CN116539621A - Method and device for setting parameters of appearance defect detection algorithm and electronic equipment - Google Patents
Method and device for setting parameters of appearance defect detection algorithm and electronic equipment Download PDFInfo
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Abstract
The embodiment of the invention discloses a method and a device for setting parameters of an appearance defect detection algorithm and electronic equipment. The method comprises the following steps: setting parameters of appearance defect types of the laser chips to be detected; setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface; and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode. The setting method of the appearance defect detection algorithm parameters is simple and efficient in setting logic and easy to adjust, can be adapted to different types of laser chips, can realize diversified appearance detection, and greatly improves the detection efficiency of appearance defects of the laser chips.
Description
Technical Field
The present invention relates to the field of laser chip detection technologies, and in particular, to a method and an apparatus for setting an appearance defect detection algorithm parameter, and an electronic device.
Background
The laser chip COS (Chip on Submount) involves a very complex series of steps from manufacturing to encapsulation, with a wide variety of damage defects. Therefore, in order to make the performance of the laser excellent, strict control is required to be performed on the manufacturing process, for example, the line width is continuously compressed, however, the operation is very easy to damage and pollute the cavity surface of the laser, and the solder layer is in a gap, so that the optical performance and stability of the laser chip are greatly affected, and meanwhile, some defects are serious hidden dangers of the laser chip, which cause great influence on the physical characteristics of the laser chip.
At present, after the laser chip is manufactured, whether the laser chip has defects is mainly judged through modes of image acquisition, image recognition, data extraction, data matching and the like. However, the defect detection algorithm is complex, and meanwhile, the accurate appearance defect detection cannot be performed on different types of laser chips, so that the detection efficiency of the appearance defects of the laser chips is greatly reduced.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a method and a device for setting parameters of an appearance defect detection algorithm and electronic equipment, and aims to solve the technical problem that the appearance defect detection efficiency of a laser chip in the prior art is low.
In order to solve the above problems, in a first aspect, an embodiment of the present invention provides a method for setting parameters of an appearance defect detection algorithm, including:
setting parameters of appearance defect types of the laser chips to be detected;
setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip;
setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface;
and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode.
In a second aspect, an embodiment of the present invention provides a device for setting parameters of an appearance defect detection algorithm, including:
a first setting unit for setting parameters of appearance defect types of the laser chips to be detected;
a second setting unit, configured to set a segmentation mode of an appearance image of the laser chip and parameters of the detection mode according to the appearance defect type and the detection surface of the laser chip;
a third setting unit, configured to set parameters of a detection surface of the laser chip according to a chip type of the laser chip, and introduce standard parameters of the detection surface;
and a fourth setting unit, configured to set and position parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the division mode.
In a third aspect, an embodiment of the present invention further provides an electronic device, including a memory, a processor, and a computer program stored in the memory and capable of running on the processor, where the setting method of the appearance defect detection algorithm parameter according to the first aspect is implemented when the processor executes the computer program.
In a fourth aspect, an embodiment of the present invention further provides a computer readable storage medium, where the computer readable storage medium stores a computer program, where the computer program when executed by a processor causes the processor to execute the method for setting the parameters of the appearance defect detection algorithm described in the first aspect.
The embodiment of the invention provides a method, a device and electronic equipment for setting parameters of an appearance defect detection algorithm, wherein the method is characterized in that parameters of an appearance defect type of a laser chip to be detected are set, parameter setting is carried out on a segmentation mode and a detection mode of an appearance image of the laser chip according to the appearance defect type, then the chip type of the laser chip is determined, parameters of a detection surface of the laser chip are set according to the chip type of the laser chip, standard parameters of the detection surface are imported, and finally parameters of the detection surface of the laser chip are set and positioned according to the parameters of the detection surface and the parameters of the segmentation mode, so that the setting of the parameters of the appearance defect detection algorithm can be completed. The setting method of the appearance defect detection algorithm parameters is simple and efficient in setting logic and easy to adjust, can be adapted to different types of laser chips, can realize diversified appearance detection, and greatly improves the detection efficiency of appearance defects of the laser chips.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flowchart of a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
FIG. 2 is another flowchart of a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
FIG. 3 is another flowchart of a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
FIG. 4 is another flowchart of a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
FIG. 5 is another flowchart of a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
FIG. 6 is another flowchart of a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
FIG. 7 is a schematic block diagram of a setting device for parameters of an appearance defect detection algorithm according to an embodiment of the present invention;
fig. 8 is a schematic block diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be understood that the terms "comprises" and "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
The method for setting the appearance defect detection algorithm parameters is applied to the terminal equipment, and the method for setting the appearance defect detection algorithm parameters is carried out through application software installed in the terminal equipment. The terminal equipment can be electronic equipment such as a desktop computer, a notebook computer, a tablet computer or a mobile phone.
