CN112114224A - Automatic test system of device to be tested - Google Patents
Automatic test system of device to be tested Download PDFInfo
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- CN112114224A CN112114224A CN202010914782.5A CN202010914782A CN112114224A CN 112114224 A CN112114224 A CN 112114224A CN 202010914782 A CN202010914782 A CN 202010914782A CN 112114224 A CN112114224 A CN 112114224A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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Abstract
The application discloses automatic test system of device under test, wherein, the system includes: the board to be tested is used for placing a device to be tested; the test instrument is used for measuring the state data of the device to be tested; the MCU switch control board is respectively connected with the board to be tested and the test instrument and is used for detecting the device to be tested according to the built-in PIN to be tested; and the computer is respectively connected with the test instrument and the MCU switch control board and is used for controlling the switching of the PIN to be tested in the MCU switch control board and the switching of the test instrument, acquiring the state data from the test instrument, comparing the state data with preset data and outputting a test result. Therefore, the efficiency of verifying the passive device can be greatly improved, the problem of testing can be accurately positioned, the reliability and the accuracy of testing are greatly improved, and the service life verification efficiency of the device is improved.
Description
Technical Field
The application relates to the technical field of testing, in particular to an automatic test system of a device to be tested.
Background
Along with more and more materials used by products are introduced into suppliers, material quality testing is more and more important; the conventional method for verifying the materials by the project integral test in the project has low accuracy and poor efficiency; in particular, materials with performance reduction but no failure problem can not be verified, and meanwhile, failure positioning is very difficult and complex and extremely low in efficiency.
In the related technology, the introduction and the test of the materials are the tests of the functions, the performances and the service lives of finished products placed in finished product equipment; because the test is carried out in a project, the total test time is generally 3-6 months (project test period) and the test problem is very difficult to locate (the performance is the finished product problem);
however, the test method in the related art not only has low efficiency in project verification of the passive device, but also cannot accurately find the reliability problem in the project verification, has low life verification efficiency, and cannot accurately position.
Content of application
The application provides an automatic test system of device to be tested, not only can promote the efficiency of verifying passive device greatly, can pinpoint the problem of test moreover, improves the reliability and the accuracy of test greatly, promotes the life-span verification efficiency of device.
An embodiment of a first aspect of the present application provides an automatic test system for a device under test, including:
the device comprises a board to be tested, a first circuit board and a second circuit board, wherein the board to be tested is used for placing a device to be tested;
the test instrument is used for measuring state data of the device to be tested;
an MCU (micro controller Unit) switch control panel, which is respectively connected with the board to be tested and the test instrument and is used for detecting the device to be tested according to a built-in PIN to be tested; and
and the computer is respectively connected with the test instrument and the MCU switch control board and is used for controlling the switching of the PIN to be tested in the MCU switch control board and the switching of the test instrument, acquiring the state data from the test instrument, comparing the state data with preset data and outputting a test result.
Optionally, the MCU switch control board includes: a relay;
the computer is specifically configured to: and controlling the relay switch to switch the PIN to be tested according to the type of the device to be tested. Optionally, the test meter comprises: any one or more of a digital bridge, a voltage source meter and a current source meter.
Optionally, the status data includes: any one or more of an IV (current/voltage) curve, a resistance-capacitance sensing critical parameter.
Optionally, the computer is connected to the MCU switch control board through a USB (Universal Serial Bus).
Optionally, the device to be tested is a passive device and a PN characteristic device of the passive device.
Optionally, the computer comprises:
and the display module displays the test result through a human-computer interactive interface.
Optionally, the computer further includes:
and the voice module prompts an operation instruction, a test result, an alarm or an error through voice.
The automatic test system of the device to be tested comprises a board to be tested, a computer, an MCU switch control board, a test instrument and a control board, wherein the board to be tested is arranged on the board to be tested, the MCU switch control board is controlled by the computer to be switched to a PIN to be tested, the PIN is identical to the PIN to be tested, the test instrument is controlled to be switched to an instrument corresponding to the device to be tested for testing, and a test result is output after state data acquired from the test instrument is compared with preset. Therefore, the efficiency of verifying the passive device can be greatly improved, the problem of testing can be accurately positioned, the reliability and the accuracy of testing are greatly improved, and the service life verification efficiency of the device is improved. .
Additional aspects and advantages of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the present application.
Drawings
The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic structural diagram of an automatic test system for a device under test according to an embodiment of the present application.
Detailed Description
Reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application.
An automatic test system for a device under test according to an embodiment of the present application is described below with reference to the drawings.
Specifically, fig. 1 is a schematic structural diagram of an automatic test system for a device under test according to an embodiment of the present disclosure.
As shown in fig. 1, the automatic test system 10 for a device under test includes: the device comprises a board to be tested 100, a test instrument 200, an MCU switch control board 300 and a computer 400.
The board 100 to be tested is used for placing a device to be tested. Test meter 200 is used to measure status data of a device under test. The MCU switch control board 300 is respectively connected with the board to be tested 100 and the test instrument 200, and is used for detecting the device to be tested according to the built-in PIN to be tested. The computer 400 is connected to the test instrument 200 and the MCU switch control board 300, respectively, and is configured to control switching of the PIN to be tested in the MCU switch control board 300 and switching of the test instrument 200, obtain status data from the test instrument 200, compare the status data with preset data, and output a test result. The preset data may be data preset by a user, data acquired through limited experiments, or data obtained through limited computer simulation.
Optionally, in some embodiments, the device under test may be a passive device and a PN feature device. Among them, passive devices are an important class of microwave radio frequency devices, and play a very important role in microwave technology. The passive devices mainly comprise resistors, capacitors, inductors, converters, graduators, matching networks, resonators, filters, mixers, switches and the like.
Specifically, as shown in fig. 1, the board under test 100 may be placed with most PN devices, such as diodes, transistors, MOSFETs; or most passive devices, such as resistance-capacitance sensing various IV curve characteristic devices, are placed.
Various test meters may be placed in test meter 200. Optionally, in some embodiments, test meter 200 includes: any one or more of a digital bridge, a voltage source meter and a current source meter. It should be noted that, the working principle of the digital bridge, some test methods of the voltage source meter and the current source meter are the same as those in the related art, and are not described in detail herein to avoid redundancy.
Optionally, in some embodiments, the test meter 200 may measure status data of the device under test, and the status data may include: IV curve, resistance-capacitance induction key parameter.
Specifically, the resistance-capacitance inductance can be measured by a digital bridge according to the embodiment of the application; the I/V characteristics of diodes (diode devices including various diode characteristics), piezoresistors, NTC PTC, triodes, MOSFETs and the like are measured through a voltage source meter and a current source meter.
Optionally, in some embodiments, the MCU switch control board 300 includes: a relay; the computer 400 is specifically configured to: and controlling a relay switch to switch the PIN to be tested according to the type of the device to be tested.
It can be understood that the working principle of the relay is that a certain voltage is applied to two ends of a coil, the coil can generate current, so that an electromagnetic effect is generated, an armature can overcome the pulling force of a return spring under the action of the electromagnetic force and is attracted to an iron core, so that a movable contact of the armature is driven to be attracted with a stationary contact (normally open contact), and after the coil is powered off, the armature can make the movable contact be attracted with the original stationary contact (normally closed contact), so that the purposes of conducting and cutting off in a circuit are achieved.
Therefore, after the type of the device to be tested is determined, different PIN to be tested can be selected in the MCU switch control board by controlling the relay, and therefore the device to be tested can be tested.
Alternatively, in some embodiments, the computer 400 may be connected to the MCU switch board 300 via USB.
