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ATE544174T1 - Mim kondensator und verfahren zur herstellung eines mim kondensators - Google Patents

Mim kondensator und verfahren zur herstellung eines mim kondensators

Info

Publication number
ATE544174T1
ATE544174T1 AT07820782T AT07820782T ATE544174T1 AT E544174 T1 ATE544174 T1 AT E544174T1 AT 07820782 T AT07820782 T AT 07820782T AT 07820782 T AT07820782 T AT 07820782T AT E544174 T1 ATE544174 T1 AT E544174T1
Authority
AT
Austria
Prior art keywords
mim capacitor
producing
bottom plates
metal
capacitor
Prior art date
Application number
AT07820782T
Other languages
English (en)
Inventor
Alexis Farcy
Maryline Thomas
Joaquin Torres
Sonarith Chhun
Laurent-Georges Gosset
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE544174T1 publication Critical patent/ATE544174T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/005Electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • H01L28/82Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/91Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/005Electrodes
    • H01G4/008Selection of materials

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
AT07820782T 2006-10-04 2007-10-01 Mim kondensator und verfahren zur herstellung eines mim kondensators ATE544174T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06301014 2006-10-04
PCT/EP2007/060400 WO2008040706A1 (en) 2006-10-04 2007-10-01 Mim capacitor

Publications (1)

Publication Number Publication Date
ATE544174T1 true ATE544174T1 (de) 2012-02-15

Family

ID=38759992

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07820782T ATE544174T1 (de) 2006-10-04 2007-10-01 Mim kondensator und verfahren zur herstellung eines mim kondensators

Country Status (5)

Country Link
EP (1) EP2074641B1 (de)
JP (1) JP5091242B2 (de)
CN (1) CN101573772B (de)
AT (1) ATE544174T1 (de)
WO (1) WO2008040706A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8274777B2 (en) 2008-04-08 2012-09-25 Micron Technology, Inc. High aspect ratio openings
US20110089477A1 (en) * 2008-06-13 2011-04-21 Qunano Ab Nanostructured mos capacitor
US7858506B2 (en) 2008-06-18 2010-12-28 Micron Technology, Inc. Diodes, and methods of forming diodes
US8268695B2 (en) 2008-08-13 2012-09-18 Micron Technology, Inc. Methods of making capacitors
RU2444078C1 (ru) * 2010-12-23 2012-02-27 Общество с ограниченной ответственностью "БАРГАН ТЕХНОЛОДЖИ" (ООО "БТЕХ") Способ изготовления слоистой наноструктуры для двухобкладочных конденсаторов
GB2501872B8 (en) * 2012-05-03 2022-08-03 Dyson Technology Ltd Coated Structured Surfaces
GB201207766D0 (en) * 2012-05-03 2012-06-13 Dyson Technology Ltd Dielectric capacitor
RU2533010C2 (ru) * 2012-06-19 2014-11-20 Общество с ограниченной ответственностью "Электронные приборы и системы ". Способ изготовления планарного конденсатора повышенной емкости
US9755013B2 (en) * 2015-04-22 2017-09-05 Globalfoundries Inc. High density capacitor structure and method
TWI766072B (zh) * 2017-08-29 2022-06-01 瑞典商斯莫勒科技公司 能量存儲中介層裝置、電子裝置和製造方法
EP3867935A4 (de) * 2018-10-18 2022-07-13 Smoltek AB Diskretes metall-isolator-metall(mim)-energiespeicherbauteil und herstellungsverfahren
TW202038266A (zh) * 2018-11-26 2020-10-16 瑞典商斯莫勒科技公司 具有離散的能量儲存構件之半導體組件
WO2021059569A1 (ja) 2019-09-25 2021-04-01 株式会社村田製作所 キャパシタおよびその製造方法
US11038011B2 (en) 2019-10-29 2021-06-15 Globalfoundries U.S. Inc. Metal-insulator-metal capacitors including nanofibers
US20230075019A1 (en) * 2020-02-06 2023-03-09 Smoltek Ab Electronic system with power distribution network including capacitor coupled to component pads
TW202141805A (zh) * 2020-04-17 2021-11-01 瑞典商斯莫勒科技公司 具有分層堆疊的金屬-絕緣體-金屬(mim)能量儲存裝置及製造方法
WO2021229871A1 (ja) * 2020-05-12 2021-11-18 株式会社村田製作所 構造体
WO2022107696A1 (ja) * 2020-11-19 2022-05-27 株式会社村田製作所 キャパシタ
WO2022113843A1 (ja) 2020-11-27 2022-06-02 株式会社村田製作所 キャパシタ
WO2023210134A1 (ja) * 2022-04-26 2023-11-02 株式会社村田製作所 キャパシタおよびキャパシタの製造方法
JPWO2024095536A1 (de) * 2022-11-01 2024-05-10

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI292583B (en) * 2000-08-22 2008-01-11 Harvard College Doped elongated semiconductor articles, growing such articles, devices including such articles and fabicating such devices
TW506083B (en) * 2001-11-28 2002-10-11 Ind Tech Res Inst Method of using nano-tube to increase semiconductor device capacitance
JP4695817B2 (ja) * 2002-10-23 2011-06-08 富士通株式会社 キャパシタ、半導体記憶装置及び方法
US7163659B2 (en) * 2002-12-03 2007-01-16 Hewlett-Packard Development Company, L.P. Free-standing nanowire sensor and method for detecting an analyte in a fluid
EP1738378A4 (de) 2004-03-18 2010-05-05 Nanosys Inc Auf nanofaseroberflächen basierende kondensatoren

Also Published As

Publication number Publication date
WO2008040706A1 (en) 2008-04-10
CN101573772A (zh) 2009-11-04
JP5091242B2 (ja) 2012-12-05
EP2074641A1 (de) 2009-07-01
EP2074641B1 (de) 2012-02-01
CN101573772B (zh) 2011-10-05
JP2010506391A (ja) 2010-02-25

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