CA2264328A1 - A method and apparatus for increasing the speed of electromagnetic scanning of electronic devices - Google Patents
A method and apparatus for increasing the speed of electromagnetic scanning of electronic devices Download PDFInfo
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- CA2264328A1 CA2264328A1 CA 2264328 CA2264328A CA2264328A1 CA 2264328 A1 CA2264328 A1 CA 2264328A1 CA 2264328 CA2264328 CA 2264328 CA 2264328 A CA2264328 A CA 2264328A CA 2264328 A1 CA2264328 A1 CA 2264328A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/305—Contactless testing using electron beams
- G01R31/306—Contactless testing using electron beams of printed or hybrid circuits
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Abstract
Disclosed is a method and apparatus for increasing the speed of electromagnetic emission scanning of an electronic device under test. Included is an array of electromagnetic emission detection probes, decoder and driver circuits to address a selected number of probes in the probe array in a predetermined manner, a micro-controller to instruct and supervise the decoder and driver circuits, an analogue to digital converter, a memory circuit, a system controller and a display. The device under test is energized and located adjacent to the array of probes. The micro-controller instructs the decoder and driver circuits to address, individually and successively a specific group or list of probes during a first scanning period. The emission level from each of the addressed probes is measured, digitized and stored in memory circuits as a first data set. The system controller integrates, scales, maps and displays the first data set on the display for interpretation by an operator concomitant with the next data set being collected by the micro-controller. Collected data sets are passed to the system controller for processing and the sampling steps are repeated until the operator receives the desired level of electromagnetic characterization and terminates the scan.
Description
A METHOD AND APPARATUS FOR INCREASING THE SPEED OF
ELECTROMAGNETIC SCANNING OF ELECTRONIC DEVICES
Field of the Invention The present invention relates to a method and apparatus for detecting and measuring the magnitude and location of electromagnetic emissions from electronic devices.
It is particularly concerned with an improved method and apparatus for testing printed circuit boards and similar devices.
Background of the Invention An important tool in the design of printed circuit boards is the ability to accurately locate and measure electromagnetic emissions from an operating printed circuit board.
The prior art electronic emission monitors are represented by Canadian Letters Patent 1,286,724, issued to Goulette et al. on July 23, 1991 entitled "Method and Apparatus for Monitoring Electromagnetic Emission Levels". This patent describes a method and apparatus for monitoring electromagnetic emission levels from electronic circuit boards.
The prior art describes the use of probes to scan a device under test for electromagnetic emissions. Each probe of interest is addressed one at a time. When a probe is selected, electromagnetic emissions adjacent to the probe will induce a signal therein.
The signal is received by a measuring receiver and processed by a system controller. The controller is used to control the apparatus and to display the data to the operator. The controller will not begin to display the data received from the probe array until all of the probes of interest have been addressed and all of the data has been collected and stored. This takes a significant amount of time. The time required to address a single probe and obtain the measurement of electromagnetic radiation coming from the adjacent device under test is in the order of 20 milliseconds. A scan may require the addressing of an array of probes that may have over 1000 individual probes.
Therefore the time taken to measure the electromagnetic emissions from a device under test can be measured in tens of seconds. The controller then requires additional time to process and display the data.
1o Real-time scanning of an active printed circuit board, particularly when the operating cycle of the board under test is synchronized to the scanning apparatus requires a rapid succession of multiple scans to obtain an accurate electromagnetic emission profile. Therefore the disadvantages and limitations associated with the prior art relate to the fact that the device under test must be scanned as fast as possible in order to obtain an accurate display of electromagnetic performance synchronized to circuit board operation in real-time. An additional limitation in the prior art relates to use of the scanning apparatus in production line testing. To be effective in such an application an improved method and apparatus for gathering data from the printed circuit board under test in much less time is required.
2o Summary of the Invention An object of the present invention is to provide an improved method and apparatus for monitoring electromagnetic emission levels from electronic devices under test that results in a faster scan of the device under test.
ELECTROMAGNETIC SCANNING OF ELECTRONIC DEVICES
Field of the Invention The present invention relates to a method and apparatus for detecting and measuring the magnitude and location of electromagnetic emissions from electronic devices.
