Guarino et al., 2023 - Google Patents
Hard bond pad plastic deformation study for adhesion estimation by 3D FEM modelling of wire bonding processGuarino et al., 2023
- Document ID
- 1520656108838405781
- Author
- Guarino L
- Caglio C
- Villa R
- Carasi B
- Passagrilli C
- Cecchetto L
- Publication year
- Publication venue
- 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
External Links
Snippet
Bond pad structure design is one of the main challenges in the study of Chip-Package Interaction (CPI). The introduction of Copper (Cu) wire requires design solutions to ensure wire pad joint reliability and pad structure integrity. In this context, Nickel-Palladium bond …
- 238000000034 method 0 title abstract description 48
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- H01L2924/01—Chemical elements
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- H01L2924/14—Integrated circuits
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- H01L2924/01029—Copper [Cu]
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- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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