CN107505520B - Scene type intelligent automatic test platform and method - Google Patents
Scene type intelligent automatic test platform and method Download PDFInfo
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- CN107505520B CN107505520B CN201710631990.2A CN201710631990A CN107505520B CN 107505520 B CN107505520 B CN 107505520B CN 201710631990 A CN201710631990 A CN 201710631990A CN 107505520 B CN107505520 B CN 107505520B
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- G—PHYSICS
- G01—MEASURING; TESTING
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Abstract
The invention discloses a scene-type intelligent automatic test platform and a method, wherein the platform comprises a test function virtual module, a test case module, an interface module and a test report generation module, wherein the test function virtual module is used for setting a description method and parameters of a test scene so as to enable the test function virtual module to be used for testing different types of equipment; the test function virtual module comprises a plurality of test function sub-modules; the test case module is used for generating a test case file corresponding to the device to be tested according to the parameters of the test function sub-module; the interface module comprises a driving interface module which is used for being connected with signals of different testing instruments to control the output and feedback of the testing instruments and a platform interface module which is in communication connection with different types of devices to be tested; the test report generation module is used for calling the tester interface module to control the tester to output the test quantity, calling the communication interface module of the device to be tested to receive the data of the automatic test, and inputting the data according to a specified format.
Description
Technical Field
The invention relates to an intelligent test method, in particular to a scene type intelligent automatic test platform and a scene type intelligent automatic test method.
Background
With the rapid development of electronic technology and smart grid, the reliability and stability of the operation of smart devices are very important. Each function of each device (e.g., relay protection device, power quality monitoring device, voltage monitor, tester, etc.) requires rigorous testing. Meanwhile, the functions of each device are associated with each other, and cross test is needed, so that the test complexity is very high, and the test period is long.
Currently, automatic test systems for a single type of device have appeared, but due to the wide variety of devices, based on various test applications for different types of devices, the existing automatic test software has insufficient expandability and flexibility, and according to the current method, a set of automatic test systems needs to be developed independently for different applications, so that the development workload is large, time and labor are consumed, and the management and maintenance are not easy to perform; the test reports of various types of devices have the defects of non-uniform report data, non-standardization and inconvenient management, and cannot meet the requirements of future big data application.
Disclosure of Invention
In order to solve the problems in the prior art, a scene-type intelligent automatic testing method and an automatic testing platform for implementing the method are provided.
The technical scheme is as follows: the utility model provides a scene formula intelligence automatic test platform which characterized in that includes:
the test function virtual module can be used for testing different types of equipment by setting a description method and parameters of a test scene; the test function virtual module comprises a plurality of test function sub-modules, each test function sub-module comprises a plurality of function parameters for virtualizing a test scene, a data type library for describing data types of the function parameters, and a communication command library for communicating with a device to be tested;
the test case module is used for generating a test case file corresponding to the device to be tested according to the parameters of the test function sub-module;
the interface module comprises a driving interface module which is used for being connected with signals of different test instruments to control the output and feedback of the test instruments and a platform interface module which is in communication connection with different types of devices to be tested;
and the test report generation module is used for calling the tester interface module to control the tester to output the test quantity, calling the communication interface module of the device to be tested to receive the automatically tested data and inputting the automatically tested data according to a specified format.
According to an aspect of the present invention, the scene-based intelligent automatic test platform further includes a scene switching module, configured to receive a predetermined switching signal for input, or call a corresponding test case file according to signals of the test instrument and the device under test, so as to switch the test scene.
According to one aspect of the invention, the functional parameter data type definition library comprises various fault parameter types under a test scene, such as fault types, fault directions, change modes and the like.
According to one aspect of the invention, the library of communication commands includes a read value, a write value, a read control word, a write control word, and a read measurement.