It should be noted that, the application scenario of the foregoing embodiment is merely an example, and the services and scenarios described in the embodiments of the present invention are for more clearly describing the technical solutions of the embodiments of the present application, and do not constitute a limitation on the technical solutions provided in the embodiments of the present application, and those skilled in the art can know that, with the evolution of the system and the appearance of a new service scenario, the technical solutions provided in the embodiments of the present application are equally applicable to similar technical problems. The following will describe in detail.
The following description of the embodiments is not intended to limit the preferred embodiments. The method for setting the parameters of the appearance defect detection algorithm is described in detail below.
Referring to fig. 1, fig. 1 is a flowchart illustrating a method for setting parameters of an appearance defect detection algorithm according to an embodiment of the invention.
As shown in fig. 1, the method includes the following steps S110 to S140.
S110, setting parameters of appearance defect types of the laser chips to be detected.
In this embodiment, the parameters of the appearance defect type include defect names and defect identifiers, the defect names include dirt, white lines, different colors, and the like, the dirt includes black dirt and white dirt, the defect identifiers are symbols when the appearance defect of the laser chip at the detection position meets the set defect names, and the defect identifiers can be identified by symbols such as english letters, that is, each defect name corresponds to one defect identifier.
In other inventive embodiments, as shown in fig. 2, step S110 includes steps S111 and S112.
S111, if the appearance defect type of the laser chip does not exist in the terminal, a defect name and a defect identifier of the appearance defect type of the laser chip are newly added;
and S112, deleting the defect name and the defect identifier of the appearance defect type which is not matched with the laser chip if the appearance defect type which is not matched with the laser chip exists in the terminal.
Specifically, parameters of different types of appearance defects are preset in the terminal, but the types of appearance defects required to be detected by the different types of laser chips are not the same, that is, the types of appearance defects of the different types of laser chips are different. When the appearance defect type of the laser chip to be detected does not exist in the terminal, the parameters of the appearance defect type of the laser chip to be detected need to be newly added, specifically, the defect name and the defect identifier of the appearance defect type are added; when there is an appearance defect type that does not match the laser chip to be detected in the terminal, parameters of the unmatched appearance defect type need to be deleted, specifically, a defect name and a defect identifier of the appearance defect type.
It should be noted that, in the present application, detection of multiple appearance defect types may be performed on the laser chip at the same time, or detection of only one appearance defect type may be performed, and may be specifically selected according to practical applications, which is not limited in this embodiment.
S120, setting parameters of a segmentation mode and a detection mode of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip.
Specifically, when appearance defect detection is performed on the laser chip, specifically, appearance images of the laser chip are collected, and then the appearance images are processed, so that the appearance defect detection is performed on the laser chip. Meanwhile, the detection surface for detecting the laser chip mainly comprises a front surface, a bottom surface, an HR surface (high reflection film) and an AR surface (anti-reflection film), so that appearance detection types, segmentation modes and detection modes of appearance images corresponding to different surfaces of the laser chip are different, and after parameters of appearance defect types of the laser chip to be detected are set, parameter setting can be carried out on the segmentation modes and the detection modes of the appearance images of all surfaces of the laser chip, and further defect detection of all surfaces of the laser chip can be achieved.
In other inventive embodiments, as shown in fig. 3, step S120 includes steps S121 and S122.
S121, if the segmentation mode is threshold segmentation, setting a color space of the threshold segmentation, a first segmentation threshold and the color of an abnormal region according to the detection surface;
s122, setting a first defect standard of the threshold segmentation according to the appearance defect type.
In this embodiment, the appearance images of different detection surfaces on the laser chip have different segmentation modes, and threshold segmentation exists in the segmentation modes, which is specifically used for performing segmentation detection on defects in the appearance images corresponding to the AR surface and the HR surface of the laser chip. The threshold segmentation is used for independently converting faults into black or white through imaging definition under different color spaces so as to realize detection of defects in a detection surface.
