Turki et al., 2012 - Google Patents
Towards synthetic benchmarks generator for CAD tool evaluationTurki et al., 2012
View PDF- Document ID
- 8726911180903069336
- Author
- Turki M
- Mehrez H
- Marrakchi Z
- Abid M
- Publication year
- Publication venue
- PRIME 2012; 8th Conference on Ph. D. Research in Microelectronics & Electronics
External Links
Snippet
In the process of designing prototyping CAD tools for system on chip, industrial need usually huge benchmark designs to test and evaluate their tools. However, observing the limits of existing and available bench-marks, it is necessary to develop and provide large suites of …
- 238000011156 evaluation 0 title description 3
Classifications
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- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/50—Computer-aided design
- G06F17/5045—Circuit design
- G06F17/5054—Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
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- G06F17/5045—Circuit design
- G06F17/505—Logic synthesis, e.g. technology mapping, optimisation
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- G—PHYSICS
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- G06F17/50—Computer-aided design
- G06F17/5009—Computer-aided design using simulation
- G06F17/5022—Logic simulation, e.g. for logic circuit operation
- G06F17/5031—Timing analysis
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- G—PHYSICS
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- G06F17/5009—Computer-aided design using simulation
- G06F17/5022—Logic simulation, e.g. for logic circuit operation
- G06F17/5027—Logic emulation using reprogrammable logic devices, e.g. field programmable gate arrays [FPGA]
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- G—PHYSICS
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- G06F17/5081—Layout analysis, e.g. layout verification, design rule check
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- G—PHYSICS
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- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
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- G06F15/00—Digital computers in general; Data processing equipment in general
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