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Diagnostic testing of embedded memories using BIST

Authors:

Timothy J. Bergfeld,

Dirk Niggemeyer,

Elizabeth M. RudnickAuthors Info & Claims

DATE '00: Proceedings of the conference on Design, automation and test in Europe

Pages 305 - 311

https://doi.org/10.1145/343647.343786

Published: 01 January 2000 Publication History

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Cited By

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Overill RVolkamer MWressnegger C(2020)Cosmic raysProceedings of the 15th International Conference on Availability, Reliability and Security10.1145/3407023.3409188(1-6)Online publication date: 25-Aug-2020
https://dl.acm.org/doi/10.1145/3407023.3409188
Mukherjee NPogiel ARajski JTyszer J(2011)BIST-Based Fault Diagnosis for Read-Only MemoriesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2011.212703030:7(1072-1085)Online publication date: 1-Jul-2011
https://dl.acm.org/doi/10.1109/TCAD.2011.2127030
WAN HASAN WABD HALIN IMOHD SIDEK ROTHMAN M(2009)An Efficient Fault Syndromes Simulator for SRAM MemoriesIEICE Transactions on Electronics10.1587/transele.E92.C.639E92-C:5(639-646)Online publication date: 2009
https://doi.org/10.1587/transele.E92.C.639
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Index Terms

Diagnostic testing of embedded memories using BIST
1. Hardware

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DATE '00: Proceedings of the conference on Design, automation and test in Europe

January 2000

707 pages

ISBN:1581132441

DOI:10.1145/343647

Chairman:
Ivo Bolsens
IMEC, Leuven, Belgium

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Published: 01 January 2000

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DATE00: Design Automation and Test in Europe

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Cited By

View all

Overill RVolkamer MWressnegger C(2020)Cosmic raysProceedings of the 15th International Conference on Availability, Reliability and Security10.1145/3407023.3409188(1-6)Online publication date: 25-Aug-2020
https://dl.acm.org/doi/10.1145/3407023.3409188
Mukherjee NPogiel ARajski JTyszer J(2011)BIST-Based Fault Diagnosis for Read-Only MemoriesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2011.212703030:7(1072-1085)Online publication date: 1-Jul-2011
https://dl.acm.org/doi/10.1109/TCAD.2011.2127030
WAN HASAN WABD HALIN IMOHD SIDEK ROTHMAN M(2009)An Efficient Fault Syndromes Simulator for SRAM MemoriesIEICE Transactions on Electronics10.1587/transele.E92.C.639E92-C:5(639-646)Online publication date: 2009
https://doi.org/10.1587/transele.E92.C.639
Masnita MZuha WSidek RIzhal A(2009)March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faultsIEICE Electronics Express10.1587/elex.6.10916:15(1091-1097)Online publication date: 2009
https://doi.org/10.1587/elex.6.1091
Mukherjee NPogiel ARajski JTyszer J(2009)Fault diagnosis for embedded read-only memories2009 International Test Conference10.1109/TEST.2009.5355530(1-10)Online publication date: Nov-2009
https://doi.org/10.1109/TEST.2009.5355530
Su CTsai CWu CHung CChen YWang DLee YKao M(2008)Write disturbance modeling and testing for MRAMIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2007.91540216:3(277-288)Online publication date: 1-Mar-2008
https://dl.acm.org/doi/10.1109/TVLSI.2007.915402
Mukherjee NPogiel ARajski JTyszer J(2008)High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST2008 IEEE International Test Conference10.1109/TEST.2008.4700554(1-10)Online publication date: Oct-2008
https://doi.org/10.1109/TEST.2008.4700554
Huang RLi JYeh JWu C(2007)RaisinIEEE Design & Test10.5555/1304048.130428324:4(386-396)Online publication date: 1-Jul-2007
https://dl.acm.org/doi/10.5555/1304048.1304283
Li JHuang C(2007)An Efficient Diagnosis Scheme for RAMs with Simple Functional FaultsIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1093/ietfec/e90-a.12.2703E90-A:12(2703-2711)Online publication date: 1-Dec-2007
https://dl.acm.org/doi/10.1093/ietfec/e90-a.12.2703
Bernardi PGrosso MRebaudengo MSonza Reorda M(2007)A System-layer Infrastructure for SoC DiagnosisJournal of Electronic Testing: Theory and Applications10.1007/s10836-007-5014-623:5(389-404)Online publication date: 1-Oct-2007
https://dl.acm.org/doi/10.1007/s10836-007-5014-6
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Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

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