The parameters of the threshold segmentation include parameters such as a color space, a first segmentation threshold, colors of an abnormal region, a first defect standard and the like, wherein the color space includes a brightness space, a green space and a gray space, and different color spaces correspond to different first segmentation thresholds, colors of the abnormal region and the first defect standard. After the detection surface of the laser chip is determined, a color space for threshold segmentation of the appearance image of the detection surface, a first segmentation threshold, and the color of the abnormal region may be set according to the color of the detection surface. Meanwhile, the first defect standard of the threshold segmentation can be determined according to the external defect detection type corresponding to the detection surface. Specifically, the first segmentation threshold is a threshold for performing pixel segmentation on the appearance image, the color of the abnormal region can be white or black, the first defect standard comprises maximum and minimum values of defect width and height, and the first defect standard also comprises maximum number of allowed defects and minimum size of the defects.
In other inventive embodiments, as shown in fig. 4, step S120 further includes steps S123 and S124.
S123, if the segmentation mode is color segmentation, setting a second segmentation threshold value of the color segmentation and the color of an abnormal region according to the detection surface;
s124, setting a second defect standard of the color segmentation according to the appearance defect type.
In this embodiment, the method for dividing the appearance image of the detection surface further includes color division, which is specifically used for dividing and detecting the appearance image corresponding to the front surface and the bottom surface of the laser chip, where the color division removes a color space compared with the threshold value division, and directly uses the color of the laser chip itself to detect the defect of the laser chip. The parameters of the color segmentation include a second segmentation threshold, the color of the abnormal region and a second defect standard, and the second defect standard of the color segmentation can be determined according to the external defect detection type corresponding to the detection surface.
Specifically, the second division threshold includes a threshold of color hue, color saturation and color brightness, the front and bottom surfaces of the chip can be better positioned by setting the second division threshold of color division, the edge grabbing rate can be improved, the over-killing is reduced, the color of the abnormal area can be white or black, the second defect standard includes maximum and minimum values of defect width and height, and the first defect standard also includes maximum number of allowed defects and minimum size of the defects.
In other embodiments of the invention, as shown in fig. 5, step S120 further includes steps S125, S126, and S127.
S125, setting a third defect standard of a detection mode of the appearance image of the laser chip according to the appearance defect detection type;
s126, if the detection mode is white line detection, setting a first algorithm threshold value of the white line detection;
and S127, if the detection mode is abnormal color detection, setting the area expansion parameter of white line detection and a second algorithm threshold.
In this embodiment, the third defect criteria includes maximum and minimum values of defect width and height, while the first defect criteria also includes maximum number of allowed defects and minimum size of defects. After setting the parameters of the third defect criteria, specific parameters corresponding to the detection mode may be set. The detection mode comprises white line detection and abnormal color detection, and when the detection mode is white line detection, a first algorithm threshold value of white line detection is set; when the detection mode is different-color detection, setting a region expansion parameter of white line detection and a second algorithm threshold. The range of the first algorithm threshold and the second algorithm threshold is between 0 and 1, and the region expansion parameters comprise a left expansion parameter outside the region, a right expansion parameter outside the region, an up expansion parameter outside the region and a down expansion parameter outside the region, wherein the unit of the region expansion parameters is a pixel, and can be a negative pixel.
S130, setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface.
Specifically, when the appearance defect detection algorithm is adopted to detect the appearance defect of the laser chip, parameters of a detection surface of the laser chip are set in the algorithm, the detection surface of the laser chip comprises a front surface, a bottom surface, an HR surface and an AR surface, wherein the parameters of the front surface comprise width, width tolerance, height tolerance and chip inclination angle of the front surface, the parameters of the bottom surface comprise width, width tolerance, height tolerance and chip inclination angle of the bottom surface, parameters of the AR surface include width, width tolerance, height tolerance, chip tilt angle, etched trench width tolerance, etched trench height tolerance, etched trench spacing, critical area width, critical area height, critical area left offset and critical area up offset of the AR surface, parameters of the HR surface include width, width tolerance, height tolerance, chip tilt angle, etched trench width tolerance, etched trench height tolerance, etched trench spacing, critical area width, critical area height, critical area left offset, and critical area up offset of the HR surface.
And S140, setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the dividing mode.
In this embodiment, the appearance images of different detection surfaces correspond to different dividing modes and different positioning modes, and after determining the detection surface of the laser chip and the dividing mode of the appearance image of the detection surface, which need to detect the appearance defect, parameters for positioning the detection surface in the appearance image can be set. The method for positioning the detection surface of the laser chip comprises contour positioning and surface positioning of the detection surface.