It is particularly concerned with an improved method and apparatus for testing printed circuit boards and similar devices.
Background of the Invention An important tool in the design of printed circuit boards is the ability to accurately locate and measure electromagnetic emissions from an operating printed circuit board.
The prior art electronic emission monitors are represented by Canadian Letters Patent 1,286,724, issued to Goulette et al. on July 23, 1991 entitled "Method and Apparatus for Monitoring Electromagnetic Emission Levels". This patent describes a method and apparatus for monitoring electromagnetic emission levels from electronic circuit boards.
The prior art describes the use of probes to scan a device under test for electromagnetic emissions. Each probe of interest is addressed one at a time. When a probe is selected, electromagnetic emissions adjacent to the probe will induce a signal therein.
The signal is received by a measuring receiver and processed by a system controller. The controller is used to control the apparatus and to display the data to the operator. The controller will not begin to display the data received from the probe array until all of the probes of interest have been addressed and all of the data has been collected and stored. This takes a significant amount of time. The time required to address a single probe and obtain the measurement of electromagnetic radiation coming from the adjacent device under test is in the order of 20 milliseconds. A scan may require the addressing of an array of probes that may have over 1000 individual probes.
Therefore the time taken to measure the electromagnetic emissions from a device under test can be measured in tens of seconds. The controller then requires additional time to process and display the data.
1o Real-time scanning of an active printed circuit board, particularly when the operating cycle of the board under test is synchronized to the scanning apparatus requires a rapid succession of multiple scans to obtain an accurate electromagnetic emission profile. Therefore the disadvantages and limitations associated with the prior art relate to the fact that the device under test must be scanned as fast as possible in order to obtain an accurate display of electromagnetic performance synchronized to circuit board operation in real-time. An additional limitation in the prior art relates to use of the scanning apparatus in production line testing. To be effective in such an application an improved method and apparatus for gathering data from the printed circuit board under test in much less time is required.
2o Summary of the Invention An object of the present invention is to provide an improved method and apparatus for monitoring electromagnetic emission levels from electronic devices under test that results in a faster scan of the device under test.
In accordance with one aspect of the present invention there is provided an apparatus for electromagnetic emission scanning of electronic devices, comprising: a grid array of probes for detecting electromagnetic emissions from an electronic device adjacent thereto; decoder and driver circuits connected to the grid array of probes for activating and deactivating an individual probe or group of probes thereon; a micro-controller for controlling the decoder and driver circuits; a receiver to receive output signals from the grid array of probes;
an analogue to digital converter for receiving analogue signals from the receiver and digitizing them; a memory device for storing the digital signals as data sets; a programmable system controller for processing the 1o data sets into signals suitable for mapping, scaling, archiving and visual displaying; and a visual display for displaying the processed data sets as visual images to an operator.
In another embodiment of the present invention the receiver is a spectrum analyzer.
15 In accordance with one aspect of the present invention the system controller comprises a computer, operating software and a memory for controlling the overall operation of the apparatus.
The operating software may be WINDOWS.°
One embodiment of the present invention provides a method for the improved scanning of 2o an electronic device for electromagnetic emissions comprising the following steps: the device under test is energized; the energized device under test is placed in proximity to the electromagnetic probes; a list of probes is sampled; the data is collected, digitized and stored as a data set in the memory. The collected data set is downloaded to the system controller and subsequently displayed to the operator. The process is repeated until the operator terminates the operation.
By adding a micro-controller, analogue to digital converter and memory circuits between the decoder and driver circuits and the system controller and by addressing the probes of interest as a list of probes concomitant with the system controller processing and displaying the previous data set, the present invention seeks to overcome the disadvantages found in the prior art.
Scanning speeds one order of magnitude faster than the prior art scanning apparatus are obtained by processing the data from the grid array of probes as data sets from lists of probes rather than as 1o data from the entire grid array. The increased scanning speeds allows the creation of a more accurate real time scan.
The present invention also facilitates the testing of the performance of electronic devices on the manufacturing line in real time.
Brief Description of the Drawings The present invention will be further understood from the following description with references to the drawings in which:
Fig 1 illustrates, in a block diagram, an improved scanning apparatus in accordance with an embodiment of the present invention.
