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Turki et al., 2012 - Google Patents

Towards synthetic benchmarks generator for CAD tool evaluation

Turki et al., 2012

View PDF
Document ID
8726911180903069336
Author
Turki M
Mehrez H
Marrakchi Z
Abid M
Publication year
Publication venue
PRIME 2012; 8th Conference on Ph. D. Research in Microelectronics & Electronics

External Links

Snippet

In the process of designing prototyping CAD tools for system on chip, industrial need usually huge benchmark designs to test and evaluate their tools. However, observing the limits of existing and available bench-marks, it is necessary to develop and provide large suites of …
Continue reading at www.ceslab.org (PDF) (other versions)

Classifications

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    • G06F17/5045Circuit design
    • G06F17/5054Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
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