CN115683576A - Detection device and method for optical coupling device - Google Patents
Detection device and method for optical coupling device Download PDFInfo
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Abstract
The invention relates to a detection device and a method of an optical coupling device, wherein the detection device of the optical coupling device comprises an optical coupler, a first lens, a second lens, a beam quality analyzer and a processing unit; the optical coupler is used for generating test light, the first lens is used for collimating the test light, and the second lens is used for converging the collimated test light; the beam quality analyzer is used for acquiring far-field light distribution maps of the received test light at different optical path positions and sending the far-field light distribution maps to the processing unit; the processing unit is used for calculating far-field light distribution maps at different optical path positions to obtain the angular power change rate of the test light in far-field transmission. The mode conversion process in the optical coupling device is quantitatively evaluated by utilizing the angular power change rate without analyzing an internal section, so that a quantitative evaluation standard is provided for the beam shaping capability of the optical coupling device, and more reference information is provided for the control of the output mode of the optical coupling device.
Description
Technical Field
The application relates to the field of semiconductor laser coupling, in particular to a detection device and a detection method for an optical coupling device.
Background
Optical couplers and optical waveguide coupling devices represented by photon lanterns are widely applied in the fields of optical combination and optical shaping. When obtaining high power laser by using a optocoupler, the power ratio of the desired mode in the output light is generally increased by shaping the laser mode. In practical studies, the mode shaping performance of optical coupling devices is generally evaluated by evaluating the beam quality or beam profile. In this process, nonlinear effects and transverse mode oscillations due to power increase are a serious obstacle to the evaluation of the energy conversion process occurring in the optocoupler. The performance of the optical coupling device is evaluated by simply evaluating the quality of output light, and the performance of the optical coupling device is sensitive to the influence of the environment and bending and twisting conditions, and the mode conversion process in the optical coupling device is lack of attention.
Therefore, a scheme for evaluating the optical coupling process occurring in the optical coupler based on the analysis of the output light is needed, and the scheme can well describe the mode conversion performance of the optical coupling device and characterize the mode shaping potential of the optical coupling device. The performance optimization difficulty of the optical coupler is reduced, and more possibility is provided for improving the mode conversion efficiency of the optical coupler.
Disclosure of Invention
In view of the above problems, the present application provides an apparatus and a method for detecting an optical coupler, which solve the problem in the prior art that the quality of output light is only evaluated and the mode conversion process in the optical coupler is not evaluated.
To achieve the above object, in a first aspect, the present invention provides a detection apparatus of an optical coupling device, including an optical coupler, a first lens, a second lens, a beam quality analyzer, a sliding assembly, and a processing unit; the optical coupler is provided with an output end, the light beam quality analyzer is provided with a receiving end, the sliding assembly comprises a sliding chute and a sliding block, the light beam quality analyzer is arranged on the sliding block, and the sliding block can move in the sliding chute; the optical coupler, the first lens, the second lens and the light beam quality analyzer are sequentially arranged along the light path direction, the central point of the output end of the optical coupler, the central point of the first lens, the central point of the second lens and the central point of the receiving end of the light beam quality analyzer are positioned on the same central axis, the groove-direction axis of the sliding groove and the central axis are positioned in the same vertical plane, and the processing unit is electrically connected with the light beam quality analyzer;
the optical coupler is used for generating test light, and the test light is emitted through the output end of the optical coupler; the first lens is used for collimating the test light, and the second lens is used for converging the collimated test light; the beam quality analyzer is used for acquiring far-field light transverse mode pattern distribution diagrams of the received test light at different optical path positions and sending the far-field light distribution diagrams at the different optical path positions to the processing unit; the processing unit is used for calculating far-field light distribution maps at different optical path positions to obtain the angular power change rate of the test light in far-field transmission.
In some embodiments, the distance between the center point of the first lens and the output end of the optical coupler is within a first preset range.
