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CN210572558U - Testing device - Google Patents

Testing device Download PDF

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Publication number
CN210572558U
CN210572558U CN201921504754.5U CN201921504754U CN210572558U CN 210572558 U CN210572558 U CN 210572558U CN 201921504754 U CN201921504754 U CN 201921504754U CN 210572558 U CN210572558 U CN 210572558U
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Prior art keywords
radio frequency
elastic probe
hole
elastic
probe
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CN201921504754.5U
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Chinese (zh)
Inventor
林斌
詹昌吉
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Ningbo Jipin Technology Co ltd
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Ningbo Jipin Technology Co ltd
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Abstract

The utility model relates to a testing arrangement for to containing the device under test of radio frequency signal terminal, its characterized in that: the radio frequency detection device comprises a main body (1), wherein a radio frequency detection body (2) made of a conductor is embedded in the main body, a radio frequency elastic probe (3) is arranged in the radio frequency detection body, and an insulating sleeve (4) wraps the outside of the radio frequency elastic probe; a plurality of auxiliary elastic probes (5) surrounding the radio frequency elastic probes wrapped with the insulating sleeves are also arranged in the radio frequency detection body; the upper end of the radio frequency detection body (2) is provided with a through hole through which the radio frequency elastic probe (3) and the auxiliary elastic probes (5) can respectively penetrate; the upper end of the radio frequency elastic probe (3) can be contacted with a radio frequency signal terminal of a tested device, the lower end of the radio frequency elastic probe is in conductive connection with a radio frequency cable inner conductor, and the auxiliary elastic probe is directly in conductive contact with a radio frequency detection body; the lower end of the radio frequency detector can be connected with a radio frequency cable.

Description

Testing device
Technical Field
The utility model relates to a testing arrangement especially relates to the device under test who contains radio frequency microwave signal terminal, if detect the high-speed transmission chip and microsystem (SIP) product of BGA encapsulation.
Background
Future information exchange is developing in the direction of wireless and mobile, and various wireless mobile technologies including mobile communication, wireless local area network, satellite communication, wireless access, radar detection, GPS positioning, etc. are developing vigorously. All of these systems require Radio Frequency (RF) technology, Radio Frequency Integrated Circuits (RFICs) or radio frequency systems. In these communication systems, it is necessary to develop microwave and millimeter wave bands with signal spectrum extending to the radio frequency band and even higher frequency, and some super high speed integrated circuits also have the characteristics of radio frequency microwave signal transmission.
The package, usually referred to as a package, generally refers to a protective housing and related accessories of a single IC after being cut from a wafer, and is mainly used for protecting a silicon wafer. The packaging form generally comprises DIP, QFP, QFN, BGA and the like, and with the improvement of the process level, the packaging technology is developed rapidly, mainly the packaging density is higher and higher, the scale is larger and larger, and the pin number is increased rapidly. In addition, due to the requirement of function integration, single chip packages have not been able to meet the requirements of system design, and the packaged products are gradually developed from small-scale, single chip packages to large-scale, multi-chip packages.
SiP (System in Package) System in Package, as the name implies, refers to the integration of one System in one Package. Generally, the system needs to package a plurality of chips and can independently complete specific tasks, such as SiP system-in-package integrating a plurality of traditional IC chips like CPU, DRAM, Flash, etc., wherein SiP packages including radio frequency integrated circuit units are also included, and the lead-out mode of the pins thereof conventionally adopts BGA package fan-out mode.
In the testing process of an IC, an RFIC, an SIP and related packaging substrates and high-frequency circuit boards which have the requirements of radio frequency microwave transmission or ultra-high speed transmission, the radio frequency microwave transmission frequency can reach 20GHz or even higher, and how to efficiently and conveniently test a radio frequency microwave channel, a traditional control channel and a traditional power supply channel is a technical problem which needs to be solved at present.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem that a testing arrangement that can conveniently test the testee that contains the radio frequency microwave channel port of higher frequency is provided to above-mentioned prior art.
The utility model provides a technical scheme that above-mentioned technical problem adopted does: a testing device for testing a device under test having a radio frequency microwave signal port, comprising: the radio frequency detection device comprises a main body, wherein a radio frequency microwave detection body made of a conductor is embedded in the main body, a radio frequency elastic probe is arranged in the radio frequency microwave detection body, and an insulation sleeve wraps the outside of the radio frequency elastic probe; a plurality of auxiliary grounding elastic probes surrounding the periphery of the radio frequency elastic probe wrapped with the insulating sleeve are also arranged in the radio frequency microwave detection body; the upper end of the radio frequency microwave detection body is provided with through holes through which the radio frequency elastic probes and the auxiliary grounding elastic probes can respectively penetrate; the upper end of the radio frequency elastic probe can be contacted with a radio frequency microwave signal port of a tested device, the lower end of the radio frequency elastic probe is in conductive connection with a radio frequency cable inner conductor, and the auxiliary grounding elastic probe is directly in conductive contact with a radio frequency detection body; the lower end of the radio frequency detector can be connected with a radio frequency cable.
As an improvement, the main body comprises a panel and a bottom plate arranged below the panel, the radio frequency detection body comprises an upper insert embedded in the panel and a lower insert embedded in the bottom plate, and the upper insert and the lower insert are both made of conductors; a first through hole extending in the vertical direction is formed in the upper insert, and the radio frequency elastic probe and the insulating sleeve wrapped outside the radio frequency elastic probe are inserted into the first through hole along the axial direction of the first through hole; the auxiliary grounding elastic probes are embedded in the upper insert and surround the radio frequency elastic probes wrapped with the insulating sleeves, and the lower ends of the auxiliary grounding elastic probes are in conductive contact with the lower insert; the lower insert is internally provided with a second through hole extending along the vertical direction, the first through hole and the first through hole are coaxially arranged, a lower insulating sleeve inserted along the axial direction of the second through hole is arranged in the second through hole, and a radio frequency inner conductor in conductive contact with the radio frequency elastic probe is arranged in the lower insulating sleeve.
The improvement is that the upper insert is provided with an upper compensation step at the top end of the first through hole; a lower compensation step is formed in the middle of the inner conductor; the lower end part of the radio frequency elastic probe is conical, and a gap is formed between the lower end part of the radio frequency elastic probe and the inner wall of the insulating sleeve.
And the lower end of the radio frequency inner conductor is provided with a jack for inserting the central conductor of the radio frequency cable.
And the lower part of the lower insulating sleeve is provided with an insulating gasket for preventing the radio frequency inner conductor and the radio frequency cable outer conductor from being short-circuited.
Then, the inner wall of the radio frequency inner conductor jack is welded with the radio frequency cable central conductor by adopting soldering tin; and the inner wall of the second through hole of the lower insert is welded with the outer conductor of the radio frequency cable by adopting soldering tin.
And the panel is further improved, a low-frequency elastic probe is embedded in the panel, and a low-frequency contact pin which can be in conductive contact with the low-frequency elastic probe is arranged at a corresponding position in the bottom plate.
And the panel is further improved, a grounding elastic probe is embedded in the panel, and a grounding contact pin which can be in conductive contact with the grounding elastic probe is arranged at a corresponding position in the bottom plate.
The main body is externally provided with a metal shell, a metal bottom shell is arranged below the metal shell, a radio frequency detection interface is arranged on the metal bottom shell, and a radio frequency inner conductor of a radio frequency detection body is in conductive connection with the radio frequency detection interface through a radio frequency cable; the metal bottom shell is also provided with a low-frequency detection interface, and the lower part of the low-frequency contact pin is provided with a jack which can be electrically connected with the low-frequency detection interface through a wire; the grounding pin is in conductive contact with the metal shell.
And the upper part of the metal shell is also provided with an upper cover which is movably connected with the metal shell through a buckle.
And the part of the upper cover corresponding to the measured object is provided with a through hole observation window, and a movable gasket capable of pressing the measured device is arranged in the through hole observation window.
Compared with the prior art, the utility model has the advantages of:
1. the elastic probe is adopted to effectively contact with a bonding pad or a BGA ball of a tested object, the tested object can be flexibly and conveniently replaced, and the welding-free design has no damage to the tested object.
2. The radio frequency detection body is used as a main transmission channel of a radio frequency microwave signal, and meanwhile, a transmission channel with a coaxial structure is also formed in a contact part of the radio frequency detection body and a detected object, so that the compensation structure can be arranged to achieve a better impedance matching effect and reduce the reflection of the radio frequency microwave signal.
3. In the improvement scheme, an integrated design is adopted, all radio frequency, control and power supply ports of the tested object can be led out through corresponding detection ports, the size is small, and the requirement of incoming line testing can be met.
4. In the improvement scheme, the upper cover area is provided with an open structure, so that on-line windowing detection can be conveniently performed on some SIP products, and fixed-point debugging analysis operation is further performed on specific chip units in the package.
Drawings
Fig. 1 is a schematic perspective view of a testing device in an embodiment of the present invention;
fig. 2 is a schematic perspective view of another view angle of the testing device in the embodiment of the present invention;
fig. 3 is an exploded perspective view of a testing device according to an embodiment of the present invention;
fig. 4 is a cross-sectional view of a testing device in an embodiment of the present invention;
fig. 5 is a schematic structural diagram of the main body and the rf detector in the embodiment of the present invention;
fig. 6 is a schematic structural view of an upper insert and an inner assembly in an embodiment of the present invention;
fig. 7 is a schematic structural view of the lower insert and the inner assembly in the embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the following embodiments.
The testing device as shown in fig. 1-4 is used for testing a device under test 7 with a radio frequency signal terminal 71, and comprises a main body 1, a radio frequency detection body 2 made of a conductor is embedded in the main body, a radio frequency elastic probe 3 is arranged in the radio frequency detection body, and an insulating sleeve 4 wraps the outside of the radio frequency elastic probe; a plurality of auxiliary elastic probes 5 surrounding the radio frequency elastic probes wrapped with the insulating sleeves are also arranged in the radio frequency detection body; the upper end of the radio frequency detection body is provided with through holes through which the radio frequency elastic probes and the auxiliary elastic probes can respectively penetrate; the upper end of the radio frequency elastic probe 3 can be contacted with a radio frequency signal terminal 71 of a tested device 7, the lower end of the radio frequency elastic probe is in conductive connection with an inner conductor 61 of a radio frequency cable 6, and the auxiliary elastic probe 5 is directly in conductive contact with the radio frequency detection body 2; the lower end of the radio frequency detector 2 can be connected to a radio frequency cable 6.
In this embodiment, the main body 1 is made of an insulating material, and includes a panel 11 and a bottom plate 12 disposed below the panel; the radio frequency detector 2 comprises an upper insert 21 embedded in the insulating panel 11 and a lower insert 22 embedded in the bottom plate 12, and as shown in fig. 5, the upper insert 21 and the lower insert 22 are both made of conductors; a first through hole extending in the vertical direction is formed in the upper insert 21, and the radio frequency elastic probe 3 and the insulating sleeve 4 wrapped outside the radio frequency elastic probe are inserted into the first through hole along the axial direction of the first through hole; the auxiliary elastic probes 5 are embedded in the upper insert 21 and surround the radio frequency elastic probes 31 wrapped with the insulating sleeves 4, and the lower ends of the auxiliary elastic probes 5 are in conductive contact with the lower insert 22; the upper end of the upper insert 21 is provided with through holes through which the radio frequency elastic probe 3 and the plurality of auxiliary elastic probes 5 can respectively penetrate, as shown in fig. 6; a second through hole extending in the up-down direction is formed in the lower insert 22, the first through hole and the first through hole are coaxially arranged, a lower insulating sleeve 8 inserted in the axial direction of the second through hole is formed in the second through hole, and a radio frequency inner conductor 9 in conductive contact with the lower end of the radio frequency elastic probe 3 is formed in the lower insulating sleeve 8, as shown in fig. 7.
In this example, the lower insert 22 has a step design with a wide top and a narrow bottom, and in practical design, a step design with a narrow top and a wide bottom or two narrow ends and a wide middle can also be used. Structural variations of this part should be considered within the scope of protection of the claims.
In this embodiment, the whole rf transmission line is designed based on a characteristic impedance of 50 Ω, but misalignment compensation or high impedance compensation is adopted in some transition sections to reduce rf microwave reflection and improve transmission performance. The upper insert 21 is formed with an upper compensation step 21a at the top end of the first through hole, which can be used to adjust the impedance matching at the contact with the chip pad, as to form compensation; a lower compensation step 9a is formed in the middle of the inner conductor 9 to form high impedance compensation; the lower end part of the radio frequency elastic probe 3 is conical, and a gap 4a is formed between the lower end part and the inner wall of the insulating sleeve 4 to form high impedance compensation. The lower end of the radio frequency inner conductor 9 is provided with a slot 91 for inserting the inner conductor 61 of the radio frequency cable 6. The lower part of the lower insulating sleeve 8 is provided with an insulating gasket 10 for preventing the radio frequency inner conductor from being short-circuited with the outer conductive shell of the radio frequency cable.
In this embodiment, the shapes of the insulating sleeve 4 and the lower insulating sleeve 8 are designed by using a single insulating material, and the actual design can also adopt a mode of using a part of air medium or mixed medium to achieve the purposes of insulation and support. Structural variations of this part should be considered within the scope of protection of the claims.
A low-frequency elastic probe 13 is embedded in the panel 11, and a low-frequency pin 23 capable of being in conductive contact with the low-frequency elastic probe is arranged at a corresponding position in the bottom plate 12. The panel 11 is further embedded with a grounding elastic probe 14, and a grounding pin 24 capable of being in conductive contact with the grounding elastic probe is arranged at a corresponding position in the bottom plate 12.
In this embodiment, the radio frequency elastic probe 31, the auxiliary elastic probe 5, the low frequency elastic probe 13, and the grounding elastic probe 14 adopt a double-acting elastic probe as a transmission medium for achieving reliable contact, and in practical applications, a plurality of vertical interconnection modes with elastic contact, such as a fuzz button, a conductive rubber pad, a special-shaped elastic needle, and the like, can be adopted. Structural variations of this part should be considered within the scope of protection of the claims.
In this embodiment, only one rf detector is used as an example for description, and actually, a plurality of rf detectors may be distributed. In addition, the positions and pitch layouts of the radio frequency detector, the low frequency pins, and the ground pins are given as illustrations only, and cannot be limited to actual layouts.
For special chip layouts, such as denser pitch, the panel 11 may be made integral with the upper insert 21, using engineering plastic materials, using shorter, thinner spring probes and using a greater number of rf grounds to reduce rf transmission losses. In addition, for some chip layouts with low frequency concentrated distribution, the panel 11 and the upper insert 21 can also be made of a whole metal, but the peripheral material of the low frequency elastic probe part needs to be changed into an insulating material, and a new independent insert is formed. The part can be optimally arranged and combined according to the actual layout of the chip, and the part is supposed to be in the scope of protection of the right.
A metal shell 15 is arranged outside the main body 1, a metal bottom shell 16 is arranged below the metal shell 15, a radio frequency detection interface 17 is arranged on the metal bottom shell 16, and a radio frequency inner conductor of a radio frequency detection body is electrically connected with the radio frequency detection interface through a radio frequency cable; the metal bottom shell is also provided with a low-frequency detection interface 18, and a low-frequency contact pin 23 is electrically connected with the low-frequency detection interface 18 through a lead; the ground pin 24 is in conductive contact with the metal housing. The metal bottom case 16 is hollowed out to form a cavity for accommodating components such as rf cables and low frequency wires, and the bottom opening is covered with a bottom cover 161.
In the present embodiment, the low frequency detection interface 18 employs a J30J micro rectangular electrical connector, and other types of electrical connectors such as J63 and D type may be used. In an extension, a control circuit board may be further disposed in the cavity formed by the bottom metal shell 16 and the bottom cover 161 for optimizing the stability of the low frequency power supply and the waveform of the control signal. Structural variations of this part should be considered within the scope of protection of the claims.
The upper part of the metal shell 15 is also provided with an upper cover 19, and the upper cover 19 is movably connected with the metal shell 16 through a buckle 20. The upper cover 19 is provided with a through hole observation window 19a at the position corresponding to the radio frequency elastic probe, and a movable gasket 25 capable of elastically pressing the tested device is arranged in the through hole observation window.
In the present embodiment, the upper cover 19 is movably connected to the metal housing 16 by a double-buckle, and the upper cover is expandable and fixed by using a flip structure with one side shaft and the other side buckle movably connected. Structural variations of this part should be considered within the scope of protection of the claims.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.

Claims (10)

1. A test apparatus for testing a device under test having a radio frequency signal terminal, comprising: the radio frequency detection device comprises a main body (1), wherein a radio frequency detection body (2) made of a conductor is embedded in the main body, a radio frequency elastic probe (3) is arranged in the radio frequency detection body, and an insulating sleeve (4) wraps the outside of the radio frequency elastic probe; a plurality of auxiliary elastic probes (5) surrounding the radio frequency elastic probes wrapped with the insulating sleeves are also arranged in the radio frequency detection body; the upper end of the radio frequency detection body (2) is provided with a through hole through which the radio frequency elastic probe (3) and the auxiliary elastic probes (5) can respectively penetrate; the upper end of the radio frequency elastic probe (3) can be contacted with a radio frequency signal terminal of a tested device, the lower end of the radio frequency elastic probe is in conductive connection with a radio frequency cable inner conductor, and the auxiliary elastic probe is directly in conductive contact with a radio frequency detection body; the lower end of the radio frequency detector can be connected with a radio frequency cable.
2. The test device of claim 1, wherein: the radio frequency detection body (2) comprises an upper insert (21) embedded in the panel (11) and a lower insert (22) embedded in the bottom plate (12), and the upper insert (21) and the lower insert (22) are both made of conductors; a first through hole extending in the vertical direction is formed in the upper insert (21), and the radio frequency elastic probe (3) and the insulating sleeve (4) wrapped outside the radio frequency elastic probe (3) are inserted into the first through hole along the axial direction of the first through hole; the auxiliary elastic probes are embedded in the upper insert (21) and surround the radio frequency elastic probes (3) wrapped with the insulating sleeves, and the lower ends of the auxiliary elastic probes (5) are in conductive contact with the lower insert (22); the lower insert (22) is internally provided with a second through hole extending along the up-down direction, the first through hole and the first through hole are coaxially arranged, a lower insulating sleeve (8) inserted along the axial direction of the second through hole is arranged in the second through hole, and a radio frequency inner conductor (9) in conductive contact with the radio frequency elastic probe is arranged in the lower insulating sleeve (8).
3. The test device of claim 2, wherein: the upper insert (21) is formed with an upper compensation step (21a) at the top end of the first through hole; a lower compensation step (9a) is formed in the middle of the inner conductor (9); the lower end part of the radio frequency elastic probe (3) is conical, and a gap is formed between the lower end part and the inner wall of the insulating sleeve (4).
4. The test device of claim 3, wherein: the lower end of the radio frequency inner conductor (9) is provided with a slot (91) for inserting the radio frequency cable inner conductor; and an insulating gasket for preventing the radio frequency inner conductor from being short-circuited with the radio frequency cable outer conductive shell is arranged at the lower part of the lower insulating sleeve.
5. A test device according to claim 2 or 3 or 4, characterized in that: still inlay in panel (11) and be equipped with low frequency elasticity probe, correspond the position in bottom plate (12) and be equipped with low frequency contact pin (23) that can electrically conduct contact with low frequency elasticity probe.
6. The test device of claim 5, wherein: still inlay in panel (11) and be equipped with ground connection elastic probe, corresponding position is equipped with in bottom plate (12) and can with ground connection elastic probe conductive contact's ground connection contact pin (24).
7. The test device of claim 6, wherein: a metal shell is arranged outside the main body (1), a metal bottom shell is arranged below the metal shell, a radio frequency detection interface is arranged on the metal bottom shell, and a radio frequency inner conductor of a radio frequency detection body is electrically connected with the radio frequency detection interface through a radio frequency cable; the metal bottom shell is also provided with a low-frequency detection interface, and the low-frequency contact pin is electrically connected with the low-frequency detection interface through a lead; the grounding pin is in conductive contact with the metal shell.
8. The test device of claim 7, wherein: the upper part of the metal shell is also provided with an upper cover which is movably connected with the metal shell through a buckle; the upper cover is provided with a through hole observation window corresponding to the measured object, and a movable gasket capable of elastically pressing the measured device is arranged in the through hole observation window.
9. The test device of claim 2, wherein: the panel (11) and the upper insert (21) are made into an integral piece and made of engineering plastic materials.
10. The test device of claim 5, wherein: the panel (11) and the upper insert (21) are made of a whole metal, and the periphery of the low-frequency elastic probe part is provided with an insulating wrapping piece to form a new independent insert which is embedded in the panel (11).
CN201921504754.5U 2019-09-10 2019-09-10 Testing device Active CN210572558U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201921504754.5U CN210572558U (en) 2019-09-10 2019-09-10 Testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201921504754.5U CN210572558U (en) 2019-09-10 2019-09-10 Testing device

Publications (1)

Publication Number Publication Date
CN210572558U true CN210572558U (en) 2020-05-19

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Application Number Title Priority Date Filing Date
CN201921504754.5U Active CN210572558U (en) 2019-09-10 2019-09-10 Testing device

Country Status (1)

Country Link
CN (1) CN210572558U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110441640A (en) * 2019-09-10 2019-11-12 宁波吉品科技有限公司 A kind of test device
CN113346301A (en) * 2021-05-17 2021-09-03 中航光电科技股份有限公司 Maintainable thin chip switching base
CN116298777A (en) * 2023-01-17 2023-06-23 苏州联讯仪器股份有限公司 Chip test structure

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110441640A (en) * 2019-09-10 2019-11-12 宁波吉品科技有限公司 A kind of test device
CN113346301A (en) * 2021-05-17 2021-09-03 中航光电科技股份有限公司 Maintainable thin chip switching base
CN116298777A (en) * 2023-01-17 2023-06-23 苏州联讯仪器股份有限公司 Chip test structure
CN116298777B (en) * 2023-01-17 2024-01-30 苏州联讯仪器股份有限公司 Chip test structure

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CP02 Change in the address of a patent holder

Address after: 315041 Building 5, No. 238 Dongsheng Road, Jiaochuan street, Zhenhai District, Ningbo City, Zhejiang Province

Patentee after: NINGBO JIPIN TECHNOLOGY CO.,LTD.

Address before: A7-3-1, building 9, Yunsheng science and Technology Industrial Park, No.2 Lane 189, Canghai Road, high tech Zone, Ningbo City, Zhejiang Province, 315041

Patentee before: NINGBO JIPIN TECHNOLOGY CO.,LTD.

CP02 Change in the address of a patent holder