[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Jiang et al., 2016 - Google Patents

Design of a high-resolution Time-to-Digital converter chip

Jiang et al., 2016

Document ID
17890580981837380963
Author
Jiang A
Niu Y
Guo X
Hu G
Wu X
Publication year
Publication venue
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

External Links

Snippet

Time-to-Digital converter (TDC) is one of the high-precision time measurement techniques. The design of a TDC chip is presented in this paper. This TDC chip occupies a cyclic tapped delay line which forms a ring oscillator. Several measurement functions are supported …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage
    • G01R23/06—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses

Similar Documents

Publication Publication Date Title
Nose et al. A 1-ps resolution jitter-measurement macro using interpolated jitter oversampling
Lu et al. A 3.6 mW, 90 nm CMOS gated-Vernier time-to-digital converter with an equivalent resolution of 3.2 ps
US8203368B2 (en) DLL for period jitter measurement
TWI770128B (en) Variation immune on-die voltage droop detector
Chen et al. A low-cost low-power CMOS time-to-digital converter based on pulse stretching
Chen et al. A cyclic CMOS time-to-digital converter with deep sub-nanosecond resolution
Zhang et al. A low-power time-to-digital converter for the CMS endcap timing layer (ETL) upgrade
CN105629061A (en) Precise frequency measurement device based on high-stability wide reference pulse
Perktold et al. A fine time-resolution (≪ 3 ps-rms) time-to-digital converter for highly integrated designs
Muntean et al. Blumino: The first fully integrated analog SiPM with on-chip time conversion
CN103675383B (en) A kind of circuit measuring waveform
Jiang et al. A multi-path gated ring oscillator based time-to-digital converter in 65 nm CMOS technology
Jiang et al. Design of a high-resolution Time-to-Digital converter chip
Abas et al. Embedded high-resolution delay measurement system using time amplification
Prasad et al. A four channel time-to-digital converter ASIC with in-built calibration and SPI interface
Chen et al. A 486k S/s CMOS time-domain smart temperature sensor with− 0.85° C/0.78° C voltage-calibrated error
Chung et al. An all-digital on-chip jitter measurement circuit in 65nm CMOS technology
Deng et al. A high-precision coarse-fine time-to-digital converter with the analog-digital hybrid interpolation
Parsakordasiabi et al. A survey on FPGA-based high-resolution TDCs
Chen et al. A low power 10-bit time-to-digital converter utilizing vernier delay lines
Jedari et al. A PVT resistant coarse-fine time-to-digital converter
Fu et al. Miniaturized High Precision Time Interval Measurement Technology Based on FPGA
Tong et al. A Two-Step Resolution-Reconfigurable Time-to-Digital Converter Using SAR ADC
Bayat et al. Low-power Time-to-Digital Converter Based on Vernier Gated-Ring-Oscillator
Huang et al. An infrastructure IP for on-chip clock jitter measurement