In some embodiments, the outer side wall of the chute is further provided with a plurality of scale marks, the distance between two adjacent scale marks gradually increases along the propagation direction of the light path according to a first preset gradient, and the scale marks are used for marking the position of the beam quality analyzer in the chute.
In some embodiments, the distance between the output end of the optical coupler and the closest scale mark on the chute is within a second preset range; and/or the distance between the scale mark on the side farthest from the output end of the optical coupler and the second lens is the focal length of the second lens.
In some embodiments, the detection device further comprises a flange fixing platform and a flange joint, and the output end of the optical coupler is fixed on the flange fixing platform through the flange joint.
In a second aspect, the present invention further provides a method for detecting an optocoupler device, applied to the detecting apparatus for an optocoupler device in the first aspect, the method including the steps of:
the output end of the optical coupler emits test light;
the first lens collimates the test light;
the second lens is used for converging the collimated test light;
the light beam quality analyzer acquires far-field light distribution diagrams of the received test light at different optical path positions, and sends the far-field light distribution diagrams at the different optical path positions to the processing unit;
the processing unit calculates far-field light distribution maps at different optical path positions to obtain the angular power change rate of the test light in far-field transmission.
In some embodiments, the processing unit calculates far-field light distribution maps at a plurality of different optical path positions to obtain an angular power change rate of the test light in far-field propagation, and specifically includes the following steps:
acquiring a far-field light distribution map;
carrying out image gray processing on the far-field light distribution map to obtain a full-map gray value distribution matrix;
performing first calculation on the full-image gray value distribution matrix to obtain an angular power distribution variance;
and performing second calculation by using the angular power distribution variance to obtain the angular power change rate.
In some embodiments, the first calculation is derived from equation (1), equation (1) being as follows:
wherein,in order to be the angular power distribution variance,the variance of the angular power distribution of the far field light distribution map at different positions (i),to read out the numerical elements in the gray matrix,as the average value of the numerical elements in the read gray matrix,is a gray valueThe probability of occurrence in the gray matrix, L being the number of elements in the gray matrix.
In some embodiments, the second calculation is derived from equation (2), equation (2) being as follows:
wherein,for the rate of change of angular power in the far field propagation of the desired output light,l、1.5l、2.5l、3.5lis the distance between adjacent graduation lines corresponding to different positions along the light path direction, whereinlIn order to set the unit distance to a preset value,is the angular power distribution variance of the far field light distribution map at different locations (i).
Different from the prior art, the technical scheme includes that different far-field light distribution diagrams are obtained at different positions, the angular power change rate is calculated according to a plurality of far-field light distribution diagrams, the mode conversion process occurring in the optical coupling device is quantitatively evaluated by the angular power change rate, the quantitative evaluation specifically includes the steps of obtaining far-field light spots at different positions through a CCD, carrying out gray processing on the light spots, and then solving the value of the angular power distribution variance (calculated according to a formula (1)). The angular power distribution variance at a plurality of positions is calculated, the angular power distribution variance is divided by the distance difference, the change rate of the angular power distribution variance along with the distance is calculated, the obtained parameter can represent the mode conversion process occurring in the optical coupling device, the higher the numerical value is, the higher the high-order mode ratio is, and the more unstable the mode is, namely, the worse the capability of the optical coupling device for realizing optical coupling to obtain the fundamental mode light is. Without analyzing the internal cut planes, the internal cut planes specifically represent different locations within the optocoupler. The optical coupling process is analyzed without analyzing an internal section, namely detecting the optical field distribution at different positions in the optical coupling device, and the occurrence degree of the process can be represented directly through the variance change rate of the angular power distribution of the far-field optical field. The larger the rate of change, the poorer the ability of the optical coupling device to optically couple light in the fundamental mode. Thereby providing a quantitative evaluation criterion for the beam shaping capability of the optical coupling device and providing more reference information for the control of the output mode of the optical coupling device.
The above description of the present invention is only an overview of the technical solutions of the present application, and in order to make the technical solutions of the present application more clearly understood by those skilled in the art, the present invention may be further implemented according to the content described in the text and drawings of the present application, and in order to make the above objects, other objects, features, and advantages of the present application more easily understood, the following description is made in conjunction with the detailed description of the present application and the drawings.