In other inventive embodiments, as shown in fig. 6, step S140 includes steps S141, S142, S143, and S144.
S141, if a contour is adopted to position a detection surface of the laser chip, setting an etching groove range and a key region range in the contour of an appearance image of the laser chip according to the detection surface; wherein the detection surface comprises an AR surface and an HR surface of the laser chip;
s142, setting a color space of upper and lower edges of the outline of the appearance image of the laser chip and an offset compensation value;
s143, if a detection surface of the laser chip is positioned by adopting a surface, setting a third segmentation threshold value of an appearance image of the laser chip and the color of an abnormal region according to the detection surface; wherein the detection surface comprises a front surface and a bottom surface of the laser chip;
s144, setting and positioning the brightness compensation value of the detection surface of the laser chip.
In this embodiment, different detection surfaces are positioned in different manners, the HR surface and the AR surface of the laser chip are positioned in a contour positioning manner, and the front surface and the bottom surface of the laser chip are positioned in a surface positioning manner. The parameters of the detection surface of the profile positioning laser chip comprise an etched groove range, a key area range, a color space of upper and lower edges of the profile and an offset compensation value in the profile of the appearance image corresponding to the detection surface, the detection surface comprises an AR surface and an HR surface of the laser chip, the etched groove range in the profile of the appearance image corresponding to the detection surface comprises an etched groove width, an etched groove width tolerance, an etched groove height tolerance and an etched groove spacing, the parameters can be obtained from the parameters corresponding to the detection surface, the key area range comprises a key area width and a key area height, the key area range can also be obtained from the parameters corresponding to the detection surface, and the color space of the upper and lower edges of the profile and the offset compensation value can be determined according to the color space of threshold segmentation. The parameters of the detection surface of the surface positioning laser chip comprise a third segmentation threshold value of the appearance image corresponding to the detection surface, the color of the abnormal region and a brightness compensation value, wherein the third segmentation threshold value comprises a threshold value of color tone, color saturation and color brightness, the color of the abnormal region can be black or white, and the brightness compensation value of the detection surface of the laser chip can be set according to the color of the detection surface.
In other embodiments of the present invention, after step S140, the method further includes the steps of: and detecting the appearance defects of the laser chip according to the appearance defect detection algorithm after parameter setting.
In this embodiment, after the parameter setting of the appearance defect detection algorithm of the laser chip is completed, the laser chip may be placed in the image acquisition mechanism to acquire an appearance image, and then the appearance defect detection algorithm after the parameter setting is adopted to process the acquired appearance image, so that defects of each surface of the laser chip may be detected.
In the method for setting the parameters of the appearance defect detection algorithm provided by the embodiment of the invention, parameters of the appearance defect type of the laser chip to be detected are set; setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface; and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode. The setting method of the appearance defect detection algorithm parameters is simple and efficient in setting logic and easy to adjust, can be adapted to different types of laser chips, can realize diversified appearance detection, and greatly improves the detection efficiency of appearance defects of the laser chips.
The embodiment of the invention also provides a setting device 100 of the appearance defect detection algorithm parameter, which is used for executing any embodiment of the setting method of the appearance defect detection algorithm parameter.
Specifically, referring to fig. 7, fig. 7 is a schematic block diagram of an apparatus 100 for setting parameters of an appearance defect detection algorithm according to an embodiment of the present invention.
As shown in fig. 7, the setting device 100 of the appearance defect detection algorithm parameter includes: the first setting unit 110, the second setting unit 120, the third setting unit 130, and the fourth setting unit 140.
A first setting unit 110 for setting parameters of an appearance defect type of the laser chip to be detected;
a second setting unit 120, configured to set parameters of a segmentation mode and a detection mode of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip;
a third setting unit 130, configured to set parameters of a detection surface of the laser chip according to a chip type of the laser chip, and import standard parameters of the detection surface;
and a fourth setting unit 140, configured to set and position parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the division mode.
The setting device 100 of the appearance defect detection algorithm parameter provided by the embodiment of the invention is used for executing the setting of the parameters of the appearance defect type of the laser chip to be detected; setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface; and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode.