A scene type intelligent automatic test method comprises the following steps:
firstly, designing test scenes aiming at different types of equipment to be tested, and determining a description method and description parameters of each test scene;
secondly, performing data description on each test scene, and describing each test scene by designing a function library, parameters of each function, data types of the function parameters and a communication command library; setting driving interfaces for controlling the output and feedback of different types of test instruments under different scenes and platform interfaces for communicating with different types of tested devices;
thirdly, generating a test case file according to the data of each test scene;
fourthly, calling a corresponding test case file according to the type and the parameters of the device to be tested and/or the test instrument, and starting test work;
and fifthly, generating a test report and outputting the test report according to a preset format.
According to an aspect of the present invention, in the fourth step, the type and parameters of the device under test and/or the test instrument are acquired by the automatic test platform or input by the tester.
According to an aspect of the present invention, in the fourth step, after the test case file is called, the command in the device test case file is executed, a standardized test instrument driving interface is selected and executed according to the type of the test instrument to control the output and feedback of different types of test instruments, and a standardized communication protocol platform is selected according to the type of the device to be tested to communicate with the device to be tested, so as to complete the automatic test.
According to one aspect of the invention, when the test instrument and/or the device to be tested is replaced, the test scene is switched according to the received switching signal input by the user or the received signal of the test instrument or the device to be tested, the test case file is called again, and the steps from three to five are executed.
According to one aspect of the invention, when the test scene needs to be switched, an intelligent judgment step is further provided between the second step and the third step: the test instrument and/or the equipment to be tested upload the model information of the test instrument and/or the equipment to be tested to the automatic test platform, and the automatic test platform judges which test scene is adopted according to the relevant information and switches the test scene.
Has the advantages that:
from the testing angle of various types of devices, abstracting various application scenes, carrying out standardized processing on different testing instrument driving interfaces, and carrying out platformization on the communication of different types of tested devices.
And secondly, selecting a test instrument driving interface for executing standardization to control output and feedback of different types of test instruments according to the types of the test instruments, selecting a standardized communication protocol platform to communicate with the tested device according to the types of the tested device, completing automatic test and generating a test report. The branch of academic or vocational study is fast carried out the switching and the extension of many applications, realizes the automatic test to each type device.
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Fig. 1 is a schematic diagram of the principle of the present invention.
Detailed Description
The present invention is described with reference to fig. 1, and firstly, to solve the disadvantages of the prior art that the variety of devices is various, the standardization level of the prior testing system is low, the expandability and flexibility are insufficient, and multi-scenario, multi-function and platform testing is difficult to achieve. A new solution is proposed.
According to the scheme, firstly, a testing device and a testing scene are analyzed, different testing scenes are divided, and corresponding testing scenes are described by setting testing parameters, so that multifunctional testing and standardized testing are realized.
Firstly, based on the testing principle, setting and describing scenes of different types of applications are performed:
1. and constructing a standard library of the test function definition of the tested object, wherein each tested device has different test functions, and abstracting different test function data interface standardized descriptions according to actual application.
2. Constructing a test parameter data type definition library: various parameter data types for a particular test function are described. Such as fault type, fault direction, change pattern, etc.
3. And constructing a standard library for communication command definition of the object to be tested. Communication with each device is required, a description of the communication commands, in the case of the protection device, read-set values, write-set values, read control words, write control words, read measurements, etc. are required.
4. The method comprises the following steps of constructing and realizing standardized tester interface drive of tester equipment: for controlling the output and feedback of different types of test instruments.
5. Constructing and realizing a standardized communication protocol platform interface: for communicating with different types of devices under test.
Then, according to the test scene, a tested object test function module, a test parameter data type and a tested object communication command definition standard library are established to generate different types of device test case files, the automatic test platform executes commands in the device test case files according to the device test case files, selects a standardized test instrument drive interface to control output and feedback of different types of test instruments according to the types of the test instruments, selects a standardized communication protocol platform to communicate with the tested device according to the types of the tested device, completes automatic test and generates a standard test report.
In a further embodiment, the scenario construction specifically includes abstracting an analysis to refine the test scenario for different types of device tests; and constructing a description method and a storage format of the test scene. The automatic test system completes the test function of various applications and generates test cases; designing communication with different types of devices; and designing and controlling different test devices to output and feed back signals. The method mainly comprises two modes of switching different application scenes, wherein one mode is that a tester inputs a switching signal to an automatic test platform according to information such as the model of a test instrument and/or equipment to be tested, and the automatic test platform calls a corresponding test case file after receiving the automatic switching signal to complete scene switching. The other is that the automatic test platform is provided with an intelligent detection and switching module, after the test instrument and the equipment to be tested are connected, the information such as the model of the test instrument and/or the equipment to be tested can be automatically acquired, and the type of the test case file to be called is judged according to the information, so that the test scene switching is completed.
Examples are as follows: under a certain scene, the automatic test system of the relay protection device needs to be quickly switched to the automatic test system of the power quality monitoring device.
And re-defining the automatic test scene of the power quality monitoring device:
step 1, constructing a test function description standard library of the tested object. Each tested device has different testing functions, and different testing function data interface standardized descriptions are abstracted according to actual application.
Step 2, constructing a test parameter data type description library: various parameter data types are described for specific test functions. Such as fault type, fault direction, change pattern, etc.
And 3, constructing a communication command standard library of the object to be tested. Communication with each device is required, a description of the communication commands, in the case of the protection device, read-set values, write-set values, read control words, write control words, read measurements, etc. are required.
And 4, constructing and realizing the interface drive of the standardized tester of the tester equipment: for controlling the output and feedback of different types of test instruments.
Step 5, establishing and realizing a standardized communication protocol platform interface: for communicating with different types of devices under test.
In a word, the invention abstracts each application scene from the test angle of each type of device, standardizes the driving interfaces of different test instruments and standardizes and platformizes the communication of different types of tested devices. According to the type of the test instrument, the standardized test instrument driving interface is selected to control the output and feedback of different types of test instruments, and the standardized communication protocol platform is selected to communicate with the tested device according to the type of the tested device, so that the automatic test is completed, and a standard test report is generated. Therefore, multi-application switching and expansion are rapidly carried out, and automatic testing of various types of devices is realized. 1. Various types of device test reports and reporting data are standardized. 2. It is easier to develop an automatic test system for new types of devices. 3. Only one system is maintained (prior art systems maintain one system for each type of device).
The invention is suitable for the intelligent automatic test of another device by using an instrument, which comprises the following devices: the intelligent automatic test system platform is characterized in that various application scenes are abstractly constructed by loading a relay protection device, an electric energy quality monitoring device, a voltage monitor, a tester, a meter and the like, and an automatic test platform loads one of the scenes, so that intelligent automatic test on one device can be realized, the aim of rapidly generating various applications is fulfilled, the workload of independently developing automatic test programs of various devices is reduced, and the intelligent automatic test system platform for uniformly and flatly managing the various devices is formed.
Claims (6)
1. The utility model provides a scene formula intelligence automatic test platform which characterized in that includes:
the test function virtual module can be used for testing different types of devices by setting a description method and parameters of a test scene; the test function virtual module comprises a plurality of test function sub-modules, each test function sub-module comprises a plurality of function parameters for virtualizing a test scene, a data type library for describing data types of the function parameters, and a communication command library for communicating with a device to be tested;
the scene switching module is used for receiving an input preset switching signal or calling a corresponding test case file according to signals of the test instrument and the device to be tested and switching a test scene;
the test case module is used for generating a file corresponding to the device to be tested for testing according to the parameters of the test function sub-module;
the interface module comprises a driving interface module which is used for being connected with signals of different test instruments to control the output and feedback of the test instruments and a platform interface module which is in communication connection with different types of devices to be tested;
and the test report generation module is used for calling the tester interface module to control the tester to output the test quantity, calling the communication interface module of the device to be tested to receive the automatically tested data and inputting the automatically tested data according to a specified format.
2. The intelligent and automatic scenic test platform as claimed in claim 1, wherein the database of data types includes various fault parameter types under test scenes, and the fault parameter types include fault type, fault direction and change mode.
3. The intelligent, episodic automated test platform of claim 1 wherein the library of communication commands comprises read values, write values, read control words, write control words, and read measurements.