Drawings
The drawings are only for purposes of illustrating the principles, implementations, applications, features, and effects of particular embodiments of the invention, as well as others related thereto, and are not to be construed as limiting the application.
In the drawings of the specification:
FIG. 1 is a schematic diagram of an optocoupler detection apparatus according to an embodiment of the invention;
FIG. 2 is a diagram illustrating steps of a detection method according to a first exemplary embodiment of the present invention;
fig. 3 is a diagram illustrating steps of a detection method according to a second exemplary embodiment of the present invention.
Wherein the reference numerals include: 1. an optical coupler; 2. a first lens; 3. a second lens; 4. a beam quality analyzer; 51. a chute; 511. calibration; 52. a slider; 6. a flange fixing platform; d1, a first preset range; d2, a second preset range; d3, focal length of the second lens; a1, a first distance; a2, a second interval; a3, a third interval; a4, fourth pitch.
Detailed Description
Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. In the following description, the same reference numerals are used for the same blocks. In the case of the same reference numerals, their names and functions are also the same. Therefore, detailed description thereof will not be repeated.
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not to be construed as limiting the invention.
Referring to fig. 1, in a first aspect, the present invention provides a detection apparatus for an optical coupler 1, including an optical coupler 1, a first lens 2, a second lens 3, a beam quality analyzer 4, a sliding component and a processing unit; the optical coupler 1 is provided with an output end, the light beam quality analyzer 4 is provided with a receiving end, the sliding assembly comprises a sliding groove 51 and a sliding block 52, the light beam quality analyzer 4 is arranged on the sliding block 52, and the sliding block 52 can move in the sliding groove 51; the optical coupler 1, the first lens 2, the second lens 3 and the beam quality analyzer 4 are sequentially arranged along the light path direction, the central point of the output end of the optical coupler 1, the central point of the first lens 2, the central point of the second lens 3 and the central point of the receiving end of the beam quality analyzer 4 are located on the same central axis, the groove direction axis of the sliding groove 51 and the central axis are located in the same vertical plane, and the processing unit is electrically connected with the beam quality analyzer 4; the optical coupler 1 is used for generating test light, and the test light is emitted through the output end of the optical coupler 1; the first lens 2 is used for collimating the test light, and the second lens 3 is used for converging the collimated test light; the beam quality analyzer 4 is used for acquiring far-field light distribution diagrams of the received test light at different optical path positions and sending the far-field light distribution diagrams at the different optical path positions to the processing unit; the processing unit is used for calculating far-field light distribution maps at different optical path positions to obtain the angular power change rate of the test light in far-field transmission.
The first lens 2 and the second lens 3 are aspheric convex lenses, and the aperture of the first lens 2 is larger than the optical field diameter of the test light, and the aperture of the second lens 3 is larger than the optical field diameter of the collimated test light. The optical coupler 1 is a device for generating a laser beam, and the optical coupler 1 may be a fiber coupler or other types of optical coupling devices as long as it is ensured that input light is incident on the first lens 2 in parallel. The central point of the output end of the optical coupler 1, the central point of the first lens 2, the central point of the second lens 3 and the central point of the receiving end of the beam quality analyzer 4 are located on the same central axis, because the optical axis of the test light is located at the central point of the output end of the optical coupler 1, and the central points of the optical components are unified, the projection path of the test light is ensured not to be deviated or changed, and subsequent test steps are influenced.
The beam quality analyzer 4 is a device for measuring a laser beam, and may be an SP620 beam quality analyzer. The beam quality analyzer 4 may collect a beam image of the laser beam, the beam image including a beam center position, a beam peak intensity position, a beam divergence, an ellipticity, a beam intensity uniformity, a gaussian fit, different beam diameters/widths based on a user-selected peak/total energy percentage, etc. in this embodiment, the beam quality analyzer 4 is used to obtain a far-field light distribution map. The far-field light spot generally refers to a transverse light power distribution pattern obtained by detection of a position beyond a Rayleigh distance from a laser emission point, a second lens 3 is used for beam-shrinking of collimated light, and a CCD (charge coupled device) detects a focused far-field light distribution pattern and performs subsequent gray level extraction processing on the focused far-field light distribution pattern.
