CN108036804B - Device for adjusting output of resistance strain gauge - Google Patents
Device for adjusting output of resistance strain gauge Download PDFInfo
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- CN108036804B CN108036804B CN201810015675.1A CN201810015675A CN108036804B CN 108036804 B CN108036804 B CN 108036804B CN 201810015675 A CN201810015675 A CN 201810015675A CN 108036804 B CN108036804 B CN 108036804B
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- 238000005259 measurement Methods 0.000 claims abstract description 23
- 230000008859 change Effects 0.000 claims abstract description 17
- 238000006243 chemical reaction Methods 0.000 claims abstract description 15
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000003990 capacitor Substances 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 229920001296 polysiloxane Polymers 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 9
- 230000032683 aging Effects 0.000 abstract description 7
- 238000010586 diagram Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 239000000741 silica gel Substances 0.000 description 2
- 229910002027 silica gel Inorganic materials 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 229910001006 Constantan Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- CLOMYZFHNHFSIQ-UHFFFAOYSA-N clonixin Chemical compound CC1=C(Cl)C=CC=C1NC1=NC=CC=C1C(O)=O CLOMYZFHNHFSIQ-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910001120 nichrome Inorganic materials 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measurement Of Force In General (AREA)
Abstract
The invention discloses a device for adjusting output of a resistance strain gauge, which can reduce drift and error of a detection signal, is less affected by aging of the resistance strain gauge and has higher stability. The device comprises: the device comprises a resistance strain gauge, a measuring circuit, an amplifier, an analog-to-digital conversion circuit, a microprocessor and a direct current power supply for supplying power to the device, wherein the resistance strain gauge, the measuring circuit, the amplifier, the analog-to-digital conversion circuit, the microprocessor and the direct current power supply are sequentially connected; the measuring circuit is provided with a fixed resistance resistor connected with the lead wire of the resistance strain gauge in parallel and a resistance adjustable resistor connected with the fixed resistance resistor in series and is used for outputting a corresponding voltage signal according to the resistance value of the resistance strain gauge; the microprocessor is used for calculating the resistance value of the equivalent resistor of the resistance strain gauge according to the resistance value of the fixed resistance value resistor, the resistance value of the resistance value adjustable resistor and the voltage value of the direct current power supply, generating measurement data corresponding to the deformation of the resistance strain gauge according to the resistance value change of the equivalent resistor, and outputting or storing the generated measurement data.
Description
Technical Field
The invention relates to the technical field of resistance strain sensing measurement, in particular to a device for adjusting output of a resistance strain gauge.
Background
Resistive strain gages are a common sensing element. When the physical quantity such as tension, pressure, torque, displacement, acceleration, temperature and the like applied to the resistance strain gauge changes, the resistance of the resistance strain gauge also changes correspondingly, and the measured value of the corresponding physical quantity can be obtained through measuring and outputting the resistance of the resistance strain gauge.
Among the resistive strain gages commonly found in the prior art are metallic strain gages and semiconductor strain gages. The metal strain gauge is made by winding constantan wire or nichrome wire into grid shape or etching thin metal foil into grid shape and clamping the grid shape in two layers of insulating sheets, then connecting silver-plated copper wires with the wire grid of the strain gauge as a lead of the resistance gauge, and detecting the stress by the change of resistance value caused by deformation of the metal wire. The semiconductor strain gauge is a sensitive element manufactured by utilizing the piezoresistive effect of monocrystalline silicon, and the physical quantity such as pressure, tensile force and the like applied to the strain gauge is detected by the change of resistivity caused by the deformation of a semiconductor material.
Because the resistance strain gauge has mechanical hysteresis, the resistance strain gauge cannot be restored to the original state immediately after being stressed, and the resistance value cannot be restored to the initial value, the output value is inevitably drifted in the repeated detection process; meanwhile, the resistance strain gauge has a certain tensile life, and after a certain number of times of use, the initial resistance value of the resistance strain gauge can drift in an original detection range and exceed the detection range of a measuring circuit, so that no data output is caused. The output signal of the strain gauge is also affected by a change in temperature, and a temperature drift occurs.
