CN102854206B - High temperature accessory for X-ray diffraction instrument - Google Patents
High temperature accessory for X-ray diffraction instrument Download PDFInfo
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- CN102854206B CN102854206B CN201210275849.0A CN201210275849A CN102854206B CN 102854206 B CN102854206 B CN 102854206B CN 201210275849 A CN201210275849 A CN 201210275849A CN 102854206 B CN102854206 B CN 102854206B
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- tank body
- heating plate
- end cap
- high temperature
- ray diffraction
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Abstract
A high temperature accessory for an X-ray diffraction instrument belongs to the field of X-ray diffraction instrument technology application. The high temperature accessory for the X-ray diffraction instrument comprises a base combined piece, a tank body, an upper cover connected with two ends of the tank body in sealing mode, an end cover, a fastening device arranged between the end cover and the tank body, a ceramic heating plate arranged in the tank body, a sample box arranged on the ceramic heating plate and a light reflecting plate. A gas inlet channel communicated with the inside of the tank body is arranged on the upper cover, a spare plug is arranged on the gas inlet channel, the light reflecting plate is arranged at a gas inlet port in the tank body, the end cover is provided with a gas outlet channel, a gas discharging nozzle is connected onto the gas discharging channel, the base combined piece for installing is connected on the end cover of the tank body, and the ceramic heating plate is connected with a proportion integration differentiation (PID) adjustor. The high temperature accessory adopts the SiC ceramic heating plate to heat, heating quantity is adjusted and controlled through the PID adjustor, and the sample in the sample box remains the preset temperature. During work, a mechanical pump is adopted for vacuumizing a sealed container if necessary, and a vacuum degree is 10-2 mbar; or inert gas is used for preventing the sample from being oxidized.
Description
technical field
The invention belongs to X-ray diffractometer technical applications, particularly relate to a kind of high temperature accessory for X-ray diffraction instrument.
Background technology
X-ray diffractometer is the equipment studied material crystal structure, the angular instrument of X-ray diffractometer is according to Bragg diffraction instrument principle: n λ=2dsin θ designs, utilize the surface pivots reflected ray angle of sample different, the structure, grain size, crystallinity etc. of material are detected.Conventional diffractometer cannot the change of measuring tempeature on the impact of material structure, especially can not meet the analysis for carrying out X-ray diffraction under high temperature to material.
Summary of the invention
For the technical matters of above-mentioned existence, the invention provides a kind of high temperature accessory for X-ray diffraction instrument.It changes to material structure the annex analyzed in the case of a high temperature to meet.
The present invention includes base component, tank body, the upper cover be tightly connected with tank body two ends, end cap, fastener between end cap and tank body, be placed in the heating plate in tank body, be placed in the sample box on heating plate and reflector, described upper cover with the inlet channel communicated in tank body, inlet channel is provided with for subsequent use stifled, reflector is arranged at air intake opening place in tank body, end cap is with outlet passageway, this outlet passageway is connected with deflating valve, the described base component for installing is connected to tank body end cap, described tank body is provided with X ray incidence window, heating plate is connected with PID regulator.
Described fastener comprises fastening block and dead ring, and dead ring is placed in tank body end cap periphery, fastening block at least three, and arrange along the even circumferential between dead ring and end cap, cooperation is fastenedly connected.Described reflector is semicircle.Described tank body upper cover and end cap all have water annulus.Described tank body covers and also has multiple ring groove, form radiation rib.Described window is provided with diaphragm, by sealing gasket and tightening band tightens.Vacuumize or filling with inert gas in described tank body.Described heating plate is silit heating plate.
Beneficial effect of the present invention:
The present invention adopts silit heater plate, adds heat by PID regulable control, makes the sample in sample box be stabilized in design temperature.
All with water annulus on tank body upper cover of the present invention and end cap, for circulating cooling.Semicircular reflector, not only has reflective effect, when ventilating body, for separation gas and sample.