4. A scene type intelligent automatic test method is characterized by comprising the following steps:
firstly, designing test scenes aiming at different types of devices to be tested, and determining a description method and description parameters of each test scene;
secondly, performing data description on each test scene, and describing each test scene by designing a function library, parameters of each function, data types of the function parameters and a communication command library; setting driving interfaces for controlling output and feedback of different types of test instruments under different scenes and platform interfaces for communicating with different types of devices to be tested;
thirdly, generating a test case file according to the data of each test scene;
fourthly, calling a corresponding test case file according to the type and the parameters of the device to be tested and/or the test instrument, and starting test work; after the test case file is called, executing a command in the test case file of the device, selecting a drive interface of the execution standardized test instrument according to the type of the test instrument to control the output and feedback of different types of test instruments, and selecting a standardized communication protocol platform according to the type of the device to be tested to communicate with the device to be tested so as to complete automatic test;
fifthly, generating a test report and outputting the test report according to a preset format;
and when the test instrument and/or the device to be tested are replaced, switching the test scene according to a received switching signal input by a user or a received signal of the test instrument or the device to be tested, recalling the test case file, and executing the steps from three to five.
5. The intelligent scene-based automatic test method according to claim 4, wherein in the fourth step, the type and parameters of the device under test and/or the test instrument are acquired by the automatic test platform or input by a tester.
6. The intelligent scene-based automatic test method according to claim 4, wherein when the test scene needs to be switched, an intelligent judgment step is further provided between the second step and the third step:
the test instrument and/or the device to be tested upload the model information of the test instrument and/or the device to be tested to the automatic test platform, and the automatic test platform judges which test scene is adopted according to the relevant information and switches the test scene.
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| CN108061833B (en) * | 2017-12-14 | 2020-12-22 | 南京能云电力科技有限公司 | Test instrument automatic detection system and method based on virtual test instrument interface module |
| CN108933711B (en) * | 2018-06-29 | 2021-06-18 | 华勤技术股份有限公司 | Automatic testing method and system for terminal equipment |
| CN110232018A (en) * | 2019-05-17 | 2019-09-13 | 浙江数链科技有限公司 | Interface test method, device, computer equipment |
| CN110426589A (en) * | 2019-09-10 | 2019-11-08 | 南京国电南自电网自动化有限公司 | A kind of substation secondary device automatic testing method, server and system based on general-purpose interface template |
| CN112181835B (en) * | 2020-09-29 | 2024-04-26 | 中国平安人寿保险股份有限公司 | Automatic test method, device, computer equipment and storage medium |
| CN112305356A (en) * | 2020-10-26 | 2021-02-02 | 江苏罗思韦尔电气有限公司 | Portable test instrument and test method |
| CN112595434B (en) * | 2020-12-30 | 2021-11-05 | 广州旭杰电子有限公司 | Distributed optical fiber temperature measurement intelligent monitoring system |
| CN116069573B (en) * | 2022-11-16 | 2023-09-22 | 北京东方通科技股份有限公司 | Testing method and system based on API (application program interface) testing platform |
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| CN103529377B (en) * | 2013-10-11 | 2016-04-20 | 国家电网公司 | The Auto-Test System of intelligent transformer substation digital protection device and method |
| CN104793076B (en) * | 2015-04-08 | 2018-03-09 | 南京能云电力科技有限公司 | Intelligent Auto-Test System and method of testing |
| CN104980317B (en) * | 2015-06-18 | 2018-03-02 | 南京南瑞集团公司 | A kind of Auto-Test System and method of testing of dispatch data net equipment |
| CN105277912B (en) * | 2015-11-26 | 2019-02-05 | 国网新疆电力公司电力科学研究院 | Equipment for monitoring power quality self-measuring device and its self-testing method |
| CN105301419A (en) * | 2015-12-03 | 2016-02-03 | 中国电力科学研究院 | Cloud-technology-based automatic test system for protective relaying device |
| CN105866567B (en) * | 2016-03-24 | 2018-12-07 | 南京能云电力科技有限公司 | A kind of automatic test system of relay protection device based on foundation forms technology |
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