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MX2020011066A - Analizador de fluorescencia de rayos x con una pluralidad de canales de medición, y un método para realizar el análisis de fluorescencia de rayos x. - Google Patents

Analizador de fluorescencia de rayos x con una pluralidad de canales de medición, y un método para realizar el análisis de fluorescencia de rayos x.

Info

Publication number
MX2020011066A
MX2020011066A MX2020011066A MX2020011066A MX2020011066A MX 2020011066 A MX2020011066 A MX 2020011066A MX 2020011066 A MX2020011066 A MX 2020011066A MX 2020011066 A MX2020011066 A MX 2020011066A MX 2020011066 A MX2020011066 A MX 2020011066A
Authority
MX
Mexico
Prior art keywords
crystal
ray fluorescence
handling unit
slurry
measurement channels
Prior art date
Application number
MX2020011066A
Other languages
English (en)
Inventor
Tommi Koskinen
Antti Pelli
Heikki Sipilä
Original Assignee
Outotec Finland Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Outotec Finland Oy filed Critical Outotec Finland Oy
Publication of MX2020011066A publication Critical patent/MX2020011066A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B03—SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
    • B03B—SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS
    • B03B13/00—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects
    • B03B13/06—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects using absorption or reflection of radioactive emanation
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
    • C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
    • C22B3/02—Apparatus therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G01T1/2023—Selection of materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/1603—Measuring radiation intensity with a combination of at least two different types of detector
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Geochemistry & Mineralogy (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Environmental & Geological Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

El analizador de fluorescencia de rayos X comprende un tubo de rayos X para emitir rayos X incidentes (206) en la dirección de un primer eje óptico (204). Una unidad de manejo de suspensión espesa (201) se configura para mantener una distancia constante entre una muestra (202) de suspensión espesa y el tubo de rayos X. Un primer difractor de cristal (601, 1501) se ubica en una primera dirección de la unidad de manejo de suspensión espesa (201). Comprende un primer cristal (603, 1502) y un primer detector de radiación (602, 1505) configurado para detectar rayos X fluorescentes difractados por el primer cristal (603, 1502) a una primera resolución de energía. Un segundo difractor de cristal (1511) se ubica en una segunda dirección de la unidad de manejo de suspensión espesa (201). Comprende un segundo cristal (1512) y un segundo detector de radiación (1515) configurado para detectar rayos X fluorescentes difractados por el segundo cristal (1512) a una segunda resolución de energía. -ese primer cristal (603, 1502) es un cristal de grafito pirolítico, el segundo cristal (1512) es de un material que no es grafito pirolítico, y el primero y segundo difractores de cristal se configuran para dirigir a sus respectivos detectores de radiación la radiación fluorescente característica de un mismo elemento.
MX2020011066A 2018-04-20 2018-04-20 Analizador de fluorescencia de rayos x con una pluralidad de canales de medición, y un método para realizar el análisis de fluorescencia de rayos x. MX2020011066A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/FI2018/050283 WO2019202199A1 (en) 2018-04-20 2018-04-20 X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis

Publications (1)

Publication Number Publication Date
MX2020011066A true MX2020011066A (es) 2021-01-15

Family

ID=68239963

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020011066A MX2020011066A (es) 2018-04-20 2018-04-20 Analizador de fluorescencia de rayos x con una pluralidad de canales de medición, y un método para realizar el análisis de fluorescencia de rayos x.

Country Status (12)

Country Link
US (1) US11199513B2 (es)
CN (1) CN112313506B (es)
AU (2) AU2018419253B2 (es)
BR (1) BR122023023754A2 (es)
CA (1) CA3097467C (es)
DK (2) DK181068B1 (es)
EA (2) EA202092309A1 (es)
FI (2) FI131090B1 (es)
MX (1) MX2020011066A (es)
SE (1) SE544472C2 (es)
WO (1) WO2019202199A1 (es)
ZA (1) ZA202007014B (es)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MX2020011106A (es) 2018-04-20 2021-01-29 Outotec Finland Oy Analizador de fluorescencia de rayos x y un metodo para realizar el analisis de fluorescencia de rayos x.
US11644431B2 (en) * 2018-08-17 2023-05-09 Microtrace Pty Limited X-ray fluoresence apparatus for a measurement of mineral slurries
SG11202103927WA (en) * 2018-10-18 2021-05-28 Security Matters Ltd System and method for detection and identification of foreign elements in a substance
JP7380421B2 (ja) * 2020-05-27 2023-11-15 株式会社島津製作所 Ｘ線分析装置およびｘ線分析方法
CN113294150B (zh) * 2021-06-11 2023-05-23 中国石油天然气股份有限公司 一种元素分类的方法及系统
CN117825425A (zh) * 2024-01-11 2024-04-05 安徽科瑞思创晶体材料有限责任公司 一种激光晶体的杂质检测系统与检测方法

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Also Published As

Publication number Publication date
FI20206179A1 (en) 2020-11-20
EA202092310A1 (ru) 2021-03-11
ZA202007014B (en) 2021-09-29
CA3097467C (en) 2024-06-25
BR112020021453A2 (pt) 2021-01-19
DK181068B1 (en) 2022-11-08
DK202270431A1 (en) 2022-09-15
AU2021102216A4 (en) 2021-06-03
SE2051352A1 (en) 2020-11-19
CN112313506A (zh) 2021-02-02
EA202092309A1 (ru) 2021-02-05
DK202070771A1 (en) 2020-12-01
AU2018419253A1 (en) 2020-12-03
WO2019202199A1 (en) 2019-10-24
FI20245869A1 (en) 2024-07-09
CN112313506B (zh) 2024-10-25
CA3097467A1 (en) 2019-10-24
BR122023023754A2 (pt) 2023-12-26
US20210255122A1 (en) 2021-08-19
FI131090B1 (en) 2024-09-24
US11199513B2 (en) 2021-12-14
SE544472C2 (en) 2022-06-14
AU2018419253B2 (en) 2022-03-03

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