CN103792435B - Coupling component, and data measuring device and method for measuring scattering parameters - Google Patents
Coupling component, and data measuring device and method for measuring scattering parameters Download PDFInfo
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- CN103792435B CN103792435B CN201310753021.6A CN201310753021A CN103792435B CN 103792435 B CN103792435 B CN 103792435B CN 201310753021 A CN201310753021 A CN 201310753021A CN 103792435 B CN103792435 B CN 103792435B
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Abstract
The invention discloses a data measuring device for measuring scattering parameters. The data measuring device includes a coupling component and a vector network analyzer; the coupling component includes a first probe, a second probe, a first port connected with the first probe, and a second port connected with the second probe; the first probe and the second probe are respectively used for coupling radio frequency signals of a measured device; an output port of the vector network analyzer is used for connection with a public input port of the measured device; and an input port is connected with the first port or the second port of the coupling component, so as to measure a transmission coefficient the public input port of the measured device to the first probe and the second probe and measure a delay coefficient between the first probe and the second probe. The transmission coefficient and the delay coefficient are used to calculate scattering parameters of the measure device. By adopting the above method, in the invention, while the work condition of the measured device is not changed, the scattering parameters of the measured device are measured.
Description
Technical field
The present invention relates to microwave measurement field, more particularly to a kind of coupling assembly for measuring scattering parameter, data
Measure device and method.
Background technology
Multiport circuit is the common measurement means in frequency microwave field, for multiport Microwave Net, scattering
Parameter includes the isolation between the reflection coefficient of port and port.By the scattering parameter of measurement port it can be estimated that port
Matching status and port and port between intercouple.Vector network analyzer is the major meters of scattering parameter
Table, because Meter Test port is typically coaxial-type, therefore when measuring measured piece scattering parameter, needs to pacify on measured piece
Radio-frequency joint is connected with vector network analyzer by dress radio-frequency joint by radio-frequency cable.
Fig. 1 is the circuit connection diagram of existing measurement scattering parameter one embodiment, as shown in figure 1, measured piece 11 includes one section
Microstrip line 111, for testing the scattering parameter of microstrip line 111, need to use and include microstrip line 211,212 and radio-frequency joint 213,214
Transition piece measured piece 11 is connected with vector network analyzer device 31 by cable.If need to obtain at microstrip line 111 plane of reference a
Scattering parameter, need using the technology such as " De- embedding " or " TRL calibration ", to eliminate the impact that the transition pieces such as radio-frequency joint bring.
When measured piece 11 is a part for certain complete micro-strip power division network, by above-mentioned conventional measuring method, micro-strip work(need to be destroyed
The integrity of subnetwork, inserts the joint for measurement in measurement position, and this mode can affect test result, produce unfavorable because
Element.
Content of the invention
The invention mainly solves the technical problem of providing a kind of coupling assembly for measuring scattering parameter, data determination
Device and method, so that in the case of not changing measured piece working condition, measures to the scattering parameter of measured piece.
For solving above-mentioned technical problem, one aspect of the present invention is：There is provided one kind for measurement scattering ginseng
The coupling assembly of number, includes the first probe, the second probe and pops one's head in the first first port of being connected of probe and with second being connected
Second port；First probe, the second probe are respectively used to couple the radiofrequency signal of measured piece so that radiofrequency signal is used for scattering ginseng
The measurement of number.
Wherein, coupling assembly includes the substrate for setting first probe, the second probe, first port and second port.
Wherein, substrate can be provided with measured piece, i.e. measured piece and the first probe, the second probe, first port and second
Port is on same substrate.
Wherein, the first probe and the second probe are respectively perpendicular to the distance between axis of measured piece to be not equal to 1/2 tested
The integral multiple of the internal electromagnetic wave operation wavelength of part, and it is less than the total length of measured piece more than 0；First probe and the second probe are respectively
For coupling the radiofrequency signal of measured piece, and the first probe is identical with the stiffness of coupling of measured piece with the second probe.
