[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Carasi et al., 2023 - Google Patents

Wire bonding: a thorough numerical methodology

Carasi et al., 2023

View PDF
Document ID
17281364706122284095
Author
Carasi B
Guarino L
Zullino L
Cecchetto L
Publication year
Publication venue
Comsol Conference

External Links

Snippet

The semiconductor industry is always looking for early anticipation of manufacturing risks, pushing the development of Computer Aided Engineering (CAE) modeling of processes. Robust Chip-Package Interaction (CPI) design requires a deep understanding of thermo …
Continue reading at www.comsol.fr (PDF) (other versions)

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation

Similar Documents

Publication Publication Date Title
Doumanidis et al. Mechanical modeling of ultrasonic welding
Kang et al. Modeling and experimental studies on thermosonic flip-chip bonding
Wang et al. Development of novel ultrasonic transducers for microelectronics packaging
Carasi et al. Wire bonding: a thorough numerical methodology
Dhiman et al. Modeling techniques for board level drop test for a wafer-level package
Baek et al. Chip level evaluation of wafer-to-wafer direct bonding strength with bending test
Otto et al. Modelling the lifetime of heavy wire-bonds in power devices–concepts, limitations and challenges
JP4988303B2 (en) Prediction method of ultrasonic bonding strength
Chang et al. Development of a High Cycle Fatigue Life Prediction Model for Thin Film Silicon Structures
Zhang et al. Analytical and experimental characterization of bonding over active circuitry
Lau et al. Realistic solder joint geometry integration with finite element analysis for reliability evaluation of printed circuit board assembly
Li et al. A study of displacement distribution in a piezoelectric heterogeneous bimorph
Hu et al. A microslip model of the bonding process in ultrasonic wire bonders Part I: Transient response
Althoff et al. A friction based approach for modeling wire bonding
Althoff et al. Shape-dependent transmittable tangential force of wire bond tools
Chen et al. Impact isolation through the use of compliant interconnects for microelectronic packages
Guarino et al. Hard bond pad plastic deformation study for adhesion estimation by 3D FEM modelling of wire bonding process
Shin et al. Theoretical analysis of the deflection of a cantilever plate for wirebonding on overhang applications
Hu et al. The vibration characteristics of capillary in wire bonder
Ostaševičius Digital Twins for Smart Manufacturing
Huang et al. Effect of ultrasonic capillary dynamics on the mechanics of thermosonic ball bonding
Wong et al. Modeling of the impact of mechanical stress resulted from wafer probing and wire bonding on circuit under pad
Wu et al. Process Parameters and Modeling Study of Thermosonic Flip Chip Bonding
Meng et al. Forced-time controlled transient dynamic wire bonding simulation for wire bond process development
Ji-Chen et al. Effects of mold compound properties on lead-on-chip (LOC) package reliability during IR reflow