CN221840470U - Sensor wide-pressure testing device - Google Patents
Sensor wide-pressure testing device Download PDFInfo
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- CN221840470U CN221840470U CN202420496554.4U CN202420496554U CN221840470U CN 221840470 U CN221840470 U CN 221840470U CN 202420496554 U CN202420496554 U CN 202420496554U CN 221840470 U CN221840470 U CN 221840470U
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Abstract
The utility model discloses a sensor wide-voltage testing device which comprises a logic processing circuit, a digital voltage regulation control circuit, a switching value signal acquisition circuit, a voltage reduction circuit and a sensor power supply control signal input circuit. The utility model can supply 0-48V adjustable direct current power supply to the sensor by arranging the digital voltage regulating control circuit, the switching value signal acquisition circuit can acquire the output signals of the NPN sensor and the PNP sensor, the logic processing circuit is used for judging the working state of the sensor and simultaneously controlling the voltage value output by the digital voltage regulating control circuit, and the voltage reducing circuit can provide stable 5V voltage for the whole device, so that the voltage range and the overvoltage protection threshold value of different types of sensors can be accurately detected by the arrangement.
Description
Technical Field
The utility model relates to the technical field of sensors, in particular to a wide pressure testing device for a sensor.
Background
The working voltage range is one of indexes of the working performance of the sensor, the sensor with wide-voltage input can be suitable for wider use occasions, and a working power supply usually has three scenes of DC9V, DC12 and V, DC V. Meanwhile, in order to prevent the sensor from being damaged by excessive voltage, an overvoltage protection circuit is added in the design of the sensor, and the overvoltage protection performance is one of important indexes of the sensor. Therefore, the sensor needs to detect the voltage range and the overvoltage protection threshold value when leaving the factory, and therefore, we propose a sensor wide-voltage testing device.
Disclosure of utility model
The utility model aims to provide a sensor wide-pressure testing device which aims to solve the problems in the background technology.
In order to achieve the above purpose, the present utility model provides the following technical solutions: a sensor wide-voltage testing device comprises a logic processing circuit, a digital voltage regulation control circuit, a switching value signal acquisition circuit, a voltage reduction circuit and a sensor power supply control signal input circuit;
The output end of the switching value signal acquisition circuit is connected with the input end of the logic processing circuit, the output end of the logic processing circuit is electrically connected with the input end of the digital voltage regulation control circuit, the output end of the voltage reduction circuit is connected with the other input end of the logic processing circuit, and the output end of the logic processing circuit is connected with the input end of the sensor power supply control signal input circuit;
The digital voltage regulation control circuit is used for controlling the regulation of the input voltage of the sensor;
the switching value signal acquisition circuit is used for acquiring output signals of the NPN sensor and the PNP sensor;
the logic processing circuit is used for controlling the logic judgment of the digital voltage regulation control circuit and the sensor test result;
The step-down circuit is used for converting the externally input high voltage into fixed voltage to provide a stable power supply for the testing device;
the sensor power supply control signal input circuit is used for controlling the sensor to work.
Further, the logic processing circuit comprises an MCU chip U4 and a capacitor C3, the VDD pin of the MCU chip U4 is connected with the voltage reduction circuit, and the VDD pin of the MCU chip U4 is connected with the capacitor C3.
Further, the step-down circuit includes voltage conversion chip U1, unidirectional diode D1, high-speed switch diode D2 and power output self-recovery insurance F1, the VIN pin of voltage conversion chip U1 is connected with external power source through unidirectional diode D1, the VIN pin and the OUT pin of voltage conversion chip U1 are connected with filter capacitor C1 and high-speed switch diode D2, the OUT pin of voltage conversion chip U1 is connected with the VDD pin of MCU chip U4 through output inductance L1 and power output self-recovery insurance F1.
Further, the digital voltage regulation control circuit comprises a photoelectric coupler U6 and a voltage regulation chip U5, a 3 pin of the photoelectric coupler U6 is connected with a PB11 pin of the MCU chip U4, a 1 pin of the photoelectric coupler U6 is connected with a resistor R8, a 5 pin and a6 pin of the photoelectric coupler U6 are connected with a resistor R7, a 4 pin and a 5 pin of the photoelectric coupler U6 are connected with a capacitor C5, a 5 pin of the photoelectric coupler U6 is connected with a DIM pin of the voltage regulation chip U5, a VCC pin of the voltage regulation chip U5 is connected with a capacitor C4, an IADJ pin of the voltage regulation chip U5 is connected with a GND pin, a VIN pin of the voltage regulation chip U5 is connected with a sensor power supply control signal input circuit through a fuse F2, and an LX pin of the voltage regulation chip U5 is connected with the sensor power supply control signal input circuit through an output inductor L2.
