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Article
April 2000
A Technique for Logic Fault Diagnosis of Interconnect Open Defects
- Srikanth Venkataraman,
- Scott B. Drummonds
VTS '00: Proceedings of the 18th IEEE VLSI Test SymposiumPage 313

A technique for performing logic diagnosis of defects that cause interconnects in a digital logic circuit to become open or highly resistive is presented. The novel features of this work include a diagnostic fault model to capture potential faulty ...
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