For solving above-mentioned technical problem, one aspect of the present invention is：There is provided one kind for measurement scattering ginseng
The data determination device of number, including coupling assembly and vector network analyzer；Coupling assembly include the first probe, second probe,
The first port being connected with the first probe and the second port being connected with the second probe；First probe, the second probe are respectively used to
The radiofrequency signal of coupling measured piece；Vector network analyzer output port is used for being connected with the public input port of measured piece, defeated
Inbound port is connected with the first port of coupling assembly or second port, for measuring the public input port of measured piece to the first probe
Or second probe transmission coefficient and the first probe and the second probe between retardation coefficient, described transmission coefficient and retardation coefficient are used
Measurement in described scattering parameter.
For solving above-mentioned technical problem, one aspect of the present invention is：There is provided one kind for measurement scattering ginseng
The method of number, including step：Measure that the first probe, the second probe and the public input port of measured piece, output port are formed 4
In the Microwave Net of port, the public input port of measured piece is to the first probe, the transmission coefficient of the second probe and the first probe and second
Retardation coefficient between probe, wherein, the first probe and second is popped one's head in the radiofrequency signal for coupling measured piece；According to transmission coefficient
Calculate the scattering parameter of measured piece with retardation coefficient.
Wherein, the first probe and the second probe are respectively perpendicular to the distance between axis of measured piece to be not equal to 1/2 tested
The integral multiple of the internal electromagnetic wave operation wavelength of part, and it is less than the total length of measured piece more than 0；First probe and the second probe are respectively
For coupling the radiofrequency signal of measured piece, while the first probe is identical with the stiffness of coupling of measured piece with the second probe.
Wherein, the acquisition pattern of retardation coefficient is the survey of electromagnetic field simulation software emulation or the vector network analyzer of calibration
Amount.
Wherein, the acquisition pattern of transmission coefficient is to be measured using the vector network analyzer of calibration, wherein, transmission system
Number includes amplitude and phase place.
Wherein, the first probe is near the public input port of measured piece, the reflection system of the corresponding measured piece position of the first probe
Number is equal to-(S41-S31 × G21)/(S41-S31 × G12）；The reflection coefficient of the corresponding measured piece position of the second probe is equal to-
(S31-S41×G12)/(S41-S31×G21）；Wherein, S31, S41 are radiofrequency signal from the public input port of measured piece to the
One probe, second probe transmission coefficient, G12 be radiofrequency signal from first pop one's head in second probe retardation coefficient, G21 be penetrate
Frequency signal from second pop one's head in first probe retardation coefficient.
Wherein, the isolation between two identical its radio-frequency (RF) signal input end mouths of 4 port Microwave Nets is（S81-S71×
G12）/（S41-S31×G12）；Wherein, S31, S41 be one 4 port Microwave Nets in radiofrequency signal from the public input of measured piece
To the transmission coefficients of two probes, S81, S71 are radiofrequency signal public input port of measured piece from one 4 port Microwave Nets to mouth
The transmission coefficient of two probes in another 4 port Microwave Nets, G12 is the retardation coefficient between one 4 port Microwave Net probes,
Probe corresponding to S31, S71 compared with respective other probes being located in 4 port Microwave Nets, away from described public input port
Close together.
The invention has the beneficial effects as follows：It is different from the situation of prior art, the present invention arranges the first spy near measured piece
Head and second probe to form 4 port Microwave Nets, wherein, first probe, second pop one's head in for couple measured piece radio frequency believe
Number, by measure the public input port of measured piece in 4 port Microwave Nets to the first probe, the transmission coefficient of the second probe and
Retardation coefficient between the first probe and the second probe, calculates the scattering parameter of measured piece.By the way, the present invention can be
In the case of not changing measured piece working condition, the scattering parameter of measured piece is measured.
Brief description
Fig. 1 is the circuit connection diagram of existing measurement scattering parameter one embodiment；
Fig. 2 is the schematic flow sheet of multiport circuit method one embodiment of the present invention；
Fig. 3 is the circuit connection diagram of one embodiment during data determination measurement device scattering parameter of the present invention；
Fig. 4 is the schematic diagram of embodiment illustrated in fig. 3；
Fig. 5 is the schematic diagram of isolation one embodiment between measurement port of the present invention；
Fig. 6 is the schematic diagram that coupling assembly of the present invention measures；
Fig. 7 is the structural representation that coupling assembly of the present invention measures microstrip line one embodiment；
Fig. 8 is the structural representation that coupling assembly of the present invention measures another embodiment of microstrip line.
Specific embodiment
The present invention is described in detail with reference to the accompanying drawings and examples.
In a preferred embodiment of the present invention, the data determination device for measuring scattering parameter includes coupling assembly and vector
Network Analyzer.
Wherein, the coupling assembly for measuring scattering parameter includes the first probe, the second probe is connected with the first probe
First port and the second port being connected with the second probe.Wherein, the first probe and the second probe are respectively used to couple measured piece
Radiofrequency signal.And first probe and during the second probe setting, the first probe and the second probe are respectively perpendicular to the axle of measured piece
The distance between line is not equal to the integral multiple of the internal electromagnetic wave operation wavelength of 1/2 measured piece, and is less than the overall length of measured piece more than 0
Degree；Meanwhile, first probe and second probe be respectively used to couple measured piece radiofrequency signal, and first probe and second probe with
The stiffness of coupling of measured piece is identical.
During concrete application, the first probe and second is popped one's head in and be may be disposed at both sides or the homonymy of measured piece radial direction.Quilt
The operation wavelength surveying the internal electromagnetic wave of part can draw according to known to measured piece in relevant parameter reckoning.
The public input port of the first probe, the second probe and measured piece, output port form 4 port Microwave Nets.
The input port of vector network analyzer is connected with first port or second port, and outfan is public with measured piece
Input port connects, for measuring what the public input port of measured piece in 4 port Microwave Nets was popped one's head in the first probe or second
Retardation coefficient between transmission coefficient and the first probe and the second probe.Calculated tested according to the transmission coefficient recording and retardation coefficient
The scattering parameter of part.
In other embodiments, if vector network analyzer is multiport vector network analyzer, including multiple inputs
Port, each input port is simultaneously connected with first port and second port respectively.
Refer to Fig. 2, Fig. 2 is the schematic flow sheet of multiport circuit method one embodiment of the present invention, as shown in Fig. 2
Comprise the following steps：
Step 201, measures public input port, 4 ends of output port formation of the first probe, the second probe and measured piece
In mouth Microwave Net, the public input port of measured piece is to the first probe, the transmission coefficient of the second probe and the first probe and the second spy
Retardation coefficient between head, wherein, the first probe and second is popped one's head in the radiofrequency signal for coupling measured piece.
Wherein, the acquisition pattern of retardation coefficient includes the vector network analyzer of electromagnetic field simulation software emulation and calibration
Measurement.The acquisition pattern of transmission coefficient is the measurement of the vector network analyzer of calibration, using the vector network analyzer of calibration
Measure the transmission coefficient obtaining and include amplitude and phase place.
Step 202, calculates the scattering parameter of measured piece according to transmission coefficient and retardation coefficient.
In the present embodiment, measured piece is a uniform transmission line, arranges two test points, test point in uniform transmission line
Setting nearby first probe and the second probe, can pass through electric capacity or electricity between the first probe, the second probe and uniform transmission line
Sense carries out weak coupling, generally is designed as being less than -20dB by coupling magnitude, to weaken the impact to uniform transmission line characteristic.
Wherein, the first probe and the second probe are respectively perpendicular to the distance between axis of measured piece to be not equal to 1/2 tested
The integral multiple of the internal electromagnetic wave operation wavelength of part, and it is less than the total length of measured piece more than 0；Meanwhile, the first probe and the second spy
Head is respectively used to couple the radiofrequency signal of measured piece, and the first probe is identical with the stiffness of coupling of measured piece with the second probe.?
During concrete application, the first probe and second is popped one's head in and be may be disposed at both sides or the homonymy of measured piece radial direction.
Measure what the public input port of measured piece was popped one's head in the first probe and second by the vector network analyzer of calibration
Retardation coefficient between transmission coefficient and the first probe and the second probe, then calculates according to the computing formula being derived from through theory
The scattering parameter of measured piece.
Refer to Fig. 3, Fig. 3 is the circuit connection diagram of one embodiment during data determination measurement device scattering parameter of the present invention,
Including：Measured piece 31, the first radio-frequency joint 32, second radio-frequency joint the 33, first probe the 34, second probe 35, vector network divide
Analyzer 36 and load 37.
Wherein, measured piece 31 includes transmission line 311, and the transmission line 311 in the present embodiment is uniform transmission line.
The setting principle of the present embodiment is to arrange two test points in uniform transmission line 311, using the arrow through calibration
The amount Network Analyzer 36 measurement public input port of measured piece is to the delay system between the transmission coefficient of two test points and test point
Number, recycles corresponding computing formula, obtains the scattering parameter of test point position.
Specifically, 311 two test points of transmission line（Plane of reference b, plane of reference c）The first probe the 34, second spy of setting nearby
35, the distance between the first probe 34 and the second probe 35 are d.
Transmission line 311 input, outfan are respectively equipped with the first radio-frequency joint 32, the second radio-frequency joint 33.Vector network
The output port of analyser 36 is connected with the first radio-frequency joint 32 by cable, and its input port passes through cable connection Single port
38, this port 38 can be connected the transmission system at test reference face b, plane of reference c with the first probe 34 or the second probe 35 respectively
Retardation coefficient between number and plane of reference b and plane of reference c, that is, the public input port of measured piece is to the biography of the first probe, the second probe
Defeated coefficient and the first probe, the retardation coefficient between the second probe.The computing formula derived further according to the present invention, obtains the plane of reference
Scattering parameter at b, plane of reference c.
Wherein, the second radio-frequency joint 33 connects load 37.
For the more detailed measurement process illustrating scattering parameter, illustrate with reference to Fig. 3, Fig. 4.
Fig. 4 is the schematic diagram of embodiment illustrated in fig. 3, as shown in figure 4, uniform transmission line 311 setting two nearby is apart for d
The first probe 34 and the second probe 35, wherein, d is not equal to the integral multiple of the internal electromagnetic wave operation wavelength of 1/2 transmission line 311,
First probe 34 and the second probe 35 are coupled by way of inductively or capacitively with transmission line 311 respectively.This structure forms 4 ports
Microwave Net, wherein, port 1（Port1）, Port2 be located at the input of transmission line 311, outfan respectively, that is, the first radio frequency connects
The 32, second radio-frequency joint 33.Port3, Port4 are connected with first probe the 34, second probe 35 respectively.
Wherein, Port1 is public input port.
Can be measured using vector network analyzer 36 shown in Fig. 3 obtain Port1 to Port3, the transmission coefficient S31 of Port4,
S41, and retardation coefficient G12, the retardation coefficient G21 of Port1 to Port2 of Port2 to Port1.
As shown in figure 4, V1, V2 are the vector voltage of corresponding transmission line 311 positions of first probe the 34, second probe 35, can
Vector network analyzer 36 records as shown in Figure 3, wherein, V1+、V1-It is V1 corresponding incidence wave voltage and reflected wave voltage, V2+、V2-It is V2 corresponding incidence wave voltage and reflected wave voltage.
Existing transmission line theory includes as follows：
V1=V1++V1-（1）
V2=V2++V2-（2）
V1+=V2+×G12 （3）
V1-=V2-×G21 （4）
G12=exp(j×A×d）Retardation coefficient for Port2 to Port1, G21=exp (- j × A × d) arrives for Port1
The retardation coefficient of Port2, A is the propagation constant of uniform transmission line, and ± j is -1 numerical value opening radical sign, G12=1/G21.
Joint equation（1）~（4）, can obtain：
V1-=（V2-V1×G21）/（G12-G21）
V1+=（V2-V1×G12）/（G21-G12）
V2-=（V1-V2×G12）/（G21-G12）
V2+=（V2-V1×G21）/（G12-G21）
Wherein, pop one's head in because of the first probe 34, second and intercouple between 35 and transmission line 311, therefore, S31=K ×
V1, S41=K × V2, wherein, K is the coefficient of coup.
Definition according to scattering parameter and above-mentioned existing theory, can try to achieve V2 position to the reflection system loading 37 directions
Number is：S11m=V2-/V2+=-(S31-S41×G12)/(S41-S31×G21）, the corresponding impedance in V2 position is：Z0×（1
+S11m)/(1-S11m).In the same manner, can try to achieve and can try to achieve V1 position and to the reflection coefficient loading 37 directions be：S=V1-/V1+
=-(S41-S31×G21)/(S41-S31×G12）.
Refer to Fig. 5, Fig. 5 is the schematic diagram of isolation one embodiment between measurement port of the present invention, as shown in figure 5, including
First transmission line 51, second transmission line the 52, first probe the 53, second probe the 54, the 3rd probe the 55, the 4th probe 56 and 2 ports
Network.
Wherein, the input of the first transmission line 51, outfan connect Port1, Port2 respectively, first probe the 53, second spy
54 connect Port3, Port4 respectively.
The input of the second transmission line 52, outfan connect Port5, Port6 respectively, the 3rd probe the 55, the 4th probe 56
Connect Port7, Port8 respectively.
Wherein, the first probe 53 and the second probe the distance between 54, between the 3rd probe 55 and the 4th probe 56 away from
From being d, d is not equal to 1/2 first transmission line 51 or the integral multiple of the second transmission line 52 operation wavelength
Wherein, V1, V2 are respectively the vector voltage of corresponding first transmission line 51 position of first probe the 53, second probe 54,
Wherein, V1+、V1-It is V1 corresponding incidence wave voltage and reflected wave voltage, V2+、V2-It is V2 corresponding incidence wave voltage and reflection
Wave voltage.
V5, V6 are respectively the vector voltage of corresponding second transmission line 52 position of the 3rd probe the 55, the 4th probe 56, wherein,
V5+、V5-It is V5 corresponding incidence wave voltage and reflected wave voltage, V6+、V6-It is V6 corresponding incidence wave voltage and echo electricity
Pressure.
Schematic diagram shown in Fig. 5 can measure the isolation between Port1 and Port5.Measuring principle is same as shown in Figure 4,
Through similar derivation, can obtain：
V6-=（V6-V5×G21）/（G12-G21）
V6+=（V5-V6×G12）/（G21-G12）
V5-=（V6-V5×G12）/（G21-G12）
V5+=（V5-V6×G21）/（G12-G21）
Measure transmission coefficient S31 and S41 of public input port Port1 to Port3 and Port4 respectively, pushed away according to above-mentioned
Lead and embodiment illustrated in fig. 4 derivation, calculate V1+=（S41-S31×G12）/（G21-G12）；Measure public input port again
Transmission coefficient S71 and S81 of Port1 to Port7 and Port8, according to derivation, calculates V5-=（S81-S71×G12）/（G21-
G12）.According to the definition of S parameter, the isolation ISO between Prot1 and Port51-5=V5-/V1+=（S81-S71×G12）/
（S41-S31×G12）.
Refer to Fig. 6, Fig. 6 is the schematic diagram that coupling assembly of the present invention measures, including microstrip line 61, first probe
62nd, the second probe 63 and Port1, Port2, Port3, Port4.Wherein, the distance between the first probe 62 and the second probe 63
For d.
In Fig. 6, the measuring principle of probe is, is arranged in pairs measuring probe 62,63, the first spy near uniform microstrip line 61
62, second probe 63 can be printed on PCB in the way of using etching.By testing public input port Port1 to first
Retardation coefficient between the transmission coefficient of probe 62, second probe 63 and first probe the 62, second probe 63, can be calculated uniformly
The scattering parameter of first probe the 62, second probe 63 correspondence positions on microstrip line 61.
Refer to Fig. 7, Fig. 7 is the structural representation that coupling assembly of the present invention measures microstrip line one embodiment, including tested
Part and measurement apparatus.