The Chinese patent application with publication number of CN105675184A discloses a compensation method for zero temperature drift of a bridge circuit of a silicon strain gauge, which estimates a series resistance value and a parallel resistance value by collecting data of a corresponding resistor at a plurality of temperature points. Although the effect of temperature drift can be reduced to some extent, the output of the hardware compensation circuit diagram still has a non-negligible zero drift when the bridge of this scheme is balanced due to the mechanical hysteresis of the strain gauge. As shown in FIG. 1, if stress is measured repeatedly at time t, the strain resistance R measured by this scheme A The signal having a DeltaR with respect to the mechanical hysteresis of the strain gauge A Drift of (c). In addition, after multiple measurements, the drift amount of the output signal is further increased due to aging of the strain gauge, and the accuracy of the detection result is reduced.
Disclosure of Invention
At least one of the objects of the present invention is to provide a device for adjusting output of a resistance strain gauge, which can reduce drift and error of a detection signal, has less influence of aging of the resistance strain gauge, has higher stability, and can be used for improving detection accuracy of output signals of various resistance strain gauges.
In order to achieve the above object, the present invention adopts a technical scheme including the following aspects.
An apparatus for resistance strain gauge output adjustment, comprising: the device comprises a resistance strain gauge, a measuring circuit, an amplifier, an analog-to-digital conversion circuit, a microprocessor and a direct current power supply for supplying power to the device, wherein the resistance strain gauge, the measuring circuit, the amplifier, the analog-to-digital conversion circuit, the microprocessor and the direct current power supply are sequentially connected;
the measuring circuit is provided with a first resistor (which can be a resistance value adjustable resistor or a fixed resistance value resistor which is described later) connected in parallel with the lead wire of the resistance strain gauge, and a second resistor (which can be a resistance value adjustable resistor or a fixed resistance value resistor which is described later) connected in series with the first resistor, wherein the resistance value of the first resistor is smaller than the minimum value of the equivalent resistance value of the resistance strain gauge so that the measuring circuit outputs a corresponding voltage signal according to the resistance value of the resistance strain gauge;
the amplifier is used for amplifying the amplitude of the voltage signal output by the measuring circuit; the analog-to-digital conversion circuit is used for converting the output signal of the amplifier into a digital signal;
the microprocessor is used for calculating the resistance value of the equivalent resistor of the resistance strain gauge according to the resistance values of the first resistor and the second resistor and the voltage value of the direct current power supply, generating measurement data corresponding to the deformation of the resistance strain gauge according to the resistance value change of the equivalent resistor, and outputting or storing the generated measurement data.
Preferably, the measuring circuit comprises a resistance adjustable resistor and a fixed resistance resistor;
the lead at one end of the resistance strain gauge is connected to a direct current power supply, and the other end of the resistance strain gauge is connected with a resistance adjustable resistor; one end of the resistance-adjustable resistor is connected with the resistance strain gauge in series, and the other end of the resistance-adjustable resistor is grounded; the fixed-resistance resistor is connected with the lead wire of the resistance strain gauge in parallel; and outputting the voltage at two ends of the resistance-adjustable resistor as a voltage signal to an amplifier.
Preferably, the measuring circuit comprises a resistance adjustable resistor and three resistors with fixed resistance values;
the lead at one end of the resistance strain gauge is connected to a direct current power supply, and the other end of the resistance strain gauge is connected with a first fixed resistance resistor in series and then grounded; one end of the resistance adjustable resistor is connected to the direct current power supply, and the other end of the resistance adjustable resistor is connected with the second fixed resistance resistor in series and then grounded; the third fixed-resistance resistor is connected with the lead wire of the resistance strain gauge in parallel; and outputting the voltage difference between the first fixed resistance resistor and the second fixed resistance resistor and the ground to the amplifier as a voltage signal.
Preferably, the device comprises two resistance strain gauges, and the measuring circuit comprises a resistance value adjustable resistor and three fixed resistance values;
the lead at one end of the first resistance strain gauge is connected to a direct current power supply, and the other end of the first resistance strain gauge is connected with a first fixed resistance resistor in series and then grounded; one end of the resistance adjustable resistor is connected to the direct current power supply, and the other end of the resistance adjustable resistor is connected with the second fixed resistance resistor in series and then grounded; the third fixed-resistance resistor is connected with the lead wire of the resistance strain gauge in parallel; the second resistance strain gauge is connected with a second fixed resistance resistor in parallel; and outputting the voltage difference between the first fixed resistance resistor and the second fixed resistance resistor and the ground to the amplifier as a voltage signal.
Preferably, when the resistance strain gauge deforms and the amplitude of the voltage signal changes beyond the input voltage range of the amplifier, the resistance value of the resistance value adjustable resistor is adjusted to change the amplitude of the voltage signal so as to meet the input voltage range of the amplifier.
Preferably, the amplifier employs ADI low noise amplifier AD8634 having 9.7MHz bandwidth with input voltage noise density
Preferably, an analog-to-digital conversion circuit is formed by using a MC14433 chip of Motorola company and peripheral resistors and capacitors.
Preferably, the microprocessor adopts 16-bit RISC SCM MSP-430F413 of TI company.
Preferably, the resistance strain gauge is a flexible resistance strain gauge made of a polymer composite material comprising silica gel.
Preferably, the equivalent resistance value of the flexible resistance strain gauge ranges from 100 Ω to 1mΩ.
In summary, due to the adoption of the technical scheme, the invention has at least the following beneficial effects:
through first, second fixed resistance and resistance adjustable resistance, not only can be with the amplitude adjustment of the voltage signal of measuring circuit output to accord with the input voltage scope of amplifier to reduce drift and the error of detected signal, and can be when the equivalent resistance change curve of resistance strain gauge changes after many stretching ageing, keep measuring result's stability through the resistance of changing resistance adjustable resistance, avoid the influence that resistance strain gauge is ageing.
Drawings
FIG. 1 is a strain resistance signal measured in one of the prior art, which is present as ΔR A Drift of (c).
Fig. 2 is a schematic structural view of an apparatus for resistance strain gauge output adjustment according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of a measurement circuit according to an embodiment of the invention.
Fig. 4 is a schematic diagram of the amplitude variation of the voltage signal output by one of the prior art.
Fig. 5 is a schematic diagram of the change in amplitude of the voltage signal at the output of the measurement circuit according to an embodiment of the invention.
Fig. 6 is a schematic diagram of a measurement circuit according to another embodiment of the invention.
Fig. 7 is a schematic diagram of a measurement circuit according to still another embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, so that the objects, technical solutions and advantages of the present invention will become more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Fig. 2 illustrates an apparatus for resistance strain gage output adjustment in accordance with an embodiment of the invention. The device of the embodiment comprises a resistance strain gauge, a measuring circuit, an amplifier, an amplitude modulation circuit, an analog-to-digital conversion circuit, a microprocessor, a communication interface and a direct current power supply for supplying power to the device, which are connected in sequence.
The measuring circuit is provided with a fixed-resistance resistor connected with the lead wire of the resistance strain gauge in parallel and a resistance-adjustable resistor connected with the fixed-resistance resistor in series and is used for outputting a corresponding voltage signal according to the resistance value of the resistance strain gauge.
An amplifier for amplifying the amplitude of the voltage signal to the input range of the amplitude modulation circuit, for example, a low noise amplifier AD8634 of ADI company having a 9.7MHz bandwidth, an input voltage noise density of
The amplitude modulation circuit comprises a triode and an LC resonant circuit and is used for carrying out nonlinear frequency conversion on an input voltage signal through a constant-amplitude carrier wave generated by the high-frequency carrier wave oscillator and outputting an amplitude modulation wave. However, the amplitude modulation circuit is optional, and in various embodiments the amplitude of the voltage signal may be amplified to within the input range of the analog-to-digital conversion circuit by setting the gain factor of the amplifier.
And the analog-to-digital conversion circuit is used for converting the amplitude modulation wave into a digital signal. For example, the Motorola MC14433 chip and peripheral resistors and capacitors may be used to form the analog-to-digital conversion circuit.
And the microprocessor is used for calculating the resistance value of the equivalent resistor of the resistance strain gauge according to the resistance value of the fixed resistance value resistor, the resistance value of the resistance value adjustable resistor and the voltage value of the direct current power supply, and generating measurement data corresponding to the deformation of the resistance strain gauge according to the resistance value change of the equivalent resistor. For example, the microprocessor may employ a 16-bit RISC SCM MSP-430F413 from TI company.
The generated measurement data can be directly displayed by a display (such as an LED display screen which is integrally arranged with the resistance strain gauge) connected with the microprocessor, or can be sent to other devices, such as a data analysis server, through a communication interface connected with the microprocessor so as to further process or store the measurement data.
Fig. 3 shows a schematic diagram of the structure of a measurement circuit according to an embodiment of the invention. Wherein the equivalent resistance of the resistance strain gauge is denoted as Rx; one end of the resistance strain gauge is connected with the direct current power supply VCC through a lead wire, and the other end of the resistance strain gauge is connected with the resistance value adjustable resistor R2; one end of the resistance value adjustable resistor R2 is connected with the resistance strain gauge in series, and the other end is grounded; the fixed resistance resistor R1 is connected with the lead wire of the resistance strain gauge in parallel; and outputting the voltage Uo at two ends of the resistance adjustable resistor R2 as a voltage signal to an amplifier. In other embodiments, the resistor R2 may be set to a resistor with a fixed resistance value, and the voltage across the R1 may be output to the amplifier as a voltage signal.
In the application of various different types of resistance strain gauges, a fixed resistance value resistor R1 smaller than the equivalent resistance value can be selected according to the nominal equivalent resistance value of the resistance strain gauge under the condition that the resistance strain gauge is not deformed, so that the resistance value of the R1 is always lower than Rx, and the resistance value of the strain gauge is prevented from being too greatly changed to be measured; the initial resistance of the resistance adjustable resistor R2 can be set according to the resistance of the fixed resistance resistor R1 and the input voltage range of the amplifier so as to acquire a voltage signal conforming to the input voltage range of the amplifier; when the resistance strain gauge deforms and the amplitude of the voltage signal changes beyond the input voltage range of the amplifier, the resistance value of the resistance value adjustable resistor R2 is adjusted to change the amplitude of the voltage signal Uo so that the amplitude still accords with the input voltage range (for example, -14.5V to +14.5V) of the amplifier. As can be seen from this process, the resistance-adjustable resistor referred to herein means that the strain gauge can be dynamically adjusted according to the potentiometer (e.g., digital potentiometer MCP41XX can be used) due to temperature drift or other attenuation of the strain gauge when the production is completed.
For example, for a highly sensitive resistance strain gauge (for example, a flexible resistance strain gauge made of a polymer composite material including silica gel), the equivalent resistance change Δr may range from 100 Ω to 1mΩ. On the one hand, the drift range of the amplitude change DeltaU of the voltage signal output by the measuring circuit is wide, the input voltage range of the amplifier is limited, and the input voltage cannot be accurately amplified; on the other hand, in the case where the variation Δr of the equivalent resistance value is small, Δu is too small, which may cause the amplifier circuit to have no output. As shown in fig. 4, in the range of t0 to t1, Δu is lower than the lowest input voltage of the amplifier, resulting in no signal output; in the range of t2 to t3, Δu exceeds the voltage range that can be detected by the amplifier, resulting in no signal output. According to the embodiment of the invention, on one hand, the voltage values at two ends of the resistance strain gauge are kept at relatively stable values through the fixed-resistance resistor connected in parallel with the resistance strain gauge, and the amplitude of the voltage signal Uo is further regulated to be in the range of the input voltage of the amplifier through the resistance value adjustable resistor, so that drift and errors of the detection signal are reduced. The amplitude change DeltaU of the output voltage signal is shown in fig. 5, and the voltage signal has stable output within the range of t 0-t 1.
Fig. 6 shows a schematic structural diagram of a bridge measurement circuit according to another embodiment of the invention. The lead at one end of the resistance strain gauge is connected to a direct current power supply VCC, and the other end of the resistance strain gauge is connected with a first fixed resistance resistor R4 in series and then grounded; one end of the resistance adjustable resistor R2 is connected to the direct current power supply VCC, and the other end of the resistance adjustable resistor R2 is connected with the second fixed resistance resistor R3 in series and then grounded; the third fixed resistance resistor R1 is connected with the lead wire of the resistance strain gauge in parallel; the voltage difference between the first and second fixed resistance resistors R4 and R3 and ground is output as a voltage signal Uo to the amplifier.
Fig. 7 shows a schematic diagram of a full-bridge measurement circuit according to a further embodiment of the invention. The circuit is different from the circuit shown in fig. 6 in that the device comprises two resistance strain gauges, the equivalent resistances of the resistance strain gauges are Rx and Ry, and the second fixed-resistance resistor R3 is connected in parallel with Ry.
In the above embodiment, through the first to third fixed resistance resistors and the resistance adjustable resistor, the amplitude of the voltage signal Uo output by the measurement circuit can be adjusted to be in line with the input voltage range of the amplifier, so that drift and error of the detection signal are reduced, and when the equivalent resistance change curve of the resistance strain gauge changes after multiple stretching ageing of the resistance strain gauge, the stability of the measurement result is maintained by changing the resistance value of the resistance adjustable resistor, so that the influence of ageing of the resistance strain gauge is avoided.
The foregoing is a detailed description of specific embodiments of the invention and is not intended to be limiting of the invention. Various alternatives, modifications and improvements will readily occur to those skilled in the relevant art without departing from the spirit and scope of the invention.
Claims (9)
1. An apparatus for resistance strain gauge output adjustment, comprising: the device comprises a resistance strain gauge, a measuring circuit, an amplifier, an analog-to-digital conversion circuit, a microprocessor and a direct current power supply for supplying power to the device, wherein the resistance strain gauge, the measuring circuit, the amplifier, the analog-to-digital conversion circuit, the microprocessor and the direct current power supply are sequentially connected;
wherein the equivalent resistance value change range of the resistance strain gauge is 100 omega-1 MΩ;
the measuring circuit is provided with a first resistor connected with the lead wire of the resistance strain gauge in parallel and a second resistor connected with the first resistor in series, wherein the resistance value of the first resistor is smaller than the minimum value of the equivalent resistance value of the resistance strain gauge so that the measuring circuit outputs a corresponding voltage signal according to the resistance value of the resistance strain gauge; the second resistor comprises a resistor with an adjustable resistance value and N resistors with fixed resistance values, and N is a natural number; the resistance value adjustable resistor is adjusted by adopting a digital potentiometer;
the amplifier is used for amplifying the amplitude of the voltage signal output by the measuring circuit; the analog-to-digital conversion circuit is used for converting the output signal of the amplifier into a digital signal;
the microprocessor is used for calculating the resistance value of the equivalent resistor of the resistance strain gauge according to the resistance values of the first resistor and the second resistor and the voltage value of the direct current power supply, generating measurement data corresponding to the deformation of the resistance strain gauge according to the resistance value change of the equivalent resistor, and outputting or storing the generated measurement data.
2. The apparatus of claim 1, wherein the measurement circuit comprises a resistance-adjustable resistor and a fixed resistance resistor;
the lead at one end of the resistance strain gauge is connected to a direct current power supply, and the other end of the resistance strain gauge is connected with a resistance adjustable resistor; one end of the resistance-adjustable resistor is connected with the resistance strain gauge in series, and the other end of the resistance-adjustable resistor is grounded; the fixed-resistance resistor is connected with the lead wire of the resistance strain gauge in parallel; and outputting the voltage at two ends of the resistance-adjustable resistor as a voltage signal to an amplifier.
3. The device of claim 1, wherein the measurement circuit comprises one resistance-adjustable resistor and three fixed-resistance resistors;
the lead at one end of the resistance strain gauge is connected to a direct current power supply, and the other end of the resistance strain gauge is connected with a first fixed resistance resistor in series and then grounded; one end of the resistance adjustable resistor is connected to the direct current power supply, and the other end of the resistance adjustable resistor is connected with the second fixed resistance resistor in series and then grounded; the third fixed-resistance resistor is connected with the lead wire of the resistance strain gauge in parallel; and outputting the voltage difference between the first fixed resistance resistor and the second fixed resistance resistor and the ground to the amplifier as a voltage signal.
4. The device of claim 1, wherein the device comprises two resistance strain gauges, and the measurement circuit comprises one resistance value adjustable resistor and three fixed resistance value resistors;
the lead at one end of the first resistance strain gauge is connected to a direct current power supply, and the other end of the first resistance strain gauge is connected with a first fixed resistance resistor in series and then grounded; one end of the resistance adjustable resistor is connected to the direct current power supply, and the other end of the resistance adjustable resistor is connected with the second fixed resistance resistor in series and then grounded; the third fixed-resistance resistor is connected with the lead wire of the resistance strain gauge in parallel; the second resistance strain gauge is connected with a second fixed resistance resistor in parallel; and outputting the voltage difference between the first fixed resistance resistor and the second fixed resistance resistor and the ground to the amplifier as a voltage signal.
5. The apparatus according to any one of claims 1 to 4, wherein when the resistance strain gauge is deformed and the amplitude of the voltage signal is changed beyond the input voltage range of the amplifier, the resistance value of the resistance value adjustable resistor is adjusted to change the amplitude of the voltage signal so as to conform to the input voltage range of the amplifier.
6. The apparatus of any one of claims 1 to 4, wherein the amplifier employs a low noise amplifier AD8634 having a 9.7MHz bandwidth with an input voltage noise density of
7. The device according to any one of claims 1 to 4, wherein the analog-to-digital conversion circuit is formed by using an MC14433 chip and peripheral resistors and capacitors.
8. The apparatus of any one of claims 1 to 4, wherein the microprocessor employs a 16-bit RISC single chip MSP-430F413.
9. The device of any one of claims 1 to 4, wherein the resistive strain gauge is a flexible resistive strain gauge made of a polymeric composite material comprising silicone.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810015675.1A CN108036804B (en) | 2018-01-08 | 2018-01-08 | Device for adjusting output of resistance strain gauge |
| PCT/CN2018/123167 WO2019134552A1 (en) | 2018-01-08 | 2018-12-24 | Elastic resistance strain gauge, preparation method therefor and application thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810015675.1A CN108036804B (en) | 2018-01-08 | 2018-01-08 | Device for adjusting output of resistance strain gauge |
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| CN108036804A CN108036804A (en) | 2018-05-15 |
| CN108036804B true CN108036804B (en) | 2024-03-01 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2019134552A1 (en) * | 2018-01-08 | 2019-07-11 | 成都柔电云科科技有限公司 | Elastic resistance strain gauge, preparation method therefor and application thereof |
| CN108931956B (en) * | 2018-09-03 | 2024-03-26 | 康泰医学系统（秦皇岛）股份有限公司 | Body temperature signal analog output device and method |
| CN110595885B (en) * | 2019-09-06 | 2022-06-14 | 鞍钢股份有限公司 | Dynamic load signal acquisition device and method |
| CN113655729B (en) * | 2021-10-20 | 2021-12-14 | 北京创米智汇物联科技有限公司 | Control device, control method, control system, and storage medium |
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| CN203241111U (en) * | 2013-05-16 | 2013-10-16 | 长安大学 | Vehicle oil tank oil level detection device |
| CN204854855U (en) * | 2015-05-20 | 2015-12-09 | 绵阳市万欣测控技术有限公司 | Air mass flow meter foil gage temperature compensation circuit of adjustable sampled value |
| CN105997089A (en) * | 2016-06-24 | 2016-10-12 | 上海仪器仪表研究所 | Analysis device and method for sleep-disordered breathing |
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