The far-field light distribution diagram is obtained by receiving the light beams transmitted by the optical coupler 1 through the lenses at different positions of the light beam quality analyzer 4, and the far-field light distribution diagrams at different positions are different. The light beam quality analyzer 4 is movably connected with the sliding groove 51 through the sliding block 52, the sliding groove 51 is locked on an optical platform, the optical platform is a platform specially used for placing test equipment during research light, the flatness is high, and light paths in all instruments are guaranteed to be in the same plane. Different positions refer to different positions in the projection direction of the optical path, and as shown in fig. 1 in particular, the groove-direction axis of the sliding groove 51 and the central axis are located in the same vertical plane, so that the far-field light distribution patterns at different positions can be received when the light beam quality analyzer 4 slides in the sliding groove 51, the central point of the receiving end of the light beam quality analyzer 4 can be ensured to be always kept on the central axis in the moving process by arranging the sliding groove 51, and the error of the collected far-field light distribution patterns is reduced.
Different far-field light distribution diagrams are obtained at different positions, the angular power change rate is calculated according to a plurality of far-field light distribution diagrams, the mode conversion process in the optical coupler 1 is quantitatively evaluated by utilizing the angular power change rate, an internal section does not need to be analyzed, so that a quantitative evaluation standard is provided for the beam shaping capacity of the optical coupler 1, and more reference information is provided for the control of the output mode of the optical coupler 1.
Referring to fig. 1, in some embodiments, a distance between a center point of the first lens 2 and the output end of the optical coupler 1 is within a first predetermined range D1. The first preset range D1 is a range determined after comprehensive calculation and testing according to the specific aperture size of the first lens 2 and the optical field diameter of the test light emitted by the optical coupler 1, and within the first preset range D1, the optical loss of the test light is small, and the environmental influence factors are small, so that the final measurement accuracy of the test light is ensured.
Referring to fig. 1, in some embodiments, a plurality of scale marks are further disposed on an outer side wall of the sliding groove 51, a distance between two adjacent scale marks gradually increases along a propagation direction of the light path according to a first preset gradient, and the scale marks are used for marking a position of the beam quality analyzer 4 in the sliding groove 51.
The beam quality analyzer 4 needs to acquire far-field light distribution at different positionsFor the sake of distinction, the position of the far-field light distribution pattern is marked. Therefore, a scale 511 is provided on the slide groove 51 for marking different positions. The specific marking mode is as follows: in terms of the light path output direction, the scale 511 is sequentially written as: the scale comprises a first scale, a second scale and a third scale … …, wherein the distance between the first scale and the second scale is marked as a first distance A1; the distance between the second scale and the third scale is marked as a second distance A2, and so on. Five scales are taken as an example and are understood in conjunction with fig. 1: the five scales correspond to four intervals, and the four intervals are sequentially marked as a first interval A1, a second interval A2, a third interval A3 and a fourth interval A4 along the output direction of the light path; the first distance A1 is smaller than the second distance A2, the second distance A2 is smaller than the third distance A3, and the third distance A3 is smaller than the fourth distance A4, which gradually increases according to a first predetermined gradient. The specific variation value of the first preset gradient is set according to the experimental requirement, in this embodiment, the first distance A1 is set aslThe second pitch A2 is set to 1.5 lThe third pitch A3 is set to 2.5 lThe fourth pitch A4 is set to 3.5 lWhereinlThe unit distance is determined according to the size of the actual detection device.
Through setting for scale 511, be convenient for mark the survey position of light beam quality analyzer 4, and then be convenient for the far field light distribution map of different positions department records and transfers, avoids mixing, also is convenient for follow-up carry out numerical calculation to the far field light distribution map of different positions department.
