CN113050147A

CN113050147A - Batch test method for read-out electronic boards of electromagnetic particle detector

Info

Publication number: CN113050147A
Application number: CN202110250426.2A
Authority: CN
Inventors: 张庚; 常劲帆
Original assignee: Institute of High Energy Physics of CAS
Current assignee: Institute of High Energy Physics of CAS
Priority date: 2021-03-08
Filing date: 2021-03-08
Publication date: 2021-06-29
Anticipated expiration: 2041-03-08
Also published as: CN113050147B

Abstract

The invention discloses a batch test method for a read-out electronic board of an electromagnetic particle detector, which comprises the following steps: 1) the attenuator control module performs parameter configuration on the attenuator, and configures the duration of each frame signal of input electronics and the attenuation multiple of the corresponding frame signal; the test system sends K groups of configuration parameters of the electronics to each to-be-tested electronics; different addresses, anode step values and dynode step values of different electronics are provided; the scale voltages in different sets of configuration parameters are different; 2) the signal generated by the signal generator is input into an attenuator, the attenuator generates M-frame step change signals according to parameter configuration and sequentially inputs the M-frame step change signals into each electronics to be tested, and test data of each electronics under K different scale voltages are tested; 3) the testing system collects testing data of each electronics under K different scale voltages and processes the testing data to generate images so as to test the performance of each electronics. The invention reduces the test time and improves the test precision.

Description

Batch test method for read-out electronic boards of electromagnetic particle detector

Technical Field

The invention belongs to the technical field of accelerators, and relates to a batch test method for a read-out electronic board of an electromagnetic particle detector.

Background

The particle detector is an indispensable tool and means in nuclear physics, particle physics research and radiation application, wherein an electromagnetic particle detector (ED) is a novel detector for high-energy cosmic ray measurement and is widely applied to LHAASO at present, and for a mass-produced electromagnetic particle detector read-out electronic board, the performance needs to meet project requirements, so that each piece of electronics needs to be accurately tested for functions and performance. The old version of the test method for electronics is to connect the electronics with a signal generator, and the electronics transmit data to a PC to test the data.

The electronic board old version test method comprises a plurality of test steps of electronic test connection, DAQ starting, step adjustment, charge test, time test, step test, scale test, data processing and the like, one minute of manual timing is needed while signals with different amplitudes are generated by a manual operation signal generator, the signal generator is required to be changed for 16 times in total, so that the manual operation of a tester is always needed, the old data processing method is based on an LINUX system, the tester is required to manually generate and copy debugging configuration and trigger files, in the subsequent test steps, the operations of inquiring, modifying, opening, moving, running test files and the like all need code input operation, because the number of electronic boards is overlarge, the test method excessively depends on manual operation, huge manpower and time are consumed for each electronic board test, and the timing operation needs to depend on manual timing, the testing precision is difficult to guarantee.

Disclosure of Invention

Aiming at the technical problems in the prior art, the invention aims to provide a batch test method for a read-out electronic board of an electromagnetic particle detector. The method can be used for carrying out automatic batch test on the read-out electronic board of the electromagnetic particle detector, and comprises three parts of automatic test of attenuator hardware control, data acquisition and data processing; the testing process and an operating instrument do not need to be controlled manually, so that the labor cost is saved, the testing time is greatly reduced, and the testing precision is improved.

The technical scheme of the invention is as follows:

a batch test method for a read-out electronic board of an electromagnetic particle detector comprises the following steps:

1) the attenuator control module performs parameter configuration on the attenuator, and configures the duration of each frame signal of input electronics and the attenuation multiple of the corresponding frame signal; the test system sends K groups of configuration parameters of the electronics to each to-be-tested electronics; each group of configuration parameters of electronics comprises a threshold, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, scale starting, starting Start and ending Stop; different addresses, anode step values and dynode step values of different electronics are provided; the scale voltages in different sets of configuration parameters are different;

2) inputting a signal generated by a signal generator into the attenuator, generating M frame signals with amplitude step changes according to parameter configuration by the attenuator, sequentially inputting the M frame signals into each electronics to be tested, and testing test data of each electronics under K different scale voltages;

3) the testing system collects testing data of each electronics under K different scale voltages and processes the testing data to generate images so as to test the performance of each electronics.

Further, the method for the test system to send the K sets of configuration parameters of the electronics to each electronic device to be tested is as follows: the test system firstly sends the invariants in each group of configuration parameters to the corresponding electronics; the invariant comprises a threshold, an anode step, a dynode step, a slow control data updating interval and a data packet interval; then, in the data acquisition stage of the ith scale voltage, sending the scale voltage, starting the scale, starting the Start to each electronics and carrying out data acquisition, and then sending a Stop; wherein each of said electronics sends test data for each of the scale voltages to the test system in the form of a data packet.

Further, the processing method of the test system for the test data is as follows:

31) replacing a blank space in test data in each data packet with a null character, replacing a line change character with an English full stop character, connecting all data into a character string, and extracting effective data in the character string, wherein the effective data comprises five test values of an anode Q value, an anode step value, a dynode Q value, a dynode step value and arrival time; the arrival time is the difference of the arrival times of the data packets before and after the current data;

32) generating a corresponding histogram for each test value corresponding to the same electronics; and performing Gaussian fitting on each target test value array corresponding to the same electronics; in the Gaussian fitting method, the difference value between the maximum value and the minimum value of the array is calculated, division is carried out by taking 0.1 as a scale, the division value of the maximum value divided by the minimum value is taken as the cycle number, the minimum value plus 0.1 is taken as a shift parameter of the shift register in the cycle structure, and the minimum value plus 0.1 is taken as an x element of the Gaussian fitting cluster; then calculating the standard deviation sigma and the arithmetic mean mu of the data in the array, and simultaneously taking the histogram statistical x value group corresponding to the target test value as input to Gaussian fitting vi to obtain an amplitude A and an offset C; then passing through a Gaussian function

Obtain an array of y elements, X [ i ]]Is the distribution of x values; combining the y element array and the x element array into a Gaussian fitting cluster, combining the Gaussian fitting cluster corresponding to the same electronics and each histogram into a two-dimensional array cluster, and outputting the two-dimensional array cluster and each histogram into an x-y image to obtain a data image corresponding to the electronics; the target test value array comprises an array for storing anode Q values, an array for storing anode step values, an array for storing dynode Q values and an array for storing dynode step values;

33) and respectively performing linear fitting on the anode step values and the dynode step values under the K scale voltages.

Further, the method for extracting the effective data comprises the following steps: and searching 01 as a search keyword, intercepting a character string with the beginning of 01 and the end of aa, replacing English period characters in the intercepted character string with null characters, performing length comparison on the intercepted character string, and if the intercepted character string meets 160bits, keeping the character string as effective data.

Further, the attenuator adopts a stacked sequential structure to store the parameter configuration of the attenuator and is used for generating 16-frame signals with step change from 50mv to 10 v; the signal duration of each frame is 60000 ms.

Further, the signal generator generates a constant 10v signal; the attenuator is a mechanical step attenuator; the electronics are electromagnetic particle detectors.

A batch test system for a read-out electronics board of an electromagnetic particle detector is characterized by comprising a signal generator, an attenuator, electronics and a test system; the attenuator control module performs parameter configuration on the attenuator, and configures the duration of each frame of signal of input electronics and the attenuation multiple of the corresponding frame of signal; the test system sends K groups of configuration parameters of the electronics to each to-be-tested electronics; each group of configuration parameters of electronics comprises a threshold, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, scale starting, starting Start and ending Stop; different addresses, anode step values and dynode step values of different electronics are provided; the scale voltages in different sets of configuration parameters are different;

a signal generator for generating a PMT signal for testing electronic performance and transmitting it to the attenuator;

the attenuator is used for attenuating the received PMT signal according to parameter configuration to generate M frames of signals with amplitude step change and sequentially inputting the M frames of signals to each electronics to be tested;

the electronic device comprises electronics, a test system and a control circuit, wherein the electronics are used for generating test data under K different scale voltages according to an input signal and sending the test data to the test system;

and the test system is used for acquiring test data of each electronics under K different scale voltages and processing the test data to generate an image so as to test the performance of each electronics.

Compared with the prior art, the invention has the following effects:

1. improving automation

The invention is invented and created by a LabVIEW platform, combines hardware facilities such as an attenuator, a circuit board and the like, removes complicated manual operation, and improves the automation level of the test by handing over the test process to a computer.

2. Shorten the test time

According to the invention, the hardware equipment is controlled by a computer, so that all modules can be simultaneously performed, the manual operation time is shortened, and the whole test time is greatly shortened.

3. Improve the test accuracy

According to the invention, accurate measurement can be realized by automatically timing through a computer, and in the aspect of data processing, compared with the traditional test, effective data can be extracted, invalid data can be abandoned, and the precision of the test is improved.

Drawings

FIG. 1 is a test structure of the present invention;

fig. 2 is a software configuration diagram of the present invention.

Detailed Description

The present invention is described in further detail below with reference to the attached drawings.

The test environment generally includes a signal generator, a mechanical step (RSC) attenuator, electronics, and a test system. Signal generator the electronics was tested using an Agilent 81150a generator, which was used primarily to simulate PMT signals for testing electronics performance. The attenuator uses R & S RSC step attenuator, is a switchable mechanical step attenuator, has a frequency range up to 6GHz, 18GHz, 40GHz and 67GHz, a maximum attenuation range of 139.9dB and minimum step sizes of 0.1dB, 1dB and 5dB, and can effectively and stably attenuate signals. Electronics using electromagnetic particle detector (ED) electronics, a test structure is shown in fig. 1.

The test system mainly completes the tests of charge resolution, time resolution and integral nonlinearity of the electronic board through the signal generator and the attenuator, and completes the self-calibration function test of the system through configuring different parameters. The specific testing steps are as follows: connect signal generator signal output port and RSC attenuator signal input port, attenuator tail end is connected to the pc machine through the USB interface, and RSC attenuator signal output port is connected to the ED electronics, and the electronics is connected to the pc machine through the net twine port, and the switch on, test system operate on the pc machine, and the test can be accomplished in the operation test system.

Integral frame

The ED electronic test system is developed by adopting LabVIEW 2018 as a platform, and is integrally divided into three modules, namely an RSC attenuator control module, a data acquisition module and a data processing module. The data acquisition module comprises a parameter configuration module, a data sending module and a data acquisition module, the data processing module comprises a file processing module, a data extraction module, an image generation module and a straight line fitting module, and the overall structure diagram of the software is shown in figure 2.

1. Attenuator control module

The RSC Attenuator control module is responsible for controlling the attenuation decibel number of the Attenuator to automatically jump, the test relates to the amplitude change of 16 input signals from 50mv to 10v, a signal generator is used for generating input signals with constant 10v, the attenuation decibel number of the Attenuator is automatically controlled through a program so as to control the signals output to electronics to change from 50mv to 10v, Initialize.vi in a Rohde & Schwarz RSC Attenuator Controller instrument driver program is called for initialization of the Attenuator, the VISA resource name of the currently connected Attenuator can be checked through a VISA resource name interface for ID confirmation (because a plurality of attenuators are simultaneously connected, corresponding processing programs can have different functions, and therefore the ID confirmation program corresponds to the Attenuator one by one), the interface has an automatic refreshing function, the USB port number of the current selectable Attenuator can be checked in real time, and has an error information prompting function, VISA resource name output is connected with configuration authorization.vi for parameter transmission and parameter configuration, decibel numbers corresponding to attenuation times are set under the configuration authorization.vi, a laminated sequence structure is adopted, 16 frames are totally set, each frame is timed for 60000ms, and attenuation times corresponding to the current frame are set, so that 16 times of signal attenuation are completed. And outputting Error information which possibly appears through the Error-Query so as to be checked and debugged by a tester.

2. Data acquisition module

The ED electronics adopts a TCP/IP transmission method based on FPGA, transmission data comprises uplink data (the ED sends the data to a test system) and downlink data (the test system sends the data to the ED), the function of a data acquisition module comprises parameter configuration, data sending and data acquisition, and the function of the data acquisition module is to configure the parameters of the downlink data, send the downlink data and acquire the uplink data transmitted by a TCP/IP protocol to the local.

2.1 parameter configuration

The method comprises the steps of configuring register instruction parameters after electronics are powered on, wherein the parameters comprise 9 groups of data which are respectively a threshold value, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, scale starting, starting and ending Stop, the data format of each group is 64-bit hexadecimal character string, in order to meet the requirement of a TCP/IP protocol transmission data format, the transmission data format needs to be modified, the parameter configuration module has the function of modifying 16-bit hexadecimal character strings into 8-bit groups for decimal conversion to obtain one-dimensional arrays of 8 groups of data, then processing characters in the 8 groups of one-dimensional arrays to convert the data in each array into ASCII values, and then combining the converted values into a recombined ASCII character string of the parameters so that a system can perform subsequent operation.

2.2 data Transmission

The parameters configured by the parameter configuration module need to be sent to the electronics through a TCP/IP protocol, and each electronics has a unique IP address and different anode step values and dynode step value test requirements, so that for each electronics, the anode step values and the dynode step values are manually input by a tester. Meanwhile, each piece of electronics needs to test data under 14 different scale values in total, then processing and analyzing are carried out, scale voltage values in the 9 parameters mentioned above are different in each scale value, the other 8 parameter configurations do not need to be changed under the test condition of different scale values, therefore, for each piece of electronics, except for an anode step value and a dynode step value, the different scale voltage values and specific values of other fixed configuration parameters are automatically input by a background program and are subjected to parameter conversion, manual configuration of a tester is not needed, for 14 scales (each frame is subjected to 14 scale tests) of each piece of electronics board, 61 groups of parameters are written in a common direction TCP, and each group of parameters needs to be written in sequence at set time intervals (such as 1000ms) so as to be read by the electronics, and therefore, writing in of each group of parameters is cut off by adopting a sequence structure.

2.3 data acquisition

And transmitting the parameters to the electronics through a TCP/IP protocol, and then transmitting uplink data. The ED electronics will add hits data such as charge information and time information to the data packet header and data packet trailer for data identification, and will send the data packet header and data packet trailer to the TCP/IP module at a fixed time interval, so the testing system needs to acquire data transmitted by the ED electronics in real time through the TCP/IP on line to obtain real-time and effective testing data. The data acquisition module is internally coupled with a data sending module aiming at 4 groups of parameters of each scale node, and the specific flow is as follows: and sending scale voltage, starting sending scale, sending Start, collecting data, and sending Stop. The data acquisition part is connected with the data transmission module through ID by reading TCP data, can appoint the byte number and the reading time to read in a format with the width of 2 so as to match the data format transmitted from a network, and stores the output hexadecimal shaping character strings in a hard disk of a pc machine by a group of 8bits through a function of writing in a text file, and the address of the disk file is automatically allocated by a test system without manual input of a tester.

2.4 data processing

The data acquired by the data acquisition module needs to be processed by the data processing part and an image is generated so as to test the performance of electronics. The data processing part has the functions of file processing, data extraction, data analysis and straight line fitting, and has the functions of processing files stored in a data acquisition module, extracting effective data from the data in the files, analyzing the effective data to obtain an image, and fitting straight lines between the integral data scale points and the two step values to obtain an analysis result.

2.4.1 document processing

The data acquired by the data acquisition module is automatically stored in a hard disk of the pc, and the data is processed and analyzed by the hard disk, and the data is firstly extracted into a test system by the file processing module. The method comprises the steps of automatically opening a data file through a file dialog box, reading data or character strings from a local hard disk through a text processing function, setting a reading format by a user, and adopting default numerical values, namely default numerical values are all read. Since the data storage format in the local text file is in a storage mode with one line of 8bits, the data format in the file needs to be processed. The storage format in the text document can be replaced with a standard character string format by replacing the blank space in the text with a blank character and replacing the line feed character with an English full stop character using the search replacement character string, with each 8bits separated by one English full stop character. After all data are connected into character strings, effective data in the data are extracted, data sent by electronics through TCP/IP comprise slow control data, updated information data, invalid data such as register read-back data and the like, and therefore the acquired data need to be extracted for subsequent processing and analysis of a program. The packet format is shown in table 1, the header format is shown in table 2, and the trailer format is shown in table 3.

Table 1 packet format

Data head	Data of	Data tail
			8bits	160bits	8bits

TABLE 2 data header Format

TABLE 3 data Tail Format

	Length (bit)	Description of the invention
			Fixed data	1	0xaa

As can be seen from table 1, table 2, and table 3, the valid data required for the test, i.e., hits data, is data with a length of 160bits beginning in the hexadecimal character form 01 and ending in the hexadecimal character form aa. Therefore, 01 is used as a search keyword to search through a search splitting character string function, a character string ending at aa is intercepted through the intercepted character string, English period characters are replaced by null characters, the length of the intercepted character string is compared, and meanwhile effective character strings meeting two conditions of 160bits and 01 ending at aa are adopted by the system. The algorithm adopts a while loop structure, and the loop ending condition is that the read character is empty, namely the data in the file is completely read by the system. The algorithm can quickly and accurately extract effective data of the data sent by the TCP in electronics.

2.4.2 data extraction

After the effective data character strings are reintegrated through file processing, five test values in the extracted effective data are analyzed, the data head, the data tail and the unnecessary data part are removed according to the table 1, and the data structure of the data center part 160bits is shown in the table 4.

TABLE 4 data Structure

As can be seen from table 4, the five test values of the anode Q value, the anode step value, the dynode Q value, the dynode step value and the arrival time are respectively located at 6 to 10 bits, 10 to 14 bits, 16 to 20 bits, 20 to 24 bits and 24 to 40 bits in the 40-byte hexadecimal character string data. Therefore, five test values in all hits data in the file are extracted by the data extraction module. The data in the file is processed through the file processing module to obtain a character string array containing a hits data center part 160bits data character string, the character strings in the character string array are sequentially intercepted according to the positions, the algorithm adopts for circulation to take the array length as the number of circulation times, the auto-increment variable as the index array subscript to obtain the character string corresponding to the index, then the character string corresponding to five test values is intercepted according to the position, the character string is used as a parameter to be transmitted to a hexadecimal character string to be converted into a decimal character and stored in the decimal character string array. The arrival time data value requires the difference between the arrival time before and after calculation of each data packet, so the algorithm is to calculate the data difference between the index subscript and the index subscript plus 1 by subtracting 1 from the cycle number. Five arrays of target values in the data file for each scale may be extracted by the data extraction module.

2.4.3 data analysis

For 5 arrays obtained by data extraction (values of each test value of the same electronics at different scales are stored in a corresponding array, for example, values of an anode Q value of the same electronics at different scales are stored in an anode Q value array), the time difference array directly adopts a histogram function in LabVIEW to perform image generation, and the rest 4 arrays not only adopt the histogram to perform image generation, but also need to perform Gaussian fitting on the data to obtain a fitting result. For the histogram part, the number of different numbers of the array is input into a histogram function as a histogram interval, the number in the array is used as an x-axis abscissa value of the histogram distribution, the count is used as a y-axis ordinate value to be bound into a cluster, and the cluster is combined with the cluster obtained by a Gaussian fitting algorithm to form a two-dimensional cluster array. For a Gaussian fitting part, the ED electronics board generates and is received by a test system, namely the anode Q value, the anode step value, the dynode Q value and the dynode step value except the time difference are mentioned above, the number of different values, namely the number of histogram x values, can reach 4 at least, for the image processing function provided by LabVIEW, Gaussian fitting is carried out on 4 value points and an x-y diagram is generated, only the 4 points can be connected in sequence, and the generated image cannot meet the test requirement, so the data analysis module carries out algorithm improvement on LabVIEW Gaussian fitting treatment, and the specific improvement method is as follows: calculating a difference value between a maximum value and a minimum value of an array, dividing by taking 0.1 as a scale, taking a division value of the maximum value divided by the minimum value as a for-cycle number, adding 0.1 to the minimum value as a shift parameter of a shift register in a cyclic structure, outputting the cyclic body by an automatic index tunnel, taking the minimum value after adding 0.1 as an x element of a Gaussian fitting cluster, converting the data type of the array into a dynamic data type which can be used by a statistical function by converting the array into the dynamic type, connecting the array into statistics by taking the array as a signal, calculating to obtain a standard deviation sigma and an arithmetic mean mu of the data, taking a group of x values of the histogram statistics as an input to the Gaussian fitting function to obtain an amplitude A and an offset C, and obtaining the amplitude A and the offset C by using a Gaussian:

obtaining a y element array, combining the y element array with the x element array to form a Gaussian fitting cluster, combining the Gaussian fitting cluster with a histogram cluster to form a two-dimensional array cluster, and outputting the two-dimensional array cluster to an x-y diagram, namely obtaining a data image through a test system; where X [ i ] is the distribution of X values. For 4 points, an effective Gaussian image cannot be simulated by the traditional method of a labview development tool, and a smooth and effective Gaussian fitting curve can be simulated by adopting the method of the invention under the condition of 4 points at the minimum.

2.4.4 straight line fitting

The testing needs to obtain anode step values and dynode step values under 14 scales and obtain straight line fitting results, Gaussian fitting center values of the anode step values and the dynode step values obtained under 14 scales are stored in a local file respectively, and after the 14 scales are tested by a testing system, a straight line fitting module conducts straight line fitting on two groups of values with 28 points in total to obtain respective straight line fitting results of two data. The specific implementation method comprises the following steps: the step value array of each scale point is obtained through the data processing module, the histogram X value and the histogram count value obtained after histogram processing are respectively used as X and y values of Gaussian fitting to be input, the central value of the step value is obtained through histogram function calculation, the central value is subjected to numerical value to decimal character conversion so as to facilitate subsequent processing, and the specific processing algorithm is as follows: space characters are added in front of the character string of the central value of each scale, then line-changing symbols are added, the character string is stored in a text file in the format, data in the text file are detected in real time by adopting a circulating structure, if 14 numerical values are reached, data analysis is carried out on the file by adopting for circulation, the beginning of the space symbol is searched for the data in the file, the character string at the end of the line-changing symbols is changed, the obtained step value character string is stored in an array by automatic indexing, the step value array and the set scale array are bound into a cluster, and the cluster is output in the format of an x-y diagram.

The foregoing is a more detailed description of the present application in connection with specific embodiments thereof, and it is not intended that the present application be limited to the specific embodiments thereof. It will be apparent to those skilled in the art from this disclosure that many more simple derivations or substitutions can be made without departing from the inventive concepts herein.

Claims

1. A batch test method for a read-out electronic board of an electromagnetic particle detector comprises the following steps:

2. The method of claim 1, wherein the test system sends K sets of configuration parameters for the electronics to each of the electronics under test by: the test system firstly sends the invariants in each group of configuration parameters to the corresponding electronics; the invariant comprises a threshold, an anode step, a dynode step, a slow control data updating interval and a data packet interval; then, in the data acquisition stage of the ith scale voltage, sending the scale voltage, starting the scale, starting the Start to each electronics and carrying out data acquisition, and then sending a Stop; wherein each of said electronics sends test data for each of the scale voltages to the test system in the form of a data packet.

3. The method of claim 1 or 2, wherein the test system processes the test data by:

4. The method of claim 3, wherein the valid data is extracted by: and searching 01 as a search keyword, intercepting a character string with the beginning of 01 and the end of aa, replacing English period characters in the intercepted character string with null characters, performing length comparison on the intercepted character string, and if the intercepted character string meets 160bits, keeping the character string as effective data.

5. The method of claim 1, wherein the attenuator stores a parameter configuration of the attenuator in a stacked sequential configuration for generating a 16 frame signal that varies in steps from 50mv to 10 v; the signal duration of each frame is 60000 ms.

6. The method of claim 1, wherein the signal generator generates a constant 10v signal; the attenuator is a mechanical step attenuator; the electronics are electromagnetic particle detectors.

7. A batch test system for a read-out electronics board of an electromagnetic particle detector is characterized by comprising a signal generator, an attenuator, electronics and a test system; the attenuator control module performs parameter configuration on the attenuator, and configures the duration of each frame of signal of input electronics and the attenuation multiple of the corresponding frame of signal; the test system sends K groups of configuration parameters of the electronics to each to-be-tested electronics; each group of configuration parameters of electronics comprises a threshold, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, scale starting, starting Start and ending Stop; different addresses, anode step values and dynode step values of different electronics are provided; the scale voltages in different sets of configuration parameters are different;

8. Such as rightThe system of claim 7, wherein the test system processes the test data by: replacing blank spaces in test data in each data packet with empty characters, replacing line-changing characters with English full stop characters, connecting all data into character strings, and extracting effective data in the character strings, wherein the effective data comprises five test values of an anode Q value, an anode step value, a dynode Q value, a dynode step value and arrival time; the arrival time is the difference of the arrival times of the data packets before and after the current data; then generating a corresponding histogram for each test value corresponding to the same electronics; and performing Gaussian fitting on each target test value array corresponding to the same electronics; in the Gaussian fitting method, the difference value between the maximum value and the minimum value of the array is calculated, division is carried out by taking 0.1 as a scale, the division value of the maximum value divided by the minimum value is taken as the cycle number, the minimum value plus 0.1 is taken as a shift parameter of the shift register in the cycle structure, and the minimum value plus 0.1 is taken as an x element of the Gaussian fitting cluster; then calculating the standard deviation sigma and the arithmetic mean mu of the data in the array, and simultaneously taking the histogram statistical x value group corresponding to the target test value as input to Gaussian fitting vi to obtain an amplitude A and an offset C; then passing through a Gaussian function

Obtain an array of y elements, X [ i ]]Is the distribution of x values; combining the y element array and the x element array into a Gaussian fitting cluster, combining the Gaussian fitting cluster corresponding to the same electronics and each histogram into a two-dimensional array cluster, and outputting the two-dimensional array cluster and each histogram into an x-y image to obtain a data image corresponding to the electronics; the target test value array comprises an array for storing anode Q values, an array for storing anode step values, an array for storing dynode Q values and an array for storing dynode step values; and respectively performing linear fitting on the anode step values and the dynode step values under the K scale voltages.

9. The system of claim 8, wherein the valid data is extracted by: and searching 01 as a search keyword, intercepting a character string with the beginning of 01 and the end of aa, replacing English period characters in the intercepted character string with null characters, performing length comparison on the intercepted character string, and if the intercepted character string meets 160bits, keeping the character string as effective data.

10. The system of claim 7, wherein the attenuator stores a parameter configuration of the attenuator in a stacked sequential configuration for generating a 16 frame signal that varies in steps from 50mv to 10 v; the signal duration of each frame is 60000 ms.