Further, the sensor power supply control signal input circuit comprises a wiring terminal CN1 and a sensor power supply control circuit, a2 pin of the wiring terminal CN1 is connected with a PB3 pin of the MCU chip U4 through the power supply control circuit, a3 pin of the wiring terminal CN1 is connected with an NPN type sensor, and a 4 pin of the wiring terminal CN1 is connected with a PNP type sensor.
Further, the sensor power supply control circuit comprises a MOS tube Q1 and a resistor R4, the 2 pin of the wiring terminal CN1 is connected with the drain electrode of the MOS tube Q1, and the grid electrode of the MOS tube Q1 is connected with the PB3 pin of the MCU chip U4 through the resistor R4.
Further, the switching value signal acquisition circuit comprises a photoelectric coupler U2 and a photoelectric coupler U3, a 4 pin of the photoelectric end coupler U2 is connected with the voltage reduction circuit through a resistor R1, a 4 pin of the photoelectric coupler U3 is connected with the voltage reduction resistor through a resistor R3, a 2 pin of the photoelectric coupler U2 is connected with the NPN type sensor, and a 1 pin of the photoelectric coupler U4 is connected with the PNP type sensor.
Compared with the prior art, the utility model has the following beneficial effects: the utility model can supply 0-48V adjustable direct current power supply to the sensor by arranging the digital voltage regulating control circuit, the switching value signal acquisition circuit can acquire the output signals of the NPN sensor and the PNP sensor, the logic processing circuit is used for judging the working state of the sensor and simultaneously controlling the voltage value output by the digital voltage regulating control circuit, and the voltage reducing circuit can provide stable 5V voltage for the whole device, so that the voltage range and the overvoltage protection threshold value of different types of sensors can be accurately detected by the arrangement.
Drawings
FIG. 1 is a schematic diagram of the system of the present utility model;
FIG. 2 is a schematic diagram of a circuit structure of the present utility model;
FIG. 3 is a schematic diagram of a logic processing circuit according to the present utility model;
FIG. 4 is a schematic diagram of a step-down circuit according to the present utility model;
FIG. 5 is a schematic diagram of a circuit structure of the digital voltage regulation control circuit of the present utility model;
FIG. 6 is a schematic diagram of a circuit configuration of a sensor power control signal input circuit according to the present utility model;
FIG. 7 is a schematic diagram of a circuit configuration of the switching value signal acquisition circuit according to the present utility model.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1 to 7, the present utility model provides a technical solution: a sensor wide-voltage testing device comprises a logic processing circuit, a digital voltage regulation control circuit, a switching value signal acquisition circuit, a voltage reduction circuit and a sensor power supply control signal input circuit;
The output end of the switching value signal acquisition circuit is connected with the input end of the logic processing circuit, the output end of the logic processing circuit is electrically connected with the input end of the digital voltage regulation control circuit, the output end of the voltage reduction circuit is connected with the other input end of the logic processing circuit, and the output end of the logic processing circuit is connected with the input end of the sensor power supply control signal input circuit;
The digital voltage regulation control circuit is used for controlling the regulation of the input voltage of the sensor;
the switching value signal acquisition circuit is used for acquiring output signals of the NPN sensor and the PNP sensor;
the logic processing circuit is used for controlling the logic judgment of the digital voltage regulation control circuit and the sensor test result;
The step-down circuit is used for converting the externally input high voltage into fixed voltage to provide a stable power supply for the testing device;
the sensor power supply control signal input circuit is used for controlling the sensor to work.
The digital voltage regulation control circuit is arranged to supply 0-48V of adjustable direct current power supply to the sensing electricity, the switching value signal acquisition circuit can acquire output signals of the NPN sensor and the PNP sensor, the logic processing circuit is used for judging the working state of the sensor and simultaneously controlling the voltage value output by the digital voltage regulation control circuit, the voltage reduction circuit can provide stable 5V voltage for the whole device, and the arrangement can accurately detect the voltage range and the overvoltage protection threshold value of different types of sensors.
Referring to fig. 1, 2, 3 and 4, the logic processing circuit includes an MCU chip U4 and a capacitor C3, a VDD pin of the MCU chip U4 is connected to a voltage reduction circuit, the VDD pin of the MCU chip U4 is connected to the capacitor C3, the voltage reduction circuit includes a voltage conversion chip U1, a unidirectional diode D1, a high-speed switching diode D2 and a power output self-recovery fuse F1, a VIN pin of the voltage conversion chip U1 is connected to an external power supply through the unidirectional diode D1, a VIN pin and an OUT pin of the voltage conversion chip U1 are connected to a filter capacitor C1 and a high-speed switching diode D2, and an OUT pin of the voltage conversion chip U1 is connected to the VDD pin of the MCU chip U4 through an output inductor L1 and the power output self-recovery fuse F1.
