CN102332920A - High spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation type analog to digital converter - Google Patents
High spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation type analog to digital converter Download PDFInfo
- Publication number
- CN102332920A CN102332920A CN201110200434A CN201110200434A CN102332920A CN 102332920 A CN102332920 A CN 102332920A CN 201110200434 A CN201110200434 A CN 201110200434A CN 201110200434 A CN201110200434 A CN 201110200434A CN 102332920 A CN102332920 A CN 102332920A
- Authority
- CN
- China
- Prior art keywords
- passage
- sampling
- electric capacity
- group
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Analogue/Digital Conversion (AREA)
Abstract
The invention belongs to the technical field of integration circuits and particularly relates to a high spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation (SAR) type analog to digital converter. A capacitor array for sampling and quantifying at the front end of each channel of the conventional multichannel time staggering SARADC is often relatively independent and fixed; and the own capacitor array of each channel at the front end is dismantled into a number of equal modules so as to form a 'capacitance pool'. Before sampling, the capacitance pool is randomly distributed to each channel, so a fixed error of each channel is reduced and randomized then; from an energy spectrum, energy of a harmonic component is changed into noise which is normalized to a noise base; therefore, the nonlinearity caused by capacitance mismatch is improved effectively.
Description
Technical field
The invention belongs to technical field of integrated circuits, be specifically related to a kind of multichannel gradual approaching A/D converter.
Background technology
Common multichannel gradual approaching A/D converter structural representation is as shown in Figure 1, and is for the ease of analyzing, existing that the equivalent electric circuit of each passage is as shown in Figure 2.The DAC that mainly forms, be that digital control unit, comparator and the switch arrays of core constitute with the shift register by track and hold circuit, reference voltage, capacitor array.Transfer process is as shown in Figure 3 under its normal condition.At first the sampling of digital control logic unit (the SAR Logic among Fig. 2) control sample holding unit is controlled DAC array highest order then and is met V
Ref(shown in Figure 3), output V
Ref/ 2, comparator will be imported V
InCompare with the output of DAC.If input is big, then the highest order electric capacity of DAC meets V
RefConstant, an inferior high position is met V
RefIf Vin is littler than the output of DAC, then highest order meets Gnd, and an inferior high position meets V
RefBy that analogy.Input shown in Figure 3, the digital code of output is 0001111 at last.If electric capacity does not match, then can cause quantizing to make mistakes, the digital code of output has become 000101, sees shown in Figure 4.Therefore when electric capacity does not match, between different passages, introduce different errors, when the coding output module of process integral body (seeing figure one), can influence the whole linearity.
Summary of the invention
The object of the present invention is to provide a kind of nonlinear multichannel time interleaving gradual approaching A/D converter that can effectively improve by the capacitance mismatch introducing.
Multichannel time interleaving gradual approaching A/D converter provided by the invention, its integrated circuit structure keeps module 17, capacitance pool 21, pseudorandom number generator 23, decoder 24 to constitute by switch arrays 4 ~ 9, sampling switch array 13, comparator array 10 ~ 12, clock generating and coding output module 25, digital control module 14 ~ 16, sampling.If the passage of this analog to digital converter is N, be designated as passage one successively, passage two ..., passage N; Then switch arrays 4,5 are the switch arrays of passage one, and switch arrays 6,7 are the switch arrays of passage two, and switch arrays 8,9 are the switch arrays of passage N; Comparator 10 is the comparator of passage one; Comparator 11 is the comparator of passage two; Comparator 12 is the comparator of passage N; Digital control module 14 is the digital control module of passage N; Digital control module 15 is the digital control module of passage two; Digital control module 16 is the digital control module of passage one; Each passage is provided with electric capacity 20 at random;
Wherein, Public capacitance pool 21 is made up of the electric capacity that natural capacity 19 flocks together and one group redundant of each passage, before each sampling, produces one group of random number by pseudorandom number generator 23; Control decoder 24 is chosen the capacitor array of one group of electric capacity as sampling next time remaining two groups of electric capacity in the middle of capacitance pool 21; Thereby periodically error randomization, the energy of reduction harmonic wave is realized high SFDR (SFDR); Get over for a long time when port number, the effect of improvement is obvious more.
Among the present invention; When circuit has just begun to sample; Produce the reset signal of the control clock 22 (CLK1) of a pseudorandom number generator, control decoder 24 is assigned to each passage with the electric capacity of 21 li of capacitance pools and gets on, and the function of each sequential and realization constantly is following subsequently:
(1) when first high level of CLK2 ~ CLK5,, only realizes that the sampling of each corresponding passage and conversion get final product by first group of work in the decoder 24.Final data is carried out Unified coding output at clock generating and coding output module 25;
(2) when second high level of CLK2 ~ CLK5; Organize altogether by second group of decoder 24; Except the sampling and conversion that realize each corresponding passage, also realize choosing one group from remaining two groups of electric capacity the inside respectively each time, be used as the capacitor array of sampling next time;
(3) the rest may be inferred, and the function that the function of later CLK2 ~ CLK5 all repeats step 2 li gets final product.
Here, CLK2 is passage 1 sampling clock, and CLK3 is passage 2 sampling clocks, by that analogy.
In the such scheme; The present invention's mismatch electric capacity that each passage of original multichannel gradual approaching A/D converter is intrinsic gathers forms " capacitance pool " 21 together; The own capacitor array that is about to each passage of front end splits into equal module, constitutes " capacitance pool ", sees shown in Figure 5.Before the improvement, all there is intrinsic mismatch between each passage, when traditional multichannel time interleaving type SAR ADC switches, can introduces periodic error between different passages, have a strong impact on the system linearity degree.After the improvement, the intrinsic mismatch electric capacity of all passages has been constituted a capacitance pool, before each sampling; Through pseudorandom number generator 23 (PRG module); Produce one group of random number, the electric capacity with 21 li of capacitance pools is at random distributed to each passage, thereby unborn fixing periodic error has been become noise at random; Analyze from energy spectrum; To eliminate because of the high-frequency harmonic that original periodic nonlinearity erron causes exactly, become white noise at random, and be evenly distributed to make an uproar at the end (nosie floor) and get on.Thereby improve the performance of multichannel gradual approaching A/D converter.
Analog to digital converter of the present invention is the low power consumption folded interpolating analog to digital converter that a seed transducer is shared, and is based on the method for proofreading and correct the imbalance of multichannel gradual approaching A/D converter interchannel capacitor array and designs.
In addition, when many more, the traditional stranded and interchannel mismatches of multichannel time interleaving type SAR ADC of port number, it is serious more that the linearity descends; And the randomization effect of the modified model multichannel time interleaving type SAR ADC structure of the high SFDR that the present invention proposes is better on the contrary; Can be effectively harmonic energy being assigned to the end of making an uproar gets on; Thereby improve the system linearity degree more significantly, well remedied traditional structural deficiency of multichannel time interleaving type SAR ADC.
Description of drawings
Fig. 1 tradition multichannel time interleaving gradual approaching A/D converter structural representation.
The rough schematic view of each passage of Fig. 2 multichannel time interleaving gradual approaching A/D converter.
Transducer work sketch map when Fig. 3 electric capacity matees fully.
Fig. 4 is because the sketch map of error appears in the transducer that capacitance mismatch causes.
The high SFDR multichannel of Fig. 5 time interleaving gradual approaching A/D converter highest order electric capacity improves sketch map.
Fig. 6 pseudorandom number generator sketch map.
Fig. 7 improves back multichannel gradually-appoximant analog-digital converter sequential chart.
Label among the figure: 1 expression multichannel time interleaving gradual approaching A/D converter passage one; 2 expression multichannel time interleaving gradual approaching A/D converter passages two; 3 expression multichannel time interleaving gradual approaching A/D converter passage N; 4, the switch arrays of 5 expression passages one, the switch arrays of 6,7 expression passages two;
8, the switch arrays of 9 expression passage N, the comparator of 10 expression passages one, the comparator of 11 expression passages two; The comparator of 12 expression passage N, 13 expression sampling switch arrays, the digital control module of 14 expression passage N; The digital control module of 15 expression passages two, the digital control module of 16 expression passages one, 17 expression samplings keep module; 18 expressions are as the capacitor array of DAC, and 19 improve the intrinsic mismatch electric capacity of each preceding passage, the electric capacity at random of each passage after 20 improvement; Capacitance pool after 21 improvement, the control clock of 22 pseudorandom number generators, 23 pseudorandom number generators; 24 decoders (constituting) by two groups of decoders, 25 expression clock generating and coding output module.
Embodiment
To combine diagram to further specify the implementation method of circuit below:
Fig. 6 is the concrete implementation method of pseudorandom number generator 23, employing be the method for the linear feedback shift register (LFSR) after improving, have simple in structurely, realize easily and the cycle of random number and the relation of number of registers exponentially growth.Can only increase the cycle period of pseudo random number in the time of necessary through the number that increases each grade shift register.Under the control of clock CLK1 22, choose the output node that needs from PRG 23 the insides, then through a decoder 24, with randomized electric capacity each time be connected to each passage above go, as the capacitor array of sampling each time and quantizing.
Improve the whole SECO in back by 25 controls of the clock & output module in the middle of the figure one, concrete sequential is seen Fig. 7.Wherein CLK1 is the clock cycle that pseudo random number produces and electric capacity distributes, and CLK2 is passage one sampling clock, and CLK3 is passage two sampling clocks, by that analogy.Compare with traditional multichannel gradual approaching A/D converter, increased an extra clock cycle to produce pseudo random number and distribute electric capacity.
For the ease of narration, be example with 4 passages below, the concrete workflow of the improvement structure of this high SFDR is described:
1) at first under the control of clock generating and coding output module 25; CLK1 produces high level; Control pseudorandom number generator 23 produces one group of random number (being equivalent to the initialization of PRG 23 modules), and random number is delivered to decoder 24 the insides; The electric capacity of capacitance pool is assigned randomly to all passages according to the result of decoding gets on, as sampling with quantize the capacitor array of usefulness.
2) as shown in Figure 7 subsequently, under the control of clock generating and coding output module 25, order produces the high level of CLK2, CLK3, CLK4, and control sampling switch array 13 lets passage one, two, three sample and change.
3) as shown in Figure 7; Under the control of clock generating and coding output module 25; CLK5 produces high level, and control channel 4 is sampled and changed, and clock generating and coding output module 25 are accepted the first group of transformation result and the coding of digital control module 16 generations of passage one and exported.Meanwhile, the high level of CLK5 is controlled the capacitor array that decoder is sampled as passage one from one group of capacitor array of capacitor array the inside picked at random of redundant capacitor array and passage one release just next time.
4) clock generating and coding output module 25 control CLK2 produce high level, the capacitor array that the control decoder selects remaining capacitor array the inside and unnecessary capacitor array the inside picked at random capacitor array to sample as passage two at CLK5 next time.Afterwards the cycle the inside step above repeating.
Like this, under clock generating and coding output module 25 were controlled, passage one was changed to passage N successively, and capacitor array each time all produces at random.Output is with traditional the same, after the sampling through N-1 clock cycle (N is a port number) dateout.Adopt very little cost; Overcome traditional multichannel time interleaving type SAR ADC because the intrinsic mismatch of interchannel capacitor array; The remarkable decline of the linearity that causes; And, will significantly improve the SFDR (SFDR) of multichannel time interleaving type SAR ADC along with the change of number of active lanes is many.
Claims (3)
1. proofread and correct the method that multichannel time interleaving gradual approaching A/D converter interchannel capacitor array is lacked of proper care for one kind, this analog to digital converter integrated circuit structure comprises: switch arrays (4 ~ 9), sampling switch array (13), comparator array (10 ~ 12), clock generating and coding output module (25), digital control module (14 ~ 16), pseudorandom number generator (23), decoder (24); It is characterized in that the natural capacity of each passage is flocked together and one group of redundant public capacitance pool (21) of electric capacity formation; Before each sampling; Produce one group of random number by pseudorandom number generator (23), control decoder (24) is chosen the capacitor array of one group of electric capacity as sampling next time remaining two groups of electric capacity in the middle of capacitance pool (21), thereby with periodic error randomization; Reduce the energy of harmonic wave, realize high SFDR.
2. multichannel time interleaving gradual approaching A/D converter is characterized in that: its integrated circuit structure keeps module 17, capacitance pool (21), pseudorandom number generator (23), decoder (24) to constitute by switch arrays (4 ~ 9), sampling switch array (13), comparator array (10 ~ 12), clock generating and coding output module (25), digital control module (14 ~ 16), sampling; If the passage of this analog to digital converter is N, be designated as passage one successively, passage two ..., passage N; Then switch arrays (4,5) are the switch arrays of passage one, and switch arrays (6,7) are the switch arrays of passage two, and switch arrays (8,9) are the switch arrays of passage N; Comparator (10) is the comparator of passage one; Comparator (11) is the comparator of passage two; Comparator (12) is the comparator of passage N; Digital control module (14) is the digital control module of passage N; Digital control module (15) is the digital control module of passage two; Digital control module (16) is the digital control module of passage one; Each passage is provided with electric capacity (20) at random;
Wherein, Public capacitance pool (21) is flocked together and one group of redundant electric capacity formation by the natural capacity (19) of each passage, before each sampling, produces one group of random number by pseudorandom number generator (23); Control decoder (24) is chosen the capacitor array of one group of electric capacity as sampling next time remaining two groups of electric capacity in the middle of capacitance pool (21); Thereby periodically error randomization, the energy of reduction harmonic wave is realized high SFDR.
3. multichannel time interleaving gradual approaching A/D converter according to claim 2; It is characterized in that: when this analog-digital converter circuit has just begun to sample; Produce the reset signal of a CLK1 (22); Control decoder (24) is assigned to each passage with the electric capacity of capacitance pool (21) lining and gets on, and the function of each sequential and realization constantly is following subsequently:
(1) when first high level of CLK2 ~ CLK5,, only realizes that the sampling of each corresponding passage and conversion get final product by first group of work in the decoder (24); Final data is carried out Unified coding output at clock generating and coding output module (25);
(2) when second high level of CLK2 ~ CLK5; Organize altogether by second group of decoder (24); Realize the sampling and the conversion of each corresponding passage, and realize choosing one group from remaining two groups of electric capacity the inside respectively each time, be used as the capacitor array of sampling next time;
(3) the rest may be inferred, and the operation that the function of later CLK2 ~ CLK5 all repeats step (2) lining gets final product;
Here, CLK1 is the control clock of pseudorandom number generator, and CLK2 is passage one sampling clock, and CLK3 is passage two sampling clocks, by that analogy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201110200434A CN102332920A (en) | 2011-07-18 | 2011-07-18 | High spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation type analog to digital converter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201110200434A CN102332920A (en) | 2011-07-18 | 2011-07-18 | High spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation type analog to digital converter |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102332920A true CN102332920A (en) | 2012-01-25 |
Family
ID=45484547
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201110200434A Pending CN102332920A (en) | 2011-07-18 | 2011-07-18 | High spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation type analog to digital converter |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102332920A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104052483A (en) * | 2013-03-12 | 2014-09-17 | 蔡金狮 | Anti-noise gradual approximation type analog digital conversion device and method thereof |
CN104218952A (en) * | 2013-05-30 | 2014-12-17 | 西安电子科技大学 | High-speed switch time sequence for successive approximation type analog-digital converter |
CN104681412A (en) * | 2015-02-02 | 2015-06-03 | 南京宇都通讯科技有限公司 | Matching capacitor and manufacturing method thereof |
CN104993830A (en) * | 2015-08-07 | 2015-10-21 | 中国电子科技集团公司第二十四研究所 | Double-channel time division interleaving structure asynchronous successive comparison analog-digital converter |
CN103780349B (en) * | 2014-01-22 | 2017-02-08 | 北京工业大学 | Randomization sampling lattice decoding method based on limited distance decoding |
CN106877866A (en) * | 2014-12-17 | 2017-06-20 | 美国亚德诺半导体公司 | For the microprocessor assisted calibration of analog-digital converter |
CN106896283A (en) * | 2017-02-08 | 2017-06-27 | 上海华虹宏力半导体制造有限公司 | Measure the circuit structure and measuring method of capacitance mismatch characteristic |
CN107231153A (en) * | 2017-05-09 | 2017-10-03 | 大连理工大学 | Gradually-appoximant analog-digital converter for monolithic integrated sensor |
CN107395206A (en) * | 2017-07-26 | 2017-11-24 | 中国科学技术大学 | Band feedback shifts to an earlier date set successive approximation digital analog converter and corresponding Delta SigmaADC frameworks |
CN107636971A (en) * | 2015-05-29 | 2018-01-26 | 瑞典爱立信有限公司 | AD converter system |
CN107888191A (en) * | 2017-12-11 | 2018-04-06 | 电子科技大学 | Gradually-appoximant analog-digital converter and its quantization method based on adaptive prediction section |
CN108990427A (en) * | 2017-03-30 | 2018-12-11 | 深圳市汇顶科技股份有限公司 | Analog to digital conversion circuit and method |
CN114094869A (en) * | 2021-11-23 | 2022-02-25 | 成都科莱弗生命科技有限公司 | Circuit and method for realizing pulsed electric field technology |
CN115865081A (en) * | 2022-11-30 | 2023-03-28 | 贵州振华风光半导体股份有限公司 | Error reduction circuit and method and comparator array |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7535391B1 (en) * | 2008-01-07 | 2009-05-19 | Freescale Semiconductor, Inc. | Analog-to-digital converter having random capacitor assignment and method thereof |
US20100123611A1 (en) * | 2008-11-19 | 2010-05-20 | Electronics And Telecommunications Research Institute | Successive approximation register analog-digital converter and method of driving the same |
CN102075464A (en) * | 2011-01-18 | 2011-05-25 | 电子科技大学 | Joint estimation and real-time correction method for channel error of TIADC system |
-
2011
- 2011-07-18 CN CN201110200434A patent/CN102332920A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7535391B1 (en) * | 2008-01-07 | 2009-05-19 | Freescale Semiconductor, Inc. | Analog-to-digital converter having random capacitor assignment and method thereof |
US20100123611A1 (en) * | 2008-11-19 | 2010-05-20 | Electronics And Telecommunications Research Institute | Successive approximation register analog-digital converter and method of driving the same |
CN102075464A (en) * | 2011-01-18 | 2011-05-25 | 电子科技大学 | Joint estimation and real-time correction method for channel error of TIADC system |
Non-Patent Citations (2)
Title |
---|
《电子器件》 20061231 殷勤等 "多通道逐次逼近型10 bit 40 Ms/ s 模数转换器的设计" 第1126-1130页 1-3 第29卷, 第4期 * |
殷勤等: ""多通道逐次逼近型10 bit 40 Ms/ s 模数转换器的设计"", 《电子器件》 * |
Cited By (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104052483A (en) * | 2013-03-12 | 2014-09-17 | 蔡金狮 | Anti-noise gradual approximation type analog digital conversion device and method thereof |
CN104218952B (en) * | 2013-05-30 | 2017-08-08 | 西安电子科技大学 | One kind is used for gradual approaching A/D converter |
CN104218952A (en) * | 2013-05-30 | 2014-12-17 | 西安电子科技大学 | High-speed switch time sequence for successive approximation type analog-digital converter |
CN103780349B (en) * | 2014-01-22 | 2017-02-08 | 北京工业大学 | Randomization sampling lattice decoding method based on limited distance decoding |
CN106877866A (en) * | 2014-12-17 | 2017-06-20 | 美国亚德诺半导体公司 | For the microprocessor assisted calibration of analog-digital converter |
CN104681412A (en) * | 2015-02-02 | 2015-06-03 | 南京宇都通讯科技有限公司 | Matching capacitor and manufacturing method thereof |
CN107636971A (en) * | 2015-05-29 | 2018-01-26 | 瑞典爱立信有限公司 | AD converter system |
CN104993830B (en) * | 2015-08-07 | 2018-02-13 | 中国电子科技集团公司第二十四研究所 | Binary channels time-division pilotaxitic texture is asynchronous gradually to compare type analog-to-digital converter |
CN104993830A (en) * | 2015-08-07 | 2015-10-21 | 中国电子科技集团公司第二十四研究所 | Double-channel time division interleaving structure asynchronous successive comparison analog-digital converter |
CN106896283B (en) * | 2017-02-08 | 2019-10-11 | 上海华虹宏力半导体制造有限公司 | Measure the circuit structure and measurement method of capacitance mismatch characteristic |
CN106896283A (en) * | 2017-02-08 | 2017-06-27 | 上海华虹宏力半导体制造有限公司 | Measure the circuit structure and measuring method of capacitance mismatch characteristic |
CN108990427A (en) * | 2017-03-30 | 2018-12-11 | 深圳市汇顶科技股份有限公司 | Analog to digital conversion circuit and method |
CN107231153A (en) * | 2017-05-09 | 2017-10-03 | 大连理工大学 | Gradually-appoximant analog-digital converter for monolithic integrated sensor |
CN107395206A (en) * | 2017-07-26 | 2017-11-24 | 中国科学技术大学 | Band feedback shifts to an earlier date set successive approximation digital analog converter and corresponding Delta SigmaADC frameworks |
CN107395206B (en) * | 2017-07-26 | 2020-05-12 | 中国科学技术大学 | Successive approximation type digital-to-analog converter with feedback advance setting and corresponding Delta-SigmaADC framework |
CN107888191A (en) * | 2017-12-11 | 2018-04-06 | 电子科技大学 | Gradually-appoximant analog-digital converter and its quantization method based on adaptive prediction section |
CN107888191B (en) * | 2017-12-11 | 2020-11-13 | 电子科技大学 | Successive approximation analog-to-digital converter and quantization method based on self-adaptive prediction region |
CN114094869A (en) * | 2021-11-23 | 2022-02-25 | 成都科莱弗生命科技有限公司 | Circuit and method for realizing pulsed electric field technology |
CN114094869B (en) * | 2021-11-23 | 2024-01-09 | 融和医疗科技(浙江)有限公司 | Circuit and method for realizing pulsed electric field technology |
CN115865081A (en) * | 2022-11-30 | 2023-03-28 | 贵州振华风光半导体股份有限公司 | Error reduction circuit and method and comparator array |
CN115865081B (en) * | 2022-11-30 | 2024-10-01 | 贵州振华风光半导体股份有限公司 | Error reduction circuit, method and comparator array |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102332920A (en) | High spurious-free-dynamic-range (SFDR) multichannel time staggering successive approximation type analog to digital converter | |
Shen et al. | A reconfigurable 10-to-12-b 80-to-20-MS/s bandwidth scalable SAR ADC | |
CN103986470B (en) | Low-power consumption level multi-reference voltage monoclinic analog-digital conversion method and converter | |
US7535391B1 (en) | Analog-to-digital converter having random capacitor assignment and method thereof | |
CN1199356C (en) | Deigital logic correction circuit for a pipeline analog to digital (A/D) converter | |
US20110128172A1 (en) | Low power convert and shutdown sar adc architecture | |
US20120146822A1 (en) | Successive approximation register analog-to-digital converter and analog-to-digital conversion method using the same | |
CN104967451A (en) | Successive approximation type analog-to-digital converter | |
US6788240B2 (en) | Single-chip massively parallel analog-to-digital conversion | |
AU2003259260A1 (en) | Method and apparatus for voltage reference generation by charge redistribution for use in analog to digital conversion | |
CN101783684B (en) | Pipelined analog-to-digital converter | |
US20080191919A1 (en) | Single stage cyclic analog to digital converter with variable resolution | |
CN106877869B (en) | Capacitor sorting method capable of improving linearity of resistance-capacitance type successive approximation analog-to-digital converter | |
Danesh et al. | A reconfigurable 1 GSps to 250 MSps, 7-bit to 9-bit highly time-interleaved counter ADC with low power comparator design | |
KR101861059B1 (en) | Current reduction in a single stage cyclic analog to digital converter with variable resolution | |
CN104135289B (en) | The method and device of many reference voltage monocline ADC of calibration row level | |
CN106341133A (en) | Dual-channel time interleaved asynchronous assembly line flash analog-to-digital converter | |
CN106788345B (en) | Ramp signal generator using resistance structure | |
CN101621294B (en) | Control logical circuit and successive approximation analog-to-digital converter | |
CN110690901A (en) | High-speed low-power-consumption SAR ADC capacitance mismatch self-calibration method and circuit | |
Aytar et al. | Employing threshold inverter quantization (TIQ) technique in designing 9-Bit folding and interpolation CMOS analog-to-digital converters (ADC) | |
CN104753533B (en) | One kind is classified shared binary channels flow-line modulus converter | |
CN205265662U (en) | Pipeline type adc | |
Lai et al. | A 10-bit 20 MS/s successive approximation register analog-to-digital converter using single-sided DAC switching method for control application | |
KR101927101B1 (en) | Sar adc(successive approximation register analog digital converter) and cmos image sensor comprising the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120125 |