CN110361685B - Broadband oscilloscope probe transmission characteristic calibration method and system - Google Patents
Broadband oscilloscope probe transmission characteristic calibration method and system Download PDFInfo
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Abstract
The application discloses a method for calibrating transmission characteristics of a broadband oscilloscope probe, which comprises the following steps: testing the full scattering coefficient of the standard fixture, converting the full scattering coefficient into a time domain, intercepting the 1 st port reflected pulse, and converting the intercepted pulse into a frequency domain to obtain the left arm coaxial port reflection coefficient; intercepting the 2 nd port reflected pulse and converting the intercepted pulse into a frequency domain to obtain a right arm coaxial port reflection coefficient; calculating the total scattering coefficient of the L part according to the total scattering coefficient of the standard clamp, the reflection coefficient of the left arm coaxial port and the reflection coefficient of the right arm coaxial port; connecting the 1 st port with a test end of a vector network analyzer and connecting the 2 nd port with a matched load; and connecting the output end of the broadband oscilloscope probe with the other testing end of the vector network analyzer, and connecting the input end of the broadband oscilloscope probe with the center of the standard fixture in a pressing manner, and further testing to obtain the scattering coefficient of the broadband oscilloscope probe. The application also comprises a system applying the method. According to the scheme, the measuring error caused by the frequency characteristic of the calibration clamp can be eliminated, and the accuracy of the calibration result is improved.
Description
Technical Field
The application relates to the technical field of microwave measurement, in particular to a broadband oscilloscope probe transmission characteristic calibration method and system based on microwave network measurement.
Background
The oscilloscope probe is an important tool for testing board-level circuits, and the basic working principle of the oscilloscope probe is that partial energy of a transmission signal in a circuit board is extracted through the front end of the probe which is in contact with a circuit board transmission line or a specific bonding pad, then the extracted signal is compensated and amplified through an internal active device, and finally the signal to be tested is transmitted to an oscilloscope for measurement and analysis.
The transmission characteristic is an important technical index of the oscilloscope probe, represents the response of the oscilloscope probe to signals with different frequencies, and directly influences the measurement capability of the oscilloscope probe to high-speed and high-frequency signals. The traditional method for calibrating the transmission characteristic of the oscilloscope probe is to use a signal generator to generate a standard sine wave signal, then utilize an oscilloscope probe calibration clamp to guide the standard signal into an input end of a probe to be calibrated, then connect an output end of the oscilloscope probe to a standard oscilloscope or a power meter, change the frequency of the standard sine wave signal, record the amplitude or power of signals output by the oscilloscope probe under different frequencies, and finally compare the amplitude or power with the amplitude or power at a reference frequency to obtain the transmission characteristic of the probe within a calibration bandwidth range.
The conventional probe transmission characteristic calibration method can only perform probe calibration within 6GHz of bandwidth, because the conventional calibration method assumes the calibration jig as an ideal electrical connection device, completely ignores the influence of the frequency characteristic of the calibration jig on the calibration result, and introduces a small error in the frequency band, but when the calibrated bandwidth is further increased, the measurement error introduced by the frequency characteristic of the calibration jig is larger and larger, and the high accuracy requirement of calibration cannot be met simply by assuming the calibration jig as an ideal electrical connection device.
Disclosure of Invention
In view of this, the present application provides a method and a system for calibrating transmission characteristics of a probe of a broadband oscilloscope, which can eliminate measurement errors introduced by the frequency characteristics of a calibration fixture itself and improve the accuracy of a calibration result.
The embodiment of the application provides a method for calibrating transmission characteristics of a broadband oscilloscope probe, which comprises the following steps:
testing the standard fixture total scattering coefficient, which is a scattering parameter comprising four quantities S11, S12, S21 and S22, and expressing the standard fixture total scattering coefficient as
Wherein the 1 st port is a left arm coaxial port of the standard fixture, and the 2 nd port is a right arm coaxial port of the standard fixture;
transforming the full scattering coefficient to a time domain, intercepting the 1 st port reflected pulse by using a time domain gate function, and transforming to a frequency domain to obtain a left arm coaxial port reflection coefficient S11 of the L partL(ii) a Intercepting the 2 nd port reflected pulse and converting the intercepted pulse into a frequency domain to obtain the reflection coefficient S22 of the right arm coaxial port of the R partR；
Calculating the total scattering coefficient of the L part according to the total scattering coefficient of the standard clamp, the reflection coefficient of the left arm coaxial port and the reflection coefficient of the right arm coaxial port;
connecting the 1 st port with a test end of a vector network analyzer and connecting the 2 nd port with a matched load; and connecting the output end of the broadband oscilloscope probe with the other testing end of the vector network analyzer, and connecting the input end of the broadband oscilloscope probe with the center of the standard fixture in a pressing manner, and testing to obtain a system scattering coefficient, namely a cascading result of the broadband oscilloscope probe and the L part, so as to further obtain the scattering coefficient of the broadband oscilloscope probe.
