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Low-power skewed-load tests based on functional broadside tests

Author:

Irith PomeranzAuthors Info & Claims

ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 19, Issue 2

Article No.: 18, Pages 1 - 18

https://doi.org/10.1145/2566664

Published: 28 March 2014 Publication History

Abstract

This article studies the generation of low-power skewed-load tests such that the signal transitions (and line values) they create during their fast functional clock cycles match those of functional broadside tests. Functional broadside tests create functional operation conditions during their fast functional clock cycles. As a result, the signal transitions that occur during these clock cycles can also occur during functional operation. The procedure described in this article matches these signal-transitions on a line-by-line basis when generating low-power skewed-load tests. The procedure accepts a functional broadside test set for transition faults. In one of its basic steps, the procedure modifies a functional broadside test into a skewed-load test. This allows it to retain many of the signal transitions (and line values) of the functional broadside test in the skewed-load test. Experimental results for benchmark circuits demonstrate the extent to which it is possible to match the signal-transitions of skewed-load tests with those of functional broadside tests while achieving the high transition fault coverage that is typical of skewed-load tests.

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Cited By

Pomeranz I(2015)Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test SetIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2014.231117023:3(593-597)Online publication date: Mar-2015
https://doi.org/10.1109/TVLSI.2014.2311170

Index Terms

Low-power skewed-load tests based on functional broadside tests

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Published In

cover image ACM Transactions on Design Automation of Electronic Systems

ACM Transactions on Design Automation of Electronic Systems Volume 19, Issue 2

March 2014

314 pages

ISSN:1084-4309

EISSN:1557-7309

DOI:10.1145/2597648

Issue’s Table of Contents

Copyright © 2014 ACM.

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Association for Computing Machinery

New York, NY, United States

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ACM Journals for the Design of Smart and Connected Systems

Publication History

Published: 28 March 2014

Accepted: 01 August 2013

Revised: 01 February 2013

Received: 01 September 2012

Published in TODAES Volume 19, Issue 2

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Cited By

Pomeranz I(2015)Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test SetIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2014.231117023:3(593-597)Online publication date: Mar-2015
https://doi.org/10.1109/TVLSI.2014.2311170

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