * 1993-04-12 1998-01-26 セイコーインスツルメンツ株式会社 走査型近視野原子間力顕微鏡、及びその顕微鏡に使用されるプローブ、及びそのプローブの製造方法
DE69434641T2 (de) * 1993-04-13 2006-12-14 Agilent Technologies, Inc., Palo Alto Elektrooptisches Messinstrument
JP3213436B2 (ja) * 1993-05-24 2001-10-02 シャープ株式会社 光プローブ素子、光プローブ素子を用いた記録再生装置、および光プローブ素子の製造方法
JPH0717452A (ja) 1993-06-30 1995-01-20 Mori San Tour:Kk 自転車用ディレーラ
GB2294759A (en) * 1993-07-22 1996-05-08 British Tech Group Intelligent sensor for near field optical device
IL106613A0 (en) * 1993-08-08 1993-12-08 Klony S Lieberman Device and method for probe microscopy
JP3317001B2 (ja) * 1994-03-16 2002-08-19 富士通株式会社 プローブ製造方法
JPH08334521A (ja) * 1995-06-08 1996-12-17 Olympus Optical Co Ltd 集積型ｓｐｍセンサ及び走査型プローブ顕微鏡
JPH0943132A (ja) * 1995-07-27 1997-02-14 Fujitsu Ltd パーティクル計測装置
JP3208312B2 (ja) * 1995-11-30 2001-09-10 シャープ株式会社 テーパ導波路及びその製造方法
JP3260619B2 (ja) * 1996-03-19 2002-02-25 セイコーインスツルメンツ株式会社 光導波路プロ−ブおよび光システム
JP2903211B2 (ja) * 1996-04-09 1999-06-07 セイコーインスツルメンツ株式会社 プローブとプローブ製造方法及び走査型プローブ顕微鏡
JP3260644B2 (ja) * 1996-12-10 2002-02-25 セイコーインスツルメンツ株式会社 カンチレバーおよびその製造方法
DE19713746C2 (de) * 1997-04-03 2001-06-28 Inst Mikrotechnik Mainz Gmbh Sensor für gleichzeitige Rasterkraftmikroskopie und optische Nahfeldmikroskopie
DE29713746U1 (de) 1997-08-01 1997-11-13 CDE Commerce Display Norbert Eichler GmbH, 22525 Hamburg Sockel für Verkaufsaufsteller
EP1705475B1 (de) * 1997-12-15 2012-08-15 Seiko Instruments Inc. Optische Wellenleitersonde und deren Herstellungsverfahren.
JP3862845B2 (ja) * 1998-02-05 2006-12-27 セイコーインスツル株式会社 近接場用光プローブ
JP2000329677A (ja) * 1999-03-17 2000-11-30 Seiko Instruments Inc 光マイクロカンチレバーとその製造方法および光マイクロカンチレバーホルダ
JP2002296169A (ja) * 2001-03-30 2002-10-09 Canon Inc 近接場光プローブ、及び該近接場光プローブを有する近接場光学顕微鏡、近接場光リソグラフィー装置、近接場光ストレージ装置

Also Published As

Publication number Publication date
US20070062266A1 (en) 2007-03-22
EP1089066A4 (de) 2005-06-22
EP1089066B1 (de) 2008-09-03
WO2000055597A1 (en) 2000-09-21
EP1975598A3 (de) 2009-09-30
US20050039523A1 (en) 2005-02-24
JP2000329677A (ja) 2000-11-30
US20070211986A1 (en) 2007-09-13
US7496250B2 (en) 2009-02-24
US6834537B1 (en) 2004-12-28
US7240541B2 (en) 2007-07-10
EP1975598A2 (de) 2008-10-01
EP1089066A1 (de) 2001-04-04
US7150185B2 (en) 2006-12-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee