[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

CN110441640A - A kind of test device - Google Patents

A kind of test device Download PDF

Info

Publication number
CN110441640A
CN110441640A CN201910853607.7A CN201910853607A CN110441640A CN 110441640 A CN110441640 A CN 110441640A CN 201910853607 A CN201910853607 A CN 201910853607A CN 110441640 A CN110441640 A CN 110441640A
Authority
CN
China
Prior art keywords
radio frequency
elastic probe
probe
frequency
radio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910853607.7A
Other languages
Chinese (zh)
Inventor
林斌
詹昌吉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ningbo Lucky Technology Co Ltd
Original Assignee
Ningbo Lucky Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ningbo Lucky Technology Co Ltd filed Critical Ningbo Lucky Technology Co Ltd
Priority to CN201910853607.7A priority Critical patent/CN110441640A/en
Publication of CN110441640A publication Critical patent/CN110441640A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to a kind of test devices, for testing the tested device containing radio frequency signal terminal, it is characterized by comprising main body (1), the detection of the radio frequency made of conductor body (2) is embedded in the main body, radio frequency detection is equipped with radio frequency elastic probe (3) in vivo, and the outside of radio frequency elastic probe is enclosed with insulation sleeve (4);Radio frequency detection is additionally provided with the assistant spring probe (5) that more rhizospheres are wound on around the radio frequency elastic probe for being enclosed with insulation sleeve in vivo;The upper end of radio frequency detection body (2) is equipped with the perforation that can be pierced by respectively for radio frequency elastic probe (3) He Duogen assistant spring probe (5);The upper end of radio frequency elastic probe (3) can be contacted with the radio frequency signal terminal of tested device, and the lower end of radio frequency elastic probe and radio-frequency cable inner conductor are conductively connected, and assistant spring probe directly detects body conductive contact with radio frequency;The lower end of radio frequency detection body can be connect with radio-frequency cable.

Description

A kind of test device
Technical field
The present invention relates to a kind of test devices, such as right more particularly to the tested device containing frequency microwave signal terminal High-speed transfer chip and micro-system (SIP) product of BGA package is detected.
Background technique
Following information interchange develops towards wireless and mobile direction, including mobile communication, WLAN, All kinds of wireless mobile technologies including satellite communication, wireless access, radar detection, GPS positioning etc. are flourishing.It is all this A little system all demand radio frequency (RF) technology, RF IC (RFIC) or radio frequency systems.In these communication systems, Ren Menxu It develops signal spectrum and extends to the radio band even higher microwave and millimeter wave wave band of frequency, in addition, the integrated electricity of some ultrahigh speeds Road equally has the characteristics that the transmission of frequency microwave signal.
Packeage is often translated into encapsulation, typically refer to protectiveness shell of the monolithic IC after being cut down from wafer and Related accessories, mainly for the protection of silicon wafer.The form of encapsulation generally comprises DIP, QFP, QFN, BGA etc., with technological level It improves, encapsulation technology develops quickly, and mainly packaging density is higher and higher, and scale is increasing, number of pins rapid growth. Further, since the requirement that function is integrated, single-chip package is no longer satisfied the requirement of system design, and encapsulating products are also gradually Developed from small-scale, single-chip package to extensive, multi-chip package direction.
SiP (System in Package) system in package refers to as its name suggests and integrates one in a package System.In general, this system need to encapsulate multiple chips and can the specific task of complete independently, be such as integrated with CPU, DRAM, The SiP system in package of multiple conventional IC chips such as Flash, wherein also including the SiP envelope containing RF IC unit Dress, the lead-out mode of pin routinely use BGA package to be fanned out to mode.
To containing frequency microwave transmission or ultrahigh speed transmission demand IC, RFIC and SIP and relevant package substrate, In the test process of high-frequency circuit board, frequency microwave transmission frequency or to can reach 20GHz even higher, how efficiently, conveniently Frequency microwave channel and traditional control channel, power channel are tested in ground, are current technical problems urgently to be solved.
Summary of the invention
The technical problem to be solved by the present invention is to for the above-mentioned prior art provide it is a kind of can be easily to containing higher The test device that the testee of the frequency microwave access port of frequency is tested.
The technical scheme of the invention to solve the technical problem is: a kind of test device, for containing radio frequency The tested device of microwave signal port is tested, it is characterised in that: including main body, is embedded with made of conductor in the main body Frequency microwave detects body, and frequency microwave detection is equipped with radio frequency elastic probe in vivo, and the outside of radio frequency elastic probe is enclosed with insulation Set;Frequency microwave detection is additionally provided with the auxiliary earth bullet that more rhizospheres are wound on around the radio frequency elastic probe for being enclosed with insulation sleeve in vivo Property probe;The upper end of frequency microwave detection body is equipped with and can be pierced by respectively for radio frequency elastic probe and Duo Gen auxiliary earth elastic probe Perforation;The upper end of radio frequency elastic probe can be contacted with the frequency microwave signal port of tested device, under radio frequency elastic probe End is conductively connected with radio-frequency cable inner conductor, and auxiliary earth elastic probe directly detects body conductive contact with radio frequency;Radio frequency inspection The lower end for surveying body can be connect with radio-frequency cable.
As an improvement, the main body includes panel and the bottom plate that below the panel is arranged in, the radio frequency detection body includes embedding The upper inserts that is located in panel and it is embedded the lower inserts in bottom plate, upper inserts and lower inserts are made of conductor;It is described embedding The first through hole vertically extended, the radio frequency elastic probe and the insulation being wrapped in outside radio frequency elastic probe are equipped in part The axial direction covered along first through hole is plugged in first through hole;The more auxiliary earth elastic probes are embedded in upper inserts, and It is centered around around the radio frequency elastic probe for being enclosed with insulation sleeve, while the lower end of more assistant spring probes connects with lower inserts conduction Touching;The second through-hole vertically extended, first through hole and first through hole coaxial arrangement are equipped in the lower inserts, second is logical It is equipped with the lower insulation sleeve plugged along the axial direction of the second through-hole in hole, is equipped with and radio frequency elastic probe conductive contact in lower insulation sleeve Radio frequency inner conductor.
It improves again, the upper inserts is formed with upper compensation step in first through hole top end;It is formed in the middle part of the inner conductor There is lower compensation step;The lower end of radio frequency elastic probe is tapered, and is formed with gap between insulation sleeve inner wall.
It improves again, radio frequency inner conductor lower end is provided with the jack for the insertion of radio-frequency cable center conductor.
It improves again, the lower insulation sleeve lower part is equipped with the felt pad for preventing radio frequency inner conductor Yu the short circuit of radio-frequency cable outer conductor Piece.
It improves again, the radio frequency inner conductor jack inner wall and radio-frequency cable center conductor are welded using scolding tin;It is embedding under described The second through-hole wall and radio-frequency cable outer conductor of part are welded using scolding tin.
It improves again, low-frequency elastic probe is also embedded in the panel, corresponding position is equipped with energy and low frequency in the bottom plate The low frequency contact pin of elastic probe conductive contact.
Improve again, ground connection elastic probe be also embedded in the panel, in the bottom plate corresponding position be equipped with can be with ground connection The ground connection contact pin of elastic probe conductive contact.
It improves again, the main body is externally provided with metal shell, is equipped with metal bottom shell below metal shell, metal bottom shell is equipped with Radio frequency detects interface, and the radio frequency inner conductor that radio frequency detects body detects interface by radio-frequency cable and radio frequency and is conductively connected;Metal bottom Low frequency detection interface is additionally provided on shell, low frequency contact pin lower part has jack, can detect interface with low frequency and be conductively connected by conducting wire; It is grounded contact pin and metal shell conductive contact.
It improves again, the top of the metal shell is additionally provided with upper cover, and upper cover is flexibly connected with metal shell by buckle.
It improves again, the corresponding position of the upper Gai Shangyu measurand is provided with through-hole observation window, sets in the through-hole observation window There are the removable insole pieces that can compress tested device.
Compared with the prior art, the advantages of the present invention are as follows:
1, effectively contacted using elastic probe and the pad of measurand or BGA ball work, can flexibly, easily replace quilt Object is surveyed, no-welding design is not damaged to measurand.
2, radio frequency detect body as frequency microwave signal prevailing transmission channel, while with testee contact site also structure The transmission channel of coaxial configuration has been set, it can be micro- to reduce radio frequency preferably to reach impedance matching effect by setting collocation structure The reflection of wave signal.
3, in improvement project, using integral type Integrated design, radio frequency that can be all to measurand, control, power end Mouth is made corresponding detection port and is drawn, and small volume can satisfy the demand of inlet wire test.
4, in improvement project, upper cover area is equipped with open architecture, it may be convenient to is opened online some SIP products Window detection further executes fixed point Commissioning Analysis operation to the certain chip unit in encapsulation.
Detailed description of the invention
Fig. 1 is the schematic perspective view of test device in the embodiment of the present invention;
Fig. 2 is the schematic perspective view at another visual angle of test device in the embodiment of the present invention;
Fig. 3 is the stereogram exploded view of test device in the embodiment of the present invention;
Fig. 4 is the cross-sectional view of test device in the embodiment of the present invention;
Fig. 5 is the structural schematic diagram that main body and radio frequency detect body in the embodiment of the present invention;
Fig. 6 is the structural schematic diagram of upper inserts and internal component in the embodiment of the present invention;
Fig. 7 is the structural schematic diagram of lower inserts and internal component in the embodiment of the present invention.
Specific embodiment
The present invention will be described in further detail below with reference to the embodiments of the drawings.
Test device as described in Fig. 1~4, for testing the tested device 7 containing radio frequency signal terminal 71, Including main body 1, the detection body 2 of the radio frequency made of conductor is embedded in the main body, radio frequency detection is equipped with radio frequency elastic probe in vivo 3, the outside of radio frequency elastic probe is enclosed with insulation sleeve 4;Radio frequency detection, which is additionally provided with more rhizospheres in vivo and is wound on, is enclosed with insulation sleeve Assistant spring probe 5 around radio frequency elastic probe;The upper end that radio frequency detects body is equipped with can be respectively for radio frequency elastic probe and more The perforation that root assistant spring probe is pierced by;The upper end of radio frequency elastic probe 3 can connect with the radio frequency signal terminal 71 of tested device 7 Touching, the lower end of radio frequency elastic probe and 6 inner conductor 61 of radio-frequency cable are conductively connected, and assistant spring probe 5 is directly examined with radio frequency Survey 2 conductive contact of body;The lower end of radio frequency detection body 2 can be connect with 6 cable of radio frequency electrical.
In the present embodiment, main body 1 is whole to be made of isolation material comprising panel 11 and the bottom that below the panel is arranged in Plate 12;The radio frequency detection body 2 includes being embedded the upper inserts 21 in insulating panel 11 and being embedded the lower inserts in bottom plate 12 22, shown in Figure 5, upper inserts 21 and lower inserts 22 are made of conductor;It is equipped in the upper inserts 21 and prolongs along the vertical direction The axial direction of the first through hole stretched, the radio frequency elastic probe 3 and the insulation sleeve 4 being wrapped in outside radio frequency elastic probe along first through hole It is plugged in first through hole;The more assistant spring probes 5 are embedded in upper inserts 21, and are centered around and are enclosed with insulation sleeve 4 Radio frequency elastic probe 31 around, while the lower end of more assistant spring probes 5 and lower 22 conductive contact of inserts;Upper inserts 21 Upper end is equipped with the perforation that can be pierced by respectively for radio frequency elastic probe 3 and Duo Gen assistant spring probe 5, shown in Figure 6;Under described It is equipped with the second through-hole vertically extended, first through hole and first through hole coaxial arrangement in inserts 22, is set in the second through-hole There is the lower insulation sleeve 8 that the axial direction along the second through-hole plugs, is equipped in lower insulation sleeve 8 and is connect with the lower conductive of radio frequency elastic probe 3 The radio frequency inner conductor 9 of touching, it is shown in Figure 7.
In this example, the shape of lower inserts 22 uses step design wide at the top and narrow at the bottom, can also adopt in actual design With the wide step design in the narrow centre in up-narrow and down-wide or both ends.The structural change of this part, it should all within rights protection scope.
In the present embodiment, entire radio-frequency transmission line is designed based on the characteristic impedance of 50 Ω, but is used in some changeover portions Mis-registry compensation or highly resistance compensation promote transmission performance to reduce frequency microwave reflection.Such as in order to form compensation, upper inserts 21 is the One through-hole top end is formed with compensation step 21a, can be used for adjusting the impedance matching with chip bonding pad contact position;In described It is formed with lower compensation step 9a in the middle part of conductor 9, forms highly resistance compensation;The lower end of radio frequency elastic probe 3 is tapered, and with insulation It covers and is formed with gap 4a between 4 inner walls, form highly resistance compensation.9 lower end of radio frequency inner conductor is provided with for 6 inner conductor 61 of radio-frequency cable The slot 91 of insertion.Lower 8 lower part of insulation sleeve is equipped with the felt pad for preventing radio frequency inner conductor and the outer conductive shell short circuit of radio-frequency cable Piece 10.
In the present embodiment, the shape of the insulation sleeve 4 and lower insulation sleeve 8 is designed using independent isolation material, real Partial air medium also can be used for border design or the mode of blending agent achievees the purpose that insulation and support.The structure of this part becomes It is dynamic, it should all within rights protection scope.
Low-frequency elastic probe 13 is also embedded in panel 11, corresponding position is equipped with and can visit with low-frequency elastic in the bottom plate 12 The low frequency contact pin 23 of needle conductive contact.Ground connection elastic probe 14 is also embedded in panel 11, corresponding position is set in the bottom plate 12 Having can be with the ground connection contact pin 24 of ground connection elastic probe conductive contact.
In the present embodiment, it the radio frequency elastic probe 31, assistant spring probe 5, low-frequency elastic probe 13 and connects Ground elastic probe 14 uses double acting elastic probe as the transmission medium for reaching reliable contacts, also can be used in practical applications A variety of vertical interconnection modes with Elastic Contact such as hair button, conductive rubber mat, special-shaped elastic needle.The structural change of this part, is answered This is all within rights protection scope.
In this legend, describes, can actually be examined using multiple radio frequencies as example only with radio frequency detection body at one Survey body distribution.In addition, radio frequency detection body, low frequency needle and the position of grounding pin, pitch layout are also only used as signal and provide, not It can be limited as practical layout.
For special chip layout, such as more dense spacing, panel 11 can be made integral piece with upper inserts 21, use Engineering plastics material, and using shorter, thinner elastic probe and more radio frequency is used to be grounded to reduce radio frequency transmission Loss.In addition, being directed to the chip layout of some low frequency integrated distributions, panel 11 and upper inserts 21 can also use block of metal system At, but the peripheral material of low-frequency elastic probe locations needs to become isolation material, and forms new independent inserts.This part can For chip practical layout and optimize permutation and combination, it should all within rights protection scope.
Main body 1 is externally provided with metal shell 15, and metal bottom shell 16 is equipped with below metal shell 15, and metal bottom shell 16 is equipped with and penetrates Frequency detection interface 17, the radio frequency inner conductor of radio frequency detection body detect interface with radio frequency by radio-frequency cable and are electrically connected;Metal bottom shell On be additionally provided with low frequency detection interface 18, low frequency contact pin 23 and low frequency detection interface 18 by conducting wire conductive connection;It is grounded contact pin 24 With metal shell conductive contact.It hollows out to form cavity inside metal bottom shell 16, for accommodating the portions such as radio-frequency cable and low frequency conducting wire Part, bottom opening are covered using bottom cover 161.
In the present embodiment, low frequency detection interface 18 uses the micro- rectangular electric connector of J30J, practical to can be used The other types of electric connector such as J63, D type.Extension, the cavity that can be further formed in metal bottom shell 16 and bottom cover 161 Interior placement control circuit board, for optimizing the stability of low-frequency power and the waveform of control signal.The structural change of this part, is answered This is all within rights protection scope.
The top of metal shell 15 is additionally provided with upper cover 19, and upper cover 19 is flexibly connected with metal shell 16 by buckle 20.On Position corresponding with radio frequency elastic probe is provided with through-hole observation window 19a on lid 19, and being equipped in the through-hole observation window can elastic compression The removable insole pieces 25 of tested device.
In the present embodiment, upper cover 19 is flexibly connected with metal shell 16 by double card button, expansible one side axle of use Flip structure fixed, that other side buckle is flexibly connected.The structural change of this part, it should all within rights protection scope.
Obviously, the above embodiments are merely examples for clarifying the description, and does not limit the embodiments.It is right For those of ordinary skill in the art, can also make on the basis of the above description it is other it is various forms of variation or It changes.There is no necessity and possibility to exhaust all the enbodiments.And it is extended from this it is obvious variation or It changes still within the protection scope of the invention.

Claims (10)

1. a kind of test device, for testing the tested device containing radio frequency signal terminal, it is characterised in that: including master Body (1), the detection of the radio frequency made of conductor body (2) is embedded in the main body, and radio frequency detection is equipped with radio frequency elastic probe in vivo (3), the outside of radio frequency elastic probe is enclosed with insulation sleeve (4);Radio frequency detection, which is additionally provided with more rhizospheres in vivo and is wound on, is enclosed with insulation Assistant spring probe (5) around the radio frequency elastic probe of set;The upper end that radio frequency detects body (2) is equipped with can be respectively for radio frequency elasticity The perforation that probe (3) He Duogen assistant spring probe (5) is pierced by;The upper end of radio frequency elastic probe (3) can be penetrated with tested device The contact of frequency signal terminal, the lower end of radio frequency elastic probe and radio-frequency cable inner conductor are conductively connected, and assistant spring probe is direct Body conductive contact is detected with radio frequency;The lower end of radio frequency detection body can be connect with radio-frequency cable.
2. test device according to claim 1, it is characterised in that: the main body (1) includes that panel (11) and setting exist The bottom plate (12) of below the panel, radio frequency detection body (2) include being embedded the upper inserts (21) in panel (11) and being embedded Lower inserts (22) in bottom plate (12), upper inserts (21) and lower inserts (22) are made of conductor;It is set in the upper inserts (21) There is a first through hole vertically extended, the radio frequency elastic probe (3) and is wrapped in the insulation of radio frequency elastic probe (3) outside Set (4) is plugged in first through hole along the axial direction of first through hole;The more assistant spring probes are embedded in upper inserts (21), And it is centered around around the radio frequency elastic probe (3) for being enclosed with insulation sleeve, while the lower end of more assistant spring probes (5) is embedding under Part (22) conductive contact;The second through-hole vertically extended is equipped in the lower inserts (22), first through hole and first are led to Hole coaxial arrangement, the second through-hole is interior to be equipped with the lower insulation sleeve (8) plugged along the axial direction of the second through-hole, is equipped in lower insulation sleeve (8) With the radio frequency inner conductor (9) of radio frequency elastic probe conductive contact.
3. test device according to claim 2, it is characterised in that: the upper inserts (21) is in first through hole top end shape At there is upper compensation step (21a);Lower compensation step (9a) is formed in the middle part of the inner conductor (9);Under radio frequency elastic probe (3) End is tapered, and is formed with gap between insulation sleeve (4) inner wall.
4. test device according to claim 3, it is characterised in that: radio frequency inner conductor (9) lower end is provided with for radio frequency The slot (91) of connector inner conductor insertion;The lower insulation sleeve lower part, which is equipped with, prevents radio frequency inner conductor and radio-frequency cable outer conductive The insulation spacer of shell short circuit.
5. according to test device described in Claims 2 or 3 or 4, it is characterised in that: be also embedded with low frequency in the panel (11) Elastic probe, the interior corresponding position of the bottom plate (12) is equipped with can be with the low frequency contact pin (23) of low-frequency elastic probe conductive contact.
6. test device according to claim 5, it is characterised in that: be also embedded with ground connection elasticity in the panel (11) and visit Needle, the interior corresponding position of the bottom plate (12) is equipped with can be with the ground connection contact pin (24) of ground connection elastic probe conductive contact.
7. test device according to claim 6, it is characterised in that: the main body (1) is externally provided with metal shell, metal-back Metal bottom shell is equipped with below body, metal bottom shell is equipped with radio frequency and detects interface, and the radio frequency inner conductor of radio frequency detection body passes through radio frequency Cable is electrically connected with radio frequency detection interface;Low frequency detection interface is additionally provided in metal bottom shell, low frequency contact pin and low frequency detect interface It is conductively connected by conducting wire;It is grounded contact pin and metal shell conductive contact.
8. test device according to claim 7, it is characterised in that: the top of the metal shell is additionally provided with upper cover, on Lid is flexibly connected with metal shell by buckle;The corresponding position of the upper Gai Shangyu measurand is provided with through-hole observation window, should The removable insole pieces of energy elastic compression tested device are equipped in through-hole observation window.
9. the test device stated according to claim 2, it is characterised in that: one is made in the panel (11) and upper inserts (21) Part is made of engineering plastics material.
10. the test device stated according to claim 5, it is characterised in that: the panel (11) and upper inserts (21) use monolith Metal is made, and the periphery of low-frequency elastic probe locations is equipped with insulation wrap member, forms new independent inserts, is embedded in panel (11) It is interior.
CN201910853607.7A 2019-09-10 2019-09-10 A kind of test device Pending CN110441640A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910853607.7A CN110441640A (en) 2019-09-10 2019-09-10 A kind of test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910853607.7A CN110441640A (en) 2019-09-10 2019-09-10 A kind of test device

Publications (1)

Publication Number Publication Date
CN110441640A true CN110441640A (en) 2019-11-12

Family

ID=68439836

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910853607.7A Pending CN110441640A (en) 2019-09-10 2019-09-10 A kind of test device

Country Status (1)

Country Link
CN (1) CN110441640A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111230767A (en) * 2020-02-13 2020-06-05 深圳飞骧科技有限公司 Clamp for radio frequency circuit test
CN111343050A (en) * 2020-03-02 2020-06-26 瑞声科技(新加坡)有限公司 Testing device of transmission module
CN112034327A (en) * 2020-08-29 2020-12-04 捷映凯电子(昆山)有限公司 Flexible circuit board test switching device for electric connector
CN112180244A (en) * 2020-12-01 2021-01-05 四川斯艾普电子科技有限公司 Support plate type bare chip power amplifier module testing device
CN112327139A (en) * 2020-11-04 2021-02-05 上海航天科工电器研究院有限公司 Chip testing device
CN112485646A (en) * 2020-12-03 2021-03-12 上海航天科工电器研究院有限公司 BGA chip vertical interconnection test module based on hair button
TWI726509B (en) * 2019-11-20 2021-05-01 嘉聯益科技股份有限公司 Cable test module and method of cable test
CN114236278A (en) * 2021-12-13 2022-03-25 北京中微普业科技有限公司 SMD component impedance analysis three-temperature coaxial structure test tool
CN115248356A (en) * 2022-09-21 2022-10-28 荣耀终端有限公司 Test fixture and test system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040212383A1 (en) * 2003-04-25 2004-10-28 Yokowo Co., Ltd. IC socket
CN210572558U (en) * 2019-09-10 2020-05-19 宁波吉品科技有限公司 Testing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040212383A1 (en) * 2003-04-25 2004-10-28 Yokowo Co., Ltd. IC socket
CN210572558U (en) * 2019-09-10 2020-05-19 宁波吉品科技有限公司 Testing device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI726509B (en) * 2019-11-20 2021-05-01 嘉聯益科技股份有限公司 Cable test module and method of cable test
CN111230767A (en) * 2020-02-13 2020-06-05 深圳飞骧科技有限公司 Clamp for radio frequency circuit test
CN111343050A (en) * 2020-03-02 2020-06-26 瑞声科技(新加坡)有限公司 Testing device of transmission module
CN112034327A (en) * 2020-08-29 2020-12-04 捷映凯电子(昆山)有限公司 Flexible circuit board test switching device for electric connector
CN112327139A (en) * 2020-11-04 2021-02-05 上海航天科工电器研究院有限公司 Chip testing device
CN112180244A (en) * 2020-12-01 2021-01-05 四川斯艾普电子科技有限公司 Support plate type bare chip power amplifier module testing device
CN112180244B (en) * 2020-12-01 2021-02-12 四川斯艾普电子科技有限公司 Support plate type bare chip power amplifier module testing device
CN112485646A (en) * 2020-12-03 2021-03-12 上海航天科工电器研究院有限公司 BGA chip vertical interconnection test module based on hair button
CN114236278A (en) * 2021-12-13 2022-03-25 北京中微普业科技有限公司 SMD component impedance analysis three-temperature coaxial structure test tool
CN115248356A (en) * 2022-09-21 2022-10-28 荣耀终端有限公司 Test fixture and test system
CN115248356B (en) * 2022-09-21 2023-02-17 荣耀终端有限公司 Test fixture and test system

Similar Documents

Publication Publication Date Title
CN110441640A (en) A kind of test device
US6822438B2 (en) Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer
US6727716B1 (en) Probe card and probe needle for high frequency testing
CN210572558U (en) Testing device
US5486770A (en) High frequency wafer probe apparatus and method
US6924637B2 (en) Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device
Hebeler et al. Differential bondwire interface for chip-to-chip and chip-to-antenna interconnect above 200 GHz
CN211404488U (en) Millimeter wave chip packaging structure and test structure thereof
TW201118381A (en) Test device for high-frequency vertical probe card
Lu et al. Comparative modeling of single-ended through-silicon vias in GS and GSG configurations up to v-band frequencies
CN109655733A (en) The method of non-destructive testing millimeter wave bga component
CN214845614U (en) Chip testing device
CN111599788B (en) Test method of high-frequency leadless ceramic shell with 0.5mm pitch
CN108828326B (en) Three-dimensional microwave assembly testing arrangement
JPS62502709A (en) Probes or related improvements
US8149009B2 (en) Apparatus and method for terminating probe apparatus of semiconductor wafer
JPH07122602A (en) High frequency probe and probe circuit
JPH07311220A (en) High-frequency probe for measuring electric characteristic of semiconductor package
CN212514903U (en) Chip testing device
TWM593697U (en) Cable test module
KR100549932B1 (en) Epoxy Probe Card
CN207366639U (en) A kind of LCR radio frequency connection devices
CN217180969U (en) Micro coaxial radio frequency probe card
JPS61125031A (en) Probe card
KR100261220B1 (en) Socket including a ground plane for improving a signal transmission

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CB02 Change of applicant information

Address after: 315041 Building 5, No. 238 Dongsheng Road, Jiaochuan street, Zhenhai District, Ningbo City, Zhejiang Province

Applicant after: NINGBO JIPIN TECHNOLOGY CO.,LTD.

Address before: A7-3-1, building 9, Yunsheng science and Technology Industrial Park, No.2 Lane 189, Canghai Road, high tech Zone, Ningbo City, Zhejiang Province, 315041

Applicant before: NINGBO JIPIN TECHNOLOGY CO.,LTD.

CB02 Change of applicant information