CN108827898B - Continuous zooming microscopic infrared optical enhancement system and method - Google Patents
Continuous zooming microscopic infrared optical enhancement system and method Download PDFInfo
- Publication number
- CN108827898B CN108827898B CN201810346551.1A CN201810346551A CN108827898B CN 108827898 B CN108827898 B CN 108827898B CN 201810346551 A CN201810346551 A CN 201810346551A CN 108827898 B CN108827898 B CN 108827898B
- Authority
- CN
- China
- Prior art keywords
- infrared
- adjusting
- reflector
- optical enhancement
- microscopic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 49
- 238000000034 method Methods 0.000 title claims abstract description 26
- 239000000463 material Substances 0.000 claims abstract description 16
- 230000001052 transient effect Effects 0.000 claims abstract description 11
- 230000008569 process Effects 0.000 claims abstract description 9
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 8
- 238000005057 refrigeration Methods 0.000 claims description 7
- 238000002310 reflectometry Methods 0.000 claims description 6
- 230000008020 evaporation Effects 0.000 claims description 3
- 238000001704 evaporation Methods 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims 1
- 230000001105 regulatory effect Effects 0.000 claims 1
- 230000003014 reinforcing effect Effects 0.000 claims 1
- 238000011160 research Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000003331 infrared imaging Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
- G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
Abstract
The invention discloses a continuously-zooming microscopic infrared optical enhancement system, and belongs to the field of transient temperature measurement of engineering materials. The invention comprises a reflection type system, a refraction type system and a focusing auxiliary system; the reflection type system is used for increasing the working distance of the infrared optical enhancement system and comprises a laser, a first reflector, a light path adjusting box and a second reflector; the refraction system is used for realizing a continuous zooming microscopic function; the focusing auxiliary system is used for realizing a focusing function and comprises an infrared light source and a first reflector. The invention also discloses a debugging method of the continuous zooming microscopic infrared optical enhancement system based on the system. The technical problem to be solved by the invention is as follows: the continuous zooming microscopic infrared optical enhancement system and the focusing operation are realized, the working distance of the infrared optical system is increased, and the transient temperature measurement in the deformation and failure process in a micro area of the material under high-speed impact is realized.
Description
Technical Field
The invention relates to a continuous zooming optical enhancement system and method for microscopic infrared photography, in particular to a refrigeration type high-speed infrared detector-based microscopic infrared photography system and method, and belongs to the field of transient temperature measurement of engineering materials.
Background
The deformation process and the failure mechanism of the material under high-speed impact are increasingly paid attention by researchers, are one of research hotspots in the solid mechanics direction, and have important scientific significance and engineering application value. The high-speed impact performance test process of the material needs to be applied to a high-speed infrared temperature measuring instrument, and the development of domestic high-speed infrared temperature measuring instruments is delayed, so that the current test requirements cannot be met. The foreign high-speed infrared temperature measuring instrument is forbidden to be sold in China, and the research of relevant military application of domestic scientific research is prevented. Therefore, a foundation is laid for the deep research of the deformation and failure mechanism of the material under the high-speed impact in China, the foreign technical blockade needs to be broken, and the high-speed infrared temperature measuring instrument with the independent intellectual property rights is developed. In the development of a high-speed infrared temperature measuring instrument, an infrared optical enhancement system is an important pivot, can improve the intensity of optical signals, and is beneficial to the collection and transmission of the optical signals, so that the distribution of the surface temperature of a material under high-speed impact is recorded. Particularly, the width of a failure area of a material under high-speed impact is only 20-50 μm, and the spatial resolution (>50 μm) of the current high-speed infrared detector cannot meet the distribution record of the temperature field in the failure area. Therefore, a microscopic infrared optical enhancement system is needed, and the zooming capability of the microscopic infrared optical enhancement system reflects the application capability of the high-speed infrared temperature measuring instrument.
At present, a refraction type amplification mode is mainly adopted, but focusing operation cannot be carried out in an infrared imaging mode, so that a refraction type system is limited to be applied to a refrigeration type high-speed infrared detector. Meanwhile, because the object is hit away in the high-speed impact experiment, the refraction system with short object distance is not suitable for measuring the transient temperature of the surface of the material under the high-speed impact.