The step-down circuit can convert the externally input high voltage into fixed DC5V voltage to provide stable DC power for logic processing circuits and other circuits in the circuit, the externally input power is input by the unidirectional diode D1, and the power is input to the voltage conversion chip U1 through the filter capacitor C1 to change the voltage value.
Referring to fig. 1, fig. 2, fig. 3, fig. 4 and fig. 5, the digital voltage regulation control circuit includes a photo coupler U6 and a voltage regulation chip U5, pin 3 of the photo coupler U6 is connected with pin PB11 of the MCU chip U4, pin 1 of the photo coupler U6 is connected with a resistor R8, pin 5 and pin 6 of the photo coupler U6 are connected with a resistor R7, pin 4 and pin 5 of the photo coupler U6 are connected with a capacitor C5, pin 5 of the photo coupler U6 is connected with a DIM pin of the voltage regulation chip U5, pin VCC of the voltage regulation chip U5 is connected with a capacitor C4, pin IADJ of the voltage regulation chip U5 is connected with pin GND of the voltage regulation chip U5 is connected with a resistor R9, pin LX of the voltage regulation chip U5 is connected with a sensor power supply control signal input circuit through a fuse F2, and pin LX of the voltage regulation chip U5 is connected with the sensor power supply control signal input circuit through an output inductor L2.
The logic processing circuit outputs a modulated 200kHzPWM signal, the PB11 pin of the MCU chip U4 controls the 3 pin of the photoelectric coupler U6, the 3 pin is isolated by the 5 pin of the photoelectric coupler U6 and then outputs the PWM signal to the DIM pin of the voltage regulating chip U5, then the voltage regulating chip U5 outputs voltage from the LX pin according to the duty ratio of the PWM signal, the duty ratio is 0% -100% of the input voltage corresponding to the VIN pin, for example, when the VIN pin is DC48V and the duty ratio of the PWM signal is 100%, the voltage between the VIN pin of the voltage regulating chip U5 and the LX pin of the voltage regulating chip U5 is DC48V.
Referring to fig. 1, fig. 2, fig. 3, fig. 4, fig. 5 and fig. 6, the sensor power control signal input circuit includes a connection terminal CN1 and a sensor power control circuit, a 2 pin of the connection terminal CN1 is connected with a connection PB3 pin of the MCU chip U4 through the power control circuit, a3 pin of the connection terminal CN1 is connected with the NPN type sensor, a 4 pin of the connection terminal CN1 is connected with the PNP type sensor, the sensor power control circuit includes a MOS transistor Q1 and a resistor R4, a 2 pin of the connection terminal CN1 is connected with a drain electrode of the MOS transistor Q1, and a gate of the MOS transistor Q1 is connected with a connection PB3 pin of the MCU chip U4 through a resistor R4.
The MOS tube Q1 and the resistor R4 form a sensor power supply control circuit, a signal at one end of P_ON of the sensor power supply control circuit is a control end of the MCU chip U4, when P_ON is in a high level, the MOS tube Q1 is conducted, at the moment, the sensor is electrified to start working, a3 pin of the wiring terminal CN1 is an NPN sensor output signal, and a4 pin of the wiring terminal CN1 is a PNP sensor output signal.
Referring to fig. 1-7, the switching value signal acquisition circuit includes a photo-coupler U2 and a photo-coupler U3, wherein a4 pin of the photo-end coupler U2 is connected with a voltage-reducing circuit through a resistor R1, a4 pin of the photo-coupler U3 is connected with the voltage-reducing resistor through a resistor R3, a2 pin of the photo-coupler U2 is connected with an NPN type sensor, and a1 pin of the photo-coupler U4 is connected with a PNP type sensor.
The photoelectric coupler U2 and the photoelectric coupler U3 are used for isolating sensor input signals, when the sensor is NPN signal input, the photoelectric coupler U2 is conducted, the PC15 pin of the MCU chip U4 is at a low level, when the sensor is PNP signal input, the photoelectric coupler U3 is conducted, the PC14 pin of the MCU chip U4 is at a low level, the PC15 pin and the PC14 pin of the MCU chip U4 are signal input to the IO port of the MCU chip U4, and the MCU chip U4 judges the signal level state through logic.