As an embodiment of the method optimization of the present application, the method further comprises the following steps: transforming the full scattering coefficient into a time domain, wherein H11(t) is IFT (S11); time domain gating is carried out on the time domain data H11(t) by using a time domain gating function W (t), and left arm coaxial port time domain reflection data H11 '(t), namely H11' (t) W (t) H11(t), are obtained; converting the time domain reflection data of the left arm coaxial port into a frequency domain to obtain a reflection coefficient S11 of the left arm coaxial port of the calibration fixtureLI.e. S11L＝FT[H11'(t)](ii) a Wherein IFT denotes an inverse fourier transform algorithm and FT denotes a fourier transform algorithm.
As an embodiment of the optimization of the method, the method further comprisesComprises the following steps: transforming the full scattering coefficient into a time domain, wherein H22(t) is IFT (S22); time domain gating is carried out on the time domain data H22(t) by using a time domain gating function W (t), and right arm coaxial port time domain reflection data H22'(t), namely H22' (t) W (t) H22(t), are obtained; converting the time domain reflection data of the right arm coaxial port into a frequency domain to obtain a reflection coefficient S22 of the right arm coaxial port of the calibration fixtureRI.e. S22R＝FT[H22'(t)](ii) a Wherein IFT denotes an inverse fourier transform algorithm and FT denotes a fourier transform algorithm.
As an optimized embodiment of the method, the total scattering coefficient of the L part is calculated as
Wherein, S12L＝S21L，
As a further optimized embodiment of the method of the present application, the "further obtaining the scattering coefficient of the broadband oscilloscope probe" further includes the following steps: and inputting the total scattering coefficient of the L part into the vector analyzer, and testing by using a port extension test function to obtain the scattering coefficient of the broadband oscilloscope probe.
Preferably, in any one of the method embodiments of the present application, the width τ of the time domain gate functionfxContains the first electrical pulse.
On the other hand, the application also provides a broadband oscilloscope probe transmission characteristic calibration system which comprises a vector network analyzer, a standard clamp and a matched load. Wherein, the 1 st port is a left arm coaxial port of the standard clamp, the 2 nd port is a right arm coaxial port of the standard clamp, and the 1 st port is connected with a test end of a vector network analyzer and the 2 nd port is connected with a matched load; and connecting the output end of the broadband oscilloscope probe with the other testing end of the vector network analyzer, and connecting the input end of the broadband oscilloscope probe with the center of the standard fixture in a pressing mode.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects:
according to the probe transmission characteristic calibration method, the working bandwidth reaches the probe calibration work of more than 6GHz, the influence of the frequency characteristic of the calibration clamp on the calibration result is considered, when the calibrated bandwidth is further improved, the measurement error introduced by the self frequency characteristic of the calibration clamp is larger and larger, the influence of the frequency characteristic of the calibration clamp is overcome by the scheme, and the requirement of high-accuracy calibration at a higher frequency band can be met.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic view of a calibration fixture and vector network analyzer connection;
FIG. 2 is a flow chart of an embodiment of the method of the present invention;
FIG. 3 is a schematic diagram of the equivalent port locations for the connection of the L and R portions of a standard fixture;
FIG. 4 is a schematic view of a standard fixture with a partial L port reflection
FIG. 5 is a schematic diagram of an embodiment of the system of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a calibration fixture and vector network analyzer connection.
The vector network analyzer is calibrated by two ports, then the left coaxial port L and the right coaxial port R of the calibration fixture are respectively connected with the test port (or called as a first test port1) and another test port (or called as a second test port2) of the vector network analyzer according to the mode of fig. 1, and the total scattering parameters of the coaxial ports are directly measured and obtained:
the S parameter is used to represent the scattering characteristics of the 1 st and 2 nd ports of the two-port network, according to equation 1. As shown in fig. 1, port1 is the left arm (L) coaxial port of the standard fixture and port2 is the right arm (R) coaxial port of the standard fixture.
In order to calculate the electrical delay amount of the calibration fixture, the data S21 in the scattering parameters of the coaxial port obtained in the first step is inversely transformed into time domain data by using an inverse Fourier transform calculation method:
H21(t)＝IFT(S21) (2)
the obtained time domain data H21(t) represents the impulse response of the calibration fixture, and the time quantum corresponding to the pulse peak value is calculated to be the total electric delay tau of the calibration fixturefx。
The total electrical delay amount here can be used to determine the time domain gate function window of the reflection coefficients of the left arm coaxial port of the L portion and the right arm coaxial port of the R portion.