The present invention, with air inlet, outlet passageway, when need of work, vacuumizes by the container of mechanical pump to sealing, makes the vacuum tightness in container reach 10
-2mbar; Or make blanketing with inert gas sample, the object of two kinds of methods is all ensure that sample is not oxidized.Fully meet application demand, expand detection application power and the application of X-ray diffractometer.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Fig. 2 is that schematic diagram is looked on a left side of Fig. 1.
In figure: 1. base component, 2. O-ring seal I, 3. tank body, 4. upper cover, 5. reflector, 6. connect spiral shell block, 7. for subsequent use stifled, 8. O-ring seal II, 9. O-ring seal III, 10. O-ring seal IV, 11. restraint zone components, 12. sealing gaskets, 13. fixed blocks, 14. dead rings, 15 fastening blocks, 16. deflating valves, 17. angular instruments, 18. heating plates, 19. sample boxs, 20. ring grooves, 21. muscle sheets, 22. inlet channels, 23. outlet passageways, 24. water annulus, 25. end caps, 26. windows.
Embodiment
The present invention is specifically described below in conjunction with drawings and Examples.
Embodiment: as shown in Figure 1, the present invention includes base component 1, tank body 3, the upper cover 4 be tightly connected with tank body 3 two ends, end cap 25, fastener between end cap 25 and tank body 3, be placed in the ceramic heating plate 18 in tank body 3, be placed in the sample box 19 on ceramic heating plate 18 and reflector 5, described upper cover 4 with the inlet channel 22 communicated in tank body 3, inlet channel 22 is provided with for subsequent use stifled 7, reflector 5 is semicircle, be arranged at air intake opening place in tank body 3, not only there is reflective effect, when ventilating body, for separation gas and sample, heat is stoped to be walked toward charging connector, end cap 25 is with outlet passageway 23, this outlet passageway 23 is connected with deflating valve 16, the described base component 1 for installing is connected to tank body end cap 25, described tank body 3 has X ray and injects window 26, ceramic heating plate 18 is connected with PID regulator, add heat for what control heating plate 18, temperature is met the demands.
As shown in Figure 2, described fastener comprises dead ring 14 and fastening block 15, and dead ring 14 is placed in tank body end cap 25 periphery, fastening block 15 at least three, arrange along the even circumferential between dead ring 14 and end cap 25, fastening block 15 and dead ring 14 junction are staircase structure, and cooperation is fastenedly connected.
The upper cover 4 of described tank body 3 and end cap 25 all have water annulus 24.Described tank body upper cover 4 also has multiple ring groove 20.
Be equipped with diaphragm outside window 26 in the present invention, tank body 3 periphery is provided with sealing gasket 12 and restraint zone component 11, for the diaphragm of fastening window 26.
In the present invention, restraint zone component 11 and ceramic heating plate 18, sample box 19 are outsourcing piece.Base component 1 is for connecting angular instrument 17, and its end is with the flange be connected with angular instrument 17.
The present invention adopts ceramic heating plate 18 to heat, and adds heat by PID regulable control, makes the sample in sample box 19 be stabilized in design temperature.During work as required, when detecting oxidizable article, vacuumized by tank body 3 container of mechanical pump to sealing, make the vacuum tightness in tank body 21 container reach 10
-2mbar.Or, make blanketing with inert gas sample.
Claims (1)
1. a high temperature accessory for X-ray diffraction instrument, it is characterized in that: comprise base component, tank body, the upper cover be tightly connected with tank body two ends, end cap, fastener between end cap and tank body, be placed in the heating plate in tank body, be placed in the sample box on heating plate and reflector, described upper cover with the inlet channel communicated in tank body, inlet channel is provided with for subsequent use stifled, reflector is arranged at air intake opening place in tank body, end cap is with outlet passageway, this outlet passageway is connected with deflating valve, the described base component for installing is connected to tank body end cap, described tank body is provided with X ray incidence window, heating plate is connected with PID regulator, described fastener comprises fastening block and dead ring, and dead ring is placed in tank body end cap periphery, fastening block at least three, and arrange along the even circumferential between dead ring and end cap, cooperation is fastenedly connected, described reflector is semicircle, described tank body upper cover and end cap all have water annulus, described tank body covers and also has multiple ring groove, form radiation rib, described window is provided with diaphragm, by sealing gasket and tightening band tightens, vacuumize or filling with inert gas in described tank body, described heating plate is silit heating plate.
Priority Applications (1)
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CN201210275849.0A CN102854206B (en) | 2012-08-03 | 2012-08-03 | High temperature accessory for X-ray diffraction instrument |
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CN201210275849.0A CN102854206B (en) | 2012-08-03 | 2012-08-03 | High temperature accessory for X-ray diffraction instrument |
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CN102854206A CN102854206A (en) | 2013-01-02 |
CN102854206B true CN102854206B (en) | 2015-01-07 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103359299B (en) * | 2013-07-25 | 2015-07-22 | 中国科学院武汉物理与数学研究所 | Small-sized vacuum thermal environment simulation system |
CN104458780B (en) * | 2014-12-09 | 2017-10-31 | 中国科学院上海应用物理研究所 | A kind of in-situ test example platform |
CN104502367A (en) * | 2014-12-09 | 2015-04-08 | 中国科学院上海应用物理研究所 | In-situ testing platform for thermal chemical vapor deposition |
Citations (6)
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SU1043536A1 (en) * | 1978-11-03 | 1983-09-23 | Ордена Трудового Красного Знамени Институт Физической Химии Ан Ссср | High temperature vacuum x-ray chamber specimen assembly |
SU1627943A1 (en) * | 1989-01-19 | 1991-02-15 | Опытное Конструкторско-Технологическое Бюро С Опытным Производством Института Металлофизики Ан Усср | High-temperature high-vacuum attachment camera for x-ray diffractometer |
JPH11173964A (en) * | 1997-12-11 | 1999-07-02 | Rigaku Denki Kk | Sample high-temperature device and x-ray apparatus using it |
JPH11211678A (en) * | 1998-01-26 | 1999-08-06 | Rigaku Denki Kk | Sample high-temperature device and x-ray apparatus using the same |
JPH11218504A (en) * | 1998-01-30 | 1999-08-10 | Rigaku Denki Kk | Sample high-temperature device and x-ray apparatus using it |
CN202710493U (en) * | 2012-08-03 | 2013-01-30 | 丹东浩元仪器有限公司 | High temperature accessory for x-ray diffractometer |
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2012
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Patent Citations (6)
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SU1043536A1 (en) * | 1978-11-03 | 1983-09-23 | Ордена Трудового Красного Знамени Институт Физической Химии Ан Ссср | High temperature vacuum x-ray chamber specimen assembly |
SU1627943A1 (en) * | 1989-01-19 | 1991-02-15 | Опытное Конструкторско-Технологическое Бюро С Опытным Производством Института Металлофизики Ан Усср | High-temperature high-vacuum attachment camera for x-ray diffractometer |
JPH11173964A (en) * | 1997-12-11 | 1999-07-02 | Rigaku Denki Kk | Sample high-temperature device and x-ray apparatus using it |
JPH11211678A (en) * | 1998-01-26 | 1999-08-06 | Rigaku Denki Kk | Sample high-temperature device and x-ray apparatus using the same |
JPH11218504A (en) * | 1998-01-30 | 1999-08-10 | Rigaku Denki Kk | Sample high-temperature device and x-ray apparatus using it |
CN202710493U (en) * | 2012-08-03 | 2013-01-30 | 丹东浩元仪器有限公司 | High temperature accessory for x-ray diffractometer |
Non-Patent Citations (1)
Title |
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X射线衍射分析的实验方法及其应用;胡林彦、张庆军、沈毅;《河北理工学院学报》;20040831;第26卷(第3期);第83-86页 * |
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