Referring to fig. 1, in some embodiments, the distance between the output end of the optical coupler 1 and the closest scale mark on the sliding groove 51 is within a second preset range D2; and/or the distance between the scale mark on the side farthest from the output end of the optical coupler 1 and the second lens 3 is the focal length D3 of the second lens.
The scale mark closest to the sliding groove 51 is a first scale mark, the distance between the output end of the optical coupler 1 and the first scale mark is within a second preset range D2, the second preset distance is a range determined after comprehensive calculation and test according to the optical path distribution of the whole optical coupler 1 detection device (including the distance between the output end of the optical coupler 1 and the first lens 2, the distance between the second lens 3 and the first lens 2, and the distance between the beam quality analyzer 4 and the second lens 3) and the optical field diameter of the test light emitted by the optical coupler 1, and within the second preset range D2, the optical loss of the test light is small, the final measurement accuracy of the test light is ensured, and the influence of environmental interference on the measurement result is reduced.
The focal length D3 of the second lens is a fixed value, and the focal length D3 of the second lens can be obtained by measuring the focal length D3 of the second lens used in an actual experiment. When the distance between the scale mark on the side farthest from the output end of the optical coupler 1 and the second lens 3 is the focal length D3 of the second lens, it can be ensured that the beam quality analyzer 4 is still a clear pattern when acquiring the farthest far-field light distribution diagram, thereby facilitating subsequent calculation of different far-field light distribution diagrams.
Referring to fig. 1, in some embodiments, the detection apparatus further includes a flange fixing platform 6 and a flange joint, and the output end of the optical coupler 1 is fixed on the flange fixing platform 6 through the flange joint. The flange fixing platform 6 is a flat plate with a light through hole, the optical coupler 1 is locked on the flange fixing platform 6 through a flange joint, and the test light is projected to the first lens 2 through the light through hole. The flange fixing platform 6 is provided with a threaded hole matched with the unilateral SNA-1 flange joint and used for ensuring that test light can be incident into the collimating lens straightly.
Referring to fig. 2, in a second aspect, the present invention further provides a method for detecting an optocoupler device, applied to the apparatus for detecting an optocoupler device in the first aspect, the method includes the following steps:
s1, emitting test light by an output end of an optical coupler;
s2, collimating the test light by using a first lens;
s3, the collimated test light is converged by the second lens;
s4, the light beam quality analyzer acquires far-field light distribution diagrams of the received test light at different light path positions, and sends the far-field light distribution diagrams at the different light path positions to the processing unit;
and S5, calculating far-field light distribution maps at different optical path positions by the processing unit to obtain the angular power change rate of the test light in far-field transmission.
The test light emitted by the optical coupler 1 is divergent, and two adjacent light beams are separated from each other more and more after being transmitted. Therefore, the first lens 2 needs to be added to collimate the test light, and collimation means that the parallelism between two adjacent light rays is kept. In this embodiment, the process of focusing the collimated laser by using the convex lens to obtain the airy disk at the focal length of the convex lens is specifically shown. The positions of the detected far field spots are all within the focal length of the first lens 2, i.e. between the airy spot position and the first lens 2. The far-field light distribution diagram of the test light is clearer and more accurate when the test light enters the light beam quality analyzer 4.
The beam quality analyzer 4 sequentially obtains different far-field light distribution diagrams at different positions, sends the far-field light distribution diagrams to the processing unit, and calculates the far-field light distribution diagrams through the processing unit, so that the angular power change rate of the test light in far-field transmission is obtained. As a preferred embodiment, the beam quality analyzer 4 performs far-field light distribution pattern acquisition at non-equidistant positions, which can increase the accuracy of the results. And acquiring and drawing a corresponding far-field light distribution fitting curve through a plurality of times of non-equidistant far-field light distribution graphs, and then performing first calculation and second calculation to obtain the angular power change rate, so that the calculation result has smaller performance characterization errors.
Different far-field light distribution diagrams are obtained at different positions, the angular power change rate is calculated according to a plurality of far-field light distribution diagrams, the mode conversion process occurring in the optical coupler 1 is quantitatively evaluated by utilizing the angular power change rate, the quantitative evaluation specifically comprises the steps of obtaining far-field light spots at different positions through a CCD (charge coupled device), and solving the numerical value of the angular power distribution variance (calculated according to a formula (1)) after carrying out gray processing on the light spots. The angular power distribution variance at a plurality of positions is calculated, the angular power distribution variance is divided by the distance difference, the change rate of the angular power distribution variance along with the distance is calculated, the obtained parameter can represent the mode conversion process occurring in the optical coupling device, the higher the numerical value is, the higher the high-order mode ratio is, and the more unstable the mode is, namely, the worse the capability of the optical coupling device for realizing optical coupling to obtain the fundamental mode light is. Without analyzing the internal cut planes, the internal cut planes specifically represent different locations within the optocoupler. The optical coupling process is analyzed without analyzing an internal section, namely detecting the optical field distribution at different positions in the optical coupling device, and the occurrence degree of the process can be represented directly through the variance change rate of the angular power distribution of the far-field optical field. The larger the rate of change, the poorer the ability of the optical coupling device to optically couple light into the fundamental mode. Thereby providing a quantitative evaluation criterion for the beam shaping capability of the optical coupler 1 and providing more reference information for the control of the output mode of the optical coupler 1.
Referring to fig. 3, in some embodiments, the processing unit calculates far-field light distribution maps at a plurality of different optical path positions to obtain an angular power change rate of the test light in far-field propagation, and specifically includes the following steps:
s51, acquiring a far-field light distribution map;
s52, carrying out image gray processing on the far-field light distribution map to obtain a whole map gray value distribution matrix;
s53, performing first calculation on the whole image gray value distribution matrix to obtain an angular power distribution variance;
and S54, performing second calculation by using the angular power distribution variance to obtain the angular power change rate.
The image gray processing specifically includes: carrying out 16-bit gray level processing on the far-field light distribution map through a preset program, and extracting a full-map gray level value distribution matrix, wherein the size of the full-map gray level value distribution matrix does not exceed the range of a light power distribution square aperture fitted by software generally; when a large amount of repeated data appears in the edge of the gray value distribution matrix of the whole image, the repeated data needs to be removed. L effective gray values are extracted in the full-map gray value distribution matrix for the first calculation, where it should be noted that the number L of effective gray values is not equal to the number of gray values in the entire full-map gray value distribution matrix, and the value range of the effective gray values generally does not exceed the range of the software-fitted optical power distribution circular aperture in the gray value matrix. It should be noted that, if the change rate of the angular power distribution variance is significantly lower than the normal data of the test light under the same wavelength and the same power, the value range of the effective gray scale value needs to be narrowed for calculation again.
And after the angular power distribution variance is obtained through the first calculation, performing second calculation on the plurality of angular power distribution variances to obtain the angular power change rate. Through the steps of the method, the mode conversion performance of the optical coupler 1 can be well described, the mode shaping potential of the optical coupler 1 is represented, the performance optimization difficulty of the optical coupler 1 is reduced, and more possibility is provided for improving the mode conversion efficiency of the optical coupler 1.
The rate of change of the angular power obtained by the above steps is superior to that obtained by solving a simple average value.
In some embodiments, the first calculation is derived from equation (1), equation (1) being as follows:
wherein,in order to be the angular power distribution variance,the variance of the angular power distribution of the far field light distribution map at different positions (i),to read out the numerical elements in the gray matrix,as the average value of the numerical elements in the read gray matrix,is a gray valueThe probability of occurrence in the gray matrix, L being the number of elements in the gray matrix.
In some embodiments, the second calculation is derived from equation (2), equation (2) being as follows:
wherein,for the rate of change of angular power of the desired output light in far field propagation,l、1.5 l、2.5 l、3.5 lis the distance between adjacent graduation lines corresponding to different positions along the light path direction, whereinlIn order to set the unit distance to a preset value,the angular power distribution variance of the far field light distribution pattern at different locations (i).
The specific embodiment is as follows:
the optical coupler with the photon lantern of 3x1 is adopted to generate test light, the generated test light is laser of 976nm, the light output by the optical coupler is in a stable optical mode, and the power jitter is not more than +/-0.1%. The first lens is an aspheric convex lens with a focal length less than 30mm, for example, the focal length of the first lens can be 25mm or 20mm; the first lens collimates the output light of the optical coupler, the optical coupler is arranged on a flange fixing platform through a flange joint, the flange fixing platform uses an optical fiber coupler fixing platform with a threaded hole matched with an SNA-1 flange, and the output end of the optical coupler is located at the focal point position of the first lens.
The focal length of second lens is 200mm, sets up in the rear of first lens (the output direction behind the first lens of light transmission promptly), and the second lens is used for enlargiing test light, and the light beam quality analyzer of being convenient for obtains more clear light field distribution diagram. The beam quality analyzer is a beam quality analyzer model SP 620. The beam quality analyzer is used for far-field light pattern capture and transmits a lossless far-field light distribution diagram to a processing unit, and the processing unit is a computer terminal or other computer equipment. The SP620 light beam quality analyzer uses a far-field lens without amplification, and can add an optical filter according to the output light power to avoid light saturation in a pattern and ensure the quality of a far-field light distribution diagram.
The spout is the bottom plate of taking standard scale and recess, and both sides have the screw hole, can fix on optical platform. The upper groove is used for fixing and sliding the beam quality analyzer, so that the center of the lens of the beam quality analyzer is always positioned on the central shaft of the second lens. The first preset distance is 30mm, the second preset distance is 80mm, and the second preset distance can be verified through experiments to obtain a stable power distribution pattern (i.e., a far-field light distribution pattern) of a transverse mode field of light, which can be completely captured by a CCD lens (a lens in a beam quality analyzer), where the power distribution pattern represents a far-field transverse mode light spot, and can also be expressed as a power distribution state of the far-field light on a transverse interface, and the distance is generally lower than 80mm. The distance from the first scale to the end face of the sliding groove close to one end of the optical coupler is 10mm, the test light is input into the second lens after being collimated by the first lens and is input into a far-field lens of the beam quality analyzer SP620 after being amplified by the second lens, and the far-field light is captured by the lens and input into a computer program for subsequent processing.
Wherein, the distance between two adjacent standard scales of the sliding groove is respectivelyl,1.5 l,2.5l,3.5 lMore non-equidistant scales can increase the reliability of the result.
And the SP620 light beam quality analyzer performs noise reduction processing on the collected far-field light distribution diagram, the far-field light distribution diagram of the input program is standard iridescence, and the gain adjustment carried by the light beam quality analyzer is used for noise reduction. Through image gray processing and gray matrix extraction of the processing unit, the far-field light distribution diagram is processed into a 16-bit gray diagram by python, and a gray value matrix is extracted to obtain a 16-bit gray value. The angular power distribution variance solution for multiple images is implemented based on the procedure of equation (1). The angular power distribution variance uses a gray-scale variance formula. The angular power change rate is obtained based on the first calculation result of formula (1) and the second calculation of formula (2). The effect of solving for the variance ratio of angular power distribution by curve fitting based on more data is superior to that of simple mean solution. The far field light distribution pattern used to analyze the rate of change of the variance of the angular power distribution is no more than 300mm farthest from the output of the optical coupler.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
The above embodiments of the present invention should not be construed as limiting the scope of the present invention. Any other corresponding changes and modifications made according to the technical idea of the present invention should be included in the protection scope of the claims of the present invention.
Claims (9)
1. The detection device of the optical coupling device is characterized by comprising an optical coupler, a first lens, a second lens, a beam quality analyzer, a sliding assembly and a processing unit;
the optical coupler is provided with an output end, the light beam quality analyzer is provided with a receiving end, the sliding assembly comprises a sliding groove and a sliding block, the light beam quality analyzer is arranged on the sliding block, and the sliding block can move in the sliding groove;
the optical coupler, the first lens, the second lens and the light beam quality analyzer are sequentially arranged along the light path direction, the central point of the output end of the optical coupler, the central point of the first lens, the central point of the second lens and the central point of the receiving end of the light beam quality analyzer are positioned on the same central axis, the groove-direction axis of the sliding groove and the central axis are positioned in the same vertical plane, and the processing unit is electrically connected with the light beam quality analyzer;
the optical coupler is used for generating test light, and the test light is emitted through the output end of the optical coupler;
the first lens is used for collimating the test light, and the second lens is used for converging the collimated test light;
the beam quality analyzer is used for acquiring far-field light distribution diagrams of the received test light at different optical path positions and sending the far-field light distribution diagrams at the different optical path positions to the processing unit;
the processing unit is used for calculating far-field light distribution maps at different optical path positions to obtain the angle power change rate of the far-field transverse mode pattern of the test light in propagation.
2. The detecting device of claim 1, wherein the distance between the center point of the first lens and the output end of the optical coupler is within a first preset range.
3. The detecting apparatus of claim 1 or 2, wherein a plurality of scales are further disposed on the outer sidewall of the sliding groove, the distance between two adjacent scales gradually increases along the propagation direction of the light path according to a first predetermined gradient, and the scales are used for marking the position of the beam quality analyzer in the sliding groove.
4. The detecting device of the optical coupler element according to claim 2, wherein the distance between the output end of the optical coupler and the closest graduation mark on the slide groove is within a second preset range;
and/or the distance between the scale mark on the side farthest from the output end of the optical coupler and the second lens is the focal length of the second lens.
5. The detecting device for detecting the optical coupling device according to claim 1, further comprising a flange fixing platform and a flange joint, wherein the output end of the optical coupler is fixed on the flange fixing platform through the flange joint.
6. A method for inspecting an optocoupler device, characterized in that it is applied to an inspection apparatus for optocoupler devices according to any of claims 1 to 5, the method comprising the steps of:
the output end of the optical coupler emits test light;
the first lens collimates the test light;
the second lens is used for converging the collimated test light;
the beam quality analyzer acquires far-field light distribution diagrams of the received test light at different optical path positions, and sends the far-field light distribution diagrams at the different optical path positions to the processing unit;
and the processing unit calculates far-field light distribution maps at different optical path positions to obtain the angular power change rate of the test light in far-field transmission.
7. The method as claimed in claim 6, wherein the processing unit calculates the far-field light distribution map at a plurality of different optical path positions to obtain the angular power variation rate of the test light in far-field propagation, and comprises the following steps:
acquiring the far-field light distribution map;
performing image gray processing on the far-field light distribution map to obtain a full-map gray value distribution matrix;
performing first calculation on the full-image gray value distribution matrix to obtain an angular power distribution variance;
and performing second calculation by using the angular power distribution variance to obtain the angular power change rate.
8. The method of detecting an optocoupler device according to claim 7, wherein the first calculation is derived from equation (1), and wherein equation (1) is as follows:
wherein,in order to be the angular power distribution variance,the variance of the angular power distribution of the far field light distribution map at different positions (i),to read out the numerical elements in the gray matrix,as the average value of the numerical elements in the read gray matrix,is a gray valueThe probability of occurrence in the gray matrix, L being the number of elements in the gray matrix.
9. The method of detecting an optocoupler device according to claim 8, wherein the second calculation is derived from equation (2), and wherein equation (2) is as follows:
wherein,for the rate of change of angular power of the desired output light in far field propagation,l、1.5l、2.5l、3.5lis the distance between adjacent graduation lines corresponding to different positions along the light path direction, whereinlIn order to set the unit distance to a preset value,is the angular power distribution variance of the far field light distribution map at different locations (i).
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