FIG. 2 is a flow chart of an embodiment of the method of the present invention.
The embodiment of the application provides a method for calibrating transmission characteristics of a broadband oscilloscope probe, which comprises the following steps:
and step 10, testing the full scattering coefficient of the standard clamp.
The full scattering coefficient is a scattering coefficient of a full frequency band. Further, step 11 of determining the total delay amount of the calibration jig by formula (2) may be further included.
The left-arm coaxial port reflection coefficient is a calibration jig L portion (left-side coaxial port L to calibration jig center position portion) coaxial port reflection coefficient.
The right-arm coaxial port reflection coefficient is a calibration jig R portion (right-side coaxial port R to calibration jig center position portion) coaxial port reflection coefficient.
Note that, at this time, it is assumed that the port between the L portion and the R portion is located at the standard jig center position O. Referring to fig. 3, the L-part and the R-part of the calibration fixture are connected together by a planar transmission structure to form a whole, and the port between the L-part and the R-part is not a real physical port, but an equivalent port for implementing a correction setting.
The step 20 further comprises the following steps 21-22:
S11L＝FT[H11′(t)] (3)
wherein IFT denotes an inverse fourier transform algorithm and FT denotes a fourier transform algorithm.
Step 22, converting the total scattering coefficient into a time domain, wherein H22(t) is IFT (S22); time domain gating is carried out on the time domain data H22(t) by using a time domain gating function W (t), and right arm coaxial port time domain reflection data H22'(t), namely H22' (t) W (t) H22(t), are obtained; converting the time domain reflection data of the right arm coaxial port into a frequency domain to obtain a reflection coefficient S22 of the right arm coaxial port of the calibration fixtureRNamely:
S22R＝FT[H22'(t)] (4)
wherein IFT denotes an inverse fourier transform algorithm and FT denotes a fourier transform algorithm.
In any of the method embodiments of the present application, the first electrical pulse is contained within the width of the time domain gate function. Preferably, the width of the time domain gate function is τfx. Time-domain gating of the time-domain data H11(t) is performed using a time-domain gating function W (t) that divides the H11(t) data by the first pulse-to-electrical delay τfxSetting the other data to be 0 to obtain gated time domain data H11' (t); and time-domain gating the time-domain data H22(t) using a time-domain gating function W (t) that divides the H22(t) data by the first pulse time to an electrical delay τfxThe other data is set to 0, and the gated time domain data H22' (t) is obtained.
And step 30, calculating the total scattering coefficient of the L part according to the total scattering coefficient of the standard fixture, the reflection coefficient of the left arm coaxial port and the reflection coefficient of the right arm coaxial port.
The total scattering parameter of the calibration jig L section can be expressed as
Considering that the network characteristics of the calibration jig are the result of the concatenation of the network characteristics of the L and R parts, and that the L and R parts are symmetrical, the S parameter data of the calibration jig satisfies the following relation:
the calibration fixture L part and the calibration fixture R part are structurally symmetrical, and S parameters of the calibration fixture L part and the calibration fixture R part also meet the requirement
S12L＝S21R (7)
Calculating according to equations (5) - (7) to obtain the reflection coefficient S22 of the partial plane port of the calibration fixture LL：
The reflection coefficient S11 of the partial plane port of the calibration jig R can also be calculatedR：
To understand the left arm (L part) coaxial port reflection coefficient S11LRight arm (R part) coaxial port reflection coefficient S22RL part plane port reflection coefficient S22LR partial plane port reflection coefficient S11RReferring to fig. 4, the reflection coefficient is the ratio of the reflected signal to the incident signal, the left-arm coaxial port reflection coefficient is the reflection of the coaxial port (i) when only the left half exists, and the L-part plane reflection coefficient is the reflection of the plane port (ii) when the left half exists alone, assuming that the entire calibration fixture is divided into two parts.
Similarly, the right arm coaxial port reflection coefficient refers to the reflection of the coaxial port when only the right half is present, and the R-part plane reflection coefficient refers to the reflection of the planar port when the right half is present alone, assuming that an integral calibration fixture is split into two parts.
transmission coefficient S21 of calibration jig L partLCan be calculated by equations (6) and (7):
the calibration fixture is a passive network, and two ports of the calibration fixture have reciprocity:
S12L＝S21L (11)
so far, the parameters for describing the total scattering of the L part are obtained, and see formulas (3), (8), (10) and (11).
As a further optimized embodiment of the method of the present application, the "further obtaining the scattering coefficient of the broadband oscilloscope probe" further includes the following steps: and inputting the total scattering coefficient of the L part into the vector analyzer, and testing by using a port extension test function to obtain the scattering coefficient of the broadband oscilloscope probe.
Specifically, the step 40 may further include the following steps 41 to 42:
and 41, loading the two-port S parameter of the part L of the calibration fixture obtained by calculation in the step 30 into a vector network analyzer, and extending the measurement reference surface to a plane port of the part L of the calibration fixture by using a port extension function. According to the mode of fig. 5, the left coaxial port L of the calibration fixture is connected with the port1 of the vector network analyzer, the output coaxial port of the broadband oscilloscope probe is connected with the port2 of the vector network analyzer, the right coaxial port R of the calibration fixture is connected with the matching load, the input end of the broadband oscilloscope probe is pressed at the center position of the calibration fixture, and the scattering coefficient under the state is obtained:
Hprobe(f)＝|S21′| (13)
FIG. 5 is a schematic diagram of an embodiment of the system of the present invention.
On the other hand, the application also provides a broadband oscilloscope probe transmission characteristic calibration system which comprises a vector network analyzer, a standard clamp and a matched load. Wherein, the 1 st port is a left arm coaxial port of the standard clamp, the 2 nd port is a right arm coaxial port of the standard clamp, and the 1 st port is connected with a test end of a vector network analyzer and the 2 nd port is connected with a matched load; and connecting the output end of the broadband oscilloscope probe with the other testing end of the vector network analyzer, and connecting the input end of the broadband oscilloscope probe with the center of the standard fixture in a pressing mode.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (4)
1. A method for calibrating transmission characteristics of a probe of a broadband oscilloscope is characterized by comprising the following steps:
testing the total scattering coefficient of the standard fixture, wherein the total scattering coefficient is
Port1 being said standardThe 2 nd port is the right arm coaxial port of the standard clamp;
transforming the full scattering coefficient to a time domain, intercepting the 1 st port reflected pulse by using a time domain gate function, and transforming to a frequency domain to obtain a left arm coaxial port reflection coefficient S11 of the L partL(ii) a Intercepting the 2 nd port reflected pulse and converting the intercepted pulse into a frequency domain to obtain the reflection coefficient S22 of the right arm coaxial port of the R partR；
Calculating the total scattering coefficient of the L part according to the total scattering coefficient of the standard fixture, the reflection coefficient of the left arm coaxial port and the reflection coefficient of the right arm coaxial port
Wherein, S12L＝S21L，
Connecting the 1 st port with a test end of a vector network analyzer and connecting the 2 nd port with a matched load; connecting the output end of the broadband oscilloscope probe with the other testing end of the vector network analyzer, and connecting the input end of the broadband oscilloscope probe with the center of the standard fixture in a pressing manner, testing to obtain a system scattering coefficient, namely a cascading result of the broadband oscilloscope probe and the left arm, inputting the full scattering coefficient of the L part into the vector analyzer, and testing to obtain the scattering coefficient of the broadband oscilloscope probe by using a port extension testing function:
and calculating the modulus value of S21' to obtain the transmission characteristic calibration result of the calibrated broadband oscilloscope probe: hprobe(f)＝|S21′|。
2. The method of claim 1, further comprising the step of:
transforming the full scattering coefficient into a time domain, wherein H11(t) is IFT (S11);
time domain gating is carried out on the time domain data H11(t) by using a time domain gating function W (t), and left arm coaxial port time domain reflection data H11 '(t), namely H11' (t) W (t) H11(t), are obtained;
converting the time domain reflection data of the left arm coaxial port into a frequency domain to obtain a reflection coefficient S11 of the left arm coaxial port of the calibration fixtureLI.e. S11L＝FT[H11′(t)]；
Wherein IFT denotes an inverse fourier transform algorithm and FT denotes a fourier transform algorithm.
3. The method of claim 1, further comprising the step of:
transforming the full scattering coefficient into a time domain, wherein H22(t) is IFT (S22);
time domain gating is carried out on the time domain data H22(t) by using a time domain gating function W (t), and right arm coaxial port time domain reflection data H22'(t), namely H22' (t) W (t) H22(t), are obtained;
converting the time domain reflection data of the right arm coaxial port into a frequency domain to obtain a reflection coefficient S22 of the right arm coaxial port of the calibration fixtureRI.e. S22R＝FT[H22'(t)]；
Wherein IFT denotes an inverse fourier transform algorithm and FT denotes a fourier transform algorithm.
4. The method according to any one of claims 1 to 3,
width tau of said time domain gate functionfxContains the first electrical pulse.
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