[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Mazierska et al., 2005 - Google Patents

Loss tangent measurements of dielectric substrates from 15K to 300K with two resonators: Investigation into accuracy issues

Mazierska et al., 2005

View PDF
Document ID
16889196242636144944
Author
Mazierska J
Jacob M
Ledenyov D
Krupk J
Publication year
Publication venue
2005 Asia-Pacific Microwave Conference Proceedings

External Links

Snippet

Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880 and 6010.2, LaAlO/sub 3/, LSAT, MgO and quartz) was measured at varying temperatures with two TE/sub 01/spl delta//dielectric resonators to ensure verification of the …
Continue reading at arxiv.org (PDF) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/20—Frequency-selective devices, e.g. filters
    • H01P1/201—Filters for transverse electromagnetic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/34—Constructional details, e.g. resonators, specially adapted to MR
    • G01R33/34015—Temperature-controlled RF coils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/12—Coupling devices having more than two ports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/34—Constructional details, e.g. resonators, specially adapted to MR
    • G01R33/345—Constructional details, e.g. resonators, specially adapted to MR of waveguide type
    • G01R33/3453—Transverse electromagnetic [TEM] coils
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P7/00—Resonators of the waveguide type
    • H01P7/04—Coaxial resonators
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced with unbalanced lines or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor

Similar Documents

Publication Publication Date Title
Baker-Jarvis et al. Dielectric characterization of low-loss materials a comparison of techniques
Chen et al. Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics
Krupka Frequency domain complex permittivity measurements at microwave frequencies
Sheen Comparisons of microwave dielectric property measurements by transmission/reflection techniques and resonance techniques
Krupka Measurements of the complex permittivity of low loss polymers at frequency range from 5 GHz to 50 GHz
Sharma et al. Analysis of dielectric properties of polydimethylsiloxane (PDMS) as a flexible substrate for sensors and antenna applications
Zhu et al. Extraction of dielectric and rough conductor loss of printed circuit board using differential method at microwave frequencies
Baker-Jarvis et al. Dielectric and magnetic measurements: A survey of nondestructive, quasi-nondestructive, and process-control techniques
Gold et al. Measuring design-dk and true permittivity of pcb materials up to 20ghz
Chen et al. Cavity perturbation technique for the measurement of permittivity tensor of uniaxially anisotropic dielectrics
Han et al. A new method for measuring the properties of dielectric materials
Krupka et al. Complex permittivity measurements of low-loss microwave ceramics employing higher order quasi TE0np modes excited in a cylindrical dielectric sample
Fiedziuszko et al. Dielectric resonator used as a probe for high T/sub c/superconductor measurements
Mazierska et al. Loss tangent measurements of dielectric substrates from 15K to 300K with two resonators: Investigation into accuracy issues
Sheen A dielectric resonator method of measuring dielectric properties of low loss materials in the microwave region
Cuper et al. Conductivity measurement in mm-wave band with a Fabry-Perot open resonator
Mazierska et al. Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators
Ceremuga et al. Resonant measurements of surface resistance of high-T c superconducting films: How good or bad are they?
Fang et al. A tunable split resonator method for nondestructive permittivity characterization
Wolfson et al. Complex permittivity and permeability measurement using a rectangular waveguide
Cheng et al. Multifrequency measurements of dielectric properties using a transmission-type overmoded cylindrical cavity
Krupka et al. Recent advances in metrology for the electromagnetic characterization of materials at microwave frequencies
Bartley Permittivity measurement of low-loss materials using embedded resonance
Rajab et al. Dielectric property measurement using a resonant nonradiative dielectric waveguide structure
Dankov et al. Characterization of microwave substrates with split-cylinder and split-coaxial-cylinder resonators