It should be noted that, as those skilled in the art can clearly understand, the setting device 100 of the appearance defect detection algorithm parameter and the specific implementation process of each unit may refer to the corresponding description in the foregoing method embodiment, and for convenience and brevity of description, the description is omitted here.
The above-described means for setting parameters of the appearance defect detection algorithm may be implemented in the form of a computer program that is executable on an electronic device as shown in fig. 8.
Referring to fig. 8, fig. 8 is a schematic block diagram of an electronic device according to an embodiment of the present invention.
With reference to fig. 8, the device 500 includes a processor 502, a memory, and a network interface 505, which are connected by a system bus 501, wherein the memory may include a storage medium 503 and an internal memory 504.
The storage medium 503 may store an operating system 5031 and a computer program 5032. The computer program 5032, when executed, causes the processor 502 to perform a method for setting parameters of an appearance defect detection algorithm.
The processor 502 is used to provide computing and control capabilities to support the operation of the overall device 500.
The internal memory 504 provides an environment for the execution of a computer program 5032 in the non-volatile storage medium 503, which computer program 5032, when executed by the processor 502, causes the processor 502 to perform a method for setting parameters of an appearance defect detection algorithm.
The network interface 505 is used for network communication, such as providing for transmission of data information, etc. It will be appreciated by those skilled in the art that the structure shown in fig. 8 is merely a block diagram of a portion of the structure associated with the present inventive arrangements and is not limiting of the apparatus 500 to which the present inventive arrangements are applied, and that a particular apparatus 500 may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.
Wherein the processor 502 is configured to execute a computer program 5032 stored in a memory to perform the following functions: setting parameters of appearance defect types of the laser chips to be detected; setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface; and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode.
In an embodiment, when the setting of the parameters of the appearance defect type of the laser chip to be detected is implemented, the processor 502 specifically implements the following steps: if the appearance defect type of the laser chip does not exist in the terminal, a defect name and a defect identifier of the appearance defect type of the laser chip are newly added; and if the appearance defect type which is not matched with the laser chip exists in the terminal, deleting the defect name and the defect identifier of the appearance defect type which is not matched with the laser chip.
In one embodiment, when the processor 502 sets the parameters of the segmentation method of the appearance image of the laser chip, the following steps are specifically implemented: if the segmentation mode is threshold segmentation, setting a color space of the threshold segmentation, a first segmentation threshold and the color of an abnormal region according to the detection surface; and setting a first defect standard of the threshold segmentation according to the appearance defect type.
In one embodiment, when the processor 502 sets the parameters of the segmentation method of the appearance image of the laser chip, the following steps are specifically implemented: if the segmentation mode is color segmentation, setting a second segmentation threshold value of the color segmentation and the color of an abnormal region according to the detection surface; and setting a second defect standard of the color segmentation according to the appearance defect type.
In one embodiment, when the processor 502 sets the parameters of the detection mode of the appearance image of the laser chip, the following steps are specifically implemented: setting a third defect standard of a detection mode of the appearance image of the laser chip according to the appearance defect detection type; if the detection mode is white line detection, setting a first algorithm threshold value of the white line detection; if the detection mode is abnormal color detection, setting the area expansion parameter of white line detection and a second algorithm threshold.
In an embodiment, when the processor 502 implements the parameter setting for positioning the detection surface of the laser chip according to the parameter of the detection surface and the parameter setting of the dividing manner, the following steps are specifically implemented: if the outline is adopted to position the detection surface of the laser chip, setting an etching groove range and a key area range in the outline of the appearance image of the laser chip according to the detection surface; wherein the detection surface comprises an AR surface and an HR surface of the laser chip; setting a color space and an offset compensation value of upper and lower edges of the outline of the appearance image of the laser chip; if the detection surface of the laser chip is positioned by adopting the surface, setting a third segmentation threshold value of the appearance image of the laser chip and the color of an abnormal region according to the detection surface; wherein the detection surface comprises a front surface and a bottom surface of the laser chip; and setting a brightness compensation value for positioning the detection surface of the laser chip.
In an embodiment, after implementing the parameter setting for positioning the detection surface of the laser chip according to the parameter of the detection surface and the parameter setting of the dividing manner, the processor 502 specifically implements the following steps: and detecting the appearance defects of the laser chip according to the appearance defect detection algorithm after parameter setting.
