Lo et al., 1974 - Google Patents
A measuring system for studying the time-resolution capabilities of fast photomultipliersLo et al., 1974
- Document ID
- 10505467101283211919
- Author
- Lo C
- Leskovar B
- Publication year
- Publication venue
- IEEE Transactions on Nuclear Science
External Links
Snippet
A measuring system has been developed for studying and optimizing the time-resolution capabilities of fast photoelectric devices, such as standard and microchannel type photomultipliers. The system incorporates a subnanosecond light-pulse generator capable …
- 238000005259 measurement 0 abstract description 22
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's, e.g. LCD's
- G01R13/22—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Klanner | Characterisation of sipms | |
Leskovar et al. | Single photoelectron time spread measurement of fast photomultipliers | |
Spieler | Fast timing methods for semiconductor detectors | |
Karar et al. | Characterization of avalanche photodiodes for calorimetry applications | |
Lo et al. | A measuring system for studying the time-resolution capabilities of fast photomultipliers | |
Nagai et al. | Characterization of a large area silicon photomultiplier | |
Nashashibi et al. | A low noise FET with integrated charge restoration for radiation detectors | |
Akindele et al. | Acceptance tests of Hamamatsu R7081 photomultiplier tubes | |
Anacker et al. | Analysis of microchannel plate response in relation to pulsed laser time‐of‐flight photoemission spectroscopy | |
Leskovar et al. | Time resolution performance studies of contemporary high speed photomultipliers | |
Nashashibi | The Pentafet and its applications in high resolution and high rate radiation spectrometers | |
Holeman et al. | Photoconductivity in semi-insulating gallium arsenide | |
Bjerke et al. | Pulse shaping and standardizing of photomultiplier signals for optimum timing information using tunnel diodes | |
Lo et al. | A measuring system for studying the time-resolution capabilities of fast photomultipliers | |
De Marco et al. | Pulsed photomultipliers | |
Girard et al. | Characterisation of silicon photomultipliers based on statistical analysis of pulse-shape and time distributions | |
Arecchi et al. | Measurements of light intensity correlations in the subnanosecond region by photomultipliers | |
JPS6254183A (en) | Method and device for monitoring function of integrated circuit during operation | |
Kron | Developments in the Practical Use of Photocells for Measuring Faint Light. | |
Moleri et al. | A detector-emulation method for realistic readout-electronics tests. A case study of VMM3a ASIC for sTGC detector. | |
Johnson | A pulse-shape-discrimination circuit of wide range and high sensitivity | |
Karlsson | On compensated leading edge timing with fast photomultipliers | |
Filippini et al. | HPD readout based TOF scintillator detector for the FINUDA trigger | |
US3573615A (en) | System for measuring a pulse charge | |
Amsel et al. | Use of Fast Infrared Emitting Diodes with Semiconductor Detectors |