Detailed Description Refernng to Figure 1, a block diagram of an embodiment of the present invention is shown. Planar grid array of probes (10) comprising row and column conductors (11) is provided.
Decoder and driver circuit (12) is connected to and controls the grid array of probes column conductors. Decoder and driver circuit (14) is connected to and controls the grid array of probes row conductors. Decoder and drive circuits (12 & 14) are instructed and supervised by micro-controller (18) connected thereto. Analogue to digital converter (20) is connected to the output of 1o a receiver or spectrum analyzer (21). The receiver is connected to the grid array of probes (10) and receives the analogue signals generated in the probes stimulated by electromagnetic radiation emanating from electronic device under test (16). The analogue signals are converted into digital signals to form a data set. The data set is relayed to memory (22) connected to micro-controller (18) and stored. At the completion of the sampling period, micro-controller (18) downloads the 15 data set to system controller (26). System controller (26) will scale, map, archive and display the information received on display device (28). The system controller (26) is programmable and directs the operation of the entire system.
In operation, the device under test (16) is positioned adjacent to scanning array (10) so 2o that electromagnetic radiation emanating from the device under test induces a current in those selected probes that are adjacent to the device under test. Micro-controller (18) instructs decoder and driver circuits (12 & 14) to address, sequentially, a selected list of probes of interest.
Analogue signals derived from the induced currents in the selected list of probes are transmitted to A/D converter (20) through receiver (21). A/D converter (20) converts the analogue signals to digital signals. The micro-controller (26) then transmits them to memory (22) as a data set. At the end of the first sampling period, that is, when all of the probes in the list of probes have been sampled, micro-controller (18) downloads the first data set to system controller (26). System controller (26) scales and converts the data into a visual image of electromagnetic radiation as a function of position on the electronic device under test. This data is then displayed on visual display unit (28) and archived in the system controller's memory.
Concomitant with systems controller (26) processing and displaying the first data set, micro-controller (18) instructs decoder and driver circuits (12 & 14) to sample the selected list of 1o probes again. Data collected during the second sampling period is converted to a digital format by A/D converter (20) and stored in memory (22) as a second data set. Upon completion of the second sampling period, micro-controller (18) downloads the second data set to system controller (26) for processing. This sampling method is repeated until the operator stops the process. In this way, the system controller does not have to wait until the all of the data from the grid array is 15 collected prior to displaying it. The system controller can work on processing and displaying a data set while the micro-controller is collecting the next data set. This provides for an order of magnitude improvement in the sampling speed.
The steps of the sampling process are summarized in the following chart:
CHART A
SAMPLING PROCESS
STEP ACTIVITY
1 Energizing an electronic device under test (16).
2 Placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes. (10).
an analogue to digital converter for receiving analogue signals from the receiver and digitizing them; a memory device for storing the digital signals as data sets; a programmable system controller for processing the 1o data sets into signals suitable for mapping, scaling, archiving and visual displaying; and a visual display for displaying the processed data sets as visual images to an operator.
In another embodiment of the present invention the receiver is a spectrum analyzer.
15 In accordance with one aspect of the present invention the system controller comprises a computer, operating software and a memory for controlling the overall operation of the apparatus.
The operating software may be WINDOWS.°
One embodiment of the present invention provides a method for the improved scanning of 2o an electronic device for electromagnetic emissions comprising the following steps: the device under test is energized; the energized device under test is placed in proximity to the electromagnetic probes; a list of probes is sampled; the data is collected, digitized and stored as a data set in the memory. The collected data set is downloaded to the system controller and subsequently displayed to the operator. The process is repeated until the operator terminates the operation.
By adding a micro-controller, analogue to digital converter and memory circuits between the decoder and driver circuits and the system controller and by addressing the probes of interest as a list of probes concomitant with the system controller processing and displaying the previous data set, the present invention seeks to overcome the disadvantages found in the prior art.
Scanning speeds one order of magnitude faster than the prior art scanning apparatus are obtained by processing the data from the grid array of probes as data sets from lists of probes rather than as 1o data from the entire grid array. The increased scanning speeds allows the creation of a more accurate real time scan.
The present invention also facilitates the testing of the performance of electronic devices on the manufacturing line in real time.
Brief Description of the Drawings The present invention will be further understood from the following description with references to the drawings in which:
Fig 1 illustrates, in a block diagram, an improved scanning apparatus in accordance with an embodiment of the present invention.
Detailed Description Refernng to Figure 1, a block diagram of an embodiment of the present invention is shown. Planar grid array of probes (10) comprising row and column conductors (11) is provided.
Decoder and driver circuit (12) is connected to and controls the grid array of probes column conductors. Decoder and driver circuit (14) is connected to and controls the grid array of probes row conductors. Decoder and drive circuits (12 & 14) are instructed and supervised by micro-controller (18) connected thereto. Analogue to digital converter (20) is connected to the output of 1o a receiver or spectrum analyzer (21). The receiver is connected to the grid array of probes (10) and receives the analogue signals generated in the probes stimulated by electromagnetic radiation emanating from electronic device under test (16). The analogue signals are converted into digital signals to form a data set. The data set is relayed to memory (22) connected to micro-controller (18) and stored. At the completion of the sampling period, micro-controller (18) downloads the 15 data set to system controller (26). System controller (26) will scale, map, archive and display the information received on display device (28). The system controller (26) is programmable and directs the operation of the entire system.
In operation, the device under test (16) is positioned adjacent to scanning array (10) so 2o that electromagnetic radiation emanating from the device under test induces a current in those selected probes that are adjacent to the device under test. Micro-controller (18) instructs decoder and driver circuits (12 & 14) to address, sequentially, a selected list of probes of interest.
Analogue signals derived from the induced currents in the selected list of probes are transmitted to A/D converter (20) through receiver (21). A/D converter (20) converts the analogue signals to digital signals. The micro-controller (26) then transmits them to memory (22) as a data set. At the end of the first sampling period, that is, when all of the probes in the list of probes have been sampled, micro-controller (18) downloads the first data set to system controller (26). System controller (26) scales and converts the data into a visual image of electromagnetic radiation as a function of position on the electronic device under test. This data is then displayed on visual display unit (28) and archived in the system controller's memory.
Concomitant with systems controller (26) processing and displaying the first data set, micro-controller (18) instructs decoder and driver circuits (12 & 14) to sample the selected list of 1o probes again. Data collected during the second sampling period is converted to a digital format by A/D converter (20) and stored in memory (22) as a second data set. Upon completion of the second sampling period, micro-controller (18) downloads the second data set to system controller (26) for processing. This sampling method is repeated until the operator stops the process. In this way, the system controller does not have to wait until the all of the data from the grid array is 15 collected prior to displaying it. The system controller can work on processing and displaying a data set while the micro-controller is collecting the next data set. This provides for an order of magnitude improvement in the sampling speed.
The steps of the sampling process are summarized in the following chart:
CHART A
SAMPLING PROCESS
STEP ACTIVITY
1 Energizing an electronic device under test (16).
2 Placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes. (10).
3 In a first sampling period successively activating a selected group of probes in a predetermined sequence.
4 Converting the analogue signals received from the selected group of probes into a first digital data set.
Storing the first digital data set in the memory.
6 At the end of the first sampling period downloading the stored first data set to the system controller.
7 Processing the first data set by the system controller for scaling, mapping, displaying and digital storage.
8 Concomitant with the system controller processing the data, sampling the selected list of probes a second time to generate a second data set.
9 Repeating steps 3 to 8 to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time the selected set of probes was sampled to form a real-time image of '~
STEP ~ ACTIVITY
the electromagnetic characteristics of the device under test.
Archiving the aggregated data in the system controller I 1 Terminating the process when the desired level of characterization has been achieved.
Numerous modifications, variations and adaptations may be made to the particular embodiments of the invention described above without departing from the scope of the invention, which is defined in the claims.
Storing the first digital data set in the memory.
6 At the end of the first sampling period downloading the stored first data set to the system controller.
7 Processing the first data set by the system controller for scaling, mapping, displaying and digital storage.
8 Concomitant with the system controller processing the data, sampling the selected list of probes a second time to generate a second data set.
9 Repeating steps 3 to 8 to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time the selected set of probes was sampled to form a real-time image of '~
STEP ~ ACTIVITY
the electromagnetic characteristics of the device under test.
Archiving the aggregated data in the system controller I 1 Terminating the process when the desired level of characterization has been achieved.
Numerous modifications, variations and adaptations may be made to the particular embodiments of the invention described above without departing from the scope of the invention, which is defined in the claims.
Claims (10)
1. An apparatus for electromagnetic emission scanning of electronic devices, comprising:
a. a grid array of probes for detecting electromagnetic emissions from an electronic device adjacent thereto;
b. decoder and driver circuits connected to the grid array of probes for activating and deactivating an individual probe or list of probes thereon;
c. a micro-controller connected to the decoder and driver circuits for controlling said circuits;
d. a receiver connected to the grid array of probes for receiving analogue signals therefrom;
e. an analogue to digital converter connected to the receiver for digitizing the signals;
f. a digital memory device connected to the micro-controller for storing digital data as data sets;
g. a system controller for processing the data sets into signals suitable for mapping, scaling, archiving and displaying; and, h. a visual display for displaying the processed data sets as visual images to an operator.
a. a grid array of probes for detecting electromagnetic emissions from an electronic device adjacent thereto;
b. decoder and driver circuits connected to the grid array of probes for activating and deactivating an individual probe or list of probes thereon;
c. a micro-controller connected to the decoder and driver circuits for controlling said circuits;
d. a receiver connected to the grid array of probes for receiving analogue signals therefrom;
e. an analogue to digital converter connected to the receiver for digitizing the signals;
f. a digital memory device connected to the micro-controller for storing digital data as data sets;
g. a system controller for processing the data sets into signals suitable for mapping, scaling, archiving and displaying; and, h. a visual display for displaying the processed data sets as visual images to an operator.
2. An apparatus as claimed in claim 1 wherein said receiver is a spectrum analyzer.
3. An apparatus as claimed in claim 2 wherein said system controller includes a programmable computer, operating software and a memory device.
4. An apparatus as claimed in claim 3 wherein said operating software is WINDOWS R.
5. An apparatus for electromagnetic emission scanning of electronic devices, comprising: a grid array of probes for detecting electromagnetic emissions from an electronic device adjacent thereto; decoder and driver circuits connected to the grid array of probes for activating and deactivating an individual probe or list of probes thereon; a micro-controller connected to the decoder and driver circuits for controlling said circuits; a spectrum analyzer connected to the grid array of probes for receiving analogue signals therefrom; an analogue to digital converter connected to the receiver for digitizing the signals; a digital memory device connected to the micro-controller for storing digital data as data sets; a system controller, comprising, a data processor, a memory and WINDOWS R operating software, for receiving and processing the data sets into signals suitable for mapping, scaling, archiving and display;
and, a visual display for displaying the processed data sets as visual images to an operator.
and, a visual display for displaying the processed data sets as visual images to an operator.
6. A method scanning an active electronic device for electromagnetic emissions therefrom comprising the steps of:
a. energizing an electronic device under test;
b. placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes;
c. in a first sampling period successively activating a selected group of probes in a pre-determined sequence;
d. converting the analogue signals received from the selected group of probes into a first digital data set;
e. storing the first digital data set in the memory;
at the end of the first sampling period downloading the stored first data set to the system controller;
g. processing the first data set by the system controller for scaling, mapping, displaying and archiving;
h. concomitant with the system controller processing the data, sampling the selected list of probes a second time to generate a second data set;
i. repeating steps c to h above to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time when the selected set of probes was sampled to form a real-time image of the electromagnetic characteristics of the device under test;
j. archiving the aggregated data in the system controller; and, k. terminating the process when the desired level of characterization has been achieved.
a. energizing an electronic device under test;
b. placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes;
c. in a first sampling period successively activating a selected group of probes in a pre-determined sequence;
d. converting the analogue signals received from the selected group of probes into a first digital data set;
e. storing the first digital data set in the memory;
at the end of the first sampling period downloading the stored first data set to the system controller;
g. processing the first data set by the system controller for scaling, mapping, displaying and archiving;
h. concomitant with the system controller processing the data, sampling the selected list of probes a second time to generate a second data set;
i. repeating steps c to h above to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time when the selected set of probes was sampled to form a real-time image of the electromagnetic characteristics of the device under test;
j. archiving the aggregated data in the system controller; and, k. terminating the process when the desired level of characterization has been achieved.
7. In an apparatus for electromagnetic emission scanning of electronic devices, comprising: a grid array of probes for detecting electromagnetic emissions from an active electronic device adjacent thereto; decoder and driver circuits for activating and deactivating an individual probe or group of probes; a receiver for receiving analogue signals from said probes; a programmable system controller; and a display means, wherein the improvement comprises:
a. a micro-controller connected to said decoder and driver circuits for directly controlling the decoder and driver circuits; said micro-controller sampling a probe or list of probes in a predetermined manner thereby defining a sampling period;
said micro-controller controlled by said programmable system controller;
b. an analogue to digital converter connected between said receiver and said micro-controller for receiving analogue signals directly from said receiver and converting them to digital signals;
c. a memory device connected to said micro-controller for storing aggregated digital signals converted by said analogue to digital converter during a sampling period as a data set.
a. a micro-controller connected to said decoder and driver circuits for directly controlling the decoder and driver circuits; said micro-controller sampling a probe or list of probes in a predetermined manner thereby defining a sampling period;
said micro-controller controlled by said programmable system controller;
b. an analogue to digital converter connected between said receiver and said micro-controller for receiving analogue signals directly from said receiver and converting them to digital signals;
c. a memory device connected to said micro-controller for storing aggregated digital signals converted by said analogue to digital converter during a sampling period as a data set.
8. An apparatus as claimed in claim 7 wherein the analogue to digital converter, the micro-controller and the memory device act cooperatively to collect analogue signals from a selected list of probes representing measurements of electromagnetic radiation from the device under test; convert the analogue signals to digital signals; aggregate the signals in the memory as a first data set; and download the first data set to the system controller for processing and; repeating the data set generation and processing steps until the electromagnetic characteristics of the device under test are satisfactorily characterized.
9. In an apparatus for electromagnetic emission scanning of electronic devices, comprising: a grid array of probes for detecting electromagnetic emissions from an electronic device adjacent thereto; decoder and driver circuits connected to the grid array of probes for activating and deactivating an individual probe or group of probes thereon; a micro-controller connected to the decoder and driver circuits for controlling said circuits; a receiver connected to the grid array of probes for receiving analogue signals therefrom; an analogue to digital converter connected to the receiver for converting the signals to digital signals; a digital memory device connected to the micro-controller for storing digital data as data sets;
a system controller for receiving and processing the data sets into signals suitable for mapping, scaling, archiving and display; and, a visual display for displaying the data sets as visual images to an operator, a method of scanning an active electronic device for electromagnetic emissions therefrom comprising the steps of:
a. energizing the device under test b. placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes;
c. in a first sampling period successively activating a selected group of probes in a predetermined sequence;
d. converting the analogue signals received from the selected group of probes into a first digital data set;
e. storing the first digital data set in the memory;
f. at the end of the first sampling period downloading the stored first data set to the system controller;
g. processing the first data set by system controller for mapping, scaling, displaying and archiving;
h. concomitant with the system controller processing the data, sampling the selected group of probes a second time to generate a second data set;
i. repeating steps c to h to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time when the list of selected probes was sampled to form a real-time visual representation of the electromagnetic characteristics of the device under test;
j. archiving the aggregated data in the system controller; and k. terminating the process when the desired level of characterization has been achieved.
a system controller for receiving and processing the data sets into signals suitable for mapping, scaling, archiving and display; and, a visual display for displaying the data sets as visual images to an operator, a method of scanning an active electronic device for electromagnetic emissions therefrom comprising the steps of:
a. energizing the device under test b. placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes;
c. in a first sampling period successively activating a selected group of probes in a predetermined sequence;
d. converting the analogue signals received from the selected group of probes into a first digital data set;
e. storing the first digital data set in the memory;
f. at the end of the first sampling period downloading the stored first data set to the system controller;
g. processing the first data set by system controller for mapping, scaling, displaying and archiving;
h. concomitant with the system controller processing the data, sampling the selected group of probes a second time to generate a second data set;
i. repeating steps c to h to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time when the list of selected probes was sampled to form a real-time visual representation of the electromagnetic characteristics of the device under test;
j. archiving the aggregated data in the system controller; and k. terminating the process when the desired level of characterization has been achieved.
10. In an apparatus for electromagnetic emission scanning of electronic devices, comprising: a grid array of probes for detecting electromagnetic emissions from an active electronic device adjacent thereto; decoder and driver circuits for activating and deactivating an individual probe or group of probes; a receiver for receiving analogue signals from said probes; a programmable system controller; and a display means, wherein the improvement comprises a micro-controller connected to said decoder and driver circuits for directly controlling the decoder and driver circuits; said micro-controller sampling a probe or list of probes in a predetermined manner thereby defining a sampling period; said micro-controller controlled by said programmable system controller; an analogue to digital converter connected between said receiver and said micro-controller for receiving analogue signals directly from said receiver and converting them to digital signals; a memory device connected to said micro-controller for storing aggregated digital signals converted by said analogue to digital converter during a sampling period as a data set; and wherein the analogue to digital converter, the micro-controller and the memory device act cooperatively to collect analogue signals from a selected list of probes representing measurements of electromagnetic radiation from the device under test; convert the analogue signals to digital signals;
aggregate the signals in the memory as a first data set; and download the first data set to the system controller for processing and; repeating the data set generation and processing steps until the electromagnetic characteristics of the device under test are satisfactorily characterized, a method comprising the steps of:
a. energizing the device under test b. placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes;
c. in a first sampling period successively activating a selected group of probes in a predetermined sequence;
d. converting the analogue signals received from the selected group of probes into a first digital data set;
e. storing the first digital data set in the memory;
f. at the end of the first sampling period downloading the stored first data set to the system controller;
g. processing the first data set by system controller for mapping, scaling, displaying and archiving;
h. concomitant with the system controller processing the data, sampling the selected group of probes a second time to generate a second data set;
i. repeating steps c to h to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time when the list of selected probes was sampled to form a real-time visual representation of the electromagnetic characteristics of the device under test;
j. archiving the aggregated data in the system controller; and k. terminating the process when the desired level of characterization has been achieved.
aggregate the signals in the memory as a first data set; and download the first data set to the system controller for processing and; repeating the data set generation and processing steps until the electromagnetic characteristics of the device under test are satisfactorily characterized, a method comprising the steps of:
a. energizing the device under test b. placing the active device under test in a predetermined position immediately adjacent to a plurality of electromagnetic emission monitoring probes;
c. in a first sampling period successively activating a selected group of probes in a predetermined sequence;
d. converting the analogue signals received from the selected group of probes into a first digital data set;
e. storing the first digital data set in the memory;
f. at the end of the first sampling period downloading the stored first data set to the system controller;
g. processing the first data set by system controller for mapping, scaling, displaying and archiving;
h. concomitant with the system controller processing the data, sampling the selected group of probes a second time to generate a second data set;
i. repeating steps c to h to acquire a plurality of sequential data sets each representing electromagnetic emissions at the time when the list of selected probes was sampled to form a real-time visual representation of the electromagnetic characteristics of the device under test;
j. archiving the aggregated data in the system controller; and k. terminating the process when the desired level of characterization has been achieved.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA 2264328 CA2264328A1 (en) | 1999-03-01 | 1999-03-01 | A method and apparatus for increasing the speed of electromagnetic scanning of electronic devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA 2264328 CA2264328A1 (en) | 1999-03-01 | 1999-03-01 | A method and apparatus for increasing the speed of electromagnetic scanning of electronic devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2264328A1 true CA2264328A1 (en) | 2000-09-01 |
Family
ID=29555271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2264328 Abandoned CA2264328A1 (en) | 1999-03-01 | 1999-03-01 | A method and apparatus for increasing the speed of electromagnetic scanning of electronic devices |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA2264328A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9500690B2 (en) | 2013-11-07 | 2016-11-22 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Radio frequency and microwave imaging with a two-dimensional sensor array |
-
1999
- 1999-03-01 CA CA 2264328 patent/CA2264328A1/en not_active Abandoned
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9500690B2 (en) | 2013-11-07 | 2016-11-22 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Radio frequency and microwave imaging with a two-dimensional sensor array |
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