Those skilled in the art will appreciate that the embodiment of the apparatus 500 shown in fig. 8 is not limiting of the specific construction of the apparatus 500, and in other embodiments, the apparatus 500 may include more or less components than illustrated, or certain components may be combined, or a different arrangement of components. For example, in some embodiments, the device 500 may include only the memory and the processor 502, and in such embodiments, the structure and the function of the memory and the processor 502 are consistent with the embodiment shown in fig. 8, and will not be described herein.
It should be appreciated that in an embodiment of the invention, the processor 502 may be a central processing unit (Central Processing Unit, CPU), the processor 502 may also be other general purpose processors 502, digital signal processors 502 (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), off-the-shelf programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. Wherein the general purpose processor 502 may be the microprocessor 502 or the processor 502 may be any conventional processor 502 or the like.
In another embodiment of the present invention, a computer storage medium is also provided. The storage medium may be a nonvolatile computer-readable storage medium or a volatile storage medium. The storage medium stores a computer program 5032, wherein the computer program 5032 when executed by the processor 502 performs the steps of: setting parameters of appearance defect types of the laser chips to be detected; setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface; and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode.
In an embodiment, when the processor executes the program instructions to implement the setting of the parameters of the appearance defect type of the laser chip to be detected, the method specifically includes the following steps: if the appearance defect type of the laser chip does not exist in the terminal, a defect name and a defect identifier of the appearance defect type of the laser chip are newly added; and if the appearance defect type which is not matched with the laser chip exists in the terminal, deleting the defect name and the defect identifier of the appearance defect type which is not matched with the laser chip.
In an embodiment, when the processor executes the program instructions to set parameters of the splitting manner of the appearance image of the laser chip, the following steps are specifically implemented: if the segmentation mode is threshold segmentation, setting a color space of the threshold segmentation, a first segmentation threshold and the color of an abnormal region according to the detection surface; and setting a first defect standard of the threshold segmentation according to the appearance defect type.
In an embodiment, when the processor executes the program instructions to set parameters of the splitting manner of the appearance image of the laser chip, the following steps are specifically implemented: if the segmentation mode is color segmentation, setting a second segmentation threshold value of the color segmentation and the color of an abnormal region according to the detection surface; and setting a second defect standard of the color segmentation according to the appearance defect type.
In an embodiment, when the processor executes the program instructions to set parameters of a detection mode of the appearance image of the laser chip, the method specifically includes the following steps: setting a third defect standard of a detection mode of the appearance image of the laser chip according to the appearance defect detection type; if the detection mode is white line detection, setting a first algorithm threshold value of the white line detection; if the detection mode is abnormal color detection, setting the area expansion parameter of white line detection and a second algorithm threshold.
In an embodiment, when the processor executes the program instructions to implement the setting of the parameters for positioning the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the dividing manner, the following steps are specifically implemented: if the outline is adopted to position the detection surface of the laser chip, setting an etching groove range and a key area range in the outline of the appearance image of the laser chip according to the detection surface; wherein the detection surface comprises an AR surface and an HR surface of the laser chip; setting a color space and an offset compensation value of upper and lower edges of the outline of the appearance image of the laser chip; if the detection surface of the laser chip is positioned by adopting the surface, setting a third segmentation threshold value of the appearance image of the laser chip and the color of an abnormal region according to the detection surface; wherein the detection surface comprises a front surface and a bottom surface of the laser chip; and setting a brightness compensation value for positioning the detection surface of the laser chip.
In an embodiment, after executing the program instructions to implement the setting of the parameters for positioning the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the dividing manner, the processor specifically implements the following steps: and detecting the appearance defects of the laser chip according to the appearance defect detection algorithm after parameter setting.
It will be clearly understood by those skilled in the art that, for convenience and brevity of description, specific working procedures of the apparatus, device and unit described above may refer to corresponding procedures in the foregoing method embodiments, which are not repeated herein. Those of ordinary skill in the art will appreciate that the elements and algorithm steps described in connection with the embodiments disclosed herein may be embodied in electronic hardware, in computer software, or in a combination of the two, and that the elements and steps of the examples have been generally described in terms of function in the foregoing description to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
In the several embodiments provided by the present invention, it should be understood that the disclosed apparatus, device and method may be implemented in other manners. For example, the apparatus embodiments described above are merely illustrative, and for example, the division of the units is merely a logical function division, there may be another division manner in actual implementation, or units having the same function may be integrated into one unit, for example, multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. In addition, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices, or elements, or may be an electrical, mechanical, or other form of connection.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the embodiment of the present invention.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units may be stored in a storage medium if implemented in the form of software functional units and sold or used as stand-alone products. Based on such understanding, the technical solution of the present invention may be essentially or a part contributing to the prior art, or all or part of the technical solution may be embodied in the form of a software product stored in a storage medium, comprising several instructions for causing an apparatus 500 (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a magnetic disk, an optical disk, or other various media capable of storing program codes.
