Tapia et al., 1983 - Google Patents
A μP-controlled flying-spot scanner with an intelligent A/D-converter unitTapia et al., 1983
View PDF- Document ID
- 14233236490277458686
- Author
- Tapia M
- Nordlander E
- Drugge B
- Publication year
- Publication venue
- IEEE transactions on instrumentation and measurement
External Links
Snippet
A flying-spot scanning technique is useful for the measurement and mapping of inhomogeneities in semiconductor parameters such as minority carrier lifetime, resistivity, and surface-recombination velocity. This paper describes a system based on a 16-bit …
- 238000005259 measurement 0 abstract description 23
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/033—Pointing devices displaced or positioned by the user, e.g. mice, trackballs, pens or joysticks; Accessories therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's, e.g. LCD's
- G01R13/22—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4470122A (en) | Integrated electro-optical position sensing, workpiece probing and display method and apparatus | |
US3541541A (en) | X-y position indicator for a display system | |
EP0132665A2 (en) | Individual identification apparatus | |
US4801873A (en) | Waveform measuring apparatus with marker zone displaying function | |
US6441896B1 (en) | Method and apparatus for measuring spatial uniformity of radiation | |
US3886331A (en) | Electronic scanning spectrophotometer system | |
Tapia et al. | A μP-controlled flying-spot scanner with an intelligent A/D-converter unit | |
Clem et al. | Modularized digitizing time-synchronizing current-sampling system for electroanalytical studies | |
JP2796373B2 (en) | Color temperature measuring instrument | |
US3504980A (en) | Color analyzer and shade sorting apparatus | |
JPH0225221B2 (en) | ||
CN207215909U (en) | A kind of Antenna Pattern Measuring Test device based on vector network analyzer | |
Dryzek et al. | Planck’s constant determination from black-body radiation | |
Pullman et al. | Instrumentation for testing and control of laboratory model turbogenerator | |
US5049736A (en) | Apparatus for measurement of geological age by measuring zirconium color | |
US3585385A (en) | Method and apparatus for heat treating a material and monitoring the material content x-ray spectrographically | |
Van Well et al. | Instrument control and data acquisition for a time-of-flight neutron reflectometer | |
Lum et al. | Microcomputer‐controlled digitizer and image analyzer | |
EP0064413A1 (en) | Microwave impedance measurement apparatus | |
Hawkins et al. | Computer-aided facility for mosaic sensor test and calibration and characterization of advanced focal plane arrays | |
CN116793985A (en) | Soil moisture detection device and soil moisture detection method | |
JPS6135329A (en) | Measuring device for characteristic of display device | |
Bredael et al. | Digitalized Transfer Function Analyser for Precision Measurements. EUR 3916. | |
US3581203A (en) | Analog meter having means to provide a digital reading of the pointer position | |
Heuer et al. | A new stand-alone beam emittance measurement system |