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Wan et al., 2024 - Google Patents

AENet: attention enhancement network for industrial defect detection in complex and sensitive scenarios

Wan et al., 2024

View PDF
Document ID
7051597114673170775
Author
Wan Y
Yi L
Jiang B
Chen J
Jiang Y
Xie X
Publication year
Publication venue
The Journal of Supercomputing

External Links

Snippet

Conventional image processing and machine learning based on handcrafted features struggle to meet the real time and high-accuracy requirements for industrial defect detection in complex, sensitive, and dynamic environments. To address this issue, this paper …
Continue reading at www.researchsquare.com (PDF) (other versions)

Classifications

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    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/36—Image preprocessing, i.e. processing the image information without deciding about the identity of the image
    • G06K9/46—Extraction of features or characteristics of the image
    • G06K9/4604—Detecting partial patterns, e.g. edges or contours, or configurations, e.g. loops, corners, strokes, intersections
    • G06K9/4609—Detecting partial patterns, e.g. edges or contours, or configurations, e.g. loops, corners, strokes, intersections by matching or filtering
    • G—PHYSICS
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