While the invention has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (10)
1. The method for setting the parameters of the appearance defect detection algorithm is characterized by comprising the following steps:
setting parameters of appearance defect types of the laser chips to be detected;
setting a segmentation mode and parameters of a detection mode of an appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip;
setting parameters of a detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface;
and setting and positioning parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation mode.
2. The method for setting parameters of an appearance defect detection algorithm according to claim 1, wherein the setting parameters of an appearance defect type of a laser chip to be detected comprises:
if the appearance defect type of the laser chip does not exist in the terminal, a defect name and a defect identifier of the appearance defect type of the laser chip are newly added;
and if the appearance defect type which is not matched with the laser chip exists in the terminal, deleting the defect name and the defect identifier of the appearance defect type which is not matched with the laser chip.
3. The method for setting parameters of an appearance defect detection algorithm according to claim 1, wherein setting parameters of a segmentation mode of an appearance image of the laser chip specifically comprises:
if the segmentation mode is threshold segmentation, setting a color space of the threshold segmentation, a first segmentation threshold and the color of an abnormal region according to the detection surface;
and setting a first defect standard of the threshold segmentation according to the appearance defect type.
4. The method for setting parameters of an appearance defect detection algorithm according to claim 1, wherein setting parameters of a segmentation mode of an appearance image of the laser chip specifically further comprises:
if the segmentation mode is color segmentation, setting a second segmentation threshold value of the color segmentation and the color of an abnormal region according to the detection surface;
and setting a second defect standard of the color segmentation according to the appearance defect type.
5. The method for setting parameters of an appearance defect detection algorithm according to claim 1, wherein setting parameters of a detection mode of an appearance image of the laser chip specifically comprises:
setting a third defect standard of a detection mode of the appearance image of the laser chip according to the appearance defect detection type;
if the detection mode is white line detection, setting a first algorithm threshold value of the white line detection;
if the detection mode is abnormal color detection, setting the area expansion parameter of white line detection and a second algorithm threshold.
6. The method for setting parameters of an appearance defect detection algorithm according to claim 1, wherein setting parameters of a detection surface for positioning the laser chip according to the parameters of the detection surface and the parameters of the dividing method comprises:
if the outline is adopted to position the detection surface of the laser chip, setting an etching groove range and a key area range in the outline of the appearance image of the laser chip according to the detection surface; wherein the detection surface comprises an AR surface and an HR surface of the laser chip;
setting a color space and an offset compensation value of upper and lower edges of the outline of the appearance image of the laser chip;
if the detection surface of the laser chip is positioned by adopting the surface, setting a third segmentation threshold value of the appearance image of the laser chip and the color of an abnormal region according to the detection surface; wherein the detection surface comprises a front surface and a bottom surface of the laser chip;
and setting a brightness compensation value for positioning the detection surface of the laser chip.
7. The method according to claim 1, further comprising, after the setting of the parameters for positioning the detection surface of the laser chip according to the parameters for the detection surface and the parameters for the dividing method:
and detecting the appearance defects of the laser chip according to the appearance defect detection algorithm after parameter setting.
8. An appearance defect detection algorithm parameter setting device is characterized by comprising:
a first setting unit for setting parameters of appearance defect types of the laser chips to be detected;
a second setting unit, configured to set a segmentation mode of an appearance image of the laser chip and parameters of the detection mode according to the appearance defect type and the detection surface of the laser chip;
a third setting unit, configured to set parameters of a detection surface of the laser chip according to a chip type of the laser chip, and introduce standard parameters of the detection surface;
and a fourth setting unit, configured to set and position parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the division mode.
9. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing a method of setting the appearance defect detection algorithm parameters according to any one of claims 1 to 7 when the computer program is executed.
10. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program which, when executed by a processor, implements the method of setting the appearance defect detection algorithm parameters according to any one of claims 1 to 7.
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| CN202310492879.5A CN116539621A (en) | 2023-05-04 | 2023-05-04 | Method and device for setting parameters of appearance defect detection algorithm and electronic equipment |
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