It can be understood that, the computer 400 is connected to the MCU switch control board 300 through the USB, which not only can supply power to the MCU switch control board 300, but also can communicate with the MCU switch control board 300 to control the MCU switch control board 300, for example, the computer 400 can control the operation of the relay in the MCU switch control board 300.
Optionally, in some embodiments, the computer 400 comprises: and a display module. The display module displays the test result through a human-computer interactive interface.
It can be understood that the embodiment of the application can display the test state, the test curve, the analyzed test result data and the current test product index specification information through the provided human-computer interactive interface, and guide the user operation and the product test result.
Optionally, in some embodiments, the computer 400 further comprises: and a voice module. Wherein, the voice module prompts an operation instruction, a test result, an alarm or an error through voice.
It should be understood that the embodiment of the present application may be pre-installed with a live voice library in the computer 400, and the present application may connect with the TTS speech engine and control the voice library to issue a required prompt voice, for example, to prompt a user how to operate, prompt a test result, alarm or error prompt.
According to the automatic test system of the device to be tested, the device to be tested is placed on the board to be tested, the MCU switch control board is controlled by the computer to be switched to the PIN to be tested, the PIN is the same as the device to be tested, the test instrument is controlled to be switched to the instrument corresponding to the device to be tested, and the test result is output after the state data acquired from the test instrument is compared with the preset data. Therefore, the efficiency of verifying the passive device can be greatly improved, the problem of testing can be accurately positioned, the reliability and the accuracy of testing are greatly improved, and the service life verification efficiency of the device is improved.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or N embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "N" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more N executable instructions for implementing steps of a custom logic function or process, and alternate implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of implementing the embodiments of the present application.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or N wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present application may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc. Although embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present application, and that variations, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present application.
Claims (8)
1. An automatic test system for a device under test, comprising:
the device comprises a board to be tested, a first circuit board and a second circuit board, wherein the board to be tested is used for placing a device to be tested;
the test instrument is used for measuring state data of the device to be tested;
the MCU switch control board is respectively connected with the board to be tested and the test instrument and is used for detecting the device to be tested according to the built-in PIN to be tested; and
and the computer is respectively connected with the test instrument and the MCU switch control board and is used for controlling the switching of the PIN to be tested in the MCU switch control board and the switching of the test instrument, acquiring the state data from the test instrument, comparing the state data with preset data and outputting a test result.
2. The system of claim 1, wherein the MCU switch control board comprises: a relay;
the computer is specifically configured to: and controlling the relay switch to switch the PIN to be tested according to the type of the device to be tested.
3. The system of claim 1, wherein the test meter comprises: any one or more of a digital bridge, a voltage source meter and a current source meter.
4. The system of claim 1, wherein the status data comprises: IV curve, resistance-capacitance induction key parameter.
5. The system of claim 1, wherein the computer is connected to the MCU switch control board via USB.
6. The system of claim 1, wherein the device under test is a passive device and is a passive device PN feature device.
7. The system of claim 1, wherein the computer comprises:
and the display module displays the test result through a human-computer interactive interface.
8. The system of claim 1, wherein the computer further comprises:
and the voice module prompts an operation instruction, a test result, an alarm or an error through voice.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202010914782.5A CN112114224A (en) | 2020-09-03 | 2020-09-03 | Automatic test system of device to be tested |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010914782.5A CN112114224A (en) | 2020-09-03 | 2020-09-03 | Automatic test system of device to be tested |
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| CN112114224A true CN112114224A (en) | 2020-12-22 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112798864A (en) * | 2020-12-31 | 2021-05-14 | 徐州淮远电子科技有限公司 | Automatic testing device and sorting device for equivalent impedance of MOSFET (metal-oxide-semiconductor field effect transistor) |
| CN113158937A (en) * | 2021-04-28 | 2021-07-23 | 合肥移瑞通信技术有限公司 | Sleep monitoring method, device, equipment and readable storage medium |
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Application publication date: 20201222 |