Krupka, 2016 - Google Patents
Measurements of the complex permittivity of low loss polymers at frequency range from 5 GHz to 50 GHzKrupka, 2016
- Document ID
- 7518008908864123266
- Author
- Krupka J
- Publication year
- Publication venue
- IEEE Microwave and Wireless Components Letters
External Links
Snippet
Complex permittivity of Polytetrafluoroethylene (PTFE), Polypropylene (PP), Polyethylene (PE) and cross-linked Polystyrene (Rexolite), has been measured at frequency range from 5 GHz to 50 GHz. Measurements have been performed in two cylindrical cavities employing …
- 238000005259 measurement 0 title abstract description 34
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/34—Constructional details, e.g. resonators, specially adapted to MR
- G01R33/34015—Temperature-controlled RF coils
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Krupka | Measurements of the complex permittivity of low loss polymers at frequency range from 5 GHz to 50 GHz | |
Arbaoui et al. | Full 3-D printed microwave termination: A simple and low-cost solution | |
Krupka et al. | A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature | |
Lomakin et al. | Analytical waveguide model precisely predicting loss and delay including surface roughness | |
Huber et al. | Dielectric property measurement of PLA | |
Kazemipour et al. | Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain | |
Sharma et al. | Analysis of dielectric properties of polydimethylsiloxane (PDMS) as a flexible substrate for sensors and antenna applications | |
Gutiérrez-Cano et al. | A new stand-alone microwave instrument for measuring the complex permittivity of materials at microwave frequencies | |
Li et al. | Broadband measurements of dielectric properties of low-loss materials at high temperatures using circular cavity method | |
Dankov | Two-resonator method for measurement of dielectric anisotropy in multilayer samples | |
Raveendran et al. | Complex permittivity extraction of planar dielectrics using a noninvasive microwave transmission line resonant technique | |
Mirbeik-Sabzevari et al. | Characterization and validation of the slim-form open-ended coaxial probe for the dielectric characterization of biological tissues at millimeter-wave frequencies | |
Ramzan et al. | A complex permittivity extraction method based on anomalous dispersion | |
Bronckers et al. | Broadband material characterization method using a CPW with a novel calibration technique | |
Sklavounos et al. | Liquid-permittivity measurements using a rigorously modeled overmoded cavity resonator | |
Chen et al. | An improved NRW method for thin material characterization using dielectric filled waveguide and numerical compensation | |
Han et al. | A new method for measuring the properties of dielectric materials | |
Afsar et al. | A new 60 GHz open-resonator technique for precision permittivity and loss-tangent measurement | |
Hefford et al. | Liftoff dielectric resonator for the microwave surface resistance measurement of metal plates | |
Hinojosa | S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties | |
Park et al. | Uncertainty analysis of Q-factor measurement in cavity resonator method by electromagnetic simulation | |
Sheen | A dielectric resonator method of measuring dielectric properties of low loss materials in the microwave region | |
Ceremuga et al. | Resonant measurements of surface resistance of high-T c superconducting films: How good or bad are they? | |
Fang et al. | A tunable split resonator method for nondestructive permittivity characterization | |
Bendaoued et al. | Determining the complex permittivity of building dielectric materials using a propagation constant measurement |