CN107688230B - Microscope for marking bad lines of liquid crystal screen - Google Patents
Microscope for marking bad lines of liquid crystal screen Download PDFInfo
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- CN107688230B CN107688230B CN201710885068.6A CN201710885068A CN107688230B CN 107688230 B CN107688230 B CN 107688230B CN 201710885068 A CN201710885068 A CN 201710885068A CN 107688230 B CN107688230 B CN 107688230B
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 12
- 230000002950 deficient Effects 0.000 claims description 19
- 230000000007 visual effect Effects 0.000 claims description 6
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 238000010330 laser marking Methods 0.000 abstract 1
- 210000005069 ears Anatomy 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0068—Optical details of the image generation arrangements using polarisation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0092—Polarisation microscopes
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
Abstract
The invention discloses a microscope for marking bad lines of a liquid crystal screen, which comprises: the microscope comprises a microscope body, a lens barrel and an ocular, wherein the objective is positioned at one end of the lens barrel, and the ocular is positioned at the other end of the lens barrel; the polaroid is connected with the microscope body and can be switched between an entering position extending into the ocular lens or the lens cone and a moving-out position extending out of the ocular lens or the lens cone; and a laser emitter connected with the microscope body, the laser emitter configured to project laser light into a viewing area of the objective lens. From this, rotate the polaroid to the entering position when looking for bad line to reduce field of vision luminance, make the position of the bad line of discernment that the observer can be quick accurate, whether accurate need switch the polaroid to the position of shifting out in order to accurately observe laser marking's position in addition, later just can carry out quick mark to bad line through laser transmitter, field of vision luminance height makes laser line mark more clear, accurate this moment.
Description
Technical Field
The invention relates to the technical field of liquid crystal screens, in particular to a microscope for marking bad lines of a liquid crystal screen.
Background
In the related art, in a process of manufacturing a Thin Film Transistor (TFT), it is necessary to analyze a defective line of a liquid crystal panel, there are thousands of Data/Gate lines on each small panel (panel), and a general Mark pen marks a defective position and then searches for the defective line with a microscope.
In addition, if the mark can not be found on the back of the panel, the front of the panel needs to be detached to find, so that the operation is complex, time and labor are wasted, and the probability of error finding is increased.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art. Therefore, the invention provides a microscope for marking a poor line of a liquid crystal screen.
The microscope for marking the poor lines of the liquid crystal screen comprises the following components: the microscope comprises a microscope body, a lens barrel and an ocular, wherein the objective is positioned at one end of the lens barrel, and the ocular is positioned at the other end of the lens barrel; the polaroid is connected with the microscope body and can be switched between an entering position extending into the eyepiece or the lens cone and a moving-out position extending out of the eyepiece or the lens cone; and a laser emitter coupled to the microscope body, the laser emitter configured to project laser light into a viewing area of the objective lens.
According to the microscope for marking the bad lines of the liquid crystal screen, the movable polaroid is arranged, so that the polaroid is rotated to the entering position when the bad lines are searched, the visual field brightness is reduced, an observer can quickly and accurately identify the positions of the bad lines, in addition, the polaroid needs to be switched to the moving-out position in order to accurately observe whether the positions of the laser marks are accurate, then the bad lines can be quickly marked through the laser emitting piece, and at the moment, the visual field brightness is high, so that the laser lines are marked more clearly and accurately.
In some embodiments, the laser emitting element comprises: the laser emitting head is connected with the objective lens; and the operation button is connected with the lens barrel and electrically connected with the laser emitting head to control the opening and closing of the laser emitting head.
In other embodiments, the number of the laser emitting heads is multiple, the projection areas of the laser emitting heads are all located in the observation area of the objective lens, and the operating button is configured to control the multiple laser emitting heads to be synchronously opened and closed.
According to some embodiments of the invention, the number of the laser emitting heads is at least three, and a plurality of the laser emitting heads are uniformly distributed around the circumference of the objective lens.
According to other embodiments of the present invention, an end of the lens barrel opposite to the eyepiece has a mounting groove, and the polarizer is rotationally switched between an entry position extending into the mounting groove and a removal position extending out of the mounting groove.
Optionally, the microscope body still includes the support, the lens cone includes first barrel and second barrel, the second barrel movably with first barrel is connected, the eyepiece, first barrel all with support fixed connection, objective with second barrel fixed connection, the mounting groove forms in the one end that first barrel is relative with the eyepiece.
Furthermore, the number of the polaroids is multiple, each polaroid can rotate independently, and the multiple polaroids are sequentially distributed along the axial direction of the lens barrel.
In a specific embodiment, a pivot shaft is arranged in the mounting groove, the pivot shaft is fixedly connected with the lens barrel, the pivot shaft sequentially penetrates through the plurality of polaroids so that the polaroids can pivot independently, and the axial direction of the pivot shaft is consistent with the axial direction of the lens barrel.
According to some embodiments of the invention, the first cylinder and the second cylinder are in threaded transmission so that the second cylinder can move towards or away from the first cylinder.
According to some embodiments of the present invention, the number of the polarizers is multiple, and the multiple polarizers are different types of polarizers, the multiple polarizers include at least a first polarizer and a second polarizer, one of the first polarizer and the second polarizer is a TN-type polarizer and the other is an ADS-type polarizer.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a schematic view of a microscope according to an embodiment of the invention.
FIG. 2 is a schematic diagram of a polarizer of a microscope according to an embodiment of the invention.
FIG. 3 is a schematic view of a microscope marking a faceplate according to an embodiment of the invention.
FIG. 4 is another schematic illustration of a microscope marking a faceplate according to an embodiment of the invention.
Reference numerals:
the microscope 100, the faceplate 200, the fault line 300, the laser mark point 400,
a microscope body 10, an objective lens 11, a lens barrel 12, a first cylinder 121, a second cylinder 122, an ocular 13, a support 14, a pivot shaft 15,
a polarizer 20, mounting ears 21, mounting holes 22,
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
A microscope 100 according to an embodiment of the present invention is described below with reference to fig. 1 to 4.
As shown in fig. 1, a microscope 100 for marking a defective line of a liquid crystal panel according to an embodiment of the present invention includes: a microscope body 10, a polarizer 20, and a laser emitter 30.
The microscope body 10 comprises an objective lens 11, a lens barrel 12 and an eyepiece lens 13, wherein the objective lens 11 is positioned at one end of the lens barrel 12, the eyepiece lens 13 is positioned at the other end of the lens barrel 12, the polarizer 20 is connected with the microscope body 10, the polarizer 20 can be switched between an entering position extending into the eyepiece lens 13 or the lens barrel 12 and a moving-out position extending out of the eyepiece lens 13 or the lens barrel 12, a laser emitting piece 30 is connected with the microscope body 10, and the laser emitting piece 30 is constructed to project laser into an observation area a of the objective lens 11.
The observation area a of the objective lens 11 refers to the field of view area of the objective lens 11 on the observed object, as shown in fig. 3.
According to the microscope 100 for marking the bad lines of the liquid crystal screen, the movable polarizer 20 is arranged, so that the polarizer 20 is rotated to the entering position when the bad lines 300 are searched, the visual field brightness is reduced, an observer can quickly and accurately identify the positions of the bad lines 300, in addition, the polarizer 20 needs to be switched to the moving-out position in order to accurately observe whether the positions of the laser marks are accurate, then the bad lines 300 can be quickly marked through the laser emitting part 30, and the visual field brightness is high, so that the laser line marks are clearer and more accurate.
In some embodiments, the laser emitting member 30 includes: a laser emitting head 31 connected to the objective lens 11, an operation button 32 connected to the lens barrel 12, and an operation button 32 electrically connected to the laser emitting head 31 for controlling the opening and closing of the laser emitting head 31. Specifically, the operation button 32 and the laser emitting head 31 are located in a control circuit, a battery or an external power source can be arranged in the control circuit, and the operation button 32 is a switch for controlling the on/off of the circuit. Therefore, when the defective line 300 is found through the microscope body 10 and the polarizer 20, pressing the operation button 32 triggers the laser emitting head 31 to emit laser, so as to mark the defective line 300 in the observation area a quickly and accurately.
In other embodiments, the number of the laser emitting heads 31 is plural, the projection areas of the plural laser emitting heads 31 are all located in the observation area a of the objective lens 11, and the operation button 32 is configured to control the synchronous opening and closing of the plural laser emitting heads 31. Thus, the plurality of laser emitting heads 31 can be controlled to emit laser light simultaneously by one operation button 32 and the laser light falls within the observation area a of the field of view of the current objective lens 11, further enhancing the accuracy of marking.
According to some embodiments of the present invention, the number of laser emitting heads 31 is at least three, and the plurality of laser emitting heads 31 are uniformly distributed around the circumference of the objective lens 11. Specifically, as shown in fig. 3 and 4, the laser mark points 400 of the three laser emitting heads may form a triangle into which a portion of the defective line is framed, and the laser mark points 400 of the four laser emitting heads may form a square into which a portion of the defective line falls. That is, the connecting lines of the marking points of the at least three laser emitting heads 31 in the observation area a of the field of view of the objective lens 11 may be in a ring shape, and the defective line 300 is located in the ring shape, thereby further reducing the marking range, so that the panel 200 does not need to be disassembled during subsequent maintenance, and the defective line 300 can be quickly identified according to the mark on the back of the panel 200.
As shown in fig. 1, according to other embodiments of the present invention, the end of the lens barrel 12 opposite to the eyepiece 13 has a mounting groove, and the polarizer 20 is rotationally switched between an entry position protruding into the mounting groove and a removal position protruding out of the mounting groove. Therefore, by arranging the mounting groove between the lens barrel 12 and the eyepiece 13, the polarizer 20 can not only extend out of the mounting groove when not in use and can rotate into the mounting groove when in use, but also the integration of the polarizer 20 on the microscope 100 and the storage of the polarizer 20 are more convenient.
Optionally, the lens barrel 12 includes a first barrel 121 and a second barrel 122, the second barrel 122 is movably connected with the first barrel 121, the eyepiece 13 is fixedly connected with the holder 14, and the mounting groove is formed at an end of the first barrel 121 opposite to the eyepiece 13. Specifically, the first cylinder 121 and the second cylinder 122 are in threaded transmission, so that the second cylinder 122 can move toward or away from the first cylinder 121. This makes the entire microscope 100 more compact and reasonable in layout.
The holder 14 may be substantially C-shaped, the eyepiece 13 and the first cylinder 121 are both fixedly connected to the holder 14, a lower end of the holder 14 forms a support surface to facilitate placement of the microscope 100, and a side portion of the holder 14 facilitates holding and moving of the microscope 100 by a user. Thus, the microscope 100 is formed as a hand held microscope 100, which is not only small and low cost, but also convenient to use, transport and store.
In a preferred embodiment, the number of the polarizers 20 is multiple, each polarizer 20 is independently rotatable, and the multiple polarizers 20 are sequentially distributed along the axial direction of the lens barrel 12. That is, a plurality of polarizers 20 may be sequentially stacked in the axial direction of the barrel 12, and whether each polarizer 20 rotates may not be affected by the other polarizers 20. Therefore, a user can select the polarizer 20 of the corresponding type according to the type of the panel 200 to be tested and rotate the polarizer 20 to the entry position, and the remaining polarizers 20 are in the exit position, so that the brightness of the panel 200 can be adjusted in a targeted manner by using the polarizer 20 adapted to the type of the panel 200, thereby facilitating the search of the defective line 300.
In one embodiment, a pivot shaft 15 is disposed in the mounting groove, the pivot shaft 15 is fixedly connected to the lens barrel 12, the pivot shaft 15 sequentially passes through the plurality of polarizers 20 so that the polarizers 20 can pivot independently, and an axial direction of the pivot shaft 15 is consistent with an axial direction of the lens barrel 12. Specifically, as shown in fig. 2, each polarizer has mounting ears 21, each mounting ear 21 has a mounting hole 22 for connecting with the pivot shaft 15, the mounting ears 21 of the plurality of polarizers 20 axially correspond and the pivot shaft 15 sequentially passes through the plurality of mounting holes 22 so that the plurality of polarizers 20 can rotate independently with respect to the pivot shaft 15. Therefore, the arrangement of the pivot shaft 15 is more convenient, and the microscope 100 has a more compact overall structure and is more reasonable in arrangement.
Of course, the present invention is not limited thereto, each polarizer 20 may be pivotally connected by an independent pivot shaft 15, the positions of the plurality of polarizers 20 are not limited to be all located in the mounting groove, the plurality of polarizers 20 may be separately arranged, and each polarizer 20 may be connected to any one of the objective lens 11, the eyepiece 13, the lens barrel 12 and the support 14, as long as it can be switched between the extended position and realize the function that it can facilitate the identification of the defective line 300 in the extended position. For example, a portion of the polarizer 20 may be disposed in the mounting groove, and another portion of the polarizer 20 may be disposed between the objective lens 11 and the barrel 12.
According to some embodiments of the present invention, the number of the polarizers 20 is plural, and the plural polarizers 20 are different types of polarizers 20, the plural polarizers 20 at least include a first polarizer 20 and a second polarizer 20, one of the first polarizer 20 and the second polarizer 20 is a TN-type polarizer 20, and the other is an ADS-type polarizer 20.
Therefore, the poor line 300 of the TN type panel 200 can be accurately and quickly positioned through the TN type polarizer 20, and the poor line 300 of the ADS type panel 200 can be accurately and quickly searched through the ADS type polarizer 20. Thus, by providing a plurality of polarizers 20 in different types to facilitate selection of an appropriate polarizer 20 for different types of panels 200 to be inspected, the versatility and reliability of the microscope 100 are further enhanced.
The following briefly describes the use of the microscope 100 according to an embodiment of the present invention.
After the defective line 300 is found by lighting, firstly clicking the position of the defective line 300 by using a Mark pen to determine the position (the position is firstly confirmed because the polarizer 20 needs to be removed and is convenient to Mark by using laser later), after confirming the position, selecting the polarizer 20 of TN or ADS according to the model of a product, switching the polarizer 20 to an entering position, then searching by using the microscope 100 of the embodiment of the invention according to the Mark pen Mark, after finding the defective line 300, adjusting the defective line 300 (problem line) to the middle, then observing the position of the previous Mark through the eyepiece 13, and pressing the operating button 32 to enable the laser emitting head 31 to project laser to the panel 200 and generate the laser Mark point 400, thereby realizing the clear marking of the defective line 300 and facilitating the searching and positioning of the subsequent defective line 300 during maintenance.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the present invention and to simplify the description, but are not intended to indicate or imply that the structures or elements so referred to must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered as limiting. Furthermore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples" or the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the invention have been shown and described, it will be understood by those of ordinary skill in the art that: various changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.
Claims (10)
1. A microscope for marking a defective line of a liquid crystal screen, comprising:
the microscope comprises a microscope body, a lens barrel and an ocular, wherein the objective is positioned at one end of the lens barrel, and the ocular is positioned at the other end of the lens barrel;
the polaroid is connected with the microscope body and can be switched between an entering position extending into the eyepiece or the lens cone and a moving-out position extending out of the eyepiece or the lens cone; and
a laser emitter coupled to the microscope body, the laser emitter configured to project laser light into a viewing area of the objective lens;
the polaroid is used for reducing the brightness of a visual field when the polaroid extends into the ocular or the lens cone so as to identify the position of a bad line, and improving the brightness of the visual field when the polaroid is moved out of the ocular or the lens cone so as to mark the bad line by the laser.
2. The microscope of claim 1, wherein the laser emitting member comprises:
the laser emitting head is connected with the objective lens; and
and the operation button is connected with the lens barrel and electrically connected with the laser emitting head to control the laser emitting head to be opened and closed.
3. The microscope of claim 2, wherein the number of the laser emitting heads is plural, the projection areas of the plural laser emitting heads are each located in the observation area of the objective lens, and the operation button is configured to control the synchronous opening and closing of the plural laser emitting heads.
4. The microscope according to claim 2 or 3, wherein the number of the laser emitting heads is at least three, and a plurality of the laser emitting heads are uniformly distributed around the circumference of the objective lens.
5. The microscope of claim 1, wherein the end of the lens barrel opposite to the eyepiece has a mounting slot, and the polarizer is rotationally switched between an entry position extending into the mounting slot and an exit position extending out of the mounting slot.
6. The microscope of claim 5, wherein the microscope body further comprises a holder, the lens barrel comprises a first barrel and a second barrel, the second barrel is movably connected with the first barrel, the eyepiece and the first barrel are both fixedly connected with the holder, the objective lens is fixedly connected with the second barrel, and the mounting groove is formed at an end of the first barrel opposite to the eyepiece.
7. The microscope of claim 5, wherein the number of the polarizers is plural and each polarizer is independently rotatable, and the plural polarizers are sequentially distributed along the axial direction of the lens barrel.
8. The microscope of claim 7, wherein a pivot shaft is disposed in the mounting groove, the pivot shaft is fixedly connected to the lens barrel, the pivot shaft sequentially penetrates through the plurality of polarizers so that the polarizers can pivot independently, and the axial direction of the pivot shaft is consistent with the axial direction of the lens barrel.
9. The microscope of claim 6, wherein the first cylinder is in threaded communication with the second cylinder such that the second cylinder is movable toward and away from the first cylinder.
10. The microscope of any one of claims 1 to 9, wherein the number of polarizers is at least two and comprises at least a first polarizer and a second polarizer, one of the first polarizer and the second polarizer is a TN-type polarizer and the other is an ADS-type polarizer.
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CN108710136B (en) * | 2018-06-19 | 2024-01-05 | 国蓉科技有限公司 | Three-dimensional imaging laser radar transmitting device |
CN110596875A (en) * | 2019-10-30 | 2019-12-20 | 苏州精濑光电有限公司 | Structure and optical detection equipment are adjusted to microscope camera lens polaroid |
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CN100465612C (en) * | 2005-06-10 | 2009-03-04 | 联华电子股份有限公司 | Defect detection method |
JP2010096554A (en) * | 2008-10-15 | 2010-04-30 | Hitachi High-Technologies Corp | Heightening of sensitivity of method for detecting defect |
JP2015206642A (en) * | 2014-04-18 | 2015-11-19 | 株式会社日立ハイテクノロジーズ | Method for observing defect and device thereof |
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