Wherein, measured piece includes substrate 711, microstrip line 712, and measurement apparatus include first probe the 721, second probe 722.
Wherein, the input of microstrip line 712, outfan are connected with Port1, Port2 respectively, first probe the 721, second probe
722 are connected with Port3, Port4 respectively.
In the present embodiment, there is uniform microstrip line 712, first probe 721 of characteristic impedance Z0 and the second probe 722 leads to
Cross PCB etch process to be produced on substrate 711, the distance between probe is not equal to the integer of 1/2 microstrip line 712 operation wavelength
Times, first probe 721 and second probe 722 by microstrip line 712 between gap formed equivalent capacity enter with microstrip line 712
Row coupling, forms the 4 port Microwave Nets with Port1～Port4.
Refer to Fig. 8, Fig. 8 is the structural representation that coupling assembly of the present invention measures another embodiment of microstrip line, including by
Survey part and measurement apparatus.
Wherein, measured piece includes the first substrate 811 and the microstrip line 812 being etched on the first substrate 811.
Measurement apparatus include the second substrate 821 and are etched in the first probe 822 and the second probe on the second substrate 821
823.
Wherein, the input of microstrip line 812, outfan are connected with Port1, Port2 respectively, first probe the 822, second probe
823 are connected with Port3, Port4 respectively.
In the present embodiment, the uniform microstrip line 812 with characteristic impedance Z0 is produced on the first base by PCB etch process
On piece 811, the first probe 822 and the second probe 823 are produced on the second substrate 821 by PCB etch process, between probe
Distance is not equal to the integral multiple of 1/2 microstrip line 812 operation wavelength, and the second substrate 821 is in the first probe 822 and the second probe 823
Outside region be eliminated as much as to reduce impact to microstrip line 812, the first probe 822 and the second probe 823 by with micro-
The equivalent capacity that gap between band wire 812 is formed is coupled with microstrip line 812, is formed and has the 4 of Port1～Port4
Port Microwave Net.
In sum, the present invention is by being placed around measuring probe in measured piece, it is to avoid will be used for connecting test cable
Radio-frequency joint is arranged in measured piece, can be scattered the measurement of parameter in the case of not changing measured piece working condition.Tool
The following advantage of body：
A. coupling assembly low manufacture cost, is suitably applied the measurement of the various microwave circuit scattering parameters using micro-strip.
B. measuring method is simply it is not necessary to using special calibration measure, only need to obtaining coupling probe and be formed with microstrip line
4 port Microwave Nets transmission coefficient.
C. can frequency measurement bandwidth, as long as probe vertical is not equal to 1/2 microstrip line work in the distance between the axis of microstrip line
The integral multiple of wavelength can measure.
D. coupling probe uses PCB etch process, and dimensional accuracy is high, and concordance is good.
The foregoing is only embodiments of the invention, not thereby limit the present invention the scope of the claims, every using this
Equivalent structure or equivalent flow conversion that bright description and accompanying drawing content are made, or directly or indirectly it is used in other related skills
Art field, is included within the scope of the present invention.
Claims (11)
1. a kind of coupling assembly for measuring scattering parameter is it is characterised in that include the first probe, the second probe and first
First port and the second port being connected with the second probe that probe connects；
Described first probe, the second probe are respectively used to couple the radiofrequency signal of measured piece so that described radiofrequency signal is used for scattering
The measurement of parameter, and the first probe is identical with the stiffness of coupling of measured piece with the second probe.
2. coupling assembly according to claim 1 is it is characterised in that described coupling assembly is included for arranging described first
Probe, the substrate of the second probe, first port and second port.
3. coupling assembly according to claim 2 is it is characterised in that be provided with measured piece on described substrate.
4. the coupling assembly according to Claims 2 or 3 is it is characterised in that described first probe and the second probe hang down respectively
The distance between straight axis in measured piece is not equal to the integral multiple of the internal electromagnetic wave operation wavelength of 1/2 measured piece, and little more than 0
Total length in measured piece.
5. a kind of data determination device for measuring scattering parameter is it is characterised in that inclusion coupling assembly and vector network divide
Analyzer；
Described coupling assembly include the first probe, the second probe and the first first port of being connected of probe and with the second probe company
The second port connecing；Described first probe, the second probe are respectively used to couple the radiofrequency signal of measured piece；
Described vector network analyzer output port is used for being connected with the public input port of measured piece, input port and described coupling
The first port of seaming element or second port connect, for measuring the public input port of measured piece to the first probe or the second probe
Transmission coefficient and the first probe and the second probe between retardation coefficient, described transmission coefficient and retardation coefficient are used for described scattering
The measurement of parameter.
6. a kind of method for measuring scattering parameter is it is characterised in that comprise the following steps：
In the 4 port Microwave Nets that the public input port of mensure first probe, the second probe and measured piece, output port are formed
The public input port of measured piece is to prolonging between the described first probe, the transmission coefficient of the second probe and the first probe and the second probe
Late coefficient, wherein, described first probe and second is popped one's head in the radiofrequency signal for coupling measured piece；
Calculate the scattering parameter of measured piece according to described transmission coefficient and retardation coefficient.
7. method according to claim 6 it is characterised in that described first probe and second probe be respectively perpendicular to tested
The distance between axis of part is not equal to the integral multiple of the internal electromagnetic wave operation wavelength of 1/2 measured piece, and is less than measured piece more than 0
Total length；
Wherein, described first probe and the second probe are respectively used to couple the radiofrequency signal of measured piece, and the first probe and second
Probe is identical with the stiffness of coupling of measured piece.
8. method according to claim 7 is it is characterised in that the acquisition pattern of described retardation coefficient is that electromagnetic-field simulation is soft
The measurement of the vector network analyzer of part emulation or calibration.
9. method according to claim 7 is it is characterised in that the acquisition pattern of described transmission coefficient is the arrow using calibration
Amount Network Analyzer measures, and wherein, described transmission coefficient includes amplitude and phase place.
10. the method described according to Claim 8 or 9 any one is it is characterised in that described first probe is near measured piece
Public input port, the reflection coefficient that described first probe corresponds to measured piece position is equal to-(S41-S31 × G21)/(S41-S31
×G12)；
The reflection coefficient that described second probe corresponds to measured piece position is equal to-(S31-S41 × G12)/(S41-S31 × G21)；
Wherein, S31, S41 are radiofrequency signal from the public input port of described measured piece to the described first probe, the second biography popped one's head in
Defeated coefficient, G12 is that radiofrequency signal is popped one's head in from described first the retardation coefficient of the second probe, and G21 is radiofrequency signal from described the
Two pop one's head in first probe retardation coefficient.
11. methods according to claim 10 are it is characterised in that two identical 4 its radiofrequency signals of port Microwave Net are defeated
Isolation between inbound port is (S81-S71 × G12)/(S41-S31 × G12)；
Wherein, S31, S41 are that in one 4 port Microwave Nets, radiofrequency signal is popped one's head in from the public input port of described measured piece to two
Transmission coefficient, S81, S71 be radiofrequency signal from described one 4 port Microwave Nets the public input port of measured piece to another 4
The transmission coefficient of two probes in the Microwave Net of port, G12 is the retardation coefficient between described one 4 port Microwave Net probes,
Probe corresponding to S31, S71 compared with respective other probes being located in 4 port Microwave Nets, away from described public input port
Close together.
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| CN106405462B (en) * | 2016-08-30 | 2019-03-22 | 中国电子科技集团公司第十三研究所 | Piece scattering parameter trace to the source and uncertainty evaluation method |
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| CN110361685B (en) * | 2019-07-01 | 2021-07-30 | 北京无线电计量测试研究所 | Broadband oscilloscope probe transmission characteristic calibration method and system |
| CN112230069A (en) * | 2020-08-05 | 2021-01-15 | 北京经纬恒润科技股份有限公司 | Integrated circuit electromagnetic interference diagnostic system and method |
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