Disclosure of Invention
Aiming at the defects of the prior art: (1) temperature field measurement in a micro area cannot be realized; (2) focusing operation cannot be performed in an infrared imaging mode, so that the refractive system cannot be applied to a refrigeration type high-speed infrared detector; (3) the short object distance refractive system is not suitable for measuring the transient temperature of the surface of the material under high-speed impact. The invention discloses a continuous zooming microscopic infrared optical enhancement system and a method, which aim to solve the technical problems that: the continuous zooming microscopic infrared optical enhancement system and the focusing operation are realized, the working distance of the infrared optical system is increased, and the transient temperature measurement in the deformation and failure process in a micro area of the material under high-speed impact can be realized.
The purpose of the invention is realized by the following technical scheme.
The invention discloses a continuously zooming microscopic infrared optical enhancement system which comprises a reflection type system, a refraction type system and a focusing auxiliary system. The reflective system and the focusing auxiliary system share the first mirror.
The reflective system is used for increasing the working distance of the infrared optical enhancement system and comprises a laser, a first reflector, a light path adjusting box and a second reflector. The light path adjusting box is used for adjusting the center of a light path, and two through holes, namely a right light adjusting port and a left light adjusting port, are symmetrically formed in the same side face. A small adjusting frame, a convex mirror, a large adjusting frame and a concave mirror are arranged in the light path adjusting box. The light path adjusting box is fixed on the fixing plate through the lifting fixing device. The small adjusting frame is fixedly connected with the convex mirror and used for adjusting the position of the convex mirror. The large adjusting frame is fixedly connected with the concave mirror and used for adjusting the position of the concave mirror.
The top point of the convex mirror is positioned at the focus of the concave mirror, so that light rays are emitted along the center of the left dimming port;
the surface of the convex mirror and the surface of the concave mirror are coated with films by evaporation, the films by evaporation need to be ensured to have high reflectivity in an infrared band, and the high reflectivity means that the reflectivity is more than 90%.
Preferably, the convex mirror and the concave mirror are surface-deposited with a gold film having a thickness of preferably 1000 angstroms.
The refraction type system is used for realizing a continuous zooming microscopic function, and the front focus of the refraction type system with continuous zooming is coincided with the back focus of the reflection type system.
The focusing auxiliary system is used for realizing a focusing function and comprises an infrared light source and a first reflector.
The laser and the infrared light source are arranged on the first sliding rail; the first reflector is arranged on the first sliding rail; the grating target is arranged on the second slide rail, and the first slide rail is fixedly connected with the second slide rail at a right angle; the infrared camera, the second reflector and the refraction type system are arranged on a third slide rail; the first slide rail, the second slide rail and the third slide rail are arranged on the fixing plate.
Laser emitted by the laser device penetrates through the grating target and the right dimming port in sequence after being reflected by the first reflector, is then reflected by the concave mirror and the convex mirror and then is emitted from the light path adjusting box through the left dimming port, and is finally reflected by the second reflector and collected by the infrared camera through the refraction type system, so that continuous zooming and microscopic infrared optical enhancement of the microscopic infrared optical enhancement system for continuous zooming are realized, and further transient temperature measurement in deformation and failure processes in a microcell region in a material under high-speed impact can be realized.
The infrared light spots emitted by the infrared light source penetrate through the light path adjusting box after being reflected by the first reflecting mirror, are collected by the infrared camera after being converged and emitted by the refraction type system, and the distance between the refraction type system and the infrared camera under different multiplying powers is adjusted by the third sliding rail, so that the focusing operation of the continuously zooming microscopic infrared optical enhancement system is realized.
Preferably, the first reflector uses a rotating device to realize rotation, and realizes accurate positioning of the middle part of the whole system and focal length determination of the refraction type system. The components comprise a light path adjusting box, an infrared light source, a second reflecting mirror, a refraction type system and an infrared camera.
The debugging method of the continuously zooming microscopic infrared optical enhancement system, which is realized based on the continuously zooming microscopic infrared optical enhancement system disclosed by the invention, comprises the following steps:
the method comprises the following steps: the height of the laser is adjusted through the laser emitted by the laser, and the angle and the height of the first reflector are adjusted through the laser emitted by the laser, so that laser spots are ensured to be emitted from the center point of the right dimming port; the angle of the first reflector is rotated, the height and the angle of the infrared light source are adjusted, and light spots emitted by the infrared light source are ensured to be emitted from the center point of the right dimming port.
Step two: the laser facula is emitted from the central point of the left dimming port after being reflected by adjusting the large adjusting frame and the small adjusting frame.
Step three: adjusting the height and angle of the refraction type system according to the spot point to ensure that the laser spot is emitted from the central point of the refraction type system; the height and angle of the infrared camera is then adjusted so that the spot is exactly centered on the infrared target surface.
Step four: and taking the grating target away before measurement, and adjusting the distance between the refraction type system and the infrared camera through a third slide rail, so that the infrared camera receives the maximum infrared energy which sequentially passes through the first reflector, the light path adjusting box, the second reflector and the refraction type system, and the focusing operation of the continuously zooming microscopic infrared optical enhancement system is realized.
Step five: and placing the grating target on the second sliding rail, and adjusting the height of the grating target to enable the infrared light spot to pass through the central position of the grating target.
Step six: light spots emitted by the infrared light source sequentially penetrate through the grating target and the right dimming port after being reflected by the first reflecting mirror, are reflected by the concave mirror and the convex mirror and then are emitted from the light path adjusting box through the left dimming port, and finally are reflected by the second reflecting mirror and penetrate through the refraction type system, and then are recorded by the infrared camera. The continuous zooming microscopic infrared optical enhancement system has the function of amplifying and measuring in micro-cells, and the refrigeration type high-speed infrared detector replaces an infrared camera so as to measure the transient temperature in the deformation and failure processes in the micro-cells in the material under high-speed impact.
Has the advantages that:
1. the invention discloses a continuous zooming microscopic infrared optical enhancement system and a continuous zooming microscopic infrared optical enhancement method, which can realize continuous zooming microscopic function by coincidence of the object distance of a refraction type system and the image distance of a reflection type system, can be applied to a refrigeration type high-speed infrared detector, and can realize transient temperature measurement in deformation and failure processes in a micro area of a material under high-speed impact.
2. According to the continuous zooming microscopic infrared optical enhancement system and method, the focal length of the whole system is adjusted through the single infrared light source and the single infrared camera, the complicated focusing method is reduced, the operation is simple and easy, and the testing efficiency is improved.
3. The invention discloses a continuous zooming microscopic infrared optical enhancement system and a continuous zooming microscopic infrared optical enhancement method, which can increase the working distance of an infrared optical system by utilizing a reflection type system and ensure the safety of instruments.
Drawings
FIG. 1 is a schematic structural diagram of a continuously variable-focus microscopic infrared optical enhancement system according to the present invention;
FIG. 2 is a schematic diagram of the overall structure of a continuously variable-focus microscopic infrared optical enhancement system disclosed in the present invention;
FIG. 3 is a flow chart of a method for continuously zooming micro-infrared optical enhancement.
Wherein: wherein: 1-a laser; 2-an infrared light source; 3-a rotating device; 4-a first mirror; 5-grating target; 6-small adjusting bracket; 7-right light adjusting port; 8-convex mirror; 9-an optical path adjusting box; 10-concave mirror; 11-large adjusting bracket; 12-left dimming port; 13-refractive system with continuous zoom; 14-an infrared camera; 15-a second mirror; 16-a first slide rail; 17-a second slide rail; 18-a third slide rail; 19-fixing the plate.