When the sensor is used, firstly, an adjustable direct current power supply of 0-48V can be supplied to the sensing electricity through the digital voltage regulation control circuit, the switching value signal acquisition circuit can acquire output signals of the NPN sensor and the PNP sensor, the logic processing circuit is used for judging the working state of the sensor and simultaneously controlling the voltage value output by the digital voltage regulation control circuit, the set voltage reduction circuit can provide stable 5V voltage for the whole device, and the setting can accurately detect the voltage ranges and the overvoltage protection threshold values of different types of sensors.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. The utility model provides a wide pressure testing arrangement of sensor which characterized in that: the device comprises a logic processing circuit, a digital voltage regulation control circuit, a switching value signal acquisition circuit, a voltage reduction circuit and a sensor power supply control signal input circuit;
The output end of the switching value signal acquisition circuit is connected with the input end of the logic processing circuit, the output end of the logic processing circuit is electrically connected with the input end of the digital voltage regulation control circuit, the output end of the voltage reduction circuit is connected with the other input end of the logic processing circuit, and the output end of the logic processing circuit is connected with the input end of the sensor power supply control signal input circuit;
The digital voltage regulation control circuit is used for controlling the regulation of the input voltage of the sensor;
the switching value signal acquisition circuit is used for acquiring output signals of the NPN sensor and the PNP sensor;
the logic processing circuit is used for controlling the logic judgment of the digital voltage regulation control circuit and the sensor test result;
The step-down circuit is used for converting the externally input high voltage into fixed voltage to provide a stable power supply for the testing device;
the sensor power supply control signal input circuit is used for controlling the sensor to work.
2. The sensor wide-pressure testing device according to claim 1, wherein: the logic processing circuit comprises an MCU chip U4 and a capacitor C3, the VDD pin of the MCU chip U4 is connected with the voltage reduction circuit, and the VDD pin of the MCU chip U4 is connected with the capacitor C3.
3. A sensor wide-pressure testing device according to claim 2, wherein: the voltage reduction circuit comprises a voltage conversion chip U1, a unidirectional diode D1, a high-speed switching diode D2 and a power output self-recovery fuse F1, wherein the VIN pin of the voltage conversion chip U1 is connected with an external power supply through the unidirectional diode D1, the VIN pin and the OUT pin of the voltage conversion chip U1 are connected with a filter capacitor C1 and the high-speed switching diode D2, and the OUT pin of the voltage conversion chip U1 is connected with the VDD pin of the MCU chip U4 through an output inductor L1 and the power output self-recovery fuse F1.
4. A sensor wide-pressure testing device according to claim 3, wherein: the digital voltage regulation control circuit comprises a photoelectric coupler U6 and a voltage regulation chip U5, wherein a 3 pin of the photoelectric coupler U6 is connected with a PB11 pin of the MCU chip U4, a 1 pin of the photoelectric coupler U6 is connected with a resistor R8, a 5 pin and a 6 pin of the photoelectric coupler U6 are connected with a resistor R7, a 4 pin and a 5 pin of the photoelectric coupler U6 are connected with a capacitor C5, a 5 pin of the photoelectric coupler U6 is connected with a DIM pin of the voltage regulation chip U5, a VCC pin of the voltage regulation chip U5 is connected with a capacitor C4, an IADJ pin of the voltage regulation chip U5 is connected with a GND pin, a VIN pin of the voltage regulation chip U5 is connected with a sensor power supply control signal input circuit through a fuse F2, and an LX pin of the voltage regulation chip U5 is connected with the sensor power supply control signal input circuit through an output inductor L2.
5. The wide pressure sensor testing device according to claim 4, wherein: the sensor power supply control signal input circuit comprises a wiring terminal CN1 and a sensor power supply control circuit, wherein a2 pin of the wiring terminal CN1 is connected with a PB3 pin of the MCU chip U4 through the power supply control circuit, a3 pin of the wiring terminal CN1 is connected with an NPN type sensor, and a 4 pin of the wiring terminal CN1 is connected with a PNP type sensor.
6. The sensor wide-pressure testing device according to claim 5, wherein: the sensor power supply control circuit comprises a MOS tube Q1 and a resistor R4, the 2 pin of the wiring terminal CN1 is connected with the drain electrode of the MOS tube Q1, and the grid electrode of the MOS tube Q1 is connected with the PB3 pin of the MCU chip U4 through the resistor R4.
7. The sensor wide-pressure testing device of claim 6, wherein: the switching value signal acquisition circuit comprises a photoelectric coupler U2 and a photoelectric coupler U3, wherein a 4 pin of the photoelectric coupler U2 is connected with a voltage reduction circuit through a resistor R1, a 4 pin of the photoelectric coupler U3 is connected with the voltage reduction resistor through a resistor R3, a 2 pin of the photoelectric coupler U2 is connected with an NPN type sensor, and a 1 pin of the photoelectric coupler U4 is connected with a PNP type sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202420496554.4U CN221840470U (en) | 2024-03-14 | 2024-03-14 | Sensor wide-pressure testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202420496554.4U CN221840470U (en) | 2024-03-14 | 2024-03-14 | Sensor wide-pressure testing device |
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| Publication Number | Publication Date |
|---|---|
| CN221840470U true CN221840470U (en) | 2024-10-15 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202420496554.4U Active CN221840470U (en) | 2024-03-14 | 2024-03-14 | Sensor wide-pressure testing device |
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| CN (1) | CN221840470U (en) |
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- 2024-03-14 CN CN202420496554.4U patent/CN221840470U/en active Active
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