Detailed Description
The embodiments of the present invention will now be further described with reference to the accompanying drawings;
as shown in fig. 1 and 2, the system mainly includes a laser 1, an infrared light source 2, a rotating device 3, a first reflecting mirror 4, a light path adjusting box 9, a refractive system 13 with continuous zooming, an infrared camera 14, a second reflecting mirror 15, and a fixing plate 19;
the light path adjusting box 9 is symmetrically provided with two through holes on the same side, and crossed organic glass, namely a right dimming port 7 and a left dimming port 12, is arranged at the through holes and is used for adjusting the center of a light path; a small adjusting frame 6, a convex mirror 8, a large adjusting frame 11 and a concave mirror 10 are arranged in the light path adjusting box 9; the light path adjusting box 9 is fixed on the fixing plate 19 through a lifting fixing device; the small adjusting frame 6 is fixedly connected with the convex mirror 8 and is used for adjusting the position of the convex mirror 8; the large adjusting frame 11 is fixedly connected with the concave mirror 10 and is used for adjusting the position of the concave mirror 10; the laser 1, the infrared light source 2 and the first reflector 4 are arranged on a first slide rail 16; the first reflector 4 is mounted on the first slide rail 16 through the rotating device 3; the grating target 5 is arranged on a second slide rail 17; the first slide rail 16 and the second slide rail 17 are fixedly connected at right angles; the refraction type system 13 with continuous zooming, the infrared camera 14 and the second reflector 15 are arranged on a third slide rail 18, and a first slide rail 16, a second slide rail 17 and the third slide rail 18 are arranged on a fixed plate 19;
the front focus of the refractive system 13 is coincided with the back focus of the reflective system; the magnification of the refraction type system is 0.5, 1, 2 and 3;
the long working distance of the continuous zooming microscopic infrared optical enhancement system realized by the reflective system is 140 mm;
the refraction system 13 transmits the image passing through the reflection system to the infrared camera 14;
the first reflector 4 is rotated by the rotating device 3, and the accurate positioning of the middle part of the whole system and the focal length determination of the refraction system 13 are realized. The components comprise a light path adjusting box 7, an infrared light source 3, a second reflector 15, a refraction type system 13 and an infrared camera 14
The top point of the convex mirror 8 is positioned at the focus of the concave mirror 10, so that light rays can be emitted along the center of the left light adjusting port 12;
a layer of gold film with the thickness of 1000 angstroms is evaporated on the surfaces of the convex mirror 8 and the concave mirror 10;
the surface of the grating target 5 is engraved with a grating of 50 lines/mm;
the debugging method of the continuously zooming microscopic infrared optical enhancement system based on the disclosed continuously zooming microscopic infrared optical enhancement system of the embodiment comprises the following specific implementation steps:
step one, adjusting the height of the component: the height of the laser 1 and the angle and the height of the first reflector 4 are adjusted through laser emitted by the laser 1, so that laser spots are ensured to be incident from the center point of the right dimming port 7; rotating the angle of the first reflector 4, adjusting the height and the angle of the infrared light source 2, and ensuring that light spots emitted by the infrared light source 3 are incident from the central point of the right dimming port 7;
step two, adjusting the light path adjusting box: the large adjusting frame 11 and the small adjusting frame 6 are adjusted to enable laser spots to be emitted from the central point of the left dimming hole 12 after being reflected;
step three, adjusting the refraction type system and the infrared camera: the height and the angle of the refraction type system 13 are adjusted according to the spot point to ensure that the laser spot is emitted from the central point of the refraction type system; then adjusting the height and the angle of the infrared camera 14 to enable the light spot to be just at the center position of the infrared target surface;
step four, adjusting the focal length of the refraction type system: before the experiment, the grating target 5 is taken away, and the distance between the refraction type system 13 and the infrared camera 14 is adjusted through a third slide rail, so that the infrared energy received by the infrared camera 14 sequentially passes through the first reflector 6, the light path adjusting box 9, the second reflector 15 and the refraction type system 13 is maximum;
step five, adjusting the height of the grating target: placing the grating target 5 with the surface containing 50 lines/mm grid lines on a second sliding rail 17, and adjusting the height of the grating target 5 to enable the infrared light spot to pass through the center position of the grating target 5;
step six, infrared image acquisition: light spots emitted by the infrared light source 2 are reflected by the first reflecting mirror 3, sequentially pass through the grating target 5 and the right dimming port 7, are reflected by the concave mirror 10 and the convex mirror 8, are emitted from the light path adjusting box 9 through the left dimming port 12, are reflected by the second reflecting mirror 15, penetrate through the refraction type system 13, and are recorded by the infrared camera 14.
The above detailed description is intended to illustrate the objects, aspects and advantages of the present invention, and it should be understood that the above detailed description is only exemplary of the present invention and is not intended to limit the scope of the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (5)
1. A continuous zooming microscopic infrared optical enhancement system is characterized in that: the device comprises a reflection type system, a refraction type system and a focusing auxiliary system; the reflective system and the focusing auxiliary system share a first reflector (2);
the reflection type system is used for increasing the working distance of the infrared optical enhancement system and comprises a laser (1), a first reflector (2), a light path adjusting box (9) and a second reflector (15); the light path adjusting box (9) is used for adjusting the center of a light path, and two through holes, namely a right light adjusting port (7) and a left light adjusting port (12), are symmetrically formed in the same side surface; a small adjusting frame (6), a convex mirror (8), a large adjusting frame (11) and a concave mirror (10) are arranged in the light path adjusting box (9); the light path adjusting box (9) is fixed on the fixing plate (19) through a lifting fixing device; the small adjusting frame (6) is fixedly connected with the convex mirror (8) and is used for adjusting the position of the convex mirror (8); the large adjusting frame (11) is fixedly connected with the concave mirror (10) and is used for adjusting the position of the concave mirror (10);
the vertex of the convex mirror (8) is positioned at the focus of the concave mirror (10), so that light rays are emitted along the center of the left light adjusting port (12);
the surfaces of the convex mirror (8) and the concave mirror (10) are coated with films by evaporation, the films need to be ensured to have high reflectivity in an infrared band, and the high reflectivity means that the reflectivity is more than 90%;
the refraction type system (13) is used for realizing a continuous zooming microscopic function, and the front focus of the refraction type system with continuous zooming is superposed with the back focus of the reflection type system;
the focusing auxiliary system is used for realizing a focusing function and comprises an infrared light source (2) and a first reflector (4);
laser emitted by the laser (1) is reflected by the first reflecting mirror (4), sequentially penetrates through the grating target and the right dimming port (7), is reflected by the concave mirror (10) and the convex mirror (8), is emitted from the light path adjusting box (9) through the left dimming port (12), is reflected by the second reflecting mirror (15), and is collected by the infrared camera (14) through the refraction type system (13), so that continuous zooming and microscopic infrared optical enhancement of the continuous zooming microscopic infrared optical enhancement system are realized, the refrigeration type high-speed infrared detector replaces the infrared camera (14), and further transient temperature measurement in deformation and failure processes in a micro area of the material under high-speed impact can be realized;
the infrared light spot that infrared light source (2) sent pass light path regulating box (9) after being reflected by first speculum (4), gather after penetrating through refraction formula system (13) and gather by infrared camera (14), adjust the distance between refraction formula system (13) and infrared camera (14) under the different multiplying powers through third slide rail (18), realize a continuous zooming microscopic infrared optics reinforcing system focus operation.
2. A continuous zoom microscopic infrared optical enhancement system as claimed in claim 1, wherein: the laser (1) and the infrared light source (2) are arranged on the first sliding rail; the first reflector (4) is arranged on the first sliding rail (16); the grating target (5) is arranged on the second slide rail (17), and the first slide rail (16) is fixedly connected with the second slide rail (17) at a right angle; the infrared camera (14), the second reflector (15) and the refraction type system (13) are arranged on a third slide rail (18); the first slide rail (16), the second slide rail (17) and the third slide rail (18) are arranged on the fixing plate (19).
3. A continuous zoom microscopic infrared optical enhancement system as claimed in claim 1 or 2, wherein: the first reflector (3) realizes rotation by using the rotating device (4) and realizes accurate positioning of components in the whole system and focal length determination of the refraction type system; the components comprise a light path adjusting box (7), an infrared light source (3), a second reflector (15), a refraction type system (13) and an infrared camera (14).
4. A continuous zoom microscopic infrared optical enhancement system as claimed in claim 1 or 2, wherein: gold films with the thickness of 1000 angstroms are evaporated on the surfaces of the convex mirror (8) and the concave mirror (10).
5. A method of commissioning a continuous zoom microinfrared optical enhancement system based on a continuous zoom microinfrared optical enhancement system as claimed in claim 1 or 2, wherein: the method comprises the following steps:
the method comprises the following steps: the height of the laser (1) is adjusted through the laser emitted by the laser (1), and the angle and the height of the first reflector (4) are adjusted through the laser emitted by the laser (1), so that laser spots are ensured to be emitted from the center point of the right light adjusting port (7); rotating the angle of the first reflector (4), adjusting the height and the angle of the infrared light source (2) and ensuring that light spots emitted by the infrared light source (3) are emitted from the center point of the right light adjusting opening (7);
step two: the laser facula is emitted from the central point of the left dimming port (12) after being reflected by adjusting the large adjusting frame (11) and the small adjusting frame (6);
step three: the height and the angle of the refraction type system (13) are adjusted according to the spot point to ensure that the laser spot is emitted from the central point of the refraction type system (13); then adjusting the height and the angle of the infrared camera (14) to enable the light spot to be exactly positioned at the center of the infrared target surface;
step four: before measurement, the grating target (5) is taken away, the distance between the refraction type system (13) and the infrared camera (14) is adjusted through a third slide rail (18), so that the infrared camera (14) receives the infrared light energy which sequentially passes through the first reflector (6), the light path adjusting box (9), the second reflector (15) and the refraction type system (13) to the maximum, and then the focusing operation of the continuous zooming microscopic infrared optical enhancement system is realized;
step five: placing the grating target (5) on a second sliding rail (17), and adjusting the height of the grating target (5) to enable the infrared light spot to pass through the central position of the grating target (5);
step six: light spots emitted by the infrared light source (2) are reflected by the first reflecting mirror (3) and then sequentially pass through the grating target (5) and the right light adjusting port (7), then are reflected by the concave mirror (10) and the convex mirror (8), and then are emitted from the light path adjusting box (9) through the left light adjusting port (12), and finally are reflected by the second reflecting mirror (15) and penetrate through the refraction type system (13), and then grating graphs are recorded by the infrared camera (14); the function of the continuous zooming microscopic infrared optical enhancement system for amplifying and measuring in the micro area is realized, and the refrigeration type high-speed infrared detector replaces an infrared camera (14) so as to realize transient temperature measurement in deformation and failure processes in the micro area in the material under high-speed impact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810346551.1A CN108827898B (en) | 2018-04-18 | 2018-04-18 | Continuous zooming microscopic infrared optical enhancement system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810346551.1A CN108827898B (en) | 2018-04-18 | 2018-04-18 | Continuous zooming microscopic infrared optical enhancement system and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108827898A CN108827898A (en) | 2018-11-16 |
| CN108827898B true CN108827898B (en) | 2021-04-20 |
Family
ID=64155443
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810346551.1A Active CN108827898B (en) | 2018-04-18 | 2018-04-18 | Continuous zooming microscopic infrared optical enhancement system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108827898B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1310798A (en) * | 1998-05-21 | 2001-08-29 | 依兰集团有限公司 | An optical apparatus |
| CN1890554A (en) * | 2003-12-12 | 2007-01-03 | Elt株式会社 | Gas sensor |
| CN101634628A (en) * | 2009-07-07 | 2010-01-27 | 杨涛 | Active infrared SF6 detecting and monitoring instrument |
| CN102680122A (en) * | 2012-04-25 | 2012-09-19 | 山东商业职业技术学院 | Visible long-distance non-contact temperature measuring system |
| CN103018196A (en) * | 2012-12-11 | 2013-04-03 | 江苏大学 | Fast detection method for rape water demand information |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1141601C (en) * | 2001-08-14 | 2004-03-10 | 中国科学院长春光学精密机械与物理研究所 | Continuous vari-focus Fresnel lens |
| US9402036B2 (en) * | 2011-10-17 | 2016-07-26 | Rudolph Technologies, Inc. | Scanning operation with concurrent focus and inspection |
| CN103197406B (en) * | 2012-11-25 | 2015-01-14 | 西南技术物理研究所 | Optical compensation continuous zooming passive athermalization optical system |
| US9501827B2 (en) * | 2014-06-23 | 2016-11-22 | Exxonmobil Upstream Research Company | Methods and systems for detecting a chemical species |
| CN205697730U (en) * | 2016-05-19 | 2016-11-23 | 西安中科飞图光电科技有限公司 | Medical human thermal source collecting device |
| CN106657824A (en) * | 2016-11-22 | 2017-05-10 | 北京理工大学 | Infrared photography optical enhancement system |
| CN107465891A (en) * | 2017-06-23 | 2017-12-12 | 国网浙江省电力公司宁波供电公司 | A kind of new night observation device and transformer station's infrared temperature measurement system |
-
2018
- 2018-04-18 CN CN201810346551.1A patent/CN108827898B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1310798A (en) * | 1998-05-21 | 2001-08-29 | 依兰集团有限公司 | An optical apparatus |
| CN1890554A (en) * | 2003-12-12 | 2007-01-03 | Elt株式会社 | Gas sensor |
| CN101634628A (en) * | 2009-07-07 | 2010-01-27 | 杨涛 | Active infrared SF6 detecting and monitoring instrument |
| CN102680122A (en) * | 2012-04-25 | 2012-09-19 | 山东商业职业技术学院 | Visible long-distance non-contact temperature measuring system |
| CN103018196A (en) * | 2012-12-11 | 2013-04-03 | 江苏大学 | Fast detection method for rape water demand information |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108827898A (en) | 2018-11-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103098319B (en) | Laser beam analytical equipment | |
| CN102564611B (en) | High-power laser wave front measuring instrument and wave front measuring method | |
| CN104034279B (en) | Detection device and method for splicing and measuring surface shape by utilizing small-hole diffraction wave surface | |
| CN103777348B (en) | The dexterous infrared optical system of a kind of multiband | |
| CN102426093A (en) | Polymer planar waveguide optical parameter measuring instrument based on microscopic imaging | |
| CN110687078A (en) | Phase recovery imaging apparatus and imaging method | |
| CN109900357A (en) | Method and system for measuring large-scale laser spots of target surface | |
| CN115561220A (en) | Light scattering angle resolution detection analysis system | |
| CN108132026A (en) | Infrared visible ray dual wavelength transmission-type interference testing device in semiconductor | |
| CN202351017U (en) | Measuring instrument based on microscopic imaging for optical parameters of polymer planar waveguide | |
| KR100763974B1 (en) | Method and apparatus for aligning optical axis for wavefront sensor for mid-infrared band | |
| CN115032847B (en) | Sum frequency light output device | |
| CN108168842A (en) | A kind of controllable infrared target generating means | |
| Willis et al. | A confocal microscope position sensor for micron-scale target alignment in ultra-intense laser-matter experiments | |
| CN108827898B (en) | Continuous zooming microscopic infrared optical enhancement system and method | |
| CN209895098U (en) | Light source switching multiplexing unit coaxiality debugging system | |
| CN110118645B (en) | Optical performance comprehensive evaluation method of semi-ellipsoid reflecting surface | |
| CN109000591B (en) | Eccentricity difference measuring instrument | |
| CN110109262B (en) | Coaxiality debugging system and method for light source switching multiplexing unit | |
| CN204101461U (en) | Raman probe and can the Raman signal sniffer of auto-focusing | |
| CN116678583B (en) | Schlieren system based on phase modulation and adjusting method thereof | |
| WO2024065898A1 (en) | High-precision light spot test system and method based on space imaging system | |
| CN111795649B (en) | Device and method for non-contact measurement of edge covering thickness of optical crystal | |
| CN2599524Y (en) | Dot diffraction interferometer for detecting surface shape | |
| CN103673928A (en) | High-precision measuring device for micro-curvature of optical reflecting mirror |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |